FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics: 1:...

23
FE8113 ”High Speed Data Converters”

Transcript of FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics: 1:...

Page 1: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

FE8113 ”High Speed Data Converters”

Page 2: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Course outline

Focus on ADCs. Three main topics:1: Architectures

”CMOS Integrated Analog-to-Digital and Digital-to-Analog Converters,” 2nd ed., Rudy van de Plassche, Kluwer Academic Publishers, Ch. 1-3

2: Digital background calibration Selected papers

3: State-of-the-art converters Selected papers

Page 3: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Part 1: Architectures

First three chapters of van de Plassche’s textbookCh.1: The Converter as a black boxCh.2: Specifications of convertersCh.3: High-Speed A/D Converters

Page 4: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Chapter 2Specifications of converters

Page 5: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Digital data coding

TTL, CMOS, ECLSerial to parallel conversion

- Data latched out by latch clock- Directly drives switches in DA-converters- Output glitches

- Deglitching- Switch optimization- Accurate board layout for matched delays

Serial input register

Parallel data latches

Bit switches

Binary weighted networkReference

input

Analogoutput

Latch

Data

Clock

Page 6: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Digital coding schemes

Offset binary code Major carry transition for signal around zero Glitch sensitive

Sign-magnitude code Signal inversion around zero Low-level linearity issues

Twos complement Used for computational operations

Page 7: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

DC specifications

Absolute accuracy Full-scale input or output compared to the absolute standard of the

National Bureau of Standards Mostly related to the reference source

Relative accuracy Deviation of the output signal or code from a straight line Also called integral non-linearity (INL) No missing codes (monotonicity): INL<±1/2LSB

000 001 010 011 100 101 110 1110

1/8

1/4

3/8

1/2

5/8

3/4

7/8

Analog output

Digitalinput

Page 8: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Nonlinearity calculation

Binary w. output bit: Full-scale value B:

Ideal step-size:

Linearity error of kth bit:

INL:

2mm mb

1 1

0 0

2 2 1n n

m nm m

m m

B

1

012 1 2 1

n

mm

n n

BS

1

02 1 22 1

n

mk km

k kn

1

1 11 0

1 1 10

22 1 2

2 1 2 1

n

nm nn km

n n m nn nm

Page 9: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Nonlinearity calculation II

Monotonicity: D/A: No increase in

analog output value when input increases by a value of one LSB:

000 001 010 011 100 101 110 1110

½-2LSB

½-1LSB

½

½+2LSB

Analog output

Digitalinput

½+1LSB

Non-monotonicconverter

Missingcode

1 1

10

2 1

2 1 2

1

2

n n

m nnm

LSB

INL LSB

To guarantee monotonicity the sum of errors for all bits must never exceed ½ LSB level

Page 10: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other static specifications

DNL Quote from book: ”The difference between two adjacent analog

signal values compared to the step-size (LSB-weight) of a converter generated by transitions between adjacent pairs of digital code numbers over the full range of the converter” (...)

Offset: Non-zero output when zero input.

Temperature dependence: For thermal mismatch below ¼ LSB:

Supply voltage variations: Typically specified, e.g. ±5%

1

1

: 1

: 1

out m out m

input m input m

DAC DNL S C S C LSB

ADC DNL A Q A Q LSB

2 per degree C

4

n

T

Page 11: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Dynamic specification

SNR Signal power divided by

integrated noise power. Harmonics not included If harmonics included:

SNDR: Signal to noise and distortion ratio

6.02n+1.76 dB SFDR

Ratio between full-scale fundamental and largest harmonic distortion component

ENOB (SNDR-1.76)/6.02

Page 12: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Element matching vs. INL

Requirements: INL≤ ½ LSB See book for details.

Based on measurement of many samples. σ=mismatch standard variation.

Page 13: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

ENOB and SDNR vs. INL model

Transfer-function with INL:

INL-model (differential):

Out vs. in with three coefficients in INL-model:

Gives odd harmonics:

Only one coefficient:

Resulting ENOB:

1 ( )out inV V INL LSB

2 4 6( ) cos(2 ) cos(4 ) cos(6 ).....INL LSB a t a t a t

2 4 6cos( ) 1 cos(2 ) cos(4 ) cos(6 )out sigV a t a t a t a t

2 2 4

4 6 6

1 11 cos( ) cos(3 )

2 2

1 1cos(5 ) cos(7 )

2 2

out sig sig

sig sig

V a a t a a a t

a a a t a a t

2 2

4

12

42 2distortion

aP a

2log 1 3

2log 2

42 24

1.5 2 2 //12 / 4

, INL

ns

INL s

S SENOB INL a q

N N q a

2log 1 3

2log(2)reduction

INLn

Page 14: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

SFDR and IMD vs. INL model

Distortion: Quantization component: SFDR:

