Design for Manufacturing Course- By DFR
description
Transcript of Design for Manufacturing Course- By DFR
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Design for Manufacturing
IPC APEX 2012
Cheryl Tulkoff
Senior Member of the Technical Staff
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DfM Course Abstract In the electronics industry. the quality and reliability of any product is highly dependent upon the
capability of the manufacturing supplier, regardless of whether it is a contractor or a captured shop.
Manufacturing issues are one of the top reasons that companies fail to meet warranty expectations,
which can result in severe financial pain and eventual loss of market share. What a surprising
number of engineers and managers fail to realize is that focusing on processes addresses only part
of the issue. Design plays a critical role in the success or failure of manufacturing and assembly.
Designing printed boards today is more difficult than ever before because of the increased lead free process temperature requirements and associated changes required in manufacturing. Not only has
the density of the electronic assembly increased, but many changes are taking place throughout the
entire supply chain regarding the use of hazardous materials and the requirements for recycling.
Much of the change is due to the European Union (EU) Directives regarding these issues. The
RoHS and REACH directives have caused many suppliers to the industry to rethink their materials
and processes. Thus, everyone designing or producing electronics has been or will be affected.
This course provides a comprehensive insight into the areas where design plays an important role in the manufacturing process. This workshop addresses the increasingly sophisticated PCB
fabrication technologies and processes - covering issues such as laminate selection, micro/via and
through hole formation, trace width and spacing, and solder mask and finishes in relation to lead
free materials and performance requirements. Challenges include managing the interconnection of
both through hole and surface mount at the bare board level. The soldering techniques will discuss
on pad design, hole design/annular ring, component location and component orientation. Attendees
will have a unique opportunity to obtain first-hand information on design issues that impact both
leaded and lead free manufacturability.
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Instructor Biography Cheryl Tulkoff has over 20 years of experience in electronics manufacturing with an
emphasis on failure analysis and reliability. She has worked throughout the electronics
manufacturing life cycle beginning with semiconductor fabrication processes, into printed
circuit board fabrication and assembly, through functional and reliability testing, and
culminating in the analysis and evaluation of field returns. She has also managed no clean
and RoHS-compliant conversion programs and has developed and managed comprehensive
reliability programs.
Cheryl earned her Bachelor of Mechanical Engineering degree from Georgia Tech. She is a published author, experienced public speaker and trainer and a Senior member of both ASQ
and IEEE. She holds leadership positions in the IEEE Central Texas Chapter, IEEE WIE
(Women In Engineering), and IEEE ASTR (Accelerated Stress Testing and Reliability)
sections. She chaired the annual IEEE ASTR workshop for four years and is also an ASQ
Certified Reliability Engineer.
She has a strong passion for pre-college STEM (Science, Technology, Engineering, and Math) outreach and volunteers with several organizations that specialize in encouraging pre-
college students to pursue careers in these fields.
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Cheryls Background
22 years in Electronics IBM, Cypress
Semiconductor, National Instruments
SRAM and PLD Fab (silicon level) Printed Circuit Board Fabrication, Assembly, Test, Failure Analysis, Reliability Testing and Management
ISO audit trained, ASQ CRE, Senior ASQ & IEEE Member, SMTA, iMAPS
Random facts: Rambling Wreck from
Georgia Tech
14 year old son David, Husband Mike, Chocolate Lab Buddy
Marathoner & Ultra Runner
Ran Boston 2009 in 3:15
Ran 100 miles in 24:52 on 2/4-2/5, 2012
Triathlete Sprint, Olympic, and Half. Ironman finisher in CDA, Idaho in June 10
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Course Outline MODULE 1: INTRODUCTIONS
Intro to Design for Manufacturing
Key Global DfM Guidelines
MODULE 2: INDUSTRY STANDARD DESIGN RULES
Overview of Industry Standard Organizations
Examples: IPC, JEDEC, ISO
Description of common standards in use
MODULE 3: OVERVIEW OF DFM TASKS
Types of Review Processes
Important of Good Communication
Failure Analysis
DfM Examples
MODULE 4: DfM - COMPONENT
Component Robustness Electrolytic Capacitors
V Chip Capacitors
Ceramic Capacitors
Temperature Sensitivity Level
Moisture Sensitivity Level
Pb-free Issues
Case Studies
MODULE 5: DfM PRINTED CIRCUIT BOARD Surface Finishes
Cracking & Delamination
Laminate Selection
PTH Barrel Cracking
CAF
Trace Width and Spacing
Strain/Flexure Issues & Pad Cratering
Cleanliness
Electrochemical Migration
MODULE 6: DfM - SOLDER
Soldering
Lead Free Solder Alloy Update
Copper Dissolution
Mixed Assembly
Case Study
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Module 1: Introduction
Introduction to Design for Manufacturing (DfM)
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Design for Manufacturing
Definition The process of ensuring a design can be
consistently manufactured by the designated supply chain with a minimum number of defects
Requirements An understanding of best practices (what fails
during manufacturing?)
An understanding of the limitations of the supply chain (you cant make a silk purse out of a sows ear)
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DfM Failures
DfM is often overlooked in the design process for some of the following
reasons: Design team often has poor insight into supply chain
(reverse auction, anyone?)
OEM requests no feedback on DfM from supply chain
DfM feedback consists of standard rule checks (no insight)
DfM activities at the OEM are not standardized or distributed
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Introduction to Design for Manufacturing (DfM)
DfM is the process of proactively designing products to:
Optimize all of the manufacturing functions: supplier selection and management, procurement, receiving, fabrication, assembly, quality control, operator training, shipping, delivery, service, and repair.
Assure that critical objectives of cost, quality, reliability, regulatory compliance, safety, time-to-market, and customer satisfaction are known, balanced, monitored, and achieved.
Successful DFM efforts require the integration of product design and process planning into a cohesive, interactive activity know as Concurrent, Collaborative, or Simultaneous Engineering.
If existing processes are to be used, new products must be designed to the parameters and limitations of these processes regardless of whether the product is build internally or externally.
If new processes are to be utilized, then the product and process need to be developed concurrently and mindfully (carefully considering the risks associated with new)
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Why DfM?
DfM is a proven, cost-effective strategic methodology.
Early effective cross functional involvement: Reduces overall product development time (less changes, spins,
problem solving)
Results in a smoother production launch.
Speeds time to market.
Reduces overall costs.
Designed right the first time.
Optimizes # of parts
Optimizes # of process steps and use of correct, efficient steps
Reduces labor costs to repair and resolve issues
Improves overall production efficiency.
Build right the first time = less rework, scrap, and warranty costs.
Improved quality and reliability results in:
Higher customer satisfaction.
Reduced warranty costs.
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Design Engineering Influence on Lifecycle Costs
Design/product engineering typically accounts for only 8-10% of a product budget.
Design decisions can determine up to 70-80% of the manufacturing cost of the product and have significant impact on quality, reliability and serviceability.
These decisions determine cost throughout the lifecycle of the product. Once these costs are locked in, they are very difficult to change. Require Engineering Change Orders (ECOs), design spins, supplier
qualifications, and/or certification (UL, FDA) modifications
Production decisions (material handling, process flow, assembly equipment) account for less than 20-30% of product costs.
Total lifecycle cost, impacted by quality, and reliability, can be better managed and optimized by developing products and their associated manufacturing processes together with cross functional or collaborative teams aware of design for Manufacturing and sourcing best practices.
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Why DfM?
Architectural Design for Reliability, R. Cranwell and R. Hunter, Sandia Labs, 1997
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Why DfM? (cont.) Reduce Costs by Improving
Manufacturability Upfront
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Old Style Product Development - Sequential Over The Wall
R & D
PRODUCT
ENRG. MANUF./
ASSEMBLY
DEALERS
DISTRIBUTORS
SERVICE
VALIDATION
TESTING
Requires 4.5 - 5
CHAMBER
Stress
Feedback Loops
Before DfM, it was We designed it ~ You build it! Design engineers worked independently, then transferred designs
over the wall to the next department or external to the company (CM). Eventually manufacturing has to assemble the product.
Usually inherit a product not designed for their processes and too late to make changes. Manufacturing forced struggle to meet yield, quality, cost or delivery targets. Often required trial & error crisis management Followed by launch delays, then quality and reliability issues.
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Key Design for Manufacturing Guidelines
The foundation of a robust Design for Manufacturing system is a set of design guidelines and tasks to help the product team improve manufacturability, increase quality, reduce lifecycle cost and enhance long term reliability.
These guidelines need to be customized to your companys culture, products, technologies and based on a solid understanding of the intended production system whether internal or external.
The next module will review global Top 10 DfM guidelines and tasks that are applicable to most industries and processes.
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DfM Guideline #1: Know Your History
Those who do not learn from history are doomed to repeat it. Learn from the past: Process yields, Returns, Corrective Actions
Processes, Recalls, etc.
Develop and implement strategies to address and prevent recurrence of mistakes.
Know and understand problems and issues with current and past products with respect to:
Manufacturability Delivery Quality Repairability & serviceability, Regulatory issues Recalls Especially critical if carrying over existing technologies into new designs.
