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  • Document No. 001-53357 Rev. *H Page 1 of 2

    Cypress Semiconductor Corporation, 198 Champion Court, San Jose, CA 95134. Tel: (408) 943-2600

    PRODUCT CHANGE NOTIFICATION

    PCN: PCN182408 Date: June 17, 2018 Subject: Qualification of Fab 25 with the Copper (Cu) BEOL Process for the EZ-PDTM CCG4 (PD2) USB Type-C PD Controller Product Family To: PCN ALERTS MOUSER [email protected] Change Type: Major Description of Change: Cypress announces the qualification of Fab 25 in Austin, Texas with the Copper (Cu) Backend of Line (BEOL) process for the EZ-PDTM CCG4 (PD2) USB Type-C Power Delivery (PD) Controller product family. The Aluminum (Al) BEOL process uses Tungsten (W) plugs and Ti/TiN/Al metallization with subtractive patterning to create the metal interconnect layers. The Cu BEOL process converts the underlying metal interconnect layers from W plugs to Cu plugs and from Ti/TiN/Al metallization with subtractive patterning to Cu damascene with Ta/TaN barriers. This qualification is part of the flexible manufacturing initiative which allows Cypress to meet its delivery commitments in dynamic and changing market conditions. Benefit of Change: Qualification of alternate manufacturing sites is part of the ongoing flexible manufacturing initiative announced by Cypress. The goal of the flexible manufacturing initiative is to provide the means for Cypress to continue to meet delivery commitments through dynamic, changing market conditions. Part Numbers Affected: 6 See the attached Affected Parts List file for a list of all part numbers affected by this change. Note that any new parts that are introduced after the publication of this PCN will include all changes outlined in this PCN.

  • Document No. 001-53357 Rev. *H Page 2 of 2

    Qualification Status: This wafer fab site has been qualified through a series of tests documented in the Qualification Test Plan QTP#174802. This qualification report can be found as an attachment to this PCN or by visiting www.cypress.com and typing the QTP number in the keyword search window. Sample Status: Qualification samples may not be built ahead of time for all part numbers affected by this change. Please review the attached Affected Parts List file for a list of affected part numbers with their associated Fab 25 Cu BEOL sample ordering part numbers. Samples are available now unless there is an indication that the sample ordering part numbers are subject to lead times. If you require qualification samples, please contact your local Cypress sales representative as soon as possible, preferably within 30 days of the date of this PCN, to place any sample orders. Approximate Implementation Date: Effective 90 days from the date of this notification or upon customer approval, whichever comes first, all shipments of Commercial, Industrial and Automotive non-PPAP part numbers in the attached file will be supplied Fab 25 with Cu BEOL or Al BEOL process or other approved wafer fabrication sites. Anticipated Impact: Products fabricated at the new site are completely compatible with existing products from form, fit, functional, parametric and quality performance perspectives. Cypress also recommends that customers take this opportunity to review these changes against current application notes, system design considerations and customer environment conditions to assess impact (if any) to their application. Method of Identification: Cypress maintains traceability of product to wafer level, including wafer fabrication location, through the lot number marked on the package. Response Required: No response is required. For additional information regarding this change, contact your local sales representative or contact the PCN Administrator at [email protected]. Sincerely, Cypress PCN Administration

    http://www.cypress.com/mailto:[email protected]
  • Company Confidential A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 1 of 18

    Cypress Semiconductor Corporation EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller

    FAB25 Cu Material Characterization Report

    Design Engineering Director Murtuza Lilamwala [email protected]

    Product Engineering Director

    Jeffrey Kooiman [email protected]

    Product Engineer Swanand Phadke [email protected]

    Applications Engineer

    Palaniappan (Palani) Subbiah [email protected]

    Marketing Engineer

    Ganesh Subramaniam [email protected]

    www.cypress.com

    198 Champion Ct

    San Jose, CA 95134 USA

    Tel: (408) 943 2600 Fax: (408) 943 4730

    mailto:[email protected]:[email protected]:[email protected]:[email protected]:[email protected]://www.cypress.com/
  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

    Document No. 002-23442 Rev. **

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    Page 2 of 18

    1.0 Table of Contents

    1.0 Table of Contents .......................................................................................................................................................... 2

    2.0 Introduction ................................................................................................................................................................... 3

    3.0 Characterization Hardware and Setup ........................................................................................................................ 4

    3.1 Characterization Hardware .......................................................................................................................................... 4

    Temperature Forcing System .............................................................................................................................................. 4

    Temptronic TPO4310A Precision Temperature Forcing System was used to force ambient/industrial operating temperatures of -40C, 25C and 105C .................................................................................................................................. 4

    Power Supply......................................................................................................................................................................... 4

    Agilent E3631A was used to source operating device power supply voltages. Keithley-2400 was used to force voltage and current. .............................................................................................................................................................. 4

    Digital Multimeter .................................................................................................................................................................. 4

    Agilent 34411A/3458 was used to measure voltages at 6.5/8.5 digit resolution ............................................................. 4

    Clock Input ............................................................................................................................................................................. 4

    Agilent 33250A Function Generator was used to provide clock signal .......................................................................... 4

    Oscilloscope .......................................................................................................................................................................... 4

    ATE Tester ............................................................................................................................................................................. 5

    Nextest Magnum1 and Advantest 93K were used for all ATE tested parameters .......................................................... 5

    4.0 Characterization Results .............................................................................................................................................. 6

    4.1 Absolute Maximum Ratings: ........................................................................................................................................ 6

    Document History : ............................................................................................................................................................. 18

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    2.0 Introduction

    2.1 General Description

    EZ-PD CCG4 is a dual USB Type-C controller that complies with Revision 2.0 of the Power Delivery specification and Revision 1.2 of the USB Type-C specification. . EZ-PD CCG4 provides a complete dual USB Type-C and USB-Power Delivery port control solution for notebooks, power adapters and docking stations. It can also be used in dual role and downstream facing port applications. EZ-PD CCG4 uses Cypresss proprietary M0S8 technology with a 32-bit, 48-MHz ARM Cortex-M0 processor with 128 KB flash and integrates two complete Type-C Transceivers including the Type-C termination resistors RP and RD.

    Key Features:

    Integrated dual Type-C+PD controller Integrated UFP (RD) and current sources for DFP (RP) on both Type-C ports Integrated dead battery termination for DRP (Power Source/Sink) applications Integrated VCONN FETs to power EMCA cables

    Figure 1. CCG4 Logic Block Diagram

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    2.2 Datasheet

    Datasheet is available here : http://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controller

    2.3 Application Notes

    The following are the Application Notes related to CYPD4xxxx.

