Introduction TAS Instrumentation Applications Product intro and apps 2... · Technology...
Transcript of Introduction TAS Instrumentation Applications Product intro and apps 2... · Technology...
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Outline
• Introduction
• TAS Instrumentation
• Applications
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Preface
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Preface
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Company Overview
HQ Founded : U.S. Subsidiary : European Subsidiary : Asian Subsidiaries : Business : Publicly Traded : Capital : Revenue (FY2012) : No. of Employees : Annual R&D Spend :
1954, Tokyo, Japan 1982, Santa Clara, CA 1983, Munich, Germany China, Taiwan, Korea, Singapore Malaysia Semiconductor ATE Mechatronics Systems Services ,Support & others (Terahertz Technologies) Tokyo Stock Exchange (6857) New York Stock Exchange (ATE) /32.4Billion Appx. $1.7B Globally Approximately 5000 $ 365M – 8 facilities
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Business Segments
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Introduction of TAS7500 Series and Applications
For more inquiries
ADVANTEST CORPORATION 508 Carnegie Center, Princeton, NJ 08540 USA Tel.: +1-609-897-7326 [email protected] June 2013
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Multi-layer analysis • Layer thickness • Refractive index
Bulk analysis • Powders • Tablets • Liquids • Suspensions
Reflectance
Sample
Transmission
ATR * Surface analysis • Highly absorbing
samples (Aqueous) • Rapid powder
analysis
Sample compartment (dry air purged)
Polarization analysis • Anisotropic solids • Chiral molecules
Spectroscopy Sampling Accessories
Sample
Sample
Linear Polarization Transmission
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TAS7500SP unit block diagram
FFT
Time domain waveform
-0.2
-0.1
0.0
0.1
0.2
0.3
0.4
0.5
0 20 40 60
Am
plit
ude (
a.u
.)
Time (ps)
A/D
Laser 1 Synchronized
Control Laser 2
emitter detector
sample
Spectroscopy
Frequency domain spectrum
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Automated THz Image Analysis
1. Measure sample dimensions
Spatial mapping of
coating thickness
2. Select cassette and load
samples
3. Select point spacing and
data averaging
5. Define calculation file
and run automated data
processing
6. Display analysis results
4. Automated data collection
on up to 10 tablets
Cross-sectional depth
profiling
Layer thickness
distribution
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Emitter
Sample
Automatic 3D scan
Detector
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テラヘルツ分光
TAS7500IM Imaging unit block diagram
Laser 1 Synchronized
Control Laser 2
A/D
Data Processing
emitter detector
x y
z Sample tablet
Translation & Rotation Motorized Stages
Time-of-flight waveform Single point data
2D, 3D Spatial map
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Coating, n1
Surface
Interface Core, n2
Air, n0
Coating
thickness
I n1
Time (psec)
Inte
nsity
t
Time (psec)
Inte
nsity
rref
r1
r2
Reflective mirror
Iref
𝒕𝒉𝒊𝒄𝒌𝒏𝒆𝒔𝒔 =𝒄∆𝒕
𝟐𝒏
Terahertz Time-of-flight Imaging
Layer Thickness Measurements
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TAS7500SP - Spectroscopy only
TAS7500IM - Imaging only Common parts for all configurations
The TAS7500 can be configured as a
complete system or as individual units
TAS7500 - Spectroscopy & Imaging
System controller/ analysis PC
Analyzer unit
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Variable Optical Path Length
Sample Compartment
for the
Spectroscopy System SP
Configurable Optical Bench
for the
Optical Sampling System TS
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TAS7500TS
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New Terahertz Technology
• Dual Fiber Launch System brings the THz beam to your
sampling system
- Taking spectroscopy “out of the box”
• Choice of Emitters
- Wide Choice of Optimized THz Emitters
- Ultra Broadband Coverage
• Variable Optical Path Length
- Continuously Variable Up to 10 meters
• Variable Acquisition Speed and Resolution
- Minimum 1 msec/scan
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TAS7500TS
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TAS7500TS
Terahertz Wave Optical Sampling System Flexible Terahertz wave measurement and analysis platform
TAS1230 0.03 - 7THz (broadband type) Fiber coupled compact terahertz wave detector with transimpedance amplifier
TAS1110 0.1 - 4THz (basic type)
TAS1120 0.03 - 2THz (low-frequency type)
TAS1130* 0.5 - 7THz (broadband type)
TAS1110, TAS1120, TAS1130 Terahertz Source Modules
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TAS7500TS
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Mod. signal
THz emitter
THz detector
Freq. std.
