Summer '07 at CLS
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Summer '07 at CLS Small Angle X-Ray Scattering Peter Chen Chithra Karunakaran & Konstantine Kaznatche
description
Small Angle X-Ray Scattering. Summer '07 at CLS. Peter Chen. Chithra Karunakaran & Konstantine Kaznatcheev. to provide an alternative imaging technique to STXM : to understand structural information of sample. Purpose. (Feser/Jacobsen). - PowerPoint PPT Presentation
Transcript of Summer '07 at CLS
Summer '07 at CLS
Small Angle X-Ray Scattering
Peter Chen Chithra Karunakaran & Konstantine Kaznatcheev
Purpose
to provide an alternative imaging technique to STXM : to understand structural information of sample
(Feser/Jacobsen)
(Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999))
Reconstruction
image
hologram
diffraction pattern
SEM image of letters, fabricated by gold dots, (100 nm in diameter each); diffraction pattern (middle) and reconstructed image (Miao, Charalambous, Kirz, Sayre, Nature 400, 342 (1999)).
Only intensity is obtained, phase information is lost.
Purpose
to image smaller samples
0 10 20 30 40
10
20
30
40
latex spheres 5%, visible light
a=0.44mk /x=2.53; n=1.5
0 0.001 0.002
0.001
0.002a=88nm /x=0.5; n=1.5
Mie polar diagrams
sm
all
x=
a/
la
rge0 300 600 900
300
600
900
0
45
90
135
180
a=2.2mk/ x=12.6; n=1.5
0 100 200
100
200
0
45
90
135
180
a=10nm/x=25.3; n=0.998-i0.0011
0 0.010.020.030.040.05
0.01
0.02
0.03
0.04
0.05
0
45
90
135
180
a=2nm/x=5; n=0.998-i0.0011
Au particles; x-ray
to test stability and integrity of the optics and the microscope
Tasks
Tasks: create software determine camera setup
in the STXM experimentation
take data with respect to different variables
orientation geometry nature of samples
Andor Vacuum supported CCD. 512 x 512 12.3 x 12.3 mm
Software
Software Visual Basic .NET 2003
Requirements basic: single imaging,
video, exposure settings, etc.
long exposure aXis readable data and
header output beamline read and control
Mechanics
Implementation external placement
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SAXS
incident beamfocus
sample
scattered wave
1st order beam
camera
detector
zone plate
OSA
Scans on the Mesh
xx
x
Exposure: 100 sec
Energy: 710 eV
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Change in Focus
Defocusing of beam
by 30 um by 10 um
Change in Energy
Energy: 709 eVEnergy: 705 eVEnergy: 703 eV
Change in Slit Size
10 um x 10 um slit size20 um x 20 um slit size50 um x 50 um slit size100 um x 100 um slit size
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Consistency
Iron ParticlesExposure: 100 secEnergy: 710 eVBackground Corrected
10 nm particle.
Camera Placement Issue
