Volume 3902 Laser-Induced Damage in Optical Materials: 1999 Chairs/Editors: Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith L. Lewis, M. J. Soileau Foreword International Program Committee Symposium Welcome Summary of Meeting

SESSION 1 MINI-SYMPOSIUM: LASER DAMAGE PROCESSES IN THE EYE AND OTHER BIOLOGICAL TISSUE Overview of the range of mechanisms [3902-57] D. Sliney Photochemical mechanisms of ocular photic injury (Abstract Only) [3902-58] B. Stuck, D. Lund, J. Zuclich Spectral dependence of retinal thermal injury [3902-59] D. Lund, P. Edsall, B. Stuck Photomechanical effects: experimental studies of pigment granule absorption, cavitation, and cell damage [3902-60] J. Roegener, C. Lin Theoretical modeling of laser-induced explosive pressure generation and vaporization in pigmented cells [3902-61] B. Gerstman Retinal damage from femtosecond to nanosecond laser exposure [3902-62] R. Thomas, G. Noojin, D. Stolarski, G. Hengst, C. Toth, W. Roach, B. Rockwell Retinal damage thresholds for large-image sources (Abstract Only) [3902-64] R. Hollins, S. Till Variation of laser-induced retinal damage threshold with retinal image size (Abstract Only) [3902-72] J. Zuclich, D. Lund, P. Edsall, R. Hollins, P. Smith, B. Stuck, L. McLin, P. Kennedy, S. Till SESSION 2 SURFACES AND MIRRORS Perfect mirrors from a coating designer's point of view [3902-53] C. Carniglia Calculated and measured laser-induced damage threshold (LIDT) in glass and metal optics [3902-1] M. Acharekar, P. Morrison, D. Sengupta, A. Kar Thermographic profiles on optical surfaces: from insulators to metals [3902-9] R. Shah, A. Stewart, J. Bettis, L. Bonsall Nanosecond interferometric studies of surface deformation induced by laser irradiation [3902-11] S. Greenfield, J. Casson, A. Koskelo Total scatter losses of optical components in the DUV/VUV spectral range [3902-22] P. Kadkhoda, A. Mueller, D. Ristau Laser-modulated scatter from optical surfaces using fiber detection [3902-38] J. Natoli, C. Deumie, C. Amra

Luminescence investigation of SiO2 surfaces damaged by 0.35-nm laser illumination [3902-6] M. Kozlowski, C. Battersby, S. Demos Thermoelastic influence of substrate on damage threshold of ultraviolet dielectric coatings [3902-21] B. Li, S. Martin, E. Welsch SESSION 3 THIN FILMS Recent advances in laser spallation technique for measurement of interfacial strength in thin films and multilayers (Abstract Only) [3902-54] V. Gupta 100- J/cm2 1.06-µm mirrors [3902-35] J. DiJon, B. Rafin, C. Pelle, J. Hue, G. Ravel, B. Andre Laser-induced damage of overcoated materials at high humidity [3902-13] K. Yoshida, N. Tochio, M. Ohya, T. Matsuoka, K. Yagi, K. Ochi, S. Kaku, T. Kamimura, N. Kuzuu Laser damage threshold of MgF2 thin films by photoacoustic beam deflection [3902-18] M. Protopapa, M. Perrone, A. Piegari, E. Masetti, D. Ristau, E. Quesnel, A. Duparre Comparison of the optical properties and UV radiation resistance of HfO2 single layers deposited by reactive evaporation, IAD, and PIAD [3902-24] R. Thielsch, T. Feigl, N. Kaiser, S. Martin, S. Scaglione, F. Sarto, M. Alvisi, A. Rizzo Correlation between the structural and optical properties of ion-assisted afnia thin films [3902-12] S. Scaglione, F. Sarto, M. Alvisi, A. Rizzo, M. Perrone, M. Protopapa CO2 laser damage trials on chemical vapor deposited diamond [3902-37] C. Pickles, S. Coe, T. Madgwick, R. Sussmann, C. Wort, K. Lewis Alternative coating materials and treatments for the manufacture of ultraviolet sol-gel mirrors [3902-36] H. McInnes, J. Andrew, N. Bazin, A. Morris

Critical issues on the assessment of laser-induced damage thresholds of fluoride multilayer coatings at 193 nm [3902-23]

R. Thielsch, J. Heber, N. Kaiser, S. Martin, E. Welsch Nonlinear absorption phenomena in oxide coatings for 193 nm [3902-25] O. Apel, K. Mann, J. Heber, R. Thielsch Thickness dependence of damage thresholds for 193-nm dielectric mirrors by predamage sensitive photothermal technique [3902-20] H. Blaschke, W. Arens, D. Ristau, S. Martin, B. Li, E. Welsch Properties of fluoride DUV excimer laser optics: influence of the number of dielectric layers [3902-28] W. Arens, D. Ristau, J. Ullmann, C. Zaczek, R. Thielsch, N. Kaiser, A. Duparre, O. Apel, K. Mann, H. Lauth, H. Bernitzki, J. Ebert, S. Schippel, H. Heyer Formulas for the strains, the stresses, and the curvature of multilayered optical windows [3902-51] C. Klein Linear and nonlinear contributions on the dielectric response of zirconia and polyethylene films [3902-52] K. Ferris, G. Exarhos, S. Risser Reversible laser damage of dichroic coatings in a high-average-power laser vacuum resonator [3902-73] R. Chow, L. Berzins, P. Arnold, G. Erbert

SESSION 4 FUNDAMENTAL MECHANISMS Time-resolved studies of laser damage processes in DKDP crystals [3902-55] H. Jiang, J. McNary, H. Tom, M. Yan, H. Radousky, S. Demos Electron tunnel ionization: the pulse length and wavelength dependence [3902-10] J. Bettis Laser-induced damage simulations of absorbing materials under pulsed IR irradiation [3902-33] P. Combis, F. Bonneau, G. Daval, L. Lamaignere Error analysis of ISO 11551 [3902-7] J. Arenberg Refined statistical measurements of laser damage [3902-30] P. Volto, A. Roussel, C. Cordillot, D. Bernardino, H. Bercegol

Statistical distribution of laser damage and spatial scaling law for a model with multiple defect cooperation in damage [3902-31]

