23 MOS Fundamentals - nanoHUB.orgMOS_Fundamentals… · Pierret, Semiconductor Device Fundamentals...
Transcript of 23 MOS Fundamentals - nanoHUB.orgMOS_Fundamentals… · Pierret, Semiconductor Device Fundamentals...
Lundstrom ECE 305 S15
ECE-305: Spring 2015
MOS Fundamentals
Professor Mark Lundstrom Electrical and Computer Engineering
Purdue University, West Lafayette, IN USA [email protected]
3/29/15
Pierret, Semiconductor Device Fundamentals (SDF) pp. 525-530, 563-571
MOS Fundamentals
2
1) MOSFET and MOS capacitors 2) E-bands and workfunctions 3) Bandbending in ideal MOS-C’s
Lundstrom ECE 305 S15
MOSFETs
3
source drain
SiO
2
silicon
G S D
(Texas Instruments, ~ 2000)
gate oxide EOT ~ 1.1 nm
channel ~ 20 nm
gate
electrode
MOSFET (off)
4
VD
0
L
p-Si
n+-Si n+-Si
VG < VT ID = 0
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MOSFET (on)
5
VD
0
L
p-Si
n+-Si n+-Si
VG > VT ID > 0
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MOSFET and MOS C
6
p-Si
n+-Si n+-Si
MOS capacitor
MOS capacitor
7
VG
p-Si or n-Si
metal or
heavily doped “polysilicon”
SiO2
tox ≈1− 2 nm
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oxide scaling
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EC
EV
Ei
SiO2
EG ≈ 8.9eV
χi
e-band diagram
9
EC
EV
Ei
EF
EG = 1.12eV
Si
metal
EFM
ΦM
E0
χS
recall the MS junction
10
EC
EVEFP
Ei
aluminum
EFM
E0
ΦM = 4.08 eVΦS
χS = 4.05 eV
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built-in potential
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EC
EVEFS
Ei
aluminum
EFM
E0
ΦM = 4.08 eVΦS
χS = 4.05 eV
qVbi = EFM − EFS( ) = ΦS −ΦM( ) = − ΦM −ΦS( ) = −ΦMS
potential =VbiVbi =
−ΦMS
q= −φms
example:
12
Aluminum metal and p-type Si
NA = 1016 cm-3
p0 = NVeEV −EFS( )/kBT cm-3
EFS − EV = kBT lnNV
NA
⎛⎝⎜
⎞⎠⎟
NV = 2mp*kBT( )2π!2
⎡
⎣⎢⎢
⎤
⎦⎥⎥
3/2
= 1.83×1019 cm-3
EFS − EVq
= 0.2
ΦM = 4.08 eV
ΦS = χS + EG − EFS − EV( ) q
ΦS = 4.97 eV
φms =ΦM − ΦS( )
q= −0.9 V
Vbi = −φms = +0.9 V
now the band diagram
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EC
EVEFS
Ei
metal
EFM
E0
ΦM = 4.5 ΦS
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the band diagram
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EC
EVEF
Ei
metal
EF
φM
qVbi
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MOS e-band diagram
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EC
EV
Ei
SiO2
EG ≈ 8.9eV
EC
EV
Ei
EF
EG = 1.12eV
Si
metal
EFM
ΦM
E0
χS
χi
MOS e-band diagram
16
1) Built-in potential is exactly the same. 2) But part of the voltage drop occurs across the
semiconductor and part across the oxide.
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equilibrium e-band diagram
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EC
EV
Ei
EF
metal
ΔVS
ΔVox
Vbi = −φms φ x( ) = 0 in the bulk
φ x = 0( ) = φS surface potential
V metal( ) = ΔVox +φS
φS
V metal( ) =Vbi
Question 1)
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EC
EV
Ei
EF
metal
Which of the following statements is true about the electric field in the semiconductor (near the oxide-semiconductor interface). a) It is 0 V/cm b) It is > 0 V/cm and constant c) It is < 0 V/cm and constant d) It is > 0 V/cm and non-constant e) It is < 0 V/cm and non-constant
Question 2)
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EC
EV
Ei
EF
metal
Which of the following statements is true about the electric field in the oxide. a) It is 0 V/cm b) It is > 0 V/cm and constant c) It is < 0 V/cm and constant d) It is > 0 V/cm and non-constant e) It is < 0 V/cm and non-constant
equilibrium e-band diagram
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EC
EV
Ei
EF
metal
constant electric field
monotonically decreasing electric field
dEdx
=ρ x( )ε
V metal( ) =Vbi
equilibrium e-band diagram
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EC
EV
Ei
EF
metal
ΔVS
ΔVOX
Vbi
E S =E 0+( )
E ox
Koxε0E ox = KSε0E S
E ox =
KS
KOX
E S
E ox ≈ 3E S
Dox = DS
potential vs. position
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φ x( )
x0−xox
φ = 0
φS > 0V metal( ) =Vbi = −φms = ΔVox + ΔVS
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from the e-band diagram: e-field
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EC
EV
Ei
EF
metal
V metal( ) =Vbi
electric field vs. position
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x0−xox
φ = 0
E x( )
E S E ox
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from the e-band diagram: charge density
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EC
EV
Ei
EF
metal Vbi
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space charge density vs. position
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x0−xox
−qNA
ρ x( )
W
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depletion charge
apply a voltage to the gate
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EC
EV
Ei
EF
Simetal
ΔVS
ΔVOX
What happens if we apply a voltage to the gate?
V metal( ) =Vbi = ΔVox + ΔVS →
VG +Vbi =VG −φms = ΔVox + ΔVS →V metal( ) =Vbi +VG
e-band under “flat band” conditions
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EC
EV
Ei
EF
Si
metal
What happens if we apply a negative voltage = ? φms
VG = −Vbi
MOS–C at the flat band voltage.
VG +Vbi = ΔVox + ΔVS →0 = ΔVox + ΔVS
“ideal” MOS structure
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EC
EV
Ei
SiO2
EG ≈ 8eV
EC
EV
Ei
EF
EG = 1.12eV
Sihypothetical
metal
EFM
ΦM
E0
χS
χi
Vbi = 0
flat band conditions
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For an ideal MOS structure, flat band occurs for: For a real MOS structure, flat band occurs for:
VG =VFB = 0
VG =VFB = φms
′VG =VG −VFB =VG +Vbi =VG −φms
VFB = φms
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in Chapter 16 of SDF by Pierret
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VG means V’G; i.e. an ideal MOS structure with NO metal-semiconductor workfunction difference is assumed.
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band banding in an MOS device
32 Fig. 16.6, Semiconductor Device Fundamentals, R.F. Pierret
next: band-bending and depletion approximation
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1) V’G < 0: Accumulation (No depletion region)
2) 0 < V’G < VT: Depletion (depletion region)
3) V’G < VT: Inversion (depletion region + inversion layer)
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N-channel MOS (p-type substrate)