XRAY ANALYTICS

Courtesy Henn Gems Idar-Oberstein, Peridot 52 cts.

ED-XRF CHEMICAL ANALYSIS IN GEMMOLOGY

XRAY ANALYTICS

Gemmology is a science with a community of thousands

of gemmologists worldwide, doing examinations, research

or issuing reports on gemstones. Xray Analytics Switzerland

AG, Ltd. is the only company specialised on developing non-

destructive testing procedures for ED-XRF (Energy Disper-

sive X-Ray Fluorescence) spectrometers.

Xray Analytics Switzerland AG, Ltd. is the global distributor

for ED-XRF spectrometers that are exclusively designed by

Jiangsu Skyray Instrument Co. Ltd. in collaboration with Xray

Analytics for advanced gemmological analysis.

Xray Analytics Switzerland AG, Ltd. is the exclusive distribu-

tor in Austria and Switzerland for all analytical equipment

produced by Skyray Instrument Co. Ltd. in Kunshan, China.

Xray Analytics Switzerland AG, Ltd. was founded in Zürich

2014, which is the business centre of Switzerland. Our office

and laboratory are located in Zollikon, close to the city centre.

Our showroom for live testing is in the heart of Zürich city,

only 250 meters from Zürich main station.

Zollikon village is connected with Zürich in:

• 05 minutes by train

• 15 minutes by car

• 20 minutes to International Airport

Company facts

• 01 July 2014, Free Trade Agreement Switzerland

and China

• 22 July 2014, Exclusive Distributorship Agreement

with Jiangsu Skyray Instrument Co. Ltd.

• 05 August 2014, Founding

Xray Analytics Switzerland AG, Ltd.

• 18 August 2014, Commercial Registration

Handelsregister Canton Zürich

• 04 December 2014, BAG Permission No ZH-4693.001

COMPETENCE AND CONFIDENCE ARE PRECIOUS VALUES TO US

Dr. Andreas Burkhardt, Chairman & President of Xray Analytics Switzerland AG, Ltd.

SKYRAY INSTRUMENT

Jiangsu Skyray Instrument Co. Ltd. is a public Chinese com-

pany (stock code 300165) and has graduated with research

and own patents to one of the biggest global producers and

suppliers for high-tech analytical systems e.g. Atomic Ab-

sorption Spectrometry (AAS), Inductively Coupled Plasma

Emission Spectrometry (ICP), ICP-MS Mass-Spectrometry,

also combined with Gas Chromatography (GC-MS), HPLC or

OES. Skyray Instrument has become the biggest supplier for

advanced XRF spectrometers (WD-XRF and ED-XRF) in China

and ASEAN markets. Skyray Instrument is specialized on fast

developing and implementing individual, analytical solutions

by customers specifications.

The Skyray Instrument head office is located in Kunshan, the

new industrial development zone „KSND“, which is close to

Shanghai, with the largest seaport worldwide and two Inter-

national Airports.

Skyray Instrument is an innovative technology enterprise

and has received many awards. The subsidiaries are Beijing

Bandwise Technology Development Co. Ltd. and Shenzhen

Skyray Instrument Co. Ltd..

The company employs 1000 technicians, qualified software

engineer, physicists, chemists and scientists. Skyray Instru-

ment has almost 150 distributors in 115 countries worldwi-

de.

Address

Jiangsu Skyray Instrument Co. Ltd.

1888, West Zhonghuayuan Road

Kunshan, Jiangsu Province, China.

www.skyray-instrument.com

150 DISTRIBUTORS IN 115 COUNTRIES WORLDWIDE FOR PHYSICAL-CHEMICAL TESTING SOLUTIONS

Shanghai City view and Huangpu Jiang River.

SCIENTIFIC RESEARCH

Xray Analytics Switzerland AG, Ltd. and the Board of scientific

advisors represent decades of analytical experience in scientific

research at Universities in Germany and Switzerland creating

the first ED-XRF spectrometer for non-destructive testing of

gemstones in Basel Switzerland in the early 1980th. Professor

Willem B. Stern, Geochemical Laboratory at the University of

Basel Switzerland, became a renowned scientist of advanced

X-Ray Fluorescence analysis (XRF) and X-Ray Diffraction (XRD)

and was involved with his students in many research projects.

When the first commercial ED-XRF spectrometers were pro-

duced in the early 90th many thousands of analytical data from

metals, alloys, glass, gemstones, ceramics, soils and colour pig-

ments have been collected and published in books, scientific

journals or congress proceedings.