H. Bercegol Large-scale laser damage experiments on LIL mirrors: statistical analysis [3902-32] J. Néauport, P. Volto, V. Beau, A. Roussel, O. Lam, D. Bernardino, H. Bercegol Jefferson Lab. FEL user facility [3902-74] M. Shinn, S. Benson, G. Biallas, C. Bohn, D. Douglas, H. Dylla, R. Evans, J. Fugitt, J. Gubeli, R. Hill, K. Jordan, G. Krafft, R. Li, L. Merminga, G. Neil, D. Oepts, P. Piot, J. Preble, T. Siggins, R. Walker, B. Yunn Automated damage onset analysis techniques applied to KDP damage and the Zeus small-area damage test facility [3902-2] R. Sharp, M. Runkel Laser damage of silicon oxynitride mirrors: comparison of theory and experiment [3902-66] G. Gurtman, R. Wilson, M. Rice, K. Lewis, M. Corbett, J. Sprague, J. Grun, G. Davis SESSION 5 MATERIALS AND MEASUREMENTS Microstructural characterization of inhomogeneous media [3902-56] A. Dogariu Laser-induced bulk damage of various types of vitreous silica [3902-14] N. Kuzuu, N. Umemura, A. Nagafuchi, K. Yagi, K. Ochi, K. Yoshida Laser-induced damage threshold of optical components for ultrashort-pulse laser systems [3902-19] K. Starke, T. Groß, D. Ristau Laser-induced damage in nonlinear crystals on irradiation direction and polarization [3902-15] H. Yoshida, T. Jitsuno, H. Fujita, M. Nakatsuka, T. Kamimura, M. Yoshimura, T. Sasaki, A. Miyamoto, K. Yoshida Evaluation of KTiOPO4 crystals for high-power laser [3902-17] S. Motokoshi, T. Jitsuno, M. Nakatsuka, Y. Izawa Laser-induced material modification in the bulk KDP crystals [3902-4] S. Demos, H. Radousky, M. Staggs, M. Runkel, A. Burnham Modeling KDP bulk damage curves for prediction of large-area damage performance [3902-3] M. Runkel, R. Sharp Laser damage durability in borate crystals for high-power all solid state UV lasers (Abstract Only) [3902-16] T. Kamimura, H. Furuya, I. Yamada, K. Nakai, M. Yoshimura, Y. Yap, Y. Mori, T. Sasaki, H. Yoshida, M. Nakatsuka, M. Tanaka, Y. Okada, K. Yoshida

Scatter loss from environmental degradation of KDP crystals [3902-5] E. Wheeler, J. McWhirter, P. Whitman, C. Thorsness, J. De Yoreo, I. Thomas, M. Hester Scatter and absortion losses from DUV optics: a comparative study [3902-26] O. Apel, K. Mann Pulsed top-hat beam thermal lens: a simple and sensitive tool for in-situ measurement on ultraviolet dielectric components [3902-27] B. Li, S. Martin, E. Welsch, R. Thielsch, J. Heber, N. Kaiser Creation of laser-induced damage images [3902-39] I. Troitski Systems for creation of laser-induced damage images and problems of their optimization [3902-40] I. Troitski Laser damage tests and optical densities of laser goggles [3902-34] J. Hue, C. Pelle, P. Garrec, O. Lartigue, F. Baume, J. Rochas SESSION 6 1998 SYMPOSIUM LATE SUBMISSION Coated optics for DUV excimer laser application [3902-75] J. Ullmann, M. Mertin, H. Lauth, H. Bernitzki, K. Mann, D. Ristau, W. Arens, R. Thielsch, N. Kaiser

Volume 4347 Laser-Induced Damage in Optical Materials: 2000 Chairs/Editors: Gregory J. Exarhos, Arthur H. Guenther, Mark R. Kozlowski, Keith L. Lewis, M. J. Soileau Foreword International Program Committee Symposium Welcome

Summary of Meeting SESSION 1 THIN FILMS Time-resolved diagnostics and mechanisms of single-wall carbon nanotube synthesis by the laser vaporization technique [4347-2] D. Geohegan, A. Puretzky, X. Fan, S. Pennycook, M. Guillorn, M. Simpson, V. Merkulov, D. Austin, D. Joy Long-time radiation-resistant optical coatings for UV excimer laser applications [4347-42] S. Laux, H. Bernitzki, M. Klaus, H. Lauth, N. Kaiser Interfacial absorption of DUV coatings [4347-39] O. Apel, M. Schulz-Grosser, U. Leinhos, M. Kennedy, K. Mann, R. Schuhmann Femtosecond laser damage in dielectric coatings [4347-63] J. Bonse, S. Baudach, J. Krüger, W. Kautek, K. Starke, T. Groß, D. Ristau, W. Rudolph, J. Jasapara, E. Welsch Physical mechanisms of femtosecond-pulse-induced damage in dielectric thin films [4347-40] J. Jasapara, V. Nampoothiri, W. Rudolph, D. Ristau, K. Starke Optical damage of sputtered gold films irradiated with femtosecond laser pulses [4347-81] R. Boedefeld, J. Schreiber, H. Geßner, E. Welsch, W. Theobald, T. Feurer, R. Sauerbrey Laser conditioning characterization and damage threshold prediction of hafnia/silica multilayer mirrors by photothermal microscopy [4347-56] A. Papandrew, C. Stolz, Z. Wu, G. Loomis, S. Falabella Absorptance measurements of optical coatings: a round robin [4347-36]

R. Chow, J. Taylor, Z. Wu, A. Boccara, U. Broulik, Y. Chen, M. Commandre, J. DiJon, C. Fleig, A. Giesen, Z. Fan, P. Kuo, R. Lalezari, K. Moncur, H. Obramski, C. Pelle, D. Reicher, D. Ristau, P. Roche, B. Steiger, M. Thomsen, M. Von Gunten, Q. Zhao

Quadratic increase of nonlinear absorption in thin Al2O3 films at 193 nm [4347-37] O. Apel, K. Mann, G. Marowsky Laser-induced damage of fluoride coatings for UV lasers (Abstract Only) [4347-73] K. Yoshida, M. Ohya, K. Yagi, T. Matsuoka, K. Ochi, M. Sunagawa, T. Kamimura

Different conditioning and absorption behavior of fluoride material combinations for dielectric multilayers at 193 nm [4347-66]

B. Li, S. Martin, E. Welsch Optical measurement of UV absorption in dielectric coatings [4347-67] S. Martin, S. Bock, E. Welsch, H. Blaschke Influence of the standing-wave electric field pattern on the laser damage resistance of HfO2 thin films [4347-53] M. Alvisi, M. Di Giulio, M. Perrone, M. Protopapa, S. Scaglione

Use of hafnia/silica multilayer coatings on large mirrors and polarizers for the National Ignition Facility (Abstract Only) [4347-79]

D. Smith, J. Oliver, J. Howe, C. Stolz, A. Rigatti Functional damage thresholds of hafnia/silica coating designs for the NIF laser [4347-78] J. Taniguchi, N. LeBarron, J. Howe, D. Smith, C. Stolz, C. Weinzapfel, J. Kimmons Aging studies of sol-gel-derived thin film single-layer and multilayer dielectric mirrors [4347-24] H. McInnes, N. Bazin, J. Andrew, A. Morris Temperature effects on the LIDT of single- and multilayer sol-gel-derived thin film coatings [4347-23] N. Bazin, J. Andrew, H. McInnes, A. Morris Moisture barrier coatings to prevent environmental degradation of KDP crystals (Abstract Only) [4347-77] A. Rigatti, D. Smith, G. Mitchell, J. Dirmyer, A. Schmid, S. Papernov Optical thin films grown by surface chemical reaction for high-power lasers [4347-52] S. Zaitsu, S. Motokoshi, T. Jitsuno, M. Nakatsuka, T. Yamanaka Using colloidal gold nanoparticles for studies of laser interaction with defects in thin films [4347-45] S. Papernov, A. Schmid, R. Krishnan, L. Tsybeskov SESSION 2 MINI-SYMPOSIUM ON DEFECTS IN GLASS Laser-induced color centers in silica [4347-3] L. Skuja, H. Hosono, M. Hirano Ablation of amorphous SiO2 using ArF excimer laser [4347-20] K. Awazu Behavior of fused silica irradiated by a low-level 193-nm excimer laser for tens of billions of pulses [4347-41] C. Van Peski, Z. Bor, T. Embree, R. Morton Damage behavior of SiO2 glass induced by 193-nm radiation under a simulated operating mode of lithography laser [4347-30] Y. Ikuta, S. Kikugawa, M. Hirano, H. Hosono Fabrication of nonerasable gratings in SiO2 glasses by a two-beam holographic method using infrared femtosecond laser pulses [4347-26] K. Kawamura, N. Sarukura, M. Hirano, H. Hosono Defect generation in fused silica under high-intensity laser interaction [4347-8] A. Silins Subpicosecond optical damaging of silica: time-resolved measurements of the light-induced damage threshold [4347-22] S. Juodkazis, A. Marcinkevicius, M. Watanabe, V. Mizeikis, S. Matsuo, H. Misawa Optical transparency of SiO2 glass in vacuum ultraviolet region and defect formation by F2 laser [4347-76] H. Hosono, T. Kinoshita, Y. Ikuta, K. Kajihara, M. Hirano SESSION 3 FUNDAMENTAL MECHANISMS Photonic bandgap materials [4347-4] T. Shepherd Two-photon equivalent weighting of spatial excimer laser beam profiles (Abstract Only) [4347-80] E. Eva, H. Bauer, K. Metzger, A. Pfeiffer Modeling of laser-induced breakdown in dielectrics with subpicosecond pulses [4347-16] T. Apostolova, Y. Hahn

