MODEL 5000 SERIES TEST SYSTEMS - gkzhan2011/09/02 · EN55022 1994 EN50082-1 1992 IEC 801-2 1991...

MODEL 5000 SERIES TEST SYSTEMSManual
Scientific Test, Inc. 1110 E. Collins Blvd., #130 Richardson, Texas 75081
www.scitest.com Email: [email protected]
Version 1.23 March 25, 2008
Copyright© 2005 Scientific Test, Inc. All rights reserved
LIMITED WARRANTY
SCIENTIFIC TEST, INC. (STI) WILL REPAIR (OR AT ITS OPTION, REPLACE) THE SERIES 5000 TESTER (PRODUCT) FREE OF CHARGE FOR PARTS AND LABOR FOR A PERIOD ONE (1) YEAR FROM THE DATE OF PURCHASE IF STI FINDS IT TO BE DEFECTIVE IN MATERIAL OR WORKMANSHIP, PROVIDED THE PRODUCT IS RETURNED (SHIPPING PREPAID AND PROPERLY PACKED) TO STI. THIS WARRANTY DOES NOT APPLY IF, IN THE OPINION OF STI, THE PRODUCT HAS BEEN DAMAGED BY ACCIDENT, MISUSE, NEGLECT, IMPROPER PACKING OR IMPROPER MODIFICATIONS OR SERVICE. IN THE EVENT THIS PRODUCT SHALL PROVE DEFECTIVE IN WORKMANSHIP OR MATERIALS THE PURCHASER’S SOLE REMEDY SHALL BE THE REPAIRS STATED IN THIS WARRANTY AND UNDER NO CIRCUMSTANCES SHALL STI BE LIABLE FOR ANY LOSS OR DAMAGE, DIRECT, INCIDENTAL OR CONSEQUENTIAL ARISING OUT OF THE USE OF, OR INABILITY TO USE, THIS PRODUCT CAUSED BY ANY DEFECT IN THE PRODUCT. THIS WARRANTY IS IN LIEU OF ALL OTHER WARRANTIES, EXPRESS OR IMPLIED, AND STI HEREBY DISCLAIMS ALL OTHER WARRANTIES OF MERCHANTABILITY
AND FITNESS FOR A PARTICULAR PURPOSE.
EC DECLARATION OF CONFORMITY We Scientific Test, Inc. 3306 W. Walnut Suite 412 Garland, TX 75042 U.S.A. Declare under our sole responsibility that the 5300S and 5300HS To which this declaration relates is in conformity with the following standard(s) or other normative document(s). EN55022 1994 EN50082-1 1992 IEC 801-2 1991 IEC 801-3 1991 ENV 50204 1996 IEC 801-4 1988 EN 61010-1 Following provisions of the Electromagnetic Compatibility (89/336/EEC) Directive and Low Voltage (73/23/EEC) Directive. The Technical Construction File is maintained at Scientific Test, Inc. at the address listed above. The authorized representative located in the community is:
Safety Summary
Please take a moment to review these safety precautions. They are provided for your protection and to prevent damage to the system. This safety information applies to all operators and service personnel.
Symbols and Terms These symbols appear on the equipment:
ATTENTION Refer to Manual
Do Not Perform Service Alone
Do not perform internal service or adjustments of this product unless another person capable of rendering first aid and resuscitation is present.
Use Care When Servicing With Power On
Dangerous voltages which may exceed 2KV exist at several points in this product. To avoid personnel injury, do not touch exposed connections or components while power is on. Disconnect power before removing protective panels, soldering or replacing components.
Disconnect Power
To avoid electrical shock, disconnect the main power by means of the power cord or the power switch.
Specific Precautions
Observe all the following precautions to ensure your personal safety and to prevent damage to either the system or equipment connected to it.
Power Source The system is grounded through the power cord. To avoid electrical shock, plug the power cord into a properly wired receptacle with an earth ground connection. Do this before making connections to the input or output terminals of the system. Without the protective ground connection, all parts of the system are potential shock hazards. This includes connectors and controls that may appear to be insulators.
Use The Proper Power Cord Use only an appropriate power cord which has provisions for a ground connection and is rated for the amount of current and voltage specified on the rear of each system. Use only a power cord that is in good condition.
Use The Proper Fuse To avoid fire hazard, use only a fuse that meets all type, voltage and current specifications as shown below: IEC 127: 5 by 20 mm, time lag, 1A, 250V, Type T or IEC 127: 5 by 20 mm, time lag, 2A, 120V, Type T
Do Not Remove Covers To avoid personal injury, do not operate the system without the covers.
Do Not Operate in Explosive Atmospheres The system provides no explosion protection from static discharge or arcing components. Do not operate the system in an atmosphere of explosive gases.
Do Not Operate The System In A Manner Not Specified Failure to operate the system as described in this manual may result in serious injury or death.
Use Care When Operating System Dangerous voltages can exist at the front terminals that may exceed 2KV. To
avoid personal injury or death, exercise caution when operating system.
Power and Environmental Characteristics
Power Requirements and Frequency 100 to 132 VACRMS, for 47 Hz through 63 Hz 200 to 240 VACRMS, for 47 Hz through 63 Hz
Temperature 25ºC ± 5ºC
Relative Humidity To 50% at or below 30ºC
Ventilation Requirements Equipment should be located no closer than 4 cm from the wall in a well ventilated room.
Installation/Overvoltage Catagory II
ESD Susceptibility The following areas can be static sensitive: Screws, seams, toggle switches, ports and the start/stop switch.
