dave heading and bp1 - Samtec...

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Contech Research SEPTEMBER 24, 2001 TEST REPORT #201175A, REVISION 1.2 QUALIFICATION TESTING PART NUMBERS YFT-20-05-E-08-SB YFS-20-03-E-08-SB YFT-20-05-H-08-SB YFS-20-03-H-08-SB SAMTEC SAM ARRAY NUMBER: 0110-0349 APPROVED BY: LUANNE WITT PROGRAM MANAGER CONTECH RESEARCH, INC.

Transcript of dave heading and bp1 - Samtec...

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Contech Research

SEPTEMBER 24, 2001

TEST REPORT #201175A, REVISION 1.2

QUALIFICATION TESTING

PART NUMBERS

YFT-20-05-E-08-SBYFS-20-03-E-08-SBYFT-20-05-H-08-SBYFS-20-03-H-08-SB

SAMTEC SAM ARRAY

NUMBER: 0110-0349

APPROVED BY: LUANNE WITTPROGRAM MANAGER

CONTECH RESEARCH, INC.

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TR#201175A, REV.1.2 2 of 117 Contech Research

REVISION HISTORY

DATE REV. NO. DESCRIPTION ENG.

9/24/2001

10/25/2001

8/14/2007

1.0

1.1

1.2

Initial Issue

Editorial changes per customersrequest.

Revised Current Derating curves.

LEW

MP

TP

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CERTIFICATION

This is to certify that the evaluation described herein wasdesigned and executed by personnel of Contech Research, Inc.It was performed in concurrence of Samtec, of New Albany, INwho was the test sponsor.

All equipment and measuring instruments used during testingwere calibrated and traceable to NIST according to ISO 10012-1and ANSI/NCSL Z540-1, as applicable.

All data, raw and summarized, analysis and conclusionspresented herein are the property of the test sponsor. No copyof this report, except in full, shall be forwarded to anyagency, customer, etc., without the written approval of thetest sponsor and Contech Research.

Luanne WittProgram Manager

Contech Research, Inc.

LW:js/cm

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SCOPE

To perform qualification testing on mated connectors asmanufactured and submitted by the test sponsor Samtec.

APPLICABLE DOCUMENTS

1. Unless otherwise specified, the following documents ofissue in effect at the time of testing form a part of thisreport to the extent as specified herein.

2. Product Specifications:

Nortel Networks, NPS Detail Specification NPS25298-2

3. Standards: EIA Publication 364

TEST SAMPLES AND PREPARATION

1. The following test samples were submitted by the testsponsor, Samtec, for the evaluation to be performed byContech Research, Inc.

Part Number Description Condition

YFT-20-05-E-08-SB 50µin Au Header MountedYFS-20-03-E-08-SB 50µin Au Socket MountedYFT-20-05-H-08-SB 30µin Au Header MountedYFS-20-03-H-08-SB 30µin Au Socket Mounted

2. Unless otherwise indicated, all materials were certified bythe manufacturer to be in accordance with the applicableproduct specification.

3. The test samples as submitted were certified by themanufacturer as being fabricated and assembled utilizingnormal production techniques common for this type ofproduct and inspected in accordance with the qualitycriteria as established for the product involved.

4. Where applicable, test samples were supplied assembled andterminated to test boards by the test sponsor.

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TEST SAMPLES AND PREPARATION - Continued

5. All test samples were coded and identified by ContechResearch to maintain continuity throughout the testsequences. Upon initiating testing, mated test samplesremained with each other throughout the test sequences forwhich they were designated.

6. The test samples were ultrasonically cleaned using thefollowing process:

A) Test samples were immersed into the Branson 8210cleaner which contained Kyzen Ionex FCR cleaningsolution with the following conditions:

a) Temperature : 55° ± 4°Cb) Frequency : 43 KHzc) Immersion Time : 3 to 5 Minutes

B) Test samples were slowly removed and placed into theBranson 5210 cleaner which contained DI water with thefollowing conditions:

a) Temperature : 55° ± 4°Cb) Frequency : 47 KHzc) Immersion Time : 1 to 2 Minutes

C) Test samples were removed and placed in a FisherThermix agitator containing DI water warmed to55° ± 5°C for 1 to 2 minutes.

D) Upon removal, the test samples were rinsed for 1 to 2minutes in free flowing DI water at 55° ± 5°C.

E) After final rinse, test samples were dried in an aircirculating oven for 2 to 3 minutes minimum at50° ± 2°C.

F) Test samples were allowed to recover to room ambientconditions prior to testing.

7. Unless otherwise specified in the test procedures used, nofurther preparation was used.

TEST SELECTION

See Test Plan Flow Diagram, Figure #1, for test sequences used.

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DATA SUMMARY

TEST REQUIREMENT RESULTS

GROUP 1 (50µin Au)

NORMAL FORCE RECORD FIGURE #2MATING FORCE RECORD 36.5lbs MAX.UNMATING FORCE RECORD 16.8lbs MIN.DURABILITY NO DAMAGE PASSEDMATING FORCE RECORD 29.3lbs MAX.UNMATING FORCE RECORD 15.1lbs MIN.NORMAL FORCE RECORD FIGURES #3-5WEAR TRACK <50% CORROSION FIGURES #6-12

GROUP 2 (50µin Au)

LLCR 20 mΩ MAX. 9.7mΩ MAX.DURABILITY NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +0.9mΩ MAX.

GROUP 3 (50µin Au)

CURRENT RATING (32 Pos.) PLOT FIG. #13CURRENT RATING (160 Pos.) PLOT FIG. #14

GROUP 4 (50µin Au)

LLCR 20 mΩ MAX. 10.1mΩ MAX.VIBRATION NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +1.3mΩ MAX.MECHANICAL SHOCK NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +1.4mΩ MAX.

GROUP 5 (50µin Au)

BREAKDOWN VOLTAGE RECORD 1600 VACIR >5000 MEGOHMS PASSEDDWV NO ARCING OR BREAKDOWN PASSEDTHERMAL SHOCK NO DAMAGE PASSEDIR >5000 MEGOHMS PASSEDDWV NO ARCING OR BREAKDOWN PASSEDMOISTURE RESISTANCE NO DAMAGE PASSEDIR >5000 MEGOHMS PASSEDDWV NO ARCING OR BREAKDOWN PASSEDBREAKDOWN VOLTAGE RECORD 1100 VAC

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DATA SUMMARY – Continued

TEST REQUIREMENT RESULTS

GROUP 6 (50µin Au)

LLCR 20 mΩ MAX. 9.2mΩ MAX.THERMAL SHOCK NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +0.9mΩ MAX.MOISTURE RESISTANCE NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +0.9mΩ MAX.

GROUP 7 (50µin Au)

LLCR 20 mΩ MAX. 9.0mΩ MAX.THERMAL AGING NO DAMAGE PASSEDLLCR, 100 HRS. ∆10 mΩ MAX. +0.9mΩ MAX.

200 HRS. ∆10 mΩ MAX. +0.9mΩ MAX.300 HRS. ∆10 mΩ MAX. +1.4mΩ MAX.400 HRS. ∆10 mΩ MAX. +1.4mΩ MAX.500 HRS. ∆10 mΩ MAX. +1.5mΩ MAX.

GROUP 8 (50µin Au)

NORMAL FORCE RECORD FIGURE #20THERMAL AGING NO DAMAGE PASSEDNORMAL FORCE, 100 HRS. RECORD FIGURE #21

200 HRS. RECORD FIGURE #22300 HRS. RECORD FIGURE #23400 HRS. RECORD FIGURE #24500 HRS. RECORD FIGURE #25

GROUP 9 (30µin Au)

LLCR, MATED 20 mΩ MAX. 10.4mΩ MAX.THERMAL AGING NO DAMAGE PASSEDLLCR, UNMATED ∆10 mΩ MAX. +3.6mΩ MAX.DURABILITY NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +9.4mΩ MAXMFG (5 DAYS) NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +7.7mΩ MAX.MFG (10 DAYS) NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +4.2mΩ MAX.MFG (15 DAYS) NO DAMAGE PASSED

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DATA SUMMARY – Continued

TEST REQUIREMENT RESULTS

GROUP 9 (50µin Au)- Continued

LLCR ∆10 mΩ MAX. +7.5mΩ MAX.1 CYCLE NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +13.7mΩ MAX.MFG (20 DAYS) NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +7.4mΩ MAX.DISTURBANCE NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +5.0mΩ MAX.1 CYCLE NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +6.6mΩ MAX.DURABILITY NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +6.3mΩ MAX.MFG (30 DAYS) NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +6.0mΩ MAX.MFG (40 DAYS) NO DAMAGE PASSEDLLCR ∆10 mΩ MAX. +7.6mΩ MAX.