    AN210403 - Hardware Design Guidelines for Dual Role Port Applications Using EZ-PD USB Type-C Controllers : http://www.cypress.com/file/234156/download

    AN210771 - Getting Started with EZ-PD CCG4 : http://www.cypress.com/file/283881/download

    2.4 White Papers

    The CYPD4xxxx has no associated White Papers at this time.

    2.5 Qualification Report

    Not available at this time. Qualification is in progress.

    3.0 Characterization Hardware and Setup

    3.1 Characterization Hardware

    Temperature Forcing System

    Temptronic TPO4310A Precision Temperature Forcing System was used to force ambient/industrial operating temperatures of -40C, 25C and 105C

    Power Supply

    Agilent E3631A was used to source operating device power supply voltages. Keithley-2400 was used to force voltage and current.

    Digital Multimeter

    Agilent 34411A/3458 was used to measure voltages at 6.5/8.5 digit resolution

    Clock Input

    Agilent 33250A Function Generator was used to provide clock signal

    Oscilloscope

    Tektronix DPO 7254 Digital Phosphor Oscilloscope was used to verify IMO oscillator frequency on bench.

    http://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controllerhttp://www.cypress.com/documentation/datasheets/ez-pd-ccg4-datasheet-usb-type-c-port-controllerhttp://www.cypress.com/documentation/application-notes/an210403-hardware-design-guidelines-dual-role-port-applicationshttp://www.cypress.com/documentation/application-notes/an210403-hardware-design-guidelines-dual-role-port-applicationshttp://www.cypress.com/file/234156/downloadhttp://www.cypress.com/documentation/application-notes/an210771-getting-started-ez-pd-ccg4http://www.cypress.com/file/283881/download
  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    ATE Tester

    Nextest Magnum1 and Advantest 93K were used for all ATE tested parameters

    3.2 Characterization Conditions and Parameters

    Characterization was done on the following parts and conditions as listed in Table 1. Units were built using 40 QFN standard production package and chosen randomly unless specified.

    Table 1. Characterization Conditions and Parameters

    Device Package Supply Voltage (V) Temperature (C)

    CYPD4125-40LQXIT 40 QFN VDDD=2.7-5.5V, VDDIO =1.71-5.5V, V5V=4.85-5.5V -40, 25, 105

    CYPD4225-40LQXIT 40 QFN VDDD=2.7-5.5V, VDDIO =1.71-5.5V, V5V=4.85-5.5V -40, 25, 105

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    4.0 Characterization Results

    4.1 Absolute Maximum Ratings:

    Spec ID

    Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    - VDDD_MAX Digital supply relative

    to VSS Absolute max -0.5 - 6 V -0.5 - 6 -0.5 - 6

    - V5V_P1 Max supply voltage

    relative to VSS Absolute max - - 6 V - - 6 - - 6

    - V5V_P2 Max supply voltage

    relative to VSS Absolute max - - 6 V - - 6 - - 6

    - VDDIO_MAX Max supply voltage

    relative to VSS Absolute max - - 6 V - - 6 - - 6

    - VGPIO_ABS GPIO voltage Absolute max -0.5 - VDDIO + 0.5 V -0.5 - VDDIO + 0.5 -0.5 - VDDIO + 0.5

    - IGPIO_ABS Maximum current per

    GPIO Absolute max -25 - 25 mA -25 - 25 -25 - 25

    - IGPIO_injection GPIO injection current, Max for VIH> VDDD,

    and Min for VIL < VSS

    Absolute max, current injected per

    pin -0.5 - 0.5 mA -0.5 - 0.5 -0.5 - 0.5

    - LU Pin current for latch-up - -200 - 200 mA -200 - 200 -200 - 200

    - ESD_IEC_CON Electrostatic discharge

    IEC61000-4-2 Contact discharge on CC1, CC2 pins

    8000 - - V - - 8000 - - 8000

    - ESD_IEC_AIR Electrostatic discharge

    IEC61000-4-2 Air discharge for pins CC1, CC2

    15000 - - V - - 15000 - - 15000

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    4.2 DC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.PWR#1 VDDD Power supply input

    voltage UFP applications 2.7 - 5.5 V 2.7 - 5.5 2.7 - 5.5

    SID.PWR#1_A VDDD Power supply input

    voltage DFP/DRP applications 3.15 - 5.5 V 3.15 - 5.5 3.15 - 5.5

    SID.PWR#26 V5V_P1, V5V_P2

    Power supply input voltage

    - 4.85 - 5.5 V 4.85 - 5.5 4.85 - 5.5

    PWR#13 VDDIO GPIO power supply - 1.71 - 5.5 V 1.71 - 5.5 1.71 - 5.5

    SID.PWR#24 VCCD Output voltage (for core

    logic) - - 1.8 - V 1.78 1.80 1.82 1.79 1.82 1.85

    SID.PWR#15 CEFC External regulator voltage bypass on

    VCCD X5R ceramic or better 80 100 120 nF 80 100 120 80 100 120

    SID.PWR#16 CEXC Power supply

    decoupling capacitor on VDDD

    X5R ceramic or better 0.8 1 - F 0.8 1 - 0.8 1 -

    SID.PWR#27 CEXV Power supply

    decoupling capacitor on V5V_P1 and V5V_P2

    X5R ceramic or better - 0.1 - F - 0.1 - - 0.1 -

    Active Mode, VDDD = 2.7 to 5.5 V. Typical values measured at VDD = 3.3 V.

    SID.PWR#4 IDD12 Supply current

    V5V_P1 and V5V_P2 = 5 V, TA = 25 C, CC I/O IN Transmit or Receive, no I/O sourcing current, CPU at 24 MHz, two PD

    ports active

    -10 - 10 mA 5.53 5.65 5.92 5.45 5.71 6.22

    Sleep Mode, VDDD = 2.7 to 5.5 V

    SID25A IDD20A I2C wakeup WDT ON

    IMO at 48 MHz

    VDDD = 3.3 V, TA = 25 C, all blocks except CPU are ON, CC I/O ON, no I/O sourcing

    current

    - 2.5 4 mA 1.92 1.97 2.05 1.90 1.97 2.40

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    Deep Sleep Mode, VDDD = 2.7 to 3.6 V (Regulator on)

    SID34 IDD29 VDDD = 2.7 to 3.6 V I2C

    wakeup and WDT ON VDDD = 3.3 V, TA = 25

    C - 80 - A 48.75 55.23 111.06 56.38 74.21 177.81

    SID_DS IDD_DS VDDD = 2.7 to 3.6 V CC

    wakeup ON

    Power source = VDDD, Type-C not attached,

    CC enabled for wakeup, RP disabled

    - 2.5 - A 0.85 1.88 34.90 1.43 6.24 28.73

    SID_DS1 IDD_DS1 VDDD = 2.7 to 3.6 V

    CC wakeup ON

    Power source = VDDD, Type-C not attached,

    CC enabled for wakeup, RP and RD connected at 70 ms intervals by CPU. RP,RD connection

    should be enabled for both PD ports.

