PCI Express® Transmitter Compliance and Debug DPO… exp.pdf · PCIExpress®...
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PCI Express ® Transmitter Compliance and Debug DPO/MSO70000 Series Option PCE3 Datasheet Tektronix Option PCE3 TekExpress PCI Express DUT setup Features & benefits PCIe test support: Supports compliance and validation of PCIe Gen1/2/3 interfaces based on PCIe Base and CEM specifications for Tektronix DPO/MSO70000 Series oscilloscopes Automated setup: Automatically set up the oscilloscope horizontal and vertical scales to optimize signal quality for accurate analysis Automated acquisition / waveform management: Automatically acquire and save the waveform as per the PCI-SIG-recommended naming convention to help manage the numerous waveforms that need to be acquired per lane for completing the Transmitter (Tx) test Automated DUT control: Automatically control the DUT and step it through the various supported speeds and presets necessary for Tx testing De-embedding: De-embed the effects of the channel, test fixtures and cables to provide results that more accurately represent the signal (requires Option SDLA64 Serial Data Link Analysis) Test selection: Select the specification against which to perform the analysis, as well as select individual tests or groups of tests to perform targeted compliance analysis for failing tests SigTest integration: User-selectable choice of the SigTest DLL or SigTest EXE (using command line interface) to perform the analysis of the acquired waveforms, providing the ability to test a system using the PCI-SIG-recommended analysis tool Reporting: Compile all the results of a test run into a customizable report with Pass/Fail results for easy analysis and record keeping Pattern Matching: Verifies that the correct set of compliance patterns are sent by the transmitter before acquiring signals for compliance analysis PHY Level Protocol Decode: Decode and display of PCIe data in a protocol-aware view. A time-correlated event table view with waveforms allows for quickly searching through events of interest Multi-Lane testing: Perform analysis on multiple lanes of PCI express data using differential probes that speed up the Tx analysis in a multi-lane system Compliance and debug: Provides a toolkit of DPOJET-based setups to quickly switch into debug and validation mode in case a DUT fails compliance Analysis And debug tools: Tektronix provides a broad range of compliance, debug, and validation tools for Transmitter (Tx), Receiver (Rx), and protocol testing Comprehensive programmatic interface enables automation programs and scripts to call PCIe functions
Transcript of PCI Express® Transmitter Compliance and Debug DPO… exp.pdf · PCIExpress®...
PCI Express® Transmitter Compliance and DebugDPO/MSO70000 Series Option PCE3 Datasheet
Tektronix Option PCE3 TekExpress PCI Express DUT setup
Features & benefitsPCIe test support: Supports compliance and validation of PCIe Gen1/2/3interfaces based on PCIe Base and CEM specifications for TektronixDPO/MSO70000 Series oscilloscopes
Automated setup: Automatically set up the oscilloscope horizontal andvertical scales to optimize signal quality for accurate analysis
Automated acquisition / waveform management: Automatically acquireand save the waveform as per the PCI-SIG-recommended namingconvention to help manage the numerous waveforms that need to beacquired per lane for completing the Transmitter (Tx) test
Automated DUT control: Automatically control the DUT and step itthrough the various supported speeds and presets necessary for Txtesting
De-embedding: De-embed the effects of the channel, test fixtures andcables to provide results that more accurately represent the signal(requires Option SDLA64 Serial Data Link Analysis)
Test selection: Select the specification against which to perform theanalysis, as well as select individual tests or groups of tests to performtargeted compliance analysis for failing tests
SigTest integration: User-selectable choice of the SigTest DLL or SigTestEXE (using command line interface) to perform the analysis of theacquired waveforms, providing the ability to test a system using thePCI-SIG-recommended analysis tool
Reporting: Compile all the results of a test run into a customizable reportwith Pass/Fail results for easy analysis and record keeping
Pattern Matching: Verifies that the correct set of compliance patterns aresent by the transmitter before acquiring signals for compliance analysis
PHY Level Protocol Decode: Decode and display of PCIe data in aprotocol-aware view. A time-correlated event table view with waveformsallows for quickly searching through events of interest
Multi-Lane testing: Perform analysis on multiple lanes of PCI expressdata using differential probes that speed up the Tx analysis in amulti-lane system
