Investigation Into the Effects of Microsecond Power Line ...

NASA/CR--2000-209906

Investigation Into the Effects of Microsecond

Power Line Transients on Line-Connected

CapacitorsK. Javor

EMC Compliance, Huntsville, AL

Prepared for Marshall Space Elight Centerunder Contract H-29919D

and sponsored by

The Space Environments and Effects Programmanaged at the Marshall Space FLight Center

February 2000

The NASA STI Program Office...in Profile

Since its founding, NASA has been dedicated to

the advancement of aeronautics and space

science. The NASA Scientific and Technical

Information (STI) Program Office plays a key

part in helping NASA maintain this importantrole.

The NASA STI Program Office is operated by

Langley Research Center, the lead center forNASA's scientific and technical information. The

NASA ST1 Program Office provides access to theNASA STI Database, the largest collection of

aeronautical and space science STI in the world. The

Program Office is also NASA's institutionalmechanism for disseminating the results of its

research and development activities. These results

are published by NASA in the NASA STI ReportSeries, which includes the following report types:

TECHNICAL PUBLICATION. Reports of

completed research or a major significant phase

of research that present the results of NASA

programs and include extensive data ortheoretical analysis. Includes compilations of

significant scientific and technical data andinformation deemed to be of continuing reference

value. NASA's counterpart of peer-reviewed

formal professional papers but has less stringentlimitations on manuscript length and extent of

graphic presentations.

TECHNICAL MEMORANDUM. Scientific and

technical findings that are preliminary or of

specialized interest, e.g., quick release reports,

working papers, and bibliographies that containminimal annotation. Does not contain extensive

analysis.

CONTRACTOR REPORT. Scientific and

technical findings by NASA-sponsored

contractors and grantees.

CONFERENCE PUBLICATION. Collected

papers from scientific and technical conferences,

symposia, seminars, or other meetings sponsored

or cosponsored by NASA.

SPECIAL PUBLICATION. Scientific, technical,

or historical information from NASA programs,

projects, and mission, often concerned with

subjects having substantial public interest.

TECHNICAL TRANSLATION.

English-language translations of foreign scientific

and technical material pertinent to NASA'smission.

Specialized services that complement the STI

Program Office's diverse offerings include creatingcustom thesauri, building customized databases,

organizing and publishing research results...even

providing videos.

For more information about the NASA STI Program

Office, see the following:

• Access the NASA STI Program Home Page at

http://www.sti, nasa.gov

• E-mail your question via the Internet to

help@ sti.nasa.gov

• Fax your question to the NASA Access Help

Desk at (301) 621-0134

• Telephone the NASA Access Help Desk at (301)621-0390

Write to:

NASA Access Help Desk

NASA Center for AeroSpace Information7121 Standard Drive

Hanover, MD 21076-1320

NASA/CR--2000--209906

Investigation Into the Effects of Microsecond

Power Line Transients on Line-Connected

CapacitorsK. Javor

EMC Compliance, Huntsville, AL

National Aeronautics and

Space Administration

Marshall Space Flight Center • MSFC, Alabama 35812

February2000

NASA Center for AeroSpace Information

7121 Standard Drive

Hanover, MD 21076-1320

(301) 621-0390

Available from:

ii

National Technical Information Service

5285 Port Royal Road

Springfield, VA 22161(703) 487-4650

Final Report: Capacitor Transient Potential Tests

EXECUTIVE SUMMARY

An investigation was conducted into the effect of power-line transients on capacitors used by

NASA and installed on platform primary power inputs to avionics. The purpose was to

investigate whether capacitor voltage rating needs to be derated for expected spike potentials.

Concerns had been voiced in the past by NASA suppliers that MIL-STD-461 CS06-1ike

requirements were overly harsh and led to physically large capacitors.

The author had previously predicted that electrical-switching spike requirements representative

of actual power-line transient potentials, durations and source impedance would require no

derating. This investigation bore out that prediction. It was further determined that traditional

low source impedance CS06-1ike transients also will not damage a capacitor, although the spikesthemselves are not nearly as well filtered.

This report should be used to allay fears that CS06-1ike requirements drive capacitor voltage

derating. Only that derating required by the relatively long duration transients in power qualityspecification need concern the equipment designer.

ACKNOWLEDGMENTS

The author wishes to thank Mr. Kurt Mikoleit of the Naval Surface Warfare Center, Dahlgren,

Virginia for the long term loan of a Solar 7399-2 spike generator. This equipment, capable of

delivering 8 MegaWatt pulses at 2 kV, was specially designed for the spike requirements of MIL-

STD-1399 and is not standard equipment in the typical EMI test facility.

Mr. Robert Kapustka of the Marshall Space Flight Center suggested representative bulk

capacitors he has employed as a designer of dc-dc converters. These were pulled from actual

parts bins used for space applications. Mr. Kapustka has been with NASA since the Apolloprogram.

Mr. Mark Nave of Network Appliance suggested that an explosion container be built when using

the Model 7399-2 to stress tantalum electrolytics, since the electrolyte is sulfuric acid. Given

that evidence of explosive forces was found, this was a sound suggestion.

CS06

CUT

DIP

EUT

FET

LISN

MSFC

STS- 1

ACRONYMS

power-line spike susceptibility test requirement (MIL-STD-461/MIL-STD-462)

cable-under-test

dual in-line package (integrated circuit package)equipment-under-test

field-effect transistor

line impedance stabilization/simulation network

(NASA) Marshall Space Flight Center

switching transient simulator

iii


1.0 Introduction

This report documents the restllts of a test in which capacitors were subjected to spiked

potentials of varying amplitudes, durations, and source resistances. The work follows the

development of special transient generators which simulate electrical power bus switching

transients._ In addition to the use of these unique generators, two other generators which rneet

the requirements of MIL-STD-461 CS06 and MIL-STD- 1399 were employed to stress the samecapacitors subjected to switching transients earlier.

1. I Purpose

The purpose of these tests is to demonstrate that capacitors connected across primary power

inputs in avionics need not have their voltage rating derated for switching transient-like potential

stresses. It ',viii be shown that it is sufficient to derate capacitor voltage rating for power quality-related surges, which are lower in amplitude, but have longer durations.

1.2 Scope

Six capacitor configurations were evaluated. All capacitors were selected as representative of

those used in spacecraft applications as hold-up or bulk energy storage or line-to-ground filters at

the input to switching power supplies (dc/dc converters). Specifically, these capacitors were

pulled from bins where power supply bulk capacitors are stored at MSFC. Capacitors used on

28 Vdc (Space Shuttle), 120 Vdc (Space Station), and 270 Vdc (X-33) were selected, as well as a

capacitor rated for just 30 Vdc, which was just marginally rated to operate on 28 Vdc.

Cap. Bus Type

A 28 Vdc

B 120 Vdc

C 120 Vdc

D 270 Vdc

E <28 Vdc

F 120 Vdc

Spike sources were as

Potential Volts

0 - 500

0 - 600

0-2500

I .3 Background

Nomenclature Cap Type

tantalum electrolyticM39006/+ 22-0600

M39006/25-0264H tantalum electrolytic

AVX 87106-157 9622A ceramic

AVX 87106-237 9726A ceramic

M39006/ 22-0560

Sprague LC filtertantalum electrolytic

ceramic feedthrough

C #F

140

82

33.6

15.6

WVDC

60

125 2

200

500

300 30

0.2 200

follows:

Source Impedance Ohms Generator Name Manufacturer

50 STS-13 EMC Compliance

1.2 Model 8282- 1 Solar

0.25 Model 7399-2 Solar

The Space Station program imposed a specially tailored CS06 spike (SSP 30237). The tailoringfi)llowed the practice of MIL-STD-461 of the spike potential being twice the nominal line

potential, but ignored the 100 or 200 Volt limit. For Space Station, this resulted in a 240 Volt

spike superimposed on a 120 Vdc bus. There were complaints from some equipment designers

about the severity of this requirement. In 1994, the author presented a paper at the IEEE EMC

iRefcrenccNASA rcport: NASA/('R 1999 209574

2 Two of these capacitors are used in series across the hus to get the propc derating. "[his results in 41 HI"._S'witching Transient Silnulalor - 1


symposium that was the result of investigations into this subject (the breadboard spike generatordescribed therein was developed into stand-alone test equipment as described in the footnote 1

report). A 50 _ spike source was developed which more accurately sinmlated switching

transients? It was demonstrated that a small capacitor could effectively filter a 50 _ source

impedance 1 Its spike, but could not filter a 10 ItS, 1 _ source impedance spike from a Solar

Model 8282-1 spike generator, which is the usual test equipment employed for CS06.

