18A082403V-C1 SENOR Vehicle-Mounted Computer iV12 · 2019-01-14 · Report No.: 18A082403V-C1 Page...

Report No.: 18A082403V-C1 of 41

Interocean EMC Technology Corp. EMC Test Report

Test Report

(Declaration of Conformity)

for

Electromagnetic Compatibility

of

Product： Vehicle-Mounted Computer

Trade Name： N/A

Model Number： iV12 X1X2X3X4X5X6 (X1~X3 = 0~9, a~z, A~Z or blank; X4~X6 = 0~9, a~z, A~Z or blank)

Prepared for

SENOR TECH CO., LTD

No.165, Kangning Street, Xizhi District, New Taipei City 22150,

Taiwan.

TEL.: +886 2 2695 2780

Prepared by

Interocean EMC Technology Corp.

Interocean EMC Technology Tin-Fu Laboratory

No. 5-2, Lin 1, Tin-Fu, Lin-Kou Dist., New Taipei City,

Taiwan 244, R.O.C.

TEL.：+886 2 2600 6861

FAX.：+886 2 2600 6859

Remark:

The test report consists of 41 pages in total. It shall not be reproduced except in full,

without the written approval of IETC. This document may be altered or revised by

IETC only, and shall be noted in the revision section of the document.

The test result in this report is only subjected to the test sample.



Table of Contents

1 General Information 4

1.1 Description of Equipment Under Test 4

1.2 Test Facility 5

1.3 Measurement Uncertainty 6

2 ESA Radiated Disturbances Test 7

2.1 Instrument 7

2.2 Block Diagram of Test Configuration 7

2.3 ESA Radiated Disturbances Limit 8

2.4 Test Procedure 8

2.5 Test Result 8

3 ESA Conducted Transient Disturbances Test 17

3.1 Instrument 17


3.3 ESA Conducted Transient Disturbances Limit 18


3.5 Test Result 18

4 ESA Conducted Transient Immunity Test 22

4.1 Instrument 22


4.3 ESA Conducted Transient Immunity Functional Status 22

4.4 Classification of Functional Status 23


4.6 Test Result 23

5 Photographs of Test 31

5.1 ESA Radiated Disturbances Test 31

5.2 ESA Conducted Transient Disturbances Test 32

5.3 ESA Conducted Transient Immunity Test 33

6 Photographs of EUT 34



Statement of Compliance Applicant： SENOR TECH CO., LTD

Manufacturer： SENOR TECH CO., LTD

Product： Vehicle-Mounted Computer

Model No.： iV12 X1X2X3X4X5X6 (X1~X3 = 0~9, a~z, A~Z or blank; X4~X6 = 0~9, a~z, A~Z or blank)

Tested Power Supply： DC 27 V

Date of Final Test： Sep. 11, 2018

Revision of Report: Rev. 01

Harmonized Standards：

EN 50498: 2010

Reference Basic Standards：

Automotive EMC Directive 2004/104/EC, Annex I, 6.5, 6.6, 6.8 and 6.9: CISPR 25: 2002+Corr.: 2004 ISO 7637-2: 2004+A1: 2008

The measurement results in this test report were performed at Interocean EMC Technology

Corp. the responsibility of measurement result is only subjected to the test sample.

This report shows the EUT is technically compliance with the above official standards.

This report shall not be partial reproduced without written approval by Interocean EMC

Technology Corporation.

Report Issued: 2018/12/25

Project Engineer: Approved: Vin Chou Mars Jen



1 General Information

1.1 Description of Equipment Under Test Product : Vehicle-Mounted Computer

Model Number : iV12 X1X2X3X4X5X6 (X1~X3 = 0~9, a~z, A~Z or blank; X4~X6 = 0~9, a~z, A~Z or blank)

Applicant : SENOR TECH CO., LTD No.165, Kangning Street, Xizhi District, New Taipei City 22150, Taiwan.

Manufacturer : SENOR TECH CO., LTD No.165, Kangning Street, Xizhi District, New Taipei City 22150, Taiwan.

Power Supply : DC 10-36 V

Date of Test : Sep. 09 ~ 11, 2018

Additional Description : 1.) The test model is “iV12” and included in this report. 2.) iV12 X1X2X3X4X5X6 (X1~X3 = 0~9, a~z, A~Z or blank; X4~X6 = 0~9, a~z, A~Z or blank) CPU ID: X1~X3 = 0~9, a~z, A~Z or blank (only crystal difference, layout the same)

Market ID: X4~X6 = 0~9, a~z, A~Z or blank 3.) For more detail specification about EUT, please refer to the user’s

manual.