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FIGURE #1

VISUAL

SAMPLE PREPARATION

NORMAL LLCR LLCR BREAKDOWN LLCR LLCR NORMAL LLCRFORCE VOLTAGE FORCE

VIBRATIONIR THERMAL THERMAL

MATING/ SHOCK THERMAL AGINGUNMATING LLCR AGINGFORCE DWV THERMAL LLCR

DURA- MECHANICAL LLCR AGINGBILITY(50X) SHOCK DURABILITY

DURA- THERMAL LLCRBILITY(50X) LLCR SHOCK (100,200, LLCR

300,400,MATING/ LLCR IR 500 HRS) NORMAL MFGUNMATING CURRENT FORCEFORCE RATING DWV (100,200, LLCR

(16 CONTACTS) MOISTURE 300,400,RESISTANCE 500 HRS) MFG

NORMALFORCE CURRENT MOISTURE LLCR

RATING RESISTANCE(160 CONTACTS) LLCR MFG

WEAR IR LLCRTRACK

1 CYCLEDWV

LLCR

BREAKDOWN MFGVOLTAGE

LLCR

DISTURBANCE

LLCR

1 CYCLE

LLCR

DURABILITY

LLCR

MFG

LLCR

MFG

LLCR

Gp 1 Gp 2 Gp 3 Gp 4 Gp 5 Gp 6 Gp 7 Gp8 Gp 9

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EQUIPMENT LIST

ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal

19 6/29/02 6/29/01 Bench Oven Blue M Co. POM7-256C P38-1453 12 mon.20 Bench Oven Hot Pack 1303 30364 N/A Each Test27 5/9/02 5/9/01 Temp. Humid. Chamber Blue M Co. FR-256PC-1 F2-249 See Cal Cert 12 mon.34 Shock Machine Avco SM110-3 1047 See ID# 14 & 117 Each Test52 Drill Press Stand Craftsman 25921 4001-2 N/A N/A53 12/29/01 6/29/01 Load Cell 10 Pound Daytronic 152A-10 182 See Cal Cert 6 mon.54 Air Fume Hood Labconco 47701 39286 N/A N/A92 NF Fixture BK Tool & MFG N/A N/A ±.0005" N/A

113 Large Oven Blue M Co. POM-166E P6-2724 N/A Each Test117 6/12/02 6/12/01 Digitizing Scope Hewlett Packard 54200 2445A 00127 See Cal Cert 12mon.192 6/22/02 6/22/01 Vertical Thermal Shock Cincinnati Sub-Zero VTS-1-5-3 88-11094 See Cal Cert 12 mon.203 Stereo Scope Bausch & Lomb N/A N/A N/A N/A213 11/1/01 5/1/01 Temp/Humidity Gage Cole Parmer Co. 3310-40 1 ±1% 6 mon.257 Scanner Main Frame Keithley Instr. 706 472351 See Manual Each Test315 X-Y Table NE Affiliated Tech. XY-6060 N/A N/A N/A321 1/23/02 1/23/01 AC-DC Hipot/Megometer Hipotronics Co. H300B DS16-201 See Cal Cert 12 mon.400 Computer Kandu Co. 286-12 41353 N/A N/A410 6/20/02 6/20/01 Current Shunt Empro Co. 200A-50 05 ±1% 12mon455 8/30/02 8/30/01 Digital Multi Meter Unit Keithley Co. 199 392203 See Cal Cert 1/00465 6/21/02 6/21/01 Precision Resistor Victoreen Co. 5000 Megohm N/A ± 1 % 12 mon.466 6/21/02 6/21/01 Precision Resistor Victoreen Co. 50,000 mego N/A ± 1 % 12 mon.478 Computer Twilight Co. P111-450 N/A N/A N/A487 Computer Twilight Co. 386-40 N/A N/A N/A521 Sulfur Dioxide Analyzer Polaroid C.S.I. Co. SA285E FE001 See Spec Each Test529 Computer ARC Elect. 486-40 N/A N/A N/A543 12/11/01 12/11/00 Analytical Balance Ohaus Co. AP250D MO9198 ± .4mg 12 mon.544 2/24/02 8/24/01 Temp-Humid-Trans General Eastern 850-232 00984 ± 2%RH 6mon

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EQUIPMENT LIST cont.

ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal

628 8/28/02 8/28/01 Digital Thermometer Omega Eng. DP 116 6210125 ±1.1DegC 12mon631 12/29/01 6/29/01 LVDT Condt.Amp. Daytronics Corp. 3230 S04888 See Cal Cert 6 mon.650 8/8/02 8/8/01 Digital Multimeter Hewlett Packard 34401A US36032126 See Cal Cert 12 mon.683 Plotter Hewlett Packard 7470A 2308A85161 N/A N/A684 6/11/02 6/11/01 Accelerometer PCB. Co. 353B04 47648 See Cal Cert. 12mon

691 10/3/01 4/3/01 Microohm Meter Keithley Co. 580 0686748 See Cal Cert 6 mon.

699 Oxident Monitor Mast Co. 1724 12732 N/A Each Test1012 2/27/02 2/27/01 DC Power Supply 30 Amps Hewlett Packard 6033A 2642A-02383 See Cal.Cert. 12 mon.1041 8/8/02 8/8/01 Force Gage Chatillon DFIS-50 B34054 ± .15% 12 mon.1047 10/24/01 4/24/01 Microohm Meter Keithley 580 0705731 See Cal Cert 6 mon.1115 11/9/01 5/9/01 Digital Multimeter Radio Shack Auto Range 22-186A See Cal. Cert. 6 mon.1116 Computer ARC. Co. P111-450 N/A N/A1118 8/28/02 8/28/01 Torque Wrench Lbf-in Amp/Macom 9911 2098-0275-54 See Cal. Cert1130 1/25/02 7/25/01 Accelerometer PCB Co. 353B04 58130 See Cal. Cert. 6 mon.1136 5/30/02 5/30/01 Signal Condt. PCB 480EO9 23397 See Cal. Cert. 12mon1139 11/15/01 11/15/00 Micrometer Barrel Mitutuyo 152-391 01 ±.0001in 12 mon.1168 Mainframe Hewlett Packard E8408A US39000357 N/A N/A1169 Computer ARC PC133 none N/A N/A1175 12/7/01 6/7/01 Discontinuity Monitor Metronics DM3000-10 6-2K-1 See Cal Cert 6mon1238 Bench Oven Blue M. ESP400C-5X ESP-1394 See Manual1272 Shaker Table Unholtz Dickie S202PB 263 N/A N/A1278 7/3/02 7/3/01 Microohm mtr Keithley 580 0803947 See Manual 12 mon.1279 Computer ARC Co. Pent-450 030175 N/A N/A1297 MFG Control Panel Contech Research N/A N/A C1686A N/A1298 MFG Chamber Contech Research 64 Cu Ft N/A N/A N/A

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TEST RESULTS

GROUP 1

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: SR------------------------------------------------------------START DATE: 9/13/01 COMPLETE DATE: 9/13/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 45%------------------------------------------------------------EQUIPMENT ID#: 53, 92, 455, 487, 631, 683, 1139------------------------------------------------------------NORMAL FORCE

PURPOSE:

To determine the magnitude of normal force generated at anygiven deflection level within the normal operating levels ofthe contact system.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 04.

2. Applicable portions of the plastic housing were removed toexpose the contacts to be tested.

3. One tine of the contact was removed to expose the opposingtine to be tested.

4. The prepared sample was placed in a special holding fixtureon a X-Y moveable table.

5. The sample was positioned in such a manner so as to allow aspecial probe attached to a force transducer to deflect thecontact element to a given distance as specified.

6. The probe/force traducer is interconnected with a lineartransducer, amplifier, data acquisition/computer system andplotter.

7. As the contact element is deflected to the level desired,the normal force characteristic is plotted directly andsimultaneously.

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PROCEDURE: Continued

8. The test was performed with the contact in its plastichousing.

9. The exposed contact was deflected 0.005”.

------------------------------------------------------------REQUIREMENTS:

The force/deflection characteristic shall be plotted.

------------------------------------------------------------RESULTS:

1. The force/deflection characteristic is shown in Figure #2.

2. The normal force characteristic for 5 contacts are shown onthe same plot.

3. The spring rate of the contact system tested was16 grams/0.001" deflection.

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FIGURE #2

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 3 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/12/01 COMPLETE DATE: 7/12/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 50%------------------------------------------------------------EQUIPMENT ID#: 315, 1041------------------------------------------------------------MATING AND UNMATING FORCE

PURPOSE:

To determine the mechanical forces required to completely mateand unmate the connector pairs.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 13.

2. The test samples were fixtured to the base plate of thetest stand and applicable force gauge.

3. The fixturing was accomplished to assure axial alignmentand allowed self centering movement to exist.

4. Care was taken to assure that the mating faces did notcontact each other to assure proper forces were measured.

5. The test rate was 1 inch per minute maximum.

------------------------------------------------------------REQUIREMENTS:

The force required to mate and unmate shall be measured andrecorded.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

The following is a summary of the observed data:

MATING FORCE UNMATING FORCESample ID# (Pounds) (Pounds)

2 36.5 18.33 29.6 18.54 32.5 16.8

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 3 Pairs TECHNICIAN: SR------------------------------------------------------------START DATE: 9/14/01 COMPLETE DATE: 9/14/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 50%------------------------------------------------------------EQUIPMENT ID#: 315, 1041------------------------------------------------------------DURABILITY

PURPOSE:

To determine the effects of subjecting connector pairs toa predetermined number of mating and unmating cycles simulatingthe expected mechanical life of the connector.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 09.

2. Test Conditions:

a) No. of Cycles : 50b) Rate : 1 inch per minute max

3. The test samples were axially aligned to accomplish themating and unmating function allowing for self-centeringmovement.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. The force required to mate and unmate the connector pairsshall be measured and recorded.

3. The normal force shall be measured and recorded.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. The following is a summary of the data observed:

MATING FORCE UNMATING FORCESample ID# (Pounds) (Pounds)

aG2-2 29.3 16.8aG2-3 20.5 15.1aG2-4 25.7 15.7

3. Figures #3 thru 5 illustrate the normal force characteristicsof the samples.

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FIGURE #3

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FIGURE #4

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FIGURE #5

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 15 Contacts TECHNICIAN: GP------------------------------------------------------------START DATE: 9/18/01 COMPLETE DATE: 9/18/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 40%------------------------------------------------------------EQUIPMENT ID#: 20, 54, 203, 213, 628------------------------------------------------------------WEAR TRACK

PURPOSE:

To determine if 50 cycles of durability has worn through theplating.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 60.

2. Test Conditions:

a) Acid Vapor : Nitric Acidb) Quantity of Acid : 100 mlc) Exposure Time : 60 Minutesd) Dry Time : 15 minutese) Dry Temperature : 125°Cf) Sample : Socket & Headerg) Mated : No

3. The contacts were carefully removed from the housing and“opened” to expose the contact tines.

4. The exposed contact tines and header pins were examinedunder 10x magnification.

------------------------------------------------------------REQUIREMENTS:

All contact tines shall have less than 50 percent coverage ofcorrosion product in the wear track.

