Performance of INTPIX3 A and B sensors - CERN

Performance of INTPIX3 A and B sensors

Mohammed Imran Ahmed

Supervisors:

Prof. Marek Idzik (AGH-UST)Dr. Piotr Kapusta (IFJ-PAN)

Prof. Michal Turala (IFJ-PAN)

AGH-UST and IFJ-PAN, Krakow Poland

June 28, 2011

Contents

1 Pixel Behavior with time 11.0.1 Sensitivity to Different Parameters . . . . . . . . . . . . . 3

2 Data cleaning 72.0.2 Irradiation of INTPIX3A with Am-241 (Americium) . . . 72.0.3 INTPIX 3A (Analysis) . . . . . . . . . . . . . . . . . . . . 72.0.4 INTPIX3B (Analysis) . . . . . . . . . . . . . . . . . . . . 11

3 Results 143.0.5 Comparison of INTPIX 3A and 3B . . . . . . . . . . . . . 14

4 Analysis with 100µs and 250µs 214.0.6 100µs for 3A sensor . . . . . . . . . . . . . . . . . . . . . 214.0.7 250µs for 3B sensor . . . . . . . . . . . . . . . . . . . . . 23

5 Summary and Outlook 25

1

List of Figures

1.1 Pixel behavior of 6th region of detector 3A . . . . . . . . . . . . . 21.2 Pixel behavior of 6th region of detector 3B . . . . . . . . . . . . . 21.3 Reset Voltage RSTV varied from 200ms to 800ms of INTPIX 3B 31.4 Bias voltage varied from 5V to 100V of INTPIX 3A . . . . . . . 41.5 IT increase in steps from 50µs to 1000µs of INTPIX 3A . . . . . 6

2.1 Histogram of Pedestal before and after common mode rejection 82.2 Effect of Initial Frame . . . . . . . . . . . . . . . . . . . . . . . . 82.3 Histograms after removing common mode noise and bad pixels . 92.4 Histogram after Clustering and Fitting of sensor 3A . . . . . . . 102.5 Histograms of 1,2,3 and 4 cluster of sensor 3A . . . . . . . . . . . 102.6 Histograms after removing common mode noise and bad pixels . 112.7 Histograms of 1,2,3 and 4 cluster of sensor 3B . . . . . . . . . . . 122.8 Histogram after Clustering and Fitting of 3B . . . . . . . . . . . 12

3.1 Ped(red) and Am-241(black) histogram of all region in INTPIX 3A 153.2 Ped(red) and Am-241(black) histogram of all region in INTPIX 3B 163.3 Histogram after merging all cluster of sensor 3A . . . . . . . . . 183.4 Histogram after merging all cluster of sensor 3B . . . . . . . . . . 193.5 Histograms of 1,2,3 and 4 cluster of sensor 3B region 8 . . . . . . 20

4.1 Histogram after Clustering of 3A sensor with 100µs . . . . . . . . 224.2 Histograms of 1,2,3 and 4 cluster of sensor 3A with 100µs . . . . 224.3 Histogram after Clustering of 3B sensor with 250µs . . . . . . . . 234.4 Histograms of 1,2,3 and 4 cluster of sensor 3B with 250µs . . . . 24

2

List of Tables

1.1 Parameter setting of sensor 3A and 3B . . . . . . . . . . . . . . . 11.2 Noise, ENC and SNR for Variable Integration time of region 6th

of 3A and 3B sensor . . . . . . . . . . . . . . . . . . . . . . . . . 5

2.1 Parameter setting of Sensor 3A . . . . . . . . . . . . . . . . . . . 72.2 Am-241 Radiation Data . . . . . . . . . . . . . . . . . . . . . . . 92.3 Parameter setting of Sensor 3B . . . . . . . . . . . . . . . . . . . 11

3.1 INTPIX 3A, Noise, ENC and SNR . . . . . . . . . . . . . . . . . 173.2 INTPIX 3B, Noise, ENC and SNR . . . . . . . . . . . . . . . . . 17

4.1 Parameter setting of Sensor 3A with 100µs . . . . . . . . . . . . 214.2 Parameter setting of Sensor 3B with 250µs . . . . . . . . . . . . 234.3 Noise, ENC and SNR for Variable Integration time of region 8th

of 3A and 3B sensor . . . . . . . . . . . . . . . . . . . . . . . . . 24

3

Abstract

The measurements and test results of INTPIX 3A and 3B are presented. Ithas been found that the ADC value of every pixel of the detector is varying withtime and the slope increases with bias voltages. After 2 hour run the detectoris going to saturation. Parameter such as RSTV (reset voltage), RSTL (resetlength), back voltage and integration time are varied to find optimum valuewith americium (Am-241) source. The americium (Am-241) lines like 13.9KeV,59.5KeV and other are clearly seen in a ADC spectrum. The comparison ofINTPIX 3A and 3B is done on the basis of the measured americium spectrumsand the obtained signal to noise (SNR) values.