    - 100 - A 49.86 62.16 73.20 55.00 59.54 65.00

    XRES Current

    SID307 IDD_XR Supply current while

    XRES asserted - - 1 10 A 0.23 0.34 0.82 0.22 1.04 1.77

    4.3 AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.CLK#4 FCPU CPU frequency 3.0 V

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    4.4 I/O DC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.GIO#37 VIH Input voltage HIGH

    threshold CMOS input 0.7 VDDIO - - V 0.46 0.53 0.63 0.44 0.55 0.67

    SID.GIO#38 VIL Input voltage LOW

    threshold CMOS input - - 0.3 VDDIO V 0.35 0.40 0.45 0.35 0.37 0.41

    SID.GIO#39 VIH LVTTL input, VDDIO <

    2.7 V - 0.7 VDDIO - - V 0.50 0.52 0.55 0.51 0.58 0.67

    SID.GIO#40 VIL LVTTL input, VDDIO <

    2.7 V - - - 0.3 VDDIO V 0.41 0.43 0.44 0.41 0.44 0.46

    SID.GIO#41 VIH LVTTL input, VDDIO >=

    2.7 V - 2 - - V 1.30 1.81 1.93 1.24 1.85 1.89

    SID.GIO#42 VIL LVTTL input, VDDIO >=

    2.7 V - - - 0.8 V 1.15 1.67 1.81 1.09 1.66 1.79

    SID.GIO#33 VOH Output voltage HIGH

    level IOH = 4 mA at 3-V

    VDDIO VDDIO 0.6 - - V 3.07 3.11 3.14 3.04 3.11 3.23

    SID.GIO#34 VOH Output voltage HIGH

    level IOH = 1 mA at 1.8-V

    VDDIO VDDIO 0.5 - - V 1.70 1.71 1.73 1.67 1.72 1.70

    SID.GIO#35 VOL Output voltage LOW

    level IOL = 4 mA at 1.8-V

    VDDIO - - 0.6 V 0.08 0.09 0.12 0.08 0.11 0.15

    SID.GIO#36 VOL Output voltage LOW

    level IOL = 8 mA at 3 V

    VDDIO - - 0.6 V 0.11 0.16 0.27 0.11 0.15 0.22

    SID.GIO#5 RPULLUP Pull-up resistor - 3.5 5.6 8.5 k 3.62 5.01 5.55 4.59 4.88 5.63

    SID.GIO#6 RPULLDOWN Pull-down resistor - 3.5 5.6 8.5 k 4.69 5.00 5.50 4.50 4.80 5.53

    SID.GIO#16 IIL Input leakage current

    (absolute value) 25 C, VDDIO = 3.0 V - - 2 nA

    Guaranteed by Design

    Guaranteed by Design

    SID.GIO#17 CIN Input capacitance - - - 7 pF 1.82 2.13 3.45 2.12 2.36 3.63

    SID.GIO#43 VHYSTTL Input hysteresis LVTTL VDDIO >= 2.7 V. Guaranteed by

    characterization. 25 40 - mV 89.10 142.36 200.07 52.80 151.00 217.00

    SID.GPIO#44 VHYSCMOS Input hysteresis CMOS Guaranteed by characterization

    0.05 VDDD - - mV 0.11 0.14 0.21 0.10 0.15 0.23

    SID69 IDIODE Current through

    protection diode to VDDIO/Vss

    Guaranteed by Design

    - - 100 A

    Guaranteed by Design

    Guaranteed by Design

    SID.GIO#45 ITOT_GPIO Maximum total source or

    sink chip current Guaranteed by

    Design - - 85 mA

    Guaranteed by Design

    Guaranteed by Design

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    4.5 I/O AC Specifications

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID70 TRISEF Rise time in Fast Strong

    mode 3.3-V VDDIO, Cload=25

    pF 2 - 12 ns 4.74 5.00 5.13 2.39 3.36 4.72

    SID71 TFALLF Fall time in Fast Strong

    mode 3.3-V VDDIO, Cload=25

    pF 2 - 12 ns 2.94 4.20 4.24 2.89 3.37 3.94

    4.6 XRES DC Specifications

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.XRES#1 VIH Input voltage

    HIGH threshold CMOS input 0.7 VDDIO - - V 0.54 0.55 0.61 0.53 0.57 0.62

    SID.XRES#2 VIL Input voltage

    LOW threshold CMOS input - - 0.3 VDDIO V 0.41 0.48 0.50 0.42 0.48 0.50

    SID.XRES#3 CIN Input capacitance - - - 7 pF 1.28 1.31 1.33 1.32 1.33 1.34

    SID.XRES#4 VHYSXRES Input voltage

    hysteresis Guaranteed by characterization

    - - 0.05 VDDIO mV 0.07 0.07 0.19 0.07 0.13 0.20

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    4.7 Digital Peripherals:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.TCPWM.3 TCPWMFREQ Operating frequency Fc max = CLK_SYS. Maximum = 48 MHz.

    - Fc - MHz - Fc - - Fc -

    SID.TCPWM.4 TPWMENEXT Input trigger pulse

    width For all trigger events - 2/Fc - ns - 2/Fc - - 2/Fc -

    SID.TCPWM.5 TPWMEXT Output trigger pulse

    width

    Minimum possible width of Overflow, Underflow, and CC

    (Counter equals Compare value)

    outputs

    - 2/Fc - ns - 2/Fc - - 2/Fc -

    SID.TCPWM.5A TCRES Resolution of counter Minimum time between

    successive counts - 1/Fc - ns - 1/Fc - - 1/Fc -

    SID.TCPWM.5B PWMRES PWM resolution Minimum pulse width

    of PWM output - 1/Fc - ns - 1/Fc - - 1/Fc -

    SID.TCPWM.5C QRES Quadrature inputs

    resolution

    Minimum pulse width between quadrature-

    phase inputs - 1/Fc - ns - 1/Fc - - 1/Fc -

    4.8 Fixed I2C AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID153 FI2C1 Bit rate - - - 1 Mbps 1.51 1.91 1.98 1.45 1.87 1.97

