Raman spectroscopy - Cornell Center for Materials Research
Transcript of Raman spectroscopy - Cornell Center for Materials Research
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Raman spectroscopy
Information from Raman Spectroscopy
characteristicRaman frequencies
composition ofmaterial
e.g. MoS2,MoO3
changes infrequency ofRaman peak
stress/strainstate
e.g. Si 10 cm-1 shift per% strain
polarisation ofRaman peak
crystal symmetry andorientation
e.g. orientation of CVDdiamond grains
width of Ramanpeak
quality ofcrystal
e.g. amount of plasticdeformation
parallel
perpendicular
intensity ofRaman peak
amount ofmaterial
e.g. thickness oftransparent coating
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The coupling of a Raman spectrometer withan optical microscope provides a number ofadvantages:
1) Confocal Light collection
2) High lateral spatial resolution
3) Excellent depth resolution
4) Large solid collection angle for theRaman light
Collecting the light
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The basic function of a Raman system
• Deliver the laser to the sampling point– With low power loss through the system
– Illuminating an area consistent with sampling dimensions
– Provide a selection/choice of laser wavelengths
• Collect the Raman scatter– High aperture
– High efficiency optics
– High level of rejection of the scattered laser light
• Disperse the scattered light– Short wavelength excitation requires high dispersion spectrometers
• Detect the scattered light
• Graphically / mathematically present the spectral data
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Laser wavelength selection concerns for classical Raman
As the laser wavelength gets shorter
Raman scattering efficiency increases
The risk of fluorescence increases (except deep UV)
The risk of sample damage / heating increases
The cost of the spectrometer increases
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Raman light source
System basics: lasers
1) UV lasers
2) visible lasers
3) NIR lasers
Common excitation wavelengths
244 nm- biological, catalysts(Resonance Raman)
325 nm- wide bandgap semiconductors
488 nm & 514 nm- semiconductor, catalysts,biological, polymers, minerals & generalpurpose
633 nm- corrosion & general purpose
785 nm - polymers, biological & generalpurpose
830 nm- biological
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• Illuminate a Sample with an Intense Single Frequency Light Source
• Measure the relative frequency shift of the inelastically scattered light
Generic Raman system flow diagram
detector
laser sample
diffractiongrating
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Raman microscopy: Dispersive instrument basics
Multi-channelDetector
sampleHNF
laser
slitGrating
100
200
300
Cou
nts
System basics:
1) laser
2) Rayleigh rejection filter
3) grating (resolution)
4) CCD detector
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18 8 -2 -12
14
4
-6
Dispersion
0 200
Intensity
The Renishaw Raman spectrometer is an imagingspectrograph
on-axis stigmatic design with a -70 oC Peltier cooledCCD detector. Advanced inverted mode, deep depletionand UV optimized detectors are available as options.
We can easily demonstrate the high quality imaging andsystem performance advantages as seen in the imageof the Si 520 cm-1 Raman band on the CCD detector.
Image of Si 520 cm-1
band
pixel number
pixe
l num
ber
Research Grade MicroRaman Spectrometer
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Delivering the light
90 and 180 degree scattering
Porto notation
90 degree scattering x(z,z)y and
180 degree scattering x(z,z)x’
excitation direction (excitation polarization,
scattered polarization) scattering direction
The actual excitation and collection directions are the range of angles0 to γ
γ
mag N.A 2*γ(deg)
x5 0.12 11.5
x20 0.4 29
x50 0.75 97.2
x100 0.9 128.3
x
x’
y
γ
Delivering the light
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Delivering the light (180 degree backscattering)
excitation
Raman
> 90% efficient
Holographic notch or edge filter
2
1
Delivering the light
Raman microscope systems typicallyoperate in with the excitation direction andcollected Raman scattering directionseparated 1800. This mode of collectionand excitation is referred to as “back-scattering”.
Typically back-scattered Raman collectionnecessitate special optics that operateboth as a Rayleigh filter and as a lasermirror. Holographic notch filters andspecial dielectric mirrors are often theoptics of choice, since they minimize laserintensity loss and Raman scattering lossesthat would otherwise occur when utilizing apartial reflector.