TABLE OF CONTENTS
Table of Contents
1.1.3 Math Expression ............................................................................................................ 1-2
1.1.6 Mux Capabilities ............................................................................................................. 1-2
1.3.2 Load Resistors ............................................................................................................... 1-5
1.3.4 Device Fixture ................................................................................................................ 1-5
1.3.5 Safety Interlock .............................................................................................................. 1-6
1.3.7 Start / Stop Push-Button ................................................................................................ 1-6
1.3.8 Repetitive / Single Test Switch (LED) ............................................................................ 1-6
1.3.9 Numbered Lamps .......................................................................................................... 1-6
1.3.11 Adaptor Control / Relay Control Connector .......................................................... 1-7
TABLE OF CONTENTS
2 INSTALLATION ............................................................. 2-1
2.1.1 Inspection / Repacking .................................................................................................. 2-1
2.1.2 Power / Grounding ........................................................................................................ 2-1
2.1.3 Line Noise ...................................................................................................................... 2-2
2.1.4 Self-Test Diagnostic ...................................................................................................... 2-2
2.2.2 Electronic Start-Test ...................................................................................................... 2-4
2.2.3 Mechanical Start-Test ................................................................................................... 2-5
2.2.5 5000 Series Tester Handler Control Cable Wire List .................................................... 2-5
2.2.6 Handler Interface Schematic ......................................................................................... 2-6
2.2.7 Optional Prober Interface .............................................................................................. 2-6
2.3 Adaptor Control ......................................................................................... 2-6
2.5 Product Support ........................................................................................ 2-8
3.1.2 Analog Board ................................................................................................................. 3-2
3.2 Power Sources .......................................................................................... 3-2
3.2.2 Lo Source Board............................................................................................................ 3-3
3.3 Test Sequence .......................................................................................... 3-4
3.4 Oscillation Suppression ............................................................................ 3-5
4 SPECIFICATIONS ......................................................... 4-1
TABLE OF CONTENTS
4.3 Model 5000E Device Tests ....................................................................... 4-3
4.4 Model 5300HX Test Specifications ........................................................... 4-4
Model 5300HX Device Tests ............................................................................... 4-7
4.5 Maximum Power Curves........................................................................... 4-8
6.3.1 Runtime .......................................................................................................................... 6-2
6.4.1 Capture ........................................................................................................................ 6-17
6.4.13 Clear Window ...................................................................................................... 6-19
6.4.14 Clear Error ........................................................................................................... 6-19
6.4.15 Auto Verify ........................................................................................................... 6-19
6.5.1 Lot Summary ................................................................................................................ 6-19
6.5.3 Zero Counts ................................................................................................................. 6-19
6.5.8 Excel Spreadsheet ...................................................................................................... 6-20
6.6.2 Options Tab ................................................................................................................. 6-25
6.6.3.1 Sorting and Binning ............................................................................................ 6-27
6.6.3.2 Sorting and Binning Modes ................................................................................ 6-28
6.6.4 Relay Plan Tab ............................................................................................................ 6-30
6.6.5 Extended Relay Plan Tab ............................................................................................ 6-30
6.6.6 ADP-401 Scanner Plan Tab ........................................................................................ 6-30
6.7 Special Software Options ........................................................................ 6-31
6.7.1 Bin 1 Only for Pass ...................................................................................................... 6-31
6.7.2 Device Retest .............................................................................................................. 6-31
6.7.3 Excel Spreadsheet ...................................................................................................... 6-31
6.8 Communicating With STI 5000 Series Tester ......................................... 6-31
6.8.1 Serial Communications ............................................................................................... 6-31
6.8.2 Sending Information .................................................................................................... 6-31
6.8.3 Receiving Information .................................................................................................. 6-37
7 MAINTENANCE / TROUBLESHOOTING ..................... 7-1
7.1.4 Firmware (Software) Update ......................................................................................... 7-1
7.2 Self-Test.................................................................................................... 7-2
7.2.2 Auto Calibration ............................................................................................................. 7-2
7.3 Troubleshooting ........................................................................................ 7-3
TABLE OF CONTENTS
7.3.1 Extender Board and Cables ........................................................................................... 7-4
7.3.2 Replacing Components.................................................................................................. 7-5
7.3.6 Interchanging Individual Boards .................................................................................... 7-7
7.3.7 Failure to Resolve Error ................................................................................................. 7-7
7.4 Manual Calibration Procedures ................................................................ 7-7
7.4.1 Power Supply Voltages .................................................................................................. 7-7
7.4.2 Trim Pot Adjustments / Board Calibration (5000E / 5300HX)........................................ 7-8
7.4.3 100V / µSec VL Calibration .......................................................................................... 7-10
7.4.4 Auxiliary Low Source Calibration ................................................................................. 7-11
7.4.5 Leakage Compensation ............................................................................................... 7-11
7.5 System Verification ................................................................................. 7-11
7.6 Self Test Error Code Reference Table ................................................... 7-14
7.7 Error Code Block Diagrams .................................................................... 7-20
8 LOW CURRENT DECK ................................................. 8-1
8.1 Installation ................................................................................................ 8-1
8.2 Programming ............................................................................................ 8-2
8.4.2 5000 Series Tester Self-Test ......................................................................................... 8-5
8.4.3 Lo Current Deck Self-Test ............................................................................................. 8-5
8.4.4 Low Current Deck Self-Test Error Codes Table ............................................................ 8-7
9 HIGH CURRENT DECK ................................................ 9-1
9.1 Installation ................................................................................................ 9-1
TABLE OF CONTENTS
9.3 Operation .................................................................................................. 9-3
9.3.1 Check-Out ..................................................................................................................... 9-3
10.1 Installation ............................................................................................... 10-1
10.2 Programming .......................................................................................... 10-2
10.3 Operation ................................................................................................ 10-3
11.1 Installation ............................................................................................... 11-1
11.2 Programming .......................................................................................... 11-2
12 MULTIPLEXER ............................................................ 12-1
12.1 Description .............................................................................................. 12-1
12.2 Installation ............................................................................................... 12-1
12.3 Operation ................................................................................................ 12-2
12.5 Multiplex Error Messages / Self-Test Errors............................................ 12-3
13 APPENDICES .............................................................. 13-1
Anode Monitor ................................................................................................... 13-3
GS Monitor ......................................................................................................... 13-3
Overview ............................................................................................................ 13-5
Overview ............................................................................................................ 13-9
Appendix D Optional Kelvin Test ............................... 13-11
Kelvin Enclosure ............................................................................................. 13-11
Transistor VBEON and hFE ................................................................................. 13-15
Transistor ICEO Test ......................................................................................... 13-15
Transistor BVCE Test ....................................................................................... 13-15
13.1.3 BVCEO(SUS) .......................................................................................................... 13-16
13.1.4 BVCER,S,V ..................................................................................................................... 13-16
MOSFET VGSF and VGSR Tests ........................................................................ 13-17
Appendix G Opto-Logic (ADP-370) ............................. 13-19
Description ...................................................................................................... 13-19
VOH Test .......................................................................................................... 13-20
VOL Test ........................................................................................................... 13-20
IFON Test .......................................................................................................... 13-20
IFOFF Test ......................................................................................................... 13-21
Hysteresis (Calculation) .................................................................................. 13-21
ADP-360 .......................................................................................................... 13-23
13.1.12 ID ....................................................................................................................... 13-26