This report extends that simple observation into a lull investigation.

2.0 Applicable

Number

MIL-STD-461

MIL-STD-462

MIL-STD-1399

SSP 30237

SSP 30238

NASA/CR-

1999-209574

3.0 Results

Documents

Title

Electromagnetic Interference Characteristics Requirements for Equipment

Electromagnetic Interference Characteristics, Measurement of

Interlace Standard for Shipboard Systems, Section 300A: Electric Power

Electromagnetic Emission & Susceptibility Requirements for EMC

Electromagnetic Techniques (Space Station)

Specification, Measurement, and Control of Electrical Switching Transients

Capacitors were tested as described above. Capacitance of each capacitor was measured prior to

and after spike applications. Pass/fail criterion was the absence/presence of a change in capacity.

3.1 Summary

No bulk or hold-up capacitor tailed at any spike potential generated by either the STS-! 1 its, 50

source or the Model 8282-1 l0 Its, 1 _ source. This included potentials of 500 V peak (spike

plus dc bus) from the STS-I, and potentials of 600 Vdc superimposed on the bus potential

(resulting in peak excursions of 600 Volts above nominal bus potential). Ceramic feedthrough

capacitors were undamaged by the STS-I generated transients, but failed at higher spike

potentials from the Model 8282-1. These spike potentials were, however, above those nonnally

imposed by NASA CS06 limits.

Capacitor E failed at a Solar Model 7399-2 spike source applied potential of 600 Volts for 20 Its.

Amplitude was i.32 kV into a 0.5 _ resistor. The spike source impedance was 0.25 _. It tookahnost four hours to fail the capacitor, with spikes applied at a rate of two pulses per minute.

The original purpose of this investigation was to show that capacitors do not have to be derated

for positive sense (turn-ofl) transients of microsecond duration if they are properly generated.

This means a source impedance reflecting that of real transmission lines, as opposed to the Ohm

or sub-Ohm source i,npedance of the Model 8282-i CS06 spike source. The point here is that if

a plattbrm mission does not subject it to lightning attachments, a low impedance high potential

transient on a power bus is difficult to explain.

-I 50 _ was lhc source impedance lbr a positive going or tt, m-off Iransienl.

was low impedance.

The negative-going or turn-on transient


This investigation amply demonstrates this is the case. All the bulk capacitors except capacitor

E were able to load a 500 Volt (transient plus power bus) potential down to a level below their

voltage rating. None of the capacitors showed any degradation either short or long term after

such applications. In fact, the worst case application applied the 500 Volt spike to a 30 Vdc cap

(capacitor E) biased at 28 Vdc (essentially no derating, even for dc) and caused no effect

whatsoever after three hours of spikes at a repetition rate of one pulse per second.

But in addition to this fact, which it was the purpose of this investigation to demonstrate, it was

also found that the CS06 spike caused no damage to any of the capacitors tested. This was a

much more severe test, due to the low source impedance of the Model 8282-1 spike source.

While the spikes were not as effectively filtered, they caused no lasting degradation. All the

tantalum electrolytics got very hot, and capacitor E measured a higher capacitance just after the

test than before the test or after it had cooled off, but this could not be considered an operational

failure, since more capacitance would not cause a problem for a bulk capacitor function. Spike

potentials generated by the Model 8282-1 were capable of damaging the capacitor of Filter F, but

this occurred at potentials well in excess of normal CS06 limits (above 300 Volts spike potential).

Only a kiloAmp source was able to damage the other capacitors. Tantalum electrolytics failed at

kiloVolt/kiloAmp spike levels (20 ]as duration) after repeated spike applications at two pulses

per minute (ppm). Ceramic bulk capacitors failed at the first kiloVolt/kiloAmp spikeapplication.

3.2 Test Methods

Three different test techniques were utilized. They were implemented in order of increasing

severity. The first tests used the EMC Compliance STS-1 switching transient simulators, which

generated a 1 ps, 50 _ source impedance spike. The next test applied spikes from the Solar

Model 8282-1 CS06 transient generator. The last set of spikes were applied from a Solar Model

7399-2 borrowed from the Navy.

3.2.1 Application of Turn-Off Switching Transients

Capacitor value is measured prior to test start, and again at end of spike application. The test is

diagrammed in Figure 1. In Figure 1, CUT refers to capacitor-under-test.

switching

hi-/ o'sco UT c_r°n_ iretrotr

Figure 1: Schematic of switching transient test

The oscilloscope measures potential from line-to-ground at the LISN output. The nominal spike

potential is measured without the capacitor in place, using a 1 or 10 Mfl oscilloscope probe.

The spike is measured again with the capacitor in place. Spikes are imposed at a rate of at least 1

pps. Pictures of test set ups and capacitors are shown in Appendix A.

A characteristic of the STS-1 not previously discovered is that the switching FET has some kind

of protection circuitry which clamps applied potential to just above 500 Volts peak. Regardless

of switched load (V pik_= 50 _'_*lswilchcd) or nominal bus potential, V_otal (: Vbus-{-Vspike) is bounded

3


by just over 500 Volts. Thus the spike applied to the 28 Vdc bus was about 500 Volts, but the

spike applied to 120 Vdc was only a little over 400 Volts, and the spike applied to 270 Vdc was

about 300 Volts.

In each case (for each capacitor at each bus potential), the initial spike potential applied was 100

Volts open circuit. The spike potential actually applied to the capacitor was much decreased in

amplitude from the 100 Volts measured open circuit. This spike potential was applied for

several minutes. The capacitor value was measured, found to be unchanged, and the spike

potential increased to 200 Volts. The same process was reiterated until the maximum 500 Volt

spike was applied. At this point, spikes were imposed at a rate of at least 1 pps for over one

hour. At least 3600 spikes are thus applied at the maximum potential to which the capacitors are

exposed and to which they are considered qualified. After this final application, the capacitance

is again measured (and found to be unchanged in all cases). Test data is shown below for the final

500 Volt spike application for each type of capacitor and bus.

3.2.1.1 Test Data

Data 1-1 and 1-2 show the STS-1 50 _ spike unloaded and loaded by a 140 p,F, 60 V rated

capacitor (cap A). This capacitor is typical of one used as a bulk capacitor at the input of a 28Vdc dc/dc converter. The spike was generated by switching a 2 _ load offthe 28 Vdc line. A 14

Amp switched current should have resulted in a 700 Volt spike (14 A • 50 _), but protection

circuitry limited overall (spike plus bus) potential to 516 Volts. The capacitor so loads the spike

that peak spike amplitude (spike + nominal dc bus potential) is less than the dc rating of the

capacitor. No capacitor failure is expected under such conditions. This is the case whenever the

50 _ spike is generated across a capacitor. Therefore switching transient potentials should not

be used to derate capacitor voltages. The switched spike amplitude will not appear across the

capacitor. Demonstrating this was the major goal of this investigation.