Best approach is to have an effective system for capturing and disseminating this historical knowledge throughout the organization.
Absolute minimum should be focused brain storming sessions (post-mortems) to collect lessons learned/best practices from all areas of the organization.
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DfM Guideline #2: Standardize Design Methods
Standardize design, procurement, processes, assembly, and equipment throughout your organization Reduces overall cycle time. Simplifies training and tasks. Reduces repeated mistakes Improves opportunity for bulk discounts. Improves opportunity for automation and operation
standardization. Dont Redesign the Wheel
Never custom design something that you can buy off the shelf.
Limit exotic or unique components. Higher prices due to low volumes and less supplier
competition. Lower quality for exotic components. More opportunity for supply chain disruptions.
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DfM Guidelines #3: Simplify the Design
by Parts Reduction
Parts reduction is one of the best ways to reduce the cost of fabricating and
assembling a product and increase quality
and reliability. Reduces parts costs.
Reduces direct labor costs.
Reduces process equipment.
Reduces number or workstations.
Fewer opportunities for defective parts.
Fewer opportunities for assembly errors.
Everything should be made as simple as possible, but not one bit simpler.
- Albert Einstein
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DfM Guideline #3: Simplify the Design
Parts Reduction Parts reduction is also one of the best ways to reduce
structural costs. Fewer parts rippling through the entire organization
reduces the work load for every department at every level.
Fewer items to be processed by:
Product Development Engineering, Purchasing, Development/Test Labs.
Manufacturing Support Inventory Warehousing, Material Handling, Service Parts. Quality Management.
Manufacturing facilities Facility Size, Equipment, Processing/Assembly Time & Labor
Provides more opportunities for process automation.
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DfM Guidelines #3: Simplify the Design - Methods for Part Reduction
Modular design
Use complete modules and subassemblies, instead of designing,
fabricating and assembling everything yourself, simplifies every
level of your activities.
Modules can be manufactured and tested before final assembly.
Modules facilitate the use of standard components to minimize
product variations.
Modules add flexibility to product update in the redesign
process
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DfM Guidelines #3: Simplify the Design - Methods for
Part Reduction
Parts Commonality via Multi-Use/Multi-Functional Parts Develop an approved or preferred parts lists or a standardized BOM
(Bill of Materials) to encourage different products lines to share common parts.
Designer CAD/CAE systems can be configured to access preferred designs and parts catalogs.
Whenever possible use one-piece structures from injection molding, extrusions, castings and powder metals or similar fabrication techniques instead of bolt/glue together multi part assemblies.
Establish part families of similar parts based on proven materials, architecture and technologies that are scaled for size or functionality
Use Multi-functional parts that perform more that one function, example:
An electric conductor that also serves as a structural member,
A cover or base plate that also serves as a heat sink
Incorporate guiding, aligning, or self-fixturing features into housing and structures.
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DfM Guideline #4: Design for Lean Processes
Fundamental Principle of Lean
Anything that does not add
value to the product is waste
and must be reduced or
eliminated
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DfM Guideline #4: Design for Lean Processes Lean supply, fabrication and assembly processes are
essential design considerations.
Simple lean fabrication/processing/assembly is more
likely to be done quickly and correctly
Right part at the right station at the right time
Reduced throughput time equals faster time to market
and lower costs (reduced labor hours and faster turns).
Designs that are easy to assemble manually will be more
easily automated.
Assembly that is automated will be more uniform, more
reliable, and of higher quality.
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DfM Guideline #4: Design for Lean Processes
Develop and use standard guidelines appropriate for the process being performed. Examples:
Common hole sizes, lines, and spacings Standard soldering temperature profiles Standard handling, avoid MSL > 3 components For assembly - design for human factors the Visual Factory
Allow for visual, audio and/or tactile feedback to ensure correct assembly operations.
Makes it obvious to follow the correct process flow. Bottlenecks and problems are more easily identified
Provide adequate access clearances for tools and hands. Design in self aligning and self guiding features such as tapered parts,
guide pins or groves.
Design work to use standard tools and settings: crimpers, splicers, cutters, solder iron tips, drill bit sizes, torque settings, wire sizes
Minimizes tool clutter and decision making on what to use
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DfM Guideline #5: Eliminate Waste
Seven Types of Waste 1. Overproduction
Build more than required, before required.
2. Waiting
Stop build to look for parts, tools, material, information
3. Transportation/Moving
Moving material, parts, tooling
Transferring product between locations, into/out of racks
4. Process Inefficiencies
Unnecessary operations, too many inspections, not building to customer spec
5. Inventories/Storage
Excess raw material, excess WIP
6. Unnecessary Motions
Walking, climbing, bending, searching, identifying
7. Defective products
Low Yields, mistakes leading to large reworks, sorting, inspection
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DfM Guideline #6: Design for Parts Handling Minimize handling to correctly position, orient, and
place parts and avoid multiple or complex assembly
orientations.
Use non-symmetrical parts where possible. When symmetrical parts are needed, use keying features to ensure proper orientation. Make orienting and mating parts as visually obvious as possible.
Use parts oriented in magazines, bands, tape, reels or strips when possible or use parts designed to consistently orient themselves when fed into a process
Reduce and avoid parts that can be easily damaged, bent, or broken.
Parts should be designed with surfaces that can be easily grasped, placed or fixtured.
Reduce the need for temporary fastening and complex fixtures.
Begin assembly with a large base component with a low center of gravity to add other parts to. Assembly should proceed vertically with other parts added on top
Exception: avoid upward orientation of debris /contamination sensitive features.
Prevent dust or moisture from falling into electrical, hydraulic, pneumatic connector or lines
Use appropriate and safe packaging for parts but minimize the creation of waste
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DfM Guideline #7: Design for Joining & Fastening Design for efficient joining and fastening.
Fasteners increase the cost of manufacturing, handling and feeding operations.
Screws, bolts, nuts and washers are time-consuming to assemble & difficult to automate.
Increased potential for defects (missing and improper assembly).
Avoid threaded fasteners when possible, consider alternative, Consider the use of snap-fit. Evaluate adhesive bonding techniques.
Where fasteners must be used, minimize variety Use guidelines and standardize fasteners to minimize the
number, size, and variation. Self-tapping and chamfered screws are preferred. Use captive fasteners when possible.
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DfM Guidelines #8: Use Error Proofing Techniques
Mistakes will happen, What can go wrong will go wrong. Anticipate and Eliminate opportunities for error
Use error proofing techniques in product design and assembly Make the correct assembly process visually obvious, well-defined and
clear cut, remove confusion and interpretation.
Have written instructions in 1 location only no competing documents Minimize wording in instructions, use pictures, icons, photos instead
Key unique parts so that they can be inserted only in the correct location. Use notches, asymmetrical holes and stops to mistake-proof the
assembly process. Design verifiability into the product and its components.
Sight, Sound or Field - use visual, audio or tactile feedback Use color coding Electronic products can be designed to contain self-test
diagnostics
Avoid or simplify adjustments or modifications
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DfM Guideline #9: Design for Process Capabilities
Make use of specific production DFM guidelines or know the process capabilities of the production
equipment you expect to use. Avoid unnecessarily tight tolerances and tolerances that are
beyond the inherent capability of the manufacturing processes or
operators in a continuous production situation. Tighter is not
always better!
Perform tolerance stack up analyses on multiple, connected processes and parts.
Determine when new production process capabilities are needed and allow sufficient time to develop/optimize new processes,
determine optimal process parameters and establish controlled
processes.
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DfM Guideline #10: Design for Test, Repair, & Serviceability
Defects will occur. Design for ease of test and repair will make these processes more efficient, cost effective, and reliable.
Use recommended component spacing to allow for safe repair or replacement
Design in diagnostics, self tests, meaningful error messages, and diagnostic interfaces.
ESD Considerations - provide warning labels and appropriate workstations where needed.
Standardize approaches and methods.
Minimize parts variety, minimize tools/special tools needed
Minimize disassembly steps to access replaceable/repairable Items.
Consider unfastening and refastening, disassembly and reassembly issues.
Use self-fastening and self-jigging Features when possible.
Consider impact of adhesives, coating, and potting
Wiring/Hose Interconnection consider disconnect and reconnect capabilities.
Failed products are often returned to the manufacturer for service and failure analysis. Where possible, use the production test equipment/setup for returns analysis.
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Module 2: Industry
Standard Design Rules
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Industry Standards IPC, JEDEC, ISO
Make use of existing industry standards where possible
Tried and true
Well tested and accepted
But may represent only minimum acceptable requirements or concerns not relevant to your needs. Remember to modify and extend requirements as needed to customize for your product and environments!
Their forums provide opportunities to solicit free advice and feedback on issues you face and questions you have.
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IPC Design Requirement/Guideline References
The IPC is a global trade association dedicated to the competitive excellence and financial success of all facets of the electronic interconnect industry including design, printed circuit board manufacturing and electronics assembly. http://www.ipc.org/
Provide a forum to brings together all industry players, including designers, board manufacturers, assembly companies, suppliers, and original equipment manufacturers.