    4.9 Fixed UART AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID162 FUART Bit rate - - - 1 Mbps 1.46 1.89 2.42 1.46 1.85 2.40

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    4.10 Fixed SPI AC Specifications:

    Spec ID Parameter Description Details/Conditions

    Datasheet

    Units

    SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID166 FSPI SPI operating frequency

    (Master; 6X oversampling) - - - 8 MHz 10.34 12.25 12.70 10.85 12.09 13.06

    4.11 Fixed SPI Master Mode AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID167 TDMO MOSI valid after Sclock

    driving edge - - - 15 ns 4.65 6.04 7.16 4.25 6.18 7.94

    SID168 TDSI MISO valid before

    Sclock capturing edge - 20 - - ns -52.73 -47.54 -22.02 -51.76 -40.40 -23.89

    SID169 THMO Previous MOSI data

    hold time - 0 - - ns 52.39 55.05 57.01 50.44 54.38 58.95

    4.12 Fixed SPI Slave Mode AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID170 TDMI MOSI valid before Sclock

    capturing edge - 40 - - ns -0.96 0.24 0.65 -1.09 0.19 1.06

    SID171 TDSO MISO valid after Sclock

    driving edge TSCB = TCPU =

    1/24 MHz - - 48 + 3 * TSCB ns 77.01 81.46 102.88 77.81 86.41 101.08

    SID171A TDSO_EXT MISO valid after Sclock

    driving edge in Ext Clk mode - - - 48 ns 11.23 20.93 34.85 10.84 22.06 39.78

    SID172 THSO Previous MISO data hold

    time - 0 - - ns 11.26 20.93 34.88 10.86 22.06 39.83

    SID172A TSSELSCK SSEL valid to first SCK valid

    edge - 100 - - ns 0.17 1.32 2.46 0.11 1.29 2.41

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    4.13 Flash AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.MEM#4 TROWWRITE Row (block) write time (erase and

    program) - - - 20 ms Guaranteed by Design Guaranteed by Design

    SID.MEM#3 TROWERASE Row erase time - - - 13 ms Guaranteed by Design Guaranteed by Design

    SID.MEM#8 TROWPROGRAM Row program time

    after erase - - - 7 ms Guaranteed by Design Guaranteed by Design

    SID178 TBULKERASE Bulk erase time (128

    KB) - - - 35 ms Guaranteed by Design Guaranteed by Design

    SID180 TDEVPROG Total device program

    time Guaranteed by Design - - 25 seconds Guaranteed by Design Guaranteed by Design

    SID.MEM#6 FEND Flash endurance Guaranteed by characterization

    100K - - cycles Qual Qual

    SID182 FRET1 Flash retention. TA

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    4.15 Precise Power On Reset (POR):

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID190 VFALLPPOR BOD trip voltage in active

    and sleep modes Guaranteed by characterization

    1.48 - 1.62 V 1.54 1.58 1.59 1.55 1.56 1.57

    SID192 VFALLDPSLP BOD trip voltage in Deep

    Sleep Guaranteed by characterization

    1.1 - 1.5 V 1.26 1.27 1.32 1.26 1.27 1.30

    4.16 SWD Interface Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.SWD#1 F_SWDCLK1 3.3V

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

    Document No. 002-23442 Rev. **

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    Page 15 of 18

    4.17 IMO AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.CLK#13 FIMOTOL Frequency variation

    at 24, 36, and 48 MHz (trimmed)

    - - 2 % -0.16 -0.07 0.003 -0.16 -0.06 0.04

    SID226 TSTARTIMO IMO start-up time - - 7 s 1.72 2.26 2.66 2.92 3.15 3.40

    SID229 TJITRMSIMO RMS jitter at 48 MHz - 145 - ps 50.42 68.77 100.43 96.90 232.00 363.00

    FIMO - IMO frequency 24 - 48 MHz Verified at 48 MHz

    Verified at 48 MHz

    4.18 ILO AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID234 TSTARTILO1 ILO startup time Guaranteed by

    characterization. - - 2 ms 0.01 0.015 0.02 0.001 0.01 0.02

    SID236 TILODUTY ILO duty cycle Guaranteed by

    characterization. 40 50 60 %

    Guaranteed by Design

    Guaranteed by Design

    SID.CLK#5 FILO ILO frequency - 20 40 80 kHz 35.84 47.36 56.18 34.56 45.79 61.44

    4.19 PD DC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.PD.1 Rp_std DFP CC termination for default

    USB Power 64 80 96 A 73.94 83.19 94.73 76.59 82.89 91.36

    SID.PD.2 Rp_1.5A DFP CC termination for 1.5A

    power 166 180 194 A 167.02 177.18 183.41 169.10 176.23 191.78

    SID.PD.3 Rp_3.0A DFP CC termination for 3.0A

    power 304 330 356 A 328.13 329.26 330.25 311.75 320.67 345.75

    SID.PD.4 Rd UFP CC termination 4.59 5.1 5.61 k 4.64 5.01 5.29 4.70 4.98 5.43

    SID.PD.5 Rd_DB UFP Dead Battery CC

    Termination on CC1 and CC2 All supplies forced to 0V and 1.32 V applied at CC1 or CC2

    4.08 5.1 6.12 k 4.93 5.12 5.42 4.45 4.75 5.18

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    Page 16 of 18

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.PD.15 Vdrop_V5V_CC1

    Voltage drop from V5V_P1 and V5V_P2 pins to CC1 pin while sourcing

    215 mA. CC1 and CC2 pins of Port1 and Port2 are not short circuit

    protected. Max sourcing current allowed is 500 mA.

    - - - 100 mV 38.22 49.65 58.36 25.50 28.31 31.50

    SID.PD.16 Vdrop_V5V_CC2

    Voltage drop from V5V_P1 and V5V_P2 pins to CC2 pin while sourcing

    215 mA. CC1 and CC2 pins of Port1 and Port2 are not short circuit

    protected. Max sourcing current allowed is 500 mA.