In order to show just how benign the switching transient is, the same 500 Volt spike as of Data

1-1 was generated across a 300 pF tantalum electrolytic rated at 30 Vdc (Cap E), while it was

biased at 28 Vdc. The resulting spike is presented in Data 1-3. It is almost identical to the spike

of Data 1-2, except here the peak spike amplitude (spike plus nominal dc potential) exceeds the

capacitor dc rating. Nevertheless, a three hour exposure at one pulse per second resulted in no

observable change in capacitance, and no observed heating.

A 500 Volt spike (switched load = 20 _) was also imposed on capacitors B and C, which were

typical of those used on 120 Vdc power. Capacitor B is two 82 laF, 125 Vdc electrolytics in

series. Capacitor C is a 33.6 pF, 200 Vdc. Data 1-4 is an unloaded spike injected on 120 Vdc.

Data 1-5 shows near complete filtering of Data 1-4 spike across capacitor B after over one hour

of one pulse per second application. The same result was obtained when the Data 1-4 spike was

injected into capacitor C for two hours at one pulse per second (Data 1-6).

A more visible spike appears in Data 1-7, which is the spike of Data 1-4 injected into filter F, a

Sprague threaded LC filter with capacitor value of 0.2 gF. The capacitor was facing the LISN in

this test. Spike amplitude clearly exceeded the capacitor rating of 200 Vdc, but the spike was

applied for two hours at greater than one pulse per second with no change in capacitance.

Data 1-8 shows the 500 V, 50 f_ spike injected onto 270 Vdc. This same spike was injected over

one and one-half hour (at one pulse per second) into capacitor D, a 15.6 pF, 500 Vdc rated

4


ceramic. No visible spike was generated or recorded. Note that in any case, the unloaded

switching transient barely exceeds the capacitor D dc rating.

:()OVDC I]:IPPOBE B I'dOFFIn:IFROEE2U- OI...'.',_f'tF.LE Trigl.J" ,.2OlL..-

[-'r'? I , I "i---. I r.UF..1-

l I t _t:

F:! ia t, / o.i i / Iil / I , i' -7I--"-- .=,{6._/l't/ ! t / :1 i +i / i',,t-t- I , .,L ,I -lr4I_l-I::

l li ! i 28.eL_!l' 4_. I I ,I I,,.,ill / _-- ! I I -T,,I"_R.:sEz--]2-..J k I I l -i I: l:x,

_ t_ i---- ; F. r,-

- -,. _Jl.-:.._RlliT PRI/IrEP.• ¢ FCRNATI 9ETUP¢

Data 1-1" 500 V spike injected on 28 Vdc

n 1,3VDC !O:IPROk'E B IVOFFI¢:IPRO_E5Gfilr_,/IIIVSIhlSLETPiiliAf -2DIV

I ,,,JL

i _ 3l ,6- - L..... ,. _ V

I t

i I 3,10

I

/i_ r ........ i I.i, ,;

j r --i,-- :I

.......... I "1

I ' "'1 RISE:' 700

L i

;.... ,,, I

;] _i

_r C[.... liIE _L FI2ItCl:

GE]IEPATE I'IEA_JRE PRIMT PRIVITER¢ FOI_RTI 5ETI.I_¢

Data I-2: Spike of Data 1-1 on capacitor A

.t 13VDC iO:IFRO[E_ClOnsIDlV _II_GLE TmJ._iAj' -2.Ol'J

_,,'I ; I T-J ;I

_._l__.!f_ FUMET-" / _ I_ _1 l/GEhEI_,TE NE_SI.RE PElfIt PPIM.-EPl _ FOI;IIA f _ 5ETL,_¢

Data 1-3: Spike orData I-I on capacitor E

IV CFF 10:: PP'_BE

CUR-I-2e.4

9

•;, 1,'3U_

_R;-.-P_9.6V

,il lt-P:27.6

II

-t:$£__93r:

,t@}v DEu__FIT"SIMGLE

i ':,--!

_L: -i - 'I

-'i\I

./ k\

I

'I I i.SF_Et_;[AL FUrlcr:

GEMERATE hEA_qUFE

I0: iPROBE[rJ g -'+[ -2OIL

,1:J

i,,

B IV OFF tO:t F'.r,OEE

RI_3:ZO,:i|

P,,'P I

44_k'

_l_;:-P:S4eV

>I/h-P=96,0V

:P.E[_I? ? .'_

I

I

I!I

I

i

i

I

I

Ii

II

I

li HOLn

PRII;T FR IVTEF,FFeNnr_ SETb?¢ _I

Data 1-4:500 Volt spike injected on 120 Vdc

5


.]'"DC200 _-_-."g'[V _SIr_LE

;I......I-!i

:It

_cf4EC!_I mw_cl t

I i

!,::l:i PPOBE F 1', OF.P10"1._R3BET,'1_I_1 -2D[',,'

I I

,iI

I

I

R

I

I

I

i

I:

II

,It:

fn}

I'22

I'_.4,X-pi13G'4

1,11tt-F" i112V

_16.u

B Data 1-6: Spike of Data 1-4 injected into cap C

50',:OC LO:IF'RCSE B IVOFF;CJ::F'F)E:_•-'q._01'..'_IIIGLE irag.Hi" -.Of,

_WT- _ -It

' '.,IE_/I

l i I _3-

b_ ...... ' i'.IA,.-P

I -,, l :___ t,"_"i . . i.__' HItI-P

"'7- ;'-'1. (')

.--L]

_-._FC.IAL_'UIICT _ , .....

GErlEFATE MEASURE PRIHT FRIIiTER¢ _ FOFMAI _ '-ETI-IP-_

IC&.D

Data 1-7: Spike of Data 1-4 injected into cap F

QIE,6VOC IO:I_RC£E 8 IVC_FIO:IP_OBEIu_.-OIVSIIIGLE Tria:AJ -2DIV

I Jt :T : m,:oI

\ I

I

I _ ,

' 1 --

i

It

l 1 ...."- "'°I

;SPIECI_L FUtlC,TGEI.IER_TE IHE-aSL_I_ PRIMT _RIItTER

,_ l FORI_T¢, SETUP-"

Data 1-8:500 Volt spike injected on 270 Vdc

_EAM:

V

Mf4X-F

_|II1-P:

3.2.2 Application ofCS06 - Like Positive Transients

The Solar Model 8282-1 Transient Pulse Generator was used in a MIL-STD-462 CS06-1ike

parallel injection technique (as diagrammed in Figure 2) to inject up to 600 Volt pulses into the

test capacitors. The 10 las spike source impedance was very near 1 _. Data 2-1 and 2-2 show

spike wavetbrms into 5 _ and 1 £) loads respectively. Spike source resistance is given by:


RI R2 (V1 - V2) 5_,lf_ (600V- 340V)= = 1.2_

Rsource = V2 R1 - VI R2 340V,5f_ - 600V, lf_

An unloaded source potential of about 700 Volts may also be deduced from this data. The test

set up was identical to CS06 parallel injection with two differences. A MIL-STD-462D LISN

was used in lieu of the MIL-STD-462 suggested 20 laH coil, and the EUT (capacitor) was

connected directly to the Model 8282-1 parallel output banana jacks. Lead lengths were thus

minimized. Pictures of test set up may be viewed in Appendix A.

LISN8282-1

I

Figure 2' Test set up of CS06-1ike parallel spike injection

3.2.2.1 Test Data

The 600 V, 10 bts spike of Data 2-1 was injected on to capacitors B through E, with no test

failures. All tantalum electrolytics got very hot during this test. These tests were run for at least

one hour at one pulse per second. The ceramics were run at 2 pps with no noticeable heating.

One tantalum electrolytic, capacitor E, read 386 laF immediately at test end (very hot), but 316

p.F after returning to ambient temperature. This was not deemed a failure.