Compliance and debug: Provides a toolkit of DPOJET-based setupsto quickly switch into debug and validation mode in case a DUT failscompliance
Analysis And debug tools: Tektronix provides a broad range ofcompliance, debug, and validation tools for Transmitter (Tx), Receiver(Rx), and protocol testing
Comprehensive programmatic interface enables automation programsand scripts to call PCIe functions
Datasheet
Tektronix Option PCE3 TekExpress PCIe test selection for compliance test analysis
ApplicationsTektronix provides the most comprehensive solutions to serve the needsof engineers designing PCI Express silicon for computer systems,add-in cards, and embedded systems, as well as those validating thephysical-layer compliance of PCI Express devices to the PCI ExpressCompliance Test Specification. The Tektronix Option PCE3 includesGen1/2/3 Compliance Testing and Electrical Validation for:
Root Complex
Endpoints
Switches
Bridges
Add-In Cards
System Boards
Embedded Systems
Express Module
The Tektronix Option PCE3 TekExpress application provides the mostcomprehensive solution for PCI Express Gen1/2/3 Transmitter compliancetesting as well as debug and validation of PCI Express devices againstthe specifications. The Tektronix Option PCE3 application includes aTekExpress™ compliance automation solution that integrates SigTest fromthe PCI-SIG as well as Tektronix DPOJET-based PCI Express Jitter andEye Diagram analysis tools for debug purposes all in a single softwarepackage.
The Tektronix Option PCE3 application is compatible with TektronixDPO/MSO70000 series oscilloscopes that are designed to meet thechallenges of the next generation of serial data standards such as PCIExpress. These oscilloscopes provide the industry's leading verticalnoise performance with the highest number of effective bits (ENOB) andflattest frequency response for oscilloscopes in their class. The TektronixDPO/MSO70000 series of oscilloscopes have been approved by PCI-SIGfor compliance testing.
Tektronix Option PCE3 oscilloscope acquisition setup
Compliance testing
The PCI-SIG provides PCI Express compliance tests for testing PCIExpress systems and add-in cards. For a PCI Express system or adevice to be placed on the Integrators List, the system or device mustpass interoperability and compliance testing. For electrical validation,the PCI-SIG uses SigTest Post Capture Analysis Software that usesacquisitions from an oscilloscope connected to the PCI-SIG's CBB3 (mainboard + riser) test fixture for add-in cards or CLB3 test fixture for systemsto perform the analysis. Manually capturing the required waveforms andanalyzing them is tedious, time consuming and error prone.
The Tektronix Option PCE3 TekExpress Automation for PCI ExpressTransmitter Compliance greatly reduces the effort and accelerates thecompliance testing for PCI Express systems and devices with severalunique and innovative capabilities.
The Option PCE3 TekExpress Automation software can control the DeviceUnder Test (DUT) using selected models of a Tektronix AFG or AWG patternsource and automatically cycle it through the various speeds, de-emphasisand presets that are necessary for the compliance test. This eliminates theerror-prone manual push button approach that is normally used for DUTcontrol on the CBB3 and CLB3 test fixtures.
A complete test run requires tens of waveforms to be acquired at differentDUT settings per lane. This waveform set will increase by the numberof lanes that need to be analyzed. The ability to manage and store therequired data for analysis and future reference is an important criterionfor any compliance solution. The Option PCE3 TekExpress automationsoftware, apart from adjusting the horizontal and vertical settings as well asthe acquisition depth for optimal signal quality for accurate analysis, alsomakes managing the multiple waveforms acquired for analysis easy.
The user can choose between SigTest EXE or SigTest DLL to analyze theacquired waveforms. This make results of the analysis consistent with theSigTest post-capture analysis software that is used at PCI-SIG workshopsfor compliance testing. The SigTest DLL is integrated into the solution and isused to analyze the acquired waveforms. This make results of the analysis
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Tektronix Option PCE3 TekExpress Setup Configuration
Tektronix Option PCE3 TekExpress report generation preferences
consistent with the SigTest post capture analysis software that is used atPCI-SIG workshops for compliance testing.
The Option PCE3 TekExpress automation software provides flexibility inselecting the data rates, voltage swing, presets and the tests to run, andalso provides the option to de-embed the effects of the channel and the testfixtures and provide an accurate representation of the signal at the pins asrequired by the specification.
