The Royal Society of ChemistrySRT-Ru40-Gr910 Electronic Supplementary Information (ESI)...

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1 Normalized Absorption Ru-foil 22050 22100 22150 22200 22250 0 1 Energy (eV) S650-Ru40-Gr910 SRT-Ru40-Gr910 Electronic Supplementary Information (ESI) Nanocrystalline Cubic Ruthenium Carbide Formation in the Synthesis of Graphene on Ruthenium Ultrathin Films Félix Jiménez-Villacorta 1 , Leo Álvarez-Fraga 1 , Javier Bartolomé 1 , Esteban Climent- Pascual 1,2 , Eduardo Salas-Colera 1,3 , Montse Aguilar-Pujol 1 , Rafael Ramírez-Jiménez 4 , Ana Cremades 5 , Carlos Prieto 1 and Alicia de Andrés 1* Figure S1. Left panel: Ru XANES spectra of 40 nm thick Ru films grown on sapphire at RT and 650 ºC with graphene synthetized at T CVD = 910 ºC. Ru-foil spectrum is given also for comparison. Right panels: Ru K-edge EXAFS fits of representative samples with graphene. Black dots: FT module experiment; green line: FT imaginary part experiment; red line: FT module simulation; blue line: FT imaginary part simulation. spectrum is given also for comparison. -6 -4 -2 0 2 4 6 FSRT-Ru5-Gr910 -2 0 2 FSRT-Ru5-Gr1000 FT Magnitude (Å -3 ) -2 0 2 FS650-Ru5-Gr1000 0 1 2 3 4 -2 0 2 Distance (Å) S650-Ru5-Gr1000 Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C. This journal is © The Royal Society of Chemistry 2017

Transcript of The Royal Society of ChemistrySRT-Ru40-Gr910 Electronic Supplementary Information (ESI)...

  • 1

    No

    rma

    lize

    d A

    bso

    rptio

    n

    Ru-foil

    22050 22100 22150 22200 22250

    0

    1

    Energy (eV)

    S650-Ru40-Gr910

    SRT-Ru40-Gr910

    Electronic Supplementary Information (ESI)

    Nanocrystalline Cubic Ruthenium Carbide Formation in

    the Synthesis of Graphene on Ruthenium Ultrathin Films

    Félix Jiménez-Villacorta1, Leo Álvarez-Fraga

    1, Javier Bartolomé

    1, Esteban Climent-

    Pascual1,2

    , Eduardo Salas-Colera

    1,3, Montse Aguilar-Pujol

    1, Rafael Ramírez-Jiménez

    4,

    Ana Cremades5, Carlos Prieto

    1 and Alicia de Andrés

    1*

    Figure S1. Left panel: Ru XANES spectra of 40 nm thick Ru films grown on sapphire

    at RT and 650 ºC with graphene synthetized at TCVD = 910 ºC. Ru-foil spectrum is given

    also for comparison. Right panels: Ru K-edge EXAFS fits of representative samples

    with graphene. Black dots: FT module experiment; green line: FT imaginary part

    experiment; red line: FT module simulation; blue line: FT imaginary part simulation.

    spectrum is given also for comparison.

    -6

    -4

    -2

    0

    2

    4

    6

    FSRT-Ru5-Gr910

    -2

    0

    2

    FSRT-Ru5-Gr1000

    FT

    Mag

    nitu

    de (Å

    -3)

    -2

    0

    2

    FS650-Ru5-Gr1000

    0 1 2 3 4

    -2

    0

    2

    Distance (Å)

    S650-Ru5-Gr1000

    Electronic Supplementary Material (ESI) for Journal of Materials Chemistry C.This journal is © The Royal Society of Chemistry 2017

  • 2

    Table S1. Results obtained from the fits of the EXAFS spectra of samples with and

    without graphene obtained at different CVD temperatures (TCVD) on fused silica and

    sapphire. Ru foil results are also included as reference. The asterisks signal the pairs

    related to the new ruthenium carbide phase.

