15t Capability

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    Process CapabilityAnalysis

    Process Capability Indices: Pp, Ppk

    Observed DPM, Expected DPM

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    TopicsI. Concept of Process Capability

    II. Commonly Used Process Capability Indices

    Exclude Centering: Pp

    Include Centering: Ppk

    III. Interpreting Capability Indices

    Identifying Mean Vs. Variation Concerns

    IV. Process Capability and One-Sided Specifications

    V. Process Capability Indices and DPM

    VI. Sigma Level

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    I. Concept of Process Capability measure how well the output of a process meets

    specification limits.

    Provide tool to help assess whether defects arerelated to mean or variation concerns.

    LSL USLLSL USL

    Mean = 20S= 1.82

    DPM=6000

    Mean = 23S= 0.8

    DPM=6000

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    Target, Tolerances &

    Specifications Target (nominal) - desired value of a characteristic.

    Tolerance - specifies an allowable deviation relative to a target valuewhere a characteristic is acceptable.

    Example: Order Time Specification: 20 +/- 5 days Target___ Tolerance width ___ LSL___ USL ___

    One Sided-Specification (LSL or USL) time < 25 days; fee > $700

    Target

    Upper Specification

    Limit (USL)Lower Specification

    Limit (LSL)

    + t- t

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    Three Point Estimates

    If you do not have specifications, you need to:

    Estimate them by asking Process Owners or Customers (for theirexpectations).

    Sample Questions for Process Owner: What is your estimate of the time the process will take?

    Target

    What are the minimum and the maximum times you expect?

    LSL and USL

    Note: it may take some analysis to finalize meaningful

    specifications.

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    Assessing Process Capability

    (Low Dispersion,Off Target)

    Ideal(On Target,

    Low Dispersion)

    (On Target,High Dispersion)

    Compare:

    Mean Target, and Variation - Tolerance Widths

    Consider some possible conditions: Mean On or Off Target

    Variation (Range)

    Low or highrelative to tolerance width

    Worst Condition(Mean Off Target,

    High Dispersion)

    LSL USL

    LSL USL LSL USL LSL USL

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    II. Process Capability Indices Common Indices Used in Process Capability

    Pp, Cp

    Ppk, Cpk

    Key Issues:

    Exclude or include process centering (mean).

    Exclude: Pp, Cp

    Include: Ppk, Cpk

    Method of estimating variation

    Pp, Ppk ~ use S- Sample Std Deviation Note: Cp, Cpk, ~ use inherent common cause or within subgroup

    variation from Statistical Process Control (SPC) chart methods(covered in Black Belt Course)

    Focus of this Course: Pp and Ppk

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    Pp Index Pp measures the relationship between the tolerance width

    and the predicted range of variation (estimated by 6S).

    Pp does not consider the location of the mean andtherefore represents thepotentialof the process to meetspecifications ifthe mean were on Target.

    6

    LSL-USL=

    sigma6

    Tolerance WidthPp=

    For Pp, estimate using sample std deviation, S

    Sample Standard DeviationIn Excel: S=stdev(array) ( )

    =

    n

    i

    i

    nxS x

    1

    2

    1=

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    Pp Examples

    For the same Pp, the # of defects may vary significantly.

    T

    LSL USL

    T

    Case 1: Case 2:

    defects defects

    LSL USL

    Case LSL T USL Mean StDev PpEstimated

    DPM

    1 15 20 25 20.5 1.2 1.4 91

    2 15 20 25 22.0 1.2 1.4 6,210

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    Ppk Index Ppk takes into account any difference between the

    target and the process mean (X).

    LSL USL

    TargetX = Mean

    PpkUPpkL

    3=U

    XUSLPpk

    3=L

    LSLXPpk

    Ppk = min (PpkL, PpkU)

    estimate s using sample std deviation, S

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    Pp and Ppk Calculation Exercise Suppose Order Time is 20 +/- 5 days

    Sample 50 Orders: Mean = 20.5; S= 1.2

    Compute Pp and Ppk?

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    Difference Between Pp & Ppk By including how close the mean is to target, Ppk

    provides a better relationship to defects (DPM).

    T

    Case 1: Case 2:

    defects

    LSL USL

    Case LSL T USL Mean StDev Pp PpkEstimated

    DPM

    1 15 20 25 20.5 1.2 1.4 1.3 912 15 20 25 22.0 1.2 1.4 0.8 6,210

    LSL USL

    T defects

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    Pp and Ppk Criteria Desired Pp and Ppk values may vary by industry / application.

