Internship Report

Application Overview

PARAMETRIC SHIFT ANALYSES USING ANOVA, DELTA SIGMA, CPK

DEVICE DRIFT ANALYSIS

Automotive Test qualification methods

Group A

Accelerated

Environment

Stress test

Group B

Accelerated

Life time

Simulation

test

Group E

Package

Assembly

Integrity

Tests

Group X

Customer

Specific

tests

Biased HAST

Temperature Humidity Bias

High Temperature Operating Life

Human Body Model (Electro Static Discharge)

Charged Device Model (Electro Static Discharge)

Charged Device Model (Electro Static Discharge)

Low Temperature Operating Life

High score in FMEA

Wafer Fab Transfer

New material

Qualification

Process Change qualification

TP release

Qualification of changes in

manufacturing Process