Provides resources to: Management improvement and technology enhancement
Creation of relevant standards
Protection of the environment
Pertinent government relations.
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Circuit Assembly Design Standards
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IPC Design Requirement/Guideline References
IPC-2221- Generic Standard on Printed Board Design
IPC-2221A is the foundation design standard for all documents in the IPC-2220 series. It establishes the generic requirements for the design of printed boards and other forms of component mounting or interconnecting structures, whether single-sided, double-sided or multilayer.
3 Performance Classes Class 1 General Electronic Products - consumer products,
Class 2 Dedicated Service Electronic Products Communications equipment, sophisticated business machine, instruments and
military equipment where high performance, extended life and uninterrupted service is desired but is not critical.
Class 3 High Reliability Electronic Products Commercial, industrial and military products where continued performance or
performance on demand is critical and where high levels of assurance are required...
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IPC Design Requirement/Guideline References
IPC-4101 - Specification for Base Materials for Rigid and Multilayer Printed Boards Covers the requirements for base materials that are referred to as laminate or
prepreg. These are to be used primarily for rigid and multilayer printed boards for electrical and electronic circuits.
IPC-7351 - Generic Requirements for Surface Mount Design and Land Pattern Standards Covers land pattern design for all types of passive and active components,
including resistors, capacitors, MELFs, SSOPs, TSSOPs, QFPs, BGAs, QFNs and SONs. The standard provides printed board designers with an intelligent land pattern naming convention, zero component rotations for CAD systems and three separate land pattern geometries for each component that allow the user to select a land pattern based on desired component density.
Includes land pattern design guidance for lead free soldering processes, reflow cycle and profile requirements for components and new component families such as numerous forms of chip array packages and "pull-back" QFN and SON devices.
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IPC Design Requirement/Guideline References
IPC-CM-770E Component Mounting Guidelines for Printed Boards
Provides effective guidelines in the preparation and attachment of components for printed circuit board
assembly and reviews pertinent design criteria,
impacts and issues. It contains techniques for
assembly (both manual and machines including SMT,
BGA and flip chip) and consideration of, and impact
upon, subsequent soldering, cleaning, and coating
processes.
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IPC Design Requirement/Guideline References
IPC-7095 Design and Assembly Process Implementation for BGAs Provides guidelines for BGA inspection and repair, addresses reliability
issues and the use of lead-free joint criteria associated with BGAs.
IPC J-STD-001D - Requirements for Soldered Electrical & Electronic Assemblies.
J-STD-001D is world-recognized as the sole industry-consensus standard covering soldering materials and processes. This revision now includes support for lead free manufacturing, in addition to easier to understand criteria for materials, methods and verification for producing quality soldered interconnections and assemblies. The requirements for all three classes of construction are included
3 Construction Classes defined.
Class 1 General Electronic Products
Class 2 Dedicated Service Electronic Products
Class 3 High Reliability Electronic Product
These documents are used as a reference for the case studies and information in this workshop
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JEDEC/IPC Joint Standards
JEDEC is the leading developer of standards for the solid-state industry. Almost 3,300 participants, appointed by some 300 companies work together in 50 JEDEC committees to meet the needs of every segment of the industry, manufacturers and consumers alike. The publications and standards that they generate are accepted throughout the world. All JEDEC standards are available online, at no charge. www.jedec.org
Commonly referenced JEDEC/IPC Joint Standards standards: J-STD-020D.01: JOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW
SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES:
This document identifies the classification level of nonhermetic solid-state surface mount devices (SMDs) that are sensitive to moisture-induced stress. It is used to determine what classification level should be used for initial reliability qualification. Once identified, the SMDs can be properly packaged, stored and handled to avoid subsequent thermal and mechanical damage during the assembly solder reflow attachment and/or repair operation. This revision now covers components to be processed at higher temperatures for lead-free assembly.
JS9704 : IPC/JEDEC-9704: Printed Wiring Board (PWB) Strain Gage Test Guideline This document describes specific guidelines for strain gage testing for Printed Wiring Board
(PWB)assemblies. The suggested procedures enables board manufacturers to conduct required strain gage testing independently, and provides a quantitative method for measuring board flexure, and assessing risk levels. The topics covered include: Test setup and equipment; requirements; Strain measurement; Report format
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ISO Standards ISO (International Organization for Standardization) is the world's
largest developer and publisher of International Standards. www.iso.org
ISO is a network of the national standards institutes of 162 countries, one member per country, with a Central Secretariat in Geneva, Switzerland, that coordinates the system.
ISO is a non-governmental organization that forms a bridge between the public and private sectors. On the one hand, many of its member institutes are part of the governmental structure of their countries, or are mandated by their government. On the other hand, other members have their roots uniquely in the private sector, having been set up by national partnerships of industry associations.
Therefore, ISO enables a consensus to be reached on solutions that meet both the requirements of business and the broader needs of society.
Some commonly used ISO Standards ISO 9001: Quality Management Systems ISO 14050: Environmental Management Systems ISO 13485: Medical devices -- Quality management systems --
Requirements for regulatory purposes
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Commonly Used Lab Test & Reference Standards
IPC-TM-650: Test Methods Manual
Series available for free download at www.ipc.org
http://www.ipc.org/ContentPage.aspx?PageID=4.1.0.1.1.0
Section 1.0:Reporting and Measurement Analysis Methods
Section 2.1:Visual Test Methods
Section 2.2:Dimensional Test Methods
Section 2.3:Chemical Test Methods
Section 2.4:Mechanical Test Methods
Section 2.5:Electrical Test Methods
Section 2.6:Environmental Test Methods
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Module 3: Overview of DfM Tasks
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Common Types of DfM Review Processes
Informal Gut Check Review Performed by highly experienced engineers.
Difficult with transition to original design manufacturers (ODM) in developing countries.
Tribal knowledge
Formal Design reviews Internal team
External experts
Automated (electronic) design automation
(ADA) software Modules automate DfM rule checking.
Electronic manufacturing service (EMS) providers
Perform DfM as a service
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Design for Manufacturing (DfM)
Formal DfM Reviews and Tools Sometimes Overlooked Organization may lack specialized expertise. More design organizations completely insulated/disassociated from manufacturing. Dependence on local experience.
DfM Reviews Needs to be Performed for: Bare Board Circuit Board Assemblies Chassis/Housing Integration Packaging System Assembly
DfM Needs to be conducted in conjunction with the actual electronic assembly source. What is good DfM for one supplier and one set of assembly equipment may not be
good for another.
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Use a Root Cause Problem Solving Methodology
Critical that your organization has a formal root cause problem solving methodology used both internally and externally.
This is the best way to incorporate relevant material into your customized Design for Manufacturing and Sourcing guidelines.
This ties in closely with DfM Guideline #1: Know Your History!
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Why 8D Problem Solving?
Problem Statement:
Simply fixing the symptoms of a problem, more often than not, leads to band-aid solutions
End up solving the same problem several times
Other areas experience similar problems
Solution:
Do root cause analysis and follow through with permanent corrective actions on significant problems
Break the endless loop
Drive Continuous Improvement Save money & efficiencies
Reap benefits beyond the discrete issue
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The 8 D Suite
Approach
Tools
Process
Continuous
Improvement
Products/Processes
Improved
Assign
Review
Approve
Six Steps
Brainstorming
Is/Is Not
Why- Why
Etc.
Stop & Study
Learn
Apply Lessons Broadly
Mgt. Involvement
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The 8 Disciplines (8D)
1. Create the Team
2. Problem Description and Data Analysis
3. Containment Actions
4. Perform Root Cause Analysis
5. Choose and Verify Corrective Action
6. Implement Corrective Action
7. Apply Lessons Learned
8. Celebrate Success / Close the Issue
(8D forms can also be used by suppliers. )
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General Words of Wisdom on Failure Analysis
Before spending time and money on Failure Analysis, consider the following: Consider FA order carefully. Some actions you take will limit or
eliminate the ability to perform follow on tests.
Understand the limitations and output of the tests you select. Use partner labs who can help you select and interpret tests for
capabilities you dont have. Be careful of requesting a specific test. Describe the problem and define the data and output you need first.
Pursue multiple courses of action. There is rarely one test or one root cause that will solve your problem.
Dont put other activities on hold while waiting for FA results. Understand how long it will take to get results
Consider how you will use the data. How will it help you? Information? Change course, process, supplier? Dont pursue FA data if it wont help you or you have no control over the
path it might take you down. Some FA is just not worth doing.
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Why is Failure Analysis Knowledge
important?
There are always more problems than resources!
If you dont analyze, learn from, and prevent problems, you simply repeat
them. You list never gets smaller.
