EE143 – Ali Javey Section 5: Thin Film Deposition Part 2: Chemical Methods Jaeger Chapter 6.
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Transcript of EE143 – Ali Javey Section 5: Thin Film Deposition Part 2: Chemical Methods Jaeger Chapter 6.
EE143 – Ali Javey
Chemical Vapor Deposition (CVD)
film
substrate
chemical reaction
source
More conformal deposition vs. PVD
step
t
t
Shown hereis 100% conformaldeposition
EE143 – Ali Javey
ZYX OHCSiOHOCSi
ateorthosilicenetetraethylTEOSc
HSiOOSiH
HOPOPH
SiOOPglasssilicatephosphoPSGb
HSiOOSiH
SiOa
2452
2224
2522
252
2224
2
.:)(
2
62534
.:)(
2
)(
gas 350oC-500oC
solid
350oC-500oC
gas
LPCVD Examples
EE143 – Ali Javey
HFWHWF
Wf
HSiSiH
SiPolye
HNSiNHSiH
NSid
Co
63
)(
2
)(
123
)(
26
2600
4
24334
43
LPCVD Examples
EE143 – Ali Javey
CVD Mechanisms
reactant
1
2
5
43
stagnant gas layer
surfacediffusion
substrate1 = Diffusion of reactant to surface2 = Absorption of reactant to surface3 = Chemical reaction4 = Desorption of gas by-products5 = Outdiffusion of by-product gas
EE143 – Ali Javey
CVD Deposition Rate [Grove Model]
F
F
=
=
3
1
kTE
os
G
ekk
hD
F1F3
Si
film
= thickness of stagnant layer
31 FF
D [ CG - CS] /
kS CS
EE143 – Ali Javey
G
sG
C
kh
F
11
13
timewithcontantN
F
dt
dx 3
N = atomic densityof deposited film
Film growth rate = F3 / N
Note: This result is exactly the same as the Deal-Grove modelor thermal oxidation with oxide thickness =0
Grove model of CVD (cont’d)
EE143 – Ali Javey
Deposition Rate versus Temp
[log scale] Rate
0
R T3
2gas transport limited
surface-reaction limited
1/T
low T
high T
EE143 – Ali Javey
(1) More conformal deposition, if T is uniform
(2) Inter-wafer and intra-wafer thickness uniformity less sensitive to gas flow patterns. (i.e. wafer placement).
Wafer topography
LPCVD Features
EE143 – Ali Javey
Comments about LPCVD
(2) Mass depletion problem
inout
more less
(1) Sensitivity to gas flow patternFurnace tube
wafers
EE143 – Ali Javey
• Ionized chemical species allows a lower process temperature to be used.• Film properties (e.g. mechanical stress) can be tailored by controllable ion bombardment with substrate bias voltage.
Plasma Enhanced CVD