Relative laser excitation efficiency andRaman transmission efficiencies can beeasily calculated for most configurations
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The minimum laser focus isdetermined by:
1. the focusing optic N.A.2. laser wavefront (distortionor M2)3. How the back aperture ofthe objective is filled
Laser focused spot size
Delivering the light
Raman spectroscopy utilizing a microscopefor laser excitation and Raman lightcollection offers that highest Raman lightcollection efficiencies.
When properly designed, Ramanmicroscopes allow Raman spectroscopywith very high lateral spatial resolution,minimal depth of field and the highestpossible laser energy density for a givenlaser power.
It is important to note that the laserminimum focused spot size is not typicallythe same size as the coupled Ramanscattered spot size.
The minimum laser focused spot size isoften compromised by improperly matchingthe laser size to the back aperture of anobjective and by wavefront errors inherentto the laser and introduced by the laserdelivery optics.
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Without consideration of the laser mode quality and wavefront, orsource size the minimum laser focused spot for any optic isdescribed by equation 1:
Minimum laser focus
1) Excitation wavelength: λ
2) effective numerical aperture : N.A.
3) dl is determined by twice the Rayleigh criteria of the adjacent distancerequired to spatially resolve the presence of an identical size spots
Laser focused spot size
..
*22.1
ANdl
λ=
Delivering the light
N.A. 514.5 7850.12 2.72 4.150.25 1.31 1.990.4 0.82 1.250.75 0.44 0.660.9 0.36 0.55
dl
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The laser focused spotsize does not necessarilydefine the lateral spatialresolution of the Ramansystem. The lateralspatial resolution, is oftendiscussed in terms of theRayleigh criteria for thecollected Raman light.The Rayleigh criteriarequires that the distancebetween two pointssources of light of equalintensity be greater thanthe distance from thepeak to the first airy diskminimum. Completediscrimination of twoadjacent materials occursat twice the Rayleighcriteria
Laser focused spot size
Delivering the light
Airy disk pattern
0
0.2
0.4
0.6
0.8
1
1.2
-2.5 -1.5 -0.5 0.5 1.5 2.5
Distance/microns
Rel
ativ
e In
ten
sity
objective N.A.: 0.75
Excitation wavelength/nm: 514.5
Separation distance 0.44 um
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Diffration limited focus
-0.2
0
0.2
0.4
0.6
0.8
1
1.2
-4 -3 -2 -1 0 1 2 3 4
distance/microns
rela
tiv
e e
ne
rgy
de
ns
ity
x50 (0.75) x20 (0.40) x5 (0.10)
It’s important toremember that theobjective used todeliver the laser lightaffects the laserenergy density.
The relative energydensity and peakpower for the X5,X20 and X50objectives areshown relative tothe X50 objective.
