Electric Arc Furnace STEEL MAKING
On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits
Scanning probe microscopy (SPM) and lithography
Spring 2007EE130 Lecture 42, Slide 1 Lecture #42 OUTLINE IC technology MOSFET fabrication process CMOS latch-up Reading: Chapter 4 Die photo of Intel Penryn.
Scanning probe microscopy (SPM) and lithography 1.Atom and particle manipulation by STM and AFM. 2.AFM oxidation of Si or metals. 3.Dip-pen nanolithography.