Effects of dispersion and aberrations in ocular focusing of femtosecond pulses and the impact on damage mechanisms [4347-54] J. Shaver, G. Buffington, B. Rockwell, R. Thomas, C. Cain, G. Noojin, D. Stolarski Mechanisms to explain damage growth in optical materials [4347-58] S. Demos, M. Kozlowski, M. Staggs, L. Chase, A. Burnham, H. Radousky Use of high-power dye laser beams during long periods induces chemical vapor deposition [4347-43] L. Bruel, P. Delmas Quantitative study of laser damage probabilities in silica and calibrated liquids: comparison with theoretical prediction [4347-28] J. Natoli, L. Gallais, H. Akhouayri, C. Amra Simulations of laser damage of SiO2 induced by a spherical inclusion [4347-32] F. Bonneau, P. Combis, J. Vierne, G. Daval Scaling relations for laser damage initiation craters [4347-60] M. Feit, L. Hrubesh, A. Rubenchik, J. Wong Calculation of relative damage thresholds for total internal reflection surfaces [4347-72] J. Arenberg Extrapolation of the probability of survival of a large-area optic based on a small sample [4347-71] J. Arenberg SESSION 4 MATERIALS AND MEASUREMENTS Optical absorption and ionization of silicate glasses [4347-5] L. Glebov Results of pulse-scaling experiments on rapid-growth DKDP triplers using the Optical Sciences Laser at 351 nm [4347-33] M. Runkel, A. Burnham, D. Milam, W. Sell, M. Feit, A. Rubenchik Low-temperature growth of DKDP for improving laser-induced damage resistance at 350 nm [4347-75] A. Burnham, M. Runkel, R. Hawley-Fedder, M. Carman, R. Torres, P. Whitman Analysis of bulk DKDP damage distribution, obscuration, and pulse-length dependence [4347-59] M. Feit, A. Rubenchik, M. Runkel Effect of thermal annealing and second harmonic generation on bulk damage performance of rapid-growth KDP type-I doublers at 1064 nm [4347-35] M. Runkel, S. Maricle, R. Torres, J. Auerbach, R. Floyd, R. Hawley-Fedder, A. Burnham Laser raster conditioning of KDP and DKDP crystals using XeCl and Nd:YAG lasers [4347-57] M. Staggs, M. Yan, M. Runkel Differences in bulk damage probability distributions between tripler and z-cuts of KDP and DKDP at 355 nm [4347-34] M. Runkel, A. Burnham Correlation between absorption and scattering imaging in optical materials (Abstract Only) [4347-31] M. Commandré, A. Gatto, A. During, C. Fossati Angle-resolved scatter measurements of laser-damaged DKDP crystals using a bidirectional scatter diagnostics [4347-55] R. Fluck, P. Wegner, L. Sheehan, L. Hackel Index-mismatch scattering approach to optical limiting [4347-21] G. Exarhos, K. Ferris, C. Windisch, B. Bozlee, S. Risser, S. van Swam

Development and characterization of advanced F2 laser source for 157-nm lithography (Abstract Only) [4347-48] K. Vogler, F. Voss, E. Bergmann, U. Stamm, S. Govorkov, G. Hua, W. Walecki Reliable materials and instruments for 157-nm lithography [4347-49] K. Vogler, F. Voss, E. Bergmann, U. Stamm, W. Walecki, D. Basting Absolute measurements of nonlinear absorption near LIDT at 193 nm [4347-64] H. Blaschke, D. Ristau, E. Welsch, O. Apel Bulk laser damage in borate crystals for high-power all-solid-state UV lasers (Abstract Only) [4347-69] T. Kamimura, R. Ono, Y. Yap, M. Yoshimura, Y. Mori, T. Sasaki, T. Tsuru, T. Ogawa, H. Yoshida, M. Nakatsuka, K. Yoshida UV-laser coloration and bleaching of unirradiated and gamma-irradiated silica glasses [4347-1] M. Kasymdzhanov, P. Khabibullaev, S. Kurbanov, E. Zakhidov Nature of damage in fused silica induced by high-fluence 3-omega 355-nm laser pulses, a multiscale morphology microstructure, and defect chemistry study (Abstract Only) [4347-12] J. Wong, D. Haupt, J. Kinney, J. Ferriera, I. Hutcheon, S. Demos, M. Kozlowski Growth of laser-initiated damage in fused silica at 351 nm (Abstract Only) [4347-62]

M. Norton, L. Hrubesh, Z. Wu, E. Donohue, M. Feit, M. Kozlowski, D. Milam, K. Neeb, W. Molander, A. Rubenchik, W. Sell, P. Wegner

Waveguides in chalcogenide glasses produced by a train of femtosecond laser pulses [4347-47] O. Efimov, L. Glebov, S. Park, K. Richardson, E. Van Stryland, T. Cardinal, M. Couzi, J. Bruneel Spectral and nonlinear optical properties of fullerene-doped π-conjugated organic systems [4347-11] N. Kamanina, L. Kaporskii Fullerene-doped polymer-dispersed liquid crystals: holographic recording and optical limiting effect [4347-10] N. Kamanina, V. Sizov, D. Staselko Infrared performance of chemical-vapor-deposited diamond [4347-68] C. Pickles, R. Sussmann, M. Nesladek, K. Lewis CW and nanosecond laser irradiation on materials: elements of comparison of thermal effects [4347-29] L. Gallais, J. Natoli, H. Akhouayri, C. Amra Electromagnetic aspects of localized action of high-power laser field on transparent solids [4347-18] V. Gruzdev, M. Libenson SESSION 5 SURFACES AND MIRRORS CPA compression gratings with improved damage performance [4347-46] A. Reichart, N. Blanchot, P. Baures, H. Bercegol, B. Wattellier, J. Zou, C. Sauteret, J. DiJon Laser-induced damage investigation in chirped mirrors for ultrashort-pulse laser systems [4347-65] K. Starke, T. Groß, D. Ristau Achromatic damage investigations on mirrors for UV-free electron lasers [4347-51]

A. Gatto, N. Kaiser, R. Thielsch, D. Garzella, M. Hirsch, D. Nutarelli, G. de Ninno, E. Renault, M. Couprie, P. Torchio, M. Alvisi, G. Albrand, C. Amra, M. Marsi, M. Trovo, R. Walker, M. Grewe, J. Roger, A. Boccara

