Thickness of a Thin Film - Cleveland State University...– Incident beam is split into reflected...
Transcript of Thickness of a Thin Film - Cleveland State University...– Incident beam is split into reflected...
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Thickness of a Thin Film
Krista FreemanMax Orseno
Achille Nicoletti
6 o’clock p.m., March 10, 2010
Optics Laboratory, PHY455
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Theory: Michelson Interferometer
• Invented by Albert Michelson in
1881
• Amplitude splitting device
– Incident beam is split into reflected
and transmitted beams, each with a
smaller amplitude than incident
• Interference of split/recombined
beams produces circular or
straight-line fringes
– Fringe characteristics directly related
to difference in OPD of two beams
• Interpretation of fringes allows for:
– Comparison of wavelengths
– Measurement of refractive index of
gases and transparent solids. http://www.millersville.edu/physics/experiments/current.php
http://www.search.com/reference/Kilogram
http://en.wikibooks.org/wiki/Special_Relativity/Print_version
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Theory: Thin Film Interference
• Start at the beginning:
interference effects are observable in sheet
transparent materials
– Thin film: a layer of sheet
transparent material whose
thickness is of the order of
a given wavelength of
electromagnetic radiation
http://twilit.wordpress.com/2008/03/15/bubbles-and-interference/
http://www.answers.com/topic/opticshttp://electron9.phys.utk.edu/phys136d/modules/m9/film.htm
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Theory: OPD
OPD = Optical Path Difference
Λ nf AB( ) BC( )+[ ]⋅ n1 AD( )⋅− AB( ) BC( )d
cos θt( )
AD AC( ) sin θi( )⋅ Λ2 nf⋅ d⋅
cos θt( )n1 AD( )⋅−
Snell's Law:
AD( ) AC( )nf
n1
⋅ sin θt( )⋅
AC( ) 2 tan θt( )⋅
Λ2 nf⋅ d⋅
cos θt( )1 sin θt( )2
−
⋅ Λ 2 nf⋅ d⋅ cos θt( )⋅
OPD Λ 2 n f⋅ d⋅ cos θ t( )⋅
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Theory: Min/Max Conditions
Phase Difference = δ OPD Λ 2 nf⋅ d⋅ cos θ t( )⋅ k02 π⋅
λ 0
δ ko Λ⋅ ± π δ
4 π⋅ nf⋅
λ 0
d⋅ cos θ t( )⋅ ± π δ4 π⋅ d⋅
λ 0
nf2
n2
sin θ i( )2⋅−( )
1
2
⋅ ±⋅ π⋅
____________________________________________________________________________________________________
Maximum at δ 2 m⋅ π⋅ Minimum at δ 2 m⋅ ±⋅ 1⋅( ) π⋅
2 m⋅ π⋅4 π⋅ nf⋅
λ 0
d⋅ cos θ t( )⋅ π− 2 m⋅ 1−( ) π⋅4 π⋅ nf⋅
λ 0
d⋅ cos θ t( )⋅ π−
π 2 m⋅ 1+( )4 π⋅ nf⋅
λ 0
d⋅ cos θ t( )⋅nf
λ 0
λ f
2 m⋅ π⋅4 π⋅ nf⋅
λ 0
d⋅ cos θ t( )⋅nf
λ 0
λ f
d cos θ t( )⋅ 2 m⋅ 1+( )λ f
4⋅ (maxima) d cos θ t( )⋅ m
λ f
2⋅ (minima)
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Theory: Fringes of Equal Inclination
• Fringes of Equal
Inclination
– Formed by different rays of
incident light ALL WITH
SAME INCIDENT ANGLE
• If source is extended,
there will be many rays of
different incident angles–
each will form a fringe
– Rays with larger OPD
between them form fringes
closest to center
Hecht, Eugene. Optics (4th Edition). Addison Wesley. Figure 9.20 Page 403
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Theory: Fringes of Equal Inclination
• For “thick” thin films, we find fringes of equal inclination by viewing the film at near-normal incidence (viewing screen parallel to film)– Called Haidinger
Fringes after Austrian physicist Wilhelm Karl Haidinger (1795-1871)
http://es.wikipedia.org/wiki/Archivo:Wilhelm_Carl_Ritter_von_Haidinger_%28edit%29.jpg
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Theory: Fringes of Equal Inclination
http://www.optics.arizona.edu/Milster/380A%20Lab/Lab%209%20-%20Michelson%20Interferometer/OPTI%20380A%20Lab%209%20-%20Michelson%20Interferometer%20Presentation%20Slides.pdf
θp
p λ0⋅
d
1
2
=
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Objectives
• Record the position of the micrometer after every 100 whole fringes pass through a specific point
• Plot mirror displacement Vs. change in micrometer reading. Slope is equal to a conversion factor to be implemented in the determination of the film thickness
• Determine the film thickness by using the following formulas:
2
1)1(
dnt
dtn
=
=−n = index of refraction of
film
t = film thickness
d = distance from reference
point to color fringe pattern
on the film
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Procedure
• Use Michelson Interferometer to center the fringe pattern using a laser as our source
• Choose a reference point on the pattern and count a total of 1000-2000 fringes that pass by displacing the mirror using the micrometer.
