Shelley Begley Application Development Engineer Agilent Technologies
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Transcript of Shelley Begley Application Development Engineer Agilent Technologies
Shelley BegleyApplication Development EngineerAgilent Technologies
Electromagnetic Properties of Materials: Characterization at Microwave Frequencies and Beyond
Agenda
Definitions
Measurement TechniquesCoaxial Probe Transmission LineFree-Space Resonant Cavity
Summary
2
DefinitionsPermittivity is a physical quantity that describes how an electric field affects and is affected by a dielectric medium and is determined by the ability of a material to polarize in response to an applied electric field, and thereby to cancel, partially, the field inside the material. Permittivity relates therefore to a material's ability to transmit (or "permit") an electric field…The permittivity of a material is usually given relative to that of vacuum, as a relative permittivity, (also called dielectric constant in some cases)….- Wikipedia
DkDf
'r
"r
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
Permittivity (Dielectric Constant)
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
Permittivity (Dielectric Constant)
Dk
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
"'
0rr j
interaction of a material in the presence of an external magnetic field.
Permittivity (Dielectric Constant)
Permeability
Dk
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
"'
0rr j
interaction of a material in the presence of an external magnetic field.
Permittivity (Dielectric Constant)
Permeability
Dk
"'rrr j "'
rrr j
Electromagnetic Field Interaction
Electric Magnetic
Permittivity Permeability
FieldsFields
STORAGE
MUT
STORAGE
"'rrr j "'
rrr j
Electromagnetic Field Interaction
Electric Magnetic
Permittivity Permeability
FieldsFields
STORAGE
LOSS
MUT
STORAGE
LOSS
Loss Tangent
'
"
tanr
r
CycleperStoredEnergy
CycleperLostEnergy
QD
1tan
Dissipation FactorD
Quality FactorQ
r
'r
''r
Df
Relaxation Constant t
t = Time required for 1/e of an aligned system to return to equilibrium or random state, in seconds.
cc f
2
11
11
10
100
10 100
Water at 20o C
f, GHz
most energy is lost at 1/t
'r
"r
j
s
1
)( :equation Debye
Techniques
Transmission LIne
ResonantCavity
Free Space
CoaxialProbe
Which Technique is Best?
It Depends…
Frequency of interest
Expected value of er and mr
Required measurement accuracy
Which Technique is Best?
It Depends… on
Frequency of interest
Expected value of er and mr
Required measurement accuracy Material properties (i.e., homogeneous, isotropic) Form of material (i.e., liquid, powder, solid, sheet) Sample size restrictions
Which Technique is Best?
It Depends… on
Frequency of interest
Expected value of er and mr
Required measurement accuracy Material properties (i.e., homogeneous, isotropic) Form of material (i.e., liquid, powder, solid, sheet) Sample size restrictions Destructive or non-destructive Contacting or non-contacting Temperature
Which Technique is Best?
It Depends… on
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
Coaxial Probe System
Network Analyzer (or E4991A Impedance
Analyzer)
85070EDielectric
Probe
GP-IB, LAN or USB
85070E Software (included in kit)
Calibration is required
Computer (Optional for PNA or ENA-
C)
Material assumptions:
• effectively infinite thickness
• non-magnetic
• isotropic
• homogeneous
• no air gaps or bubbles
Material assumptions:
• effectively infinite thickness
• non-magnetic
• isotropic
• homogeneous
• no air gaps or bubbles
Coaxial Probe
11
Reflection
(S )
er
Three Probe Designs
High Temperature Probe
• 0.200 – 20GHz (low end 0.01GHz with impedance analyzer)
• Withstands -40 to 200 degrees C • Survives corrosive chemicals• Flanged design allows measuring flat surfaced
solids.
Three Probe Designs
Slim Form Probe
• 0.500 – 50GHz• Low cost consumable design• Fits in tight spaces, smaller sample sizes • For liquids and soft semi-solids only
Three Probe Designs
Performance Probe
Combines rugged high temperature performance with high frequency performance, all in one slim design.
• 0.500 – 50GHz• Withstands -40 to 200 degrees C• Hermetically sealed on both ends, OK for
autoclave• Food grade stainless steel
Coaxial Probe Example Data
Coaxial Probe Example Data
Coaxial Probe Example Data
Martini Meter!
80 85 90 95 100
Measured Y
80
85
90
95
100
Pre
d C
al
100 real
96.6 real
80.0 real
98.0 real
90.9 real
99.5 real
96.2 real
97.6 real
87.0 real
99.0 real
95.7 real
97.1 real
83.3 real
98.5 real
95.2 real
5
Infometrix, Inc.
Transmission Line System
Network Analyzer
Sample holder connected between coax
cables
85071E Materials Measurement
Software
Calibration is required
Computer (Optional for PNA or ENA-
C)
GP-IB, LAN or USB
Transmission Line Sample Holders
Waveguide
Coaxial
Transmission Line
l
Reflection(S )11
Transmission(S )21
Material assumptions:
• sample fills fixture cross section
• no air gaps at fixture walls
• flat faces, perpendicular to long axis
• Known thickness > 20/360 λ
Material assumptions:
• sample fills fixture cross section
• no air gaps at fixture walls
• flat faces, perpendicular to long axis
• Known thickness > 20/360 λ
er and mr
Transmission models in the 85071E Software
Algorithm Measured S-parameters Output
Nicolson-Ross S11, S21, S12, S22 εr and μr
NIST Precision S11, S21, S12, S22 εr
Fast Transmission S21, S12 εr
Poly Fit 1 S11, S21, S12, S22 εr and μr
Poly Fit 2 S12, S21 εr
Stack Two S21, S12 (2 samples) εr and μr
Reflection models in the 85071E Software
Algorithm Measured S-parameters Output
Short Backed S11 εr
Arbitrary Backed S11 εr
Single Double Thickness S11 (2 samples) εr and μr
Transmission Example Data
Transmission Example Data
85071E Materials Measurement
Software
Transmission Free-Space System
Network Analyzer
Sample holder fixtured between two antennae
Calibration is required
Computer (Optional for PNA or ENA-
C)
GP-IB, LAN or USB
Non-Contacting method for High or Low Temperature Tests.