Photochemical polishing of fused-silica optics by using ArF excimer laser [4347-74] M. Murahara Chemical etch effects on laser-induced surface damage growth in fused silica [4347-61] L. Hrubesh, M. Norton, W. Molander, P. Wegner, M. Staggs, S. Demos, J. Britten, L. Summers, E. Lindsey, M. Kozlowski

Laser-induced damage simulations of silica surface under 1.053-µm irradiation [4347-44] F. Bonneau, P. Combis, G. Daval, J. Gaudry CHARISMA: a new way for angular-resolved scattering measurements [4347-38] O. Apel, C. Goerling, U. Leinhos, K. Mann, B. Schäfer Dynamics of electrons in metallic nanoinclusions interacting with an intense laser beam [4347-50] P. Grua, H. Bercegol Room-temperature mirror preparation using sol-gel chemistry and laminar-flow coating technique [4347-25] P. Belleville, C. Bonnin, É. Lavastre, P. Pegon, Y. Rorato Effect of surface finish on the high-power transmission characteristics of fused-silica optical fibers [4347-7] M. Greenaway, W. Proud, J. Field, S. Goveas, R. Drake

Volume 4679 Laser-Induced Damage in Optical Materials: 2001 Chairs/Editors: Gregory J. Exarhos, Arthur H. Guenther, Keith L. Lewis, M. J. Soileau, Christopher J. Stolz Foreword International Program Committee Symposium Welcome Summary of Meeting SESSION 1 SURFACES AND MIRRORS LIGO optics: initial and advanced [4679-3] J. Camp, G. Billingsley, W. Kells, A. Lazzarini, G. Sanders, S. Whitcomb, A. Alexandrovski, M. Fejer, E. Gustafson, R. Route, S. Rowan, B. Bochner, G. Harry, N. Mavalvala, R. Weiss, J. Hough Initiation identification in fused-silica 35-nm optics [4679-64] M. Wall, J. Plitzko, M. Fluss Methods for mitigating surface damage growth in NIF final optics [4679-63] L. Hrubesh, M. Norton, W. Molander, E. Donohue, S. Maricle, B. Penetrante, R. Brusasco, W. Grundler, J. Butler, J. Carr, R. Hill, L. Summers, M. Feit, A. Rubenchik, M. Key, P. Wegner, A. Burnham, L. Hackel, M. Kozlowski CO2-laser polishing for reductoin of 351-nm surface damage initiation in fused silica [4679-60] R. Brusasco, B. Penetrante, J. Butler, S. Maricle, J. Peterson Localized CO2-laser treatment for mitigation of 351-nm damage growth in fused silica [4679-52] R. Brusasco, B. Penetrante, J. Butler, L. Hrubesh UV-laser conditioning for reduction of 351-nm damage initiation in fused silica [4679-59] R. Brusasco, B. Penetrante, J. Peterson, S. Maricle, J. Menapace Combined advanced finishing and UV-laser conditioning for producing UV-damage-resistant fused-silica optics [4679-65] J. Menapace, B. Penetrante, D. Golini, A. Slomba, P. Miller, T. Parham, M. Nichols, J. Peterson Excimer-laser-induced photochemical polishing of SiC mirror [4679-31] M. Murahara Influence of glass surface layers on laser-induced damage threshold [4679-45] Z. Gu, P. Liang, W. Zhang SESSION 2 FUNDAMENTAL MECHANISMS Initiation, growth, and mitigation of UV-laser-induced damage in fused silica [4679-1] A. Rubenchik, M. Feit Engineered defects for investigation of laser-induced damage of fused silica at 355 nm [4679-57]

A. Hamza, W. Siekhaus, A. Rubenchik, M. Feit, L. Chase, M. Savina, M. Pellin, I. Hutcheon, M. Nostrand, M. Runkel, B. Choi, M. Staggs, M. Fluss

Structural modifications in fused silica due to laser-damage-induced shock compression [4679-58] A. Kubota, M. Caturla, L. Davila, J. Stolken, B. Sadigh, A. Quong, A. Rubenchik, M. Feit

Effect of discreteness of laser action and condensed medium response on the nonlinear and photophysical phenomena [4679-48] M. Libenson, V. Gruzdev Effect of laser-induced antidiffusion on phonon-assisted electron transitions in semiconductor Fokker-Planck equation [4679-35] T. Apostolova, D. Huang, P. Alsing, J. McIver, D. Cardimona Use of order statistics in the determination of laser damage threshold [4679-42] J. Arenberg Calculation of relative damage thresholds for coated or contaminated total internal reflection surfaces [4679-40] J. Arenberg Measurement of relative damage thresholds at total internal reflection surfaces [4679-41] J. Arenberg, D. Mordaunt Soliton-type waves of reflection and conduction in laser-matter interaction: as appeared in collected papers of the Symposium on Laser-Induced Damage in Optical Materials 1969-1998 (review) [4679-46] E. Kudriavtsev Soliton-type waves of reflection and conduction in metals at static loading as a possible tool of precatastrophic damage indications [4679-47] E. Kudriavtsev, K. Abramova, I. Scherbakov Improving 351-nm damage performance of large-aperture fused silica and DKDP optics [4679-53] A. Burnham, L. Hackel, P. Wegner, T. Parham, L. Hrubesh, B. Penetrante, P. Whitman, S. Demos, J. Menapace, M. Runkel, M. Fluss, M. Feit, M. Key, T. Biesiada Simple thermal response model for a p-doped silicon substrate irradiated by 1.06- and 1.32-µm lasers [4679-39] P. Chernek, J. Orson SESSION 3 MINI SYMPOSIUM ON OPTICAL MATERIALS FOR TELECOMMUNICATIONS Designing high-power components for optical telecommunications [4679-5] J. Kulakofsky, W. Lewis, M. Robertson, T. Moore, G. Krishnan UV-laser modification of silica planar waveguide based DWDM devices (Abstract Only) [4679-6] M. Yan, D. Ball, A. Ticknor Design issues for tunable filters for optical telecommunications [4679-9] K. Lewis, G. Smith, I. Mason, K. Rochester Evaluation of materials selection criteria for composite optical limiters [4679-38] K. Ferris, C. Windisch, T. Marmolejo, G. Exarhos SESSION 4 THIN FILMS Laser megajoule 1.06-µm mirror production with very high laser damage threshold [4679-27] B. Pinot, H. Leplan, F. Houbre, E. Lavastre, J. Poncetta, G. Chabassier Technological processing of silica as seen through laser-induced damage tests [4679-22] P. Bouchut, P. Garrec, J. Neauport, P. Gacoin, F. Bonnemason, S. Kaladgew Influence of storage conditions on the LIDT of very high damage resistance mirrors [4679-23] G. Ravel, P. Bouchut, P. Garrec, B. Andre, C. Le Diraison, H. Bercegol

Performance of bare and sol-gel-coated DKDP crystal surfaces exposed to multiple 351-nm laser pulses in vacuum and air [4679-61] P. Whitman, M. Norton, M. Nostrand, W. Molander, A. Nelson, M. Engelhard, D. Gaspar, D. Baer, W. Siekhaus, J. Auerbach, S. Demos, M. Staggs, A. Burnham Aperture scaling of 351-nm high-reflectivity sol-gel-based mirror coatings [4679-34] J. Andrew, N. Bazin, H. McInnes, A. Morris, K. Porter Establishing links between single gold nanoparticles buried inside SiO2 thin film and 351-nm pulsed-laser

damage morphology [4679-51] S. Papernov, A. Schmid, A. Rigatti, J. Howe

Kinetic study of laser damage initiation by creation of an electron plasma from absorbing nano-inclusions [4679-24]

