Partially based on Prof . Vishwani D. Agrawal lecture VLSI Testing
Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9 1 ELEC 5270/6270 Fall 2007 Low-Power Design of...
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Transcript of Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9 1 ELEC 5270/6270 Fall 2007 Low-Power Design of...
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 11
ELEC 5270/6270 Fall 2007ELEC 5270/6270 Fall 2007Low-Power Design of Electronic CircuitsLow-Power Design of Electronic Circuits
Test PowerTest Power
Vishwani D. AgrawalVishwani D. AgrawalJames J. Danaher ProfessorJames J. Danaher Professor
Dept. of Electrical and Computer EngineeringDept. of Electrical and Computer EngineeringAuburn University, Auburn, AL 36849Auburn University, Auburn, AL 36849
[email protected]://www.eng.auburn.edu/~vagrawal/COURSE/E6270_Fall07/course.html
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 22
Power Considerations in DesignPower Considerations in Design A circuit is designed for certain function. Its design A circuit is designed for certain function. Its design
must allow the power consumption necessary to must allow the power consumption necessary to execute that function.execute that function.
Power buses are laid out to carry the maximum Power buses are laid out to carry the maximum current necessary for the function.current necessary for the function.
Heat dissipation of package conforms to the average Heat dissipation of package conforms to the average power consumption during the intended function.power consumption during the intended function.
Layout design and verification must account for “hot Layout design and verification must account for “hot spots” and “voltage droop” – delay, coupling noise, spots” and “voltage droop” – delay, coupling noise, weak signals.weak signals.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 33
Testing Differs from Functional Testing Differs from Functional OperationOperation
VLSI chip
system
Systeminputs
Systemoutputs
Functional inputs Functional outputs
Other chips
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 44
Basic Mode of TestingBasic Mode of Testing
VLSI chipTest vectors:
Pre-generated and stored in
ATE
DUT output for comparison with expected response stored in ATE
Automatic Test Equipment (ATE):Control processor, vector memory,timing generators, power module,
response comparator
PowerClock
Packaged or unpackaged device under test (DUT)
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 55
Functional Inputs vs. Test VectorsFunctional Inputs vs. Test Vectors
Functional inputs:Functional inputs: Functionally meaningful Functionally meaningful
signalssignals Generated by circuitryGenerated by circuitry
Restricted set of inputsRestricted set of inputs
May have been May have been optimized to reduce optimized to reduce logic activity and powerlogic activity and power
Test vectors:Test vectors: Functionally irrelevant Functionally irrelevant
signalssignals Generated by software Generated by software
to test modeled faultsto test modeled faults Can be random or Can be random or
pseudorandompseudorandom May be optimized to May be optimized to
reduce test time; can reduce test time; can have high logic activityhave high logic activity
May use testability logic May use testability logic for test applicationfor test application
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 66
An ExampleAn Example
VLSI chipBinary to decimal
converter
3-bit random vectors
8-bit1-hot
vectors
VLSI chip
system
VLSI chip in system operation
VLSI chip under test
High activity8-bit
test vectors from ATE
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 77
Comb. Circuit Power OptimizationComb. Circuit Power Optimization
Given a set of test vectorsGiven a set of test vectorsReorder vectors to minimize the number of Reorder vectors to minimize the number of
transitions at primary inputstransitions at primary inputs
Combinational circuit(tested by exhaustive
vectors)
010101010011001100001111
01111000Rearranged vector set 00110011 produces 7 transitions
00011110
11 transitions
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 88
Reducing Comb. Test Power Reducing Comb. Test Power
1 1 0 0 01 0 1 0 01 0 1 0 11 0 1 1 1
V1 V2 V3
V4 V5
3 4
1
3 223
2
1
1
Original tests:V1 V2 V3 V4 V5
10 input transitions
Traveling salesperson problem (TSP) finds the shortest distance closed path (or cycle) to visit all nodes exactly once.But, we need an open loop solution.
Reordered tests:V1 V3 V5 V4 V21 0 0 0 11 1 0 0 01 1 1 0 01 1 1 1 0
5 input transitions
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 99
Open-Loop TSP Open-Loop TSP
Add a node V0 at distance 0 from all other nodes.Add a node V0 at distance 0 from all other nodes. Solve TSP for the new graph.Solve TSP for the new graph. Delete V0 from the solution.Delete V0 from the solution.
V1 V2 V3
V4 V5
3 4
1
32
23
2
1
1V0
0
0 0 0
0
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1010
Traveling Salesperson ProblemTraveling Salesperson Problem A. V. Aho, J. E. Hopcroft anf J. D. Ullman, A. V. Aho, J. E. Hopcroft anf J. D. Ullman, Data Data
Structures and AlgorithmsStructures and Algorithms, Reading, , Reading, Massachusetts: Addison-Wesley, 1983.Massachusetts: Addison-Wesley, 1983.