1.2 Test Facility

Site Description : Chamber 6 Transient Room 1 & 2

Name of Firm : Interocean EMC Technology Corp.

Company web : http://www.ietc.com.tw

Location : No. 5-2, Lin 1, Tin-Fu, Lin-Kou Dist., New Taipei City, Taiwan 244, R.O.C.

Site Filing : Federal Communication Commissions – USA

Designation No.: TW1020 (Test Firm Registration #: 651092)

Designation No.: TW1113 (Test Firm Registration #: 959554)

Industry Canada (IC)

OUR FILE: 46405-4437

Registration No. (OATS 1): Site# 4437A-1


Registration No. (Chamber 3): Site# 4437A-5


Voluntary Control Council for Interference by Information

Technology Equipment (VCCI) – Japan

Member No.: 1349

Registration No. (Conducted Room): C-11094

Registration No. (Conducted Room): T-11562

Registration No. (OATS 1): R-11040; G-10274

Site Accreditation : Bureau of Standards and Metrology and Inspection (BSMI) –

Taiwan, R.O.C.

Accreditation No.:

SL2-IN-E-0026 for CNS 13438 / CISPR 22

SL2-R1-E-0026 for CNS 13439 / CISPR 13

SL2-R2-E-0026 for CNS 13439 / CISPR 13

SL2-L1-E-0026 for CNS 14115 / CISPR 15

Taiwan Accreditation Foundation (TAF)

Accreditation No.: 1113

Vehicle Safety Certification Center (VSCC) Approval No.: TW16-11

TüV NORD

Certificate No: TNTW0801R



1.3 Measurement Uncertainty

Item Value

Chamber 2:

ESA Conducted Emission Test (150 kHz to 108 MHz) 3.0 dB

ESA Radiated Emission Test (150 kHz to 30 MHz) 3.5 dB

ESA Radiated Emission Test (30 MHz to 250 MHz) 3.6 dB


ESA Radiated Emission Test (1 GHz to 2.5 GHz) 3.8 dB

Chamber 6:

ESA Conducted Emission Test (150 kHz to 108 MHz) 3.0 dB

ESA Radiated Emission Test (150 kHz to 30 MHz) 3.5 dB



ESA Radiated Emission Test (1 GHz to 2.5 GHz) 3.7 dB

The reported expanded uncertainty is based on a standard uncertainty multiplied by a coverage factor of k=2, providing a level of confidence of approximately 95%



2 ESA Radiated Disturbances Test

2.1 Instrument

Instrument Manufacturer Model Serial No. Next Cal. Date

Biconical Antenna Schwarzbeck VHBB 9124 & BBA 9106

9124-743 2019/07/23

Log Antenna Schwarzbeck VUSLP 9111B 911B-146 2019/07/23

Pre-Amplifier EMCI EMC01640 980105 2019/08/20

EMI Test Receiver Rohde & Schwarz ESR7 101422 2018/12/05

DC LISN SCHWARZBECK NNBM 8124-200 244 2018/12/04

DC LISN SCHWARZBECK NNBM 8124-200 245 2018/12/04

RF Cable EMCI EMC104 CBL63 2019/03/11



Note: The above equipments are within the valid calibration period.

2.2 Block Diagram of Test Configuration



2.3 ESA Radiated Disturbances Limit

Frequency range Broadband Limits Narrowband Limits F Quasi peak Average

MHz dBμV/m dBμV/m

30 to 75 62 - 52 52 - 42

75 to 400 52 - 63 42 - 53

400 to 1000 63 53

2.4 Test Procedure

The radiated disturbances of ESA representative of its type shall be tested by the method(s)

according to CISPR 25: 2002+Corr.: 2004 as described in EN 50498: 2010 Clause 7.1 & 7.2

(Automotive EMC Directive 2004/104/EC, Annex I, 6.5 and 6.6).

2.5 Test Result

The final test data is shown as following pages.