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RESULTS:

1. Approximately 40% of the contact tines have corrosionproduct in the wear track.

2. See Figures #6-12 for typical contacts.

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FIGURE #6

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 26 of 117Contech Research

FIGURE #7

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 27 of 117Contech Research

FIGURE #8

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 28 of 117Contech Research

FIGURE #9

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 29 of 117Contech Research

FIGURE #10

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 30 of 117Contech Research

FIGURE #11

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 31 of 117Contech Research

FIGURE #12

TypicalMeasurement

Zone

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TR#201175A, REV.1.2 32 of 117Contech Research

TEST RESULTS

GROUP 2

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TR#201175A, REV.1.2 33 of 117Contech Research

PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 7/02/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54%------------------------------------------------------------EQUIPMENT ID#: 400, 1047------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

To evaluate contact resistance characteristics of the contactsystems under conditions where applied voltages and currents donot alter the physical contact interface and will detect oxidesand films which degrade electrical stability.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 23.

2. Test Conditions:

a) Test Current : 10 ma max.b) Open Circuit Voltage : 20 mvc) No. of Positions Tested : 25 per test sample

------------------------------------------------------------REQUIREMENTS:

The low level circuit resistance as measured shall not exceed20 milliohms.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

1-4, 6-9 7.8 9.7 2.4

2. See data file 201175B01 for individual data points.

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TR#201175A, REV.1.2 35 of 117Contech Research

PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 6/28/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54%------------------------------------------------------------EQUIPMENT ID#: Manual, 400, 1047------------------------------------------------------------DURABILITY

PURPOSE:

To determine the effects of subjecting connector pairs to apredetermined number of mating and unmating cycles simulatingthe expected mechanical life of the connector.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 09.

2. Test Conditions:

a) No. of Cycles : 50b) Rate : 1 inch per minute

2. The test samples were axially aligned to accomplish themating and unmating function allowing for self-centeringmovement.

3. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. The change in low level circuit resistance shall not exceed+10 milliohms.

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TR#201175A, REV.1.2 36 of 117Contech Research

RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. The following is a summary of the observed data:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1-4, 6-9 -0.1 +0.9

3. See data file 201175B01 for individual data points.

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TR#201175A, REV.1.2 37 of 117Contech Research

Low Level Contact Resistance

Project: 201175A Spec: NPS 25298-2Customer: Samtec Subgroup: 2Product: YFS/YFT 50µ inch Au File #: 201175B01Description: # 1, # 2, # 3, # 4, # 6, # 7, # 8, # 9 Tech: G.P.Open circuit voltage: 20mv Current: 10ma

Delta valuesunits: milliohms

Temp ºC 23 23R.H. % 54 46Date: 28Jun01 02Jul01Pos. ID Initial Dur. 50x

1-H1 7.4 0.01-G9 7.0 0.11-F6 7.4 -0.11-E4 8.6 -0.21-D2 8.6 -0.21-C4 8.7 -0.21-B6 8.7 -0.11-A1 8.4 0.01-A3 8.7 0.01-A5 8.8 -0.11-C7 8.8 -0.11-D9 8.7 0.01-H11 7.2 0.11-C13 8.8 -0.21-B15 8.6 0.01-A16 8.7 0.01-A18 8.6 0.01-A20 8.4 0.21-B19 8.4 0.01-C17 8.6 -0.11-D19 8.6 -0.11-E17 8.7 -0.11-F15 8.6 -0.11-G18 4.0 0.11-H20 4.2 0.12-H1 7.3 0.02-G9 7.3 -0.42-F6 7.4 -0.22-E4 8.5 -0.32-D2 8.5 -0.22-C4 8.5 -0.32-B6 8.8 -0.32-A1 8.2 -0.12-A3 8.5 -0.2

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TR#201175A, REV.1.2 38 of 117Contech Research

Temp ºC 23 23R.H. % 54 46Date: 28Jun01 02Jul01Pos. ID Initial Dur. 50x

2-A5 8.4 -0.22-C7 8.6 -0.22-D9 8.2 -0.12-H11 8.1 0.02-C13 8.6 -0.22-B15 8.3 -0.12-A16 8.5 0.02-A18 8.3 0.02-A20 8.5 -0.12-B19 8.4 -0.12-C17 8.4 -0.12-D19 8.6 -0.12-E17 9.7 -1.32-F15 8.6 -1.12-G18 7.3 -0.22-H20 7.8 0.13-H1 7.7 0.13-G9 8.8 -0.23-F6 7.4 -0.13-E4 8.5 -0.13-D2 8.5 -0.13-C4 8.5 -0.13-B6 8.6 -0.13-A1 8.5 -0.13-A3 8.7 -0.13-A5 8.5 0.03-C7 8.8 -0.13-D9 8.7 0.03-H11 8.5 0.33-C13 8.5 0.03-B15 8.9 -0.33-A16 8.7 0.03-A18 8.4 0.03-A20 4.2 0.03-B19 8.5 0.03-C17 8.6 -0.13-D19 8.6 0.03-E17 8.6 0.03-F15 7.7 0.13-G18 8.6 -0.13-H20 8.0 0.94-H1 6.7 0.14-G9 6.4 -0.24-F6 6.3 -0.14-E4 7.6 -0.2

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Temp ºC 23 23R.H. % 54 46Date: 28Jun01 02Jul01Pos. ID Initial Dur. 50x

4-D2 7.0 0.24-C4 7.6 -0.24-B6 7.6 -0.24-A1 3.8 -0.14-A3 2.4 0.04-A5 7.8 -0.14-C7 7.6 0.04-D9 6.9 0.24-H11 6.5 0.24-C13 7.6 -0.14-B15 7.6 0.14-A16 6.9 -0.34-A18 7.6 -0.14-A20 7.3 0.04-B19 7.5 0.04-C17 7.4 0.04-D19 7.4 -0.74-E17 7.2 -0.74-F15 6.2 -0.14-G18 7.1 -0.64-H20 6.8 0.26-H1 7.8 -0.16-G9 8.4 -0.46-F6 7.2 -0.36-E4 7.3 -0.36-D2 8.5 -0.26-C4 8.5 -0.16-B6 8.4 -0.16-A1 8.3 -0.26-A3 8.6 -0.16-A5 8.5 -0.16-C7 8.5 -0.26-D9 8.3 -0.86-H11 8.3 -0.46-C13 7.4 0.16-B15 8.4 -0.26-A16 8.5 -0.16-A18 8.5 -0.16-A20 8.4 -0.26-B19 8.4 -0.16-C17 8.3 -0.66-D19 8.5 -0.16-E17 8.5 -0.26-F15 7.5 -0.26-G18 8.7 -0.1

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Temp ºC 23 23R.H. % 54 46Date: 28Jun01 02Jul01Pos. ID Initial Dur. 50x

6-H20 7.9 0.07-H1 7.2 0.17-G9 6.9 -0.17-F6 8.5 -0.47-E4 8.4 -0.17-D2 8.5 -0.27-C4 8.6 -0.17-B6 8.5 -0.27-A1 4.1 0.07-A3 8.5 -0.37-A5 8.5 -0.27-C7 8.6 -0.27-D9 8.4 -0.27-H11 7.3 -0.17-C13 8.9 -0.57-B15 8.3 -0.17-A16 8.4 -0.27-A18 8.4 -0.17-A20 8.2 -0.17-B19 8.3 -0.27-C17 2.8 0.07-D19 8.5 -0.17-E17 8.4 -0.97-F15 7.2 -0.27-G18 7.1 -0.17-H20 7.4 0.18-H1 7.8 0.08-G9 8.5 -0.28-F6 7.2 -0.28-E4 7.6 0.98-D2 8.9 -0.38-C4 8.6 -0.38-B6 8.9 -0.28-A1 8.5 -0.28-A3 8.7 -0.18-A5 8.7 -0.28-C7 8.7 -0.38-D9 8.4 -0.18-H11 9.1 -0.28-C13 8.6 -1.18-B15 8.6 0.08-A16 8.7 -0.18-A18 4.5 -0.28-A20 8.4 0.08-B19 8.5 -0.2

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Temp ºC 23 23R.H. % 54 46Date: 28Jun01 02Jul01Pos. ID Initial Dur. 50x

8-C17 8.6 -0.28-D19 8.6 -0.18-E17 8.7 -0.18-F15 7.5 0.38-G18 8.7 -0.28-H20 7.7 -0.19-H1 6.6 -0.19-G9 6.3 -0.19-F6 6.1 0.19-E4 6.4 0.09-D2 7.5 -0.19-C4 7.7 -0.29-B6 7.9 -0.29-A1 7.2 -0.19-A3 7.7 -0.29-A5 7.7 -0.29-C7 7.8 -0.29-D9 7.6 -0.29-H11 7.5 -1.09-C13 7.6 -0.59-B15 7.6 -0.19-A16 7.7 -0.19-A18 7.7 -0.19-A20 7.6 -0.19-B19 2.4 0.09-C17 2.4 0.09-D19 7.5 -0.19-E17 7.4 0.09-F15 6.1 0.09-G18 6.1 -0.19-H20 6.7 0.0

MAX 9.7 0.9MIN 2.4 -1.3AVG 7.8 -0.1STD 1.2 0.2Open 0 0

Tech G.P. G.P.Equip ID 400,1047 400,1047

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TEST RESULTS

GROUP 3

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 2 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 8/03/01 COMPLETE DATE: 8/10/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 58%------------------------------------------------------------EQUIPMENT ID#: 257, 410, 650, 1012, 1279------------------------------------------------------------CURRENT CARRYING CAPACITY, STEPPED TECHNIQUE

PURPOSE:

To establish the current carrying capacity of the test sampleunder evaluation. This is achieved by determining thetemperature rise resulting at the contact interface atspecified current levels. The temperature rise at a givencurrent level plus the ambient operating temperature should notexceed the temperature rating of the test sample. Thus, thecurrent rating of the system decreases as the operating ambientincreases.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 70.

2. The test samples were prepared to accept thermocouples atthe appropriate locations.

3. An additional thermocouple was placed 2″ outside of thetest samples adjacent to the locations to be monitored.This is accomplished to evaluate the impact of ambientconditions.

4. Kapton tape was used to cover the holes in the housingrequired to insert the thermocouples.

5. The thermocouples were attached to a data acquisition/scanner system.

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PROCEDURE: Continued

6. The test specimen was placed in a chamber or room whichprevents air currents and the like from influencing theobservations.