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Failure Analysis Techniques Returned parts failure analysis always starts with Non-Destructive
Evaluation (NDE)
Designed to obtain maximum information with minimal risk of
damaging or destroying physical evidence
Emphasize the use of simple tools first
(Generally) non-destructive techniques:
Visual Inspection
Electrical Characterization
Time Domain Reflectometry
Acoustic Microscopy
X-ray Microscopy
Thermal Imaging (Infra-red camera)
Superconducting Quantum Interfering Device (SQUID)
Microscopy
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Failure Analysis Techniques
Destructive evaluation techniques Decapsulation
Plasma etching
Cross-sectioning
Thermal imaging (liquid crystal; SQUID and IR also good after decap)
SEM/EDX Scanning Electron Microscope / Energy dispersive X-ray Spectroscopy
Surface/depth profiling techniques: SIMS-Secondary Ion Mass Spectroscopy, Auger
OBIC/EBIC
FIB - Focused Ion Beam
Mechanical testing: wire pull, wire shear, solder ball shear, die shear
Other characterization methods FTIR- Fourier Transform Infra-Red Spectroscopy
Ion chromatography
DSC Differential Scanning Calorimetry
DMA/TMA Thermo-mechanical analysis
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Electrical Characterization
Most critical step in the failure analysis process Can the reported failure mode be replicated?
Persistent or intermittent?
Intermittent failures often incorrectly diagnosed as no trouble found (NTF)
Least utilized to its fullest extent
Equipment often shared with production and R&D
Approach dependent upon the product Component
Bare board
PCB assembly
Sometimes performed in combination with environmental exposure Characterization over specified temperature range
Characterization over expected temperature range
Humidity environment (re-introduction of moisture)
Not designed to induce damage!
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Electrical Characterization: Components
Parametric characterization Comparison of performance to datasheet specifications
Curve tracer Applies alternating voltage; provides plot of voltage vs. current response
Valuable in characterizing diode, transistor, and resistance behavior
Time domain reflectometry (TDR) Release and return of electrical signal along a given path
Measurement of phase shift of return signal indicates potential location of electrical open
Other characterization equipment Inductance/capacitance/resistance (LCR) meter
High resistance meter (leakage current < nA)
Low resistance meter (four wire; < milliohms)
Use of additional environmental stresses Semiconductor-based devices
Temperature rise or temperature/humidity could trigger elevated leakage current
Passive components
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Electrical Characterization: Bare Board
In-circuit testing (ICT)
Primarily performed on in-line failures (bed of nails or flying probe)
Detection of electrical opens and shorts
Based on triggering rules (pass/fail)
Allows for relatively accurate identification of failure site
Time domain reflectometry (TDR)
Resistance measurements (manual)
Binary approach
Environmental stresses
Electrical short (temperature/humidity)
Electrical open (temperature cycling)
Requires continuous monitoring (intermittent behavior)
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Electrical Characterization: PCB Assembly
Functional Most valuable, if product is experiencing partial, permanent failure
JTAG (joint task action group) boundary scan Allows for testing ICs and their interconnections using four I/O pins (clock, input
data, output data, and state machine mode control)
Allows for relatively accurate identification of failure site, but rarely performed on failed units (primarily replacement for In Circuit Test-ICT)
Oscilloscope Measures voltage fluctuations as a function of time (passive)
Useful in probing operational circuitry
Digital capture provides better documentation capability
Available stand alone or PC-based
Isolation of attached components Attempt to perform as much electrical characterization without component
removal
Consider trace isolation (knife, low speed saw)
Environmental stresses Approach similar to bare board
-
Some Simple FA Tools: Flexible Light Sources & Mirrors
Make is easier to look under and around areas on an assembly
http://www.brandsplace.com/0246-ste10150a.html
http://minimicrostencil.com/mini_mirror.htm
http://www.metronusa.com/mirrors1.htm
-
Failure Analysis: Temperature Tools
Cold Spray and hot plates to simulate
fails at temperature
extremes
-
Failure Analysis Tools: Dye N Pry Capability
Allows for quick (destructive) inspection for cracked or fractured solder joints under leadless components (BGAs, QFNs)
http://www.electroiq.com/index/display/packaging-article-display/165957/articles/advanced-packaging/volume-12/issue-1/features/solder-joint-failure-analysis.html
-
Failure Analysis Dremel Tool Induce Vibrations
A Dremel tool can be used to induce local vibration
during debugging
http://www.dremel.com
-
DfM Example: Flex Cracking of Ceramic Caps
Due to excessive flexure of the board
Occurrence
Depanelization
Handling (i.e., placement into a test jig)
Insertion (i.e., mounting insertion-mount connectors or daughter cards)
Attachment of board to other structures (plates, covers, heatsinks, etc.)
-
Flex Cracking (Case Studies)
Screw Attachment Board Depaneling
Connector Insertion Heatsink Attachment
-
Flex Cracking (cont.)
-
Flex Cracking (cont.)
Drivers
Distance from flex point
Orientation
Length (most common at 1206 and above; observed in 0603)
Solutions
Avoid case sizes greater than 1206
Maintain 30-60 mil spacing from flex point
Reorient parallel to flex point
Replace with Flexicap (Syfer) or Soft Termination (AVX)
Reduce bond pad width to 80 to 100% of capacitor width
Measure board-level strain (maintain below 750 microstrain, below 500 microstrain preferred for Pb-free)
-
DfM Example (Plated Through Hole vs. Microvia)
What should be the minimum diameter of a PTH in your design?
What should be the maximum aspect ratio (PCB Thickness / PTH Diameter)?
When should you switch to microvias?
Answer: Depends! Supplier Reliability needs
-
PTH Diameter
Data from 26 board shops
Medium to high complexity
62 to 125 mil thick
6 to 24 layer
Results
Yield loss after worst-case assembly
Six simulated Pb-free reflows
Courtesy of CAT
Yield loss can results in escapes to the customer!
-
Are Microvias more reliable than PTHs?
Depends!!
Quality Some fabricators have no problems
Some have more problems with microvias
Some have more problems with PTHs
Some have problems with both
Reliability A well-built microvia is more robust than a
well-built PTH
-
PTH vs. Microvia Courtesy of CAT
PTH Quality
Microvia Quality
-
Summary (PTH and Microvias)
The capability of the PCB industry in regards to hole diameter tends to segment Very high yield (>13.5 mil)
High yield (10 13.5 mil)
Lower yield (< 10 mil)
If 8 mil drill diameter or less is required Consider using PCQR2 to identify a capable supplier
Consider using interconnect stress test (IST) coupons to ensure quality for each build
Consider transitioning to microvias (6 mil diameter)
-
DfM Examples (cont.)
Utilize thermal reliefs on all copper planes when practical Reduces thermal transfer rate between PTH and copper plane
Allows for easier solder joint formation during solder (especially for Pb-free)
Allows for better hole fill
Copper
Plane
PTH
Laminate
Copper
Spoke
Courtesy of D. Canfield (Excalibur Manufacturing)
-
Module 4: Components
Component Robustness
-
Robustness - Components o Concerns
o Potential for latent defects after exposure to Pb-free reflow temperatures
o 215C - 220C peak 240C - 260C peak
o Drivers
o Initial observations of deformed or damaged components
o Failure of component manufacturers to update specifications
o Components of particular interest
o Aluminum electrolytic capacitors
o Ceramic chip capacitors
o Surface mount connectors
o Specialty components (RF, optoelectronic, etc.)
-
117
Ceramic Capacitors (Thermal Shock Cracks)
o Due to excessive change in temperature o Reflow, cleaning, wave solder, rework
o Inability of capacitor to relieve stresses during transient conditions.
o Maximum tensile stress occurs near end of termination o Determined through transient thermal
analyses
o Model results validated through sectioning of ceramic capacitors exposed to thermal shock conditions
o Three manifestations o Visually detectable (rare)
o Electrically detectable
o Microcrack (worst-case)
NAMICS
AVX
-
118
Thermal Shock Crack: Visually Detectable
AVX
-
119
Thermal Shock Crack: Micro Crack
o Variations in voltage or temperature will drive crack propagation
o Induces a different failure mode
o Increase in electrical resistance or decrease capacitance
DfR
-
120
Corrective Actions: Manufacturing
o Solder reflow
o Room temperature to preheat (max 2-3oC/sec)
o Preheat to at least 150oC
o Preheat to maximum temperature (max 4-5oC/sec)
o Cooling (max 2-3oC/sec)
o In conflict with profile from J-STD-020C (6oC/sec)
o Make sure assembly is less than 60oC before cleaning
o Wave soldering
o Maintain belt speeds to a maximum of 1.2 to 1.5 meters/minute
o Touch up
o Eliminate
-
121
Corrective Actions: Design
o Orient terminations parallel to wave solder
o Avoid certain dimensions and materials (wave soldering)
o Maximum case size for SnPb: 1210
o Maximum case size for SAC305: 0805
o Maximum thickness: 1.2 mm
o C0G, X7R preferred
o Adequate spacing from hand soldering operations
o Use manufacturers recommended bond pad dimensions or smaller (wave soldering)
o Smaller bond pads reduce rate of thermal transfer
-
Is This a Thermal Shock Crack? No!
