VANTARugged. Revolutionary. Productive.

Handheld X-ray Fluorescence

VANTA Specifications

VantaTM handheld XRF analyzers are rugged and built for analytically demanding applications in the harshest environments. Vanta analyzers are IP 65* rated for protection against dust and water, are drop tested, and built to withstand a temperature range of -10 °C to 50 °C (14 °F to 122 °F).**

Vanta analyzers provide fast, accurate elemental analysis. Each device features Olympus’ new Axon™ technology, a revolution in XRF signal processing that provides accurate, repeatable results for greater productivity and a fast return on investment. Vanta analyzers feature an intuitive interface and application-specific software so new users can work with the device with minimal training. Data is easily exported via Wi-Fi, Bluetooth®, or USB.

www.olympus-ims.com

For enquiries - contactwww.olympus-ims.com/contact-us

48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900 12569 Gulf Freeway, Houston, TX 77034, USA, Tel.: (1) 281-922-9300

Vanta_Specs_EN_LTR_201610 • Printed in the USA • P/N: 920-404-EN Rev. B

No matter the model, each Vanta analyzer is engineered for durability and analytical superiority. Olympus manufactures VantaTM analyzers to suit a variety of applications depending on your needs.

M SeriesOur most powerful Vanta analyzers feature exceptional performance to handle the most demanding applications. Each M Series analyzer comes equipped a large-area silicon drift detector, your choice of either a rhodium (Rh) or a tungsten (W) anode, and a 50 kV X-ray tube.

C SeriesThe C Series combine value with superior speed, limits of detection (LODs), and elemental range. Each C Series analyzer is equipped with a silicon drift detector and your choice of an Rh or W anode 40 kV X-ray tube, or a silver (Ag) anode at 50 kV X-ray tube.

VANTA SpecificationsDimensions (W × H × D) 8.3 cm × 28.9 cm × 24.2 cm (3.25 in. × 11.4 in. × 9.5 in.)

Weight 1.70 kg (3.75 kb) with battery, 1.48 kg (3.25 lb) without battery

Excitation Source 4-Watt X-ray tube with application optimized anode material (rhodium (Rh), silver (Ag), or tungsten (W))M Series (Rh & W) and C Series (Ag): 8–50 kVC Series (Rh & W): 8–40 kV

Primary Beam Filtration 8-position auto selected filter per beam per mode

Detector M Series: Large area Silicon Drift DetectorC Series: Silicon Drift Detector

Power Removable 14.4 V Li-Ion battery or18 V power transformer 100-240 VAC, 50–60 Hz, 70 W max

Display 800 × 480 (WVGA) LCD with capacitive touch-screen supporting gesture control

Operating Environment Temperature: -10 °C to 50 °C (continuous duty cycle with optional fan)Humidity: 10% to 90% relative humidity non-condensing

Drop Test Military Standard 810-G 4-foot (1.3 M) drop test

IP Rating M Series IP 64: dust tight and protected against water splashing from all directions C Series IP 65: dust tight and protected against water jets from all directions

Pressure Correction Built-in barometer for automatic altitude and air density correction

GPS Embedded GPS / GLONASS receiver

Operating System Linux

Data Storage 4 GB embedded storage, micro SD slot for expandable storage

USB (2) USB 2.0 type A host ports for accessories such as Wi-Fi, Bluetooth®, and USB flash drives.(1) USB 2.0 type mini-B port for connection to computer.

WiFi Supports 802.11 b/g/n (2.4 GHz) via optional USB adapter

Bluetooth Supports Bluetooth and Bluetooth Low-Energy via optional USB adapter

Aiming Camera Full VGA CMOS camera

Panoramic Camera 5-megapixel CMOS camera with autofocus lens

The Vanta Series

is certified to ISO 9001, ISO 14001, and OHSAS 18001.

*M Series analyzers are IP 64 rated ** With optional fan. The fan assembly is IP 54 rated. Operates continuously at 33 °C without the fan. All specifications are subject to change without notice.All brands are trademarks or registered trademarks of their respective owners and third party entities. The Bluetooth® word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. and any use of such marks by Olympus Corporation is under license.Copyright © 2016 by Olympus.

VANTARugged. Revolutionary. Productive.