Impulse Reset Test .......................................................................................... 13-29
VB Test ............................................................................................................. 13-31
Note ................................................................................................................. 13-32
Function .................................................................................................................................. 13-33
Self Test (ADP-340-4 / 5 / Gated / 10x1000) ................................................... 13-42
Calibration (10x1000 Pulse Option) ................................................................. 13-48
Appendix J Zener Impedance .................................... 13-51
Zener Impedance Tests: ZZK, ZZT ................................................................... 13-51
Appendix K EXT-100 Interface Board ........................ 13-53
Overview .......................................................................................................... 13-53
Definitions ........................................................................................................ 13-54
TABLE OF CONTENTS
VBO / IBO tests .................................................................................................. 13-57
IH, VD, ID, VTM ................................................................................................... 13-58
STS (Silicon Trigger Switch), SBS and 4 Layer Diode Tests .......................... 13-59
13.1.13 VS / IS Tests ....................................................................................................... 13-59
13.1.14 IH Tests .............................................................................................................. 13-60
13.1.15 IB Tests .............................................................................................................. 13-60
13.1.16 VF Tests ............................................................................................................. 13-60
13.1.17 VS1 – VS2 ............................................................................................................ 13-60
Description ...................................................................................................... 13-61
Overview ......................................................................................................... 13-65
Installation ....................................................................................................... 13-65
Test Operation ................................................................................................ 13-66
RCOIL Test ........................................................................................................ 13-66
VOPER Test ....................................................................................................... 13-66
VREL Test ......................................................................................................... 13-66
RCONT Test ....................................................................................................... 13-67
OPTIME Test ..................................................................................................... 13-67
Appendix O VCE Sustaining (ADP-410) ....................... 13-69
Description ....................................................................................................... 13-69
Installation ....................................................................................................... 13-70
Operation ......................................................................................................... 13-70
Appendix Q Scanner (ADP-401) .................................. 13-73
Description ....................................................................................................... 13-73
14 APPLICATION NOTES ............................................... 14-1
14.1 APP-001 Limit (clamp) the voltage in Triac VD tests .............................. 14-3
14.2 APP-002 5 Pin Module Kelvin Test for SSOVP .................................... 14-7
14.3 APP-003 STI Series 5000 Tester/SPC Software ................................. 14-9
14.4 APP-004 STI Data Information File (.INF) .......................................... 14-11
14.5 APP-005 Data Logging, Binning and Sorting ..................................... 14-13
14.6 APP-006 Opto Switch ........................................................................ 14-17
14.7 APP-007 IEEE-488 Interface Option .................................................. 14-19
14.8 APP-008 Multiple Testers on One PC ................................................ 14-23
14.9 APP-009 Excel® with Datalog Data .................................................... 14-25
15 PARTS LISTS / SCHEMATICS ................................... 15-1
15.1 Component Level and Relay Spares Kits ............................................... 15-1
15.2 Test Fixtures ........................................................................................... 15-2
15.3 Self-Test Fixture ...................................................................................... 15-2
15.7 80 Volt Gate Modification ........................................................................ 15-9
15.8 Analog Board Assembly ........................................................................ 15-10
TABLE OF CONTENTS
15.9 Relay Board Assembly ......................................................................... 15-11
15.10 Control Board Assembly ................................................................... 15-13
15.11 Low Current Deck Assembly ............................................................. 15-14
15.11.1 Front Panel Assembly ....................................................................................... 15-14
15.11.2 Rear Panel Assembly ........................................................................................ 15-14
15.11.3 Base Plate Assembly ........................................................................................ 15-14
15.11.4 LCD Self-test Fixture Assembly ........................................................................ 15-15
15.11.5 “A” Board Assembly .......................................................................................... 15-15
15.11.6 “G-K” Board Assembly ...................................................................................... 15-15
15.12 High Current Deck Assembly ............................................................ 15-16
15.12.1 Front Panel Assembly ....................................................................................... 15-16
15.12.2 Rear Panel Assembly ........................................................................................ 15-17
15.12.3 Card Cage Assembly ........................................................................................ 15-17
15.12.4 Base Plate Assembly ........................................................................................ 15-17
15.12.5 HC Relay Board Assembly ................................................................................ 15-18
15.12.6 125 AMP PA#1 & PA#3 Board Assembly ......................................................... 15-18
15.12.7 125 AMP PA#2 & PA#4 Board Assembly ......................................................... 15-20
15.13 Prober / Handler Board Assembly ..................................................... 15-20
15.14 Extended Range Board Assembly .................................................... 15-20
TABLE OF CONTENTS
xii Version 1.23 MODEL 5000 SERIES MANUAL
List of Figures Figure 1-1 Optional Mux4S with Manual Station, Low Deck, High Deck and Handler ....................... 1-3
Figure 2-1 Relay Handler Interface ..................................................................................................... 2-4
Figure 2-2 Handler Timing Diagram .................................................................................................... 2-5
Figure 3-1 Simplified Test Configuration ............................................................................................. 3-1
Figure 3-2 Test Timing Diagram ......................................................................................................... 3-4
Figure 4-1 Power Curve for Leakage and Breakdown Tests .............................................................. 4-8
Figure 4-2 On-State and Gain Tests ................................................................................................... 4-9
Figure 4-3 High Current Options ......................................................................................................... 4-9
Figure 6-1 Wafer Map Initial Screen ................................................................................................... 6-8
Figure 6-2 Example Wafer Map (Test Parameter) .............................................................................. 6-9
Figure 6-3 Curve Trace Setup Window (MOSFET IS Test) .............................................................. 6-10
Figure 6-4 Curve Trace Setup Window (MOSFET RDSON Test) .................................................... 6-10
Figure 6-5 Curve Trace Setup Window (IGBT ICON Test) ............................................................... 6-11
Figure 6-6 IGBT ICON vs VCE Curve Trace .................................................................................... 6-11
Figure 6-7 Excel Formatted Curve Trace .......................................................................................... 6-12
Figure 6-8 Mainframe Configuration Screen ..................................................................................... 6-13
Figure 6-9 Test Program Test Step Tab ........................................................................................... 6-21
Figure 6-10 Test Program Device Test Edit Window ........................................................................ 6-21
Figure 6-11 Test Program Calculation Step Edit Window ................................................................ 6-22
Figure 6-12 Test Program Options Tab ............................................................................................ 6-25
Figure 6-13 Test Program Bin/Sort Tab ............................................................................................ 6-27
Figure 7-1 Flash Disk Installation ........................................................................................................ 7-2
Figure 7-2 Self-Test Block 1.............................................................................................................. 7-21
TABLE OF CONTENTS
Figure 7-15 Self-Test Block 14 .......................................................................................................... 7-34
TABLE OF CONTENTS
Figure 7-52 Self-Test Block 51 ......................................................................................................... 7-71
Figure 7-81 Self-Test Block 80 ....................................................................................................... 7-100
Figure 7-85 Self Test Block 84 ........................................................................................................ 7-104
TABLE OF CONTENTS
Figure 7-89 Self-Test Block 93 ........................................................................................................ 7-108
Figure 7-96 Self-Test Block 100 ...................................................................................................... 7-115
Figure 8-1 LCD Installation Diagram ................................................................................................... 8-2
Figure 9-1 High Current Deck Cable Hookup Diagram ....................................................................... 9-2
Figure 10-1 ADP-401A Simplified Schematic .................................................................................... 10-1
Figure 10-2 ADP-401A Connection Diagram .................................................................................... 10-2
Figure 10-3 ADP-401A Scanner Tab ................................................................................................ 10-2
Figure 11-1 Model 6010 Installation Diagram ................................................................................... 11-1
Figure 12-1 Multiplexer Installation Diagram ..................................................................................... 12-2
Figure 13-1 Regulator Adaptor .......................................................................................................... 13-6
Figure 13-2 LM317 Adjustable Voltage Regulator ............................................................................ 13-7
Figure 13-3 Opto Adaptor Schematic ................................................................................................ 13-9
Figure 13-4 Kelvin Test Adaptor ...................................................................................................... 13-11
Figure 13-5 Holding Current Characteristic ..................................................................................... 13-17
Figure 13-6 Opto-Logic Adaptor Schematic .................................................................................... 13-19
Figure 13-7 Opto Logic IFON and IFOFF .............................................................................................. 13-19