All the analysis results are compiled in an HTML-format report that caninclude pass/fail summary, eye diagrams, setup configuration, and usercomments. The contents of the report can be customized to includeinformation of interest such as append results and custom report generationbased on test name/pass fail/equalization.
Debug and validationIf a DUT or Add-In card fails any portion of the compliance test, the OptionPCE3 application includes a DPOJET-based debug and analysis toolkit thatis customized for debug and validation of PCI Express interfaces.
Tektronix Option PCE3 TekExpress setup peferences
Tektronix Option PCE3 TekExpress results summary
The new jitter measurements introduced with PCIe Gen3 provide separatelimits for data dependent (DDJ) and uncorrelated deterministic jitter(UDJDD). It is important to separate DDJ (which can be compensated withtransmitter and receiver equalization) and UDJDD (which can be caused byeffects such as crosstalk and power supply noise).
Apart from the above Jitter measurements Pulse Width Jitter (PWJ)is a new measurement that addresses the increased channel loss at8 Gb/s. The purpose of the PWJ measurement is to ensure that lone bitsmeet minimum pulse width requirements. All new jitter measurementsimplement Q-scale extrapolation as defined in the base specification. PCE3provides the complete set of PCI Express 3.0 jitter measurements enablingsilicon designers to verify that their silicon meets the base specificationrequirements.
Furthermore, the base specification requirements are defined at the pins ofthe transmitter. Before the measurements are computed the test channelmust be de-embedded. De-embed filters can be easily created using theTektronix Option SDLA64 Serial Data Link Analysis software and then
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Datasheet
quickly entered into the PCE3 base specification measurement setup andsaved for future use. In addition to jitter, Option PCE3 also provides voltage,package loss, and transmitter equalization measurements.
Option PCE3 leverages the channel modeling and receiver equalizationfunctionality of the Tektronix Option SDLA64 software to support CEMmeasurements. Unlike other solutions, Opt. PCE3 provides full visibility tothe signal as it has been modified to embed the compliance channel andprovide receiver equalization. Eye diagrams and measurements can beset up to visually see the results of channel embedding, CTLE application,and DFE. For example when determining the optimal Rx Equalizationsettings (CTLE setting and DFE tap value) the resulting eye diagrams andmeasurements show the effects of post processing on the acquired signal.Compliance measurements can then be taken on the waveform.
Tektronix Option PCE3 TekExpress PCI Express test report
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
DPOJet PCE3 base specification measurement suite
DPOJet PCE3 CEM measurement analysis before channel, after channel, after CTLE,and DFE
Comprehensive programmatic interfaceThe programmatic interface seamlessly integrates the Option PCE3TekExpress test automation application with a high-level automation layersuch as Visual Basic, Microsoft .Net, C#, C++, TestStand, Python, or a Webapplication. This lets you control the state of the TekExpress applicationrunning on a local or a remote computer.
Programming examples are found in the application examples folder.
PCI Express Serial Triggering and Analysis(Option SR-PCIe)
PCIe Gen 3 compliance pattern decoded with Tektronix Option SR-PCIe
Decode and Display of PCIe data in a protocol-aware view with thecharacters and names that are familiar from the standard such as theordered sets: SKP, Electrical Idle, and EIEOS. A time correlated event tableview with waveform allows for quickly searching through events of interestsimultaneously. The PCIe data stream is integrated with serial bus triggerand search for PCIe gen 1 and 2 allows for triggering on information ofinterest.
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Datasheet
Comprehensive measurements for PCIevalidation, debug, and precomplianceTektronix Option PCE3 provides measurements that span multiple testpoints and versions of the PCIe specification. All PCIe specifications, testpoints, and measurements supported are listed in the following sections.