Handheld X-ray Fluorescence

VANTA for PMI

2 3

Built Tough for Maximum Uptime

You asked for a more rugged Positive Material Identification (PMI) analyzer. Olympus has responded by redefining what toughness means in portable XRF with our VantaTM series of analyzers.

PMI is important for industrial plant operators and component suppliers. Alloy mix-ups can result in component failure, leading to plant downtime or even loss of life. Handheld XRF has become an essential tool to help prevent such failures through nondestructive alloy identification and is viewed by OSHA as a Recognized and Generally Accepted Engineering Practice (RAGAEP). Vanta handheld XRF analyzers for PMI provide highly specific material chemistry to quickly and accurately identify pure metals and alloy grades. With Vanta analyzers, inspectors can quickly determine correct alloy installation in critical locations.

4 5

From simple alloy verification to precise chemistry, Vanta handheld XRF provides highly specific material chemistry to rapidly and accurately identify pure metals and alloy grades including:

• Stainless steels

• Chromium-molybdenum steels

• Nickel and nickel/cobalt alloys

• Low alloy steels

• Copper alloys

• Aluminum and wrought aluminum alloys

• Tool steels

• Zinc alloys

• Zirconium alloys

• Titanium alloys

• Cobalt alloys

• Magnesium alloys

• Exotic alloys

Traceability and Rapid ReportingPulling the trigger and taking an analysis is only one part of a material verification program. VantaTM handheld XRF has features such as two optional cameras, integrated GPS, and automatic time/date stamp that make it easy to customize, capture, and export comprehensive shot data for efficient record keeping and traceability. Vanta analyzers enable inspectors to create custom data label templates for each project, job, or vendor. Optional Wi-Fi and Bluetooth® connectivity make it easy to download results for archiving.

Weld Grade LibraryThe weld grade library is used alongside the standard inspection library for comprehensive PMI work enabling accurate identification of weld materials.

Residual/Tramp ElementsThe Vanta handheld XRF for PMI comes loaded with a residual “tramp” element library based on industry standards that set maximum tolerated concentrations for residual elements in grade families. Vanta analyzers measure trace levels of contaminating elements, important for many applications such as RE corrosion in HF alkylation units, sulfidation corrosion, and FAC corrosion without compromising or delaying fast, accurate, and conclusive grade matches.

In modern industrial environments, VantaTM analyzers are vital for:

• Complying with American Petroleum Institute (API) Recommended Practice (RP) 578 — Material Verification Program for New and Existing Alloy Piping Systems

• Detecting sulfidation corrosion susceptibility (API RP 939-C)

• Evaluating flow accelerated corrosion (FAC) susceptibility

• Discerning residual element corrosion susceptibility in hydrofluoric acid (HF) alkylation units

When inspection professionals need a reliable analytical tool to provide fast and accurate PMI data, they turn to Vanta analyzers. From piping, valves, welds, and components, to pressure vessels, Vanta analyzers provide anywhere, anytime testing with accurate and repeatable results.

Essential for Material VerificationPer API, ASME, and AWS codes and recommended practices, Vanta analyzers are important tools in a material verification program for new and existing assets within a plant or refinery. From verifying incoming warehouse material to final confirmation at the point of installation, Vanta analyzers provide essential asset integrity information to help prevent catastrophic or unplanned maintenance events and increase asset life expectancy.

• Confirm the material of construction

• Verify material against mill certificates and material test reports

• Identify non-traceable or improperly marked material

Vanta analyzers are the ideal tools to verify the chemical composition and grade of welds. The optional 3 mm aiming camera enables an inspector to accurately analyze thin weld beads independent of base material as well as other conjoined metals, alloys, and small fixture components, such as wires and solders. An optional panoramic camera saves images along with the analysis results for archiving and reporting.

6 7

Durable and Reliable for Any Job in Any EnvironmentRuggedWorking conditions can be tough on electronic devices, often causing breakdowns that cost time and money. VantaTM analyzers are durable for increased uptime and a low cost of ownership. Vanta handheld XRF analyzers are IP 65* rated to withstand rain, dirt, and dust, and are drop tested to U.S. Department of Defense standards (MIL-STD-810G) to help prevent breakages and costly repairs. The detector shutter on silicon drift detector models helps prevent punctures so you can analyze rough surfaces with confidence.