Figure 13-8 SSOVP VCLAMP TEST ................................................................................................... 13-23
Figure 13-9 SSOVP IBO TEST ......................................................................................................... 13-24
Figure 13-10 SSOVP VBO TEST ...................................................................................................... 13-24
Figure 13-11 SSOVP IH TEST ......................................................................................................... 13-25
Figure 13-12 SSOVP IH Waveform .................................................................................................. 13-25
Figure 13-13 SSOVP VT TEST Circuit Diagram .............................................................................. 13-26
Figure 13-14 SSOVP VT Test Waveform ........................................................................................ 13-26
Figure 13-15 Impulse Reset Circuit Diagram .................................................................................. 13-29
Figure 13-16 Impulse Reset Waveform ........................................................................................... 13-30
Figure 13-17 VL Breakdown Circuit Diagram and Waveform .......................................................... 13-30
Figure 13-18 VB Breakdown Test Circuit Diagram ......................................................................... 13-31
Figure 13-19 VB Breakdown Test Waveform .................................................................................. 13-31
Figure 13-20 Continuity Test Circuit Diagram ................................................................................. 13-32
Figure 13-21 Coil Resistance Test Circuit Diagram ........................................................................ 13-32
Figure 13-22 ADP-340-5G Interconnect .......................................................................................... 13-33
TABLE OF CONTENTS
Figure 13-23 Single Device Connection ......................................................................................... 13-33
Figure 13-24 Dual Device Connection ............................................................................................ 13-34
Figure 13-25 Complementary Dual Connection.............................................................................. 13-34
Figure 13-32 Gated IGAS / IGKS Test ................................................................................................. 13-38
Figure 13-33 Gated IBO Test ............................................................................................................ 13-38
Figure 13-34 Gated IH Test ............................................................................................................. 13-39
Figure 13-35 Gated VT Test ............................................................................................................ 13-39
Figure 13-36 Gated IR Test ............................................................................................................. 13-40
Figure 13-37 10x1000 Simplified Schematic .................................................................................. 13-41
Figure 13-38 10x1000 Pulse Test Screen ...................................................................................... 13-41
Figure 13-39 10x1000 Pulse Option Calibration Screen ................................................................ 13-49
Figure 13-40 Zener Impedance Test .............................................................................................. 13-51
Figure 13-41 EXT-100 Schematic Diagram .................................................................................... 13-53
Figure 13-42 EXT-100 Timing Diagram .......................................................................................... 13-54
Figure 13-43 Quadrac/Diac VBO Test .............................................................................................. 13-57
Figure 13-44 Quadrac/Diac ADP-350 Adaptor ............................................................................... 13-58
Figure 13-45 STS Typical Characteristics ...................................................................................... 13-59
Figure 13-46 Sidac Characteristic ................................................................................................... 13-61
Figure 13-47 Sidac Test Program Screen ...................................................................................... 13-63
Figure 13-48 VCESUS Adaptor (ADP-410) .................................................................................... 13-69
Figure 13-49 ADP-401 Simplified Schematic.................................................................................. 13-73
Figure 14-1 ........................................................................................................................................ 14-3
Figure 14-7 APP-004 Data Information Screen .............................................................................. 14-11
Figure 14-8 APP-005 Test Step Screen ......................................................................................... 14-13
Figure 14-9 APP-005 Bin Plan Screen ........................................................................................... 14-14
Figure 14-11 APP-005 Datalog Screen for STI Bin Plan................................................................. 14-15
Figure 14-12 APP-005 Datalog Screen STI Sort Plan .................................................................... 14-15
Figure 14-13 Opto-Switch Test Program ......................................................................................... 14-17
Figure 14-14 Typical Opto-Switch ................................................................................................... 14-17
TABLE OF CONTENTS
List of Tables
Table 2-2 Adaptor Control ................................................................................................................... 2-7
Table 2-3 CNTL-12 ............................................................................................................................. 2-7
Table 4-2 5000E Test Specification .................................................................................................... 4-3
Table 4-3 Model 5300HX Test Specifications ..................................................................................... 4-6
Table 4-4 Model 5300HX Device Tests .............................................................................................. 4-7
Table 6-1 Communication Commands to 5000 Series Tester .......................................................... 6-35
Table 7-1 External Relay Driver Board Jumper Settings .................................................................... 7-6
Table 7-2 Handler Board Jumper Settings .......................................................................................... 7-6
Table 7-3 DC Power Supplies ............................................................................................................. 7-8
Table 7-4 Calibration/Trim Pot Adjustments (Models 5000E and 5300HX) ....................................... 7-9
Table 7-5 Quick Calibration Check ................................................................................................... 7-10
Table 7-6 100V/µS (VL) Option Calibration ....................................................................................... 7-10
Table 7-7 Auxiliary Low Source Calibration ...................................................................................... 7-11
Table 7-8 High Source Board Verification ......................................................................................... 7-12
Table 7-9 Low Source Verification .................................................................................................... 7-13
Table 7-10 Self-Test Error Codes (01-33) ........................................................................................ 7-14
Table 7-11 Self-Test Error Codes (34- 6A) ....................................................................................... 7-15
Table 7-12 Self-Test Error Codes (70 - B1) ...................................................................................... 7-16
Table 7-13 Self-Test Error Codes (B2-E3) ........................................................................................ 7-17
Table 7-14 Self-Test Error Codes (E4-10E)...................................................................................... 7-18
Table 8-1 Low Current Deck Self-Test Error Codes ........................................................................... 8-7
Table 9-1 High Current Deck Calibration ............................................................................................ 9-3
Table 12-1 Multiplex Adaptor Error Code Table ............................................................................... 12-4
Table 13-1 Regulator Terminal Designations ................................................................................... 13-5
Table 13-2 Options Dipswitch Settings ........................................................................................... 13-13
Table 13-3 ADP-340-5 Self Test Blocks (1-18)............................................................................... 13-43
Table 13-6 10x1000 Self Test Blocks (70-88)................................................................................. 13-46
Table 13-7 10x1000 Self Test Blocks (89-96)................................................................................. 13-47
Table 15-1 Component Level Spares Kit (Includes Relay Spares Kit) ............................................. 15-1
TABLE OF CONTENTS
Table 15-2 Test Fixtures .................................................................................................................... 15-2
Table 15-3 Self-Test Fixture (600-001) ............................................................................................. 15-2
Table 15-4 Front Panel Board ........................................................................................................... 15-4
Table 15-5 High Source Board Assembly (700-001 Rev F) .............................................................. 15-7
Table 15-6 Low Source Board Assembly (700-001 Rev F) ............................................................... 15-9
Table 15-7 80 Volt Gate Modifications ............................................................................................ 15-10
Table 15-8 Analog Board Assembly (600-036 Rev B) .................................................................... 15-11
Table 15-9 Relay Board Assembly (600-048 Rev C) ...................................................................... 15-13
Table 15-10 Control Board Assembly (600-012 Rev B) .................................................................. 15-14
Table 15-11 LCD Front Panel Assembly ......................................................................................... 15-14
Table 15-12 LCD Rear Panel Assembly ......................................................................................... 15-14
Table 15-13 LCD Base Plate Assembly .......................................................................................... 15-15
Table 15-14 LCD Self-Test Fixture Assembly (600-009) ................................................................ 15-15
Table 15-15 LCD "A" Board Assembly (600-014 Rev C) ................................................................ 15-15
Table 15-16 LCD "G-K" Board Assembly (600-015 Rev E) ............................................................ 15-16
Table 15-17 HCD Front Panel Assembly ........................................................................................ 15-16
Table 15-18 HCD Rear Panel Assembly ......................................................................................... 15-17
Table 15-19 HCD Card Cage Assembly ......................................................................................... 15-17
Table 15-20 HCD Base Plate Assembly ......................................................................................... 15-18
Table 15-21 HCD HC Relay Board Assembly (600-119 Rev B) .................................................... 15-18
Table 15-22 HCD PA#1 & PA#4 Board Assembly (700-001 Rev E) ............................................... 15-19
Table 15-23 HCD PA#2 & PA#4 Board Assembly (700-001 Rev E) ............................................... 15-20
TABLE OF CONTENTS
1 - OVERVIEW
1 OVERVIEW
1.1 System Description This manual covers the 5000 Series Tester (Models 5000E and 5300HX). The 5000 Series Tester is an extension of the proven Model 5150, adding improved Analog Board and modern CPU. Upgrading becomes much easier since all systems now use the same hardware and software. The 5000 Series Testers incorporate the proven power sources and matrix switching of the original 5150 and retains all of the basic power-source performance and ease of use features. The 5000 Series Testers are programmed only from the Windows
® PCW PC
program. All tests are individually selected from any device family and may be intermixed as desired. The 5000 Series Tester PC software includes the ability to automatically convert test programs created with the older 5300PC software to the Windows
® software format.
