Fast Device Tune Measurement Solution for Calibrating W-CDMA ...
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram [email protected] Vishwani D. Agrawal.
Finding Optimum Clock Frequencies for Aperiodic Test Master’s Thesis Defense Sindhu Gunasekar Dept. of ECE, Auburn University Advisory Committee: Dr. Vishwani.
Optimal Selection of ATE Frequencies for Test Time Reduction Using Aperiodic Clock Sindhu Gunasekar Vishwani D. Agrawal.
FUTURE IC TEST CHALLENGES QUALITY, COST AND TIME TO MARKET Korea test conference workshop 2014 Jin-Soo Ko Teradyne Inc. [email protected] Korea test.
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
Finding Optimum Clock Frequencies for Aperiodic Test