Chapter 1

Pixel Behavior with time

Each Pixel of detector 3A and 3B is analyzed in dark without any signal and itis found that the output after ADC conversion increases with time and higherslope of pixel is observed for larger bias voltage. This shows that these detec-tors cannot be used for long run, as most of their pixel are going to saturateafter approximately 1 hour run. For ease of understanding, I am showing fourdifferent pixel of region-6 from both detectors.

The figure 1.1 and 1.2 shows the pixel behavior with time for both detector3A and 3B respectively. For ease of understanding, I am showing four differ-ent pixel of region-6 from both detectors. Data is taken continuously till thedetector reach saturation, due to the maximum frame limit i.e. 70000 framesper run, we took data in four different runs but the pixels are the same for eachrun. Each graph in figure 1.1 and 1.2 shows the behavior of four pixels.

The parameter setting for both detector is as follows:

Parameters INTPIX 3A(fig:1.1) INTPIX 3B(fig:1.2)Environment Dark DarkSignal No NoFrames 70000 70000Back Bias 100V 80VIntegration Time and Scan Time 500µs, 1000 ns/pixel 500µs, 1000 ns/pixelRSTV and RST Length 0.7V, 240 ns 0.7V, 240 nsFrequency 95Hz 95Hz

Table 1.1: Parameter setting of sensor 3A and 3B

In principle each Pixel should reset after every frame and if there is no signalto the sensor then pixel ADC values should be constant but it has been foundthat pixels ADC values of both detectors are adding up frame by frame tillreaching saturation.

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Figure 1.1: Pixel behavior of 6th region of detector 3A

Figure 1.2: Pixel behavior of 6th region of detector 3B

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1.0.1 Sensitivity to Different ParametersThe RSTV and RSTL are changed to see weather the effect is reduced but noimprovement is observed. A number of tests have been done to find the reason,why the pixels do not reset after every frame and at what range the detectoroperate well. The Biasing voltage and Integration time are varied to find thebest operating conditions and The RSTV and RSTL varied to investigae resetproblem of pixels.

RSTV

The range of RSTV(reset voltage) is 0V to 1.8V, pixels start working from200mV and approach saturation at 1V. The fig: 1.3 shows the pixel behaviorfor different RSTV. The best RSTV value should be between 400mV to 600mV,some pixels will be not active or reach saturation when RSTV is below 400mVor above 600mV respectively. If that RSTV value is to reset the pixel, then whywe are getting a slope instead of constant ADC value ?. We have to understandthis problem, may be this reset is not working or something bad is happeninginside the detector.

Figure 1.3: Reset Voltage RSTV varied from 200ms to 800ms of INTPIX 3B

Biasing Voltage

For both detectors bias voltage is varied from 5V to 100V, to check weather thecontinuous increase of pixel ADC values with time is due to higher bias voltage.In fig: 1.4 four different pixels are used to analyze saturation effect and from theplot it is found that there is an increase in slope and offset with bias voltage. Infig: 1.4 see pixel(67,76), the bias voltage increase in steps from 5V to 50V, the

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(a) Vb=5V (b) Vb=10V

(c) Vb=30V (d) Vb=50V

(e) Vb=70V (f) Vb=100V

Figure 1.4: Bias voltage varied from 5V to 100V of INTPIX 3A

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offset increase by 80 ADC. A large increase in offset can be seen of 230 ADC,when the bias voltage is increased from 50V to 100V. The increase in offset isapproximately 3 times larger than for lower bias voltage. The similar increasecan be seen in slope of the pixels, as the bias voltage increases from 50V to100V the slope is twice i.e. 40 ADC as compared to the slope change between5V and 50V, which is about 20 ADC. Same is found in sensor 3B.