Also in the 80th the first analysis by soft protons PIXE (Proton

Induced X-ray Emission) was performed at the University of Sin-

gapore to test 60 rubies from Burma and Thailand. Thorough

mineralogical and gemmological examination of the gem-

stones is the precondition for a rliable determination of its

provenance. The important results were only partially acknow-

ledged or even called into doubt, when they were initially

published by S. M. Tang, S. H. Tang and T. S. Tay 1988/1989.

In 2015, the same 60 rubies were analysed with the new Skyray

EDX-4500 in the Far East Gemological Laboratory. The correct-

ness of the original PIXE data was not only confirmed by the

different method of ED-XRF, but more trace elements have

been detected with Skyray Instrument ED-XRF spectrometers.

Thirty years of analytical experience in ED-XRF has improved

new and better testing solutions for gemmology. Today, re-

nowned gemmological laboratories are using the ED-XRF tech-

nique to identify main components, minor elements, impurities

and traces in natural and synthetic gemstones in questions of

provenance, authenticity and to study chemical treatments.

THREE DECADES OF RESEARCH, INNOVATIONS AND APPLICATIONS

Prof. Sow Chorng Haur, PIXE (Proton Induced X-ray Emission) at the CIBA Department of Physics, National University of Singapore.

ED-XRF SPECTROMETERS

Skyray Instrument and Xray Analytics have designed high

sophisticated but easy to handle ED-XRF spectrometers

for gemmological analysis. The ED-XRF spectrometers fea-

turing own Skyray Instrument patents reveal to the latest

state of the art in ED-XRF analysis. The 50 KV X-ray tubes

and the SDD detectors are still US and European products.

For gemstone testing two different types of machines are

recommended: the EDX-4500 and EDX-6000.

Spectrometer EDX-4500 has one large vacuum chamber,

which is very useful for big samples, rock specimens or even

jade figures. Spectrometer EDX-6000, with rotating sample

tray (10 positions) and spin function of the gemstones (only

7 positions) is useful for smaller size specimens from 0.1 ct

up to 20 ct (< 25 mm diameter). An individual selection of 8

collimators ranging from 0.2 mm to 8 mm spot size is opti-

mised by specific excitation ranging from 5 to 50 KeV and

different automatic filter selections.

The collimation system and sample position can be changed

automatically and optical controlling and documentation is

achieved by a CMOS high resolution camera. Depending on

the atomic numbers of elements between Na 11 (Sodium )

to U 92 (Uranium), the material of the sample and the irradi-

ated surface, detections limits from 100 % down to 1 ppm

(0.0001 %) in crystalline structure are obtained in practice.

Excellent performance is achieved by fast SDD (Silicon Drift

Detector), fast DDP (Digital Pulse Processor) and Skyray

Instrument patented SNE technology (Signal Noise Enhan-

cer), that is highly efficient reducing the background noise.

Many automatic functions such as automatic dead time

counter, escape peak, double peak and pile up corrections

are very helpful in order to achieve excellent data quality. The

ED-XRF spectrometers are characterised by an unrevealed

high level of accuracy, sensitivity, precision and long-term

stability.

ADVANCED INSTRUMENTSFOR EXCELLENT PERFORMANCE

Spectrometer EDX-6000B with sample tray and spin option for advanced gemmological analysis.

Many attempts have been made during the last 30 years on

testing gemstones by means of non-destructive Energy

Dispersive X-Ray Fluorescence Spectrometry (ED-XRF), the

electron response of single atoms in a gemstone or mineral on

incident X-ray radiation. The resulting fluorescence X-ray spec-

trum provides the chemical composition of all the elements

of any sample within seconds. This method is widely used in

many applications. The ED-XRF is the only non-destructive me-

thod that is causing absolutely no damage to the gems. Also

no remanent radiation is induced that might cause any kind of

damage to the stone or changing the colour. In case of precious

stones and minerals no polishing or any kind of conditioning

is necessary to prepare the samples. Rough, polished or even

mounted stones can be analysed within seconds.

With the new generation of Skyray Instrument spectrometers

a gemmological ED-XRF analysis will need a few seconds only

for a high resolution spectrum. In only 100 s the EDX-4500

and EDX-6000 can quickly analyse a rough or polished ruby, a

sapphire, spinel or jade samples. Reporting full quantitative re-

sults of 30 elements simultaneously will need five seconds only.