o Cracking parallel to the electrodes is due to stack-up or sintering processes during capacitor manufacturing
o These defects can not be detected using in-circuit (ICT) or functional test o Requires scanning acoustic microscopy (SAM)
o With poor adhesion, maximum stress shifts away from the termination to the defect site o No correlation between failure rate and cooling rates (0.5 to 15C/sec)
-
123
Flex Cracking of Ceramic Capacitors o Excessive flexure of PCB under ceramic chip capacitor can
induce cracking at the terminations
-
Flex Cracking of Ceramic Capacitors (cont.)
o Excessive flexure of PCB under ceramic chip capacitor can induce cracking at the terminations
o Pb-free more resistant to flex cracking
o Correlates with Kemet results (CARTS 2005)
o Rationale
o Smaller solder joints
o Residual compressive stresses
o Influence of bond pad
o Action Items
o None 1.00 10.00
1.00
5.00
10.00
50.00
90.00
99.90
R eliaSoft's W eibull++ 6.0 - w w w .W eibull.c om
Probability - Weibull
Displacement (mm)
Unre
liability
, F(t
)
6/13/2005 21:56DfR SolutionsCraig Hillman
Weibull1812 SAC
W2 RRX - RRM MEDF=162 / S=0
1812 SnPb
W2 RRX - RRM MEDF=90 / S=0
SnPb
SnAgCu
-
Summary
Risk areas Small volume V-chip electrolytic capacitors Through hole electrolytic capacitors near large BGAs Ceramic capacitors wave soldered or touched up
Actions Spec and confirm
Peak reflow temperature requirements for SMT electrolytics (consider elimination if volume < 100mm3)
Time at 300C for through-hole electrolytics
Initiate visual inspection of all SMT electrolytic capacitors (no risk of latency if no bulging or other damage observed)
Ban touch up of ceramic capacitors (rework OK)
-
Module 4: Components
Temperature Sensitivity
Moisture Sensitivity
-
Peak Temperature Ratings
AKA: Temperature Sensitivity Level (TSL)
Some component manufacturers are not certifying their components to a peak temperature of 260C
260C is industry default for worst-case peak Pb-free reflow temperature
Why lower than 260C? Industry specification
Technology/Packaging limitation
-
Industry Specification (J-STD-020)
Package size Number of component
manufacturers rely on table and reflow profile suggested in J-STD-020C
Larger package size, lower peak temperature
Issues as to specifying dwell time J-STD-020C: Within 5C of 260C for 20-40 seconds
Manufacturers: At 260C for 5-10 seconds
-
J-STD-020D.1 Reflow Profile (Update)
Specification of peak package body temperature (Tp)
Users must not exceed Tp
Suppliers must be equal to or exceed Tp
Not yet widely adopted
133
-
TSL + MSL Example
Peak temperature rating is 245C
Problem, right?
Not exactly
Thickness > 2.5mm, Volume > 350mm3
Peak temp specified by J-STD-020 is 245C
Higher reflow temperature possible
May require DOE / increase in MSL
134
-
TSL + MSL (example cont.)
NEC has two soldering conditions
IR50: 250C peak temperature
IR60: 260C peak temperature
Four packages (not parts) identified as IR50
208pinQFP(FP): 28 x 28 x 3.2
240pinQFP(FP): 32 x 32 x 3.2
304pinQFP(FP): 40 x 40 x 3.7
449pinPBGA: 27 x 27 x 1.7
Peak temperatures could be 245C and still meet J-STD-020 requirements
Suggests characterization separate from J-STD-020 may have been performed
-
TSL (cont.) o Limited examples of technology and
package limitations
o Surface mount connectors (primarily overcome)
o RF devices (already sensitive to SnPb reflow)
o Opto-electronic (LEDs, opto-isolators, etc.)
o Examples
o Amphenol: Amphenol connectors containing LEDs must NOT be processed using Lead-free infra-red reflow soldering using JEDEC-020C (or similar) profiles
o Micron / Aptina: Some Pb-free CMOS imaging products are limited to 235C MAX peak temperature
http://www.amphenolcanada.com/ProductSearch/GeneralInfo/Disclaimer%20for%20Connectors%20containing%20LEDs.htm
B. Willis, SMART Group
http://download.micron.com/pdf/technotes/tn_00_15.pdf
-
Moisture Sensitivity Level (MSL)
Popcorning controlled through moisture sensitivity levels (MSL) Defined by IPC/JEDEC
documents J-STD-020D.1 and J-STD-033B
Higher profile in the industry due to transition to Pb-free and more aggressive packaging Higher die/package ratios
Multiple die (i.e., stacked die)
Larger components
-
MSL: Typical Issues and Action Items
Identify your maximum MSL Driven by contract manufacturer
(CM) capability and OEM risk aversion
Majority limit between MSL3 and MSL4 (survey of the MSD Council of SMTA, 2004)
High volume, low mix: tends towards MSL4 Low volume, high mix: tends towards MSL3
Not all datasheets list MSL Can be buried in reference or quality documents
Ensure that listed MSL conforms to latest version of J-STD-020
Cogiscan
-
MSL Issues and Actions (cont.) Most standard components have a
maximum MSL 3
Components with MSL 4 and higher
Large ball grid array (BGA) packages
Encapsulated magnetic components (chokes, transformers, etc.)
Optical components (transmitters, transceivers, sensors, etc.)
Modules (DC-DC converters, GPS, etc.)
MSL classification scheme in J-STD-020D is only relevant to SMT packages
with integrated circuits
Does not cover passives (IPC-9503) or wave soldering (JESD22A111)
If not defined by component manufacturer, requires additional
characterization
-
Aluminum and Tantalum Polymer Capacitors
Aluminum Polymer Capacitor
Tantalum Polymer Capacitor
140
-
Popcorning in Tantalum/Polymer Capacitors
Pb-free reflow is hotter Increased susceptibility to popcorning
Tantalum/polymer capacitors are the primary risk
Approach to labeling can be inconsistent Aluminum Polymer are rated MSL 3 (SnPb)
Tantalum Polymer are stored in moisture proof bags (no MSL rating)
Approach to Tantalum is inconsistent (some packaged with dessicant; some not)
Material issues Aluminum Polymer are rated MSL 3 for
eutectic (could be higher for Pb-free)
Sensitive conductive-polymer technology may prevent extensive changes
Solutions Confirm Pb-free MSL on incoming plastic
encapsulated capacitors (PECs)
More rigorous inspection of PECs during initial build
141
-
Module 4: Component Summary
Know when peak temperature indicates true temperature sensitivity Component manufacturers peak temperature ratings
deviate from J-STD-020
Peak temperature ratings are very specific or nuanced in some fashion
Ask component manufacturer for data confirming issues at temperatures below 260C
Consider requiring MSL on the BOM for certain component packaging and technologies Focus on polymeric and large tantalum capacitors
-
Module 5: Printed Circuit
Boards Surface Finishes
-
PCB Surface Finishes
Definition: A coating located at the outermost layer and exposed copper of a PCB. Protects copper from oxidation that inhibits
soldering
Dissolves into the solder upon reflow or wave soldering.
SnPb HASL (Hot Air Solder Leveling) being replaced by other finished due to technology and RoHS-Pb-free trends.
Options (no clear winner) Electroless nickel/immersion gold (ENIG) Immersion tin (ImSn) Immersion silver (ImAg) Organic solderability preservative (OSP) Pb-free HASL Others (ENEPIG, other palladium, nano
finishes etc.)
Most platings, except for Pb-free HASL, have been around for several years
18%
Surface Finishes, Worldwide
2003
2007
J. Beers
Gold Circuits
-
Pb-Free HASL
Increasing Pb-free solderability plating of choice
Primary material is Ni-modified SnCu (SN100C) Initial installations of SAC being replaced Co-modified SnCu also being offered (claim of 80
installations [Metallic Resources])
Selection driven by Storage
Reliability
Solderability
Planarity
Copper Dissolution
-
Pb-Free HASL: Ni-modified SnCu
Patented by Nihon Superior in March 1998 Claimed: Sn / 0.1-2.0% Cu / 0.002-1% Ni / 0-1% Ge
Actual: Sn / 0.7% Cu / 0.05% Ni / 0.006% Ge
Role of constituents Cu creates a eutectic alloy with lower melt temp (227C
vs. 232C), forms intermetallics for strength, and reduces copper dissolution
Ni suppresses formation of -Sn dendrites, controls intermetallic growth, grain refiner
Ge prevents oxide formation (dross inhibitor), grain refiner
Note: Current debate if Sn0.9Cu or Sn0.7Cu is eutectic
-
Pb-free HASL: Storage
PCBs with SnPb HASL have storage times of 1 to 4 years
Driven by intermetallic growth and oxide formation
SN100CL demonstrates similar behavior
Intermetallic growth is suppressed through Ni-addition
Oxide formation process is dominated by Sn element (similar to SnPb)
Limited storage times for alternative Pb-free platings (OSP, Immersion Tin, Immersion Silver)
-
Pb-Free HASL: Intermetallic Growth
HASL and Flow: A Lead-Free Alternative, T. Lentz, et. al., Circuitree, Feb 2008,
http://www.circuitree.com/Articles/Feature_Article/BNP_GUID_9-5-2006_A_10000000000000243033
SN100C (150C for 1000 hrs)
SnPb (150C for 1000 hrs)
Similar intermetallic thickness as SnPb after long-term aging and multiple reflows
-
Pb-Free HASL: Reliability
Contract manufacturers (CMs) and OEMs have reported issues with
electrochemistry-based solderability
platings
ENIG: Black Pad, Solder Embrittlement
ImAg: Sulfur Corrosion, Microvoiding
Some OEMs have moved to OSP and Pb-free HASL due to their simpler processes
-
Pb-Free HASL: Solderability
Industry adage: Nothing solders like solder
http://www.daleba.co.uk/download%20section%20-%20lead%20free.pdf
HASL and Flow: A Lead-Free Alternative, T. Lentz, et. al., Circuitree, Feb 2008,
http://www.circuitree.com/Articles/Feature_Article/BNP_GUID_9-5-2006_A_10000000000000243033
o Discussions with CMs and OEMs seem to indicate satisfaction with Pb-free HASL performance
o Additional independent, quantitative data should be gathered
o Improved solderability could improve hole fill
-
195
Pb-Free HASL: Planarity
o Recommended minimum thickness o 100 min (4 microns)
o Lower minimums can result in exposed intermetallic
o Primary issue is thickness variability
o Greatest variation is among different pad designs
o 100 min over small pads (BGA bond pads); over 1000 min over large pads
o Can be controlled through air knife pressure, pot temperatures, and nickel content
-
Pb-Free HASL: Planarity (cont.)