The most important result here is Data 2-3. This is the induced spike across the 300 _F, 30 Vdc

rated capacitor (E)biased at 28 Vdc. With absolutely no headroom to spare, this capacitor still

did not fail when the 600 Volt spike was injected. Note that about 600 Amps was flowing at the

peak of the spike waveform in order to result in an applied spike amplitude of 114 Volts (greater

than 700 Volts source potential loaded through 1 _ source resistance down to approximately 100

V). It is quite reasonable to extrapolate from this result that no properly derated tantalum

electrolytic bulk capacitor will be damaged by any low duty cycle CS06 - like spike application.

Because traditional CS06 test procedures mention spike repetition rates of 1 - 10 pps, spike

testing was also performed at 10 pps. An initial trial placed a 600 Volt spike setting across

capacitor A. The Model 8282-1 amplitude was turned all the way clockwise (maximum output).

This yields a spike potential of greater than 600 Volts into 5 f_. Data 2-7 shows the resultant

spike across capacitor A. Spike amplitude actually dropped over the course of an hour long test

to a peak of 96 Volts. This was attributed to an increase in capacitance due to electrolytic fluid

heating. Capacitor A, nominally 140 gF, rated at 60 Vdc, measured 168 btF cold. After one hour

of 600 Volt spike application at 10 pps, the capacitor case was extremely hot and the capacitance

measured 320 gF. This returned to the pre-test value of 168 btF in about four minutes. Figure 3

shows measured post-test capacitance as a function of time, with a superimposed exponential

decrease. Close correlation shows that capacitance decreases exponentially with time:

C(t) = Co ( 1 + e-t), C = capacitance, Co = initial pre-test capacitance, t = time.

which is a solution to Newton's Law of Cooling:

¢?Tz

?t T, T = temperature, t = time.


Strong correlation between capacitance and predicted temperature as a function of time indicates

a very high probability of a causal relationship between electrolyte temperature and capacitance.

3-I I I I I I I I I

tlsO

§

lU

.1,tu

a..

oQ-

• measured capacitance normalized to pre-test valut

2])/

]-

O-ii

0

exponential model of empirical data

•" -_-( )-"--_-t _._, m, _ I _.._,--'e._m|

2 4 6 8 10time (minutes)

Figure 3: Capacitance as a function of post-test time

Having completed a one hour application of a 10 pps 600 V, 10 !as spike to a 60 Vdc rated

capacitor (A), an identical test was performed on a 30 Vdc rated capacitor (E). Data 2-8 shows

the spike applied to capacitor E (recall that Model 8282-1 amplitude is at maximum, yielding

over 600 Volts peak into 5 _). Both capacitors A and E were biased at 28 Vdc for these tests.

Capacitor E gave similar results to A post test, but hot capacitance exceeded the capacitance

meter's range and could not be measured until it was nearly room temperature. Post-test, the

clear plastic coating of both capacitors was discolored by the extreme heating. It is possible that

if the case of such a capacitor were in contact with a printed circuit board (PCB), that damage to

the board could result. However, recall that the applied spike in the above cases was 600 Volts

peak. No CS06-1ike specification calls out such a spike at such repetition rates for an hour.

The same test was performed on capacitor B, the two series tantalums. Capacitor B was biased

at 120 Vdc (Space Station). The applied spike is shown in Data 2-9. Over two hours the

capacitors did not overheat, and immediate post-test capacitance was equal to the pre-test value.

When the 600 Volt, 10 ps, 10 pps spike was applied to ceramic capacitor C, biased at 120 Vdc,

there was no effect. The test was repeated with the bias at 190 Vdc to most severely stress the

capacitor. There was no effect, other than mild temperature rise after a two hour application.

Data 2-10 shows the applied stress to a 5 _ load at 10 pps, while Data 2-11 shows the actual

stress across capacitor C.

The above tests on the tantalum capacitors established a significant safety margin between

typical CS06 requirements and any resultant damage to bulk capacitors. However, the heating

issue may cause concern with respect to nearby circuit elements, including the PCB. Therefore

the above tests were rerun with a 240 Volt spike. This is the highest CS06 spike potential yet

levied on a NASA program. Data 2-12 shows the 240 Volt spike applied to a 5 _ load. Data 2-

13 shows the result when the same spike generator setting as for Data 2-12 is applied to

capacitor E (300 pF, rated at 30 Vdc, biased at 28 Vdc). After one hour of a 10 pps application,

the capacitor was warm, but not too hot to handle. Initial post-test capacitance measured 380

pF, not much different than nominal 315 _tF.


Filter F was an L-filter rather than a discrete capacitor. Line-to-ground cap value is 0.2 pF, other

specifications, taken from the RFI TM catalog, are given below.

.O7O± ,010--'_,

\ /FIl4-28 UNF -2A

SPECIFICATIONSOPERATING TEMF_R_TURE -55" "TO .125 C

CIELECTRC lEEr." 2.5 T}MES RATED VOLTAQE

ffJGUL_TION RESISTANCE: 1DOOMEC.TOH_I8

MI_1.@25'C

CONFORI',_ TO _ ,N_PL_,BLE

FtECUIREMENT$ OF tvtL-=-2_{,1

FILTER SLPPLIEO _NIIH LOCKWASH ER & HCX NU't

FINISH HOT _lDER DIP

0001 RE6905-1 L, 25 2DO 125 .1B7 ,3[_....._2.____28 40 60 60 70

i0002 R_6g05-2 L:. .25 200 125 .18/ 375 22 2B 40 60 60 70

No manufacturer specifies filter series inductance, so this had to be measured. A series insertion

loss technique was used. The filter was placed in series between a 50 _ signal source and a 50

spectrum analyzer. No connection whatsoever was made to the filter case, so the capacitor had

no effect on the measurement. A baseline measurement was made without the filter in line, so

that insertion loss could be ascertained. The equation which predicts the insertion loss is:

50

Insertion Loss (dB) = 20 log ( _'x12500+(2r(fL)2 )

Test set-up schematic and equation is plotted below for L = 400 pH, over a 100 to 1100 kHz

range. Test data shows excellent agreement with theoretical insertion loss for 400 pH. Test data

upper trace A is a baseline measurement without the filter in the test circuit. The lower trace B is

due to the insertion of the inductor in series between signal source and receiver.

-10

Choke under tesl

_, I C_5_DA

,

-20RDC:

_= -30©

-40

0.1

%%

0.2 0.3 0.4 0.5

" i

0,6 0.7 0.8 0.9 1 1.1

Frequency MHz

9


I0O

"7O

60 ",:'-' / Trace A

50 / TraceB

40 / A -B

30 / Ref

2O

10

0lO0.OOkHz 1.10MHz

Limea_Frequemcy(IDiv= 100.00kHz)

The table below shows the response of the filter to CS06-1ike spikes. Filter F failed from a single

5 or 10 _s at about 450 V spike applied to the inductor end, when biased at 120 Vdc. It could

take the SSP 30237 10 Its 240 Volt pike at 10 pps indefinitely. It failed within two minutes of

350 V 10 _ts spike 10 pps applications on the capacitor end. When spike duration was reduced

from 10 Its to 5 _ts, damage threshold at 10 pps injection

2 minutes to fail at the same rep rate at 420 Volts).

spike duration _ts single pulse failure point Volts

5 464

increased from 350 to 420 Volts (it took

10 pps, 2 minute failure point Volts

420

10 450 350

n 20¢,_' OC 10: ! PFgBE B 5V OFF IO: I PR'OFJE5us...nI'-: SI[IBLE TrJ,_;.J" -2DIV

i , dr:

q , 3,40

li ' /dr :' 294

--I _ ] -- I.H:

I ,_t 1 IEK-P$- - 6t38

i V

I It-P:--_- 8.80

i _ L

' i 400I ..... rl_

, f' J I

;PEC[ALIFU('ICTi _ .