The peak energydensity decreases by~50% for the X20and 87% for the X5objective
Airy disk calculation for X5, X20 and X50 objective calculated for 514.5 nm l
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2
*53.2
=
ll D
fh λ
The system laser focus depth (hl) is determined by:
1) Excitation wavelength: λ
2) Microscope objective focal length : f
3) Effective laser beam diameter at the the objective backaperture: Dl
Laser focus and depth of field
Delivering the light
DO NOT CONFUSE LASER FOCUS DEPTH WITH CONFOCAL COLLECTION DEPTH
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4
3*21.3
=
ll D
fλτ
The system laser focus volume (τl) is determined by:
1) Excitation wavelength: λ
2) Microscope objective focal length : f
3) Effective laser beam diameter at the the objective backaperture: Dl
Laser focus and illuminated volume
Delivering the light
DO NOT CONFUSE LASER FOCUS VOLUME WITH CONFOCAL COLLECTION VOLUME
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N.A. vs. Intensity
0
0.5
1
1.5
2
2.5
0 0.5 1 1.5
numerical aperture
Si
Ra
ma
n i
nte
ns
ity
Opaque sample
Objective N.A rel σ5x 0.12 0.0210X 0.25 0.0820X 0.4 0.250Xulwd 0.55 0.3750X 0.75 0.69100X 0.9 1100X oil 1.2 1.78
Solid collection angle is proportional to (N.A.)2 not 1/(f/#)^2
Measured vs. calculated
σ = 4/π *(N.A.)2
Collecting the light
Oil immersion objectiveincrease is likely due toreduced reflection losses
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Relative collection volume
0
1
2
3
4
5
6
400 500 600 700 800 900
Wavelength (nm)
Re
lati
ve
vo
lum
e
Macro-sampling isimproved with longerwavelength excitation
Collecting the light
4
3*21.3
=
ll D
fλτ
The system laser focus volume (τl)
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Extended scanning(Renishaw patent EP 0638788)
From the Renishaw Raman software the user can select:
• a fixed grating measurement with a spectrum 'window'of 400 cm-1 to 1000 cm-1 (configuration dependent)
• a unique 'extended scanning' facility allowing the userto choose any Raman shift range up to about 10000 cm-1
(configuration dependent). Essential for extended rangescanning for Raman and photoluminescence
Extended scanning is implemented by moving the grating andthe charge generated on the CCD camera synchronously.
This feature is NOT available on any other instrument and isKEY to system performance
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CCD Basics
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Extended scanning: how it works
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Extended scanning vs stitched scanning
Advantages of extended scanninguse a single grating no stitching required and no “discontinuities” at joinsflexible wavenumber coverage (up to 10000 cm-1 )pixel-to-pixel variation is averaged out - enhancing noise reductionno compromise on resolution across the scanned rangesimple to use
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Adequate S/N
To acquire useful Raman spectra all you need is:
Sufficient spectral and spatial resolution and coverage
Repeatability
The ability to collect and detect enough photons to distinguish theirelectronic signal above system generated noise before the sample changesor dies.
The ability to separate spectral peaks narrower than the narrowestanticipated spectral features of your sample
The ability to collect all of the spectral data required for the analysis
The ability to optically restrict the data collection to an area / volumesmall enough to eliminate acquisition of unwanted spectral data ofnearby substances
The ability to consistently get the same right or wrong values
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Confocal Raman microscopy without pinhole optics
The use of a stigmatic spectrograph and stigmatic microscope-spectrometercoupling optics creates two additional conjugate image planes at the slit andCCD eliminating the need for pinhole optics!
Conjugate image planes - Square pinhole
Collection
optic
Preslit
focusing lens
Slit
grating
CC
D
CCD CCD
Slit
Slit
Spatial filtering
Confocal Raman collection
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0
500
1000
Cou
nts
400 600 800 1000 1200 1400 1600 1800 2000 Raman Shift (cm-1)
Confocal 100X
Laser: 15802.78cm-1White Light Correction:
3: CONFO~15
αβχδη
50X
100X
100X oil
Si polymer2 um polymer film
Silicon Wafer
Higher numericalaperture objectiveseffectively eliminate theRaman spectrum ofunderlying layers!
Confocal Raman collection
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Spectral resolution and coverage are controlled by focal length and groove density
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Spectrometer issues associated with different excitations
Shorter wavelength excitation requires higher dispersion spectrometers andproduce higher levels of stray light in the system.
1 nm is equivalent to:
160 cm-1 @ 250 nm excitation 38 cm-1 @ 514 nm excitation 94 cm-1 @ 325 nm excitation 16 cm-1 @ 785 nm excitation
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System parameters that affect spectral resolution and coverage
• The dispersion of the spectrometer– Focal length– Grating groove density
•Multiple gratings• for resolution/coverage trade-off•For using multiple excitation wavelength
– Grating rotation– Optical aberrations in the spectrometer– Mutichannel Detector
•Pixel size•Width (under certain circumstances)
– Laser•Wavelength stability•Wavelength choice
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Raman microscopy: spectral resolution
Spectrometer resolution
The slit-width determined resolution of the spectrometer isdetermined by the convolution of the entrance slit with theCCD pixel.
ccd
Spectral lines
spectrum
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10000
15000
20000
25000
30000
35000
40000
Co
un
ts
60 70 80 90 100 110 Raman Shift (cm-1)
Time: 300secs
File # 1 : BBF
Air 15 um slit Laser: 15803cm-1
The air spectrum shows thatsystem resolution is limited to~0.7 cm-1 FWHM utilizing 633 nmexcitation.