Auto-Calibrate Software math expressions True parameter substitution using math expressions Wafer Mapping Option Hi-Rel Delta Testing Option Single test measurement Improved throughput Per step scan with Model 6010 Scanner Option Multiplex capabilities Curve Tracer Option
1.1.1 Single Test Measurement
The Models 5000E and 5300HX provide measured values in a single test application for certain tests. Single test measurements include, but are not limited to:
Leakage: IR, ICBO, ICEO, IDSS, IDRM, IRRM, IEBO, IGSSF, IGSSR On-State: VCESAT, VBESAT, VF, VT, VDSON, IDON, VO Breakdown: BVCEO, BVZ (Zener), BVEBO, BVGKO Zener/Diode: VF, IR, BVR, BVZ, ZZ Triac/SCR: IGT, VGT, IH (3 Test Cycles), ID, VT, VD (Triac only) Transistor: hFE, VBEON, IEBO, BVEBO, VCESAT, ICBO, ICEO, BVCEO, VBESAT,
BVCBO MOSFET: VGSTH, IDSS, BVDSS, VDSON, IGSS, VSD, IDON, VGSON JFET: IDSS, BVDGO, IGSS, IDOFF, BVGSS, VDSON OPTO: ICOFF, ICBO, BVCEO, BVCBO, CTR, VCESAT, VSAT, IR, VF Regulator: VOUT, IIN MOV: VN, ID SSOVP: VBO, IH, VT, VZ, ID Opto-Logic: VF, IR, VOH, VOL, IFON, IFOFF IGBT VGETH, ICES, BVCES, VCEON, IGSS, VF, ICON, VGEON
1 - OVERVIEW
1-2 Version 1.23 MODEL 5000 SERIES MANUAL
Single test measured parameters are measured beginning on the range of the value entered in the test program. If auto range (AR) is programmed, the system will automatically range to obtain the best resolution. If auto range down only (AR/D) is selected, auto range will be only in the down direction if necessary. If auto range (AR or AR/D) is not programmed, the parameter will be measured on the range of the value entered in the test program. For best resolution, when auto range is turned off, entered limits should be as near the expected answer as possible, otherwise the reported value may not appear to be repeatable (if at the low end of the range). For example, when auto range is turned off, if an IR test is programmed for a 20μAmaximum limit and the actual answer is much less than 10μA, the reported answer could vary as much as 50ηA to 100ηA. In this example, the limit of 20μA is on the 100μA range (100,000ηA) and 100ηA is 0.1% of the range, hence, variations of this order can be expected.
1.1.2 5300HX Test System
The 5300HX test system includes some options not available on the Model 5000E. See current price list for available options.
1.1.3 Math Expression
The PCW software provides the capability to perform mathematical manipulation of test results. Using this feature parameter substitutions may be made such the test entry is the result of some calculation including the result of a previous test, or a new test step reporting the calculation of ratios, deltas, percentages, min-max limits etc. of two or more previous tests (see Section 6.6.1.2)
1.1.4 Per Step Scan
The 5000 Series Tester allows the Model 6010 Scanner (see Section 10 or Appendix Q) to be directed independently in the test program. This provides a means to test a variety of devices with a single package (e.g.- hybrids). Scan 1, for example, could be assigned to a group of transistor tests, Scan 2 to diode tests, and so on up to a maximum 24 possible scans. The only limit is a maximum of 99 total tests.
1.1.5 Pin Programmable Scanner
The 5000 Series Tester allows the adaptors ADP401A-8 or 16 to be programmed. Any drive / sense pair (A-AS, G-GS, K-KS) can be connected to any scanner output pin (1-8 or 1-16). Personality modules are available for various packages.
1.1.6 Mux Capabilities
The Multiplex Option allows three or four stations to be connected to the 5000 Series Tester. This can be configured as any combination of Manual Stations or Handler/Probers. A High Current Deck, Low Current Deck, 6010 Scanner or any special adaptor can be connected to any of the four stations. See Section 12 or contact the factory for more information.
1.1.7 Applications
The 5000 Series Testers are automatic discrete semiconductor test systems intended for incoming inspection and manufacturing of semiconductors (high speed full datalog with the Model 5000E and 5300HX). The systems tests triacs, SCRs, transistors, MOSFETs, J-FETs, zener diodes, diodes, MOVs, and with optional adaptors and/or hardware also tests opto-couplers, opto-logic devices, SSOVPs, Sidacs, Diacs,
1 - OVERVIEW
MODEL 5000 SERIES MANUAL Version 1.23 1-3
regulators and relays. Tests from different device families can be freely mixes to create custom programs for devices like hybrids or solid-state relays.
1.1.8 System Checkout
System integrity can be checked by plugging in the Self-Test Fixture into the front panel jacks and running the self-test routine. This only takes about 15 seconds and should be run daily. See Section 7.2.1 for more details.
1.1.9 Options
Options are available to extend the available voltage and current ranges. A 2000 volt High Source and 80-volt Low Source are hardware options that can be installed internally in the 5000 Series Test Systems. Additionally, optional decks can be attached to the 5000 Series Test System. The Low Current Deck provides leakage measurements down to 100 Pico amps. The High Current Deck provides the ability to perform tests requiring high anode (collector) currents (Model HC-500 and Model HC-1000 provide 500 and 1000 amps respectively). Also a Multiplexer Option allows up to 4 test stations to be operated by 5000 Series Test System (each station can run a different test program). See Figure 1-1 for a system a 3-station Multiplexer, a Manual Station (MUX 1 DUT), a High Current Deck and/or Low Current Deck (MUX 2 DUT) and a handler (MUX 3 DUT).