GErlERATE NEASJJRE PRIHT PIR.IIIIER# ¢ POFMAI _. __ETLW°_

Data 2-1:600 V spike across 5 f2

AI@oVOC, I@:IPRC_E B 5VOFFIe:iPllQBE

5,_,"OIV a!IIBL£ TelI:AI -2tltV

1 t °'"' 3.,I(1i, _IS

' t/dr :

. ffa_ .......... _ 294" - kH_

'340' V, _ _-P_

- I .... 56.8

<'- t_ _ vI -" _.ISE:

, l .20i __ ).m_

: \ '/'ISPEC;_LIFU[_T t 1

r_EhERATE _,I[6SURE PRItff PRIIITERi _ FCeM_T# SETUP_

Data 2-2: Data 2-t generator setting develops

this spike across 1

10


I

I

w

i

"-- r

3ErERATE :.IEFi_LIRE

1_ :]pF_BES IIGLE Trig I(,b/__j-20I._';

i

V

i

E: IVOFF IO:I FROEE

---Idt ;, 3t8

i RI_ :I 31 ",,z-I

,,' t_4I VI

.... "rISE!

Us

P

| l

Lpp,IrIT PRII "ERFORMAT# SETUP¢

N ._0'¢[_' 1.3: lPI_OBE E I V OFF 1C,: 1 eRr=BE2Cl_.,l_i;VSII_SLE T_'Ig_AI -2DiV

I

I

i

I

, jlF; LIB-t -- " -i- - -,-- ;_,__6

. r ,/

' _EAI% :

' 124

I

' M_:-'.-F"' 3:36' V

' _[ti-P ,'

RIS£:

U-

I

!

,cpI:IC.IALFLINCTI

EiEIIER_TEI_E_$URE PF,IMT, _ FORI_T_ 5EIUPe.

Data 2-3: Data 2-1 generator setting develops Data 2-4: Data 2-1 generator setting develops

this spike across capacitor E this spike across capacitor B

$C,?OC 1,3:IPI_OBE B I'?OFF iF.J:tFROEEtEK_um_DI'=' Trig I/L r -2DIV

I K 1_9* _EA_:

, - V

i M_-P:"z2g

" ', _t]LD__E_R_fE _IE_L[P,E PRINT PR1MTE, Ir- : ¢ " F_jRI_T¢ SETIJP¢_

Data 2-5 Data 2-1 generator setting develops

this spike across capacitor C

nlC_VO¢ IQ:tFROBE g tVOFF1O:IPROBEtGQu.=xLIIV SII'tSLE I,,L_IAJ -201V

.... _' MEAM:I _ 256

dA_-P' 47_I

i _ , V, ' _,[H'P:

"T''--- I _'_ _"_"-" v

I i"_ ' _ISE :<8.8_

I

-- _--" ILD

CI_I:CI_LFuMcr = i (

5EFIEPATE r4EASURE PRINt FRIMIEF._ ¢, FOPMAT_ _._TUP¢

Data 2-6: Data 2-1 generator setting develops

this spike across capacitor D

11


A 50V£_; JO:IFRC_E B I','OFFIO:IPROBE50u-_/D]',;SIt_L[ IrJgi_r -2D[V

t t: I

I

il I --"

GErtERRTEI_U#E¢ ¢

i

I

!

I

..... -+L-.J'iI

I i

I i i 4

'-1'..... i .......... J

PRINT PRINTER

HE_Wt:30.8V

144V

;ISE:t-_ ,C_

H 28VDC IO:IPROBE B IVOFFIQ;IPROBE58-a..'01V T,'lg:AI -2OIV

I Oft :3_0

I ., ---- _

I _Al_

____!...... .'7.,,V

I i ' HP,X-P :"'--'1 I

I , 93 .oi i V

I

M

i-- '_ ''_4"°°

Jli

I,t

' j , _,Utl:!L,

SF_ECIAL FUHCT :

GEIERATE PlEA'C4J'EPRItIT PRIHTE' _IFO_IAT_ $EI_.IP¢ _ ; FOR,MBT¢ SETUP©

Data 2-7: Maximum generator setting develops Data 2-8: Maximum generator setting develops

this spike across capacitor A at 10 pps this spike across capacitor E at l0 pps

10E_V{JC 1G: 1P_gBE50v;,'tiIVSINGLE Tri

I

l

I

I

1

It i/

J i ,SJF_L FUHCT; i

GEItEF_TE NEA_UPE

E IV OFF tS:[ FROBE

i !dr :, 310

-'-- IJ$I

tt6

I

........ I

............ 308I

'l v'...._:[SE:

'1 < 4. r_._

' ;I .US.

_-_-.._._ --__,__i

I

I

!

PPIIIT

PRIIiTER R "-1_ R+ " ¢ : FOR_IAI{ SETUP=# ¢ FORH_T_ :,ETUP. BEI'IEPATEI_r;',LE PPIHT PRIHTER

Data 2-9: Maximum generator setting develops Data 2-10: Maximum generator setting

this spike across capacitor B at 10 pps develops 650 V spike across 5 _ at l0 pps

A2OLWrC :O:IPROBE B ]VOFFIO:IPEOBIE_3us/D ]V r ri_ IAI -2[J !V

_-'-'- .... i! HERH:8 ,oe

I V...... I_IX-P

6".6Ilt-P :

.......... _ - 48{)

-T t i'

,I_J- .... i ' 'II

• i 'i:IQL F_JI!C_T_:+

12


n :-(,V[Cli:Uu_-"E-" V_"F +i.....

I

lli!

I

; i

-ii,i ,

I ,

t ....

_!

+T

[ !ISFECZAL FI_HCI:

:iEI_P_TE MEASU_£ PPIHT= FORI_IT¢

L0:1 PROBETrig:QS -I[IIV

[ ,

LLI i_ t

I

i I

i '

t t ,I

; i

B I,/OFFIO:LPFOEE _IO0'_D[ I':i:IFP,OBE B IVOFFIO:IPROBE213u-_DI,,,' lrJ_:_J" -2D:'V

MESH:t%]V

_,IA,X-P:316

I ¢t-F' :94.+1

w""_ t'

RIgE:<e.oe

95

" " _.UI_I

PP I NTEF._TLP¢ R

Data 2-11: Data 2-10 setting delivers

spike across capacitor C at 10 pps

i ;

' ii--L--i

t

--r ,u.__

+_ __L..I I

I

I

Iv

I

GEHE_ATE ;IEIY3LRE

I

!

I

I

...... --L._I

,I

= : l I

I

I

I

I

P_+i_,i...... +"+--"PR IPIT_.R

0V

_IA?,-P:244v

PII [bP194V

I _C,g..:I .60.us

'UH

E¢ ¢ FOFMQ_¢ _ETIJP=

this Data 2-12: Model 8282-1 generator set to

develop 240 spike across 5 _ at ]0 pps

F--] _

I

i¸ tI

. ,I

!y-.+., •

it SPE.C_AL FI=HEr:

,, 20'¢D( lr_::PI+.OEE _, 1V,)FFIO:IPRC._BE2[.;u_.UI' Tr'jg:Ai - JOt',]

....... _4

I ! J i I_IEUN:

+"-i J ';

_ "'- ....T/,:-

!

i !