Skyray Instrument high-tech spectrometers are some of the

fastest and most precise instruments. High sensitivity, high

precision, low error, low standard deviation and good repeat-

ability are the source of excellent data. Traces of Gallium in

corundum and traces of Rubidium in emerald will be detected

down to 0.0005 % (5 ppm). The detection of 10 ppm Lead

(0.0010 % Pb) in lead-treated rubies is also no problem and will

help to identify tricky treatments.

25 years of ED-XRF technical development results in fast and

reliable instruments consisting of stable high-performance

hardware combined with sophisticated controlling, evaluation

and data processing. Today ED-XRF analysis is fast, precise and

simple to handle.

ED-XRF ANALYSIS

HIGH SENSITIVITY AND EXCELLENT RESULTS IN 100 SECONDS ONLY

E. Billie Hughes, FGA, operating the EDX-6000B, LOTUS Gemology Co Ltd.

06 | CONVERTING DATA05 | SAVE THE SPECTRUM

01 | PLACE THE STONE 02 | ADJUST POSITION

CYCLE OF PERFECT MEASUREMENT

08 | GRAPHS & GROUPS07 | REPORTING RESULTS

03 | SELECT PARAMETERS 04 | RUN THE ANALYSIS

TRACE ELEMENTS

Xray Analytics Switzerland AG, Ltd. is upgrading and pre-

paring each ED-XRF spectrometer with dedicated full quanti-

tative measurement procedures for special applications like

ruby and sapphire, spinel, garnet or emerald. Even tourmaline

and sophisticated jade analysis constitutes no problem for

the new Skyray Instrument spectrometers.

Natural gemstones not only display a typical chemical com-

position of the matrix, but the minerals might also display

a typical chemical fingerprint, indicating its genesis and geo-

logical provenance. New discoveries of gemstones have in-

creased the numbers of provenances drastically in the last 20

years, causing an increased chemical diversity but also over-

lapping chemical patterns.

A higher sensitivity of the analytical systems and improved

analytical performance have been realised in the last two

decades as well.

The new spectrometers can simultaneously detect over 30

elements now and the detection limits of the elements are

down to some ppm in crystalline minerals and amorphous

glass matrixes.

Detection limits are largely depending on the matrix compo-

sition. In precious metals as matrix the detection limits of

certain trace elements are some hundred ppm (parts per mil-

lion). In a crystalline matrix like gemstones the detection limit

is drastically decreasing with the increasing atomic number

from 1000 ppm of Sodium oxide to 1-2 ppm for Zircon oxide.

Even in synthetic gems we might identify a chemical finger-

print that indicates the production process. Exotic elements

e.g. Strontium, Zirconium, Thorium, Niobium or even Uranium

can be well detected and quantified in coloured gem-

stones. This is a profound source for advanced gemmo-

logical reports.

THE FINGERPRINT DETECTS A NEW WORLD IN THE GEMS

ED-XRF Spectrum (45KV) of a natural turquoise Apatite with rare trace elements Thorium and Uranium.

TEACHING

Learning by doing is good, but learning and training by indi-

vidual teaching, might be better to avoid awful mistakes in

difficult analytical laboratory work.

Our teaching is different from competitors as we are offering

not standardised lessons, with impressive pictures on a flip

chart, but a personalised individual training on the costumers

ED-XRF instrument in the laboratory. Our teaching is focused

on the analytical work and the problems of material testing

of any samples, treatments and detection of important trace

elements. We are focused on analytical problems you might

have with the customers specimen in your laboratory.

For advanced analysis of precious metals only a one day trai-

ning is required. For gemmological ED-XRF analysis a mini-

mum of two to three days intensive training on the ED-XRF

spectrometer in the customers’ laboratory is recommended.

This special training is of course included in our «all inclusive

packages» for any analytical instrumentation.

We are delighted to offer also intense teaching lesssons and

practical training on liquid analytical methods such as Atomic

Absorption Spectrometry (AAS) or Inductively Coupled Plasma

Mass-Spectrometry (ICP-MS) at the Skyray Instrument appli-

cation laboratory in Kunshan Shanghai.

Teaching topics are:

• advantages and disavantages of the analytical method

• gemstones, glasses and color pigments

• rough and polished stones (background)

• treatments and enhancement of stones

• detection limits of impurities and inclusions

• precious metals and alloys analysis

• data transfer and graphic plots

LEARNING BY DOING IS GOOD, BUT ...

Lecture at Xray Analytics Showroom, Zürich City.

SUPPORT

This is not any simple advert, but the philosophy of our com-

pany. We support our customers by advice and consultancy

services before, during and after purchasing analytical lab-

oratory equipment. We support our customers with perfect

technical installation onsite in his laboratory. Xray Analytics

Switzerland’s all inclusive packages will guarantee fast and

excellent support.