Figure 1-1 Optional Mux4S with Manual Station, Low Deck, High Deck and Handler
1.1.10 Interfaces
1.1.10.1 RS-232
The 5000 Series Test System comes with an RS-232 interface for connection to a PC. A standard RS-232 cable and Null Modem are supplied.
1.1.10.2 HANDLER/PROBER
The standard handler interface provides a single pass/fail result along with up to 16 bin classifications. All outputs are mercury-wetted relays. An optional prober
LOW CURRENT
interface is available for pulsed logic requirements. At the completion if each test cycle, bin results, pass/fail result and EOT (see Section 2.2 for handler interface details).
1.1.10.3 IEEE-488
The 5000 Series Tester can, optionally, be controlled via the IEEE-488 interface. The user, with this option, supplies the PC Interface and any software required to complete the connection. See Application Note APP-007 IEEE-488 Interface Option for complete details.
1.2 Software Device test generation is accomplished through the STI 5000 Series Interface (PCW) program on a PC computer running Windows
® . The program provides fast test
program generation with full screen display and enhanced editing aids. A fill-in-the-blanks type approach provides a simple, intuitive environment. The operator is prompted to enter only the necessary test parameters for the selected device family test. No programming language expertise is required. Setting up a device test program can be accomplished in a matter of minutes. See Section 6 for complete programming information.
1.2.1 Operation
After a test program has been generated, the normal operating method would be to: Send the test program to the 5000 Series Tester Capture the measured values to a file, screen and/or Excel Spreadsheet
– or – Do Go/No-Go testing Optionally monitor lot summary information as testing occurs If Exact Values were captured to a file, this data can be reviewed; basic
statistics on the data can be generated and/or translated for use in other Software packages.
1.2.2 Error Messages
The follow messages may be displayed on the front panel during system operation:
1.2.2.1 A/K SHORT FAULT
This message indicates that a short (<100KΩ) from the A, K or G terminals to ground was detected. The fault should be resolved before proceeding. If an automatic handler is being used, check to make certain the handler does not cause any of the device-leads to be shorted to ground.
1.2.2.2 HI SRC F1/F3 BAD
This message indicates either F1 or F3 on the High Source Board is open. Power the system down, remove the top cover, disconnect J3, J4 and J5, remove the board and determine and replace the open fuse. Re-install the High Source Board, re- attach J3, J4 and J5, replace the cover, power the system up and run self-test before resuming operation.
1.2.2.3 NOTE
Additional error messages are provided when the Multiplexer Option is installed, See Section 12 for complete information.
1 - OVERVIEW
1.3 Front Panel Description
1.3.1 Front Panel Nomenclature
SCR A G K
Triac MT2 G MT1 Transistor C B E PWR MOS FET D G S Diode A K Zener A K
Table 1-1 Front Panel Nomenclature
1.3.2 Load Resistors
Load resistors RL, RGS and RGK are used in certain tests. When programming these tests, the operator will select one of the available internal load values or the external load. The external load is attached between the appropriate pair of labeled jacks in the 5000 Series Tester front panel. The load is switched into the circuit only when required by a particular test; other tests that do not call for the load are not affected. The nomenclature of these load resistors may change from one device type to another, for example RGK for an SCR becomes RBE for a transistor. The jacks labeled ANODE NET and GATE NET are used with special programming to attach networks from anode to gate and gate to cathode for special applications.
1.3.3 Device Test Jacks with Kelvin Sense Leads
The device lead jacks are labeled A, G and K. Each of the device leads has a corresponding Kelvin sense lead labeled AS, GS and KS. Kelvin sense leads are used to compensate for any voltage drop due to cable length. In order to provide 50 amps at 4 volts at the end of a 6-foot cable, the test system may have to drive 8 volts. Be sure to connect the sense leads as close to the device under test as possible.
1.3.4 Device Fixture
Fixtures are available for many device package types. The 5000 Series Tester is shipped with one in-line fixture. The fixtures are self-orienting and will plug into the 5000 Series Tester front panel only one way. Observe the fixture labeling for device orientation. Other fixtures or leads may be used to attach the device so long as connections are properly made to the device. Consult the factory for special cable or fixture requirements.
DEVICE LEADS SHOULD NEVER BE TIED OR
REFERENCED TO ANY EQUIPMENT GROUND!
1 - OVERVIEW
1.3.5 Safety Interlock
The pair of jacks labeled INTLK on the 5000 Series Tester front panel must be connected together with a jumper cable before voltage can be applied to the device under test. If these jacks are not connected, the message “INTERLOCK OPEN” will be displayed when trying to execute a test sequence. Also, the message “ERROR CODE 03” will be displayed if self-test is run without the interlock connected.
DO NOT UNDER ANY CIRCUMSTANCES ATTACH A PERMANENT JUMPER CABLE BETWEEN THE JACKS LABELED INTLK. DOING SO WILL DEFEAT THIS SAFTY FEATURE. IF YOU ARE OPERATING A TEST SYSTEM WITH A PERMANENT JUMPER CABLE ATTACHED TO THE JACKS LABELED INTLK NOTIFY YOUR SUPERVISOR IMMEDIATELY.
1.3.6 Start From Handler / Local Switch (LED)
This switch determines whether to use the front panel start button or the handler Start Test input to begin a test sequence (if LED, green indicates local and yellow indicates handler mode).
1.3.7 Start / Stop Push-Button
The start/stop button is used in local mode only. It starts the test sequence and if in repetitive mode, alternately starts then stops the test sequence.
1.3.8 Repetitive / Single Test Switch (LED)
The repetitive switch is only valid when the Remote/Local switch is in the local mode if LED, green indicates single and yellow indicates repetitive mode). When the repetitive switch is on, the test sequence is repeated continuously after the start/stop button is pressed until the start/stop button is pressed again or until the repetitive switch is off. A test sequence could be a single test pass/fail, single test measure or complete test program.
1.3.9 Numbered Lamps
If your 5000 Series Tester has the 32 lamps on the front panel, they represent one of the first 32 available test steps in the test program. The lamp associated with the test step will be on while that test step is being executed. When running a complete test
THE INTERLOCK FEATURE IS PROVIDED FOR YOUR SAFETY. COMPLETING THE CIRCUIT BETWEEN THE PAIR OF JACKS LABELED INTLK CAN BE ACCOMPLISHED BY, FOR EXAMPLE, A
HAND SWITCH WITH MOMEMTARY CONTACT.
1 - OVERVIEW
program, if any of the first 32 programmed test steps fails, then the lamp associated with that test step will be turned on after the test sequence is completed. This gives a visual indication of which test steps failed and which test steps passed.
1.3.10 Display and Keyboard
If your 5000 Series Tester has a display and keyboard on the front panel, the 18 character display is used to display system menus, bin results, measured values and error messages. The keyboard is used to scroll through the menus and input operator responses.
1.3.11 Adaptor Control / Relay Control Connector
This 9-pin D-Sub connector provides the controls for the relays that are located in the Handler Device Cable with Kelvin Test and other Adaptors requiring relay control (e.g.: Opto-Coupler ADP-310, Sidac/Diac ADP-360). Additionally, four user programmable relay drives are available at this connector.