PC
Hardware control & data acquisition
Rep. rete cont.
THz E-field signal
Data processing /Display
Optical amp. 1
TIA
Trigger generator
Gig
abit
Eth
ern
et
Analysis Unit Measurement Unit
PC
I Bu
s
CP
U u
nit (W
ind
ow
s)
Trigger
Signal
Seed laser 2
Rep. rete cont.
Out
Out In
In
Mon. out
Mon. out
Out 1
Optical amp. 2
Seed laser 1
Out 1
Mon. out
Mon. out
Out 2
Out 2
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Cherenkov type phase matching and THz wave generation
Nonlinear optical crystal
Pump pulse
Phase front
Waveguide
Optical fiber
Si semi-conical lens
θ
Nonlinear optical crystal: LN (10 mm)
Pump
THz wave
λ: 1550 nm
Schematic of developed Cherenkov type source
Technology breakthrough Introduction of the Cherenkov type phase matching*1, 2
• Phase matching condition independent • Waveguide structure enables surface THz
generation in the nonlinear crystal, which minimize absorption loss of THz wave in the crystal.
• Shorter pump pulse width generates shorter THz pulse width with broad spectral range
1 K. Suizu et al., Opt. Express, 16, 7493 (2008) 2 K. Suizu et al., Opt. Express, 17, 6676 (2009)
Development of Cherenkov Type Source
2014/2/27
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Waveform and spectrum comparison
Signal-to-noise ratio in higher frequency range region (> 30 dB @4THz) was dramatically improved relative to conventional photoconductive antenna (PCA) source
-80
-60
-40
-20
0
0 2 4 6 8
Po
we
r (d
B)
Frequency (THz)
146 fs
400 fs
0 -2 2
Am
plit
ud
e (a
.u.)
Time domain waveforms
Power spectra
Cherenkov
PCA
Cherenkov
PCA
Fourier Transform
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TAS7500SL Low-Frequency System
-60
-50
-40
-30
-20
-10
0
0 0.2 0.4 0.6 0.8 1
Po
we
r (d
B)
Frequency (TH)]
Features - Low frequency (~30 GHz) sensitive terahertz
emitter and detector - Industry’s fastest waveform scan (8ms / scan) - Easily interchangeable sampling accessories
(transmittance / reflectance) - Software enables comprehensive spectroscopic
analysis - Excellent performance in a small footprint
• Lower band spectroscopy from 30 GHz with high sensitivity
• Suitable for material development of MMW* / Sub-MMW communication devices
* Millimeter wave
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Detector
Rotating Stage
Sample Moves Through Fixed Focal Point
Emitter Terahertz Wave
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TAS7000 Terahertz Tomography
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XY cross section
scan
Z cross section
scan
3D Imaging Analysis
3D analysis (operational example)
Measurement analysis and design factor optimization
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Key Technology
Mechanical stage
optical delay Laser
Mechanical
Slow sweep rate
Sensitive optical alignment
• Temperature
• Mechanical vibration
Ti-sapphire laser
• External power supply
• Chiller
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ADVANTEST
All electronic Fast pulse rate (50 MHz)
Advantest manufactured fiber laser
Dual laser sampling technology
fiber fiber
Reference oscillator
Laser 1
Laser 2
Electronic control
Phase control: Slightly different repetition rate
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TAS7500 Specifications
Features TAS7500TS /Advantest
THz module dimensions Emitter & Detector: 55mm × 20mm × 19mm
Measureable frequency range 0.03 THz - 2 THz / 0.1 THz - 4 THz / 0.5 THz - 7 THz are selectable by changing emitter module
Frequency resolution (after FFT)
3.8 GHz / 7.6 GHz / 61 GHz
Frequency accuracy ±10 GHz
Scan rate 16 ms / 8ms / 1ms
Dynamic range (required time)
60dB (30 s) at 7.6 GHz resolution
THz module fiber length 1.5 m - 10 m (To be determined at the time of order)
Automatic adaptive trigger delay adjustment function
Available
Remote control function Available
External measurement synchronization control Available
System size Table-top /rack mountable
Number of measurement channels - 1 measurement channel (standard) - 2-channel system is optionally available
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THz Instrumentation Summary
• TAS7500Sx
- Terahertz Spectroscopy
• Multiple Sampling Modules
• Multiple Emitters
• TAS7500IM
- Terahertz Imaging optimized for pharmaceutical tablets
• TAS7500TS
- Felxible Fiber Probe Based Spectrometer
• User Configurable Optical Design
• Remote Sampling
• TAS7000
- Automotive/Industrial Terahertz Tomography
• Large Sample Sizes
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Product pipeline
• TAS7400 Spectroscopy
• BIOATR Live cell analysis
• OEM THz Product B2B
• THz Power meter
• And more…
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Applications
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Advantages of the Terahertz Frequency
Range
• Non-destructive