Option PCE3 provides coverage for a broad set of PCIespecifications and test points
Test method Spec revision PCI Expressspecification
title
Test pointsdefined
Rev 1.1 Base Specification Transmitter andReceiver
Rev 1.1 CEM Specification System and Add-inCard Reference
ClockRev 1.0 Express Module
SpecificationTransmitter Path
and System BoardRev 1.0 PCMCIA Express
Card StandardHost SystemTransmitter
Express CardTransmitter
Rev 1.1
Ver. 3.0 Rev 1.1 Mobile PCIExpress
Module (MXM)Electromechanical
Specification
PCI Express
Rev 1.0 External CablingSpecification
Transmitter andReceiver Path
Rev 2.0 Base Specification Transmitter andReceiver
Mobile Low-powerTransmitter
Rev 2.0 CEM Specification System and Add-inCard (3.5 and 6 dB
de-emphasis)
Rev 2.0
Ver. 3.0 Rev 1.1 Mobile PCIExpress
Module (MXM)Electromechanical
Specification
PCI Express
Rev 1.0 Base Specification TransmitterRev 1.0 CEM Specification System and Add-in
Card
Rev 3.0
Rev 3.0 Test Specification System and Add-inCard
Characteristics
Supported base specificationmeasurements
Differential 8 GT/s transmitter (Tx) output measurements
Parameter Symbol
Tx Voltage with No Tx Equalization VTX-NO-EQ
Minimum Swing during EIEOS VTX-EIEOS
Pseudo Package Loss ps21TX
Data-dependent Jitter TTX-DDJ
Tx Uncorrelated Deterministic Jitter TTX-UDJDD
Tx Uncorrelated Total Jitter TTX-UTJ
Deterministic DjDD Uncorrelated PulseWidth Jitter
TTX-UPW-DJDD
Total Uncorrelated Pulse Width Jitter TTX-UPW-TJ
Differential transmitter (Tx) output measurements
Parameter Symbol(s) 2.5 GT/sRev 1.1/2.0
5 GT/sRev 2.0
Clock Recovery NA Specified SpecifiedUnit Interval UI Specified SpecifiedDifferential p-p TxVoltage Swing
VTX-DIFF-P-P
VTX-SWING
VTX-EYE-FULL
Specified Specified
Low-powerDifferential p-p TxVoltage Swing
VTX-SWING-LOW
VTX-EYE-HALF
Specified Specified
De-emphasizedOutput VoltageRatio
VTX-DE-RATIO Not Specified Specified
InstantaneousLane Pulse Width
TMIN-PULSE Not Specified Specified
Transmitter Eyeincluding All JitterSources
TTX-EYE
TTX-EYE-TJ
Specified Specified
Maximum Timebetween theJitter Medianand MaximumDeviation from theMedian
TTX-EYEMEDIAN-to-MAXJITTER Specified Specified
Deterministic Jitter TTX-DJ-DD Not Specified SpecifiedTx RMS Jitter<1.5 MHz
TTX-LF-RMS Not Specified Specified
D+/D– Tx OutputRise/Fall Time
TTX-RISE
TTX-FALL
Specified Specified
Tx Rise/FallMismatch
TRF-MISMATCH Not Specified Specified
AC Peak-to-PeakCommon ModeOutput Voltage
VTX-CM-AC-PP Not Specified Specified
AC Peak CommonMode OutputVoltage
VTX-CM-AC-P Specified Specified
Absolute Delta ofDC Common ModeVoltage betweenD+ and D–
VTX-CM-DC-LINE-DELTA Specified Specified
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Differential receiver (Rx) input measurements*
Parameter Symbol(s) 2.5 GT/sRev 1.1/2.0
5 GT/sRev 2.0
Clock Recovery NA Specified Not SpecifiedUnit Interval UI Specified SpecifiedMinimum ReceiverEye Opening
VRX_EYE Specified Specified
ReceiverDeterministic Jitter– DJ
TRX_DJ_DD Not Specified Specified
Minimum WidthPulse at Rx
TRX-MIN-PULSE Not Specified Specified
Maximum Timebetween theJitter Medianand MaximumDeviation from theMedian
TTX-EYEMEDIAN-to-MAXJITTER Specified Not Specified
Rx AC CommonMode Voltage
VRX-CM-AC-P Specified Specified
* The Rx input measurements are not specified for 8 GT/s.