O2 & N2
Spectrometer resolution is best determined by measuring the air spectrum
Raman microscopy: spectral resolution
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50000
100000
150000
200000
Co
un
ts
40 60 80 100 120 140 160 180 200 220 Raman Shift (cm-1)
Time: 300secs
File # 3 : BBJ
Air 100 um slit Laser: 15803cm-1
100 um
30 um15 um
Raman spectrum of air30 min, 7 mW, 633 nm.
Resolution 3.4 cm-1
vs.Resolution 0.70 cm-1
When the spectrometer determines measured spectral linewidths
Increasing the entrance slit increases light throughput but decreases resolution
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0
100000
200000
300000
400000
Co
un
ts
380 400 420 440 460 480 500 520 Raman Shift (cm-1)
Time: 1secs
File # 3 : BBK
CCl4 100 um Laser: 15803cm-1
Trading spectral resolution for throughput
Raman spectrum ofCCl4, 10 - 1 secaccumulations withdifferent slit setting
Intensity increases 7fold, resolutiondecreases 5 fold
100 um
30 um
15 um
Increasing the entrance slit increases throughput but decreases resolution
2400 l/mm grating
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0
.2
.4
.6
.8
1
1.2
1.4
Co
un
ts
400 600 800 1000 1200 1400 1600 1800 2000 Raman Shift (cm-1)
Time: 10secs
File # 1 : BBO
Caff 100 um match step and repeat Laser: 15803cm-1
Sample determines measured spectral linewidths
The caffeine Ramanspectrumidentical laser powers
Resolution 7 cm-1
(600 l/mm)
Resolution 3.5 cm-1
(2400 l/mm)
Single static scan with 600 l/mm, 10 stitched static scans with 2400 l/mm
10 sec
~2 min
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0
.1
.2
.3
.4
.5
.6
.7
Co
un
ts
1050 1100 1150 1200 1250 1300 1350 1400 1450 Raman Shift (cm-1)
Time: 10secs
File # 1 : BBO
Caff 100 um match step and repeat Laser: 15803cm-1
600 l/mm gratingDecreases measurement timean order of magnitude,
Increases S/N an > order ofmagnitude.
Spectral resolution isdetermined by the sample
Sample determines measured spectral linewidths
Matching the spectrometer resolution and the and CCD pixel resolution to the natural linewidthsof the sample optimizes S/N
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System parameters that affect S/N
• Laser– Power– Wavelength– Modality– Stability– Delivery optics
• Collection Optics– Aperture– Focus
•Diffraction limited spot size
– Transmission– Robustness
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Factors affecting S/N
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Select a CCD for best Raman performance
What limits the CCD performance?
1. Read noise: How many photon generated electrons are required to achievea signal level greater than the read noise?
Raman systems that require off chip binning increase read noise to thesquare root of the number of pixels binned.
2. Dark Charge rate: How long can you integrate before the binned CCDpixels generate a charge equivalent to the read noise?
At the integration time that the dark charge signal contributes to the noiseeither through shot noise or uniformity of response, it must be subtracted.
3. Uniformity of response: How many photon generated electrons can bemeasured before the shot noise is exceeded by the non-uniformity ofresponse?
At the point uniformity of response noise exceeds shot noise the pixels mustbe read out individually (without binning) for response correction.