- Changes with time can be measured on a single sample
- The sample is available for physical testing (e.g. dissolution)
• Non-ionizing radiation
- No concerns about altering product integrity
- No engineering controls are required
• No sample heating
• High depth of penetration
- Transmission spectroscopy
- Multilayer imaging
• Penetrate optically opaque materials
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Distinguishing Characteristics of Pulsed
Terahertz Vibrational Spectroscopy
• Measures fundamental inter-molecular vibrations
- Specific for crystallinity
- Hydrogen bonding
- Weak dipolar and van der Waals interactions
• Low frequency 5-150 cm-1
• Measures dynamics on a picosecond timescale
- Time-of-flight
• Femtosecond pulsed THz emitter
• Measures fundamental material properties
- Refractive Index, Absorption Coefficient, dielectric constants,
conductivity…
• Phase sensitive detection
• Measures orientation
- Anisotropy
- Optical activity
• Polarized beam
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3 Scales of Terahertz Measurements
• Bulk properties
- Density/porosity
• Tablets
• Roller Compaction Ribbon
- Layer thickness
• Multi-layer tablets
• Packaging materials – e.g., filled polymers
• Microscopic examination of coatings and interfaces
- Coating thickness – spatial uniformity in 3D imaging
• Correlation with performance properties
- Component migration
- Interface strength
• Voids and defects
• Molecular properties
- Crystallinity, polymorphism, hydration/solvation
- Content uniformity
• Specificity based on crystalline form
- Physical stability
• Co-crystal formation, Crystalline/amorphous content
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Microscopic/Imaging
Applications
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Important Applications of Terahertz
Imaging
• Density/Porosity of materials
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• Layer thickness and spatial uniformity
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Method of Data Analysis
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• Reference waveform is normalized in time and amplitude to that of the sample
• Normalized reference waveform is subtracted from the sample waveform
• Coating thickness t and refractive index
• Refractive index of coating (amplitude of r1) / (amplitude of rref)
Subtracted waveform = sample waveform – normalized reference waveform
Terahertz Time-of-flight Imaging
Sample
waveform
Reference
waveform
Subtracted
waveform
r1
rref
t
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Advantages of THz 3D Imaging
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• 2-dimensional sampling yields 3-
dimensional information
• Spatial information on coating
- Layer thickness and spatial uniformity
• Coating properties
- Surface density
• Interface properties
- Interface strength and integrity
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Intra-Tablet Coating Thickness Distribution
Tablet 1 Tablet 1-shaved
Uniform across tablet Non-uniform distribution
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Spatial Resolution vs. Scan speed
Enteric Coated Tablet
High Resolution Low Resolution
Resolution 0.3 mm 0.6 mm
# of Points 732 182
Data
averaging 512 scans/point 32 scans/point
Scan time 70 min 8 min
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Penetrating Multiple Layers
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47 μm
266 μm
Single point normalized waveform
Terahertz Time-of-flight Imaging
1st Layer
2nd Layer
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Spatial Mapping of Layer Thickness
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1st Layer Thickness 2nd Layer Thickness
Average = 53 µm Average = 287 µm
Terahertz Time-of-flight Imaging
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Terahertz Time-of-flight Imaging
Cross-sectional Imaging
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The TAS75000 series has the unparalleled ability to probe several millimeters into
the core of a multilayer tablet to reveal its internal dimensions
2D Cross-section
~ 1500um layer
thickness
TOP surface
Core
Dry-Coated Tablet
Intact
Time (ps) a Thickness (mm)
Inte
nsi
ty
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Profiling a Multi-layer System
Sectioned
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Analysis of Multi-layer Beads
Samples < 1 mm Coating
API Layer
Sugar Core
3 layer bead
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Analysis of Multi-layer Beads
Enabled by Custom Bead Holder
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Narrow Pulse Width Cherenkov Emitter
Detected waveforms
Time [ps]
Origin (sample surface)
Echo from 1st Si – SiO2 interface
-2 -1 0 1 2
Am
plit
ud
e [a
.u.]
