Ordinal Logistic Regression Analysis for Statistical Determination of Forming Limit Diagrams B.M. Colosimo Università di Cassino Dip. Ingegneria Industriale.
ac.els-cdn.com_S0951832000000478_1-s2.0-S0951832000000478-main
Alvin Anthony PhD
Ladislav Andricek TIPP 2011, Chicago, June 2011 1 XFEL DSSC DSSC - an X-ray Imager with Mega-Frame Readout Capability for the European XFEL Ladislav Andricek,
MAPS in 130 nm triple well CMOS technology for HEP applications
Volcanic environments monitoring by drones: mud volcano case study
Matteo Porro FEE 2011 Bergamo, 26.05.11 1 XFEL DSSC The DSSC project for XFEL: DEPFET and readout ASIC 8 th International Meeting on Front End Electronics.
16 mesi di attività di ricerca
2010_12_Ferrari
IL MARKETING FARMACEUTICO E LA DECISIONE CONSAPEVOLE. FARMACI ORIGINATOR VS FARMACI EQUIVALENTI
10-02-2015 (Monday)
DSSC - an X-ray Imager with Mega-Frame Readout Capability for the European XFEL