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Optimal CCD operating temperature
The best CCD temperature operation is determined by the CCD darkcharge rate and the requirements for operation near the detectorlimit of ~1050 nm
• Low temperatures decrease the CCD dark charge rate. The CCD darkcharge rate decreases ~50% for each 6-9 degree decrease in operatingtemperature.
e*T*122 QdQd T
-64003
0
=
Dark Charge e/p/s
0.001
0.01
0.1
1
10
-80 -60 -40 -20 0
Temperature C
Dar
k C
harg
e ra
te e
/p/s
Qd dark charge rate (e/p/s) atoperating temperature T
Qdo - dark charge rate at reference
temperature (typically 23-25 oC)
A1A-CCD02-06 Deep Depletion Sensor Issue 3, January2000
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Select response uniformity rather than QE
Renishaw CCDtypicalresponsecurve. Thepeak QE is~50%, butthe responseuniformity isan order ofmagnitudebetter thanwith higher QECCD chips
Select a CCD for best Raman performance
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StreamLine™
• StreamLine™ technology– Unique Renishaw technology
(patent pending)
– Combination ofhardware and software
– Enables very fastRaman imaging of samples
• Application areas– Pharmaceuticals
– Materials science
– Semiconductors
– Polymers
– Biosciences
– etc.
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Spectral imaging
• Acquire data from different pointson the sample.
• Generate maps based onparameters of resulting spectra.Examples:
– Univariate: intensity of band
– Multivariate: chemometrics:
• Component analysis based onreference samples
• Principal component analysis (noreferences)
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• Measure the Raman spectrum of ~1 µm Siparticle with 1 µm laser spot (backlash of 10 µmenabled)
• Move away from then return to the particle torepeat the Raman measurement (32 times eachdirection)
• Compare performance of the motorized mappingstage with the 0.1 µm encoders on to theperformance with the encoders off
Specification:
unencoded 2 µm
encoded 0.3 µm
Mapping stage repeatability
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The Si particle
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Raman line mapping
• Method– Generate laser line on sample
– Simultaneously acquire spectrafrom positions along the line
– Move line over sample,perpendicular to its length
• Advantages– Larger area illuminated by line
• Disadvantages– Stop/start movement overhead
– Artefacts…line uniformity
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StreamLine™
• Move line the other way!
• Synchronise the stage and thedetector
• Advantages– Smooth fast continuous movement
– Artefacts eliminated
– Large area illuminated by line
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Features of StreamLine™ imaging
• StreamLine™ offers:
– Power density up to 100x less than point laser configurations
– No joining or uniformity artefacts
– Macro (whole tablet) and micro (<1 µm) sampling capabilities
– Zero dead time between sequential spectral acquisitions
– Confocal information maintained
– High spectral resolution options available
– Multi-wavelength capabilities from the UV to NIR
– High speed with unparalleled data quality
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StreamLine™
• Technology for very fast Ramanimaging
• Unique Renishaw technology(patent pending)
• Innovative hardware, uniquesoftware
• Collect excellent quality data wherepoint by point would damagesample
• Parallel data readout, synchronisedwith sample movement
100µm
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StreamLine™ imaging: how it works?