SiO2
10.3um
21.4um
50.0um
Si
0
10
20
30
40
50
0 10 20 30 40 50
Actual thickness [mm]
Me
as
ure
d t
hic
kn
es
s
[ mm
]
理想曲線
測定値
Correlation of actual vs. measured
Realized Nondestructive thickness measurement
down to 10um
Si
Sample: Silicon on an Insulator Chip
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Cherenkov
PCA
10 mm
30 mm
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OQ standard uses SOI (Silicon On Insulator) chip
30 μm
(Highly-resistive silicon)
1 μm (SiO2)
470 μm
(Doped silicon)
THz wave
2/27/2014 All Rights Reserved - Advantest Corporation
Performance Verification
System Measurement Accuracy
1st Layer Thickness 2nd Layer Thickness
Average = 30.3 µm
= 0.73 µm Average = 470.6 µm
= 1.3 µm
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• Analyzed on other Advantest instruments
• Robotic stage/ optical bench combined with TAS7500TS
system in transmission, reflection orientations
• Samples can include:
- Large ceramic discs
- Rock core samples
- Bottles and other multi-layer plastics
- Other packaging materials
- Syringes (determine filling state)
- Biologics
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Analysis of Larger Samples
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Spatial Mapping of Bulk
Properties
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Roller Compaction Ribbon Spatial Density Mapping
All Rights Reserved - Advantest Corporation 46
S1 S2
S3 S4
2/27/2014
longitudinal 16mm
40m
m
tran
sver
se
Spot diameter
~4mm
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Spatial Density Heat Map Representation
All Rights Reserved - Advantest Corporation 47
S1 S2
S3 S4
2/27/2014
longitudinal 16mm
40m
m
tran
sver
se
Spot diameter
~4mm
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Controlled atmosphere
packaging integrity
t0 t1 t2 t3
Lay
er 1
Lay
er 2
Lay
er 3
Plastics
Layer 1 Layer 3 Layer
2
250mm
60mm
310mm
t0 t1 t2 t3
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Bulk Properties
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Measurement of Refractive Index
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Δt
Sample Peak
Air Reference
Peak
𝜂 = 𝑠𝑝𝑒𝑒𝑑 𝑜𝑓 𝑙𝑖𝑔ℎ𝑡 𝑖𝑛 𝑎𝑖𝑟𝑠𝑝𝑒𝑒𝑑 𝑜𝑓 𝑙𝑖𝑔ℎ𝑡 𝑖𝑛 𝑠𝑎𝑚𝑝𝑙𝑒
= Δ𝑡 𝑐
𝑑 +1
Tablet transmission d
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Change in Refractive Index with
Compaction Force
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1.65
1.7
1.75
1.8
1.85
1.9
0 5 10 15 20 25
Ref
ract
ive
In
dex
0.8
TH
z
Compaction Force (kN)
Compaction of MCC
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Calibration of Refractive Index vs. Porosity
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1.6
1.65
1.7
1.75
1.8
1.85
1.9
0 5 10 15 20 25
Compaction of MCC
Fresh tablet Relaxed tablet
Refr
acti
ve In
dex
Porosity (%)
% 𝑝𝑜𝑟𝑜𝑠𝑖𝑡𝑦 = 1 −𝑒𝑛𝑣𝑒𝑙𝑜𝑝𝑒 𝑑𝑒𝑛𝑠𝑖𝑡𝑦
𝑡𝑟𝑢𝑒 𝑑𝑒𝑛𝑠𝑖𝑡𝑦 100
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8kN RI= 1.673
12kN RI=1.702
16kN RI= 1.724
Correlation of Refractive Index to
Dissolution Rate of Powder Compacts
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Molecular/Spectroscopic
Applications
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Polymorph, hydrate, and co-crystal analysis
Spectra of carbamazepine polymorphs (I – III) Spectra of pipemidic acid anhydrate and trihydrate
1 2 3 4
0.0
0.5
1.0
1.5
2.0
Form III
Form II
Form I
Abso
rbance
Frequency (THz)
Crystal polymorphs
*Samples provided by Prof. Katsuhide Terada, Pharmaceutical Department, Toho University
1 2 3 4
0.0
0.5
1.0
1.5
2.0
三水和物
Abso
rbance
Frequency (THz)
無水物
Hydrates
Anhydrate
Trihydrate
Solid Form Conversion
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Chemical Specificity
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XRPD and THz Spectroscopy measure
crystallinity directly
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Lactose∙H2O
Microcrystalline cellulose
XRPD
THz
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Crystallinity
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XRPD and THz Quantitative Calibration Data
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XRPD
70 min/scan
THz
0.5 min/scan
Detection of %Crystallinity in an
Amorphous Matrix
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XRPD and THz yield comparable PLS
calibration results
All Rights Reserved - Advantest Corporation 59
THz
XRPD
2/27/2014
Detection of %Crystallinity in an
Amorphous Matrix
Cal Val
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THz PLS Calibration Data
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Detection of %Amorphous Content in a
Crystalline Matrix
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THz PLS Calibration Results
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Detection of %Amorphous Content in a
Crystalline Matrix
Cal Val
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Physical Stability
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1 2 3 4
Inte
nsity
Frequency (THz)
Form A
Form B
1 2 3 40.0
0.2
0.4
Form AAbso
rba
nce
Frequency (THz)