Air knives Pb-free HASL requires
lower air pressure to blow off excess solder
Pot Temperatures SnPb: 240C to 260C
SN100CL: 255C to 270C (air knife temp of 280C)
Ni content Variation can influence fluidity
Minimum levels critical for planarity
Some miscommunication as to critical concentrations
Sweatman and Nishimura (IPC APEX 2006)
-
Pb-Free HASL (Composition)
Minimum Ni concentrations need to be more clearly specified by licensees
Nihon recommends >300 ppm
Recommended maximum Cu concentrations range from 0.7 to 1.2wt%
Increased bridging and graininess
Nihon recommends
-
Pb-Free HASL: Copper Dissolution
To be discussed in detail in solder module
Presence of nickel is believed to slow the copper dissolution process SAC HASL removes ~5 um
SNC HASL removes ~1 um
www.p-m-services.co.uk/rohs2007.htm
www.pb-free.org/02_G.Sikorcin.pdf
www.evertiq.com/news/read.do?news=3013&cat=8 (Conny Thomasson, Candor Sweden AB)
Nihon Superior
-
Copper Erosion in HASL
-
Pb-Free HASL: Additional Concerns
Risk of thermal damage, including warpage and influence on long term reliability (PTH fatigue, CAF robustness) No incidents of cracking / delamination / excessive warpage
reported to DfR to date
Short exposure time (3 to 5 seconds) and minimal temp. differential (+5C above SnPb) may limit this effect
Compatibility with thick (>0.135) boards Limited experimental data (these products are not currently
Pb-free)
Mixing of SNC with SAC Initial testing indicates no long-term reliability issues (JGPP)
-
Electroless Nickel/Immersion Gold (ENIG)
Two material system Specified by IPC-4552
Electroless Nickel (w/P) 3 6 microns (120 240 microinches)
Some companies spec a broader 1 8 microns
Immersion Gold Minimum of 0.05 microns (2 microinches)
Self-limiting (typically does not exceed 0.25 microns)
Benefits Excellent flatness, long-term storage, robust for multiple reflow cycles, alternate
connections (wirebond, separable connector)
Saturn Electronics
-
ENIG (Primary Issue) Solder Embrittlement
Not always black pad
Not explained to the satisfaction of most OEMs
Numerous drivers Phosphorus content
High levels = weak, phosphorus-rich region after soldering
Low levels = hyper-corrosion (black pad)
Cleaning parameters Gold plating parameters Bond pad designs Reflow parameters?
Results in a severe drop in mechanical strength
Difficult to screen Can be random
(e.g., 1 pad out of 300)
Board fabricators need to be on top of numerous quality procedures to prevent defects.
-
Other ENIG Failure Mechanisms Insufficient nickel thickness
Potential diffusion of copper through the nickel underplate
Can reduce storage time and number of reflow cycles
Bond pad adhesion Problem with corner balls on very large
BGAs (>300 I/O)
Reduced plated through hole reliability (stress concentrators)
Dewetting
Crevice corrosion (trapped residues)
Poor performance under mechanical shock / drop
Copper
Nickel/Gold Layer Solder Mask
Laminate
-
ENIG & Mechanical Shock Boards with ENIG finishes
have less shock endurance. Not always consistent
Plating is an important driver SnNi vs. SnCu intermetallics
Crossover into board failure Very strain-rate dependent
PQFP (28x28mm, 208 I/O) Failures
Pb-Free on ENIG 2/6 44/50, 45/50
Pb-Free on OSP 2/6 16/50, 29/50
SnPb on OSP 0/6 --
1.00 100.0010.00
1.00
5.00
10.00
50.00
90.00
99.00
R eliaSoft's W eibull++ 6.0 - w w w .W eibull.c om
Probability - Weibull
Number of DropsU
nre
liability
, F(t
)
7/29/2005 10:27DfR SolutionsCraig Hillman
WeibullPb-Free on ENIG
W3 RR3 - SRM MEDF=6 / S=0
Pb-Free on OSP
W3 RR3 - SRM MEDF=5 / S=1
SnPb on OSP
W3 RR3 - SRM MEDF=3 / S=3
35x35mm, 312 I/O BGA
Chai, ECTC 2005
Chong, ECTC 2005
-
Immersion Tin (ImSn)
Single material system Defined by IPC-4554
Immersion Tin Standard thickness: 1 micron (40 microinches) Some companies spec up to 1.5 microns (65 microinches)
Benefits Excellent flatness, low cost, excellent bare test pad probing
Not as popular a choice Environmental and health concerns regarding thiourea
(known carcinogen).
Not good for designs with small or micro vias etchant gets entrapped during PCB processing and erupts during SMT soldering
-
Immersion Silver (ImAg)
Single material system Defined by IPC-4553
Two versions Thin: Minimum thickness of 0.05
microns
Thicker: Minimum thickness 0.12 microns
Benefits Excellent flatness, low cost, long-
term storage, excellent bare test pad probing
-
Sulfide Corrosion and Migration of Immersion Silver
Failures observed within months Sulfur-based gases attack exposed
immersion silver Non-directional migration (creepage
corrosion)
Occurring primarily in environments with high sulfur levels. Not recommended for these applications. Rubber manufacturing Waste treatment plants Petroleum refineries Coal-generation power plants, Paper mills Sewage/waste-water treatment Landfills Large-scale farms Modeling clay
-
Organic Solderability Preservative (OSP)
Single material system Specified by IPC-4555
Thickness
Benefits Very low cost, flatness, reworkable
Issues Short shelf life (6-12 months)
Limited number of reflows
Some concerns about compatibility with low activity, no-clean fluxes
Transparency prevents visual inspection
Poor hole fill
Test pads must be soldered prepare for probing through no clean materials if they are used.