FPIr, II FR I P,TEPF.)RI_AT," '..ETuP¢

MAR-f:E t ./,

V

_LSE:

u_

_.Ul+

IP" " " • m-3EIiEP-ITE Mr.A:,JI'E

¢ ¢

Data 2-13: Data 2-12 setting delivers this

spike across capacitor E at l0 pps

nlBO,/D_ IO;IFRC_E B JVOFFIO:IPE'OBE]Op'---D{',?;,IIIGLETrig ;_$ -21iIU

-T ...... I T--- _.E..:

_.I I I I I :l KIA+-P;

, i+ I t V

ia+l ] I ]tl: _ I -___"++_,I_.L.L_._.__ +_ I I.. ;/.,+J _+

; Ii I I I ,rT;-1-t .....++ -L'-=__++.,-'.lliq+,L I ;l Ir _--+;+'_ .... 2-- "_-'_ l,El p..n E I'IEA ip.c FR]';'IT: " "- ' '- .- , PPI'I'I,EP

P, ¢. FURF14T: SETI_'¢

Data 2-14: Model 8282-1 generates a 240 Volt

spike (SSP 30237 CS06) into 5

13


n LO[/._ ECl,]ps ,"D,:V

3-[ /\ 11v I,,I L- f 1;2

.Z.FU CT : IqEIiEP._iTEMEASURE

10 ;1 FRCSE B IV OFF !el:IPR_]E_

I

I

I

I

I

I

i

I

] !

• l _--15,_ j-

,,+!, R_'I

iPRIHT _PlHTEF

+ _,IE, V

I_AX-F' 5:_

V

HIH-F-_- 12'4

V

RISE:

Q 18Er:'Dr

i I

..i]

i;/

iSIP:<

Data 2-15: Filter F response to Data 2-14 Data 2-16: Filter F response to Data 2-14

spike injected into capacitor side spike injected into inductor side (measuredacross capacitor

Filter F provides the best example of how correctly defining a switching transient provides design

relief. Data 1-7 is filter F response to a 50 _ spike of total (spike plus line potential) 540 Volts

(Data 1-4). The applied spike measured 420 Volts (540 - 120 V) open circuit, and would havemeasured 210 Volts into 50 _. Spike amplitude in Data 1-7 is only 116 Volts (236 V - 120 V).

Filter capacitor succeeds in loading the transient potential sufficiently that no damage is done.

Contrast this filter efficiency with what happens when a Model 8282-1 spike is applied to the

same filter F, as shown in Figure 3. Data 2-14 shows a 240 spike (from SSP 30237 CS06)

developed across 5 f_. Data 2-15 shows the same spike applied to the capacitor side of filter F.

The peak potential has increased from that shown in Data 2-14 because the capacitor is a higher

impedance than 5 f_. If the filter is turned around so that the inductor bears the brunt of the

spike, the potential across the capacitor is shown in Data 2-16. Spike potential is reduced from

that measured when injected directly into the capacitor, but it still exceeds the potential the

Model 8282-1 can deliver into 5 _. The inductor is incapable of significantly filtering the spike.

Figure 3:

LISN

Test set up of CS06-1ike parallel spikeor inductor side face the

filter-under-test 8282-1

o'scope__ 7

injection for single filter F. (Either cap side

spike source.)

However, the test set-up of Figure 3 harkens back to the days when a MIL-F-15733 type filter

was installed in just such a line-to-ground configuration because power current was returned

14


through metallic platform structure. Nowadays it is much more common to return current on a

dedicated wire, at least until return current exits the equipment enclosure. The test set-up of

Figure 4 is a better model of modern power bus and filter topology.

__t LISN I ._b,4, :rb

rb80 IJF, 125 Vdc

filter-under-test

801JF, 125Vdcj flhllfit_ j_ i 8282-1

I'"'er T I It _1 .--rI filte r F2 ] &scope

Figure 4: Test set up of CS06-1ike parallel spike injection for two filters F in modern power

bus topology.

In Figure 4, the filters F are paralleled by 40 laF of bulk capacitance. This should help to lower

the spike potential across capacitors in filter F, but filter F inductors interfere with that function.

Data 2-17 shows a 450 Volt spike calibrated across 5 f_. This is the potential at which a single

application destroyed a stand-alone filter F. Data 2-18 shows the spike potential when the

setting resulting in Data 2-17 is applied as in Figure 4. For comparison, Data 2-19 shows spike

potential between filters F and the bulk capacitors. Almost the entire spike potential is dropped

across filters F. However in this test configuration the 450 Volt spike did not affect the filters F,

even applied at a rate of 10 pps for several minutes. When the spike potential was increased to

500 Volts (at a rate of 10 pps) it caused filter F capacitor failure in less than one minute.

R2OO¢DC IO:IFROBE B 1VOFFP-3iiPK_B£23#.-,.,01V .SIt,aLE Tr'i9 :,.Lr -2Div

..... ,

I

..... t i1F'_II_CI: I i

IIE_:SURE PRII!T

•..... IRME.i

, 10,t. V

' _.AX-P1

I 45_, V

' _II1-F' - 32E!

, V

' I;..!SE;z ! .6£

t

I

I

I

I

I

I

I

_;T_R1 pr_?RIIITEI_

,ril I

i,.# "_ II _ I_.,."

t

_._L!.....I!'

_-_.T-_--..............

.?:%_H'_C-i: I|[" r H, i-

142Or@'DC2Oj.,_./D I;V .'41liGI<.E

I

Ii

l

450 V spike across 5

IO:ICROBE B' IVOFFIO:IPFON:r r_g I:;tJ" -20 [ V

/

i

!

i I--1

tI

I

I

I

t

i

i

s

PPtr!T FY lrlrEl _:3E!IEPq rE MER-',tlP_

RM3 :

Y

PiAX-F94_V

_lIIt-F- ::2E

Y

_ISE:

IIOLO

Data 2-18: Data 2-17 generator setting develops this

spike across filters F in Fig. 4 configuration

Data 2-17:

15


A 50YI:_ IO'tPR£_E B 1_'OFFI_=IPI_OBE2OW_-.'DIV SIII_LE Trig:_J" -21_[V

i 'I 'i

k

i,t ,._

I i

I ,

if 'II i

I

51_F.CI1_, FUI*T 1 i,,GER_TE _E_S_E _W[. P_P.J_T_ER

RM.-S:122v

[72

II_-F

.... _ISE:_1 .SC

Data 2-19: portion of Data 2-18 spike potential dropped across bulk capacitors

3.2.3 Application of MIL-STD-1399 - Like Positive Transients

The Solar Model 7399-2 Transient Pulse Generator was used in a MIL-STD-462 CS06-1ike

series injection technique (as diagrammed in Figure 5) to inject up to 2000 Volt pulses into the

test capacitors. The source impedance of this generator was measured to be 0.25 f_ (for the 17.5

_ts waveform). Data 3-1 and 3-2 show 17.5 _ts spike waveforms into 10 f_ and 0.5 _ loads

respectively. The equation which gives the spike source resistance is:

Rsource/17.5 =R1 R2 (VI- V2)

V2 R1 - V1 R2

10f_-0.5f_ (1940V - 1320V)

1320V- 10_ - 1920V.0.5_: 0.25 f_

R1R2 (Vl - V2) 10o0.5 (2460-2000)

Rsource63 -- V2R1 - V1R2 = 2000o10- 2460°0.5 = 0.1225

An unloaded source potential of about 2000 Volts may also be deduced from this data. The test

set up was identical to CS06 series injection with only the 7399-2 replacing the Model 8282-1.

The capacitor under test was placed in an explosion chamber in case it failed catastrophically.

Pictures of test set up may be viewed in Appendix A.

Figure 5:

7399-2 cap under test

I 'SCO

',I

cap large compared to CUT

Test set up of CS06-1ike series spike injection

16


3.2.3.1 Test Data

The 1320 V spike of Data 3-2 was injected on to capacitor E. Capacitor E is 300 gF, rated for 30

Vdc. The power source bypass capacitor was 3300 pF in order to force the series injected spike

potential to drop mainly across capacitor E. Data 3-3 shows the spike potential as measured

across capacitor E. Note that it is very close to half the potential of the same spike source

applied to 0.5 _. Capacitor E presents a 0.25 f_ load impedance. In turn, this implies a peak

current flow of 5.2 kA in capacitor E. The spike potential of data 3-3 was applied for three

hours (at two pulses per minute, the maximum rate achievable with the 7399-2) with no failure.

