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Metrology

DescriptionAltechna is concerned about your success in experiments and final product performance, therefore our qualified metrology laboratory in cooperation with Vilnius University and other Lithuanian science institutes is offering variety of laser optics quality tests:

• Optical surface quality measurements;• Group delay dispersion (GDD) measurements in 500-1650 nm range;• Transmittance and reflectance measurements in 190-20000 nm

range;• Surface flatness, wavefront distortion measurements of flat and

spherical optics;• Angle measurements for prisms, wedges and other optics;• Non-contact ROC, Focal length measurements;• Laser Induced Damage Threshold (LIDT) tests for wide range of laser

wavelengths;• Optical absorption tests ISO 11551 standard;• Total scattering measurements;• Environmental temperature and humidity tests;• Custom made tests.

Group delay dispersion measurements (GDD)GDD in optical components is measured in the range from 500 nm to 1650 nm. Chromatis (KMLabs) quickly and accurately characterizes the full dispersive properties of optical components and coatings with resolution up to 5 fs2. GDD is measured for s and p polarization simultaneously in reflection and transmission modes at the angles of incidence from 0° to 70°, mirror pairs are mea sured at angles from 6° to 54°. The white light source in Chromatis allows characterization of mirrors designed for Ti:sapphire (around 800 nm), Yb:fiber (around 1030 nm), and Er:fiber (around 1550 nm).

Measurements by product group

Product Measured parameter

SubstratesNon-linear and laser crystals

PrismsWedges

Surface qualityDimensions

FlatnessTransmitted wavefront distortion

Parallelism, angles

Dielectric coated opticsMetallic coated opticsNon-polarizing cubes

Filters

Surface qualityDimensions

SpectraFlatness

Transmitted wavefront distortionParallelism

Polarizing cubesPolarizers

Surface qualityDimensions

Spectra for s and p polarizationsFlatness

Transmitted wavefront distortion

Lenses Surface qualityDimensions

Radius of CurvatureEffective Focal Length

IrregularityPower

Wavefront distortionCentration

Wave plates Surface qualityDimensions

Contrast

Axicons Surface qualityDimensions

Bessel beam in near and far field

Lasers (DPSS, gas) Power stabilityBeam profile

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Temperature and Humidity ChamberThe Bench-top Type Temperature and Humidity chamber allows to perform static and dynamic environmental tests in temperature range from -60° C to +180° C, relative humidity range – 30-95 %, with temperature stability ± 0.5° C. In 22.5 L capacity chamber we could place samples up to 290x250x240 (WxHxD) mm.

InterferometerFor accurate metrology of surface form for flat and spherical surfaces we are using ZYGO Verifire XP/D Phase Shifting interferometer. Variety of accessories allows to our engineers to measure coated and uncoated optics, radius metrology allows us to test spherical surfaces for form irregualities and Radius of Curvature with radius of ±20 - ±800 mm. For polarization sensitive optics, such as laser crystals, linear polarization option is used.

Interferometer Verifire XP/D, (Zygo)

Goniometer Goniomat HR, (Moeller-Wedel Optical GmbH)

GoniometerHigh accuracy goniometer with air bearing rotary table allows to measure angles for prisms, polygons, wedges and plano optics with accuracy better than 0.6 arcsec. Developed software kit allows to determine refraction indices to identify glass types.

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Set of CW lasers (532 nm, 632.8 nm, 800 nm, 1030 nm, 1064 nm)

Stereo microscope SZX7- 0,75x-100x, Analytical microscope BX51TRF, 5x-100x (Olympus)

Lens testingNon-contact and less damaging method is used for lens radius of curvature, focal length and centration measurements. Air bearing stage and electronic collimator allows to reach less than 0.1 μm accuracy when measuring centering errors. Additional accessories extend our capabilities to measure focal length values up to ± 5 meters, ROC – ± 800 mm.

Set of CW lasersSetups with lasers are used to test waveplates retardation (with Soleil-Babinet compensator), polarizers contrast, axicons and other optical elements. According to customer inquiries we build customised setups to test certain parameters.

SpectrophotometersSpectrophotometers measures transmittance and reflectance from 190 nm to 20000 nm. We use special mount to make measurements at angles from 0 to 75 deg in the range from 190 nm to 4900 nm. Integrated polarizers allows to measure spectra for s and p polarizations.

Stereo and analytical microscopesMicroscopes are used for visual inspection of high quality substrates, laser crystals, small clear aperture elements. Mounted CCD camera allows to take pictures, add scale and annotations on captured images.

OptiCentric MOT with OptiSpheric module, (Trioptics) Spectrophotometer Specord200, (Analytic Jena)