P. Grua, J. Morreeuw, H. Bercegol Fabrication of a thin film exponential transmission lines by superconducting materials for high-speed communication devices [4679-49] E. Rrustemaj, B. Ilazi SESSION 5 MATERIALS AND MEASUREMENTS Design and characterization of all-polymeric interference mirrors and optics (Abstract Only) [4679-2] A. Ouderkirk Study of laser-induced damage in PPLN [4679-36] D. Titterton, J. Terry Intrinsic laser-induced breakdown of silicate glasses [4679-68] L. Glebov Damage testing of partial reflectors for 157-nm laser calorimeters [4679-67] H. Laabs, R. Jones, C. Cromer, M. Dowell, V. Liberman Comparative studies of absorptance behavior and laser-induced fluorescene of alkaline-earth fluorides at 193 and 157 nm [4679-30] C. Goerling, U. Leinhos, K. Mann Investigation of fluorescence microscopy as a tool for noninvasive detection and imaging of damage precursors at 351 nm [4679-56] S. Demos, M. Nostrand, M. Staggs, C. Carr, D. Hahn, M. Kozlowski, L. Sheehan, C. Battersby, A. Burnham Time-resolved spectroscopic investigation of emission observed during damage in the bulk of fused silica and DKDP crystals [4679-55] C. Carr, H. Radousky, M. Staggs, A. Rubenchik, M. Feit, S. Demos Results of raster-scan laser conditioning studies on DKDP triplers using Nd:YAG and excimer lasers [4679-54] M. Runkel, K. Neeb, M. Staggs, J. Auerbach, A. Burnham Performance of thin borosilicate glass sheets at 351 nm [4679-62] P. Whitman, M. Staggs, C. Carr, S. Dixit, W. Sell, D. Milam Method and laser system for creating high-resolution laser-induced damage images [4679-37] I. Troitski SESSION 6 BY TITLE ONLY: PAPERS NOT PRESENTED DUE TO EVENTS OF SEPT. 11, 2001 Development of a photothermal microscope for multiscale studies of defects [4679-12] A. During, C. Fossati, M. Commandré

Time-resolved measurements of reflectivity, plasma formation, and damage of hafnia/silica multilayer mirrors at 1064 nm [4679-26] L. Lamaignère, V. Cavarro, C. Allais, D. Bernardino, M. Josse, H. Bercegol Dynamic absorptance behavior of hybrid multilayers at 193 nm [4679-28] H. Blaschke, M. Jupe, D. Ristau, S. Martin, S. Bock, E. Welsch Optical properties of porous fluoride coating for UV and DUV lasers [4679-32] K. Yoshida, M. Ohya, K. Hatooka, K. Ochi, M. Sunagawa, T. Kamimura Pit formation in GaAs surface induced by picosecond and femtosecond laser pulses [4679-43] A. Singh, A. Kapoor, K. Tripathi, G. Kumar Four-layer polymeric optical waveguides based on styrene acrylonitrile (SAN) [4679-44] G. Qureshi, V. Gupta, A. Singh, A. Kapoor, K. Tripathi

Volume 4932 Laser-Induced Damage in Optical Materials: 2002 and 7th International Workshop on Laser Beam and Optics Characterization Chairs/Editors: Gregory J. Exarhos, Arthur H. Guenther, Norbert Kaiser, Keith L. Lewis, M. J. Soileau, Christopher J. Stolz, Adolf Giesen, Horst Weber Foreword International Program Committee Symposium Welcome Summary of Meeting

SESSION 1 THIN FILMS Degradation of a multilayer dielectric filter as a result of simulated space environmental exposure [4932-458] P. Fuqua, N. Presser, J. Barrie, M. Meshishnek, D. Coleman Calculated and thermally measured laser damage in metallic thin films as a function of pulse duration [4932-433] L. Gallais, C. Amra, J. Natoli Nodular defects in sputtered coatings [4932-436] K. Lewis, G. Smith, A. Pidduck Ion-assisted versus nonion-assisted high-laser-damage resistant coatings on BBO (Abstract Only) [4932-449] J. Herringer, T. Caughey Influence of BK7 substrate solarization on the performance on hafnia and silica multilayer mirrors [4932-413] C. Stolz, J. Menapace, F. Genin, P. Ehrmann, P. Miller, G. Rogowski Photochemical laminating of low-refractive-index transparent antireflective SiO2 film [4932-453] M. Murahara, Y. Ogawa, K. Yoshida, Y. Okamoto Femtosecond damage threshold of multilayer metal films [4932-447] W. Ibrahim, H. Elsayed-Ali, M. Shinn, C. Bonner Damage behavior of SiO2 thin films containing gold nanoparticles lodged at predetermined distances from the film surface [4932-462] S. Papernov, A. Schmid Optical characteristics of THV fluorothermoplastic (Abstract Only) [4932-435] K. Yoshida, T. Nobori, K. Hatooka, K. Ochi, M. Sunagawa, T. Kamimura, Y. Okamoto Investigation of high-power laser beam-, plasma-, debris-, and shrapnel-induced damage of optical coatings on the HELEN laser facility [4932-418] J. Watson, J. Andrew, N. Bazin SESSION 2 SURFACES AND MIRRORS Operation of the Jefferson Lab FEL: optics lessons learned (Abstract Only) [4932-448] M. Shinn

Mechanisms of CO2 laser mitigation of laser damage growth in fused silica [4932-410] M. Feit, A. Rubenchik Wet etching for the mitigation of laser damage growth in fused silica [4932-431] P. Bouchut, P. Garrec, C. Pelle Comparison of antireflective coated and uncoated surfaces figured by pitch-polishing and magnetorheological processes [4932-463] R. Chow, M. Thomas, R. Bickel, J. Taylor Large-spot COIL irradiation of Ge samples [4932-414] W. Riede, K. Gruenewald

Dependence of surface damage resistance on bulk quality in CsLiB6O10 (CLBO) crystal (Abstract Only) [4932-430]