At 3:40 into the test, a very large popping sound was heard, the applied spike was very large,

and capacitor E now only measured 1.5 pF. It measured 1.5 gF a day later as well. The hot side

of the tubular capacitor was blackened from arcing. The ground side has a domed characteristic,

as opposed to the healthy capacitor whose flat end cap is that of a cylinder. This is evidence of

high pressure developed in the capacitor. A picture in Appendix A shows capacitor E along side

a "healthy" capacitor A. Although heating must have occurred in order to generate the pressure,

at no time did capacitor E become hot or even warm to the touch, in contrast to the CS06-1ike

spike application, which injected much less current (600 A), but did so 30 to 60 times as often.

A single application of the same spike destroyed capacitor C while biased at 120 Vdc. A picture

and description of the damage is shown in Appendix A. Single applications of the 63 p.s spike

were applied with successively greater amplitudes to capacitor A. Starting at 500 Volts (as

calibrated into a 0.5 _ load) superimposed on 28 Vdc, with 100 Volt increments up to 1 kV, and

200 Volt steps thereafter, it was determined that the single application threshold of damage

occurred at 1400 Volts. At this potential, the post-test capacitance decreased to 1 laF or less

(nominal was 140 laF, pre-test). In case the step-by-step incremental testing had weakened the

capacitor, a fresh capacitor A was also subjected to 1400 Volts, and also failed. Test data 3-6

through 3-15 show samples of calibrated and applied spikes.

¢I53F.A,,OCLO:IF'RC_E B IVC,FFI,3:IPRCeE Ag.3OVOC 18:IPRC_E B tV£_CFLO :iPEOBETr.i3:A_ -2,qI'./ 20_s,-BIk.'SII_LE Tr,.i__:AJ -_3IV20vs.. DI',' SII,GLE

i

,

i,

. I

i

i ..... ,L -.

I

" ! ' " "%_.2".,,x--_

SF_CIi_L FIJI_F_T'GEIfEFF,rE f,IE._SLNEData 3-1 :

I

III

I

I

I

I

L

P_[rIT PRIMTER

_,M_.: -'%.tJ,2EV I

r,lEOtt: I10[.

HAX-F I1 .gw _..

HI,*t-F --t--- _- 22E

-5t ,:

HOLD

STNR'

1940 V, 17 las spike across 10 if2

|

I

el

I

II

I

I

!

I

I

II

I

I

SOCY

6')/-'t

I .3;kV

_l,IIf-l;t_-9

RI;E-4 .(_(

lJ5

HOLO

I_;r-IEI;'ATEHEA_tJP.E FRI.I.I'r.FF]I!:E_Data 3-2: Data 3-1 generator setting develops

this spike across 0.5

17


A 5eC_¢D5 "I=-I:|PRC_E B IV OFF I0'IPROEE

PP.[rtTER

Data 3-3:2460 V, 63 Its spike across 10 f_

I_OLD

GF;tERRTE FE_SURE

I0: IPKOBE B IV OFF t0; I PRO[cE

\ , :l_l' q ....... :l

I 1

I I II I

t

PF II'IrPRIIfi'EE,

HrJ_D


this spike across 0.5

H2_V 12_ IO =IPROE'4KB |V OF,':"le =1_'RC_E21_ul/l}iV;ll_Gl__ Ir,j-ill,1.1-2DIV

l

,I--r-_

I

II !- .._FEGI_L FUIt.ll I

IA

!

I

I........ t

I

I

I

I

I

I

I

II

J.

t I

I

I

I

RMS"197.

.... /l

_IEAFI• 48 .E

V

NAb:-F-- _,_

V

MIN--_- 3L-'_

V

¢.I_[l-1_..,9

- = .t.,s

HOLD

eEnlEFMTE NEQSURE_.P__.{UZ I'__...I_N..T_f..R

Data 3-5 Data 3-1 generator setting develops this spike across capacitor E, which causedeventual failure

18


I_2[*]VgC I8:IPROBE B IVOFFIO:IPROBE _IO@YDC281r_/DIVSIIIGLE Trie:AI -2nIV 28_._/OIVSIIIGLE Trig"AJ -201V

' 'Id'',.......!I ,, , ps I ...... ,! I

rc RILl II i_ 12_................, , .... ,I V "-i -I _-

1 1 ' _X4= i_ i _ ._l

-2 ' _ : /' _I_: _..._, ......' 11(!

....,_..,,,.. _ _' _If_i

. . L.--i ...... _ _-"_-_

-r'-I !SHECLAL FUMCT : I _SPECIQL FL_CT !

GE_IEPATE _EA3UP£ p_!.HT PRI_ZL_" 5EIERArE MEASURE.5i1ii,::a a

Data 3-6:600 V 63 las spike across 0.5 D

IO:IPROBE B IVOFFIO:IPROBE

I II

I

I_ bI

d

L

'_l. '.I

I

...... i I .

--( ,L • ":

I

I

L

f

PRif'IT PpI!_TEF.

dt :124U_

65 .(Y

324V


this spike across capacitor A

h2G)VOC lr..:IPI;?OBE 1] IV(,FFLO:IF_OBEA2ODVDC tB::I::'R..(,BE [: I'¢OcF:O:LPROEt2O-_./DIV SId["4LE T,'iQ:AJ -2_1I'_' 2O;,='./DIV 3II'tGLfl l'ri_IA3 -2DIV

rRI'IT PF[MTER

_D : t_LO

i_iI_GE/IEFAT__ I,EAL_UFE PR[DIT PRINTEP

Data 3-9:Data3-8 generator setting develops

this spike across capacitor A

Data 3-8:800 V 63 #s spike across 0.5 f_

19


_120g'¢ DC

i i

li, -¸

i i .;

_!SF--_ECIAL 'FUHCT i

10 : ] P_QBE [: IV ('FF 10 :1 PROB!TriviA) -JOT

dt :

..... _ 2C_Y

N2'30¢ DC. IO:I,FROBE B I'¢OFF IO:IPROBE_.%u_-,01Y ¢." ".,_I41;LF.. lr,iglf, J" -2D_,V

1 I , ,:It :i f , [2_

_p- .... i 96 .CI i , \._

' r_X-F I' ', I ._ _ 544'

• _ RISE i

•ii i _ I 'J3.i .......... I _,. .... i

' 1" _ .¢...,.., .... I _

I " !i .o._ . I i 1 ,- S6)ECIAL FIItlCT. '

GEIIERATE I_ASURE P_.IN? PRIiI_TD_

Data 3-11" Data 3-10 generator setting

develops this spike across capacitor A

_EIIEPATF MERSUR_. PRIttT P,_[HTEF

Data 3-10:1 kV 63 _s spike across 0.5 f_

nL,3gVD{ ]O:IPt,'OFE B I',,'OFF1C-_:IPROBE2F:,us. O I',' ._ i 141".-l,,,F.

.1

AI

' \

i J_.>.

!

¢ 'li

I

I

I!

I ,1 '

i '; ] 'I

Ii

I

I

I

i;i

I

I

!!

I

Ok :12-"

us

25_V

kV

RISE:-.19.;

u_

,.-n-!;:,7<i.-:___.-C'[I"l<L I V "J. - " l ;

GE'IEF_TE HEASUFE PP.:rIT PRIIYTEF'< "gF_k ";f_i?

Data 3-12:1.2 kV 63 ps spike across 0.5 _2

A 2"_0'4 DC20.us/O I':S II'Ir_E

i

I

I

II-7i

,>%1

'_F_,;.iN. liTUlf_

I0 :IPROBE B 1V OFF IO_ 1 PROBETri_IAJ -201'/

(

D._ I IC__-HE'RATE,tll_t;'._l_'_t_ PP[rlI- PRit_TER

Data 3-13: Data 3-12 generator setting

develps this spike across capacitor A

, dL :i 124, U':i, WEAlll i

_._L; 11.7I V

, M_.TI

i..........6e.EI °ll

' RISE:i -62.4I

Ib5

I

I

i

I

-'.I_.._ HI.R_D

'ii

2O


Data 3-14:1.4 kV 63 ps spike across 0.5

! 1:1

I

_401.0

PP[HTEF. JDIEI:,RF: 1,1EA3UPE PR_'I"tT mIt,rer.