Integration time

In fig: 1.5 the integration time of 3A sensor is varied from 50µs to 1ms. Fromthe plots we come to the conclusion that the slope at 1000µs integration timeis more than 2 times larger than 500µs. At the same time the measured signalto noise SNR (explained in further next chapter) is smaller at 1ms, for SNR seetable: 1.2. Because of this most of the measurements done to compare sensorsA and B are done for 500µs integration time. The higher SNR is obtained foreven smaller integration times but 500 µs is chosen due to simplicity in obtain-ing high statistics. To keep the exposure time to 2.5sec, we have to increasenumber of frames i.e. 50,000 frames for 50µs and 25,000 for 100µs.

Table: 1.2 shows SNR and ENC for different integration times for 3B sensor,the slope at 250µs is small and the signal to noise ratio is better than at 500µs,keeping constant exposure time i.e. 2.5sec. In order to find the best SNR inchapter 4 we did the analysis with 100µs and 250µs integration times for 3Aand 3B sensor respectively.

INTPIX 3AIT(µs) Noise(ADC) ENC(e−) SNR Mean of 59.5KeV(ADC)50 3.80 231 70.52 268.0100 3.83 218 74.63 285.8250 4.00 239 68.15 272.6500 4.31 245 66.65 287.31000 5.30 311 52.42 279.4

INTPIX 3B100 6.01 159 102.41 600.4250 7.31 146 111.32 813.8500 10.68 191 85.37 911.8

Table 1.2: Noise, ENC and SNR for Variable Integration time of region 6th of3A and 3B sensor

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(a) IT=50µs (b) IT=100µs

(c) IT=250µs (d) IT=500µs

(e) IT=1000µs

Figure 1.5: IT increase in steps from 50µs to 1000µs of INTPIX 3A

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Chapter 2

Data cleaning

2.0.2 Irradiation of INTPIX3A with Am-241 (Americium)Test parameters details: DAQ-GUI setting

BackBias=100V, Vguard2=1.8, Vbias and Vguardio are at ground.

Integration Time and Scan Time 500 µs, 1000 ns/pixelRSTV and RST Length 750 mV, 240 nsFrequency 95 HzRun Mode calib and dataCalib run 5000 events (In dark without Am-241 source)Am-241 run 5000 events (In dark with Am-241 source)

Table 2.1: Parameter setting of Sensor 3A

2.0.3 INTPIX 3A (Analysis)The presented procedures of data cleaning and further analysis are done for 6th

region of the detector 3A. The 6th region is supposed to be a good region, itconsist of 32x64 pixels and each pixel size is 20x20 µm2. The same analysis willbe applied (in the next chapter) to all regions of sensor A and B to perform thecomparison.

The average pedestal is calculated for each pixel from calib run. The ADCvalues are subtracted from average pedestal. The distributions of the measuredcalib data before and after the common mode suppression for whole region arepresented in fig: 2.1a and fig: 2.1b, respectively. As illustrated, the Gaussianshape of the pedestal distribution was restored and the standard deviation ofthe data was significantly reduced by suppression of the common interferences.

The bad frames and bad pixels are removed in fig: 2.2. First 50 or 100 framesare bad frames see fig: 2.2a a small peak in left histogram is due to initial 50frames. In fig: 2.2b the peak is removed after rejecting initial 50 frames. Somepixels are having higher sigma, so by introducing a 2σ cut we removed bad pixel

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(a) Raw Pedestal (b) After common mode

Figure 2.1: Histogram of Pedestal before and after common mode rejection

from the analyzed data.

(a) Before initial frame removal (b) After initial frame removal

Figure 2.2: Effect of Initial Frame

After removing common mode noise, bad frames, bad pixels and with thesame exposure time for calib and Am-241 runs we can see a Gaussian noise infig: 2.3a and a nice spectrum with shoulders in fig: 2.3b indicating the presenceof gamma lines from Am-241 source.

Since it is not straightforward to identify gamma peaks from the Am-241spectrum (hit pixel distribution) in fig: 2.3b, in the next section we will try toobtain the distributions of clusters of pixels (corresponding to gamma events)rather than the distributions of single pixels.

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(a) Pedestal (b) Am-241

Figure 2.3: Histograms after removing common mode noise and bad pixels

Clustering AlgorithmAm-241 Radiation Data

The activity of Am-241 source used for this test setup is 10mCi (=370MBq).As the incident photon rate is low, we keep the source near to the sensor andset the higher possible integration time. The following table give the radiationdata of Am-241 source.