-
OSP & Hole Fill
Fill is driven by capillary action
Important parameters Hole diameter, hole aspect ratio,
wetting force, thermal relief Solder will only fill as along as its
molten (key point)
OSP has lower wetting force Risk of insufficient hole fill
Can lead to single-sided architecture
Solutions? Changing board solderability plating
Increasing top-side preheat
Increasing solder pot temperature (some go as high as 280C)
Changing your wave solder alloy P. Biocca, Kester
-
Module 5: Printed Circuit
Boards
Robustness Concerns
Cracking and Delamination
-
216
Printed Board Robustness Concerns
Increased Warpage
PTH Cracks
Land
Separation
Solder Mask Discoloration Blistering
Delamination Pad Cratering
-
217
Printed Board Damage
o Predicting printed board damage can be difficult
o Driven by size (larger boards tend to experience higher temperatures)
o Driven by thickness (thicker boards experience more thermal stress)
o Driven by material (lower Tg tends to be more susceptible)
o Driven by design (higher density, higher aspect ratios)
o Driven by number of reflows
o No universally accepted industry model
-
Printed Board Damage: Industry Response
Concerns with printed board damage have almost entirely been addressed
through material changes or process
modifications
Not aware of any OEMs initiating design rules or restrictions
Specific actions driven by board size and peak temperature requirements
-
Industry Response (cont.) Small, very thin boards
Up to 4 x 6 and 62 mil thick
Peak temperatures as low as 238C
Minimal changes; most already using 150C Tg Dicy (tends to be sufficient)
Medium, thin boards Up to 10 x 14 and 75 mil thick
Tend to have moderate-sized components; limits peak temperatures to 245C-248C
Rigorous effort to upgrade laminate materials (dicy-cured may not be feasible)
Large, thick boards Up to 18 x 24 and 180 mil thick
Difficulty in maintaining peak temperatures below 260C
Very concerned
Rothshild, APEX 2007
-
220
PCB Robustness: Laminate Material Selection Board thickness IR-240~250 Board thickness IR-260
60mil
Tg140 Dicy
All HF materials OK 60mil
Tg150 Dicy
HF- middle and high Tg materials OK
60~73mil
Tg150 Dicy
NP150, TU622-5
All HF materials OK 60~73mil
Tg170 Dicy
HF middle and high Tg materials OK
73~93mil
Tg170 Dicy, NP150G-HF
HF middle and high Tg materials OK 73~93mil
Tg150 Phenolic + Filler
IS400, IT150M, TU722-5, GA150
HF middle and high Tg materials OK
93~120mil
Tg150 Phenolic + Filler
IS400, IT150M, TU722-5
Tg 150
HF middle and high Tg materials OK 93~130mil
Phenolic Tg170
IS410, IT180, PLC-FR-370 Turbo, TU722-
7
HF middle and high Tg materials OK
121~160mil
Phenolic Tg170
IS410, IT180, PLC-FR-370 Turbo
TU722-7
HF high Tg materials OK 131mil
Phenolic Tg170 + Filler
IS415, 370 HR, 370 MOD, N4000-11
HF high Tg materials OK
161mil
PhenolicTg170 + Filler
IS415, 370 HR, 370 MOD, N4000-11
HF material - TBD 161mil TBD Consult Engineering for specific design review
1.Copper thickness = 2OZ use material listed on column 260 2.Copper thickness >= 3OZ use Phenolic base material or High Tg Halogen free materials only
3.Twice lamination product use Phenolic material or High Tg Halogen free materials only (includes HDI)
4.Follow customer requirement if customer has his own material requirement
5.DE people have to confirm the IR reflow Temperature profile
J. Beers, Gold Circuits
-
Printed Board Damage: Prevention
Thermal properties of laminate material are primarily defined by four parameters Out of plane coefficient of thermal expansion (Z-CTE)
Glass transition temperature (Tg)
Time to delamination (T260, T280, T288)
Temperature of decomposition (Td)
Each parameter captures a different material behavior Higher number slash sheets (> 100) within IPC-4101
define these parameters to specific material categories
-
Thermal Parameters of Laminate
Out of plane CTE (below Tg or Z-axis: 50C to 260C) CTE for SnPb is 50ppm - 90ppm (50C to 260C rarely considered) Pb-free: 30ppm - 65ppm or 2.5 3.5%
Glass transition temperature (IPC-TM-650, ) Characterizes complex material transformation (increase in CTE,
decrease in modulus)
Tg of 110C to 170C for SnPb Pb-free: 150C to 190C
Time to delamination (IPC-TM-650, 2.4.24.1) Characterizes interfacial adhesion T-260 for SnPb is 5-10 minutes Pb-free: T-280 of 5-10 minutes or T-288 of 3-6 minutes
Temperature of decomposition (IPC-TM-650, 2.3.40) Characterizes breakdown of epoxy material Td of 300C for SnPb Pb-free: Td of 320C
-
Thermal Parameters (cont.)
Strong correlation between Td and T288
Suggests cohesive failure during T288
May imply poor ability to capture interfacial weaknesses
B. Hoevel, et. al., New epoxy resins for printed wiring board applications, Circuit World, 2007, vol. 33, no. 2
-
PCB Robustness: Material Selection
The appropriate material selection is driven by the failure mechanism one is
trying to prevent
Cracking and delamination
Plated through fatigue
Conductive anodic filament formation
-
225
PCB Delamination
Fiber/resin interface delamination occurs as a result of stresses
generated under thermal cycling
due to a large CTE mismatch
between the glass fiber and the
epoxy resin (1 vs. 12 ppm/C)
Delamination can be prevented/resisted by selecting
resin with lower CTEs and optimizing the glass surface finish.
Studies have shown that the bond between fiber and resin is strongly
dependent upon the fiber finish
-
Delamination / Cracking: Observations
Morphology and location of the cracking and delamination can vary Even within the same
board
Failure morphology and locations Within the middle and edge of the PCB Within prepregs and/or laminate Within the weave, along the weave, or at the
copper/epoxy interface (adhesive and cohesive)
-
Delamination / Cracking: Case Study
Delamination marked by red boxes
Scalloped shape is due to pinning at the
plated through holes
(PTHs)
Results from acoustic microscopy confirmed
observations from
visual inspection
No additional delamination sites
were identified
A
B
-
Central Delamination
Delamination appears to span multiple layers
Plated through holes pin the expansion of
the delamination
-
Additional Observations
Drivers Higher peak temperatures
Increasing PCB thickness
Decreasing via-to-via pitch
Increasing foil thickness (1-oz to 2-oz)
Presence of internal pads
Sequential lamination
Limited information Controlled depth drilling
Extensive debate about root-cause Non-optimized process
Intrinsic limit to PCB capability
Moisture absorption Rothschild, IPC APEX 2007
Sequential Lamination
-
Delamination / Cracking: Root-Cause
Non-Optimized Process Some PCB suppliers have demonstrated improvement
through modifications to lamination process or oxide chemistry
Some observations of lot-to-lot variability
Limit to PCB Capability Difficult to overcome adhesion vs. thermal performance
tradeoff (dicy vs. phenolic)
High stresses developed during Pb-free exceed material strength of standard board material
Moisture Absorption
-
Cracking and Moisture Absorption
Does moisture play a role? No
DfR found delamination primarily around the edge and away from PTH sites after MSL testing
IBM found minimal differences after a 24 hr bake of coupons with heavy copper (>2 oz)
Delamination / cracking observed in board stored for short (
-
Cracking and Moisture (cont.)
Storage of prepregs and laminates
Drilling process
Moisture is absorbed by the side walls (microcracks?)
Trapped after plating
Storage of PCBs at PCB manufacturer
Storage of PCBs at CCA manufacturer
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234
PCB Trace Peeling
Delamination of trace from surface of the board
Sources of increased stress
Excessive temperatures during high temperature processes
Insufficient curing of resin
Insufficient curing of solder mask
Sources of decreased strength
Improper preparation of copper foil
Excessive undercut
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235
Plated Through Holes (PTH)
Voids Can cause large stress concentrations,
resulting in crack initiation.
The location of the voids can provide crucial information in identifying the defective process
Around the glass bundles
In the area of the resin
At the inner layer interconnects (aka, wedge voids)
Center or edges of the PTH
Etch pits Due to either insufficient tin resist deposition or
improper outer-layer etching process and
rework.
Cause large stress concentrations locally, increasing likelihood of crack initiation
Large etch pits can result in a electrical open
-
236
Plated Through Holes (PTH)
Overstress cracking CTE mismatch places PTH in
compression
Pressure applied during "bed-of-nails" can compress PTH
In-circuit testing (ICT) rarely performed at operating temperatures
Fatigue
Circumferential cracking of the copper plating that forms the PTH wall
Driven by differential expansion between the copper plating (~17 ppm) and the
out-of-plane CTE of the printed board
(~70 ppm)
Industry-accepted failure model: IPC-TR-579
Spring-Loaded Pins
-
237
PCB Robustness: Qualifying Printed Boards
This activity may provide greatest return on investment Use appropriate number of reflows or wave
In-circuit testing (ICT) combined with construction analysis (cracks can be latent defect)
6X Solder Float (at 288C) may not be directly applicable
Note: higher Tg / phenolic is not necessarily better Lower adhesion to copper (greater likelihood of delamination) Greater risk of drilling issues Potential for pad cratering
Higher reflow and wave solder temperatures may induce solder mask delamination Especially for marginal materials and processes More aggressive flux formulations may also play a role Need to re-emphasize IPC SM-840 qualification procedures
-
Material Selection - Laminate
Higher reflow and wave solder temperatures may induce delamination Especially for marginal materials and processes
Not all RoHS compliant laminates are Pb-free process capable! Specify your laminate by name not type or equivalent
Role of proper packaging and storage PCBs should remain in sealed packaging until assembly
Reseal partially opened bricks Package PCBs in brick counts which closely emulate run quantities
PCBs should be stored in temperature and humidity controlled conditions
Bake when needed Packaging in MBB (moisture barrier bags) with HIC (humidity
indicator cards) may be needed for some laminates
Need to re-emphasize IPC SM-840 qualification procedures
-
PCB Supply Chain Best
Practices
-
PCBs as Critical Components
PCBs should be considered critical components or a critical commodity.
Without stringent controls in place for PCB supplier selection, qualification, and management, long term
product quality and reliability is simply not achievable.
This section will cover some common best practices and recommendations for management of your PCB
suppliers.
-
PCB Best Practices: Commodity Team
Existence of a PCB Commodity Team with at least one representative from each of the following areas:
Design Manufacturing Purchasing Quality/Reliability
The team should meet on a minimum monthly basis to discuss new products and technology requirements in the development pipeline.
Pricing, delivery, and quality performance issues with approved PCB suppliers should also be reviewed.
