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Using low power COTS DSP Assessment of Analog Devices...
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Using low power COTS DSPAssessment of Analog Devices BlackFin
Emile REMETEANCNES
ADCSSESA/ESTEC
Noordwijk, The NetherlandsOctober 3-5, 2007
2E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Higher Computing Performance
Technical solutions
Radiation-hardened DSPThe most comfortable / easy to use solutionNot available at present time
IP cores in hardened FPGAFull DSP coreHybrid solutions: CPU + DSP operators (FFT, convolution core)
COTS DSPHighest computing performanceLowest power dissipationSensitive to radiations effects
Key factor allowing a major scale change in scientific space research Feasibility factor for some space missions
3E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
DSP use in Space Missions
Typical DSP applications FFT (IASI) Filtering (Microscope)
General signal processing Image compression (Rosetta, Picard) Signal detection & characterization by neural network (Demeter)
Other applications General processing (telecom sat) P/L Management (Microscope, Picard)
Versatile product required
4E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Analog Devices BlackFin BF532
16b fixed point DSP core: 400 MHz / 400 MIPS / 800 MMACS
Low power (< 1W)
Integrated peripherals
176 ld LQFP
Assembly language similar to 21020’s
5E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Benchmarks
Speed (optimised code in assembly language) and precision tests
Targets: BlackFin, TSC21020 (Mosaïc 020), ADSP-2106x
Benchs:FFT 1024 pts Radix 2 Radix 4
1D & 2D 9/7 Daubechies wavelets transform (JPEG2000)• Convolution• Lifting Scheme
Direct and reverse transforms
6E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Main results
Speed (TSC21020 (1WS PM & DM) = 1, same clock frequency)
1.415.942D WT Conv
0.361.612D WT Lifting
0.564.141D WT Lifting
0.363.41FFT Rdx4
0.392.98FFT Rdx2
Code & Data in external memoryCode & Data in internal memory
Precision (rms noise) TSC21020: good (floating point) BlackFin: average (fixed point) -> reconstruction noise / image artifacts
For high-precision demanding applications, block floating point scaling or emulated floating point libraries could be used (slower!)
7E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Board architecture (Steel Electronique)
FLASHSUP.
FLASHDUT
JTAG_1JTAG_2
BF532-400MHz
DUT
SRAM1Mbyte
#1
#2#3
EBUI 16Bits/A0-19
SDRAMSup.
128Mbytes
SDRAMDUT
128Mbytes
SDRAM InterfaceSDRAM Interface
3x Banks 1Mbyte
EBUI 16Bits/A0-19
UART_DSP
UART PCRS422
SPORT1
SPORT0
SPI
11 x LEDs:PF5-15
GPIO
4x LEDs:PF11-15
3x LEDs:TMR0,1,2
LED:TMR0
/reset
Mclk_DUT
RESETADM708
MCLK20MHz
RESETADM708
NMI_DUT VDDext_DUT3v3
VDDext_Sup3v3 BF532-400MHz
SUPERVISEUR
BootMode
RTC32k768
TILU
TrigLU
8E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Benchs for heavy ion irradiation (Coframi)
DSP Core Registers Arithmetical & Logical instructions Shift instructions
Memory Internal External SRAM Controler External SDRAM Controler
Communication links SPORT SPI UART
OtherTimerGPIO
9E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
At the UCL Heavy Ion Facility
10E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Main results : Latch-up (1/2)
The BlackFin has a good latch-up immunityNo latch-up has been observed even with 132Xe26+ (55.9 Mev/mg/cm2) and the board tilted
Some technologies used to improve the performances are also favorable for latch-up immunity
CNES asked Analog Devices for technological information that could explain the good LU results.
As the response « BlackFin is processed with a 130nm LV process », was not helpful, we decided to do our own technological studies of the silicon to find answers to our questions
11E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Main results: Latch-up (2/2)
90nm process => Reduced charge collection volume(Reduced probability to trigger the parasitic thyristor)
Burried doping gradient may act as a barrier for the charge flow generated by the heavy ions in the bulk substrate
Shallow Trench Insulators ?(Analysis in progress)
Low core voltage (1.2V) is a favorable factor
Hypotheses
12E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Single Events Effects
For high-LET heavy ions many SEFI have been observed
It was not possible to perform SEU tests for ions with low LET (failure of the heavy ion facility)
SEFI signature
13E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
Further activities
SEU tests with all available ions
SEFI (PLL? DMA controller? Power controller?)
TID tests
Using the cache (challenging!)
14E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
CNES DT2 Fault-Tolerant Architecture
BlkFn
Cesam
Mem#1
Syclopes
#2
Error
EDAC
BlkFn
Cesam
Mem
EDAC
The low power dissipation of the BlackFin makes it possible to imagine a DT2 architecture for scientific missions that require both high computing AND fail-operational performances
15E. REMETEAN – Using low power COTS DSP: Assessment of Analog Devices BlackFin ADCSS, 04/10/2007 CNES
For further information please contact
Gilles MOURY ([email protected])Head of the On-board Data Handling section
Emile REMETEAN ([email protected])BlackFin study
Florent MANNI ([email protected])DSP activities including further activities on BlackFin
Michel PIGNOL ([email protected])DMT / DT2 Fault-tolerant supercomputers