NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation...

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The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments

Transcript of NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation...

Page 1: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

The Next Evolution of Instrumentation for Microwave Test

Jin Bains

RF R&D Director

National Instruments

Page 2: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

The Complexity of Testing Systems of Systems

EISCAT_3DA European 3D Imaging Radar for

Atmospheric and Geospace Research

www.airbus.com www.esa.int

www.eurofighter.com

www.selex-si.com

Page 3: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

RADAR Technologies: Cognitive Radar

Joseph R. Guerci, Microwave Journal, Vol.54, No.1, January 2011

Page 4: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Vacuum Tube Transistor(Integrated Circuit)

Software

Evolution of Instrumentation

1920

General Radio

Hewlett Packard

National Instruments

1965 2010

Page 5: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

The Virtual Instrumentation Approach

The Software Is the Instrument

Page 6: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Future of RF System Design

RF/Microwave Circuit Design System SimulationRF/Microwave Circuit DesignElectromagnetic Simulation

Link Budget Analysis

Real-Time ControlFPGA Prototype

Product Verification

Design Verification

Operations & Support

Validation & Verification

ManufacturingDesign &

SimulationResearch & Modeling

Concept

Test for Validation

Test Integration With Design/Analysis

Page 7: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Comparing Traditional and Virtual Instrumentation Architectures

Traditional Instrumentation Virtual Instrumentation

Page 8: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Expanding Measurement CapabilitiesA

ccura

cy (

Bits)

26

24

22

20

18

16

14

1212

10

8

41 10 100 1K 10K 100K 1M 10M 100M 1G 10G 100G

Sampling Rate (S/s)

6

Traditional InstrumentsNI Products, 2011NI Products, 2004NI Products, 1995

Phase Matrix Products and Technology

Page 9: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Parallel Architectures Drive Performance

FPGAFPGAFPGAFPGA

PerformancePerformancePerformancePerformance

(GMACs)(GMACs)(GMACs)(GMACs)500500500500

5,0005,0005,0005,000

500500500500

5,0005,0005,0005,000

FPGAsFPGAsFPGAsFPGAs

6.737 TMACs

CPUCPUCPUCPU

PerformancePerformancePerformancePerformance

(GFLOPs)(GFLOPs)(GFLOPs)(GFLOPs)

1997199719971997 2001200120012001 2002200220022002 2004200420042004 2005200520052005 2006200620062006 20092009200920091999199919991999

5555

50505050

5555

50505050

CPUsCPUsCPUsCPUs

2010201020102010 2011201120112011

Page 10: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Enabling High-Performance Microwave Test

• Rugged, modular form factor

PXI: Hardware Platform Based on COTS

Multicore ProcessorsPCI Express FPGAs Data Converters

Riding Moore’s Law

• Rugged, modular form factor

• High-speed data movement

• Timing and synchronization

• Optimization for parallel execution

Page 11: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Parallel Programming With NI LabVIEW

Task Parallelism Data Parallelism Pipelining

FPGAsMulticore

Processors

Page 12: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

DSP Design Module Value

Enables an algorithm designer to specify an intuitive diagram…

…that generates real-time DSP implementations on FPGAs:…that generates real-time DSP implementations on FPGAs:

Page 13: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Traditional RF Spectrum Analyzers

Analog Architecture

Page 14: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Modern RF Measurement System

Software for Wireless Standards(802.11 a/b/g/n, GSM, EDGE,

WCDMA, RFID, WiMAX,

GPS, and so on)

Modular Hardware Architecture

Downconverter – Digitizer – FPGA+Processor

Page 15: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

High-Accuracy Instruments—NI PXIe-5665

• 20 to 14 GHz frequency range• Phase noise -129 dBc/Hz at 10 kHz offset• Average noise floor: -165 dBm/Hz @ 1 GHz• TOI - +24 dBm• WCDMA ACLR: -80 dBc• .33% 256 QAM EVM

Page 16: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Test Monitor Embedded Control Cyber Physical

Graphical System DesignA Platform-Based Approach

Modular InstrumentsPC-Based DAQ NI CompactRIO Open Connectivity

Page 17: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Modular PXI Platform Based on COTS

Multicore ProcessorsPCI Express FPGAs Data Converters

Riding Moore’s Law

PXI BackplaneChassis• System monitoring PXI Backplane

• Bus technology

• Timing

• Synchronization

Peripheral Slots• PXI and PXI Express hybrid slots

• >1500 PXI modules from >70 vendors

• System monitoring

PXI Controller•Multicore

•Integrated MXI

System Services• System-level assembly and test

• High availability and extended

lifetime agreements

Page 18: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Key Technologies Driving Radar

Hardware Software ServicesHardware

• RF vector signal analyzer (channels phase-synchronized)

• RF vector signal generator (channels phase-synchronized)

• IF digitizers and arbitrary waveform generators

• High-speed digital I/O

• High-speed data streaming

• Inline signal processing

Software

• Collaborative software development environments

• Flexible user interface

• Test management software

• User-defined signal processing

Services

Page 19: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

NI Reconfigurable I/O (RIO) Technology Platform

LabVIEWLabVIEW Real-Time

LabVIEW FPGA

LabVIEWLabVIEW Real-Time

LabVIEW FPGA

ProcessorProcessor FPGAFPGA

I/OI/O

I/OI/O

Middleware

Driver APIs

Device Drivers

I/O Drivers

Application IP

Signal Processing IP

Control IP

Third-Party IP

NI CompactRIO and NI Single-Board RIONI CompactRIO and NI Single-Board RIO PXI,PC RIO (R Series, NI FlexRIO)PXI,PC RIO (R Series, NI FlexRIO)

Value

Value Ultrarugged Design Performance High Performance

ProcessorProcessor FPGAFPGA I/OI/O

Custom I/OCustom I/O

Page 20: NI-EuMW Panel The Next Evolution of Instru for MiW Test · The Next Evolution of Instrumentation for Microwave Test Jin Bains RF R&D Director National Instruments. The Complexity

Test Monitor Embedded Control Cyber Physical

Graphical System DesignA Platform-Based Approach

Performance

Cost

Modular Instruments

PC-Based DAQ NI CompactRIO Open Connectivity

Integration

Development

productivity