7. Test Conditions:

a) Current Levels : 0.5A, 0.75A, 1.0A, 1.25Ab) No. of Contacts in Series : 32 Pos. and 160 Pos.c) Derating Curve : Yes

8. The current level indicated was applied until temperaturestabilization was reached.

9. Temperature stabilization is defined as no change inT-Rise greater than ± 1°C over a 15 minute interval.

10. Two types of circuits were tested: 32 positions in seriesand 160 positions in series.

11. Only positions on the outside rows of the connector couldbe tested.

------------------------------------------------------------REQUIREMENTS:

The temperature rise shall be measured and recorded and acurrent derating curve established.

------------------------------------------------------------RESULTS:

Figures #13 and 14 are the current derating curve forconnectors evaluated with maximum operating temperature of125° C. The derated curve is 20% from the base curve.

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TR#201175A, REV.1.2 45 of 117 Contech Research

FIGURE #13

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TR#201175A, REV.1.2 46 of 117 Contech Research

FIGURE #14

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TR#201175A, REV.1.2 47 of 117 Contech Research

TEST RESULTS

GROUP 4

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TR#201175A, REV.1.2 48 of 117 Contech Research

PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 6/28/01 COMPLETE DATE: 7/26/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54%------------------------------------------------------------EQUIPMENT ID#: 400, 1047------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

To evaluate contact resistance characteristics of the contactsystems under conditions where applied voltages and currents donot alter the physical contact interface and will detect oxidesand films which degrade electrical stability.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 23.

2. Test Conditions:

a) Test Current : 10 ma max.b) Open Circuit Voltage : 20 mvc) No. of Positions Tested : 25 per test sample

------------------------------------------------------------REQUIREMENTS:

The low level circuit resistance as measured shall not exceed20 milliohms.

------------------------------------------------------------RESULTS: See next page.

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TR#201175A, REV.1.2 49 of 117 Contech Research

RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

1-4, 6-9 8.0 10.1 6.4

2. See data file 201175B02 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 10 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/19/01 COMPLETE DATE: 7/19/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 54%------------------------------------------------------------EQUIPMENT ID#: 684, 1168, 1169, 1175, 1272------------------------------------------------------------VIBRATION, RANDOM

PURPOSE:

1. To evaluate the test samples to determine if frettingcorrosion occurs due to mechanical motion. To evaluatethe integrity of the test samples relative to a severemechanical environment.

2. To determine if electrical discontinuities at the levelspecified exist.

3. To determine if the electrical stability of the system hasdegraded when exposed to a vibratory environment.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 28, Test Condition V, Letter B.

2. Test Conditions:

a) Power Spectral Density : 0.04g2/Hzb) G ’RMS’ : 7.56 gsc) Frequency : 50-2000Hzd) Duration : 2 hrs/axis, 3 axis

3. The low nanosecond event detection was performed inaccordance with EIA 364, Test Procedure 87.

4. Two connector pairs were monitored for 1µsec. discontinuity.

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TR#201175A, REV.1.2 51 of 117 Contech Research

PROCEDURE: Continued

5. All subsequent variable testing was performed in accordancewith procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. There shall be no contact interruption greater than1.0 microsecond.

3. The change in low level circuit resistance shall notexceed +10 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. There was no interruption greater than 1 microsecond.

3. The following is a summary of the observed data:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1-4, 6-9 0.0 +1.3

4. See data file 201175B02 for individual data points.

5. Figures #15 thru 17 illustrate typical vibration plots.

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TR#201175A, REV.1.2 52 of 117 Contech Research

FIGURE #15

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TR#201175A, REV.1.2 53 of 117 Contech Research

FIGURE #16

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TR#201175A, REV.1.2 54 of 117 Contech Research

FIGURE #17

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TR#201175A, REV.1.2 55 of 117 Contech Research

PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 10 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/23/01 COMPLETE DATE: 7/23/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 53%------------------------------------------------------------EQUIPMENT ID#: 34, 117, 478, 1130, 1136, 1175------------------------------------------------------------MECHANICAL SHOCK (SPECIFIED PULSE)

PURPOSE:

To determine the mechanical and electrical integrity ofconnectors for use those expected from handling, transportation,etc.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 27, Test Condition C.

2. Test Conditions:

a) Peak Value : 100 Gb) Duration : 6 Millisecondsc) Wave Form : Half-sined) No. of Shocks : 3 Shocks/Direction, 3 Axis (18 Total)

3. The low nanosecond monitoring was performed in accordancewith EIA 364, Test Procedure 87.

4. Two connector pairs were monitored for 1µsec discontinuity.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. There shall be no contact interruption greater than 1.0microsecond.

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REQUIREMENTS: Continued

3. The change in low level circuit resistance shall notexceed +10 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. There was no contact interruption greater than 1.0microsecond.

3. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1-4, 6-9 0.0 +1.4

4. See data file 201175B02 for individual data points.

5. Figures #18 and 19 illustrate typical vibration plots.

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FIGURE #18

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FIGURE #19

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Low Level Contact Resistance

Project: 201175A Spec: NPS 25298-2Customer: Samtec Subgroup: Gp. 4Product: YFS/YFT 50µ inch Au File #: 201175B02Description: # 1, # 2, # 3, # 4, # 6, # 7, # 8, # 9 Tech. G.P.Open circuit voltage: 20mv Current: 10ma

Delta valuesunits: milliohms

Temp ºC 23 23 23R.H. % 54 50 60Date: 28Jun01 7/20/01 7/26/01Pos. ID Initial Vibration M. Shock

1-H1 7.5 0.0 0.01-G9 7.8 0.1 -0.31-F6 7.8 -0.3 -0.71-E4 8.7 0.0 -0.31-D2 8.5 0.0 -0.11-C4 8.9 -0.2 -0.31-B6 8.9 -0.2 -0.21-A1 8.2 -0.1 -0.11-A3 8.7 0.0 -0.11-A5 8.7 -0.1 -0.11-C7 8.8 0.0 -0.11-D9 8.5 0.0 -0.11-H11 9.0 0.0 0.11-C13 8.7 -0.1 -0.11-B15 8.5 0.0 -0.11-A16 8.7 -0.1 -0.11-A18 8.7 -0.2 -0.21-A20 8.7 -0.1 -0.21-B19 8.8 -0.1 -0.11-C17 8.8 0.0 -0.11-D19 8.7 0.1 -0.11-E17 8.3 0.5 -0.21-F15 7.8 0.1 -0.21-G18 7.6 0.0 0.01-H20 7.8 0.1 0.22-H1 7.6 0.0 0.52-G9 7.9 0.9 0.82-F6 7.4 0.2 0.02-E4 8.8 -0.1 -0.12-D2 8.9 -0.2 -0.12-C4 8.8 -0.1 -0.12-B6 8.7 -0.1 -0.22-A1 8.5 -0.2 -0.12-A3 8.6 -0.2 -0.1

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Temp ºC 23 23 23R.H. % 54 50 60Date: 28Jun01 7/20/01 7/26/01Pos. ID Initial Vibration M. Shock

2-A5 8.9 -0.2 -0.12-C7 8.9 -0.1 -0.22-D9 8.8 0.0 -0.12-H11 8.0 1.3 1.22-C13 8.9 -0.1 -0.12-B15 8.9 -0.1 -0.22-A16 8.7 0.0 0.02-A18 8.6 0.1 0.02-A20 8.6 0.0 -0.12-B19 8.8 -0.1 -0.22-C17 8.7 0.0 -0.12-D19 8.7 0.0 -0.12-E17 7.7 1.0 1.02-F15 7.2 0.5 0.02-G18 8.0 0.9 0.82-H20 8.1 0.9 1.43-H1 6.8 0.2 0.23-G9 6.4 0.0 -0.13-F6 6.6 0.0 -0.13-E4 7.0 0.2 0.03-D2 8.0 -0.1 0.13-C4 8.0 0.1 0.03-B6 7.9 0.0 -0.13-A1 7.4 0.3 0.03-A3 7.9 0.5 0.13-A5 7.8 0.0 -0.13-C7 7.8 0.0 0.03-D9 7.4 0.2 0.03-H11 6.4 0.1 0.43-C13 7.5 0.0 0.13-B15 7.9 -0.2 0.23-A16 7.9 -0.3 0.13-A18 7.7 -0.1 0.13-A20 7.6 -0.7 0.03-B19 7.7 -0.1 -0.13-C17 7.5 0.1 0.73-D19 7.8 0.0 0.13-E17 6.8 0.2 0.13-F15 6.4 0.0 -0.13-G18 6.5 -0.1 0.13-H20 7.1 -0.2 0.44-H1 6.9 -0.1 -0.14-G9 6.6 -0.2 -0.24-F6 6.7 -0.2 -0.44-E4 7.2 0.2 -0.1

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Temp ºC 23 23 23R.H. % 54 50 60Date: 28Jun01 7/20/01 7/26/01Pos. ID Initial Vibration M. Shock

4-D2 7.6 0.1 0.04-C4 7.5 0.0 0.04-B6 8.3 -0.6 -0.54-A1 7.3 0.2 -0.14-A3 7.6 0.1 0.04-A5 7.8 0.3 0.14-C7 7.8 -0.2 -0.24-D9 7.3 0.2 -0.44-H11 6.5 -0.1 0.14-C13 6.9 0.5 0.04-B15 7.9 -0.3 -0.34-A16 7.6 0.0 0.14-A18 7.5 -0.1 0.14-A20 7.3 0.0 0.04-B19 7.6 -0.1 -0.14-C17 7.9 -0.2 -0.14-D19 7.6 -0.1 0.04-E17 7.5 -0.3 0.24-F15 7.6 -1.1 -0.84-G18 6.6 -0.2 -0.14-H20 6.7 -0.2 0.15-H1 7.6 0.0 0.05-G9 7.1 0.0 0.05-F6 7.2 0.0 0.05-E4 8.7 -0.1 -0.15-D2 8.6 0.0 -0.15-C4 8.5 -0.1 0.05-B6 8.7 -0.2 -0.15-A1 8.3 -0.1 -0.15-A3 8.6 -0.1 -0.15-A5 8.7 0.0 0.05-C7 8.7 -0.1 -0.15-D9 8.7 -0.3 -0.35-H11 8.4 0.3 0.35-C13 8.8 -0.2 -0.25-B15 7.9 -0.1 0.05-A16 8.8 -0.2 -0.15-A18 8.5 -0.1 0.05-A20 8.4 -0.1 -0.15-B19 8.6 -0.1 -0.15-C17 8.6 -0.1 -0.15-D19 8.5 -0.1 -0.15-E17 8.6 -0.1 -0.15-F15 7.3 0.0 0.35-G18 7.4 -0.2 -0.1