Able to withstand a temperature range of -10 °C to 50 °C (14 °F to 122 °F), Vanta analyzers ensure you get 100% testing time without wasting time waiting for it to cool, even in hot environments.** The devices are engineered for in-service inspection of high-temperature systems and hot sample surfaces up to 425 °C (800 °F). Their ruggedness and durability make Vanta analyzers resistant to damage for maximum productivity and uptime with minimal cost of ownership.

RevolutionaryEvery circuit, contour, and interface of Vanta handhelds is engineered to be the best of its kind. Vanta analyzers incorporate Olympus’ new Axon™ technology, a breakthrough in XRF signal processing that delivers accurate and repeatable test data and ensures inspectors get alloy chemistry and grade ID in 1–2 seconds for typical plant and refinery applications. Axon uses ultra-low-noise electronics that facilitate higher X-ray counts per second and faster results. Coupled with a new quad-core processor, Axon makes Vanta analyzers remarkably responsive, pushing the limits of performance so you get the best results in the least amount of time. Axon technology provides test-to-test and instrument-to-instrument repeatability. Whether it’s your first test on your first analyzer or your thousandth test with your hundredth analyzer, the Vanta handheld XRF gives you the same result every time.

Vanta analyzers accurately and repeatably detect and quantify:

• Residual Elements (RE) in low alloy and carbon steels

• Trace silicon (Si) in carbon steel per API RP 939-C

• Sulfur (S) and phosphorus (P) for in-service stainless steels

ProductiveVanta analyzers for PMI include innovative software features that enable inspectors to make accurate inspections with minimal training. Testing times that once took 5 to 10 seconds with other handheld XRF devices now take just 1 to 2 seconds with even greater accuracy and precision. The friendly, modern user interface is intuitive and customizable so that operators can begin using the device with minimal training.

Vanta analyzers maximize user throughput and make data archiving easy.

• A new, intuitive interface enables the user to quickly navigate the device’s settings and software functions.

• The UI can be configured based on a customer’s specific needs. Users can customize which software features and functions are displayed on the main screen.

• Data are easily exported via a USB flash drive, Wi-Fi, or Bluetooth®. Vanta analyzers are designed to enable powerful cloud applications.

• Vanta analyzers feature a clear, bright LCD touch screen that is readable in any light.

• Unique username and password login for each user.

• Balanced analyzer body and form factor for comfortable daily and extended use.

• Ergonomic buttons and an industrial-grade, push-button joystick enable users to easily navigate the system with gloved hands.

www.olympus-ims.com

For enquiries - contactwww.olympus-ims.com/contact-us

48 Woerd Avenue, Waltham, MA 02453, USA, Tel.: (1) 781-419-3900 12569 Gulf Freeway, Houston, TX 77034, USA, Tel.: (1) 281-922-9300

Vanta_PMI_EN_LTR_201610 • Printed in the USA • P/N: 920-402-EN Rev. B

M SeriesOur most powerful Vanta analyzers feature exceptional performance to handle the most demanding applications. Each M Series analyzer comes equipped a large-area silicon drift detector, your choice of either a tungsten (W) or rhodium (Rh) anode, and a 50 kV X-ray tube.

C SeriesThe C Series combine value with superior speed, limits of detection (LODs), and elemental range. Each C Series analyzer is equipped with a silicon drift detector and your choice of a Rh or W anode 40 kV X-ray tube, or a silver (Ag) anode at 50 kV X-ray tube.

OlympusOlympus is a leader in XRF technology with a reputation for quality and accuracy. We are committed to providing the best technical support and after-sales service for our products, applications, training, and technologies through our global network of sales and service teams.

No matter the model, the rugged, fast, and reliable VantaTM analyzer features Olympus’ AxonTM technology, and is rated to pass a 4 foot drop test, and is rated to IP 65.*

The Vanta Series

is certified to ISO 9001, ISO 14001, and OHSAS 18001.

*M Series analyzers are IP 64 rated ** With optional fan. The fan assembly is IP 54 rated. Operates continuously at 33 °C without the fan. All specifications are subject to change without notice.All brands are trademarks or registered trademarks of their respective owners and third party entities. The Bluetooth® word mark and logos are registered trademarks owned by Bluetooth SIG, Inc. and any use of such marks by Olympus Corporation is under license.Copyright © 2016 by Olympus.

