Microphotonics Readiness for Commercial CMOS Manufacturing
Transcript of Microphotonics Readiness for Commercial CMOS Manufacturing
Microphotonics Readiness for Commercial CMOS Manufacturing
Marco Romagnoli
MicroPhotonics Consortium meeting MIT, Cambridge
October 15th , 2012
© 2011 Scuola Superiore Sant’Anna
Building blocks • Waveguide • Directional coupler • Microring • Polarization splitter and rotator • Fiber coupling • Laser butt coupling Component • AWG • Echelle grating • Lattice filter
2
Passive optical structures based on SOI technology
© 2011 Scuola Superiore Sant’Anna
Waveguide
• Single mode waveguide (TE mode)
• Buried (Si core – SiO2 cladding)
• Core Size ~ 200 x 500 nm
• Lower Cladding (BOX) Height 3 mm
Si
SiO2
Si (substrate)
3
© 2011 Scuola Superiore Sant’Anna
1,23,5
13,112,3
9,2 8,2
4,53,7
2,3 2,53,4
25,0
2,41,82,02,52,52,32,7
6,78,0
0,00
5,00
10,00
15,00
20,00
25,00
150 200 250 300 350 400 450 500 550 600 650 700 750Waveguide Width [nm]
α p
rop [d
B/c
m]
TE Pol TM Pol
Substrate leakage
Scattering loss
Weak guidance Waveguide thickness = 220 nm
Waveguide Loss
4
© 2011 Scuola Superiore Sant’Anna
Method monitoring s and Lc based on SEM image analysis. Demonstrated a correlation between roughness, statistical parameters and propagation losses in a straight waveguide
Line edge roughness (LER)
Waveguide Loss
5
Lot # s (nm) Lc (nm)
358 2.2 20
427 1.67 18
432 1.34 15
489 1.22 12
© 2011 Scuola Superiore Sant’Anna
2.22
789
2.22789
2.22789
4.45578
4.45578
6.68368
6.68368
8.91157
8.91157
11.1395
11.1395
13.3674
13.3674
15.5
952
15.5952
17.8231
17.8231
20.0
51
20.051
22.2
789
22.2789
24.5
068
24.5068
26.7347
28.9626
31.190533.4184
35.646337.8742
40.102142.3299
44.5578standard deviation σ (nm)
cohe
renc
e le
ngth
L c (nm
)
α scattering [dB/cm] (λ = 1.55 µm, Pol = TE)
1 2 3 4 5 60
20
40
60
80
100
120
140
160
Scattering losses increase with coherence length.
WG height = 220nm WG width = 450nm
0.5 1 1.5 2 2.50
2
4
6
8
σ [ nm ]α
[ d
B/c
m ]
W = 400nmW = 450nmW = 500nm
LC = 40nm
Scattering losses decrease with waveguide width.
Waveguide Loss
6
© 2011 Scuola Superiore Sant’Anna
12” SOI (2mm BOX), 65nm node at CNSE (University of Albany)
Waveguide Loss
1.7 ± 0.25 dB/cm
© 2011 Scuola Superiore Sant’Anna
TAPERED FIBER
STRAIGHT WAVEGUIDE
POLARIMETER
L = 6 mm
TE
W= 250nm 300nm 350nm 400nm 488nm
• 50 nm SCAN (1520-1570nm) • waveguide thickness 220 nm
TAPERED FIBER
TM
Waveguide Polarization Evolution
8
© 2011 Scuola Superiore Sant’Anna
Directional Coupler
For instance 2% error in coupling coefficient corresponds 2.6% in power splitting ratio. This error is mostly due to optical proximity effect. The error in gap-width is usually negligible.
Proximity error
9
© 2011 Scuola Superiore Sant’Anna
Microring Tolerances
0.0037 /nm
Tunability
- 270 GHz/nm
c - 70 GHz/nm
10 GHz/°C
0.0017 /nm - 130 GHz/nm
Parameter Effective index sensitivity
10
Wwidth
Gap
Wthickness
Wring
R Intrachip statistics on resonance fluctuation: = 27 GHz (0.22 nm) 12” SOI (2mm BOX), 65nm node at CNSE (University of Albany)
© 2011 Scuola Superiore Sant’Anna
Microring thermal tuning, trimming and power consumption
11
M. R. Watts et al, CLEO/QELS 2009
2009
© 2011 Scuola Superiore Sant’Anna
Athermal directional coupler Decrease of coupling coefficient with temperature is compensated for by increase of mode size at the new resonant wavelength. This feature implies that changes of filter shape are negligible in the 4 THz tuning range.
