Lecture 1 Introduction to Semiconductors and Semiconductor ...
PY3P04: Physics of Semiconductors, Lecture 4
Transcript of PY3P04: Physics of Semiconductors, Lecture 4
PY3P04: Physics of Semiconductors, Lecture 4
Prof. David O’Regan, Quantum Materials Theory <[email protected]>
Approx. 12 lectures and 3 tutorials, before study week. Two continuous assessment problem sets, each at 25%.
• Take a look at defect states within Bohr’s atomic model.
• Discuss carrier concentrations and Fermi level in extrinsic semiconductors, and their T dependence.
• Specifically, we look in detail at the low-temperature freeze-out region, i.e., that where the impurities are mostly not ionised.
• This means that donor levels are full, or acceptor levels are empty of electrons. We’ll look at their statistics too.
• READING: Hook & Hall (5), Kittel (8), Sze (2 & 3), and/or Elliott (6).
In this lecture, we2
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Impurity states (shallow)• Suppose that P is a donor atom in Si, thus becoming ionised P+.
• There is an attractive Coulomb interaction between the donor e- and P+, analogous to the electron-proton interaction in the H atom.
• However, semiconductors are dielectrics, so that the Coulomb interaction is reduced by a factor of the relative permittivity εr. Furthermore, the donor e- has an effective mass not equal to m0.
binding energy = Ec ≠ Ed = 1‘2
r
múe
m0
EHydrogen 1s
Bohr radius = ad = ‘rm0
múe
aHydrogen 1s
EH = e4m08h2‘2
0= 13.6 eV, aH = h2‘0
fim0e2 = 0.53 ◊ 10≠10m
• Using the macroscopic dielectric constant here is a drastic approximation.
• Diffuse GaMnAs acceptor magnetisation density (DO’R)
Can be very large!
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Impurity states continued• An example: substitutional B in Si. B accepts an
additional e-, becoming B-, releasing a hole.
• What is the ionisation energy of the acceptor impurity state, that is the diffuse anti-Hydrogen 1s like orbital that the hole occupies at low T? • Diffuse GaMnAs acceptor
magnetisation density (DO’R)
Ec ≠ Ed = 1�2
r
múe
m0
EHydrogen 1s … Ea ≠ Ev = 1�2
r
múh
m0
Eanti-Hydrogen 1s
ad = �rm0
múe
aHydrogen 1s … aa = �rm0
múh
aanti-Hydrogen 1s
• For Si: me ¥ 1.06m0, mh ¥ 0.59m0, �r ¥ 11.7Ec ≠ Ed ¥ 0.1 eV, Ea ≠ Ev ¥ 0.06 eV, ad ¥ 5.8 Å, aa ¥ 10.5 Å
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Impurity states continued
• For Si: me ¥ 1.06m0, mh ¥ 0.59m0, �r ¥ 11.7Ec ≠ Ed ¥ 0.1 eV, Ea ≠ Ev ¥ 0.06 eV, ad ¥ 5.8 Å, aa ¥ 10.5 Å
Ed (eV) P As Sb
Si 0.045 0.049 0.039
Ge 0.012 0.0127 0.0096
Ea (eV) B Al Ga
Si 0.045 0.057 0.065
Ge 0.0104 0.0102 0.0108
• Observed values, from Kittel (p374):
• At 300K, kBT = 0.026 eV, and acceptor (donor) levels are largely ionised, that is their carriers are promoted to the valence (conduction) bands.
• Why the discrepancy between observed values and the continuous medium approximation? Mainly, the Bohr radius is still small enough for spatial inhomogeneity to matter. Also, anisotropy in permittivity and mass.
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Carrier Concentrations
E
Ec
Ev
Ed
Ev
Ec
• Donor (Acceptor) added: weakly-bound impurity levels yield electrons (holes) to the conduction (valence) band.
• At T=0, the donor (acceptor) levels are completely full (empty), so there is still a small gap and no conduction. S. M Sze
n =⁄ top
Ec
Dn (E) fn (E) dE p =⁄ Ev
bottomDp (E) fp (E) dE
Ea
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Carrier Conc. (extrinsic)• Same expressions as for intrinsic case:
Nc = 232�mú
ekBT
h2
4 32
; Nv = 232�mú
hkBT
h2
4 32
np = n2i = NcNv exp
3≠ Eg
kBT
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EF ¥ 12 (Ec + Ev) ≠ 1
2kBT log (p/n)
+ 34kBT log (mú
h/múe)
n ¥ Nc exp3
≠Ec ≠ EF
kBT
4
p ¥ Nv exp3
≠EF ≠ Ev
kBT
4
• p is no longer equal to n, and both interdepend with EF, what to do?
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Fraction of dopants ionised
N+D = ND ≠ N0
D = ND ≠ NDf (ED) ∆ N+D /ND = 1 ≠ f (ED)
N≠A = NAf (EA) ∆ N≠
A /NA = f (EA)
• The number of neutral donors is the number of donors times the probability of finding an electron at the donor impurity energy:
• The number of ionised acceptors is the number of acceptors times the probability of finding an electron at the acceptor impurity energy:
• The Fermi-Dirac distribution must be modified to take into account the degeneracy factor g, that is the number of spins and pertinent bands.
• When a donor is ionised, two impurity quantum states created, one each for spin-up and spin-down. Occupancy of one precludes other: g=0.5.
f (ED) =31
2 exp3
Ed ≠ EF
kBT
4+ 1
4≠1, f (EA) =
32 exp
3Ea ≠ EF
kBT
4+ 1
4≠1
• When an acceptor is ionised, an electron is taken from the two-fold (for spin) valence band, so that g=2. Band-degeneracy: g=4 in Si and Ge.
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Fraction of dopants ionised• Example: Si with [P] = 1016 cm-3, T = 300K. Assume that it’s fully ionised:
múe ¥ 1.06m0
• We know that for P in Si, Ec ≠ Ed ¥ 0.045 eV
n = 232fimú
ekBT
h2
4 32
exp3
≠Ec ≠ EF
kBT
4
∆ EF = Ec + kBT log1n
22
≠ kBT32 log
32fimúekBT
h2
4¥ Ec ≠ 0.206 eV
N+D /ND = 1 ≠ f (ED) = 1 ≠
3exp
3Ed ≠ EF
kBT
4+ 1
4≠1
¥ 1 ≠3
exp3
≠0.045 + 0.2060.026
4+ 1
4≠1= 0.998
• Note that the approximation of full ionisation only holds if
• [P] = 1018 cm-3
ND π Nc
∆ EF = Ec ≠ 0.086 eV ∆ N+D /ND ¥ 0.83 0 1
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Carrier Concentration• Three distinct
temperature regimes:
• Freeze-out Region: temperature low enough that many donor (acceptor) impurity levels remain occupied (unoccupied).
• Extrinsic Region: dopants fully ionised, no change with increasing T.
• Intrinsic Region: high T, intrinsic carrier creation dominates.
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