33As

11.7310.54

1.321.2834Se

12.511.22

1.421.3835Br

13.2911.92

1.531.4836Kr

14.1112.65

1.641.5932Ge

10.989.89

1.221.1931Ga

10.269.25

1.121.130Zn

9.578.64

1.031.0129Cu

8.918.05

0.950.9328Ni

8.267.48

0.870.8527Co

7.656.93

0.790.7826Fe

7.066.4

0.720.7125

Mn6.495.9

0.650.6424Cr

5.955.41

0.580.5723V

5.434.95

0.520.5122Ti

4.934.51

0.460.4521Sc

4.464.09

0.40.420Ca

4.013.69

0.340.3419K

3.593.31

1.071.04 1.31.25

0.05 0.11

1H

3Li

4Be

12Mg

11Na

51Sb

29.7326.36

3.843.652Te

3127.47

4.033.7753I

32.2928.61

4.223.9454Xe

33.6229.78

4.424.1150Sn

28.4925.27

3.663.4449In

27.2824.21

3.493.2948Cd

26.123.17

3.323.1347Ag

24.9422.16

3.152.9846Pd

23.8221.18

2.992.8445Rh

22.7220.22

2.832.744Ru

21.6619.28

2.682.5643Tc

20.6218.37

2.542.4242

Mo19.6117.48

2.392.2941Nb

18.6216.62

2.262.1740Zr

17.6715.78

2.122.0439Y

16.7414.96

21.92

69Tm

57.5250.74

8.17.1870Yb

59.3752.39

8.47.4271Lu

61.2854.07

8.717.6668Er

55.6849.13

7.816.9567Ho

53.8847.55

7.536.72

66Dy

52.1246

7.256.565Tb

50.3844.48

6.986.2764Gd

48.743

6.716.0663Eu

47.0441.54

6.465.8562

Sm45.4140.12

6.215.6461

Pm43.8338.72

5.965.4360Nd

42.2737.36

5.725.2359Pr

40.7536.03

5.495.0358Ce

39.2634.72

5.264.8457La

37.833.44

5.044.65

101Md

102No

103Lr

100Fm

136.08120.60

21.7916.3899Es

132.78117.65

21.1716.0298Cf

129.54114.75

20.5615.6697Bk

126.36111.90

19.9715.3196

Cm123.24109.10

19.3914.9695

Am120.16106.35

18.8314.6294Pu

117.15103.65

18.2814.2893Np

114.18101.00

17.7413.9592U

111.398.44

17.2213.61

91Pa

108.4395.87

16.713.29

90Th

105.6193.35

16.212.9789Ac

102.8590.88

15.7112.65

38Sr

15.8414.17

1.871.8137Rb

14.9613.4

1.751.69

83Bi

87.3477.11

13.0210.8484Po

89.879.29

13.4511.1385At

92.381.52

13.8811.4386Rn

94.8783.78

14.3211.73

16S

2.462.31

17Cl

2.822.62

18Ar

3.192.96

82Pb

84.9474.97

12.6110.5581Tl

82.5872.87

12.2110.2780Hg

80.2570.82

11.829.9979Au

77.9868.8

11.449.7178Pt

75.7566.83

11.079.4477Ir

73.5664.9

10.719.1876Os

71.4163

10.368.9175Re

69.3161.14

10.018.6574W

67.2459.32

9.678.473Ta

65.2257.53

9.348.1572Hf

63.2355.79

9.027.956Ba

36.3832.19

4.834.4755Cs

34.9930.97

4.624.29

88Ra

100.1388.47

15.2412.3487Fr

97.4786.1

14.7712.03

15P

2.142.01

14Si

1.841.74

13Al

1.561.49

8O

0.52

9F

0.68

10Ne

2He

0.85

7N

0.39

6C

0.28

5B

0.18

For alloy LODs, please see the separate alloy analysis LOD specifications.