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Temp ºC 23 23 23R.H. % 54 50 60Date: 28Jun01 7/20/01 7/26/01Pos. ID Initial Vibration M. Shock

5-H20 8.0 0.0 0.86-H1 7.6 0.0 -0.16-G9 7.2 0.0 0.06-F6 7.3 0.2 0.06-E4 8.1 0.1 0.06-D2 8.8 0.1 0.06-C4 8.7 -0.1 0.06-B6 8.7 -0.1 0.06-A1 8.3 0.0 0.06-A3 8.6 0.0 0.06-A5 8.7 0.0 0.06-C7 8.6 0.1 0.06-D9 8.1 0.1 0.16-H11 8.0 -0.1 0.06-C13 8.5 0.0 0.16-B15 8.5 0.0 0.16-A16 8.7 -0.1 0.26-A18 8.4 0.0 0.06-A20 8.3 0.0 -0.16-B19 8.4 0.0 0.06-C17 8.5 0.0 0.16-D19 8.7 0.0 0.06-E17 7.9 0.0 0.16-F15 7.2 -0.1 0.16-G18 7.1 0.0 0.16-H20 7.5 0.0 0.17-H1 7.5 0.0 0.47-G9 7.2 -0.1 0.17-F6 7.9 -0.4 -0.17-E4 8.8 0.1 0.27-D2 8.7 0.0 0.17-C4 8.8 0.0 0.07-B6 10.1 -1.0 -0.57-A1 8.4 0.1 0.07-A3 8.9 0.1 0.17-A5 8.7 0.0 -0.17-C7 9.1 -0.2 0.07-D9 8.6 0.1 0.17-H11 7.6 0.0 0.77-C13 8.7 0.0 0.27-B15 8.9 0.0 0.07-A16 8.8 0.0 0.07-A18 8.4 0.1 0.17-A20 8.5 0.0 0.17-B19 8.7 0.0 0.2

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Temp ºC 23 23 23R.H. % 54 50 60Date: 28Jun01 7/20/01 7/26/01Pos. ID Initial Vibration M. Shock

7-C17 8.9 -0.1 0.17-D19 8.8 -0.1 0.07-E17 8.6 0.1 0.17-F15 8.7 -0.2 0.47-G18 7.8 -0.2 -0.27-H20 8.0 0.2 0.48-H1 6.9 -0.2 -0.18-G9 6.5 0.0 0.18-F6 6.7 -0.2 -0.18-E4 7.3 -0.8 -0.58-D2 7.7 -0.3 0.08-C4 7.7 -0.1 0.18-B6 8.1 -0.1 0.18-A1 7.5 -0.2 -0.18-A3 7.8 -0.1 0.08-A5 8.0 -0.1 -0.18-C7 7.9 -0.1 0.08-D9 7.7 -0.1 -0.48-H11 6.7 0.1 0.18-C13 7.7 0.0 -0.18-B15 7.7 -0.2 0.08-A16 7.8 -0.2 -0.18-A18 7.6 -0.1 0.08-A20 7.5 -0.1 -0.18-B19 7.6 -0.1 -0.18-C17 7.7 -0.2 -0.18-D19 7.6 0.0 0.08-E17 6.4 0.3 -0.18-F15 6.4 -0.1 -0.18-G18 6.4 0.0 0.08-H20 6.9 0.0 -0.1

MAX 10.1 1.3 1.4MIN 6.4 -1.1 -0.8AVG 8.0 0.0 0.0STD 0.7 0.3 0.3Open 0 0 0

Tech. G.P. G.P. G.P.Equip. 400,1047 400,1047 400,1047

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TEST RESULTS

GROUP 5

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 2 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50%------------------------------------------------------------EQUIPMENT ID#: 321, 465, 466------------------------------------------------------------BREAKDOWN VOLTAGE

PURPOSE:

To determine the voltage required to cause arcing or breakdownwithin the connector.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 20.

2. The test voltage was applied between adjacent electricallyisolated circuit paths.

3. The voltage was increased slowly until failure occurred.

4. The test samples were mated.

------------------------------------------------------------REQUIREMENTS:

The breakdown voltage shall be recorded.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

The following is a summary of the observed:

BREAKDOWN VOLTAGE (VAC)

Sample ID# Avg. Max. Min.

6 & 7 1900 2000 1600

Maximum DWV 1200 VACMaximum Working Voltage 400 VAC

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 7 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46%------------------------------------------------------------EQUIPMENT ID#: 321, 465, 466------------------------------------------------------------INSULATION RESISTANCE(IR)

PURPOSE:

To determine the resistance of insulation materials to leakageof current through or on the surface of these materials when aDC potential is applied.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 21.

2. Test Conditions:

a) Between Adjacent Contacts : Yesb) Between Rows : Yesc) Mated Condition : Matedd) Mounting Condition : Mountede) Electrification Time : 2 Minutesf) Test Voltage : 500 VDC

------------------------------------------------------------REQUIREMENTS:

When the specified test voltage is applied, the insulationresistance shall not be less than 5000 megohms.

------------------------------------------------------------RESULTS:

The connectors as tested met the requirements as specified.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46%------------------------------------------------------------EQUIPMENT ID#: 321, 465, 466------------------------------------------------------------DIELECTRIC WITHSTANDING VOLTAGE (SEA LEVEL)

PURPOSE:

To determine if the connector can operate at its rated voltageand withstand momentary overpotentials due to switching, surgesand other similar phenomenon.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 20.

2. Test Conditions:

a) Between Adjacent Contacts : Yesb) Between Rows : Yese) Mated Condition : Matedf) Mounting Condition : Mountedi) Hold Time : 2 Minutesk) Test Voltage : 1000 VAC

3. The test voltage was applied between adjacent electricallyisolated circuit paths.

------------------------------------------------------------REQUIREMENTS:

When the specified test voltage is applied, there shall be noevidence of breakdown, arcing, etc.

------------------------------------------------------------RESULTS:

All test samples as tested met the requirements as specified.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 5 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/2/01 COMPLETE DATE: 7/6/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 52%------------------------------------------------------------EQUIPMENT ID#: 192------------------------------------------------------------THERMAL SHOCK

PURPOSE:

To determine the resistance of a given electrical connector toexposure at extremes of high and low temperatures and the shockof alternate exposures to these extremes, simulating the worstprobable conditions of storage, transportation and application.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 32.

2. Test Conditions:

a) Number of Cycles : 100 Cyclesb) Hot Extreme : +85 +3°C/-0°Cc) Cold Extreme : -55 +0°C/-3°Cd) Time at Temperature : 30 Minutese) Mating Conditions : Matedf) Mounting Conditions : Mountedg) Transfer Time : Instantaneous

3. The total number of cycles were performed continuously.

4. All subsequent variable testing was performed in accordancewith the procedures as previously indicated.

5. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. The insulation resistance shall not be less than 5000 megohms.

3. When a 1000 VAC test voltage is applied, there shall be noevidence of arcing, breakdown, etc.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. The insulation resistance exceeded 5000 megohms.

3. There was no evidence of arcing, breakdown, etc., when1000 VAC voltage was applied.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 7 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50%------------------------------------------------------------EQUIPMENT ID#: 27------------------------------------------------------------MOISTURE RESISTANCE (HUMIDITY)

PURPOSE:

The purpose of this test is to permit evaluation of theproperties of materials used in connectors as they areinfluenced or deteriorated by the effects of high humidity andheat conditions.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 31, Procedure III.

2. Test Conditions:

a) Relative Humidity : 90% to 95%b) Temperature Conditions : 25°C to 65°Cc) Cold Cycle : Nod) Polarizing Voltage : Noe) Mating Conditions : Matedf) Mounting Conditions : Mountedg) Duration : 240 hours

3. Dielectric withstanding voltage and insulation resistancemeasurements were performed between 2 and 4 hours afterremoval from the chamber.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

1. There shall be no evidence of physical deterioration of thetest samples.

2. The final insulation resistance shall not be less than5000 megohms.

3. There shall be no evidence of arcing or breakdown when1000 VAC test voltage is applied.

4. The breakdown voltage shall be measured and recorded.

------------------------------------------------------------RESULTS:

1. The test samples as tested showed no evidence of physicaldeterioration.

2. The final insulation resistance exceeded 5000 megohmsafter air dry of 2-4 hours.

3. There was no evidence of breakdown, arcing, etc., when a1000 VAC test voltage was applied.

4. The following is a summary of the data observed:

BREAKDOWN VOLTAGE (VAC)

Sample ID# Avg. Max. Min.

6 & 7 1400 1700 1100

Maximum DWV 825 VACMaximum Working Voltage 350 VAC

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TEST RESULTS

GROUP 6

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/20/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 46%------------------------------------------------------------EQUIPMENT ID#: 400, 1047------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

To evaluate contact resistance characteristics of the contactsystems under conditions where applied voltages and currents donot alter the physical contact interface and will detect oxidesand films which degrade electrical stability.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 23.

2. Test Conditions:

a) Test Current : 10 ma max.b) Open Circuit Voltage : 20 mvc) No. of Positions Tested : 25 per test sample

------------------------------------------------------------REQUIREMENTS:

The low level circuit resistance as measured shall not exceed20 milliohms.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

1-5, 7-9 7.4 9.2 3.4

2. See data file 201175B03 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/02/01 COMPLETE DATE: 7/06/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 52%------------------------------------------------------------EQUIPMENT ID#: 192------------------------------------------------------------THERMAL SHOCK

PURPOSE:

To determine the resistance of a given electrical connector toexposure at extremes of high and low temperatures and the shockof alternate exposures to these extremes, simulating the worstprobable conditions of storage, transportation and application.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 32.