Free Space with Furnace
Transmission Free-Space
Material assumptions:
• Flat parallel faced samples
• Sample in non-reactive region
• Beam spot is contained in sample
• Known thickness > 20/360 λ
Material assumptions:
• Flat parallel faced samples
• Sample in non-reactive region
• Beam spot is contained in sample
• Known thickness > 20/360 λ
l
Reflection
(S11 )
Transmission
(S21 )
er and mr
Free Space Example Data
Free Space Example Data
Resonant Cavity System
Resonant Cavity with sample
connected between ports.
Network Analyzer
GP-IB or LAN
Computer (Optional for PNA or ENA-
C)
Resonant Cavity Software
No calibration required
Resonant Cavity Fixtures
Agilent Split Cylinder Resonator IPC TM-650-
2.5.5.5.13
Split Post Dielectric Resonators from
QWED
ASTM 2520 Waveguide Resonators
00313.011
4
2.3032
1
css
cr
ss
sccr
QQV
V
fV
ffV
Resonant Cavity Technique
ffc
Qc
empty cavityfc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21
00313.011
4
2.3032
1
css
cr
ss
sccr
QQV
V
fV
ffV
Resonant Cavity Technique
Q
fs ffc
sQc
empty cavity
sample insertedfc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21
00313.011
4
2.3032
1
css
cr
ss
sccr
QQV
V
fV
ffV
Resonant Cavity Technique
Q
fs ffc
sQc
empty cavity
sample insertedfc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21
00313.011
4
2.3032
1
css
cr
ss
sccr
QQV
V
fV
ffV
Resonant Cavity Technique
Q
fs ffc
sQc
empty cavity
sample insertedfc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
S21
Resonant Cavity Example Data
Resonant vs. Broadband Transmission Methods
Resonant Broadband
Low Loss materialsYes
er” resolution ≤10-4
Noer” resolution ≥10-2
Thin Films and SheetsYes
10GHz sample thickness <1mm
No10GHz optimum thickness ~
5-10mm
Calibration Required No Yes
Measurement Frequency Coverage Single Frequency Broadband or Banded
Materials Ordering Convenience SpecialsModel
NumberDescription
85071E E19
E03
E04
E15
E07
Split Post Dielectric Resonators from QWED1.1GHz
2.5GHz
5GHz
15GHz
22GHz
85071E E02
E01
E22
E18
E24
Quasi-optical products from Thomas Keating Ltd.60-90GHz – Quasi-optical Table
75-110GHz – Quasi-optical Table
90-140GHz – Additional set of horns for above tables
220-326GHz – Additional set of horns for above tables
325-500GHz – Additional set of horns for above tables
Materials Ordering Convenience SpecialsModel
NumberDescription
85071E E19
E03
E04
E15
E07
Split Post Dielectric Resonators from QWED1.1GHz
2.5GHz
5GHz
15GHz
22GHz
85071E E02
E01
E22
E18
E24
Quasi-optical products from Thomas Keating Ltd.60-90GHz – Quasi-optical Table
75-110GHz – Quasi-optical Table
90-140GHz – Additional set of horns for above tables
220-326GHz – Additional set of horns for above tables
325-500GHz – Additional set of horns for above tables
For More Information
Visit our website at:
www.agilent.com/find/materials
For Product Overviews, Application Notes, Manuals, Quick Quotes,
international contact information…
ReferencesR N Clarke (Ed.), “A Guide to the Characterisation of Dielectric Materials at RF and Microwave Frequencies,” Published by The Institute of Measurement & Control (UK) & NPL, 2003
J. Baker-Jarvis, M.D. Janezic, R.F. Riddle, R.T. Johnk, P. Kabos, C. Holloway, R.G. Geyer, C.A. Grosvenor, “Measuring the Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-Index Materials,” NIST Technical Note 15362005
“Test methods for complex permittivity (Dielectric Constant) of solid electrical insulating materials at microwave frequencies and temperatures to 1650°, ” ASTM Standard D2520, American Society for Testing and Materials
Janezic M. and Baker-Jarvis J., “Full-wave Analysis of a Split-Cylinder Resonator for Nondestructive Permittivity Measurements,” IEEE Transactions on Microwave Theory and Techniques vol. 47, no. 10, Oct 1999, pg. 2014-2020
J. Krupka , A.P. Gregory, O.C. Rochard, R.N. Clarke, B. Riddle, J. Baker-Jarvis, “Uncertainty of Complex Permittivity Measurement by Split-Post Dielectric Resonator Techniques,” Journal of the European Ceramic SocietyNo. 10, 2001, pg. 2673-2676
“Basics of Measureing the Dielectric Properties of Materials”. Agilent application note. 5989-2589EN
AM. Nicolson and G. F. Ross, "Measurement of the intrinsic properties of materials by time domain techniques," IEEE Trans. Instrum. Meas., IM-19(4), pp. 377-382, 1970.
Improved Technique for Determining Complex Permittivity with the Transmission/Reflection Method, James Baker-Jarvis et al, IEEE transactions on microwave Theory and Techniques vol 38, No. 8 August 1990
P. G. Bartley, and S. B. Begley, “A New Technique for the Determination of the Complex Permittivity and Permeability of Materials Proc. IEEE Instrument Meas. Technol. Conf., pp. 54-57, 2010.