T. Kamimura, S. Fukumoto, M. Nishioka, M. Yoshimura, Y. Mori, T. Sasaki, K. Yoshida Parametric study of the growth of damage sites on the rear surface of fused silica windows [4932-423] G. Raze, J. Morchain, M. Loiseau, L. Lamaignere, M. Josse, H. Bercegol Overview of raster scanning for ICF-class laser optics [4932-411] M. Runkel, M. Nostrand Influence of 527-nm laser light on debris- and shrapnel-contaminated optical surfaces [4932-416] J. Andrew, K. Mann, M. Tobin, J. Watson Environmental effects on optical component ageing [4932-415] L. Bruel Long-term performances of very high-laser-damage resistant mirrors [4932-434] G. Ravel, P. Bouchut, P. Garrec, B. André, C. Le Diraison, M. Veillerot Methods for mitigating growth of laser-initiated surface damage on DKDP optics at 351 nm [4932-407] L. Hrubesh, R. Brusasco, W. Grundler, M. Norton, E. Donohue, W. Molander, S. Thompson, S. Strodtbeck, P. Whitman, M. Shirk, P. Wegner, M. Nostrand, A. Burnham Identification and elimination of fluorescent surface-damage precursors on DKDP optics [4932-406] M. Nostrand, S. Thompson, W. Siekhaus, M. Fluss, D. Hahn, P. Whitman, A. Burnham SESSION 5 FUNDAMENTAL MECHANISMS Femtosecond pulse damage and predamage behavior of dielectric thin films [4932-538] M. Mero, J. Liu, A. Sabbah, J. Jasapara, K. Starke, D. Ristau, J. McIver, W. Rudolph Calculation of electric field intensity at dielectric interfaces (Abstract Only) [4932-403] J. Arenberg Accuracy and repeatability of laser damage threshold measurements made via order statistics [4932-404] J. Arenberg Toward an absolute measurement of LIDT [4932-441] J. Natoli, L. Gallais, B. Bertussi, M. Commandre, C. Amra Analysis of raster scanning damage and conditioning experiments [4932-409] M. Feit, A. Rubenchik Numerical simulations of laser/defect-induced absorption in SiO2 [4932-439] F. Bonneau, P. Combis, A. Pujols, J. Rullier, M. Seques, J. Vierne Trapping of electrical charges and laser damage [4932-405] J. Bigarré, P. Hourquebie, L. Doucet Electromagnetic phenomena generated in laser-produced plasmas (Abstract Only) [4932-442] A. Scott, D. Jones, D. Benton, S. Clark

Luminescence of UV thin films [4932-432] J. Heber, C. Mühlig, W. Triebel, N. Danz, R. Thielsch, N. Kaiser Self-focusing and rear surface damage in a fused silica window at 1064 nm and 355 nm [4932-420] H. Bercegol, L. Lamaignère, B. Le Garrec, M. Loiseau, P. Volto Modified Z-scan method for determination of nonlinear refraction of optical materials through the measurement of power-weighted time-averaged beam propagation factor [4932-427] A. Dement'ev, A. Jovaisa, R. Navakas Comparison of numerical simulations with experiment on generation of craters in silica by a laser [4932-437] H. Bercegol, F. Bonneau, P. Bouchut, P. Combis, L. Gallais, L. Lamaignere, J. Natoli, J. Rullier, J. Vierne Identification of point defects responsible for laser-induced ultraviolet absorption in LiB3O5 (LBO) crystals [4932-444] W. Hong, N. Garces, M. Chirila, L. Halliburton Optical limiting based on liquid-liquid immiscibility [4932-455] G. Exarhos, K. Ferris, W. Samuels, R. Owings Using a TOF mass spectrometer for studies of laser interaction with 3-nm diameter gold nanoparticles embedded in silica [4932-438]

H. Bercegol, F. Bonneau, P. Combis, L. Gallais, L. Lamaignere, M. Loiseau, J. Natoli, M. Pellin, M. Perra, J. Rullier, M. Savina

Self-guiding, supercontinuum generation and damage in bulk materials induced by femtosecond pulses [4932-443] V. Sirutkaitis, E. Gaizauskas, V. Kudriashov, M. Barkauskas, V. Vaicaitis, R. Grigonis, A. Piskarskas Ultrashort pulse damage of Si and Ge semiconductors [4932-428] P. Allenspacher, B. Huettner, W. Riede Synchrotron-radiation-induced damages in optical materials [4932-429] A. Gatto, N. Kaiser, S. Guenster, D. Ristau, F. Sarto, M. Trovo, M. Danailov Photothermal microscopy for in-situ study of laser damage induced by gold inclusions [4932-450] A. During, M. Commandré, C. Fossati, J. Natoli, J. Rullier, H. Bercegol, P. Bouchut Experimental study of wavelength-dependent damage threshold in DKDP [4932-445] C. Carr, H. Radousky, S. Demos Bulk damage and laser conditioning of KDP and DKDP crystals with Xe-F excimer light and the 3w of a Nd:Yag laser (Abstract Only) [4932-421] L. Lamaignere, M. Loiseau, H. Piombini, D. Plessis, H. Bercegol SESSION 6 MATERIALS AND MEASUREMENTS Application of spectroscopic ellipsometry to characterization of optical thin films [4932-459] J. Woollam, C. Bungay, L. Yan, D. Thompson, J. Hilfiker Effects of pulse duration on bulk laser damage in 350-nm raster-scanned DKDP [4932-412] M. Runkel, J. Bruere, W. Sell, T. Weiland, D. Milam, D. Hahn, M. Nostrand Growth of damage sites due to platinum inclusions in Nd-doped laser glass irradiated by the beam of a large-scale Nd:glass laser [4932-422] G. Raze, M. Loiseau, D. Taroux, M. Josse, H. Bercegol Experimental results of laser interaction with included gold particles in silica at 1w and 3w (Abstract Only) [4932-440] J. Natoli, L. Gallais, M. Perra, F. Bonneau, P. Combis, J. Rullier, P. Bouchut, L. Lamaignere

Radiation resistance of optical materials against synchrotron radiation [4932-454] S. Günster, H. Blaschke, D. Ristau, A. Gatto, J. Heber, N. Kaiser, B. Diviacco, M. Marsi, M. Trovo, F. Sarto, S. Scaglione, E. Masetti Evolution of bulk damage initiation in DKDP crystals [4932-446] C. Carr, T. McMillian, M. Staggs, H. Radousky, S. Demos Interferometric assessment of laser-induced damage to semiconductors [4932-457] J. Blackshire, A. Zakel, S. Guha SESSION 9 MINI-SYMPOSIUM ON OPTICS CHARACTERIZATION Characterizing CaF2 for VUV optical components: roughness, surface scatter, and bulk scatter [4932-527] A. Hultåker, N. Benkert, S. Gliech, A. Duparre System for angle-resolved and total light scattering, transmittance, and reflectance measurements of optical components at 157 nm and 193 nm [4932-529] S. Gliech, H. Geßner, A. Duparré Calcium fluoride for ArF laser lithography: characterization by in-situ transmission and LIF measurements [4932-537] C. Muehlig, W. Triebel, G. Töpfer, A. Jordanov Absorptance measurements for the DUV spectral range by laser calorimetry [4932-523] H. Blaschke, M. Jupe, D. Ristau Repetition rate dependence of two-photon absorption and self-trapped exciton luminescence in CaF2 at 193 nm [4932-515] C. Görling, U. Leinhos, K. Mann Standard measurement procedures for the characterization of fs-laser optical components [4932-522] K. Starke, D. Ristau, H. Welling Characterization of particulate contamination of optics [4932-506] J. Arenberg A coherent spectrophotometer for optical coating characterization [4932-517] O. Balachninaite, R. Eckardt, R. Grigonis, M. Peckus, V. Sirutkaitis S-on-1-induced damage thresholds of high-reflection metallic coatings at 1064 nm [4932-518] V. Bingelyte, V. Sirutkaitis, R. Eckardt Results of a round-robin experiment on reflectivity measurments at a wavelength of 1.06 µm [4932-508]

D. Nickel, C. Fleig, A. Erhard, A. Letsch, A. Giesen, M. Jupe, K. Starke, D. Ristau, O. Wilhelm, R. Huber, R. Haspel, U. Schuhmann, C. Scharfenorth, H. Eichler, S. Gliech, A. Duparré, M. Schulz-Grosser, A. Krasilnikova, A. Haise, W.

