IPC D-36 Subcommittee - HATS-Tester.com · Microsoft PowerPoint - test_methods.ppt Author: Timothy...
Transcript of IPC D-36 Subcommittee - HATS-Tester.com · Microsoft PowerPoint - test_methods.ppt Author: Timothy...
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Via Reliability Test Methods
Timothy A. EstesConductor Analysis Technologies, Inc.
Vicka E. WhiteHoneywell, Inc.
October 24, 2005
IPC D-36 Subcommittee
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Acknowledgements
Vicka WhiteDewey WhittakerBob Neves
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Introduction
Experimental detailsBackgroundCoupon designsPreconditioningTest methods
Comparison dataCross-sectionsObservationsDiscussions
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Background
Compare three test methodsDual chamberHighly Accelerated Thermal Shock (HATS™)Current induced (IST)
Perform each test method as intendedTwo manufacturers
Coupons from same production lotSame material for all coupons (Tg = 175C)
Same assembly simulation (pre-conditioning) for all coupons
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Coupon Designs
General specification
Net specification
Dual Chamber / HATS nets
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Assembly Simulation (6x)
Note: PCQR2 Profile A
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Test Methods
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Box Plot
Box plots are used to display the distribution of the data. The box extends from the first quartile (25th percentile) to the third quartile (75th percentile), encompassing 50 percent of the population. A line extends from the first quartile to the minimum value and encompasses 25 percent of the population. Similarly, a line extends from the third quartile to the maximum value and encompasses 25 percent of the population. The median is indicated by an open circle.
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Data Analysis
Removed early failures from Manufacturer ADid not include nets that did not fail before 1000 cycles
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Initial Resistance Data
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Cycles to 10% Change in Resistance
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Dual Chamber / HATS Data
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Dual Chamber / HATS / IST Data
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HATS Manufacturer A
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HATS Manufacturer A
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IST Manufacturer A
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IST Manufacturer A
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HATS Manufacturer B
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IST Manufacturer B
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Observations
HATS and dual chamber showed the same trend by via size for both manufacturersAll three methods showed separation in capability between the two suppliers
B outperformed A for the 12-mil via
Dual chamber required fewer cycles than HATS which required fewer cycles than IST