2. Test Conditions:

a) Number of Cycles : 100 Cyclesb) Hot Extreme : +85 +3°C/-0°Cc) Cold Extreme : -55 +0°C/-3°Cd) Time at Temperature : 30 Minutese) Mating Conditions : Matedf) Mounting Conditions : Mountedg) Transfer Time : Instantaneous

3. The total number of cycles were performed continuously.

4. All subsequent variable testing was performed in accordancewith the procedures as previously indicated.

5. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

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REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. The change in low level circuit resistance shall not exceed+10 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. The following is a summary of the observed data:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1-5, 7-9 -0.2 +0.9

3. See data file 201175B03 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/10/01 COMPLETE DATE: 7/20/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 50%------------------------------------------------------------EQUIPMENT ID#: 27------------------------------------------------------------MOISTURE RESISTANCE (HUMIDITY)

PURPOSE:

To evaluate the impact on electrical stability of the contactsystem when exposed to any environment which may generatethermal/moisture type failure mechanisms such as:

a) Fretting corrosion due to wear resulting frommicromotion, induced by thermal cycling. Humidityaccelerates the oxidation process.

b) Oxidation of wear debris or from particulates from thesurrounding atmosphere which may have become entrappedbetween the contacting surfaces.

c) Failure mechanisms resulting from a wet oxidationprocess.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 31, Procedure II.

2. Test Conditions:

a) Relative Humidity : 90% to 95%b) Temperature Conditions : 25°C to 65°Cc) Cold Cycle : Nod) Mating Conditions : Matede) Mounting Conditions : Mountedf) Duration : 240 hours

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PROCEDURE: Continued

3. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical deterioration of thetest samples.

2. The change in low level circuit resistance shall not exceed+10 milliohms.

------------------------------------------------------------RESULTS:

1. The test samples as tested showed no evidence of physicaldeterioration.

2. The following is a summary of the observed data:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Sample ID# Change Change

1-5, 7-9 -0.2 +0.9

3. See data file 201175B03 for individual data points.

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Low Level Contact Resistance

Project: 201175A Spec: NPS 25298-2Customer: Samtec Subgroup: 6Product: YFS/YFT 50µ inch Au File #: 201175B03Description: # 1, # 2, # 3, # 4, # 5, # 7, # 8, #9 Tech. G.P.Open circuit voltage: 20mv Current: 10ma

Delta valuesunits: milliohms

Temp ºC 23 23 23R.H. % 46 55 50Date: 02Jul01 10Jul01 20Jul01Pos. ID Initial T-Shock Humidity

1-H1 6.8 -0.2 -0.11-G9 6.8 -0.5 -0.51-F6 6.3 -0.2 -0.21-E4 6.8 -0.5 -0.41-D2 7.5 -0.9 -0.21-C4 7.5 0.0 -0.11-B6 7.8 -0.2 -0.41-A1 7.5 -0.2 -0.21-A3 7.6 -0.2 -0.41-A5 7.8 -0.8 -1.11-C7 7.8 -0.2 -0.31-D9 7.1 -0.2 -0.41-H11 6.9 -0.3 -0.11-C13 7.6 -0.2 -0.21-B15 6.9 -0.2 -0.41-A16 7.9 -0.6 -0.71-A18 7.0 -0.7 -0.71-A20 7.5 -0.3 -0.31-B19 7.1 -0.5 -0.41-C17 7.6 -0.1 -0.21-D19 7.7 -1.3 -0.21-E17 6.7 -0.5 -0.31-F15 6.3 -0.3 -0.21-G18 6.6 -0.3 -0.31-H20 6.8 -0.1 0.12-H1 7.0 -0.3 -0.32-G9 6.9 -0.6 -0.62-F6 6.4 -0.3 -0.32-E4 7.3 -0.8 -1.02-D2 7.5 -0.6 -0.82-C4 7.7 -0.2 -0.22-B6 7.7 -0.2 -0.52-A1 7.3 -0.1 -0.22-A3 7.6 -0.2 -0.3

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Temp ºC 23 23 23R.H. % 46 55 50Date: 02Jul01 10Jul01 20Jul01Pos. ID Initial T-Shock Humidity

2-A5 7.6 -0.1 -1.12-C7 7.5 -0.1 -0.12-D9 6.6 -0.3 -0.12-H11 6.8 -0.1 0.12-C13 7.5 -0.2 -0.22-B15 7.6 -0.8 -1.12-A16 7.7 -0.7 -0.82-A18 7.5 -0.2 -0.22-A20 7.4 -0.1 -0.22-B19 7.4 -0.1 -0.22-C17 7.7 -0.2 -0.22-D19 7.0 -0.8 -0.92-E17 6.7 -0.6 -0.62-F15 6.2 -0.1 -0.22-G18 6.7 -0.3 -0.42-H20 7.0 0.1 -0.13-H1 7.7 -0.1 -0.13-G9 7.1 -0.2 -0.23-F6 7.7 -0.1 -0.43-E4 8.4 -0.6 -0.23-D2 8.7 -0.2 -0.43-C4 8.6 -0.2 -0.23-B6 8.5 -0.2 -0.33-A1 8.4 -0.2 -0.33-A3 8.6 -0.3 -0.33-A5 8.7 -0.2 -0.33-C7 8.4 -0.2 -0.23-D9 7.8 -0.5 -0.63-H11 7.6 0.5 0.23-C13 8.4 -0.2 -0.23-B15 8.4 -0.3 -0.33-A16 8.6 -0.1 -0.23-A18 8.4 -0.2 -0.23-A20 8.3 -0.2 -0.23-B19 8.5 -0.2 -0.23-C17 8.5 -0.2 -0.23-D19 8.5 -0.5 -1.03-E17 8.5 -0.4 -0.53-F15 7.2 -0.2 -0.23-G18 7.5 0.3 0.43-H20 7.6 0.7 0.94-H1 7.3 0.2 0.14-G9 7.5 -0.2 -0.34-F6 7.5 -0.5 -0.64-E4 8.9 -0.3 -0.4

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Temp ºC 23 23 23R.H. % 46 55 50Date: 02Jul01 10Jul01 20Jul01Pos. ID Initial T-Shock Humidity

4-D2 9.0 -0.4 -0.64-C4 9.0 -0.3 -0.44-B6 9.0 -0.4 -0.54-A1 8.7 -0.2 -0.34-A3 9.0 -0.3 -0.54-A5 8.8 -0.3 -0.44-C7 8.9 -0.3 -0.44-D9 8.9 -0.2 -0.24-H11 8.4 -0.1 0.34-C13 9.2 -0.5 -0.54-B15 8.8 -0.3 -0.34-A16 9.0 -0.3 -0.54-A18 4.5 -0.1 -0.24-A20 4.2 -0.1 -0.24-B19 4.3 -0.1 -0.24-C17 8.8 -0.2 -0.24-D19 8.8 -0.2 -0.34-E17 8.8 -0.3 -0.34-F15 7.0 -0.1 -0.14-G18 8.9 -0.2 -1.14-H20 8.1 0.2 -0.15-H1 7.5 0.0 0.35-G9 7.5 0.8 0.85-F6 7.1 0.5 0.25-E4 8.8 0.1 -0.25-D2 8.6 0.0 -0.35-C4 9.0 -0.1 -0.35-B6 8.8 -0.1 -0.35-A1 8.5 0.1 -0.25-A3 8.7 0.1 -0.25-A5 8.8 0.1 -0.35-C7 8.7 -0.1 -0.35-D9 8.6 0.0 -0.15-H11 7.8 0.9 0.35-C13 8.7 -0.1 -0.25-B15 8.8 -0.2 -0.45-A16 8.9 0.0 -0.35-A18 8.8 0.1 -0.15-A20 8.7 0.1 -0.15-B19 8.4 0.1 0.05-C17 8.5 -0.1 -0.15-D19 8.7 0.0 -0.25-E17 8.6 -0.8 -1.15-F15 7.8 0.1 -0.25-G18 7.5 0.8 0.3

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Temp ºC 23 23 23R.H. % 46 55 50Date: 02Jul01 10Jul01 20Jul01Pos. ID Initial T-Shock Humidity

5-H20 4.3 0.0 0.07-H1 7.5 0.1 -0.17-G9 6.9 0.0 -0.17-F6 7.0 0.0 -0.17-E4 8.3 -0.1 -0.17-D2 8.3 -0.1 -0.27-C4 8.3 -0.1 -0.17-B6 8.4 -0.2 -0.17-A1 8.2 -0.1 -0.27-A3 8.5 -0.2 -0.27-A5 8.5 -0.2 -0.27-C7 8.4 -0.2 -0.17-D9 8.2 -0.1 -0.57-H11 7.4 0.1 0.67-C13 8.3 -0.1 -0.17-B15 8.2 -0.1 -0.17-A16 8.5 -0.2 -0.17-A18 8.4 -0.1 -0.17-A20 4.2 0.0 -0.17-B19 4.4 0.0 -0.17-C17 8.3 0.0 -0.17-D19 8.3 0.0 -0.27-E17 7.3 0.2 -0.27-F15 7.0 0.2 -0.27-G18 7.3 0.2 -0.37-H20 7.8 0.1 0.08-H1 6.9 -0.2 0.08-G9 6.8 -0.6 0.08-F6 6.3 -0.2 0.08-E4 7.6 -1.2 -0.18-D2 7.5 -1.1 -0.18-C4 7.7 -0.3 0.08-B6 7.8 -0.4 0.08-A1 7.7 -0.2 0.08-A3 7.7 -0.2 0.08-A5 7.7 -0.3 0.08-C7 7.7 -0.3 -0.18-D9 6.8 -0.4 0.08-H11 7.2 -0.1 0.38-C13 6.8 -0.4 0.08-B15 7.3 -0.6 -0.18-A16 7.5 -0.2 -0.38-A18 6.6 0.7 -1.08-A20 7.3 -0.1 -0.88-B19 7.5 -0.1 -0.1

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Temp ºC 23 23 23R.H. % 46 55 50Date: 02Jul01 10Jul01 20Jul01Pos. ID Initial T-Shock Humidity