E. Horowitz and S. Sahni, E. Horowitz and S. Sahni, Fundamentals of Fundamentals of Computer AlgorithmsComputer Algorithms, Computer Science Press, , Computer Science Press, 1984.1984.
B. R. Hunt, R. L. Lipsman, J. M. Rosenberg, K. B. R. Hunt, R. L. Lipsman, J. M. Rosenberg, K. R. Coombes, J. E. Osborn and G. J. Stuck, R. Coombes, J. E. Osborn and G. J. Stuck, A A Guide to MATLAB for Beginners and Guide to MATLAB for Beginners and Experienced UsersExperienced Users, Cambridge University , Cambridge University Press, 2006.Press, 2006.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1111
Scan TestingScan Testing
Combinational logic
Scan flip- flops
Primary inputs
Primary outputs
Scan-inSI
Scan-outSO
Scan enableSE DFF
mu
x
SE
SI
D
D
D’
D’
SO1
0
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1212
Example: State MachineExample: State Machine
S5
S1
S4
S2
S3
Reduced power state encodingS1 = 000S2 = 011S3 = 001S4 = 010S5 = 100
State transitionState transition Comb. State input Comb. State input changes/clockchanges/clock
000 → 001000 → 001 11
000 → 100000 → 100 11
011 → 010011 → 010 11
001 → 011001 → 011 11
010 → 000010 → 000 11
100 → 010100 → 010 22
Functional transitionsFunctional state transitions
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1313
Scan Testing of State MachineScan Testing of State Machine
Combinational logic
FF=0
FF=0
FF=1
Primary inputs
Primary outputs
Scan-in010
Scan-out100
State State transitiontransition
Per clock Per clock state state
changeschanges
100 → 010100 → 010 22
010 → 101010 → 101 33
101 → 010101 → 010 33
Scan transitions
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1414
Low Power Scan Flip-FlopLow Power Scan Flip-Flop
DFF
mu
x
SE
SI
DDFFm
ux
SE
SI
DSO
D’ D’
SO
Scan FF cell Low power scan FF cell
1
0
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1515
Built-In Self-Test (BIST)Built-In Self-Test (BIST)
Linear feedback shift register (LFSR)
Multiple input signature register (MISR)
Circuit under test (CUT)
Pseudo-random patterns
Circuit responses
BISTController
Clock
C. E. Stroud, A Designer’s Guide to Built-In Self-Test, Boston: Springer,2002.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1616
Test Scheduling ExampleTest Scheduling Example
R1 R2
M1 M2
R3 R4
A datapath
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1717
BIST Configuration 1: Test TimeBIST Configuration 1: Test Time
LFSR1 LFSR2
M1 M2
MISR1 MISR2
Test time
Te
st p
ow
er
T1: test for M1
T2: test for M2
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1818
BIST Configuration 2: Test PowerBIST Configuration 2: Test Power
R1 LFSR2
M1 M2
MISR1 MISR2Test time
Te
st p
ow
er
T1: test for M1T2: test for M2
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 1919
Testing of MCM and SOCTesting of MCM and SOC
Test resources: Typically registers and Test resources: Typically registers and multiplexers that can be reconfigured as test multiplexers that can be reconfigured as test pattern generators (e.g., LFSR) or as output pattern generators (e.g., LFSR) or as output response analyzers (e.g., MISR).response analyzers (e.g., MISR).
Test resources (R1, . . .) and tests (T1, . . .) Test resources (R1, . . .) and tests (T1, . . .) are identified for the system to be tested.are identified for the system to be tested.
Each test is characterized for test time, Each test is characterized for test time, power dissipation and resources it requires.power dissipation and resources it requires.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2020
Resource Allocation GraphResource Allocation Graph
T1 T2 T3 T4 T5 T6
R2R1 R3 R4 R5 R6 R7 R8 R9
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2121
Test Compatibility Graph (TCG)Test Compatibility Graph (TCG)T1
(2, 100)
T2(1,10)
T3(1, 10)
T4(1, 5)
T5(2, 10)
T6(1, 100)
Tests that form a clique can be performed concurrently.