The team is also tasked with identifying new suppliers and creating supplier selection and monitoring criteria.
-
PCB Best Practices: Selection Criteria
Established PCB supplier selection criteria in place. The criteria should be unique to your business, but some generally used criteria are:
Time in business Revenue Growth Employee Turnover Training Program Certified to the standards you require (IPC, MIL-SPEC, ISO, etc.) Capable of producing the technology you need as part of their
mainstream capabilities (dont exist in their process niches where they claim capability but have less than ~ 15% of their volume built there.)
Have quality and problem solving methodologies in place Have a technology roadmap Have a continuous improvement program in place
-
PCB Best Practices: Qualification Criteria
Rigorous qualification criteria which includes: On site visits by someone knowledgeable in PCB
fabrication techniques. An onsite visit to the facility which will produce your PCBs is
vital.
The site visit is your best opportunity to review process controls, quality monitoring and analytical techniques, storage and handling practices and conformance to generally acceptable manufacturing practices.
It is also the best way to meet and establish relationships with the people responsible for manufacturing your product.
Sample builds of an actual part you will produce which are evaluated by the PCB supplier and that are also independently evaluated by you or a representative to the standards that you require.
-
PCB Best Practices: Supplier Tiering
Use of supplier tiering (Low, Middle, High ) strategies if you have a diverse product line with products that range from simpler to complex. This allows for strategic tailoring to save cost and to maximize supplier quality to your product design. Match supplier qualifications to the complexity of your product. Typical criteria for tiering suppliers include: Finest line width Finest conductor spacing, Smallest drilled hole and via size Impedance control requirement Specialty laminate needed (Rogers, flex, mixed) Use of HDI, micro vias, blind or buried vias.
Minimize use of suppliers who have to outsource critical areas of construction. Again, do not exist in the margins of their process capabilities
-
PCB Best Practices: Relationship Mgt.
Relationship Management. Ideally, you choose a strategy that allows you to partner with your PCB suppliers for success. This is especially critical is you have low volumes, low spend, or high technology and reliability requirements for your PCBs. Some good practices include:
Monthly conference calls with your PCB commodity team and each PCB supplier. The PCB supplier team should members equivalent to your team members.
QBRs (quarterly business reviews) which review spend, quality, and performance metrics, and also include state of the business updates which address any known changes like factory expansion, move, or relocation, critical staffing changes, new equipment/capability installation etc.
The sharing is done from both sides with you sharing any data which you think would help strengthen the business relationship business growth, new product and quoting opportunities, etc. At least twice per year, the QBRs should be joint onsite meetings which alternate between your site and the supplier factory site. The factory supplier site QBR visit can double as the annual on site visit and audit that you perform.
Semi-Annual Lunch and Learns or technical presentations performed onsite at your facility by your supplier. All suppliers perform education and outreach on their processes and capabilities. They can educate your technical community on PCB design for manufacturing, quality, reliability, and low cost factors. They can also educate your technical community on pitfalls, defects, and newly available technology. This is usually performed free of charge to you. Theyll often spring for free lunch for attendees as well in order to encourage attendance.
-
PCB Best Practices: Supplier Scorecards
Supplier Scorecards are in place and performed quarterly and yearly on a rolling basis. Typical metrics include: On Time Delivery
PPM Defect Rates
Communication speed, accuracy, channels, responsiveness to quotes
Quality Excursions / Root Cause Corrective Action Process Resolution
SCARs (Supplier Corrective Action Requests) Reporting
Discussion of any recalls, notifications, scrap events exceeding a certain dollar amount
-
PCB Best Practices: Cont. Quality Monitoring
Continuous Quality Monitoring is in place. Consider requiring and reviewing the following: Top 3 PCB factory defects monitoring and reporting Process control and improvement plans for the top 3 defects Yield and scrap reporting for your products Feedback on issues facing the industry Reliability testing performed (HATS, IST, solder float, etc.)
As a starting point, review the IPC-9151B, Printed Board Process Capability, Quality, and Relative Reliability (PCQR2) Benchmark Test Standard and Database at: http://www.ipc.org/html/IPC-9151B.pdf
Your PCB suppliers may be part of this activity already. Ask if they participate and if you can get a copy of their results.
-
PCB Best Practices: Prototype Development
Prototype Development
In an ideal environment, all of your PCBs for a given product should come from the same factory from start
to finish prototype (feasibility), pre-release production (testability & reliability), to released production
(manufacturability).
Each factory move introduces an element of risk since the product must go through setup and optimization
specific to the factory and equipment contained there.
While this is not always possible for prototypes, all PCBs intended for quality and reliability testing should
come from the actual PCB production facility.
-
Module 5: PCB Robustness
PTH Barrel Cracking
Conductive Anodic Filaments
(CAF)
-
250
Plated Through Hole (PTH) Fatigue
PTH fatigue is the circumferential cracking of the copper plating that forms the PTH wall
It is driven by differential expansion between the copper plating (~17 ppm) and the out-of-plane CTE of the printed board (~70 ppm)
Industry-accepted failure model
IPC-TR-579
-
251
PTH Fatigue: Pb-Free
-
PTH and Pb-Free (cont.)
Findings
Limited Z-axis expansion and
optimized copper
plating prevents
degradation
Industry response
Movement to Tg of 150 - 170C
Z-axis expansion between 2.5 to 3.5%
-
253
PCB Conductive Anodic Filaments (CAF)
CAF also referred to as metallic electro-migration
Electro-chemical process which involves the transport (usually ionic) of a metal across a nonmetallic medium under the influence of an applied
electric field
CAF can cause current leakage, intermittent electrical shorts, and dielectric breakdown between conductors in printed wiring boards
-
254
CAF: Examples A
A A:A Cross-Section
-
255
CAF: Examples
-
256
CAF: Examples
-
258
CAF: Pb-Free
o Major concern in telecom/server industry o Frequency of events can increase by two
orders of magnitude o Time to failure can drop from >750h to 50h o Initially, no qualified printed boards
o Focus on specific designs o Large (>12x18) / multilayer (>10) o Fine pitch (0.8, 1.0 mm) ball grid arrays
(BGAs) o Solutions?
o CAF resistant laminate o Different epoxy formulations o Higher quality weaves
o Phenolic cured epoxy (filled) o Can be much better o Sensitive to drilling
o Increased price? o Sometimes, not always
-
Module 5: PCB Robustness
Strain Flexure Issues & Pad Cratering
Electro-Chemical Migration (ECM)
Cleanliness
-
Depanelization Process
Look at how panel is supported during the process so that it is never allowed to
dangle or flex
Vulnerable BGA and ceramic components along the PCB edge
Design for Manufacturing & Process Review
-
SAC Solder is More Vulnerable to Strain
PCB deflection
Ten
sile
fo
rce o
n
pad
an
d L
am
inate
PbSn
LF
PbSn limit LF limit
Laminate Load
Bearing
Capability
Loa
d (kN
)0.1
0.15
0.2
0.25
0.3
0.35
0.4
0.45
0.5
SAC Sn-Pb
Solder Alloy
Each Pair
Student's t
0.05
SAC
Sn-Pb
Level
18
18
Number
0.230859
0.416101
Mean
0.056591
0.040408
Std Dev
0.01334
0.00952
Std Err Mean
0.20272
0.39601
Lower 95%
0.25900
0.43620
Upper 95%
Means and Std Dev iations
Onew ay Analysis of Load (kN) By Solder Alloy
NEMI study showed SAC is more
Sensitive to bend stress.
Sources of strain can be ICT, stuffing through-
hole components, shipping/handling, mounting
to a chassis, or shock events.
261
-
Review/perform ICT strain evaluation at fixture mfg and in process: 500 us, IPC 9701 and 9704 specs, critical for QFN, CSP, and BGA
http://www.rematek.com/download_center/board_stress_analysis.pdf
To reduce the pressures exerted on a PCB, the first and simplest solution is to reduce the probes forces, when this is possible.
Secondly, the positioning of the fingers/stoppers must be optimized to control the probe forces. But this is often very difficult to achieve. Mechanically, the stoppers must be located exactly under the pressure fingers to avoid the creation of shear points
ICT Strain: Fixture & Process Analysis
262
-
263 263
Strain & Flexure: Pad Cratering
o Cracking initiating within the laminate during a dynamic
mechanical event
o In circuit testing (ICT), board depanelization, connector insertion,
shock and vibration, etc.
G. Shade, Intel (2006)
-
264 264
Pad Cratering
Drivers
Finer pitch components
More brittle laminates
Stiffer solders (SAC vs. SnPb)
Presence of a large heat sink
Pad Design
Difficult to detect using standard procedures
X-ray, dye-n-pry, ball shear, and ball pull
Intel (2006)
-
265 265
Solutions to Pad Cratering
Board Redesign Solder mask defined vs. non-solder mask defined
Limitations on board flexure
500 microstrain max, Component, location, and PCB thickness dependent
More compliant solder
SAC305 is relatively rigid, SAC105 and SNC are possible alternatives
New acceptance criteria for laminate materials
Intel-