Job No.: 18A082403V Polarization: Horizontal Standard: EN50498_QP Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:02:07 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 31.2995 56.10 -28.58 27.52 61.54 -34.02 QP P 2 42.9583 57.34 -28.71 28.63 58.08 -29.45 QP P 3 47.4408 53.13 -28.77 24.36 57.00 -32.64 QP P 4 67.9918 47.03 -29.67 17.36 53.07 -35.71 QP P 5 83.5669 48.11 -30.29 17.82 52.71 -34.89 QP P 6 120.7531 55.41 -28.20 27.21 55.13 -27.92 QP P 7 144.3708 48.94 -27.36 21.58 56.30 -34.72 QP P 8 193.2722 38.14 -24.56 13.58 58.22 -44.64 QP P 9 224.7147 35.96 -22.35 13.61 59.21 -45.60 QP P

Chamber 6No.5-2, Lin 1, Tin-Fu, Lin-Kou Dist., New Taipei City, Taiwan 244, 新北市林口區頂福里 1 鄰 5-2 號

Fax: +886-2-2600-6859Tel: +886-2-2600-6861http://www.ietc.com.tw/

Interocean EMC Technology Corp.宇海科技股份有限公司



Job No.: 18A082403V Polarization: Horizontal Standard: EN50498_QP Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:45:05 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 260.7383 46.42 -25.33 21.09 60.19 -39.10 QP P 2 393.6628 54.00 -22.76 31.24 62.90 -31.66 QP P 3 431.9898 50.67 -22.31 28.36 63.00 -34.64 QP P 4 527.9769 51.90 -20.91 30.99 63.00 -32.01 QP P 5 719.9857 51.71 -18.81 32.90 63.00 -30.10 QP P 6 947.9824 44.40 -16.78 27.62 63.00 -35.38 QP P






Job No.: 18A082403V Polarization: Horizontal Standard: EN50498_AV Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:02:07 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 31.2995 51.60 -28.58 23.02 51.54 -28.52 AVG P 2 42.9583 54.77 -28.71 26.06 48.08 -22.02 AVG P 3 47.4408 47.77 -28.77 19.00 47.00 -28.00 AVG P 4 67.9918 40.61 -29.67 10.94 43.07 -32.13 AVG P 5 83.5669 41.57 -30.29 11.28 42.71 -31.43 AVG P 6 120.7531 49.89 -28.20 21.69 45.13 -23.44 AVG P 7 144.3708 42.76 -27.36 15.40 46.30 -30.90 AVG P 8 193.2722 31.53 -24.56 6.97 48.22 -41.25 AVG P 9 224.7147 29.47 -22.35 7.12 49.21 -42.09 AVG P






Job No.: 18A082403V Polarization: Horizontal Standard: EN50498_AV Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:45:05 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 260.7383 35.41 -25.33 10.08 50.19 -40.11 AVG P 2 393.6628 42.11 -22.76 19.35 52.90 -33.55 AVG P 3 431.9898 47.93 -22.31 25.62 53.00 -27.38 AVG P 4 527.9769 48.58 -20.91 27.67 53.00 -25.33 AVG P 5 719.9857 46.32 -18.81 27.51 53.00 -25.49 AVG P 6 947.9824 35.37 -16.78 18.59 53.00 -34.41 AVG P






Job No.: 18A082403V Polarization: Vertical Standard: EN50498_QP Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:22:53 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 31.4992 55.86 -28.58 27.28 61.47 -34.19 QP P 2 41.5776 45.97 -28.72 17.25 58.44 -41.19 QP P 3 50.2204 37.32 -28.87 8.45 56.38 -47.93 QP P 4 69.3178 42.42 -29.72 12.70 52.86 -40.16 QP P 5 84.6475 46.70 -30.27 16.43 52.80 -36.37 QP P 6 109.3647 48.90 -28.66 20.24 54.48 -34.24 QP P 7 120.7401 59.03 -28.20 30.83 55.13 -24.30 QP P 8 194.8088 45.21 -24.48 20.73 58.27 -37.54 QP P 9 220.8376 47.09 -22.54 24.55 59.10 -34.55 QP P






Job No.: 18A082403V Polarization: Vertical Standard: EN50498_AV Power Source: DC 27V (26.1V) Test item: Radiation Test Date: 2018/9/3 Temp.(℃)/Hum.(%): 26(℃)/54% Time: 下午 04:38:12 Company: SENOR TECH CO., LTD Engineer Signature: TONY HUANG Trade Name: Vehicle-Mounted Computer Distance: 1 m Model: iV12 RBW: 120kHz VBW: 300kHz Description:

No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 279.7093 63.44 -24.51 38.93 50.65 -11.72 QP P 2 336.0305 53.55 -23.38 30.17 51.85 -21.68 QP P 3 432.0098 56.14 -22.31 33.83 53.00 -19.17 QP P 4 530.6031 51.95 -20.88 31.07 53.00 -21.93 QP P 5 764.8604 45.82 -18.30 27.52 53.00 -25.48 QP P 6 924.2701 39.77 -16.94 22.83 53.00 -30.17 QP P







No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 31.4992 50.14 -28.58 21.56 51.47 -29.91 AVG P 2 41.5776 42.28 -28.72 13.56 48.44 -34.88 AVG P 3 50.2204 30.81 -28.87 1.94 46.38 -44.44 AVG P 4 69.3178 36.36 -29.72 6.64 42.86 -36.22 AVG P 5 84.6475 40.12 -30.27 9.85 42.80 -32.95 AVG P 6 109.3647 42.37 -28.66 13.71 44.48 -30.77 AVG P 7 120.7401 53.34 -28.20 25.14 45.13 -19.99 AVG P 8 194.8088 38.30 -24.48 13.82 48.27 -34.45 AVG P 9 220.8376 40.35 -22.54 17.81 49.10 -31.29 AVG P







No. Frequency Reading Factor Result Limit Margin Detector P/F Remark (MHz) (dBuV) (dB/m) (dBuV/m) (dBuV/m) (dB) 1 279.7093 53.38 -24.51 28.87 50.65 -21.78 AVG P 2 336.0305 49.46 -23.38 26.08 51.85 -25.77 AVG P 3 432.0098 53.63 -22.31 31.32 53.00 -21.68 AVG P 4 530.6031 40.15 -20.88 19.27 53.00 -33.73 AVG P 5 764.8604 35.17 -18.30 16.87 53.00 -36.13 AVG P 6 924.2701 32.19 -16.94 15.25 53.00 -37.75 AVG P






3 ESA Conducted Transient Disturbances Test

3.1 Instrument


Wave Surfer LeCroy WS452 LCRY0301J17164 2019/09/02

DC Power Supply Twintex TP-30102 1223AP0901006 2019/08/21

DC LISN SCHWARZBECK NNBM 8126G 9263 2019/09/04

Test S/W Ling-EN N/A N/A N. C. R.





3.3 ESA Conducted Transient Disturbances Limit Functional status for systems Polarity of pulse

amplitude Vehicles with 12V systems Vehicles with 24V systems Positive +75 +150 Negative -100 -450

3.4 Test Procedure

The conducted transient disturbances of ESA representative of its type shall be tested by the

method(s) according to ISO 7637-2: 2004+A1: 2008 as described in EN 50498: 2010 Clause

7.3 (Automotive EMC Directive 2004/104/EC, Annex I, 6.9).

3.5 Test Result




Test Data

Applicant：SENOR TECH CO., LTD Date of Measurement：2018 / 09 / 11

EUT：Vehicle-Mounted Computer Temp./Humidity/Atm.press.：25°C/ 55% / 996hPa

M/N：iV12 Test Mode：Working mode

Input Voltage：DC 27 V Test Engineer：Vin Chou

Maximum allowed pulse amplitude

Maximum allowed pulse amplitude for Polarity of pulse amplitude

vehicles with 12 V system vehicles with 24 V system

Positive ＋ 75 ＋ 150

Negative － 100 － 450

Test Result

Positive pulses (Us2) 3.4 Volt PASS OFF - ON

Negative pulses (Us1) - 49.4 Volt PASS

Positive pulses (Us2) 31.2 Volt PASS Fast Pulse

ON - OFFNegative pulses (Us1) - 16.4 Volt PASS

Positive pulses (Us2) 3.2 Volt PASS OFF - ON

Negative pulses (Us1) - 31.1 Volt PASS

Positive pulses (Us2) 5.7 Volt PASS Slow Pulse

ON - OFFNegative pulses (Us1) - 6.8 Volt PASS

Comments

Vehicles with 24V System



24V System Fast Pulse (OFF－ON)

US2 = 30.4 V - 27 V = 3.4 V US1 = - 22.4 V - 27 V = - 49.4 V

Fast Pulse (ON－OFF)

US2 = 58.2 V - 27 V = 31.2 V US1 = 10.6 V - 27 V = - 16.4 V



24V System

Slow Pulse (OFF－ON)

US2 = 30.2 V - 27 V = 3.2 V US1 = - 4.1 V - 27 V = - 31.1 V

Slow Pulse (ON－OFF)