    (Most industries require at least a Pp and Ppk > 1.33)

    Some general goals are as follows:

    Criteria FormulaModerate

    Goals

    Six Sigma

    Goals

    Pp (or Cp) Pp > 1.67 Pp > 2.0

    Ppk (or Cpk) Ppk > 1.33 Ppk > 1.5

    6

    LSLUSL

    )3

    ,3

    min(

    LSLXXUSL

    *Assumes 2-Sided Specification

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    III. Interpreting Pp and Ppk

    By definition: Ppk

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    Pp and Ppk Examples

    Objective: Ppk > 1.67 and Pp > 1.67 For each of the following, assess if likely have

    a mean and/or variation problem:

    Pp = 0.4 and Ppk = 0.3 M or V

    Pp = 0.8 and Ppk = -0.2 M or V

    Pp = 2.0 and Ppk = 0.2 M or V

    Pp = 1.5 and Ppk = 0.5 M or V

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    Summary of Combinations Combinations:

    1. Mean and Variation Problem

    High Dispersion, Off Target ~Low Pp, Ppk

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    IV. Capability Indices for One-Side

    Specifications For some processes, we may only have one

    specification limit. Order Time < 25 days (USL = 25 days)

    Fee > $700 (LSL = 700)

    Here, we only compute Ppk.

    3=

    XUSLPpk

    If USL only:

    If LSL only:3

    =LSLX

    Ppk

    For Ppk, estimate using sample standard deviation, S

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    Process Improvement For one-sided specification, we may improve Ppk (and

    reduce defects) by either shifting mean away fromspecification limit and/or reduce standard deviation.

    USL=25

    defects

    USL1) Shift Mean 18Same Sigma (S=1.2)

    USL

    2) Reduce S 0.52

    Same Mean (22)

    Current State

    Ppk = 0.8Mean = 22; S= 1.2

    Future State

    Ppk = 1.9

    Ppk = 1.9

    -OR

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    V. Process Capability and DPM We often relate process capability with Observed or Expected DPM.

    Observed DPM based on number of samples actually

    observed outside the specification limits divided by totalnumber of samples.

    Expected DPM based on fitting sample data to a distributionand determining the probability of a defect.

    To calculate Expected DPMs, we need Specification Limits, Mean,Standard Deviation, and an Assumed Distribution (Normal) to find theprobability of a defect.

    DPM = Probability of a Defect * 1 Million

    Understanding how to compute Probability is a Black Belt Skill. Still,Green Belts should be able to use software to estimate DPMs.

    QE Tools Process Capability Summary

    DPM Calculator, or Process Capability Summary

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    DPM Calculator Normal

    (use if you only have summary statistics)

    QETools Process

    Capability Summary DPM Calculator

    Enter the mean, standard

    deviation, andspecifications in theyellow boxes to get DPM.

    Mean = 20.5 andStandard Deviation = 1.2

    Specification: 20 +/- 5

    DPM Calculator Assuming Normal Distribution

    DPM given Average, Sigma, USL, LSLinsert values in white boxes.

    Average 20.5Standard Deviation 1.2

    USL 25 Upper Specification LimitTarget 20 Nominal Value (optional)

    LSL 15 Lower Specification Limit

    DPM Probability Defect DPMDPM > USL 0.000088 88.4DPM < LSL 0.000002 2.3

    DPM Total 0.000091 90.7

    Pp 1.39Ppk 1.25

    Predicted DPM 90.7Quality Yield 99.99%

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    DPM Example

    Suppose mean

    shifts from 20.5 to22 days with thesame S= 1.2.

    Is this a meanand/or variationconcern?

    Hint: compare Pp,Ppk, DPM with priorexample

    Average 22Standard Deviation 1.2

    USL 25 Upper Specification Limit

    Target 20 Nominal Value (optional)LSL 15 Lower Specification Limit

    DPM Probability Defect DPMDPM > USL 0.006210 6,209.7DPM < LSL 0.000000 0.0DPM Total 0.006210 6,209.7

    Pp 1.39Ppk 0.83

    Predicted DPM 6,209.7Quality Yield 99.38%

    Average 20.5Standard Deviation 1.2

    USL 25 Upper Specification LimitTarget 20 Nominal Value (optional)

    LSL 15 Lower Specification Limit

    DPM Probability Defect DPMDPM > USL 0.000088 88.4DPM < LSL 0.000002 2.3DPM Total 0.000091 90.7

    Pp 1.39Ppk 1.25

    Predicted DPM 90.7Quality Yield 99.99%

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    Process Capability - QETools QE tools may be used to compute process capability (Pp/

    Ppk), Observed DPM, and Expected DPM.