Supported CEM specificationmeasurements
Add-in Card 8 GT/s transmitter path compliancemeasurements
Parameter Symbol
Transition Eye Voltage PCIe V-TXANontransition Eye Voltage PCIe V-TXA-dEye Width PCIe T-TXA
Add-in Card transmitter path compliancemeasurements
Parameter Symbol(s) 2.5 GT/sRev 1.1/2.0
5 GT/sRev 2.0
Clock Recovery NA Specified SpecifiedUnit Interval UI Specified SpecifiedEye Height ofTransition Bits
VTXA Specified Specified
Eye Height ofNontransition Bits
VTXA_d Specified Specified
Eye Width withSample Size of 106
UI
TTXA in Rev 1.1 Specified Not Specified
Jitter Eye Openingat BER 10–12
TTXA in Rev 2.0 Specified Specified
MaximumMedian-Max JitterOutlier with SampleSize of 106 UI
JTXA-MEDIAN-to-MAX-JITTER Specified Not Specified
Total Jitter atBER 10–12
TJ at BER 10–12 Not Specified Specified
Deterministic Jitterat BER 10–12
Max DJ Not Specified Specified
System board transmitter path measurements
Parameter Symbol(s) 2.5 GT/sRev 1.1/2.0
5 GT/sRev 2.0
Clock Recovery NA Specified SpecifiedUnit Interval UI Specified SpecifiedEye Height ofTransition Bits
VTXS Specified Specified
Eye Height ofNontransition Bits
VTXS_d Specified Specified
Eye Width withSample Size of 106
UI
TTXS in Rev 1.1 Specified Not Specified
Jitter Eye Openingat BER 10–12
TTXS in Rev 2.0 Specified Specified
MaximumMedian-Max JitterOutlier with SampleSize of 106 UI
JTXA-MEDIAN-to-MAX-JITTER Specified Not Specified
Total Jitter atBER 10–12
TJ at BER 10–12 Not Specified Specified
Deterministic Jitterat BER 10–12
Max DJ Not Specified Specified
Reference clock measurements
Parameter Symbol 2.5 GT/sRev 1.1/2.0
Reference Clock Phase Jitter atBER 10–6
NA Specified
PCI ExpressModule™measurements
ExpressModule Add-in Card transmitter pathmeasurements
Parameter Symbol Rev 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VTXA SpecifiedEye Height of Nontransition Bits VTXA_d SpecifiedEye Width with Sample Size of 106 UI TTXA
in Rev 1.1Specified
Jitter Eye Opening at BER 10–12 NA SpecifiedMaximum Median-Max Jitter Outlierwith Sample Size of 106 UI
JTXA-MEDIAN-to-MAX-JITTER Specified
ExpressModule system board transmitter pathmeasurements
Parameter Symbol Gen1Rev 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VTXS SpecifiedEye Height of Nontransition Bits VTXS_d SpecifiedEye Width with Sample Size of 106 UI TTXS SpecifiedJitter Eye Opening at BER 10–12 NA SpecifiedMaximum Median-Max Jitter Outlierwith Sample Size of 106 UI
JTXA-MEDIAN-to-MAX-JITTER Specified
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Datasheet
PCI Express external cabling measurements
External cabling transmitter path measurements
Parameter Symbol Rev 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VTXA SpecifiedEye Height of Nontransition Bits VTXA_d SpecifiedJitter Eye Opening at BER 10–12 TrxA at BER 10–12 SpecifiedEye Width with Sample Size of 106 UI TrxA at 106 Samples Specified
External cabling receiver path measurements
Parameter Symbol Gen1Rev 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VRXA SpecifiedEye Height of Nontransition Bits VRXA_d SpecifiedJitter Eye Opening at BER 10–12 TrxA at BER 10–12 SpecifiedEye Width with Sample Size of 106 UI TrxA at 106 Samples Specified
PCMCIA ExpressCard™measurements
ExpressCard – Module transmitter pathmeasurements
Parameter Symbol Release 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VTXA SpecifiedEye Height of Nontransition Bits VTXA_d SpecifiedEye Width across Any 250 UIs TTXA Specified
ExpressCard™ – Host system transmitter pathmeasurements
Parameter Symbol Release 1.0
Clock Recovery NA SpecifiedUnit Interval UI SpecifiedEye Height of Transition Bits VtxS SpecifiedEye Height of Nontransition Bits VtxS_d SpecifiedEye Width across Any 250 UIs TTxS Specified
MXMmeasurements
PCI Express measurements*1
Parameter Symbol Release 1.1
Eye Height of Transition Bits VTXS SpecifiedEye Height of Nontransition Bits VTXS_d SpecifiedWidth at BER TTXS SpecifiedDeterministic Jitter DJ SpecifiedTotal Jitter TJ Specified
*1 All de-emphasis levels supported.