• Plot the mirror displacement vs. the change in the micrometer reading. Slope will be a straight line. It is a calibration factor for the interferometer and converts micrometer displacement to mirror displacement.
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Procedure
• Move mirrors until only 2-3 fringes are visible.
• Turn micrometer until there is a change in curvature of the fringe pattern.
• This is the point where the fringes appear as straight lines, and where the white light fringes will appear.
• Locate the colored fringe pattern on the thin film by observing this pattern through the detector.
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Procedure
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Procedure
• Insert the sapphire plate in the adjustable leg
with clay.
• Locate the colored fringe pattern on the film
caused by the optical path difference (OPD)
due to the plate.
• Record the displacement needed for this
colored fringe. There are two colored fringes
caused by the OPD. One at a distance d1
and one at d2. The fringe pattern at d2 is
extremely difficult to see.
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Setup
Beam Splitter
Source
Micrometer
Sapphire
plate
Adjustable
Mirror
Diffuser
Detector
Fixed
Mirror
Reference
Point
(Thumb
Tack)
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Setup
Detector OPD
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Procedure Alignment
Move 100 fringes and record
micrometer displacement.
plot fringes*632.8nm/2 vs
micrometer reading and a
correction factor is obtained
to use in the visible light
part of this lab.
Slope translates micrometer
movement into pathlength
difference in Michelson
system. -9.0 -8.5 -8.0 -7.5 -7.0 -6.5
0
100000
200000
300000
400000
D
Linear Fit of everyhundred_D
Fri
ng
es*6
32.8
nm
/2
Micrometer Displacement (mm)
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Calibration Plot with Error Estimates
0 100000 200000 300000 400000
6.5
7.0
7.5
8.0
8.5
9.0
Calibration Plot (Conversion Factor)
Mic
rom
ete
r R
eadin
g [m
m]
Fringe Count * λ/2 [nm]
Y A B X⋅+
A 8.74811 ±⋅ 0.00507⋅( ) mm⋅
B 4.97741E-6− ±⋅ 2.09536E-8⋅( )mm
nm⋅
ConvFactor B1−
2.009 105
×nm
mm=:=
σConvFactor1
B2
σB⋅ 845.769nm
mm=:=
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Issues With Experimental Observations
• The way the manual is written, the d1
would be presented before d2
• Apparently this is not the case; due to our not seeing the real d1 phenomenon first
and mistaking d2 for d1
• Once these are switched around, the
index of refraction is very close to
expected value
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Resultsmm
first interference
pattern observed
second interference
pattern observedin air lines
line
13.065
13.083
13.09
13.07
13.07
13.065
mm:= line1
11.04
11.055
11.035
11.025
11.04
15.10
mm:= line2
9.035
8.955
8.995
8.985
9.02
17.11
mm:=
The first five are shrinking OPD, micrometer mirror moving in.
The sixth is OPD enlarging, micrometer mirror moving out. Important to note, mirror moving out had less observed
intensity than going in. In both directions however,
constructive interference was observed.