8-C17 6.7 -0.3 -0.18-D19 7.1 0.1 -0.58-E17 6.5 -0.4 -0.18-F15 6.3 -0.3 -0.18-G18 6.3 -0.2 0.08-H20 7.1 -0.2 0.09-H1 6.8 -0.2 -0.19-G9 6.3 -0.2 0.09-F6 6.1 -0.2 -0.19-E4 6.8 -0.6 0.09-D2 7.8 -1.5 0.29-C4 7.7 -0.6 0.09-B6 7.9 -0.5 0.09-A1 7.5 -0.3 -0.19-A3 7.6 -0.3 -0.69-A5 7.7 -0.3 0.09-C7 7.5 -0.5 0.09-D9 3.7 -0.4 0.09-H11 6.3 -0.2 0.09-C13 3.5 -0.3 -0.19-B15 3.9 -0.2 -0.29-A16 7.8 -0.3 -0.49-A18 3.9 -0.2 -0.39-A20 3.7 -0.1 -0.19-B19 3.8 -0.1 -0.39-C17 3.6 -0.1 -0.29-D19 7.7 -1.4 0.19-E17 3.8 -0.5 -0.19-F15 6.1 -0.2 0.19-G18 3.4 -0.1 0.09-H20 3.8 -0.1 0.0

MAX 9.2 0.9 0.9MIN 3.4 -1.5 -1.1AVG 7.4 -0.2 -0.2STD 1.3 0.3 0.3Open 0 0 0

Tech: G.P. G.P. G.P.Equip ID 400,1047 400,1047 400,1048

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TEST RESULTS

GROUP 7

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 6/29/01 COMPLETE DATE: 8/07/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 54%------------------------------------------------------------EQUIPMENT ID#: 400, 1047------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

To evaluate contact resistance characteristics of the contactsystems under conditions where applied voltages and currents donot alter the physical contact interface and will detect oxidesand films which degrade electrical stability.------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 23.

2. Test Conditions:

a) Test Current : 10 ma max.b) Open Circuit Voltage : 20 mvc) No. of Positions Tested : 25 per test sample

------------------------------------------------------------REQUIREMENTS:

The low level circuit resistance as measured shall not exceed20 milliohms.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

2-4, 6-10 8.1 9.0 4.3

2. See data file 201175B04 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/16/01 COMPLETE DATE: 8/07/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 61%------------------------------------------------------------EQUIPMENT ID#: 1238------------------------------------------------------------THERMAL AGING

PURPOSE:

1. To evaluate the impact on electrical stability of thecontact system when exposed to a thermal environment.Said environment may generate temperature dependent failuremechanisms such as:

a) Dry oxidation of base metals and/or underplates whichhave reached the contacting surfaces by impurity,diffusion or pore corrosion.

b) Reduced normal (contact) force due to stress relaxationas a result of a thermal environment.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 17.

2. Test Condition:

a) Temperature : 105°Cb) Duration : 500 hoursc) Mated Condition : Matedd) Mounting Condition : Mounted

3. At each designated measurement period, the test sampleswere removed from the chamber and allowed to cool to roomambient.

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PROCEDURE: Continued

4. Upon completion of the measurements, the test samples wereplaced back into the test chamber.

5. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage ordeterioration of the test samples.

2. The change in low level circuit resistance shall not exceed+10 milliohms.

------------------------------------------------------------RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max.Exposure Time(Hrs) Change Change

100 0.0 +0.9200 0.0 +0.9300 +0.1 +1.4400 +0.1 +1.4500 +0.2 +1.5

2. There was no evidence of physical damage or deteriorationof the test samples.

3. See data file 201175B04 for individual data points.

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Low Level Contact Resistance

Project: 201175A Spec: NPS 25298-2Customer: Samtec Subgroup: 7Product: YFS/YFT 50µ inch Au File #: 201175B04Description: # 2, # 3, # 4, # 6, # 7, # 8, # 9, # 10 Tech. G.P.Open circuit voltage: 20mv Current: 10ma

Delta valuesunits: milliohms

Temp ºC 23 23 23 22 23 23R.H. % 48 50 51 60 50 61Date: 29Jun01 7/20/01 7/24/01 7/30/01 8/3/01 8/7/01Pos. ID Initial T-Aging T-Aging T-Aging T-Aging T-Aging

100 hrs. 200 hrs. 300 hrs. 400 hrs. 500 hrs.2-H1 7.5 0.1 0.0 0.2 0.3 0.32-G9 7.3 -0.1 0.3 1.0 1.3 1.32-F6 7.0 -0.1 -0.2 -0.2 -0.1 -0.12-E4 8.6 -0.1 -0.1 -0.1 -0.1 -0.12-D2 8.7 -0.1 -0.1 0.0 0.0 0.02-C4 8.6 -0.1 -0.1 -0.1 -0.1 -0.12-B6 8.8 -0.2 -0.2 -0.1 0.0 -0.12-A1 8.4 -0.1 -0.2 0.0 0.0 -0.12-A3 8.7 -0.2 -0.2 0.0 -0.1 -0.12-A5 8.6 0.0 -0.1 0.1 0.1 0.02-C7 8.6 -0.1 -0.1 -0.1 -0.1 -0.12-D9 8.5 -0.1 -0.1 -0.6 -0.5 -0.72-H11 7.2 0.0 0.3 1.3 1.4 1.42-C13 8.8 -0.2 -0.3 -0.2 -0.2 -0.22-B15 8.5 -0.1 -0.1 -0.1 0.0 -0.12-A16 8.6 0.0 0.0 0.0 0.1 0.12-A18 8.5 -0.1 -0.1 -0.1 0.0 -0.12-A20 8.4 -0.1 -0.2 -0.1 -0.1 -0.22-B19 8.4 0.0 -0.1 -0.1 0.0 -0.12-C17 8.5 -0.1 -0.2 -0.2 -0.1 -0.12-D19 8.5 0.0 -0.1 0.0 0.0 0.02-E17 8.2 0.3 0.2 0.3 0.2 0.22-F15 7.2 -0.2 -0.2 -0.1 -0.1 0.12-G18 7.9 -0.1 0.7 0.7 0.5 0.82-H20 7.5 0.1 0.0 0.2 0.2 0.33-H1 7.5 0.0 0.0 0.1 0.0 0.03-G9 8.2 0.0 0.1 0.3 0.4 0.43-F6 8.6 0.1 0.1 0.4 0.3 1.03-E4 8.6 -0.1 -0.1 0.1 0.1 0.23-D2 8.8 0.0 0.0 0.5 0.5 0.53-C4 8.6 -0.1 -0.1 0.3 0.4 0.33-B6 8.8 -0.1 -0.1 0.3 0.3 0.73-A1 8.4 -0.1 -0.1 0.2 0.1 0.03-A3 8.7 -0.1 -0.2 0.3 0.4 0.5

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Temp ºC 23 23 23 22 23 23R.H. % 48 50 51 60 50 61Date: 29Jun01 7/20/01 7/24/01 7/30/01 8/3/01 8/7/01Pos. ID Initial T-Aging T-Aging T-Aging T-Aging T-Aging

100 hrs. 200 hrs. 300 hrs. 400 hrs. 500 hrs.3-A5 8.6 0.1 0.1 0.6 0.3 0.73-C7 8.6 -0.1 -0.1 0.0 0.1 0.23-D9 8.4 -0.1 -0.1 0.0 0.1 0.13-H11 8.7 0.0 0.0 0.0 0.1 0.03-C13 8.6 -0.1 -0.1 0.1 0.1 0.33-B15 8.7 -0.1 -0.1 0.4 0.8 0.93-A16 8.7 0.0 -0.1 0.4 0.1 0.33-A18 8.6 0.0 -0.1 0.1 0.0 0.13-A20 8.6 -0.1 -0.2 -0.1 -0.1 -0.13-B19 8.5 0.0 0.0 0.1 0.1 0.13-C17 8.6 -0.1 -0.1 0.1 0.0 0.13-D19 8.7 0.0 0.0 0.0 0.1 0.03-E17 8.7 -0.1 -0.1 -0.1 -0.1 -0.13-F15 8.1 -0.1 0.3 0.2 0.1 0.13-G18 8.7 -0.5 -0.4 -0.2 -0.2 -0.43-H20 7.3 -0.1 0.0 0.1 0.3 0.24-H1 7.7 0.2 0.1 0.0 0.2 0.14-G9 8.0 0.0 0.1 0.2 0.6 0.64-F6 7.3 0.0 0.1 0.2 0.2 0.34-E4 8.3 0.0 0.1 0.1 0.1 0.24-D2 8.4 0.0 0.2 0.1 0.1 0.14-C4 8.6 -0.1 0.2 0.1 0.0 0.44-B6 8.6 -0.1 0.2 0.2 0.0 0.54-A1 8.3 0.0 0.1 0.0 -0.1 0.34-A3 8.6 -0.1 0.2 0.2 -0.1 0.74-A5 8.7 -0.1 0.4 0.4 0.0 0.84-C7 8.8 -0.2 0.1 0.2 0.3 0.74-D9 8.4 -0.1 0.0 0.0 0.1 0.24-H11 7.3 0.1 0.6 0.6 1.0 1.04-C13 8.8 -0.1 0.2 0.3 0.7 0.94-B15 8.3 0.0 0.1 0.1 0.2 0.24-A16 8.4 0.1 0.1 0.2 0.1 0.24-A18 8.4 0.0 0.0 0.1 0.0 0.24-A20 8.3 0.0 -0.1 -0.1 -0.1 0.04-B19 8.2 0.0 0.0 0.0 0.0 0.14-C17 8.4 0.0 0.0 0.0 0.1 0.14-D19 8.4 0.0 0.0 0.0 0.1 0.14-E17 8.4 -0.1 -0.1 -0.1 0.0 0.04-F15 7.6 0.1 0.3 0.3 0.5 0.54-G18 7.3 0.2 0.5 1.1 1.3 1.24-H20 7.5 0.0 0.0 0.0 0.1 0.16-H1 7.6 0.1 0.1 0.2 0.3 0.26-G9 7.1 0.3 0.4 1.1 0.9 1.26-F6 7.2 0.0 0.0 0.0 0.0 0.26-E4 8.6 0.0 0.0 0.0 0.0 0.0

