8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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ALICE Forward DetectorsTechnical Design Report

Editorial team:I.G. Bearden (NBI)

H. Bøggild (NBI)

C.Holm (NBI)

J.J. Gaardhøje (NBI), ch

J.Y. Grossiord (Lyon)

T. Malkiewicz (Jyvaesk.)

B.S. Nielsen (NBI)

G. Paic (Mexico)

W. Trzaska (Jyvaeskyla)

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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FMD ’inner’ protype before dicing

2 sectors of 512 strips

Test structures on 6” wafer

Hamamatsu

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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Bonding pads and bias resistors

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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ALICE-FMD inner sensor

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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First 3 inner sensors delivered at NBI-Feb 2005

TDR Specs: Full depletion voltage 50-100V

Measure: full depletion voltage: 75 -80V.

TDR specs: thickness = 310 μm +- 10 μm

Measure: t= 323 μm +- 1 μm

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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First test of FMD inner Si sensorsLeakage currents

0

50

100

150

200

250

300

350

400

0 50 100 150 200 250 300 350

Bias voltage (V)

Cu

rren

t (n

A)

Serial no 1

Serial no 2

Serial no 3

Stability test

0

50

100

150

200

250

0 20 40 60 80 100 120 140 160

Time (hours)

Leak

age

curr

ent (

nA) Serial no 1 ?

TDR Specs: < 3 μA

Measure: < 0.3 μA

< 0.3 nA /strip

Full-depletion voltage: 75 V

Measure: < 2.5 pF/strip (bulk)

168 hr long-term stability test of leakage current at 200V

1/C^2

0,000

0,020

0,040

0,060

0,080

0,100

0,120

0,140

0,160

0,180

0,200

0 50 100 150 200 250 300

Bias voltage (V)

1/C

^2

(1

0^

-6 p

F^

-2)

Serial no 1

Serial no 2

Serial no 3

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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FMD Hybrid card w. 8 x (128 ch) preamplifiers

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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VA_ALICE 128 ch preampl

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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Test of FEE card with 8 VA_ALICE preamplifier chips

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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FEE card test results

I MIP 22400 e-

3.5 fC

Gain 20 mV/fC =>

20MIP 1.4 V

TDR: C=0pF => N=310e-, C=25pF => N=410e-

Measure: C=0pF : N=200e-

Expect for C=25pF: N~300e- => S/N= 22400/300=75.

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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RCU-USB test at NBI with PC&TPC-FEE card

8-3-05 Jens Jørgen Gaardhøje. NBI. ALICE-CR5

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FMD milestones adjusted to new ALICE installation schedule • Production of VA_ALICE chip

done• Delivery of prototype hybrid cards done• Delivery of prototype Si sensors Feb-05

done• Prototype digitizer boards produced April-05• Lab tests Si-FEE-Digitizer-RCU Jun-05• Rad. hardness studies of FEE&digitizer May-05• Place Si production order Jun-05• Delivery Si & FEE Nov-05• Bonding at CERN Dec-05• Mechanics RB26 completed Feb-06• Full system test with DAQ Dec-05• Sector (half ring) rad. test Jan-06• Detector assembly RB26 Mar-06• Detector assembly RB24 Jun-06• Ready for installation RB26 May-06• Ready for installation RB24 Sep-06