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Results
Reading line2 line−
4.03−
4.128−
4.095−
4.085−
4.05−
4.045
mm=:=
n 1.76:=
d Reading ConvFactor⋅
0.81−
0.829−
0.823−
0.821−
0.814−
0.813
mm=:=
td
n 1−d Reading ConvFactor⋅
td
n 1−
→
1.065
1.091
1.083
1.08
1.071
1.069
mm=:=
ttheo 1 ±⋅ 0.05⋅( )mm
%error
t ttheo−
ttheo
6.534
9.125
8.252
7.988
7.063
6.93
%=:=
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ERROR ANALYSISt
d
n 1−σt
1
n 1−σd⋅
d Reading ConvFactor⋅ σd Reading σConvFactor⋅( )2ConvFactor σReading⋅( )2
+
σReading 0.01mm:=
σd Reading σConvFactor⋅( )2ConvFactor σReading⋅( )2
+
3.957 103−
×
4.028 103−
×
4.004 103−
×
3.997 103−
×
3.971 103−
×
3.967 103−
×
mm=:=
σt1
n 1−σd⋅
5.206 103−
×
5.3 103−
×
5.268 103−
×
5.259 103−
×
5.225 103−
×
5.22 103−
×
mm=:=
t
1.065
1.091
1.083
1.08
1.071
1.069
mm= +/-
5.206 103−
×
5.3 103−
×
5.268 103−
×
5.259 103−
×
5.225 103−
×
5.22 103−
×
mm
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More ERROR ANALYSIS
N 6:= ∆ N
0
N 1−
i
xi( )
2
∑=
⋅
0
N 1−
i
xi∑
=
2
− 1.051 107−
× m2
=:=
A20
N 1−
i
xi( )∑
=
−
0
N 1−
i
xi
yi
⋅( )∑=
⋅
0
N 1−
i
xi( )
2
∑=
0
N 1−
i
yi∑
=
⋅+
∆8.75 10
3−× m=:=
B2
N
0
N 1−
i
xi
yi
⋅( )∑=
⋅
0
N 1−
i
xi∑
=
0
N 1−
i
yi∑
=
⋅−
∆4.999−=:=
A 8.748mm= A2 8.75mm=
B 4.977−= B2 4.999−=
χ2
0
N 1−
i
yi
A− B xi
⋅−
σReadingi
2
∑=
0.254=:=2
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Conclusions
• Our value for the index of refraction is close to expected value when we switch d1 and d2. The index of refraction for the other value is not close. What we need is an equation for d3 to plug in the data collected and compare to d2 index of refraction.
n1 1.818±.010 n2 .409±5.475103−
⋅
n for sapphire glass is around 1.76 [1]
Percent Error
mean n1( ) nexpected−
nexpected
100 3.302=mean n2( ) nexpected−
nexpected
100⋅ 76.755=
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Observations
• Small sapphire plate, 13mmX.5mm did not reveal any type of interference pattern; could not compare this
• Instrumentation is not delicate enough for extreme precision and adjustment; budget issue
• Any slight movement would misalign system
• No observed “d1” fringe pattern
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Sources of Error
• Table, body contributing to vibrations that actually misaligned system
• Reading the micrometer scale: fatigue, eye strain, wrong angle, reading dial directionally wrong
• Not having perpendicularness throughout system with mirrors and sapphire plate; additional OPD present
• Convection currents due to white light and air currents in general make interference lines wiggle back and forth. For insane precision this would be very problematic
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References
• http://hypertextbook.com/facts/2007/GaryChang.shtml• http://en.wikibooks.org/wiki/Special_Relativity/Print_version• http://twilit.wordpress.com/2008/03/15/bubbles-and-interference/• http://electron9.phys.utk.edu/phys136d/modules/m9/film.htm• http://www.answers.com/topic/optics• http://es.wikipedia.org/wiki/Archivo:Wilhelm_Carl_Ritter_von_Haidin
ger_%28edit%29.jpg• http://www.optics.arizona.edu/Milster/380A%20Lab/Lab%209%20-
%20Michelson%20Interferometer/OPTI%20380A%20Lab%209%20-%20Michelson%20Interferometer%20Presentation%20Slides.pdf
• Hecht, Eugene. Optics (4th Edition). Addison Wesley, August 2001. • PHY455 Laboratory Manual• Lab Reports by Brain Vynahlek