Io School of Microelectronic Engineering Lecture III Single Crystal Silicon Wafer Manufacturing.

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io School of Microelectronic Engineering Lecture III Single Crystal Silicon Wafer Manufacturing

description

School of Microelectronic Engineering  Single crystal Si wafers the most commonly used semiconductor material in IC manufacturing.  In the original form, most solid materials exist in the form of amorphous or polycrystalline structures.  To make an industrial standard transistor, a single crystal semi- conductor substrate is required. This is due to the scattering of electron from the grain boundary can seriously affect the p-n junction characteristics. Why Single Crystal Material?

Transcript of Io School of Microelectronic Engineering Lecture III Single Crystal Silicon Wafer Manufacturing.

Page 1: Io School of Microelectronic Engineering Lecture III Single Crystal Silicon Wafer Manufacturing.

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School of Microelectronic Engineering

Lecture IIISingle Crystal Silicon Wafer

Manufacturing

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School of Microelectronic Engineering

Objectives

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School of Microelectronic Engineering

Single crystal Si wafers the most commonly used semiconductormaterial in IC manufacturing.

In the original form, most solid materials exist in the form of amorphous or polycrystalline structures.

To make an industrial standard transistor, a single crystal semi-conductor substrate is required. This is due to the scattering of electronfrom the grain boundary can seriously affect the p-n junction characteristics.

Why Single Crystal Material?

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School of Microelectronic Engineering

Why Silicon?

Abundant, 26% earth crust’s is silicon. One of the most abundant element on earth.

Can form a very stable and strong oxide and easy to grow.

Larger bang gap (compared to Ge), can tolerate a higher operationtemperature, wider impurity range and higher breakdown voltage.

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School of Microelectronic Engineering

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School of Microelectronic Engineering

Crystal Structure

Atomic structure of a single crystal Si unit cell Crystal orientations are defined in Miller Indexes.

MOS IC

Bipolar IC

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Crystal Defects

Vacancy – missing atom from crystal lattice

Interstitial defect – extra atom in between normal lattice

Frenkel defect – vacancy and interstitial in pair

Dislocation – geometric fault

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School of Microelectronic Engineering

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School of Microelectronic Engineering

Dislocation

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From Sand to Wafer

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From Sand to Wafer 1st step: Crude Silicon or MGS (~ 99% poly-crystal silicon)

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From Sand to Wafer 2nd step: High Purity TCS Formation (Trichlorosilane, SiHCl3)

MGS grinded into powder MGS powder react with HCL to form TCS TCS is purified up to 99.9999999%

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From Sand to Wafer 3rd step: EGS (Electronic Grade Silicon) Formation – polycrystal form

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From Sand to Wafer 4th Step: Crystall Pulling

EGS to be heated at high temperature and pulled using single-Crystal silicon seed.

2 methods; Czochralski (CZ) Method – larger diameter, lower cost, in situdoping. Floating Zone (FZ) Method

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School of Microelectronic Engineering

From Sand to Wafer CZ Method

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School of Microelectronic Engineering

From Sand to Wafer CZ Method

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School of Microelectronic Engineering

From Sand to Wafer FZ Method

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FZ and CZ Comparison

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From Sand to Wafer 5th Step: Ingot Polishing and Wafer Sawing

Ingot polishing to remove the grooves created during pulling Wafer slicing

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From Sand to Wafer

Typical Wafer Parameters

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•Grinding•Edge Polished•Slicing•Lapping•Polished•Process Control

6th Step: Wafer Finishing

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Epitaxial Wafer

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Epitaxial Wafer

The most expensive process step, ~ USD 20 -100 per step compared toUSD 1 per step for other process.