Riede, O. Balachninaite, R. Grigonis, V. Sirutkaitis, V. Kazakevich High-precision reflectivity measurements: improvements in the calibration procedure [4932-521] M. Jupé, F. Großmann, K. Starke, D. Ristau DUV/VUV spectrophotometry for high-precision spectral characterization [4932-524] H. Blaschke, J. Kohlhaas, P. Kadkhoda, D. Ristau Spectrophotometry in the vacuum UV [4932-534] J. Heber, A. Gatto, N. Kaiser

SESSION 10 7TH INTERNATIONAL WORKSHOP ON LASER BEAM AND OPTICS CHARACTERIZATION

On-line control of laser beam quality by means of diffractive optical components [4932-539] M. Duparré, C. Rockstuhl, A. Letsch, S. Schroeter, V. Pavelyev

Measurement of the Wigner distribution of a helium neon laser with a spherical aberration and a tapered semiconductor laser using moving slit technology [4932-514] B. Neubert, W. Scharfe, G. Huber Estimation of beam parameters and coherence properties of laser radiation by use of an extended Hartmann-Shack wavefront sensor [4932-511] B. Schäfer, K. Mann Characterization of the near-field profile of semiconductor lasers and the spot size of tightly focused laser beams from far-field measurements [4932-528] J. Guttman, J. Fleischer Numerical phase retrieval from beam intensity measurements in three planes [4932-516] L. Bruel Single-shot laser beam profiling using multilevel imaging (Abstract Only) [4932-532] A. Scott, S. Woods, P. Harrison Calibration of laser power meters for high-power applications [4932-456] V. Brandl, K. Hänsel, M. Klos, R. Kramer, H. Schwede Characterization device for diode-laser-stack beam propagation [4932-526] M. Roehner, H. Muentz, O. Schroeder, K. Boucke, R. Poprawe Practical absolute wavelength meter using iodine-stabilized diode laser [4932-533] Y. Akimoto, L. Yong-Chol, S. Hatano, S. Niki, A. Irisawa Intrinsic and geometrical beam classification, and the beam identification after measurement [4932-519] G. Nemes General classification of partially polarized partially coherent beams [4932-513] R. Martínez-Herrero, G. Piquero, P. Mejias Laser radiometry for UV lasers at 193 nm [4932-507] S. Kück, K. Liegmann, K. Möstl, F. Brandt, J. Metzdorf Laser beam and optics characterization with Z-scan method [4932-509] N. Tabiryan, V. Jonnalagadda, M. Mora, S. Nersisyan Characterization of capabilities of Z-scan technique for measuring of divergence and astigmatism of laser beams (Abstract Only) [4932-510] S. Nersisyan, M. Mora, N. Tabiryan Phase space analyzer with Gaussian slits [4932-520] J. Serna, G. Nemes Laser beam characterization in uniaxial crystals [4932-505] G. Cincotti, A. Ciattoni, D. Provenziani, C. Palma, H. Weber

Volume 5273 Laser-Induced Damage in Optical Materials: 2003 Chairs/Editors: Gregory J. Exarhos, Arthur H. Guenther, Norbert Kaiser, Keith L. Lewis, M. J. Soileau, Christopher J. Stolz Foreword International Program Committee In Memoriam: Mikhail N. Libenson Symposium Welcome Summary of Meeting

SESSION 1 THIN FILMS Multilayer dielectric gratings for petawatt-class laser systems [5273-64] J. Britten, W. Molander, A. Komashko, C. Barty Femtosecond pulse damage behavior of oxide dielectric thin films [5273-98] M. Mero, J. Liu, J. Zeller, W. Rudolph, K. Starke, D. Ristau Multiple ultrashort-pulse damage of AR-coated beta-barium borate [5273-82] P. Allenspacher, R. Bähnisch, W. Riede Single-shot and multishot laser-induced damage of HfO2/SiO2 multilayer at YAG third harmonic [5273-30] Y. Zhao, Z. Tang, J. Shao, Z. Fan Design/deposition process tradeoffs for high performance optical coatings in the DUV spectral region [5273-66] J. Rudisill Electric-field enhancement by nodular defects in multilayer coatings irradiated at normal and 45° incidence [5273-42] C. Stolz, F. Génin, T. Pistor Diagnostic methods for CW laser damage testing [5273-101] A. Stewart, R. Shah SESSION 2 FUNDAMENTAL MECHANISMS Single- and multiple-pulse laser-induced breakdown in transparent dielectrics in the femto-nanosecond region [5273-146] O. Efimov, S. Juodkazis, H. Misawa Implications of nanoabsorber initiators for damage probability curves, pulselength scaling, and laser conditioning [5273-52] M. Feit, A. Rubenchik Interpretation of the result of a laser damage measurement [5273-27] J. Arenberg Coalescence of phenomenological laser damage, materials properties, and laser intensity: moving toward quantitative relationships [5273-4] J. Canham

Laser-induced damage growth with small and large beams: comparison between laboratory experiments and large-scale laser data [5273-112] R. Courchinoux, G. Razé, C. Sudre, M. Josse, A. Boscheron, C. Lepage, E. Mazataud, E. Bordenave, L. Lamaignère, M. Loiseau, T. Donval, H. Bercegol Calculation of the electric field magnitude at total internal reflection surfaces [5273-28] J. Arenberg Two-photon-induced excited-state absorption in high-index fibers [5273-157] W. Shensky, I. Cohanoschi, A. Sevian, D. Hagan, E. Van Stryland Comparative study of evolution of laser damage in HgCdTe, CdTe, and CdZnTe with nanosecond 1.06-µm wavelength multiple pulses [5273-75] A. Garg, A. Kapoor, K. Tripathi, S. Bansal Stimulated Brillouin scattering and front surface damage [5273-72] J. Sajer Self-focusing and surface damage in fused-silica windows of variable thickness with UV nanosecond pulses [5273-110] H. Bercegol, A. Boscheron, C. Lepage, E. Mazataud, T. Donval, L. Lamaignère, M. Loiseau, G. Razé, C. Sudre Development of a process model for CO2 laser mitigation of damage growth in fused silica [5273-54] M. Feit, A. Rubenchik, C. Boley, M. Rotter Mechanisms of radiation-induced defect generation in fused silica [5273-25] U. Natura, O. Sohr, R. Martin, M. Kahlke, G. Fasold Homogeneous layer model for scattering from nonabsorbing multilayer surfaces [5273-37] U. Singh, A. Singh, A. Kapoor Interaction of an intense laser field with a dielectric containing metallic nanoparticles [5273-106] F. Quéré, P. Grua, H. Bercegol, P. Martin, J. Morreeuw, J. Rullier, E. Cottancin, M. Pellarin Effects of nonlinear absorption in BK7 and color glasses at 355 nm [5273-55] J. Adams, T. McCarville, J. Bruere, J. McElroy, J. Peterson Ways of creating color laser-induced images [5273-16] I. Troitski SESSION 6 SURFACES AND MIRRORS How to clean surfaces [5273-144] J. Bennett Cleaning to the monolayer level [5273-5] J. Canham ArF-laser-induced photo chemical super mirror-finishing of Si wafer (Abstract Only) [5273-113] M. Murahara Magnetorheological finishing for imprinting continuous-phase plate structures onto optical surfaces [5273-132] J. Menapace, S. Dixit, F. Génin, W. Brocious Study of surface contamination layer in silica thanks to laser damage investigation [5273-83] B. Bertussi, J. Natoli, M. Commandré, C. Amra Growth of laser-initiated damage in fused silica at 527 nm [5273-137] M. Norton, E. Donohue, W. Hollingsworth, J. McElroy, R. Hackel