US2 = 32.7 V - 27 V = 5.7 V US1 = 20.2 V - 27 V = - 6.8 V



4 ESA Conducted Transient Immunity Test

4.1 Instrument


Micro Transient Generator TESEQ AG MT5511 1284 2019/08/28

Fast Transient Generator TESEQ AG FT5530 79 2019/08/28

Load Dump Generator TESEQ AG LD5505 48 2019/08/28

Function Generator TESEQ AG FG5620 52 2019/08/28

Resistor Module TESEQ AG RM5505 23 2019/08/28



4.3 ESA Conducted Transient Immunity Functional Status

Test pulse number Immunity test level Functional status

1 Ⅲ D

2a Ⅲ D

2b Ⅲ D

3a/3b Ⅲ D

4 Ⅲ D



4.4 Classification of Functional Status Class Functional Status

A All functions of a device/system perform as designed during and after exposure to disturbance.

B

All functions of a device/system perform as designed during exposure. However, one or more of them can go beyond specified tolerance. All functions return automatically to within normal limits after exposure is removed. Memory functions shall remain class A.

C One or more functions of a device/system do not perform as designed during exposure but return automatically to normal operation after exposure is removed.

D

One or more functions of a device/system do not perform as designed during exposure and do not return to normal operation until exposure is removed and the device/system is reset by smiple”operator/use” action.

E

One or more functions of a device/system do not perform as designed during and after exposure and cannot be returned to proper operation without repairing or replacing the device/system.

Note: The word “function” in this context refers only to the function performed by the electronic system.

4.5 Test Procedure

The conducted transient immunity of ESA representative of its type shall be tested by the

method(s) according to ISO 7637-2: 2004+A1: 2008 as described in EN 50498: 2010 Clause

7.4 (Automotive EMC Directive 2004/104/EC, Annex I, 6.8).

4.6 Test Result




Pulse 1

Company Name : SENOR TECH CO., LTD

Equipment Tested : Vehicle-Mounted Computer

Model Number : iV12

Test Equipment used : MT 5511

Test Procedure Used : ISO 7637-2(2004)

General Conditions Ambient Temperature : 27.3℃ Humidity : 35％ Pressure : 988hPa Tested by : Elli Chang

Test Number 1 Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 1 Test Type MT 5511 Pulse 1 SAE (Generic 1 ms transients) Sequence Repetition Count 5000

Test Status

Class D: one or more functions of a device or system do not perform as designed during exposure and do not return to normal operation until exposure is removed and the device or system is reset by simple “operator / use” action.

US

UA

0

t3

t2

t1

V

t

td

90%

10%

- +

EU

T

Parameter Operation From To Step Size Fail Value Pulse Voltage (Us) Static 450 V --- --- --- Pulse Period (t1) Static 0.5 s --- --- --- General Value Rise Time (tr) 3 us Output Resistance (Ri) 50 ohms Pulse Width (td) 1 ms t2 200 ms Polarity/Coupling Negative Parallel Battery Battery State UPC/Time Voltage 27 V Current Limit 25 A End of Test Voltage 27 V Ext.Resistance (Ri) External Resistance Inactive

Comments ※ Test mode: Run BrunIn ※ Monitoring method: Observe screen shows BrunIn program then record the phenomena.

Before the test: The screen shows BrunIn program is in normal state. During the test: The screen is in blank state. After the test: Manually reset the power of EUT to recover to normal state.



Pulse 2a



Model Number : iV12

Test Equipment used : MT 5511



Test Number 1 Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 2a Test Type MT 5511 Pulse 2 (Generic 50 us transients) Sequence Repetition Count 5000

Test Status Class A: all functions of a device or system perform as designed during and after exposure to a disturbance.

US

UA

0V

t1

10%

90%

td

tr

- +

EU

T

Parameter Operation From To Step Size Fail Value Pulse Voltage (Us) Static 37 V --- --- --- Pulse Period (t1) Static 0.2 s --- --- --- General Value Rise Time (tr) 1 us Output Resistance (Ri) 2 ohms Pulse Width (td) 50 us t2 Not Applicable Polarity/Coupling Positive Serial Battery Battery State On Voltage 27 V Current Limit 25 A End of Test Voltage 27 V Ext.Resistance (Ri) External Resistance Inactive


Before the test: The screen shows BrunIn program is in normal state. During the test: The screen shows BrunIn program is in normal state. After the test: The screen shows BrunIn program is in normal state.