Power Test time
Pmax = 4
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2222
Test Scheduling AlgorithmTest Scheduling Algorithm
Identify all possible cliques in TCG:Identify all possible cliques in TCG:C1 = {T1, T3, T5}C1 = {T1, T3, T5}C2 = {T1, T3, T4}C2 = {T1, T3, T4}C3 = {T1, T6}C3 = {T1, T6}C4 = {T2, T5}C4 = {T2, T5}C5 = {T2, T6}C5 = {T2, T6}
Break up clique sets into power compatible Break up clique sets into power compatible sets (PCS), that satisfy the power sets (PCS), that satisfy the power constraint.constraint.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2323
Test Scheduling Algorithm . . .Test Scheduling Algorithm . . . PCS (Pmax = 4), tests within a set are ordered for PCS (Pmax = 4), tests within a set are ordered for
decreasing test length:decreasing test length: C1 = {T1, T3, T5} → (T1, T3), (T1, T5), (T3, T5)C1 = {T1, T3, T5} → (T1, T3), (T1, T5), (T3, T5) C2 = {T1, T3, T4} → (T1, T3, T4)C2 = {T1, T3, T4} → (T1, T3, T4) C3 = {T1, T6} → (T1, T6)C3 = {T1, T6} → (T1, T6) C4 = {T2, T5} → (T2, T5)C4 = {T2, T5} → (T2, T5) C5 = {T2, T6} → (T2, T6)C5 = {T2, T6} → (T2, T6)
Greedy solution:Greedy solution: Expand PCS into subsets of decreasing test lengths. Each subset is Expand PCS into subsets of decreasing test lengths. Each subset is
an independent test session, consisting of tests that can be an independent test session, consisting of tests that can be concurrently applied.concurrently applied.
Select test sessions, starting from the shortest-time PCS, to cover all Select test sessions, starting from the shortest-time PCS, to cover all tests.tests.
Remove redundant PCS from the selected sessions.Remove redundant PCS from the selected sessions.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2424
TS Algorithm: Cover TableTS Algorithm: Cover TableTest session T1 T2 T3 T4 T5 T6 Length
(T1, T3, T4) X X X 100
(T1, T5) X X 100
(T1, T6) X X 100
(T2, T6)* X X 100
(T3, T5) X X 10
(T2, T5) X X 10
(T3, T4) X X 10
(T5)* X 10
(T4)* X 5
•Dropped as redundant sessions.•Selected sessions are (T3,T4), (T2, T5) and (T1, T6). Test time = 120.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2525
An ILP Solution to Cover ProblemAn ILP Solution to Cover ProblemTest session Integer 0,1 variable T1 T2 T3 T4 T5 T6 Length
(T1, T3, T4) S1 X X X 100
(T1, T5) S2 X X 100
(T1, T6) S3 X X 100
(T2, T6) S4 X X 100
(T3, T5) S5 X X 10
(T2, T5) S6 X X 10
(T3, T4) S7 X X 10
(T5) S8 X 10
(T4) S9 X 5
Constraints: S1+S2+S3 ≥ 1 implies T1 is coveredS4+S6 ≥ 1 implies T2 is coveredsimilar constraints to cover T3, T4, T5 and T6
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2626
An ILP Solution (Cont.)An ILP Solution (Cont.)Test session Si: Integer 0,1 variable T1 T2 T3 T4 T5 T6 Length, Li
(T1, T3, T4) S1 X X X 100
(T1, T5) S2 X X 100
(T1, T6) S3 X X 100
(T2, T6) S4 X X 100
(T3, T5) S5 X X 10
(T2, T5) S6 X X 10
(T3, T4) S7 X X 10
(T5) S8 X 10
(T4) S9 X 5
9Minimize ∑ (Li × Si) ILP solution: S3=S6=S7 = 1
i=1 S1=S2=S4=S5=S8=S9 = 0Test length = 120
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2727
A System Example: ASIC Z*A System Example: ASIC Z*
RAM 2Time=61
Power=241
RAM 3Time=38
Power=213
ROM 1Time=102
Power=279
ROM 2Time=102
Power=279
RAM 1Time=69
Power=282
RAM 4Time=23
Power=96
Reg. fileTime = 10Power=95
Random logic 1, time=134, power=295
Random logic 2, time=160, power=352
*Y. Zorian, “A Distributed Control Scheme for Complex VLSI Devices,” Proc. VLSI Test Symp., April 1993, pp. 4-9.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2828
Test Scheduling for ASIC ZTest Scheduling for ASIC Z1200
900
600
300
Po
we
r
Power limit = 900
0 100 200 300 400Test time 331
RAM 1
RAM 3
Random logic 2
Random logic 1
ROM 2
ROM 1
RAM 2
Reg. file
RAM 4
R. M. Chou, K. K. Saluja and V. D. Agrawal, “Scheduling Tests for VLSI Systems under Power Constraints,” IEEE Trans. VLSI Systems, vol. 5, no. 2, pp. 175-185, June 1997.
Copyright Agrawal, 2007Copyright Agrawal, 2007 ELEC6270 Fall 07, Lecture 9ELEC6270 Fall 07, Lecture 9 2929
ReferencesReferences
N. Nicolici and B. M. Al-Hashimi, N. Nicolici and B. M. Al-Hashimi, Power-Power-Constrained Testing of VLSI CircuitsConstrained Testing of VLSI Circuits, , Boston: Springer, 2003.Boston: Springer, 2003.
E. Larsson, E. Larsson, Introduction to Advanced Introduction to Advanced System-on-Chip Test Design and System-on-Chip Test Design and OptimizationOptimization, Springer 2005., Springer 2005.