MEVD 203 VLSI Test and Testability June_2013

2
Scanned by CamScanner

Transcript of MEVD 203 VLSI Test and Testability June_2013

Page 1: MEVD 203 VLSI Test and Testability June_2013

Scanned by CamScanner

Page 2: MEVD 203 VLSI Test and Testability June_2013

Scanned by CamScanner


Code Testability

Code Testability

Testability Consideration

Testability Consideration

Testability Primer (Rev. D

Testability Primer (Rev. D

MEVD 205 Embedded Computing System June_2013

MEVD 205 Embedded Computing System June_2013

Refactoring For Testability

Refactoring For Testability

Design For Testability

Design For Testability

MEVD/MEDC-101 ADVANCED MATHEMATICS DEC-2010

MEVD/MEDC-101 ADVANCED MATHEMATICS DEC-2010

3 Testability Design

3 Testability Design

Testability Times 0205

Testability Times 0205

MEVD 203 VLSI Test and Testability June_2014

MEVD 203 VLSI Test and Testability June_2014

ATPG - 3 Testability Design

ATPG - 3 Testability Design

Desiggyn For Testability - Yonsei Universitytera.yonsei.ac.kr/.../lecture/Topic_12_Design_for_Testability.pdf · • Design for Testability • IEEE P1500 • Case Study • Conclusion

Desiggyn For Testability - Yonsei Universitytera.yonsei.ac.kr/.../lecture/Topic_12_Design_for_Testability.pdf · • Design for Testability • IEEE P1500 • Case Study • Conclusion

Design for Testability - Indian Institute of Technology ... · 9/19/2012 1 1 Design for Testability 2 Basic Concept • Design for testability (DFT) – Design techniques that make

Design for Testability - Indian Institute of Technology ... · 9/19/2012 1 1 Design for Testability 2 Basic Concept • Design for testability (DFT) – Design techniques that make

Testability Guidelines

Testability Guidelines

Title: Fault Characterization, Testability Issue and ... · 3 Index Terms: CMOS, CPL circuits, Design for testability, Fault model, Fault detection, Full-adder, IDDQ testing, Testability

Title: Fault Characterization, Testability Issue and ... · 3 Index Terms: CMOS, CPL circuits, Design for testability, Fault model, Fault detection, Full-adder, IDDQ testing, Testability

Erasmus ip june_2013

Erasmus ip june_2013

Digital VLSI Testing Week 1 Assignment Solution...Week 2 Assignment Solution Q1. DFT stands for (A) Design Find Testability (B) Design Fine Testability (C) Design Future Testability

Digital VLSI Testing Week 1 Assignment Solution...Week 2 Assignment Solution Q1. DFT stands for (A) Design Find Testability (B) Design Fine Testability (C) Design Future Testability

Carnap. Testability and Meaning

Carnap. Testability and Meaning

MEVD 201 VLSI Technology : June_2014

MEVD 201 VLSI Technology : June_2014

ADTEM-Architecture Design Testability Evaluation Model to ... · 1. Assess software system testability based on cohesion and coupling testability metrics. 2. Assess software system

ADTEM-Architecture Design Testability Evaluation Model to ... · 1. Assess software system testability based on cohesion and coupling testability metrics. 2. Assess software system