Pulse 2b



Model Number : iV12

Test Equipment used : NSG 5600



Test Number 1 Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 2b Test Type NSG 5600 Pulse 2B ( SVV ) Sequence Repetition Count 10

Test Status

Class D: one or more functions of a device or system do not perform as designed during exposure and do not return to normal operation until exposure is removed and the device or system is reset by simple “operator / use” action.

t6

10%

90%

td

tr

tf

0V

t2

US

UA

Voltage Ua 27 V Us 20 V Timing tf 1 mS t6 1 mS tr 1 mS td 200 mS t2 0.5 S t1 5 S Resistance Resistance 0 ohms Battery Current Limit 25 A End of Test Voltage 27 V


Before the test: The screen shows BrunIn program is in normal state. During the test: The screen is in blank state. After the test: Manually reset the power of EUT to recover to normal state.



Pulse 3a



Model Number : iV12

Test Equipment used : FT 5530



Test Number 1 Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 3a Test Type FT 5530 Pulse 3A/B ( Burst ) Sequence Repetition Hours 1


US

UA

0V

t1t4 t5

Vt

Parameter Operation From To Step Size Fail Value Pulse Voltage (Us) Static 150 V --- --- --- Pulse Freq (1/t1) Static 10 kHz --- --- --- General Value Rise Time (tr) 5 nS Output Resistance (Ri) 50 ohms Pulse Width (td) 100 nS Burst Interval(t5) 0.09 Seconds Output Mode NORMAL No Pulses (t4/t1) Burst Duration (t4) 10 mS Battery Battery State On Voltage 27 V Current Limit 25 A End of Test Voltage 27 V Polarity Polarity Negative





Pulse 3b



Model Number : iV12

Test Equipment used : FT 5530



Test Number 1 Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 3b Test Type FT 5530 Pulse 3A/B ( Burst ) Sequence Repetition Hours 1


US

UA

0V

t1

t4 t5

V

t

Parameter Operation From To Step Size Fail Value Pulse Voltage (Us) Static 150 V --- --- --- Pulse Freq (1/t1) Static 10 kHz --- --- --- General Value Rise Time (tr) 5 nS Output Resistance (Ri) 50 ohms Pulse Width (td) 100 nS Burst Interval(t5) 0.09 Seconds Output Mode NORMAL No Pulses (t4/t1) Burst Duration (t4) 10 mS Battery Battery State On Voltage 27 V Current Limit 25 A End of Test Voltage 27 V Polarity Polarity Positive





Pulse 4



Model Number : iV12

Test Equipment used : NSG 5600


Test Number 1

Test Name ISO 7637-2_Transient immunity_24V_LV 3_Pulse 4 Test Type NSG 5600 Pulse 4C ( SVV ) Sequence Repetition Count 1 Test Status Class A: all functions of a device or system perform as designed during and

after exposure to a disturbance.

Segment Number # 1 RAMP

Parameter Mode Initial Value Final Value Amplitude Static 24 Vpp - - - Parameter Value Segment Duration 100 ms


Parameter Mode Initial Value Final Value Amplitude Linear 24 Vpp 12 Vpp Parameter Value Segment Duration 10 ms


Parameter Mode Initial Value Final Value Amplitude Static 12 Vpp - - - Parameter Value Segment Duration 50 ms




Parameter Mode Initial Value Final Value Amplitude Static 19 Vpp - - - Parameter Value Segment Duration 5 Seconds






Parameter Mode Initial Value Final Value Amplitude Static 24 Vpp - - - Parameter Value Segment Duration 100 ms Battery: End of Test: Current Limit: 25 A Voltage: 27 V






5 Photographs of Test

5.1 ESA Radiated Disturbances Test

View of Measurement (Frequency 30 MHz - 250 MHz) (Biconical Antenna)

View of Measurement (Frequency 250 MHz - 1000 MHz) (Log Antenna)



5.2 ESA Conducted Transient Disturbances Test

Fast Pulse

Slow Pulse



5.3 ESA Conducted Transient Immunity Test



6 Photographs of EUT

Front View of EUT

Rear View of EUT



Inner View of EUT



Front View of Main PCB

Rear View of Main PCB



Front View of PCB-1

Rear View of PCB-1



Front View of PCB-2

Rear View of PCB-2



Front View of RAM

Rear View of RAM



Front View of SSD

Rear View of SSD



Front View of RF Module

Rear View of RF Module

18A082403V-C1 SENOR Vehicle-Mounted Computer iV12 · 2019-01-14 · Report No.: 18A082403V-C1 Page...

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