Thin Film Fabrication and Morphology Studies
Transcript of Thin Film Fabrication and Morphology Studies
Thin Film Fabrication and Morphology Studies
Kate Dickinson
Mentor: Mike Brady
PI: Dr. Michael Chabinyc
Introduction
• Organic photovoltaics (OPVs) aim to provide simple and efficient sources of clean energy
• OPVs have a maximum efficiency of ~5%
• Multiple methods of thin film fabrication
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Introduction
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World Record: 8.3% Efficiency (Roll-to-Roll Printing Method)
Introduction
ITO Substrate
PEDOT:PSS
P3HT:PCBM Active Layer
Aluminum Electrode
P3HT:PCBM Photovoltaic
Courtesy of A. Muñoz
Fabrica'on techniques determine morphology and cell efficiency
ITO Electrode
Aluminum Electrode
1) Light Absorption
2) Exciton Diffusion
3) Charge Separation
4) Charge Transport
5) Clean Energy
Introduction OPVs use a electron-hole (exciton) system to transport charge
Courtesy of A. Ostrowski and B. Walker
Materials • P3HT: Electron Donor
Poly(3-hexylthiophene) p-type semiconductor
• PCBM: Electron Acceptor [6,6]-phenyl C61 butyric acid methyl ester n-type semiconductor
General Research Focus
• How can OPV technology be improved?
• How can fabrication techniques be improved without losing efficiency?
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• Parameter Relationships: How are blade coating parameters related?
• Film Morphology: How does morphology change for different blade coating parameters?
• Crystallinity: How can P3HT:PCBM crystallinity be controlled and enhance charge mobility?
RET I Focus
Spin Coating: Spreads film across substrate while controlling rpm and time
Thin Film Fabrication Methods
Deposition Drying Film
Substrate
Spin
Courtesy of A. Muñoz
Blade Coating: Spreads film across substrate while controlling temperature, speed and blade height
Thin Film Fabrication Methods
Blade
Heat Plate, T(°C)
BASE
Substrate Solution
θ Velocity
Heat Plate, T(°C)
BASE
V
Heat Plate, T(°C)
BASE
Film
Courtesy of A. Muñoz
Thin Film Fabrication Methods
P3HT:PCBM Photovoltaics
Spin Coated OPV Blade Coated OPV
Spin Coated Blade Coated
Parameters • Time • RPM
• Blade speed and height • Substrate temperature
Efficiency • 2% (as-cast) • 5% (annealed)
• 3-4%
Pros • Higher efficiency • Extremely simple
• Greater parameter control • Industrially more practical • Less wasted materials
Cons • Industrially impractical • Limited parameter control • Wasteful
• Too many parameters • Lower efficiency
Thin Film Fabrication Methods
PS:tol Study
0
200
400
600
800
1000
30 25 20 15 10 5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
50°C 60°C 70°C
0
100
200
300
400
500
600
15 10 5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
10 mg/mL 20 mg/mL 30 mg/mL
Thickness Measurements 20 mg/mL PS:tol
Thickness Measurements 10-30 mg/mL PS:tol
5 mg/mL P3HT:tol Study
P3HT:tol at 5 mm/s
P3HT:tol at 10 mm/s
0
50
100
150
15 10 5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
60°C 70°C
Thickness Measurements AFM Roughness Measurements
30 mg/mL P3HT:CB Study
0
200
400
600
800
1000
1200
1400
15 10 5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
80°C
Thickness Measurements AFM Roughness Measurements
P3HT:CB at 5 mm/s Annealed at 150°C for 20 min
P3HT:CB at 15 mm/s Annealed at 150°C for 20 min
5
2.5
-‐2.5
5
0
90 mg/mL P3HT:CB Study Thickness Measurements AFM Phase Comparison
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25 20 15 10 2.5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
80°C
P3HT:CB at 25 mm/s
P3HT:CB at 25 mm/s
Melted at 250°C and cooled
30 mg/mL P3HT:PCBM Study
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200
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25 20 15 10 5
Film
Thickne
ss (n
m)
Blade Speed (mm/s)
80°C
Thickness Measurements
P3HT:PCBM at 5 mm/s
P3HT:PCBM at 5 mm/s
Melted at 250°C and quenched
AFM Phase Comparison
Conclusion • Parameter Relationships: Film thickness is directly
proportional to substrate temperature, blade speed and solution concentration increase
• Film Morphology: Concentration dependent; slower blade speeds decrease roughness; annealing continues to decreases film roughness
• Crystallinity: Blade coating forms clustered P3HT pockets; melting and rapid quenching produces longer, more evenly distributed fibrils throughout P3HT:PCBM bilayer
Next Steps
Acknowledgments Mike Brady
Justin Cochran
Chris Shuttle
Dr. Michael Chabinyc Dr. Alan Heeger
Dr. Frank Kinnaman
UCSB Materials Research Lab
California NanoSystems Institute
National Science Foundation