    Two Options:

    Process Capability Summary Normal (use if data are normal)

    Process Capability Summary Non-Normal (use if data areskewed right or follow an exponential distribution).

    Note: if data do not follow these patterns, use ObservedDPM (e.g., if bi-modal).

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    Process Capability Normal Suppose you have wait time with a USL = 40.

    See wait-time-B in excel file: capability.xls

    Note:One-Sided Specification

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    Sample Results: Wait-Time QETools Process Capability Summary Normal

    Process Capability Graphical SummaryWait-Time-B

    Summary Statistics

    USL 40.00LSL

    N 70

    Mean 38.21

    Sigma (R-bar) 4.28

    Sigma (Overall) 4.55Range 22.00

    Process Capability

    CpCpk 0.14

    Pp

    Ppk 0.13

    xp. vera er ormanceDPM < LSL

    DPM > USL 347,424.0

    DPM Total 347,424.0

    Observed PerformanceDPM < LSLDPM > USL 342,857.1

    DPM Observed 342,857.1

    Histogram

    0

    2

    4

    6

    8

    10

    12

    14

    26.90 29.10 31.30 33.50 35.70 37.90 40.10 42.30 44.50 46.70 48.90 51.10

    USLDATA are

    Close toNormal347K DPM

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    Non-Normal Distributions For non-normal processes (e.g., skewed right

    distributions), you should either: Use non-normal distribution (e.g., weibull distribution in QETools)

    Use the % Observed DPM method (i.e., # of observed defects / #samples).

    Careful with interpreting % observed with small sample sizes(e.g., N < 30)

    USL

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    Histogram

    0

    5

    10

    15

    20

    25

    11.20

    12.80

    14.40

    16.00

    17.60

    19.20

    20.80

    22.40

    24.00

    25.60

    27.20

    28.80

    30.40

    32.00

    33.60

    35.20

    36.80

    38.40

    USLLSL

    Process Capability Non-normal

    (Skew Right) Data on order fill time for shipping industrial PCs.

    Goal: 20 +/- 5 days Is this a Mean Off Target or Variation Problem?

    USL 25.00

    LSL 15.00

    N 155

    Mean 20.61

    St Dev 4.51

    Results: QETools >> Process Capability Summary Non Normal

    Assumed Distribution: Weibull

    Process CapabilityPp 0.39

    Ppk 0.24

    Exp.Overall PerformanceDPM < LSL 102,638.7

    DPM > USL 149,455.2

    DPM Total 252,093.8

    Observed PerformanceDPM < LSL 58,064.5

    DPM > USL 154,838.7

    DPM Observed 212,903.2

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    Process Capability

    Six Sigma Project Measure Phase assess current state: Pp, Ppk, DPM

    Analyze Phase identified sources of variation: in-house delays related to incomplete order information and

    components not in stock.

    Improve Phase created new systems to enter new order

    information and manage inventory. Re-Assess Capability After Improvements are made.

    CurrentState

    PostImprovements

    Sample 155 55

    Mean 20.6 20.4

    Sigma 4.51 2.50

    Pp 0.39 0.66Ppk 0.24 0.61

    Actual DPM 212,903 48,270

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    VI. Sigma Level Converters

    Yield DPM (DPMO) Sigma Level

    30.9% 690,000 1.069.2% 308,537 2.0

    93.3% 66,807 3.0

    99.4% 6,210 4.099.98% 230 5.0

    99.9997% 3.4 6.0

    DPMO Defects per million opportunity

    Given DPM or DPMO estimate, we may equate to a sigma level

    (this is an index scale). Some sample sigma levels are:

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    Sigma Level QE Tools QE Tools will compute Sigma Level given:

    Yield DPM or DPMO level

    Sigma Level from Quality Yield (Yield = 1 - % defective)

    Quality Yield % Non-Conforming DPM Z Sigma Level

    0.9999966 0.0000034 3.4 4.50 6.00

    Sigma Level for DPM for Non Centered Process - Assumes 1.5 sigma shift (Normal Distributio

    DPM Yield Prob Z Sigma Level

    6210 99.38% 0.0062100 2.4999809 4.00

    *QETools Process Capability Summary Sigma Level

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    Summary Process capability indices (and Sigma Level) are additional

    performance measures used in Six Sigma projects. Pp and Ppk together help identify if defects are related to

    Mean and/or Variation problems. For example, Mean off target/low variation (Pp high, Ppk low);

    Mean on-target/high variation (Pp and Ppk low, Pp=Ppk); Mean off target and high variation (Pp/Ppk low, Ppk