Enhancement of surface-damage resistance by removing subsurface damage in fused silica [5273-120] T. Kamimura, S. Akamatsu, M. Yamamoto, I. Yamato, H. Shiba, S. Motokoshi, T. Sakamoto, T. Jitsuno, T. Okamoto, K.Yoshida

Localized silica re-fusion for laser damage mitigation [5273-26] P. Bouchut, L. Delrive, D. Decruppe, P. Garrec Subsurface defects in silica detected by using cathodoluminescence and trapping of electrical charges measurements (Best Poster Presentation) [5273-93] J. Bigarré Influence of subsurface cracks on laser-induced surface damage [5273-53] M. Feit, A. Rubenchik Surface damage growth mitigation on KDP/DKDP optics using single-crystal diamond micromachining [5273-51] L. Hrubesh, J. Adams, M. Feit, W. Sell, J. Stanley, E. Miller, S. Thompson, P. Whitman, R. Hackel Surface investigation of VUV-optical components after exposure to high-energy synchrotron radiation [5273-128] S. Günster, H. Blaschke, K. Starke, D. Ristau, M. Danailov, B. Diviacco, A. Gatto, N. Kaiser, F. Sarto, E. Massetti Enhanced performance of large 3ω optics using UV and IR lasers [5273-49] R. Prasad, J. Bruere, J. Peterson, J. Halpin, M. Borden, R. Hackel Design of a production process to enhance optical performance of 3 ω optics [5273-50] R. Prasad, J. Bruere, J. Halpin, P. Lucero, S. Mills, M. Bernacil, R. Hackel Multiple-pulse laser-induced damage in mercury cadmium telluride and cadmium telluride with a 1.06-um laser in picosecond regime [5273-74] A. Garg, A. Kapoor, K. Tripathi, S. Bansal SESSION 9 MATERIALS AND MEASUREMENTS Cylindrical photonic bandgap fibers for high-power laser transmission (Abstract Only) [5273-145] S. Hart, Y. Fink The impact of laser damage on the lifetime of optical components in fusion lasers [5273-111] H. Bercegol, P. Bouchut, L. Lamaignère, B. Le Garrec, G. Razé A large-aperture high-energy laser system for optics and optical component testing [5273-136] M. Nostrand, T. Weiland, R. Luthi, J. Vickers, W. Sell, J. Stanley, J. Honig, J. Auerbach, R. Hackel, P. Wegner Study and experimental setting of the Z-scan method for accurate nonlinear refractive index and absorption metrology [5273-114] F. Billard, T. Olivier, H. Akhouayri Z-scan theoretical and experimental studies for accurate measurements of the nonlinear refractive index and absorption of optical glasses near damage threshold [5273-115] T. Olivier, F. Billard, H. Akhouayri Size and complex index of nanocenters: optical measurements [5273-85] L. Gallais, P. Voarino, J. Natoli, M. Commandré, C. Amra Photothermal microscopy for in-situ study of laser interaction with 100 nm diameter gold nanoparticles embedded in silica thin films [5273-116] B. Bertussi, M. Commandré, J. Natoli, F. Bonneau, P. Combis, J. Rullier Photothermal microscopy for the study of laser damage initiation by measurement of absorption modification of silica seeded with gold nanoparticles [5273-117] A. During, B. Bertussi, M. Commandré, J. Natoli, F. Bonneau, P. Combis, J. Rullier, E. Cottancin, M. Pellarin

Photothermal multi-pixel imaging microscope [5273-47] C. Stolz, D. Chinn, R. Huber, C. Weinzapfel, Z. Wu Laser calorimetry as a tool for the optimisation of mid-infrared OPO materials [5273-40] D. Orchard, P. Mason, E. McBrearty, K. Lewis Results of a round-robin experiment in multiple-pulse LIDT measurement with ultrashort pulses [5273-124] K. Starke, D. Ristau, S. Martin, A. Hertwig, J. Krüger, P. Allenspacher, W. Riede, S. Meister, C. Theiss, A. Sabbah, W. Rudolph, V. Raab, R. Grigonis, T. Rakickas, V. Sirutkaitis Interaction of photo-thermo-refractive glass with nanosecond pulses at 532 nm [5273-159] L. Glebov, V. Smirnov Heterogeneous mixtures as NLO Christiansen filters for optical limiting [5273-86] G. Exarhos, K. Ferris, W. Samuels Innovative laser-hardened solid host material for nonlinear filters [5273-92] D. Pacheco, W. Russell, H. Aldag, B. DeCristofano, M. Nakashima, B. Kimball Laser-induced bulk damage of impurity-doped silica glasses (Abstract Only) [5273-118] K. Yoshida, Y. Tsuboi, S. Yamagishi, K. Ochi, S. Kuzuu, T. Kamimura, A. Fujinoki, T. Okamoto Novel approach to realizing quasi-phase-matched gallium arsenide optical parametric oscillators for use in mid-IR laser systems [5273-38] P. Mason, E. McBrearty, D. Orchard, M. Harris, K. Lewis Chalcogenide glass films for the bonding of GaAs optical parametric oscillator elements [5273-39] E. McBrearty, K. Lewis, D. Orchard, P. Mason, C. Miller, S. Savage, D. Furniss, A. Seddon Reflectance measurement of the CdZnTe surfaces below and above the damage threshold value [5273-35] S. Sharma, A. Singh, A. Kapoor Investigation of bulk laser damage and absorption of laser light in CsLiB6O10 crystals (Abstract Only) [5273-103] T. Kamimura, M. Yamamoto, S. Akamatsu, M. Nishioka, M. Yoshimura, Y. Mori, T. Sasaki, K. Yoshida Spectral signatures and optic coefficients of surface and reservoir rocks at COIL, CO2, and Nd:YAG laser wavelengths [5273-97] R. Graves, E. Bailo

Physiochemical properties of porous media (rocks) after being drilled using high-power lasers: analytical techniques [5273-99]

E. Bailo, R. Graves, K. Loop SESSION 10 MINI-SYMPOSIUM ON UNDERSTANDING OPTICAL DAMAGE WITH ULTRASHORT LASER PULSES Micromachining of bulk transparent materials using nanojoule femtosecond laser pulses (Abstract Only) [5273-127] C. Schaffer, T. Kim, J. Garcia, E. Mazur, A. Groisman, D. Kleinfeld Ablation and optical property modification of transparent materials with femtosecond lasers [5273-148] M. Richardson, A. Zoubir, L. Shah, C. Rivero, C. Lopez, K. Richardson, N. H, R. Vallée Change of electronic properties due to ultrashort laser pulses [5273-67] B. Hüttner Burst-mode femtomachining of copper and Lexan (Abstract Only) [5273-140] C. Siders, M. Richardson Ultrashort pulse damage of semiconductors [5273-68] B. Hüttner

Investigations in the nonlinear behavior of dielectrics by using ultrashort pulses (Best Oral Presentation) [5273-123]

K. Starke, D. Ristau, H. Welling, T. Amotchkina, M. Trubetskov, A. Tikhonravov, A. Chirkin Femtosecond dynamics of highly excited dielectric thin films [5273-87] J. Zeller, A. Sabbah, M. Mero, P. Alsing, J. McIver, W. Rudolph