Radiation DataType Energy IntensityAm-241 Alpha 5483KeV 84.5Am-241 Alpha 5443KeV 13.5Am-241 Gamma 59.5KeV 35.9Am-241 Gamma 26.3KeV 2.4Am-241 Gamma 13.9KeV 42Cu L x-ray 8.01KeV -Np L x-ray 17.7KeV -Np L x-ray 20.7KeV -

Table 2.2: Am-241 Radiation Data

Since the alpha’s are blocked by a mask only the X-ray lines are allowed togenerate charge in the pixels. To find the clusters representing X-ray events thegroups of hit pixels were identified. In order to find the pixels with the signalabove noise level equation 2.1 was used. If this condition is true then those pixelsare supposed to be hit by a gamma line of Am-241 source. Number of pixelshit depends on energy and intensity of the monochromatic line. In principleeach X-ray event may create a one, two or more signal pixels. In practice it wasenough to study 1,2,3 and 4 pixel clusters. Very few larger clusters were found.Applying the fitting procedures the values of different peaks are found. The13.9KeV line corresponds to 63.6 ADC counts, 17.7KeV to 78.6 ADC countswhile 59.5KeV to 272.7 ADC counts, see fig: 2.4b.

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(a) After clustering (b) Gaussian Fitting of 3 lines

Figure 2.4: Histogram after Clustering and Fitting of sensor 3A

(a) Single Pixel (b) Double Pixel

(c) Triple Pixel (d) Quadruple Pixel

Figure 2.5: Histograms of 1,2,3 and 4 cluster of sensor 3A

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adc[i][j] >= mean_adc[i][j] + (2 ∗ sigma_ped) (2.1)

i,j = pixels number

The fig: 2.4a shows the measured Am-241 spectrum obtained after cluster-ing. The Gaussian fitting of gamma lines is shown in fig: 2.4b. We can clearlysee three lines corresponding to the peaks and a shoulder represent forth linefrom Am-241 source. The separate distributions of single, double, triple andquadruple pixel clusters are shown in fig: 2.5. Depending on the photon energy,different clusters are created. It is seen that the 13.9KeV has a highest proba-bility to hit single pixel, corresponding to large number of entries in fig: 4.2a.On the other hand the 26.3KeV line is best seen in 3 pixel clusters distribution,while 59.5KeV line is seen well in 2,3 and 4 pixel clusters distribution.

2.0.4 INTPIX3B (Analysis)Test parameters details: DAQ-GUI setting

BackBias=80V, Vguard2=gnd.

Integration Time 500 µsRSTv (Reset Voltage) 550 mVFrequency 95 HzRun Mode calib and dataCalib run 5000 events (In dark without Am-241 source)Am-241 run 5000 events (In dark with Am-241 source)

Table 2.3: Parameter setting of Sensor 3B

(a) Pedestal (b) Am-241

Figure 2.6: Histograms after removing common mode noise and bad pixels

The method discussed in section: 2.0.3 is used to analysis the 3B sensor.Similarly as in sensor 3A the region number 6 is chosen to perform first analysis.Other regions of sensor 3A and 3B will be analyzed in next section.

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Figure 2.7: Histograms of 1,2,3 and 4 cluster of sensor 3B

(a) After clustering (b) Gaussian Fitting of 3 lines

Figure 2.8: Histogram after Clustering and Fitting of 3B

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The gain of sensor 3B is very high compared to 3A. As seen in fig: 2.6b theright shoulder in 3B is stretch to 1000 ADC as compared to 3A, which is 300ADC see fig: 2.3b. The noise sigma in fig: 2.6a is twice as of noise sigma of 3A.So the sigma cut used to remove bad pixel and to find the hit pixel is differentfrom the sensor 3A.

The cluster distributions are shown in fig: 2.7, where the lines of 13.9KeV,17.7KeV and 59.5KeV are well seen. The overall cluster distribution is shown infig: 2.8. Here again the fits of different Am-241 lines are superimposed to thehistogram. If we compare fig: 2.4 with 2.8, all peaks are shifted about 3 times(in ADC counts) due to higher gain. The three peaks of 13.9KeV, 17.7KeV and59.5KeV are located respectively at 188, 239.5 and 806.5 ADC counts.