– Each sample point passes beneath each part of the laser line
– The charge is stepped synchronously with the stage movement
– Parallel data readout
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White-light montage
• Used for detailed sample survey
• 4_4 white-light montagegenerated with 50_ objective
• Montage can then be used todefine multiple imagingexperiments
• Multiple experiments may bequeued
• White-light image saved withspectral data
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StreamLine™ in action
• Example StreamLine™ video
• Silicon target with metallisedstructure, imaged with 532nm laser
• 4 x 4 montage white-light imageused to define experimental area
• Imaged area bigger than 50xobjective field of view
• Live imaging of Si 520cm-1 band
• Bicubic interpolation applied toimage during acquisition
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Metallised Si target analysis
• Line profile along the Y axis
• Feature size approximately 5 µm
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Image quality comparison
Image quality comparison
StreamLine™ 1 minute, 40 seconds Point by point 1hour, 6 minutes
• Same area on tablet analysed using point by point and StreamLine™ techniques
• Image generated using direct classical least square (DCLS) multivariate method
• Image shows distribution of Aspirin, Paracetamol and Caffeine components
• Identical data quality
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Image of complete tooth section
• First ever whole tooth Raman image
• Different regions clearly indentified
• Color coding:– Yellow: enamel– Green: dentine– Red: fluorescent areas
• Details– 9 mm x 16 mm area– 84,024 spectra– 20 minutes– 785 nm excitation
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Spectrum from dentine region of tooth
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Dental caries polarisation images
• Image is a ratio of two data sets:– Parallel-polarisation– Crossed-polarisation
• Color coding:– Red: strong polarisation dependence -
Sound enamel– Green: weak polarisation dependence -
Carious region
• Details– 1.5 mm x 3.4 mm area– 42,642 spectra– 27 minutes– 785 nm excitation
• StreamLine is compatible with the fullrange of spectral options available forthe inVia Raman microscope
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Dental caries curve-fit analysis image
• Curve fit data analysis onP-O symmetric stretchband
– Peak width– Peak position
• Details– 1.5 mm x 3.4 mm area– 42,642 spectra– 27 minutes– 785 nm excitation
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Whole ink character imaging
• 43,400 spectra
• 29 minutes
• 514 nm
• 20x objective
• 30 µm spatial resolution
• Image created usingcomponent method
White light montage
Raman ink image
First ever whole ink character Raman image
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Whole ink character imaging
High quality ink spectrum from image (noise filtered)
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Whole ink character imaging
Image can also reveal pen contact on paper
Blue – paper
Red – paper with pen contactaway from ink
Useful information provided onpen angle during stroke
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Crossed ink example 1: dual crossed ink lines
• Details– 1040 µm (X) by 2607 µm (Y)
– 90,440 spectra
– 90 minutes total time
– 514 nm excitation
– 20x objective
Double crossed line exampleusing two black ball point pens
Image collected of all lines and paper inone experiment
First ever Raman crossed lineimage
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Crossed ink example 1: dual crossed ink lines
Component Raman image ofink 1 (green)
Shows smearing of top horizontal line
Also the image provides information onthe direction of the crossing
This suggests that the top ink 1 line isbeneath a further line crossing it.
Directionof
smearing
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Crossed ink example 1: dual crossed ink lines
Component Raman image overlayfrom WiRE 3 – confirms order ofdeposition
Top cross – Ink 1 (green) under ink 2
Bottom cross – Ink 2 (red) under ink 1
Ink 1 (green)Ink 2 (red)Paper (blue)
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Crossed ink example 2: single crossed ink lines
• Details– 990 µm (X) by 1430 µm (Y)
– 47,422 spectra
– 33 minutes total time
– 514 nm laser wavelength
– 20x objective
Single crossed line example using two black ball point pens
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Crossed ink example 2: single crossed ink lines
Component Raman imageoverlay from WiRE 3superimposed on white lightimage
Cross – Black ink 1 (green) over blackink 2 (red)
Black ink 1 (green)Black ink 2 (red)
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Crossed ink example 2: spectra from image
Black ink 1 (green)
Black ink 2 (red)
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Raman and PL imaging of polycrystalline CVD diamond film