    Sample Substrate TS

    (ºC)

    TCVD

    (ºC) pair Nj

    Rj

    (Å)

    2

    (Å-2

    )

    Ru foil Ru-Ru

    Ru-Ru

    6.0

    6.0

    2.64

    2.73

    0.0024

    0.0036

    FSRT-Ru5-910 Fused

    Silica RT 910

    Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.64

    2.74

    0.0017

    0.0036

    FSRT-Ru5-Gr910 Fused

    Silica RT 910

    Ru-Ru

    Ru-Ru

    5.60.3

    5.60.3

    2.64

    2.73

    0.002

    0.0028

    FSRT-Ru5-1000 Fused

    Silica RT 1000

    Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.62

    2.74

    0.0015

    0.0024

    FSRT-Ru5-Gr1000 Fused

    Silica RT 1000

    Ru-Ru

    *Ru-C

    *Ru-Ru

    3.00.5

    6.00.5

    6.00.5

    2.59

    2.31

    2.93

    0.0098

    0.0002

    0.0074

    FS650-Ru5-1000 Fused

    Silica 650 1000

    Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.64

    2.73

    0.0024

    0.0035

    FS650-Ru5-Gr1000 Fused

    Silica 650 1000

    Ru-Ru

    *Ru-C

    *Ru-Ru

    3.10.5

    6.00.5

    7.10.5

    2.57

    2.31

    2.95

    0.0066

    0.0010

    0.0074

    SRT-Ru40-910 Sapphire RT 910 Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.60

    2.72

    0.0011

    0.0021

    S650-Ru40-Gr910 Sapphire 650 910 Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.61

    2.71

    0.0023

    0.0013

    S650-Ru5-1000 Sapphire 650 1000 Ru-Ru

    Ru-Ru

    6.00.3

    6.00.3

    2.64

    2.72

    0.0020

    0.0056

    S650-Ru5-Gr1000 Sapphire 650 1000 Ru-Ru

    *Ru-C

    4.80.5

    3.20.5

    2.67

    2.32

    0.0048

    0.0002

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    Figure S2. Observed new diffraction maxima (13.58°, 19.22°, 23.60° and 27.33°),

    (black tick marks) which cannot be indexed considering the hexagonal phase of the

    metallic ruthenium (red tick marks). Their analysis indicates that these maxima can be

    indexed by assuming a primitive cubic cell (dRu-Ru = 2.927 Å), a body-centered cubic

    cell (dRu-Ru = 3.586 Å) or a face-centered cubic cell (dRu-Ru = 4.140 Å), dark yellow, blue

    and wine tick marks, respectively. However, only the primitive cubic (cP) cell is

    compatible with the EXAFS Ru-Ru and Ru-C interatomic distances (dRu-Ru = 2.93 Å

    and dRu-C = 2.31 Å). Moreover, Ru-Ru distances resulting from the fits to fcc and bcc

    structures (4.140 Å and 3.586 Å) are not realistic values.

    14 16 18 20 22 24 26 28

    a=2.710 Å

    c=4.298 Å

    dRu-Ru

    =2.658 Å

    2.710 Å

    a=3.893 Å

    dRu-Ru

    =2.753 Å

    a=5.856 Å

    dRu-Ru

    =4.140 Å

    a=4.141 Å

    dRu-Ru

    =3.586 Å

    a=2.927 Å

    dRu-Ru

    =2.927 Å

    012011002010

    002111

    004222022002

    022112002011

    002111011

    Ru-fcc (Ref. 26)

    Ru-fcc

    Ru-bcc

    Ru-cP

    Ru-hcp

    2theta (deg.)

    this work

    001

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    Figure S3. (a, b, f, g, k and l) Experimental EBSD patterns recorded at three different

    RuC grains, and comparison with the simulated Kikuchi bands for a cubic phase with

    lattice parameter of 2.927 Å, and crystalline orientation according to sketches shown in

    (e, j and o) respectively. (c, d, h, i, m and n) Same as before with overlapped low-index

    lattice planes and poles. Note that only clearly visible bands have been overlapped in

    the experimental patterns.