    - - - 100 mV 38.69 47.87 57.89 26.00 29.07 50.00

    4.20 ADC DC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.ADC.1 Resolution ADC resolution - - 8 - bits Verified for 8Bits Verified for 8Bits

    SID.ADC.2 INL Integral nonlinearity - -1.5 - 1.5 LSB -0.28 0.02 0.37 -0.30 0.01 0.48

    SID.ADC.3 DNL Differential nonlinearity

    - -2.5 - 2.5 LSB -0.37 0.04 0.82 -0.37 0.04 0.78

    SID.ADC.4 Gain Error Gain error - -1 - 1 LSB -0.12 0.01 0.08 -0.11 0.001 0.09

    4.21 ADC AC Specifications:

    Spec ID Parameter Description Details/Conditions Datasheet

    Units

    SKYWATER Al FAB25 Cu

    Min Typ Max Min Typ Max Min Typ Max

    SID.ADC.7 SLEW_Max Rate of change of

    sampled voltage signal - - - 3 V/ms Guaranteed by Design Guaranteed by Design

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

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    Page 17 of 18

    5.0 Eye Diagram Measurements for USB-PD BMC Compliance:

    Note: USBPD-CCG4 EYE DIAGRAM for Typical unit at 25c, Voltage 3.3V, Internal Rp Trim and External Rd - 5.1K

  • EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller FAB25 Cu Material Characterization report

    Document No. 002-23442 Rev. **

    Sales, Solutions, and Legal Information

    Worldwide Sales and Design Support

    Cypress maintains a worldwide network of offices, solution centers, manufacturers representatives, and distributors. To find the office closest to you, visit us at cypress.com/sales.

    Products

    PSoC psoc.cypress.com Clocks & Buffers clocks.cypress.com Wireless wireless.cypress.com Memories memory.cypress.com Image Sensors image.cypress.com

    PSoC Solutions

    General psoc.cypress.com/solutions Low Power/Low Voltage psoc.cypress.com/low-power Precision Analog psoc.cypress.com/precision-analog LCD Drive psoc.cypress.com/lcd-drive CAN 2.0b psoc.cypress.com/can USB psoc.cypress.com/usb

    Cypress Semiconductor Corporation, 2018. The information contained herein is subject to change without notice. Cypress Semiconductor Corporation assumes no responsibility for the use of any circuitry other than circuitry embodied in a Cypress product. Nor does it convey or imply any license under patent or other rights. Cypress products are not warranted nor intended to be used for medical, life support, life saving, critical control or safety applications, unless pursuant to an express written agreement with Cypress. Furthermore, Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress products in life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Any Source Code (software and/or firmware) is owned by Cypress Semiconductor Corporation (Cypress) and is protected by and subject to worldwide patent protection (United States and foreign), United States copyright laws and international treaty provisions. Cypress hereby grants to licensee a personal, non-exclusive, non-transferable license to copy, use, modify, create derivative works of, and compile the Cypress Source Code and derivative works for the sole purpose of creating custom software and or firmware in support of licensee product to be used only in conjunction with a Cypress integrated circuit as specified in the applicable agreement. Any reproduction, modification, translation, compilation, or representation of this Source Code except as specified above is prohibited without the express written permission of Cypress. Disclaimer: CYPRESS MAKES NO WARRANTY OF ANY KIND, EXPRESS OR IMPLIED, WITH REGARD TO THIS MATERIAL, INCLUDING, BUT NOT LIMITED TO, THE IMPLIED WARRANTIES OF MERCHANTABILITY AND FITNESS FOR A PARTICULAR PURPOSE. Cypress reserves the right to make changes without further notice to the materials described herein. Cypress does not assume any liability arising out of the application or use of any product or circuit described herein. Cypress does not authorize its products for use as critical components in life-support systems where a malfunction or failure may reasonably be expected to result in significant injury to the user. The inclusion of Cypress product in a life-support systems application implies that the manufacturer assumes all risk of such use and in doing so indemnifies Cypress against all charges. Use may be limited by and subject to the applicable Cypress software license agreement. All products and company names mentioned in this document may be the trademarks of their respective holders.

    Company Confidential A printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 18 of 18

    Document History :

    Rev. ECN No. Orig. of

    Change Description of Change

    ** 6107989 RADK EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller

  • Document No. 002-24165 Rev. **ECN #: 6199884

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    Page 1 of 31

    Cypress SemiconductorProduct Qualification Report

    QTP# 174802 VERSION**June 2018

    EZ-PDTM CCG4 (PD2) USB Two-Port Type-C PD Controller Device Family

    S8SPR1 Technology, Fab 25 (Cu BEOL Interconnect)

    CYPD4125**

    EZ-PD CCG4 (PD2) Dual USB Type-C Controller

    CYPD4225**

    FOR ANY QUESTIONS ON THIS REPORT, PLEASE [email protected] or via a CYLINK CRM CASE

    Prepared By:Josephine Pineda (JYF)

    Reviewed By:Sandhya Chandrashekhar (SANC)

    Staff Reliability Engineer Principal Reliability Engineer

    Approved By:David Hoffman (DHH)

    Reliability Director

    mailto:[email protected]
  • Document No. 002-24165 Rev. **ECN #: 6199884

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    Page 2 of 31

    PRODUCT QUALIFICATION HISTORY

    QTPNumber

    Description of Qualification Purpose Date

    151008Qualification of S8* Technology in Fab 25 Using TrueTouch Gen6MTouchscreen Controller Device

    Dec. 2015

    151303 Qualification of CapSense MBR3 Device, S8PF-10R Technology in Fab 25 Dec. 2015

    160401 Qualification of TrueTouch Fingerprint Device, S8PFHD-10R Technology in Fab 25 May 2016

    160301Qualification of TrueTouch Gen6XL Touchscreen Controller Device,S8SPF-10P Technology in Fab 25

    June 2016

    160803 Qualification of PSoC 4000S Device, S8PFHD-10R Technology in Fab 25 June 2016

    160207 Qualification of PSoC 3 Device, S8P12-10P Technology in Fab 25 July 2016

    161003Qualification of EZ-PDTM CCG1 USB Type-C PD Controller Device,S8PF-10R Technology in Fab 25

    March 2016

    160809Qualification of EZ-PDTM CCG2 USB Type-C PD Controller Device,S8PR2-10R Technology in Fab 25

    Aug. 2016

    164802Qualification of EZ-PDTM CCG2 USB Type-C PD Controller Device,S8PR1-10/S8PHR-10R Technology in Fab 25

    Sept. 2017

    163301Qualification of EZ-PDTM CCG3 USB Type-C PD Controller Device,S8SPF-20/S8SPF20-NP Technology in Fab 25 (Al BEOL Interconnect)

    June 2017

    164302Qualification of EZ-PDTM CCG3 USB Type-C PD Controller Device,S8SPF-20/S8SPF20-NP Technology in Fab 25 (Cu BEOL Interconnect)

    Nov.2017

    162113Qualification of EZ-PDTM CCG4 USB Two-Port Type-C PD Controller Device,S8SPR1P Technology in Fab 25 (Al BEOL Interconnect)

    March 2017

    174801Qualification of EZ-PD TM CCG4 (PD3) USB Two-Port Type-C PD Controller Device,S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)