Xray Analytics also support you by teaching and training.

Please let us know, if any additional support or help is requi-

red. We are taking personalised and direct care of your pro-

blem. This is our promise - today, tomorrow and 365 days a year.

Xray Analytics guarantees that our customers will be satis-

fied with the Skyray Instrument ED-XRF system and indivi-

dual support we are providing. We try to fulfill even high ex-

pectations and will support you whenever there is need.

Direct support and personalised special training is the one

offer. The online technical assistance by Skyray Instrument

engineers is another offer and also free of charge. Online

assistance is a new and very convenient option to provide

direct technical assistance and support, if any software

problem might occur on your computer or with the spectro-

meter. Also for further inquiries our scientific expert team

will provide scientific expert advice. This is a complimentary

service to our customers.

For any research projects we are providing expertise. Please

ask Xray Analytics Switzerland AG, Ltd. We are delighted

to offer the best rate. Xray Analytics is proudly working to-

gether with recommended university experts and happy to

prepare any arrangement and good achievement for your

laboratory.

WE SUPPORTYOU

Dr. Richard Liu, President Skyray Instrument, Dr. Andreas Burkhardt, Prof. Dr. Willem B. Stern, Kennedy Ho CEO AIGS Bangkok and Executive of Jade Association of Thailand , Zürich 2015.

SERVICES

We like to satisfy the customer. Our complimentary services

will start just by the order. Qualified staff at Skyray Instru-

ment head office in Kunshan Shanghai is responsible for a

safe shipment and delivery of the instrumentation to your

laboratory. The onsite installation process is of course in-

cluded in our «all inclusive packages».

Our philosophy is to offer excellent ED-XRF instruments

that do not require any continuous technical services. We

are selling excellent, long-life products, without additional

charges for technical services as competitors do. All Sky-

ray Instrument software upgrades for Windows systems,

operating Windows 7, 8 or 10 are free of charge, thus re-

ducing the annual laboratory costs. If careful handling of

the spectrometer is guaranteed by laboratory staff, Sky-

ray Instrument EDX-4500 and EDX-6000 will satisfy by ex-

cellent stability, precision and repeatability for many years.

The producer Jiangsu Skyray Instrument Co. Ltd. and the

general sales agent Xray Analytics Switzerland AG, Ltd. will

guarantee this honestly.

Usually the spectrometer is operated 24 hours in stand by

modus as costs for power consumption are very low. Auto-

matic «warming up» function for 500 seconds, to achieve

the correct working temperature of the X-ray tube, is only

necessary after the ED-XRF system was switched off. Even in

case of any unforeseen power interruption, this will cause no

damage to devices and the powerful spectrometer. Switch

on the instrument for a restart again, press the automatic

calibration button and the system will be ready for gem-

stone measurements within some minutes.

Nobody is perfect and if there is any technical problem, we

offer free technical assistance by Skyray Instrument online

services. For any problem please send an email directly to

info@xray-analytics.com.

WE LIKE TO SATISFY THE CUSTOMER

The first EDX-4500 for gemmological analysis. Senior engineers Wu Min, Wang Jia Yong and Dr. Andreas Burkhardt at Skyray Instrument, 2014.

GIT Director Dr. rer. nat. Pornsawat Wathanakul welcomes Dr. Andreas Burkhardt.LOTUS Gemology Co. Ltd., Bangkok, E. Billie Hughes, operating the EDX-6000B.

Dr. Richard Liu, Founder and President of Skyray Instrument Co. Ltd., Kunshan Shanghai.

THE CUSTOMER IS PRECIOUS FOR US –WE SAY THANK YOU!

The four VIP: Thank you and see you soon!Axel Henn, HENN Idar-Oberstein and Dr. Andreas Burkhardt, Baselworld 2015.

Far East Gemological Laboratory, Tay Thye Sun, Founder and CEO, operating the EDX-4500. Kennedy Ho, CEO and owner of AIGS Lab Co. Ltd., Bangkok, operating two EDX-6000B.

XRAY ANALYTICS

Xray Analytics Switzerland AG, Ltd.

Skyray Instrument Co., Ltd. Agent

Office & Laboratory

Brandisstrasse 59

8702 Zollikon – Zürich

Switzerland

Instruments Showroom

Limmatquai 112

8001 Zürich

Switzerland

info@xray-analytics.com

www.xray-analytics.com

www.xray.expert