• CVD diamond sample grownonto silicon substrate usingchemical vapour deposition(CVD) method
• Rough growth surface issubsequently polishedoptically flat
• Raman andphotoluminescencemeasured in sequentialexperiments
• Curve-fit analysis used forimage generation
• 18,000 spectra collected in 6minutes
Diamond peak position
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Raman and PL imaging of polycrystalline CVD diamond film
1332 cm-1
Diamond
1.68 eV [Si-V]0
(intensity capped)
1.95 eV[N-V]-
1.77 eV
Raman range
Photoluminescence range
• Standard spectralresolutionconfiguration usedfor Raman bands,lower resolutionused forphotoluminescencefeatures
Details of spectral analysis
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Raman and PL imaging of polycrystalline CVD diamond film
• 50,000 spectra collected in 15 minutes with 0.5 micrometer resolution
• Sequence derived from 2 imaging experiments (Raman and Photoluminescence)
• A and B highlight two areas of highly twinned crystal facets exhibiting five-foldsymmetry
Position of 1332 cm-1 Raman bandWidth of 1332 cm-1 Raman bandArea of 1332 cm-1 Raman bandIntensity of 1.68 eV [Si-V]0 PL band
A B
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Diamond nucleation region
• Diamond film– nucleation side of a free-standing
diamond film
• Map shows:– Top image: Diamond-rich area
• 1332cm-1 diamond band component
– Bottom image: Graphitic-rich region• G and D bands graphite components
• Details– 110 µm _ 110 µm area
– 10,000 spectra
– 10 minutes
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Si-Ge cross hatch
• Semiconductor sample– SiGe layer deposited onto substrate– Graded layer with increasing
germanium content towards layersurface
– Crosshatch structure is notengineered
– Pattern is generated a mechanismfor strain relief
• Map shows:– Variation in Si-Si 510 cm-1 band
position (~ 0.2 cm-1 positional bandshift)
• Details– 55,000 spectra– 13 minutes– 0.5 micrometer resolution– 532 nm excitation
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Carbon nanotube lattice structures
SWNT Raman spectrum
MWT
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If the wavelength of the laser is close to an excited electronic state of a bond in molecule, i.e. where it is strongly absorbed or fluoresces, the signal enhancement can be increased by a factor between 100 and 10,000.
Resonance Raman
Advantage: You can select a wavelength to enhance the sensitivity toa particular type of bond or vibrations.
Potential disadvantages: increased fluorescence increase absorption/heating
In the study of carbon nanotubes multiple laserwavelengths are used to increase sensitivity tospecific vibrational modes within a molecule.
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0
.2
.4
.6
.8
1
Cou
nts
500 1000 1500 2000 Raman Shift (cm-1)Time: 10secs
File # 1 : RICE(8)C
Solid Film Laser: 12834.5cm-1
244 nm and 780 nm excited Raman spectra of nanotubes
244 nm
RBMC-C
Resonance Raman spectroscopy of SWNT
Since the Raman spectral measurment for nano-tubes is typically a resonance Raman measurementthe excitation wavelength can dramatically affect the spectral feature intensity and shift.
785 nm
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Resonance Raman of SWINTs
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500 1000 1500 2000 2500 3000 3500
Raman shift / cm-1
0
5000
10000
15000
20000
25000
Cou
nts
514 nm excited and 488 nm excited Raman spectra MWNT material
Raman spectroscopy of MWNT
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Raman and Fraud
Lewis, I. R.; Edwards, H. G. M., Lewis, I. R.; Edwards, H. G. M., Handbook of Raman Spectroscopy: From the Research Laboratory to theHandbook of Raman Spectroscopy: From the Research Laboratory to theProcess Line, Process Line, Marcel Dekker, New York: 2001.0Marcel Dekker, New York: 2001.0
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Ivory or Plastic?
Lewis, I. R.; Edwards, H. G. M., Lewis, I. R.; Edwards, H. G. M., Handbook of Raman Spectroscopy: From the ResearchHandbook of Raman Spectroscopy: From the ResearchLaboratory to the Process Line, Laboratory to the Process Line, Marcel Dekker, New York: 2001.Marcel Dekker, New York: 2001.
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The Vinland Map: Genuine or Forged?
Brown, K. L.; Clark, J. H. R., Brown, K. L.; Clark, J. H. R., Anal. Chem. Anal. Chem. 20022002, 74,, 74,3658.3658.
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The Vinland Map: Forged!
Brown, K. L.; Clark, J. H. R., Brown, K. L.; Clark, J. H. R., Anal. Chem. Anal. Chem. 20022002, 74,, 74,3658.3658.
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Surface-Enhanced Raman Scattering (SERS)
Haynes, McFarland, and Van Duyne, Anal. Chem.,77, 338A-346A (2005).
SERS: Surface Enhanced Raman Scattering
Discovered in 1977, Jeanmire et al. & Albrecht et al.