    Feb. 2018

    174802Qualification of EZ-PD TM CCG4 (PD2) USB Two-Port Type-C PD Controller Device,S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)

    June 2018

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    Page 3 of 31

    PRODUCT DESCRIPTION (for qualification)

    Qualification Purpose: To qualify EZ-PD TM CCG4 (PD2) USB Two-Port Type-C PD Controller Device,

    S8SPR1 Technology in Fab 25 (Cu BEOL Interconnect)

    Marketing Part #: CYPD4125**/ CYPD4225**

    Device Description: EZ-PD CCG4 (PD2) Dual USB Type-C Controller

    Cypress Division: Cypress Semiconductor MCU and Connectivity Division (MCD)

    TECHNOLOGY/FAB PROCESS DESCRIPTION

    Number of Metal Layers: Proprietary Metal Composition: Proprietary

    Passivation Type and Thickness: Proprietary

    Generic Process Technology/Design Rule (-drawn): Proprietary

    Gate Oxide Material/Thickness (MOS): Proprietary

    Name/Location of Die Fab (prime) Facility: Fab 25

    Die Fab Line ID/Wafer Process ID: S8SPR1

    ALTERNATIVE FAB FACILITY SITE

    FAB SITE LOCATION QTP NUMBER

    SkyWater Bloomington, Minnesota154601

    (Al BEOL Interconnect)

    Fab 25 Austin, Texas162113

    (Al BEOL Interconnect)

    Fab 25 Austin, Texas174801 (CCG4 PD3)

    (Cu BEOL Interconnect)

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    Page 4 of 31

    MAJOR PACKAGE INFORMATION USED IN THIS QUALIFICATION

    Package Designation: LQ40

    Package Outline, Type, or Name: Quad Flat No Lead (QFN), 6x6x0.6mm

    Mold Compound Name/Manufacturer: GE7470L-A/Nitto

    Mold Compound Flammability Rating: V-0 UL94

    Oxygen Rating Index: >28% 54%

    Lead Frame Designation: FMP

    Lead Frame Material: Copper

    Lead Finish, Composition / Thickness: NiPdAu

    Die Backside Preparation Method/Metallization: Backgrind

    Die Separation Method: Saw Process

    Die Attach Supplier: Henkel

    Die Attach Material: QMI 519

    Bond Diagram Designation 001-99438

    Wire Bond Method: Thermosonic

    Wire Material/Size: CuPd/0.8 mil (20um)

    Thermal Resistance Theta JA C/W: 31 C /W

    Package Cross Section Yes/No: Yes

    Assembly Process Flow: 11-21099

    Name/Location of Assembly (prime) facility: CML-RA

    MSL Level 3

    Reflow Profile 260C

    ELECTRICAL TEST / FINISH DESCRIPTION

    Test Location: CML-RA

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    Page 5 of 31

    RELIABILITY TESTS PERFORMED PER SPECIFICATION REQUIREMENTS

    Stress/Test Test Condition (Temp/Bias) ResultP/F

    Acoustic Microscopy

    J-STD-020Precondition: JESD22 Moisture Sensitivity Level

    (192 Hrs., 30 C, 60% RH, 260C Reflow)P

    Data Retention150C/175C, No BiasJESD22-A117 and JESD22-A103

    P

    Electrostatic DischargeCharge Device Model (ESD-CDM)

    500V/750V/1,000V/1,250V/1,500V/1,750V/2,000VJESD22-C101

    P

    Electrostatic DischargeHuman Body Model (ESD-HBM)

    1,100V/2,200V /3,300V/4,000V/5,000V/6,000V/7,000V/8,000VJESD22, Method A114

    P

    Endurance Test Per Datasheet (100K Cycles), JESD22-A117 P

    High Accelerated Saturation Test(HAST)

    JEDEC STD 22-A110: 130C, 85% RH, 5.5V/6.6VPrecondition: JESD22 Moisture Sensitivity Level

    (192 Hrs., 30 C, 60% RH, 260C Reflow)P

    High Temperature Operating LifeEarly Failure Rate

    Dynamic Operating Condition, Vcc Max=2.07V/2.16V/2.27V/6.6V,150CJESD22-A-108

    P

    High Temperature Operating LifeLatent Failure Rate

    Dynamic Operating Condition, Vcc Max=2.07V/2.27V,150CJESD22-A-108

    P

    Low Temperature Operating LifeDynamic Operating Condition, -40CJESD22-A108

    P

    Pressure Cooker

    JESD22-A102:121C /100%RH, 15 PSIGPrecondition: JESD22 Moisture Sensitivity Level

    (192 Hrs., 30 C, 60% RH, 260C Reflow)P

    SEM Analysis MIL-STD-883, Method 2018 P

    Static Latch-up85C, +/- 140mA, +/- 200mA, +/-300mA125C, +/-100mA, +/-140mAJESD 78

    P

    Temperature Cycle

    MIL-STD-883, Method 1010, Condition C, -65C to 150CPrecondition: JESD22 Moisture Sensitivity Level

    (192 Hrs., 30 C, 60% RH, 260C Reflow)P

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    Page 6 of 31

    RELIABILITY FAILURE RATE SUMMARY

    Stress/Test Device Tested/Device Hours

    #Fails

    ActivationEnergy

    Thermal

    AF3Failure Rate

    High Temperature Operating LifeEarly Failure Rate

    1, 591 Devices 0 N/A N/A 0 PPM (1)

    High Temperature Operating LifeLong Term Failure Rate

    553,740 DHRs 0 0.7 170 10 FIT (2)

    1. Early Failure Rate was computed from QTP# 174802.2. Long Term Failure Rate was computed from QTP#151008, QTP#151303, QTP#160301, QTP#160207, QTP# 161003,

    QTP# 164802, QTP# 163301, QTP# 164302 data.

    1 Assuming an ambient temperature of 55C and a junction temperature rise of 15C.2 Chi-squared 60% estimations used to calculate the failure rate.3 Thermal Acceleration Factor is calculated from the Arrhenius equation

    AF =E

    k

    1

    T-

    1

    T

    A

    2 1

    exp

    where:

    EA =The Activation Energy of the defect mechanism.K = Boltzmanns constant = 8.62x10-5 eV/Kelvin.T1 is the junction temperature of the device under stress and T2 is the junction temperature of thedevice at use conditions.