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Chapter 3

Results

In this chapter we discuss the results of measurements of both detectors and wecompare the INTPIX 3A and 3B. All the measurement are done with Am-241source.

3.0.5 Comparison of INTPIX 3A and 3BThe histograms of hit (and noise) distributions for all 16 region of both detec-tors 3A and 3B are seen in fig: 3.1 and 3.2. First three regions of sensor 3A and7th region of sensor 3B are provided with external guard ring. After providingrequired guard voltages to these regions there is no good response to Am-241source, as seen in fig: 3.1a to fig: 3.1c and fig: 3.2g. The right shoulder ofthese histogram has a very small number of hits and it is impossible to identifythe lines of Am-241. The 4th region of 3A in fig: 3.1d has a problem of backgate effect and this detector has a higher gain. Anyway we can see the rightshoulders corresponding to Am-241 lines. The performance of 5-8th regions of3A with Am-241 source in fig: 3.1h is pretty similar to 4th region. Lookinga bit closer a finer lower energy (13.9KeV, 17.7KeV) X-ray peaks structure isseen in this plots. The best region seems to be the 8th one where the peaksare most pronounced. The 3B sensor produce results at least the same goodcompared to 3A. Particularly the regions shown in fig: 3.2a, 3.2f and 3.2h, apartfrom having higher gain, they show a very good response to Am-241 source lines.

The table: 3.1 and 3.2 show the noise, ENC (equivalent noise charge) andSNR (signal to noise ratio), calculated from 59.5KeV line, for all 16 regions ofboth detectors. For regions 1st, 2nd and 3rd of 3A sensor and 7th of 3B sensor nolines from Am-241 were found, so we have not use these regions for comparisonof 3A and 3B sensor. The 4th and 8th region of 3A and 7th and 8th region of 3Bsensor have very good SNR but the best is 8th region of 3B with 97.1 SNR, seetable: 3.1 and 3.2. The histograms of cluster distributions for different regionsof detectors 3A and 3B are seen in fig: 3.3 and 3.4. As a confirmation that the8th region of 3B is the best with highest SNR, one can see that apart from thediscussed earlier Am-241 lines a Copper 8.01KeV line is seen as well, see fig:3.4g. For the same 8th region of 3B the distribution of 1,2,3 and 4 pixel clustersis shown in fig: 3.5. It is seen that the Copper 8.01KeV line is seen in singlecluster distribution, as one could expect.

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hbtp

(a) 3A Region 1 (b) 3A Region 2

(c) 3A Region 3 (d) 3A Region 4

(e) 3A Region 5 (f) 3A Region 6

(g) 3A Region 7 (h) 3A Region 8

Figure 3.1: Ped(red) and Am-241(black) histogram of all region in INTPIX 3A

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(a) 3B Region 1 (b) 3B Region 2

(c) 3B Region 3 (d) 3B Region 4

(e) 3B Region 5 (f) 3B Region 6

(g) 3B Region 7 (h) 3B Region 8

Figure 3.2: Ped(red) and Am-241(black) histogram of all region in INTPIX 3B

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INTPIX 3ARegion Noise(ADC) ENC(e−) SNR Mean of 59.5KeV (ADC)

1 9.27 - - -2 11.06 - - -3 6.67 - - -4 8.26 245 66.53 549.65 4.40 260 62.72 2766 4.48 266 61.22 274.37 4.92 280 58.17 286.28 5.06 186 87.82 444.4

Table 3.1: INTPIX 3A, Noise, ENC and SNR

INTPIX 3BRegion Noise(ADC) ENC(e−) SNR Mean of 59.5KeV (ADC)

1 11.98 279 58.48 700.72 9.82 200 81.44 799.83 6.50 283 57.66 374.84 6.80 271 60.2 409.45 8.8 291 75.94 668.36 10.20 205 79.44 810.37 10.13 - - -8 14.61 168 97.13 1422

Table 3.2: INTPIX 3B, Noise, ENC and SNR

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(a) 3A Region 4 all cluster (b) 3A Region 5 all cluster

(c) 3A Region 6 all cluster (d) 3A Region 7 all cluster

(e) 3A Region 8 all cluster

Figure 3.3: Histogram after merging all cluster of sensor 3A

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(a) 3B Region 1 all cluster (b) 3B Region 2 all cluster

