Electronic Engineering Department Universitat Politècnica de Catalunya
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Transcript of Electronic Engineering Department Universitat Politècnica de Catalunya
ACTIVITIES OF THE GROUP OF HIGH PERFORMANCE INTEGRATED CIRCUITS DESIGN GROUP
Variations-Aware Circuit Designs for Microprocessors
Marc Pons, Thesis Advisors: Francesc Moll, Jaume Abella
Electronic Engineering DepartmentUniversitat Politcnica de
Catalunya
OUTLINE
Integrated Circuits ManufacturingThe Need for
RegularityConclusion
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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IC MANUFACTURING
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[ASML]
LITHOGRAPHY LIMITS
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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RESOLUTION ENHANCEMENT TECHNIQUES
RETs are applied to mitigate process variationsHowever RETs are
computationally expensive for large circuits with arbitrary layout
patterns
DECREASING YIELD
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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[Synopsys]
INCREASING COSTS
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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DECREASING BENEFITS
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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DECREASING YIELD
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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[Synopsys]
REGULARITY
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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LAYOUT LAYERS
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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CONVENTIONAL(IRREGULARITY)
OUR PROPOSAL(REGULARITY)
ADDER LAYOUTS
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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CONCLUSION
Lithography Process Variations reduce Integrated Circuits YieldWe
propose to include Regularity in design to mitigate Process
VariationsWe are studying the trade-offs involved
Thank you for your attention!
1st Barcelona Forum on Ph.D. Research in Electronic Engineering
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WYS is not WYG
RETs are computationally expensive and very time-consuming for
large integrated circuits with arbitrary layout patterns