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    Page 7 of 31

    Reliability Test Data

    QTP #: 151008

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 15 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 15 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 15 0

    STRESS: DATA RETENTION, PLASTIC, 150C

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 80 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1000 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 80 0

    STRESS: DATA RETENTION, PLASTIC, 175C

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 76 80 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 152 79 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 76 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 152 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 76 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 152 80 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150, 2.07V, Vcc Max)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 48 1490 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 48 1510 0

    CYTT214032 (8CP206101) 4545249 611537364 CML-RA 48 1547 0

    STRESS: ENDURANCE

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA CYCLING 78 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 168 78 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 78 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA CYCLING 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 168 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA CYCLING 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 168 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 9 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 750 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1250 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1500 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1750 3 0

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    Page 8 of 31

    Reliability Test Data

    QTP #: 151008

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ESD-CHARGE DEVICE MODEL

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 9 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 750 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1000 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1250 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1500 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1750 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 9 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 750 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1000 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1250 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1500 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1750 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1100 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 2200 8 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 3300 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 4000 3 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 5000 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 1100 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 2200 8 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 3300 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 4000 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1100 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 2200 8 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 3300 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 4000 3 0

    STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 96 30 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 96 30 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 80 116 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 116 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 80 120 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 120 0

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    Page 9 of 31

    Reliability Test Data

    QTP #: 151008

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: LOW TEMPERATURE OPERATING LIFE, -40C

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 160 40 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 380 40 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 168 75 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 168 78 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 168 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 288 80 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 10+2 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 10+2 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 10+2 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 6 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 6 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 6 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 3 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA COMP 3 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA COMP 3 0

    STRESS: SEM CROSS SECTION

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 1 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 500 80 0

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA 1000 80 0

    CYTT214032 (8CP206101) 4540145 611534709 CML-RA 500 80 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 500 79 0

    CY8C42452 (8CP44200) 4537464 611531543 CML-RA 1000 79 0

    STRESS: THERMAL JUNCTION MEASUREMENT

    CYTT214032 (8CP206101) 4539372 611534008 CML-RA COMP 1 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 10 of 31

    Reliability Test Data

    QTP #: 151303

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 15 0

    STRESS: DATA RETENTION, PLASTIC, 150C

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 80 0

    STRESS: DATA RETENTION, PLASTIC, 175C

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 76 80 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 152 80 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 48 1469 0

    STRESS: ENDURANCE

    CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G CYCLING 80 0

    CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 168 80 0

    CY8CMBR31552 (8CP44303CB) 4542914 611534693 ASE-G 500 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 9 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 750 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1000 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1250 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1500 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1750 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1100 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 2200 8 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 3300 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 4000 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 5000 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 6000 3 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 7000 3 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)

    CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G 80 120 0

    CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G 500 120 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 168 80 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 288 79 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CY8CMBR31552(8CP44303CB) 4542914 611534693 ASE-G COMP 10+2 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 11 of 31

    Reliability Test Data

    QTP #: 151303

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 6 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 500 80 0

    CY8CMBR3106S2(8CP44304) 4542914 611534639 CML-RA 1000 80 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 12 of 31

    Reliability Test Data

    QTP #: 160401

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 15 0

    STRESS: DATA RETENTION, PLASTIC, 150C

    CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 500 80 0

    CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 1000 80 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 48 1550 0

    STRESS: ENDURANCE

    CY8C42452(8CP44200DB) 4537464 611531543 CML-RA CYCLING 80 0

    CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 168 80 0

    CY8C42452(8CP44200DB) 4537464 611531543 CML-RA 1000 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 500 9 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 750 3 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1100 3 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 2200 3 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 3300 3 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 168 80 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 168 76 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 500 78 0

    CYFPA1 (8CP2F1001BB) 3609025 611610290 CML-R 1000 76 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 13 of 31

    Reliability Test Data

    QTP #: 160301

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: DATA RETENTION, PLASTIC, 150C

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0

    STRESS: DATA RETENTION, PLASTIC, 175C

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 76 80 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 152 80 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 48 2609 1 No Visual Defect found

    CYAT816882 (8C206802BB) 3617006 611617664 CML-R 48 1013 0

    STRESS: ENDURANCE

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R CYCLING 80 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 9 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 750 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 3 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 500 9 0

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1000 3 0

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1250 3 0

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1500 3 0

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 1750 3 0

    CYTT417012 (8CP206801BB) 3613017 611614958 CML-R 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1100 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 2200 8 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 3300 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 4000 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 5000 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 6000 3 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 7000 3 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 99 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 10 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 14 of 31

    Reliability Test Data

    QTP #: 160301

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 500 80 0

    CYAT816882 (8C206802BB) 3613017 611611087 CML-R 1000 80 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 15 of 31

    Reliability Test Data

    QTP #: 160803

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 48 1596 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 500 9 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 750 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1000 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1250 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1500 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 1100 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 2200 8 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 3300 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 4000 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 5000 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 6000 3 0

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T 7000 3 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CY8C4045 (8CP40003BB) 3615013 611612344 OSE-T COMP 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 16 of 31

    Reliability Test Data

    QTP #: 160207

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 15 0

    STRESS: DATA RETENTION, PLASTIC, 150C

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 90 0

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 1000 90 0

    STRESS: DATA RETENTION, PLASTIC, 175C

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 76 90 0

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 152 90 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 48 2303 0

    STRESS: ENDURANCE

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R CYCLING 90 0

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 168 90 0

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 90 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 9 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 1100 3 0

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 2200 8 0

    STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 96 30 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 125 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 168 78 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CY8C3866A (8CP38661HB) 3617013 611615839 CML-R 500 80 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 17 of 31

    Reliability Test Data

    QTP #: 161003

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 15 0

    STRESS: DATA RETENTION, PLASTIC, 150C

    CYPD1103 (8F44100) 4537464 611531543 CML-R 500 80 0

    STRESS: DATA RETENTION, PLASTIC, 175C

    CYPD1103 (8F44100) 4537464 611531543 CML-R 76 80 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 152 80 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.07V, Vcc Max)

    CYPD1103 (8F44100) 4537464 611531543 CML-R 48 1510 0

    STRESS: ENDURANCE

    CYPD1103 (8F44100) 4537464 611531543 CML-R CYCLING 80 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 168 80 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 500 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD1103 (8F44100) 4537464 611531543 CML-R 500 9 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 750 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1000 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1250 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1500 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1750 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1100 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 2200 8 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 3300 3 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 4000 3 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.07V, Vcc Max)

    CYPD1103 (8F44100) 4537464 611531543 CML-R 80 120 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 500 120 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD1103 (8F44100) 4537464 611531543 CML-R 168 80 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 288 80 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 10+2 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 6 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 18 of 31

    Reliability Test Data

    QTP #: 161003

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD1103 (8F44100) 4537464 611531543 CML-R COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYPD1103 (8F44100) 4537464 611531543 CML-R 500 79 0