1 - OVERVIEW
2 - INSTALLATION
2 INSTALLATION
2.1 5000 Series Tester Upon receipt, use the following sections to establish that the 5000 Series Tester is functioning properly and to familiarize yourself with the test system front panel and handler connections. See the Low Current Deck Section 8 for installation and operation. See the High Current Deck Section 9 for installation and operation.
2.1.1 Inspection / Repacking
Unpack the 5000 Series Tester carefully from its shipping container and unpack the accessories shipping container. Remove the four top cover screws and top cover of the 5000 Series Tester, check to see that the printed circuit boards are secure within the card rack and that no damage has occurred during shipment. Verify that all items on the packing list have been received, including the following standard accessories; extender card and extender cables, self-test fixture, spare fuses, calibration resistors, shorting bar and load mount jack. Each 5000 Series Tester is carefully inspected prior to shipment. If damages or deficiencies exist, determine if they occurred during transit. If so, file a claim with the shipping agent. If the 5000 Series tester is to be returned for repair or service, contact the factory for authorization and shipping procedures. It is highly recommended to save and reuse your original shipping container. Secure all PC boards in the 5000 Series Tester with a tie-wrap around each card ejector and its card guide. If it is not available, then repack in an appropriate container with sufficient packing material to prevent damage (at least a double wall corrugated container with a minimum of three inches of foam packing at each corner is recommended).
2.1.2 Power / Grounding
Each 5000 Series Tester is shipped from the factory set for either 120VAC or 240VAC. Check the voltage selector on the back panel of the unit to determine which line voltage has been set up.
USE ONLY AIR FREIGHT SHIPPING AIR FREIGHT HANDLING IS MUCH SAFER
CAUTION – Be certain the unit is set for your line voltage!
2 - INSTALLATION
If it is not, open the cover door on the fused connector on the rear panel. Select either 120 or 240 VAC by orienting the printed selector board to position the correct voltage on the top left side. Push the board firmly back into its slot. Provision for grounding the 5000 Series Tester has been made in accordance with NEMA recommendations. The third pin of the power cord grounds the chassis when plugged into a 3-wire grounded socket. If a 2 contact socket is used, a 3-prong to 2- prong adaptor should be used with the green wire of the adaptor connected to earth ground.
2.1.3 Line Noise
The 5000 Series Tester contains a power line filter to reduce noise that might otherwise adversely affect system operation. This filter is adequate for most installations. If your power is particularly noisy or is near heavy switched loads or motors, it may be necessary to employ additional filtering. Use a low capacitance isolation transformer such as those manufactured by Topaz Electronics or Sola Electric, or other suitable line conditioner or filter.
2.1.4 Self-Test Diagnostic
The 5000 Series Tester contains a self-test program resident within a memory chip. Exercise of this routine will verify approximately 90% of system functions including most major items such as relays and power sources. Run this program per instructions that follow to be assured the unit has been received in good working order. Install the Self-Test fixture (pc-board with banana plugs) and shorting bar in the interlock jacks. Then apply power to tester by turning on power switch located at rear above fan. Connect the PC to the 5000 Series Tester via the 9-pin D-Sub cable and null modem supplied and run the System Self-Test from the 5000 Series Interface Software. Refer to Section 6.3.1.3.1 for details.
2.1.4.1 Test Systems with Front Panel Display and Keyboard
LEDs should momentarily turn on then off and a message should be displayed. At “**NO PROGRAM**” scroll through the main menus by pressing [ENTER] until “SELF-TEST?” appears. Press [YES] twice and then press [Start/Stop], the display should read “CHECK-OUT GOOD” if everything is functioning properly. Refer to Section 7.2 for further information.
2.2 Handler Device Attachment For use with handler, attach device test jacks to the appropriate handler contacts. The handler becomes the device fixture. Use factory supplied device-to-handler and Control cable (extra charge items, see Price Guide). Device-to-handler cable provided by Scientific Test, for systems without a Lo Current Deck, has built-in Kelvin contact continuity testing (see Appendix D). The Lo Current Deck has built-in Kelvin test. The shields on this cable are driven by the 5000 Series Tester and should not be terminated to ground at the handler. The gate (base) drive lead should contain suppression circuitry in series, just as in a test fixture, as close to the device under test as possible. See Section 3.4 Oscillation Suppression.
2 - INSTALLATION
Cable shields are terminated differently for various optional Decks. The Lo Current Deck, for example, has shields grounded. Cables are always supplied with these decks and are properly terminated. Use only factory-supplied cables for attachment to decks and handlers. Never terminate shields at the handler. Shields are always terminated at the test system and left disconnected at the handler end of cable. Each type lead (ex. A, As) will be shielded together with two leads for the drive and one for the sense. If a connector for the handler end was not ordered from the factory, bare wire ends will be provided. Red & clear are the drive leads (one will suffice if testing low currents only) and black is the sense lead.
2.2.1 Standard Interface Controls
The 5000 Series Tester requires a start test signal from the handler and supplies an end-of-test and a fail result (or 1 of 16 bins if option selected). A diode polarity reverse indication relay is also provided if the Auto-Polarity Mode is turned ON when programming a diode. The end-of-test and result signals are supplied by the 5000 Series Tester in the form of mercury wetted relay contacts with the following ratings: EOT, Bins, Polarity: 1A, 50V. The start test closure provided by the handler must withstand: Start-Test: 35mA, 12 VDC. The 5000 Series Tester may be connected in one of two ways dependent on the handler. If the handler start-test closure is mechanical, with no reference to ground, use the connection that follows entitled Mechanical Start-Test. If the start test closure is electronic, use the connection described in Electronic Start-Test. The significant difference in the two is the source of the ground for the start test signal. It is supplied by the 5000 Series Tester or the handler but never both, as explained in the following sections. This is extremely important as: Ground on the 5000 Series Tester should not be tied to any other equipment ground. (See Handler Board schematic, at the back of the manual, and Figure 2-1 for additional information.)
2 - INSTALLATION
Figure 2-1 Relay Handler Interface
2.2.2 Electronic Start-Test
Start-test relay power is obtained from the handler. Jumper the header pins on the Handler PC Board labeled “HANDLER 12V”. Be sure system main power is turned off before removing the PC board. Wire 12 volts from the handler to pin 24 on rear panel handler I/O connector. Start-test return is pin 25 (see handler connection table, Figure 2-1, or Handler schematic). To start a test, handler should pull pin 25 to ground with respect to handler 12 volts. Use EOT, EOT return, fail or bin, and diode polarity results as required. Note that EOT has a separate return which may need to be tied to handler common (dependent on handler). Make connection to handler from the 5000 Series Tester using standard 25-pin D type connector cable. Use TRW cinch type DBM-25P for solder connections, 3M P/N 3482-1000 for ribbon cable, or other equivalent.