Form B
Drug Substance polymorph identification
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TERAHERTZ SPECTRA
Y. Ikeda, E. Kato, K. Terada et al., Chem. Pharm. Bull., 58 (2010) 76.
63
X-RAY POWDER DIFFRACTION
Form A
Form B
Absorbance
2nd derivative
Physical Stability of Drug Polymorphs
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XRPD
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Initial Form A
80ºC 2 weeks
65ºC/ 75% RH 2 weeks
Initial Form B
80ºC 2 weeks
65ºC/ 75% RH 2 weeks
64
Y. Ikeda, E. Kato, K. Terada et al., Chem. Pharm. Bull., 58 (2010) 76.
Physical Stability of Drug Polymorphs
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Drug Substance Polymorph Form B
In
ten
sity
A
bso
rba
nce
Initial
80˚C 2 weeks
65˚C / 75% RH 2 weeks
Initial
80˚C 2 weeks
65˚C / 75% RH 2 weeks Absorbance
2nd
derivative
Physical Stability of Drug Polymorphs
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In
ten
sity
Ab
sorb
an
ce
Initial
80˚C 2 weeks
65˚C / 75% RH 2 weeks
Initial
80˚C 2 weeks
65˚C / 75% RH 2 weeks
Physical Stability of Drug Polymorphs
Drug Substance Polymorph Form A
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Advantages of TAS7500
Mar 26, 2013 All Rights Reserved - Advantest Corporation 67
1.Fast and Compact
- Advantest designed resulting in fastest commercially available
measurement system
- *TAS7500TS: 1ms/scan, wave form effective measurement 2fs
2.Flexible (Multifunctional and Broadest Bandwidth)
- Fiber length option, adaptive trigger delay, external and remote control
- 2 channel system offering simultaneous measurement option
- Wideband spectral coverage: 0.03 to 7 THz
i. Low-frequency: 30 GHz to 2 THz
ii. Standard: 100 GHz to 4 THz
iii.Ultra-wideband: 500 GHz to 7 THz
3.Engineering and hardware excellence: (High Resolution and low
cost of ownership)
- 100% Solid state with no moving parts to fail
- Increased instrument availability
- Low voltage
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Questions?
Thank you
for your attention
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Broadband Cherenkov Emitter
0
1
2
3
0.5 1.5 2.5 3.5 4.5
Ab
sorb
ance
Frequency (THz)
• Sample: - Carbamazepine, Form III (CBZ (III)), 20mg - Mixed with 200 mg polyethylene powder and
compressed into a flat faced tablet
•Measurement Transmission geometry
Cherenkov
PCA
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All Rights Reserved - Advantest Corporation 70
Technology Support on the Leading Edge:
・ Committed to investing ~20% of annual revenue into R&D
・ Rich pipeline generates approximately 10 new product launches annually
・ R&D facilities around the globe
Measurement Sciences Company
Sendai R&D
Center
Advantest Laboratories
Saitama R&D
Center
Gunma R&D
Center
Advantest Europe GmbH
Advantest America, Inc.
Japan Engineering
Co., Ltd.
Core Competencies
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Advantages of the Terahertz Region
Low photon energy
Technological advantage
• Crystal lattice vibration, hydrogen-bond,
intermolecular interaction
• Non-ionizing radiation
• No sample heating
• High transparency for non-conducting
materials
• Time-domain spectroscopy
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Transmission polarization accessory
Polarization (optical rotation) change Complex refractive index Absorption coefficient Birefringence Retardation Jones vector Ellipticity
Measureable Parameters
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Polarization spectroscopy
Lamellar crystal
Vibration between helicies hydrogen bonds
Vibration along helix structure skeletal vibration ETHz
ETHz
Hoshina et al. Appl. Phys. Lett. 96,
101904 (2010)
Hoshina et al. PCCP, 13, 9173 (2011) 1 2 30
20
40
60
80
Ab
sorb
ance
(cm
-1)
Frequency(THz)
2.3THz
2.9THz
Measured by TAS7500SP (ADVANTEST)
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TAS7500TS Remote Fiber Probe
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