GaN-on-Si Patent Investigation
Thin films (see Bowen & Tanner, High Resolution X-ray Diffractometry and Topography, Chap. 3) Thin films (see Bowen & Tanner, High Resolution X-ray Diffractometry.
Metallurgy dictionary
Acta Materialia 57 (2009) 559 Indent
Annealing
Strained metallic surfaces. theory, nanostructuring and fatigue strength, 2009, p.261
Mater science engin_a 527 (2010) 2738
Annu. Rev. Mater. Res. 2002 Vol 32 P 53 Overview Cellular Automa
Seismic Waves and Earth’s Interior
Cd2SnO4 دراسة تأثير التلدين على الخواص التركيبية والبصرية لأغشية
Tauhiduzzaman_Vedhuis(2014)
2013-10-21 Apsc278 Midterm With Solutions