(c) 3B Region 3 all cluster (d) 3B Region 4 all cluster

(e) 3B Region 5 all cluster (f) 3B Region 6 all cluster

(g) 3B Region 8 all cluster

Figure 3.4: Histogram after merging all cluster of sensor 3B

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(a) Single Pixel 3br8 (b) Double Pixel 3br8

(c) Triple Pixel 3br8 (d) Quadruple Pixel 3br8

Figure 3.5: Histograms of 1,2,3 and 4 cluster of sensor 3B region 8

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Chapter 4

Analysis with 100µs and 250µs

It was found that 100µs and 250µs integration times feature a good signal tonoise ratio, see table: 1.2 for 3A and 3B respectively. In this chapter we showsome histograms with Am-241 source only for the regions with highest signal tonoise ratio i.e. region 8 from both detectors 3A and 3B, see table: 3.1 and 3.2.

4.0.6 100µs for 3A sensorBackBias=100V, Vg1 and Vg2 are at ground.


Table 4.1: Parameter setting of Sensor 3A with 100µs

The same method is used for analysis as discussed in chapter:2. The fig:4.1 shows the cluster distribution for 8th region of 3A sensor. We clearly seethe 8.01KeV, 13.9KeV, 17.7KeV and 59.5Kev x-ray lines. If we compare thefig: 3.3e with fig: 4.1 we can say that 100µs is the best integration time for 3Asensor, since it allow us to detect 8.01KeV x-ray line which is not detected for500µs integration time. All single, double, triple and quadruple pixel clustersare shown in fig: 4.2. It is seen that the distribution of single clusters allowsidentification of 20.7KeV and 26.3KeV line, which were not seen before.

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Figure 4.1: Histogram after Clustering of 3A sensor with 100µs



Figure 4.2: Histograms of 1,2,3 and 4 cluster of sensor 3A with 100µs

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4.0.7 250µs for 3B sensorBackBias=80V, Vg1 and Vg2 are at ground.The 8th region of 3B sensor is analyzed using 250µs integration time. Again for


Table 4.2: Parameter setting of Sensor 3B with 250µs

comparison the cluster distribution is shown in fig: 4.3 and may be comparedto fig: 3.4g. Similarly to region 8 of sensor 3A, one can identify the peaks seenat 500µs integration time plus the Copper peak at 8.01KeV. All single, double,triple and quadruple pixel clusters are shown in fig: 4.4.

Figure 4.3: Histogram after Clustering of 3B sensor with 250µs

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Figure 4.4: Histograms of 1,2,3 and 4 cluster of sensor 3B with 250µs

INTPIX 3AIT(µs) Noise(ADC) ENC(e−) SNR Mean of 59.5KeV(ADC)100 3.65 140 111.45 426.1

INTPIX 3B250 12.80 148.5 109.70 1409

Table 4.3: Noise, ENC and SNR for Variable Integration time of region 8th of3A and 3B sensor

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Chapter 5

Summary and Outlook

The 16 different designs in both detectors INTPIX 3A and 3B are analyzedusing Am-241 source, the ENC and SNR are calculated. The saturation effectis reported for all regions, causing that the pixel pedestal increases continuouslywith time and due to this effect detector cannot be used for more than 2 hours.This is due to no resetting of pixel after every readout. The sensitivity studyof this effect is done on different parameter such as RSTV, RST Length, Biasvoltage and Integration time. The slope of pedestal change depends on theseparameters but the effect always exist.

Using the sensors 3A and 3B for shorter times (before they saturate) onecan compare their SNR. After applying required guard voltages to first threeregions of 3A and 7th region of 3B sensor, it is difficult to detect monochromaticline from Am-241 source, so we conclude that these are the worst regions. Themeasurements showed that for both detectors 3A, 3B the region number 8 per-forms in the best way, i.e. has a highest SNR.

In average for 500µs integration time the INTPIX 3B has SNR higher thanINTPIX 3A. The higher SNR is reflected by more pronounced structure of Am-241 X-ray lines. When trying to optimize the integration times significantlybetter SNRs and Am-241 spectrum may be obtained for both detectors.

We are seeking answer to the following problems:

• Why the pixels are not reset after every pixel readout?

• Why some initial frame are giving strange data?

• What is the use of Guard rings? Why regions 1-3 of 3A and region 7 of3B behave so bad ?

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Performance of INTPIX3 A and B sensors - CERN

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