Ordering informationRecommended DPO/MSO70000 Series oscilloscopes
2.5 Gb/s (PCI Express 1.0/1.1): DPO/MSO70000 Series(6 GHz or higher bandwidth models)
5.0 Gb/s (PCI Express 2.0): DPO/MSO70000 Series(12.5 GHz or higher bandwidth models)
8.0 Gb/s (PCI Express 3.0): DPO/MSO70000 Series(16 GHz or higher bandwidth models, minimum of 12.5 GHz isrecommended)
PCE3*2
PCI Express 3.0/2.0/1.x Physical-layer Test ApplicationModel New instrument
ordersProductupgrades
Floatinglicenses
DPO/MSO70KSeries
Opt. PCE3 Opt. DPO-UP PCE3 Opt. DPOFL-PCE3
*2 Requires Option DJA (DPOJET Jitter and Eye Diagram Analysis) and Option SDLA64 (Serial Data LinkAnalysis Visualizer). Option DJA is standard on MSO70000 Series oscilloscopes, and can be ordered forDPO70000 Series oscilloscopes.
Recommended accessories
Order Description
P7500 and P7600 Series TriMode™ Differential ProbeOption SDLA64 Serial Data Link Analysis Visualizer
Recommended for automated DUT control
Order Description
Tektronix AFG3252 Arbitrary Function GeneratorTektronix AFG3252C Arbitrary Function GeneratorTektronix AWG5002B/C Arbitrary Waveform GeneratorTektronix AWG5012B/C Arbitrary Waveform GeneratorTektronix AWG5014B/C Arbitrary Waveform GeneratorTektronix AWG7082B/C Arbitrary Waveform GeneratorTektronix AWG7122B/C Arbitrary Waveform GeneratorTektronix AWG70001A Arbitrary Waveform GeneratorTektronix AWG70002A Arbitrary Waveform Generator
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Test setup connection diagrams
Automatic and manual DUT control for x1, x4, x8, or x16 DUTs (add-in cards) connection diagram
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Datasheet
Automatic DUT control for x1 or x16 DUTs (platforms) connection diagram
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Manual DUT control for x1 or x16 DUTs (platforms) connection diagram
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Datasheet
Automatic DUT control for x4 or x8 DUTs (platforms) connection diagram
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Manual DUT control for x4 or x8 DUTs (platforms) connection diagram
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Datasheet
Recommended test fixture and cable accessories
Diagram reference Part number Quantity Description Vendor
CBB3 CBB3 1 PCI Express Compliance BaseBoard (CBB), revision 3.0For testing PCI Express Add-inCards
PCI-SIGwww.pcisig.com/specifications/order_form
x1/x16 CLB3 x1/x16 CLB3 1 PCI Express Compliance LoadBoard (CLB3), revision 3.0For testing PCI Express Platforms
PCI-SIGwww.pcisig.com/specifications/order_form
x4/x8 CLB3 x4/x8 CLB3 1 PCI Express Compliance LoadBoard (CLB3), revision 3.0For testing PCI Express Platforms
PCI-SIGwww.pcisig.com/specifications/order_form
Power supply 1 ATX power supply Any ATX-qualified PC power supply
SMP terminator ST2645 Quantity neededper PCIe DUTlink width:x1: 0x4: 6x8: 14x16: 30
50 Ω, limited detent, SMPterminators
Fair View Microwavewww.fairviewmicrowave.com/Scripts/showPart.asp?ItemID=ST2645
BNC-to-SMA adapters 015-1018-00 2 BNC to SMA adapter Tektronixwww.tektronix.com
GPIB cable CIF24-xxM 1 GPIB cable, choice of lengths atvendor website
L-COMwww.l-com.com/ieee-488-gpib-deluxe-ieee-488-cable-50m#
SMA-to-SMA cable set,1 meter
174-5771-00 1 set Phase-matched SMA to SMAcable set (2 cables), 1 meter
Tektronixwww.tektronix.com
SMA-to-SMP cable,right-angle, 4 inches
603841(71L-19K2-32K1-00102D)
2 SMA to SMP cable, right-angleconnector, 4 inches
Rosenbergerwww.rosenbergerna.com
SMA-to-SMP cable set,1 meter
101462 1 set Matched SMA to SMP straightcable set (2 cables), 1 meter
Rosenbergerwww.rosenbergerna.com
SMP-to-SMP cable,right-angle connectors,12 inches