--Strongly increased Raman signals from molecules attachedto metal nanostructures
--SERS active substrates: metallic structures with sizeabout 10--100 nm (e.g. colloidal Ag, Au, roughened surfaces)
General contributions:
1)Electromagnetic field enhancement
2) Chemical ‘first layer’ effect
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SERS Enhancement Mechanisms
Chemical Mechanism:Laser excites (a) new electronic states arising fromchemisorption or (b) shifted or broadened adsorbateelectronic states yielding a resonance condition.
• Short range (1-5 Å)• No roughness requirement• Contributes EF ~ 102 – 104
Electromagnetic Mechanism:LSPR induces large electromagnetic fields at roughenedmetal surface where molecules are adsorbed.
• Long range (2-4 nm)• Affected by all factors determining LSPR• Contributes EF > 104
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Localized Surface Plasmon Resonance
The resonance results in (1) wavelength-selective extinction and (2) enhanced EMfields at the surface.
Spectral location of the LSPR is dependent upon particle size, shape, composition,and dielectric environment.
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Localized Surface Plasmon Resonance
Non-resonant Resonant
1) Resonant λ is absorbed2) EM fields localized at nanoparticle surface
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Nanostructured Substrates
http://pubs.acs.org/cgi-bin/article.cgi/ancham-a/0000/77/i17/pdf/905feature_vanduyne.pdfhttp://pubs.acs.org/cgi-bin/article.cgi/ancham-a/0000/77/i17/pdf/905feature_vanduyne.pdf
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Commercial SERS Substrates
D3 produces the Klarite range of substrates for SurfaceEnhanced Raman Spectroscopy. Klarite substrates enable faster,higher accuracy detection of biological and chemical samples atlower detection limits for a wide range of applications inhomeland security, forensics, medical diagnostics andpharmaceutical drug discovery. Manufactured using techniquesfrom semiconductor processing Klarite substrates offer highlevels of enhancement and reliability.
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References
Raman Microscopy: Developments and ApplicationsRaman Microscopy: Developments and Applications, G., G. Turrell Turrell, J. Corset,, J. Corset, eds eds. (Elsevier Academic Press,. (Elsevier Academic Press,1996)1996)
Introductory Raman SpectroscopyIntroductory Raman Spectroscopy, J.R. Ferraro, K., J.R. Ferraro, K. Nakamoto Nakamoto, C.W. Brown, Academic Press, 2003., C.W. Brown, Academic Press, 2003.
Raman Spectroscopy for Chemical AnalysisRaman Spectroscopy for Chemical Analysis, R.L., R.L. McCreery McCreery (Wiley (Wiley Interscience Interscience, 2000)., 2000).
Handbook of Raman SpectroscopyHandbook of Raman Spectroscopy, I.R. Lewis, H.G.M. Edwards,, I.R. Lewis, H.G.M. Edwards, eds eds. (Marcel. (Marcel Dekker Dekker, 2001), 2001)
Raman Technology for TodayRaman Technology for Today’’ss Spectroscopists Spectroscopists, 2004 Technology primer, Supplement to Spectroscopy, 2004 Technology primer, Supplement to Spectroscopymagazine.magazine.
FT Raman spectroscopy, P. Hendra et al., Ellis Horwood.
Raman and IR spectroscopy in biology and chemistry, J. Twardowski and P. Anzenbacher, Ellis Horwood.
Ch 18 in Skoog, Holler, Nieman, Principles of Instrumental Analysis, Saunders.
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Raman Websites and On-Line Databases
www.spectroscopynow.com/coi/cda/landing.cda?chId=6&type=Education(many links including,An Introduction to Raman Spectroscopy: Introduction and Basic Principles, by J. Javier Laserna,)
Database:http://wwwobs.univ-bpclermont.fr/sfmc/ramandb2/index.html
Vendors:http://www.renishaw.comhttp://www.optics.bruker.com/http://www.nicolet.com/http://www.jobinyvon.com