Samsung Galaxy S Duos S7562 ръководство на потребителя
ELECTRICAL AND THERMAL CHARACTERIZATION OF MULTILAYER STRUCTURE DEVICES FOR FAST PC IMPLEMENTATION
Talkback - Customer Feedback Management Solution
Detectors for LHC crystal tests
SiPM technology at FBK C. Piemonte [email protected] Fondazione Bruno Kessler, Trento, Italy.
Nanofluidic Microsystems for Advanced Biosample Preparation Ying-Chih Wang ([email protected]) 1, Jianping Fu, Yong-Ak Song and Jongyoon Han 2,3 1 Department.
Full –Band Particle-Based Analysis of Device Scaling For 3D Tri-gate FETs
Mitsubishi PCL-QCPU