Data 3-15" Data 3-14 generator setting

develops this spike across capacitor A.*

* Note that whereas at lower potentials the capacitor A spike potential was roughly half of the

potential applied to 0.5 fL here the capacitor potential has risen to about 70% of the 0.5

potential. This was indicative of the onset of capacitor failure. After application of this spike,

the pre-test nominal capacitance of 140 !aF was reduced to 1 laF.

21

Appendix A

Test Setup Pictures

23


Picture 1: 50 _ spike source test set up. Capacitor is connected to LISN power output and

brass bond strap to minimize potential drop across capacitor leads and connections. The power

supply hot output is connected to the back side (power input side) of LISN. A large capacitor

also bypasses the LISN power input to ground, to provide local energy storage. Switched

current is high in magnitude relative to what the power supply can deliver (also there is

inductance/resistance in leads between the supply and LISN). The electrolytic capacitor (on the

order ofmF) has its high side connected to the LISN power input connector using a solder wick

bond strap less than one inch long, and a sheet of thin brass stock from the low side of the

capacitor to the ground plane, providing less than 3:1 length-to-width ratio in the ground path.

The picture above is schematically depicted below (Figure 1 from section 3.2.1):

switching

nL'/ UT transiento'sco generator

24


o'scope hotconnection

o'scopeground

tantalum

electrolyticcap-under-test

lowimpedancebond strapconnection

to ground

Cu tape for low impedance bond

Picture 2: Close up of tantalum capacitor connection to LISN output in 50 fl spike test set

up. Capacitor lead length has been minimized by close connection to LISN port and use of brass

bond strap extension of ground plane.

25


MIL-STD-462D LISN 50 pH, 50_, 50 A (used as power

supply protection filter only)

Solar Model 8282-1CS06 spike source

ceramic DIP cap-under-test

Picture 3: CS06 parallel injection test set up. The LISN here is a filter protecting the power

supply output from the CS06 spike. Note that capacitor under test is connected directly to

Model 8282-1 parallel output jacks to minimize lead impedance. Figure 2 (from section 3.2.2)

below is a schematic of above test set up:

LISN

26


Picture 4: Close up of ceramic capacitor under CS06 spike parallel injection. Minimized lead

length is apparent. Note that ceramic capacitor is configured as a DIP, but all leads on one side

are common. These were interwoven with solder wick and EMI tape to provide very short, low

impedance leads for connection to either LISN terminal and brass bond strap (50 f_ spike test) or

Model 8282-1 parallel output jacks.

27


0-270 Vdc power supply

oscilloscope

bypasscapacitor

Solar 6220 CS01transformer

Solar 7399-2 spike source explosion chamber

Picture 5: MIL-STD-1399 series injection test set up. Explosion chamber holds capacitor

under test. Solar transformer is extra protection for power supply, recommended by Solar 7399-

2 instruction manual. For clarity, it is not shown in schematic below (Figure 5 of section 3.2.3):

7399-2 cap under test

,_O'SCOpe_

cap large compared to CUT

28


PVC perimeter

Lexan front and back

panel removable forcapacitor access

capacitors-under-test

Picture 6: Close up of explosion chamber with capacitor B (two series 125 Vdc rated

capacitors ganged for Space Station power bus derating) installed.

29


good cap A ground side

note end capdeformationdue to highinternal pressure

failed capacitor Eground side up

Picture 7: End view comparison of failed capacitor E with good capacitor A (same package).

Capacitor E is seen to have undergone explosive compression, which, however, was contained by

its case. Capacitor failed open; its failure would not have directly caused other circuit

malfunction, except by its failure to perform its original function.

Picture 8: End view comparison of failed

Capacitor C dielectric has broken into pieces.

the power supply.

ceramic DIP capacitor C with good capacitor.

Capacitor failed short, blowing a 1 Amp fuse in

30

Form ApprovedREPORT DOCUMENTATION PAGE OMBNo.0704-0188

Public reporlthg burden for this cOleCtton of thlormation is estimated to average 1 hour per response, inclt._lingthe time for reviewing instructions,searching existing data sources.gathering and mldrdaJnmg the data needed, and completing and reviewing the collection of irdormatton. Send comments regaKling this burdon estimate or any other aspect ol thiscollection of inlorrnation, including suq_gestk_s for reducing th_sburden, to Washington Headquarters Services, Directorate for Information Operation and Repot(s, 1215 JeffersonDavis Highway, Suite 1204, Adklgton, VA 222024302, and to the Office of Management and Budgel. Paperwork Reduction Project (0704-0188), Washington, DC 20503

1. AGENCY USE ONLY (Leave Blank) 2. REPORT DATE 3. REPORT TYPE AND DATES COVERED

February 2000 Contractor Report (Final)4. TITLE AND SUBTITLE 5. FUNDING NUMBERS

Investigation Into the Effects of Microsecond Power Line Contract No. H-29919DTransients on Line-Connected Capacitors

6. AUTHORS

K. Javor

7. PERFORMING ORGANiZATiON NAMES(S) AND ADDRESS(ES)

EMC ComplianceP.O. Box 14161Huntsville, AL 35815-0161

9. SPONSORING/MONiTORING AGENCY NAME(S) AND ADDRESS(ES)

George C. Marshall Space Flight Center

Marshall Space Flight Center, AL 35812

8. PERFORMING ORGANIZATiON

REPORT NUMBER

M-961

10. SPONSORING/MONITORING

AGENCY REPORT NUMBER

NASA/CR--2000-209906

11. SUPPLEMENTARY NOTES

Prepared for NASA's Space Environments and Effects (SEE) Program

Technical Monitor: R. Kapustka

12a. DISTRIBUTION/AVAILABI LITY STATEM ENT

Unclassified-Unlimited

Subject Category 33Standard Distribution

12b. DISTRIBUTION CODE

13. ABSTRACT (Maximum 200 words)

An investigation was conducted into the effect of power-line transients on capacitors used by NASA and installed on

platform primary power inputs to avionics. The purpose was to investigate whether capacitor voltage ratings needs to

be derated for expected spike potentials. Concerns had been voiced in the past by NASA suppliers that MIL-STD--461

CS06-1ike requirements were overly harsh and led to physically large capacitors.

The author had previously predicted that electrical-switching spike requirements representative of actual power-line

transient potentials, durations, and source impedance would require no derating. This investigation bore out that

prediction. It was further determined that traditional low source impedance CS06-1ike transients also will not damage

a capacitor, although the spikes themselves are not nearly as well filtered.

This report should be used to allay fears that CS06-1ike requirements drive capacitor voltage derating. Only that

derating required by the relatively long duration transients in power quality specification need concern the equipment

designer.

14. SUBJECT TERMS

electromagnetic effects, capacitors, power line transients

15. NUMBER OF PAGES

33

16. PRICE CODE

A03i17. SECURITY CLASSIFICATION 18. SECURITY CLASSIFICATION 19. SECURITY CLASSIFICATION 20. LIMiTATION OF ABSTRACT

OF REPORT OF THIS PAGE OF ABSTRACT

Unclassified Unclassified Unclassified UnlimitedNSN 7540-01-280-5500 Standard Form 298 (Rev 2-89)

proscribedby ANSIS1d 239"18296-102

Investigation Into the Effects of Microsecond Power Line ...

Documents

Transcript of Investigation Into the Effects of Microsecond Power Line ...