June 11, 2014 [email protected] sawyes/courses.html 1 ECSE-6230 Semiconductor Devices and Models I Lecture 14 Prof. Shayla Sawyer Bldg. CII,
Fabrication and Characterization of n-ZnO/p-Si Heterostructure
Power Device Analyzer/Curve Tracer
2896 C-V Char Mos CA#26c8b1
P.G. Pelfer University of Florence and INFN, Firenze, Italy F. Dubecky
Charge collection in irradiated pixel sensors V. Chiochia a, C.Amsler a, D.Bortoletto c, L.Cremaldi d, S.Cucciarelli e, A.Dorokhov a,b*, C.Hörmann a,b,
P. Riedler- GGT Meeting 3/4/20061 Status of Sensor Irradiation and Bump Bonding P. Riedler, G. Stefanini P. Dalpiaz, M. Fiorini, F. Petrucci.
3D-FBK pixel sensors with CMS readout: first tests results M. Obertino, A. Solano, A. Vilela Pereira, E. Alagoz, J. Andresen, K. Arndt, G. Bolla, D. Bortoletto,
30 th March 2010
P.G. Pelfer University of Florence and INFN, Firenze, Italy F. Dubecky Institute of Electrical Engineering, Slovak Academy of Sciences Bratislava, Slovakia.
23 th November 2010 Possibly relevant new from RD50 G. Casse.