Intermodulation:

4

1 1

2 2distort sa a INL q

1.52 bitsNquantization sa q

1.520log 2 2bits bitsN NSFDR INL

2 1 2 2 4 1 4 2( ) cos(2 ) cos(2 ) cos(4 ) cos(4 ).....INL LSB a t a t a t a t

1 1 2 2

1 1sin sin

2 2sig sig sigV a t a t

1 1 2 2 2 1 2 2

1 1sin sin cos(2 ) cos(2 )

2 2out sig sigV a t a t a t a t

1 1 2 1 2

1 2 2 2 1

1int sin 2

41

int sin 24

sig

sig

a a t

a a t

12

1,2 2

22

int , bitsN

s

Sa INL q INL

a

2

1,2

20log 2 2int

bits bitsN NSINL SFDR

Page 15: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Glitches

Important for performance of DAC

Major carry-code transition Modelled with square glitch

with area/energy (for MSB glitch):

Compare to LSB-energy:

+

-

R

DAC

MSB

LSB

Vout

01111

10000

glitch difE At

12nLSB sE At

Page 16: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Noise

Thermal noise No correlation with q-noise:

In a 16b DAC with 98.1dB quantization-SNR, the thermal noise must be less than -108dB for 0.5dB loss in total SNR.

2 2

2

2

/1

/

system quantization thermal

quantizer

system quantizer

thermal

N N N

S NN N

S N

Page 17: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Noise

ADC: Noise dithers the comparator in an ADC

Estimating comparator output-noise by using probability of wrong desicion: Noise: σ = ½ LSB:

Bias quantizer ½ LSB over quantization-level:

s

2s

3s

3s

2s

s

0

Qj

Qj-1

Qj-2

Qj+1

Aj+1

Aj

Aj-1

2 2 2_ _ 3 _ 50.954 0.046 0.00006total qns LSB qns LSB qns LSBP q q q

2_1.37total qns LSBP q

2 2_ 2 _ 40.317 0.0027total qns LSB qns LSBP q q

2_1.14total qns LSBP q

s

2s

3s

3s

2s

s

0 Qj

Qj-1

Qj-2

Qj+1

Aj+1

Aj

Aj-1

Qj+2

Aj+2

Page 18: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other error sources

Minimum reference step-size: The possibility noise amplitude is

bigger than kσ

Min. Reference step size should be 6-7 times greater than comparator RMS-noise

Bit-error rate Number of desicion errors For ADC typically 10-15 to 10-10

Max sampling-rate Rate where DR is decreased 3dB

Digital signal feed-through Couple HF signals to the output

22 1

2 ( )k

Q k ek

k 2Q(k)

3 2.9∙10-3

4 6.7∙10-5

5 5.9∙10-7

6 2.0∙10-9

7 2.6∙10-12

8 1.3∙10-15

Page 19: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other error sources Distortion

Signal band also present at multiples of fs.

Inter-modulation products may occur when applied to analog amplifier.

Mixing fs-fin with fs+fin Product at 2fs Harmonic

Mixing 2(fs-fin) with fs+fin Product at fs-3fin Non-harmonic

Only harmonics in baseband if fs>4fin.

PSRR Immunity no power-supply noise

Settling-time Very important in any successive

approximation ADC (internal DAC) Aquisition-time

Track-command to response delay Limits max fs

fsfs-finfin fs+fin

fsfs-fin fs+fin

2fin

finfs-3fin

Page 20: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other error sources Aperture-time

Time-difference between hold-command and the time the sample is taken

Can give input-dependent error in sample-and-hold amplifier

Sample-and-hold step Charge-feedthrough can give step in

transition from sample-to-hold phase Droop-rate

Discharge of hold-capacitor in hold-phase

Signal feed-through To capacitor in hold mode Must be attenuated 70-80dB in 8-10bit

ADC Noise in S/H-amplifier

Input-noise will be tracked Peak-noise must be below LSB-level

Page 21: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other error sources

Overview of S/H-specifications Settling-time Aquisition-time Aperture time / jitter S/H step Droop rate Hold-mode feedthrough S/H amplifier noise

Page 22: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

Other error sources Analog system bandwidth

In an ideal converter system the maximum analog bandwidth is equal to fs/2.

ERB Effective resolution bandwidth Bandwidth where resolution is

within -3dB of nominal. Figure of merit:

Standard for comparison

FOM expected to drop factor 10 every 10th year

2 2ENOBin

PowerFOM

f

468

1012141618202224

1kHz 10kHz 100kHz 1MHz 10MHz 100MHz 1GHz

1µW

1mW1W 1kW

FOM=1pJ

Page 23: FE8113 ”High Speed Data Converters”. Course outline Focus on ADCs. Three main topics:  1: Architectures ”CMOS Integrated Analog-to-Digital and Digital-to-

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