    CYPD1103 (8F44100) 4537464 611531543 CML-R 1000 79 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 19 of 31

    Reliability Test Data

    QTP #: 160809

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 500 9 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 750 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1000 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1250 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1500 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1750 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 1100 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 2200 8 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 3300 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 4000 3 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 5000 3 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150, 2.07V, Vcc Max)

    CYPD21342 (7CP64111C) 3612012 611612816 CML-RA 48 1032 0

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA 48 537 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP 3 0

    YIELD: BACKEND

    CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT

    CYPD21342 (7CP64111C) 3612012 611612814 CML-RA COMP EQUIVALENT

    YIELD: E-TEST

    CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT

    YIELD: SORT

    CYPD21342 (7CP64111C) 3612012 611612816 CML-RA COMP EQUIVALENT

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 20 of 31

    Reliability Test Data

    QTP #: 164802

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 15 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 9 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 750 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1000 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1250 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1500 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1750 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1100 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 2200 8 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 3300 3 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 4000 3 0

    STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 6.6V), PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 96 28 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 48 1550 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 80 84 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 81 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 96 80 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 168 79 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 0 10+2 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 10+2 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 21 of 31

    Reliability Test Data

    QTP #: 164802

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 6 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA COMP 3 0

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 500 80 0

    CYPD21227 (7CP64102E) 3705058 611711793 CML-RA 1000 80 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 22 of 31

    Reliability Test Data

    QTP #: 163301

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: DATA RETENTION, PLASTIC, 175C

    CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 76 80 0

    CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 152 80 0

    STRESS: ENDURANCE

    CY8C4248AZI2 (8CP42003CB) 3621015 611619413 G-Taiwan 168 80 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 9 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 3 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1250 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 3 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 2200 8 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 3300 3 0

    STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 96 25 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 192 25 0

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA 96 26 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 48 1103 0

    CYPD3135 (7CP64301DB) 3641022 611637237 CML-RA 48 413 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 48 1570 0

    STRESS:HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 117 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 80 130 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 130 0

    STRESS: HIGH TEMPERATURE STORAGE, PLASTIC, 150C

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 45 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 1000 45 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 45 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 1000 45 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 0 10+2 0

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA 500 10+2 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 0 10+2 0

    CYPD3135 (7CP64301DB) 3643014 611639672 CML-RA 500 10+2 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 23 of 31

    Reliability Test Data

    QTP #: 163301

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 6 0

    CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 6 0

    CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 6 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD3135 (7CP64301DB) 3652003 611700857 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3652003 611700858 CML-RA COMP 3 0

    CYPD3135 (7CP64301DB) 3706023 611706634 CML-RA COMP 2 0

    STRESS: THERMAL JUNCTION MEASUREMENT

    CYPD3135 (7CP64301DB) 3641047 611637169 CML-RA COMP 1 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 24 of 31

    Reliability Test Data

    QTP #: 164302

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 22 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 9 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 750 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1000 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1250 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1500 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1750 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 1100 9 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 2200 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 3300 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 4000 3 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 5000 3 0

    STRESS: HI-ACCEL SATURATION TEST (130C, 85%RH, 5.5V), PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 96 30 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 48 1040 1 Functional (NGDO_Vbus)

    CYPD31357 (7CP64301JB) 3715132 611716236 CML-RA 48 1043 0

    CYPD31357 (7CP64301JB) 3719028 611719500 CML-RA 48 985 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-LATENT FAILURE RATE (150C, 2.27V, Vcc Max)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 79 0

    STRESS: PRESSURE COOKER TEST (121C, 100%RH), 15 Psig, PRE COND 192 HR 30C/60%RH (MSL3)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 168 79 0

    STRESS: PRE/POST LFR PARAMETER ASSESSMENT

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 0 10+2 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA 500 10+2 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 25 of 31

    Reliability Test Data

    QTP #: 164302

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: TC COND. C -65C TO 150C, PRE COND 192 HRS 30C/60%RH (MSL3)

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 500 0

    CYPD31357 (7CP64301JB) 3714062 611714862 CML-RA COMP 1000 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 26 of 31

    Reliability Test Data

    QTP #: 162113

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 2.16V, Vcc Max)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 48 156 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 48 1515 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 48 744 0

    CYPD4226 (7CP64210A) 3650047 611647007 CML-RA 48 784 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 500 9 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 500 9 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 500 9 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 750 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 750 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 750 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1000 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1250 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1250 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1250 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1500 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1500 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1500 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1750 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1750 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1750 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 2000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 2000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 2000 3 0

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 1100 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 1100 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 1100 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 2200 8 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 2200 8 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 2200 8 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 3300 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 3300 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 3300 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 27 of 31

    Reliability Test Data

    QTP #: 162113

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ESD-HUMAN BODY MODEL PER JESD22, METHOD A114

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 4000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 4000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 4000 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 5000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 5000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 5000 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 6000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 6000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 6000 3 0

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA 7000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 7000 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA 7000 3 0

    CYPD4226 (7CP64210A) 3631028 611627936 CML-RA 8000 3 0

    STRESS: STATIC LATCH-UP (125C, 100mA)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (125C, 140mA)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 140mA)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 200mA)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0

    CYPD4226 (7CP64210A) 3649027 611645295 CML-RA COMP 3 0

    STRESS: STATIC LATCH-UP (85C, 300mA)

    CYPD4226 (7CP64210A) 4628102 611623286 CML-RA COMP 3 0

  • Document No. 002-24165 Rev. **ECN #: 6199884

    Company ConfidentialA printed copy of this document is considered uncontrolled. Refer to online copy for latest revision.

    Page 28 of 31

    Reliability Test Data

    QTP #: 174801

    Device Fab Lot # Assy Lot # Assy Loc Duration Samp Rej Failure Mechanism

    STRESS: ACOUSTIC, MSL3

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA COMP 22 0

    STRESS: HIGH TEMP DYNAMIC OPERATING LIFE-EARLY FAILURE RATE (150C, 6.6V, Vcc Max)

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 48 1548 0

    STRESS: ESD-CHARGE DEVICE MODEL

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 500 9 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 750 3 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1000 3 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1250 3 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1500 3 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 1750 3 0

    CYPD42267 (7CP64230A) 3745143 611746079 CML-RA 2000 3 0

    CYPD4126 (7CP64234A) 3745143 611801313 CML-RA 500 9 0

    CYPD4126 (7CP64234A) 3745143 611801313 CML-RA 750 3 0

    CYPD4126 (7CP64234A) 3