HANDLER BOARD
MOVE JP9 & JP10 TO 2-3 FOR REV. POLARITY
K15
K16
K17
2.2.3 Mechanical Start-Test
If the handler presents a simple contact closure, the 5000 Series Tester must provide power to the 5000 Series Tester start relay. Jumper the header pins on the Handler PC Board labeled “5000 Series Tester 12V”, (see enclosed schematic of Handler board for additional information). Be sure main power is off before removing board. Connect the switch contacts to pins 25 and 13 of the rear panel 25-pin D connector. Pin 13 returns to 5000 Series Tester system ground and should be tied to no other system ground.
2.2.4 Handler Interface Timing
The timing diagram (Figure 2-2) shows timing provided by 5000 Series Tester to handler. Timing shown is standard supplied by 5000 Series Tester. Any modification to this interface will require a special program, contact factory.
Figure 2-2 Handler Timing Diagram
2.2.5 5000 Series Tester Handler Control Cable Wire List
25p D-Sub Plug Cable Color Code Signal Name
1 Black/Red Bin 8 2 Red Bin 7 3 Orange Bin 6 4 Orange/Green Bin 5 5 Green Bin 4 6 Blue Bin 3 7 Blue/Red Bin 2 8 Black/White/Red Bin 1 9 White EOT
NOTE 1: (EOT FROM TESTER)
5 mS EOT PULSE STANDARD
PROGRAMMABLE: 2 mS - 25 mS or HOLD TO NEXT SOT
NOTE 2: (BIN / FAIL RESULT)
PROGRAMMABLE: HOLD TO NEXT EOT
NOTE 3: (ROW / COLUMN DATA VALID)
ROW /COL DATA MUST BE AVAILABLE FROM 1 mS AFTER SOT
UNTIL EOT
25p D-Sub Plug Cable Color Code Signal Name
10 Black EOT Return 11 White/Black/Red Fail 12 Red/Green +12 13 Orange/Black +12 Return 14 Orange/Red Bin Common 15 Red/White Bin 9 16 Green/White/Black Bin 10 17 Blue/Black Bin 11 18 Red/White/Black Bin 12 19 Green/Black Bin 13 20 Black/White Bin 14 21 Blue/White Bin 15 (or Auto-Polarity) 22 Green/White Bin 16 (or Auto-Polarity) 23 Red/Black INTLK 24 White/Red +12 V from Handler 25 White/Black Start Test
Table 2-1 Handler Control Cable
2.2.6 Handler Interface Schematic
See Handler Schematic 600-400 in the Parts Lists/Schematics section of this manual.
2.2.7 Optional Prober Interface
Many probers require logic levels with precisely defined timing for start, end-of-test and bin result. An optional interface card (see Price Guide) is available which accommodates these requirements. It provides adjustable pulse widths and logic levels. See schematic 700-020 in the Parts lists/Schematics section of this manual. For isolation, connect prober +5V to pin 13 and 5V return to pin 12 of the 25-pin D- Sub connector labeled “HANDLER” at rear of the 5000 Series Tester. If pulse level is 5V, jumper the header labeled “+5” located to right of U2, otherwise connect pulse level voltage (1 to 30V) to pin 24 (Hi Level). Connect Start, EOT, Fail and Bins (if ordered) from prober to connector pins per schematic. For start test, jumper appropriate header for either positive or negative pulse from prober. Likewise, for EOT, Fail and Bins (if ordered), jumper appropriate header for either positive or negative pulse from tester to prober. If your prober specifications are provided to factory at time of order, prober pulse widths will be properly adjusted. Otherwise adjust R13 for Fail pulse width, R14 for EOT and R5 through R12 for Bins. Jumper the header pins on the Handler Board labeled “Tester 12V”. Be sure system main power is off before removing boards.
2.3 Adaptor Control Some adaptors contain relays to control test setup. These controls are obtained through the 9-Pin D-Sub located on the front panel of the STI 5000 Series Tester. Four of these relay controls (CT4 – CT7) are programmable from the STI Test Program Relay Plan (see Section 6.6.4 for complete details in setting these relays).
2 - INSTALLATION
Pin Number Name Use
3 +12V
8 GND
Table 2-2 Adaptor Control
2.4 CNTL-12 Auxiliary Board The CNTL-12 Auxiliary Board provides 16 programmable relay drivers. Four of these drivers are duplicated at the front panel Adaptor Control connector (Section 2.3). These relay drivers are accessed from the real panel “CNTL-12” 25-Pin D-Sub connector. See Section 6.6.4 for complete details in setting these relay drivers.
Pin Number Name
1 Relay 8
2 Relay 7
3 Relay 6
4 Relay 5
2.5 Product Support
Technical support for all of Scientific Test, Inc. products is provided for all users of STI 5000 Series Testers. Please note that email and fax are the preferable avenues for technical support as we have found that resolution is much faster. Support via email or fax is provided within 24 hours. Following are the different avenues through which support is provided. Email ` [email protected] or [email protected] FAX 972 479 1301 Telephone 972 479 1300 (9:00AM to 4:00PM CST)
When reporting a problem or requesting assistance, please include the Mainframe Configuration data. This can be obtained using the STI PCW Software main menu (Test Programs->Mainframe Configuration). Click the “Check Mainframe” button to obtain the STI 5000 Series Tester configuration data (Note: the PC being used must be connected to the 5000 Series Tester); double click inside the data box to print. If your 5000 Series Tester is an older model that does not support the Windows based software please provide the 5000 Series Tester mainframe serial number located on the rear panel.
3 - THEORY
3 THEORY
3.1 Overview The 5000 Series Tester is a test system of power sources exercised under computer control to test 2 and 3 lead semiconductor components. These sources, along with conditioning loads, are connected as required to obtain the exact conditions required for a particular test. Included are means to connect a variety of loads and to switch sources in and out of the circuit as required. Shown in Figure 3-1 is the basic test configuration in simplified form. DUT is the device under test.
Figure 3-1 Simplified Test Configuration
3.1.1 Card Cage / Backplane
The 5000 Series Tester is divided functionally into printed PC boards, all of which plug into the card cage and communicate through the backplane bus. The smaller section of the card cage located at the rear of the cage is the STD bus computer section.
RL
ANET
RGS
The computer bus extends forward into the larger section of the card cage for computer control of the main boards. The larger section of the card cage contains the Power Sources, Analog, Relay, Normalize and Control boards. At the gold edge fingers of each main board, J1 pins 1 through 44 carry analog signals plus AC and DC power for distribution among the boards. J2 pins 1 through 56 carry the computer signals (extension of the STD bus). Low-level analog signals are generated by the Analog I/O board and transferred down the bus (OUT line) to the power sources. Result signals are returned (IN line) to the Analog I/O board to generate the answer. Analog signals are referenced to the Signal line (S line) that is separated from ground to eliminate current in the S line. The power source outputs are steered through the Relay board to the device front panel jacks. The Relay board also switches in internal loads or the external loads on the front panel jacks.
3.1.2 Analog Board
The Analog Board generates the analog reference signals that are applied to the Hi and L

MODEL 5000 SERIES TEST SYSTEMS - gkzhan2011/09/02 · EN55022 1994 EN50082-1 1992 IEC 801-2 1991...

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Transcript of MODEL 5000 SERIES TEST SYSTEMS - gkzhan2011/09/02 · EN55022 1994 EN50082-1 1992 IEC 801-2 1991...