1525 1530 1535 1540 1545 1550 1555 1560 15650.055
0.06
0.065
0.07
0.075
0.08
0.085
0.09
0.095
0.1
λ (nm)
K Cr
oss
[nor
mal
ized
]
T = 25°C T = 125°C T = 225°C
7.9%±0.4%
15
50
.0
nm
15
57
.7
nm
15
42
.3
nm
7.9%
7.5%
8.3%
-55
-50
-45
-40
-35
-30
-25
-20
-15
-10
-5
193,750 193,850 193,950 194,050 194,150 194,250Freq [THz]
Tx [d
B]Thru T0
Drop T0
Thru Tmax
Drop Tmax
Microring athermal coupler
12
© 2011 Scuola Superiore Sant’Anna
4 THz filter thermal tuning contact
r ing
microheaters b)
contact
r ing
microheaters b)
contact
r ing
microheaters contact
r ing
microheaters b)
contact
r ing
microheaters contact
r ing
microheaters
Microring Tuning & Trimming
First channel
Last channel
13
© 2011 Scuola Superiore Sant’Anna
Polarization Handling
1.5 1.52 1.54 1.56 1.58 1.6-40
-35
-30
-25
-20
-15
-10
-5
0
Wavelength (mm)
Pow
er (d
B)
TM TE
Residual TM
Residual TM
Spurious TE
Polarization splitter & rotator
14
© 2011 Scuola Superiore Sant’Anna
SWG
-30
-25
-20
-15
-10
-5
0
1520 1525 1530 1535 1540 1545 1550 1555 1560 1565 1570Wavelength [nm]
Tx [d
B]
ASE_TE 1nmASE_TM 1nmOVA_TEOVA_TMASE_TE 0,01nmASE_TM 0,01nm
PsP_T - 12
-30
-25
-20
-15
-10
-5
0
1520 1525 1530 1535 1540 1545 1550 1555 1560 1565 1570Wavelength [nm]
Tx [d
B]
ASE_TE 1nmASE_TM 1nmOVA_TEOVA_TMASE_TE 0,01nmASE_TM 0,01nm
TM
TE
Polarization Handling
Straight Si waveguide Polarization diversity scheme
Polarization splitter & rotator performance
15
© 2011 Scuola Superiore Sant’Anna
Input Taper Vertical Coupling
Tip 110 nm
500 nm Silicon waveguide SiO2:(Ge) SMF
Top view
SMF
1 µm
Buried Oxide
Si substrate
220 nm Si waveguide
SiO2:(Ge)
Side view SM fiber ≈ 80 mm2 modal area
Si Wg ≈ 0.1 mm2 modal area (500 X 220 nm)
Fiber coupling
16
SiO2
© 2011 Scuola Superiore Sant’Anna
0 0.2 0.4 0.6 0.8
1 1.2 1.4 1.6 1.8
2
0 0.2 0.4 0.6 0.8 1 1.2 1.4 1.6 1.8 2
10 dB/cm Si tip loss
5 dB/cm
Si tip loss Verti
cal c
oupl
ing
loss
(dB
)
Mask misalignement (mm)
Tolerances to mask misalignements and sensitivity to Si tip loss
TE/TM average loss
Fiber coupling
17
1,23,5
13,112,3
9,2 8,2
4,53,7
2,3 2,53,4
25,0
2,41,82,02,52,52,32,7
6,78,0
0,00
5,00
10,00
15,00
20,00
25,00
150 200 250 300 350 400 450 500 550 600 650 700 750Waveguide Width [nm]
α p
rop [d
B/c
m]
TE Pol TM Pol
© 2011 Scuola Superiore Sant’Anna
Fiber coupling
Grating coupler
Single polarization Dual polarization
IEEE J. of Sel. Top. in Quant. El., 17, p. 597 (2011)
18
© 2011 Scuola Superiore Sant’Anna
Tapered Lensed fiber Spot size 1.7 um Working distance 4 um
Straight SOI waveguide w=1.4um
Gain Chip On submount
Butt-coupling alignment and no taper: InP/SOI best coupling loss = -4.2 dB (experimental) (theoretical best case = -3.5 dB) Extra 3 dB loss with less than 1µm lateral offset and/or 3µm air gap
Butt-coupling alignment with InP spot size converter (SSC) and taper on SOI:
InP/SOI best coupling loss = -0.5 dB (theoretical) Extra 1 dB loss including less than 1um offset and/or 4µm air gap
III-V DFB Laser Butt Coupling
19
Air gap
© 2011 Scuola Superiore Sant’Anna
AWG
Laser Photonics Rev. 6, No. 1, 14–23 (2012)
20
© 2011 Scuola Superiore Sant’Anna
Echelle Grating
Laser Photonics Rev. 6, No. 1, 14–23 (2012)
21
© 2011 Scuola Superiore Sant’Anna
Lattice Filters
22