71L-19K2-19K2-00305C 2 SMP to SMP cable, right-angleconnectors, 12 inches
Rosenbergerwww.rosenbergerna.com
SMA torque screwdriver ST-SMA8 1 SMA torque screwdriver, 8.0 in-lbs Fair View Microwavewww.fairviewmicrowave.com/Scripts/showPart.asp?ItemID=ST-SMA8
SMA torque wrench ST-SMA3 1 SMA torque wrench, 8.0 in-lbs Fair View Microwavewww.fairviewmicrowave.com/Scripts/showPart.asp?ItemID=ST-SMA3
SMP cable extractiontool
MMTL2682 1 SMP right-angle cable extractiontool
Fair View Microwavewww.fairviewmicrowave.com/Scripts/showPart.asp?ItemID=MMTL2682
SMP terminatorinstall/extract tool
MMTL4991 1 SMP terminatorinstallation/extraction tool
Fair View Microwavewww.fairviewmicrowave.com/Scripts/showPart.asp?ItemID=MMTL4991
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Pictures of recommended test fixture and cableaccessories
CBB3 test fixture
x1/x16 CLB3 test fixture
x4/x8 CLB3 test fixture
ATX power supply
SMP terminator
BNC to SMA adapter
GPIB cable
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Datasheet
SMA to SMA cables, 1 meter
SMA to SMP cables, right angle connectors, 4 inch
SMA to SMP cables, 1 meter
SMP to SMP cables, right angle connectors, 12 inches
SMA torque screwdriver
SMA torque wrench
SMP cable right-angle connector extraction tool
SMP terminator install/extract tool
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PCI Express® Transmitter Compliance and Debug — DPO/MSO70000 Series Option PCE3
Additional information
PCI Express 3.0 receiver testing
PCIe receiver test setup
A complete PCI Express 3.0 Receiver testing solution from Tektronix. Includesstressed pattern generation as required by PCI-SIG test specifications and supportfor automated clock multiplication and eye opening measurements. Automated DUTloopback control simplifies the testing process and reduces time to test results. Thereceiver testing solution also supports adding pre-emphasis to the stress pattern,common-mode interference testing, and PLL loop BW testing.
The Receiver testing solution consists of the following components:
BERTScope C Model for Pattern Generation, stressed eye sources, andError Detection
New DPP125C Option ECM that provides Eye opener, Clock doublerand clock Multiplier functionality
New BSAITS125 that provides CM/DM interference and compliant ISIchannels and programmable, variable expanded ISI with Opt EXP
New Opt PCIE8G PLL analysis for Gen1/2/3
New BSAPCI3 SW for Auto calibration, link training, and testing
MSO/DPO70000 Series Real-Time Oscilloscope for calibration
TLA7SA00 Series Protocol Analyzers
TLA7SA00 series instrument
TLA7SA00 data views
The TLA7SA00 Series logic protocol analyzer modules provide an innovativeapproach to PCI Express validation that spans all layers of the protocol from thephysical layer to the transaction layer. Feature rich software provides improvedinformation density for viewing statistical summary and protocol analysis usinginnovative Transaction and Summary Profile windows. Hardware capabilitiesincluding hardware acceleration, OpenEYE, ScopePHY, and FastSYNC provide fastaccess to data and helps shorten the time it takes to build confidence in the testsystem. Powerful trigger and filtering capabilities provide the ability to quickly focuson the data of interest. Provides a complete suite of probing solutions targeted forvarious form factors and applications.
Tektronix is registered to ISO 9001 and ISO 14001 by SRI Quality System Registrar.
Product(s) complies with IEEE Standard 488.1-1987, RS-232-C, and with TektronixStandard Codes and Formats.
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Datasheet Contact Tektronix:
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