IIA IIIA IVA VA VIA VIIA

IIIB IVB VB VIB VIIBGroupVIII IB IIB

Lanthanides57–71

Actinides89–103

47Ag

Kß1Kα1

Lß1Lα1

Principal lineskeV

Principal lineskeV

SymbolAtomic Number

Limits of Detection

Low-Density Sample Types — (soils, powders, liquids)

ActiniumAluminumAntimonyArgonArsenicAstatineBariumBerylliumBismuthBoronBromineCadmiumCalciumCarbonCeriumCesiumChlorineChromiumCobaltCopperDysprosiumErbiumEuropiumFluorineFranciumGadoliniumGalliumGermaniumGoldHafniumHolmiumIndiumIodineIridiumIronKryptonLanthanumLeadLithiumLutetiumMagnesiumManganeseMercuryMolybdenumNeodymium

AcAlSbArAsAtBaBeBiBBrCdCaCCeCsClCrCoCuDyErEuFFrGdGaGeAuHfHoInIIrFeKrLaPbLiLuMgMnHgMoNd

8913511833855648353548206585517242729666863987643132797267495377263657823711225804260

Element Symbol Atomic #

90.881.4926.362.9610.5481.5232.190.1177.110.1811.9223.173.690.2834.7230.972.625.416.938.0546

49.1341.540.6886.1439.259.8968.855.7947.5524.2128.6164.96.412.6533.4474.970.0554.071.255.970.8217.4837.36

Kα1

102.851.5629.733.1911.7392.336.380

87.340

13.2926.14.010

39.2634.992.825.957.658.9152.1255.6847.040

97.4748.710.2610.9877.9863.2353.8827.2832.2973.567.0614.1137.884.940

61.281.36.4980.2519.6142.27

Kβ1

12.6503.60

1.2811.434.470

10.840

1.483.130.340

4.844.290

0.570.780.936.56.955.850

12.036.061.11.199.717.96.723.293.949.180.711.594.6510.550

7.660

0.649.992.295.23

Lα1

15.710

3.840

1.3213.884.830

13.020

1.533.320.340

5.264.620

0.580.790.957.257.816.460

14.776.711.121.2211.449.027.533.494.2210.710.721.645.0412.610

8.710

0.6511.822.395.72

Lβ1 Element Symbol Atomic # Kα1 Kβ1 Lα1 Lβ1

NeNiNbNOsOPdPPtPoKPrPmPaRaRnReRhRbRuSmScSeSiAgNaSrSTaTcTeTbTlThTmSnTiWUVXeYbYZnZr

1028417768461578841959619188867545374462213414471138167343526581906950227492235470393040

0.857.4816.620.39630.5221.182.0166.8379.293.3136.0338.7295.8788.4783.7861.1420.2213.419.2840.124.0911.221.7422.161.0414.172.3157.5318.3727.4744.4872.8793.3550.7425.274.5159.3298.444.9529.7852.3914.968.6415.78

08.2618.620

71.410

23.822.1475.7589.83.5940.7543.83108.43100.1394.8769.3122.7214.9621.6645.414.4612.51.8424.941.0715.842.4665.2220.6231

50.3882.58105.6157.5228.494.9367.24111.35.4333.6259.3716.749.5717.67

00.852.170

8.910

2.840

9.4411.130

5.035.4313.2912.3411.738.652.71.692.565.640.41.380

2.980

1.810

8.152.423.776.2710.2712.977.183.440.458.413.610.514.117.421.921.012.04

00.872.260

10.360

2.990

11.0713.450

5.495.9616.715.2414.3210.012.831.752.686.210.41.420

3.150

1.870

9.342.544.036.9812.2116.28.13.660.469.6717.220.524.428.42

1.032.12

NeonNickelNiobiumNitrogenOsmiumOxygenPalladiumPhosphorusPlatinumPoloniumPotassiumPraseodymiumPromethiumProtactiniumRadiumRadonRheniumRhodiumRubidiumRutheniumSamariumScandiumSeleniumSiliconSilverSodiumStrontiumSulfurTantalumTechnetiumTelluriumTerbiumThalliumThoriumThuliumTinTitaniumTungstenUraniumVanadiumXenonYtterbiumYttriumZincZirconium

PHOTON ENERGIES, IN ELECTRON VOLTS, OF PRINCIPAL K- AND L-SHELL EMISSION LINES

Olympus Corporation of the Americas | 48 Woerd Avenue | Waltham, MA 02453 | Tel: 1-781-419-3900 | Fax: 1-781-419-3980 | www.olympus-ims.com

specificationsvanta_pmivanta_periodic