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Temp ºC 23 23 23 22 23 23R.H. % 48 50 51 60 50 61Date: 29Jun01 7/20/01 7/24/01 7/30/01 8/3/01 8/7/01Pos. ID Initial T-Aging T-Aging T-Aging T-Aging T-Aging

100 hrs. 200 hrs. 300 hrs. 400 hrs. 500 hrs.6-D2 8.4 0.0 0.1 0.0 0.1 0.16-C4 8.6 -0.1 0.0 0.0 -0.1 0.16-B6 8.9 -0.1 -0.1 -0.1 -0.1 0.36-A1 8.4 -0.1 -0.1 0.0 -0.2 0.06-A3 8.6 0.1 0.1 0.1 0.0 0.56-A5 8.7 0.0 0.1 0.2 0.1 0.66-C7 8.6 0.0 -0.1 0.0 0.0 0.26-D9 8.5 -0.1 -0.1 -0.1 0.0 0.06-H11 7.9 0.9 0.9 0.7 0.8 0.76-C13 4.3 0.0 0.0 0.0 0.0 0.16-B15 8.7 0.0 0.0 0.1 0.0 0.46-A16 8.7 0.0 0.0 0.0 0.0 0.36-A18 8.6 -0.1 -0.1 -0.1 -0.1 0.16-A20 8.5 0.0 0.0 -0.1 -0.1 0.06-B19 8.5 -0.1 -0.1 -0.1 -0.1 0.06-C17 8.5 -0.1 -0.1 -0.1 -0.1 0.16-D19 8.5 0.0 0.0 0.1 0.1 0.16-E17 8.4 0.0 0.0 0.1 0.0 0.06-F15 7.4 0.0 0.0 0.1 0.1 0.16-G18 7.3 0.1 0.2 0.5 0.3 0.46-H20 7.6 0.2 0.3 0.1 0.3 0.77-H1 7.7 0.1 0.2 0.3 0.0 0.17-G9 7.2 -0.1 -0.1 1.4 1.4 0.87-F6 7.1 -0.3 -0.3 0.0 -0.1 -0.17-E4 8.5 -0.1 -0.2 -0.1 -0.1 -0.17-D2 8.7 -0.1 -0.1 0.0 0.0 -0.17-C4 8.6 -0.1 -0.2 -0.1 -0.2 -0.27-B6 8.7 -0.2 -0.1 -0.1 -0.2 -0.17-A1 8.3 -0.1 -0.1 0.1 0.0 -0.17-A3 8.5 -0.1 -0.1 0.0 -0.1 -0.17-A5 8.6 0.0 0.1 0.0 0.0 0.07-C7 8.5 -0.1 -0.1 -0.1 -0.1 -0.17-D9 8.4 -0.2 -0.2 -0.2 -0.2 -0.17-H11 7.6 0.2 0.2 1.2 1.4 1.27-C13 8.6 -0.2 -0.2 -0.2 -0.1 -0.17-B15 8.6 -0.1 0.0 -0.1 -0.1 0.07-A16 8.6 0.1 0.1 0.2 0.0 0.27-A18 8.6 -0.2 -0.1 -0.2 -0.2 -0.17-A20 8.6 -0.3 -0.3 -0.2 -0.3 -0.27-B19 8.5 -0.2 -0.2 -0.2 -0.2 -0.17-C17 8.5 -0.1 -0.1 -0.1 -0.1 0.07-D19 8.5 -0.1 -0.1 -0.1 0.0 0.07-E17 8.5 -0.1 -0.2 -0.4 0.0 0.07-F15 7.6 0.2 0.3 0.3 1.0 0.77-G18 7.2 -0.1 -0.1 0.1 0.1 0.1

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Temp ºC 23 23 23 22 23 23R.H. % 48 50 51 60 50 61Date: 29Jun01 7/20/01 7/24/01 7/30/01 8/3/01 8/7/01Pos. ID Initial T-Aging T-Aging T-Aging T-Aging T-Aging

100 hrs. 200 hrs. 300 hrs. 400 hrs. 500 hrs.7-H20 7.3 -0.1 0.0 0.4 0.0 0.28-H1 6.8 -0.1 -0.1 -0.1 -0.1 -0.18-G9 6.5 -0.2 0.0 0.0 0.1 0.18-F6 6.2 -0.1 -0.1 -0.1 -0.1 -0.18-E4 6.7 0.7 0.8 0.8 0.7 0.88-D2 7.6 0.0 0.0 0.0 0.0 0.08-C4 7.7 -0.2 0.2 0.1 0.4 0.38-B6 7.7 -0.1 0.0 0.0 0.2 0.18-A1 7.5 -0.1 0.1 -0.1 0.0 -0.18-A3 7.7 -0.1 0.0 0.0 0.0 0.08-A5 7.8 -0.1 0.0 0.0 0.1 0.08-C7 7.5 0.0 0.1 0.1 0.4 0.38-D9 6.6 -0.2 -0.1 -0.1 0.1 0.08-H11 6.4 -0.1 0.2 0.1 0.0 0.28-C13 7.6 -0.1 -0.3 -0.4 -0.4 -0.58-B15 7.7 -0.6 0.0 -0.2 -0.2 -0.28-A16 7.7 -0.6 -0.1 -0.3 0.1 -0.88-A18 7.6 -0.4 -0.1 -0.7 0.0 -0.18-A20 7.4 -0.2 -0.1 -0.2 -0.1 -0.18-B19 7.6 -0.1 -0.1 -0.1 0.0 0.08-C17 7.5 -0.1 -0.1 -0.1 0.1 0.08-D19 7.6 -0.1 0.0 0.0 0.1 0.18-E17 7.6 -0.1 0.1 0.1 0.1 0.18-F15 6.2 0.0 0.2 0.2 0.2 0.38-G18 6.4 -0.1 0.0 0.0 0.0 0.18-H20 6.7 -0.1 0.0 0.0 0.0 0.19-H1 7.3 0.0 0.0 0.2 0.0 0.39-G9 7.4 0.4 0.7 1.0 0.7 1.39-F6 7.2 0.1 0.0 0.1 0.2 0.69-E4 8.7 0.0 -0.1 0.0 0.1 0.29-D2 8.6 0.0 0.0 0.1 0.1 0.49-C4 8.7 -0.1 -0.1 0.2 0.3 0.49-B6 8.6 0.1 0.0 -0.2 0.4 0.49-A1 8.6 -0.1 -0.2 0.3 0.1 0.99-A3 8.7 0.0 -0.1 0.3 0.2 0.39-A5 8.5 0.2 0.1 0.5 0.3 0.59-C7 8.6 -0.1 -0.1 0.2 0.4 0.69-D9 8.5 -0.2 -0.2 0.1 0.1 0.29-H11 7.5 0.3 0.6 0.7 0.6 0.89-C13 8.5 -0.1 -0.1 0.2 0.2 0.29-B15 8.6 0.0 -0.1 0.4 0.2 0.39-A16 8.9 -0.1 -0.1 0.6 0.6 0.39-A18 8.7 -0.1 -0.1 0.2 0.1 0.29-A20 8.5 -0.1 -0.2 0.0 0.0 0.19-B19 8.6 -0.1 -0.1 0.2 0.0 0.1

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Temp ºC 23 23 23 22 23 23R.H. % 48 50 51 60 50 61Date: 29Jun01 7/20/01 7/24/01 7/30/01 8/3/01 8/7/01Pos. ID Initial T-Aging T-Aging T-Aging T-Aging T-Aging

100 hrs. 200 hrs. 300 hrs. 400 hrs. 500 hrs.9-C17 8.4 -0.1 -0.1 0.3 0.1 0.29-D19 8.6 0.0 0.0 0.0 0.0 0.19-E17 8.7 0.0 -0.1 0.0 0.0 0.09-F15 8.0 0.0 0.3 0.2 0.0 0.19-G18 7.3 0.2 0.1 0.5 0.3 0.89-H20 7.6 0.1 0.0 0.2 0.2 0.610-H1 7.7 0.4 0.4 0.2 0.3 0.610-G9 7.3 0.1 0.8 0.7 0.9 1.310-F6 7.5 0.2 0.3 0.3 0.3 0.510-E4 8.7 -0.1 -0.1 0.0 0.0 0.010-D2 8.6 0.0 0.0 0.0 0.2 0.210-C4 8.7 -0.1 -0.1 0.0 0.2 0.210-B6 8.5 0.0 0.0 -0.1 0.3 0.210-A1 8.3 0.0 0.1 0.0 0.1 0.210-A3 8.7 -0.1 -0.1 -0.1 0.1 0.110-A5 8.8 0.0 0.0 -0.1 0.2 0.110-C7 8.6 0.0 0.0 0.0 0.3 0.210-D9 8.3 0.0 -0.1 -0.1 -0.1 0.110-H11 7.9 0.0 0.8 0.4 0.6 1.210-C13 8.8 0.0 0.0 -0.1 0.1 0.010-B15 8.6 0.0 0.1 0.0 0.2 0.010-A16 8.7 0.2 0.2 0.1 0.3 0.210-A18 4.5 0.0 0.0 0.0 0.1 0.010-A20 8.5 -0.1 -0.1 -0.1 -0.1 -0.110-B19 8.6 -0.1 -0.1 0.0 0.1 0.010-C17 8.6 -0.1 -0.1 0.1 0.0 0.010-D19 8.8 -0.1 -0.1 0.0 0.0 0.010-E17 9.0 -0.2 -0.2 -0.6 -0.1 0.010-F15 8.5 -0.1 -0.1 -0.1 -0.1 0.110-G18 7.6 0.3 0.4 0.2 0.3 0.810-H20 7.8 0.1 0.5 0.8 1.1 1.5

MAX 9.0 0.9 0.9 1.4 1.4 1.5MIN 4.3 -0.6 -0.4 -0.7 -0.5 -0.8AVG 8.1 0.0 0.0 0.1 0.1 0.2STD 0.7 0.2 0.2 0.3 0.3 0.4Open 0 0 0 0 0 0

Tech: G.P. G.P. G.P. G.P. G.P. G.P.Equip ID 400,1047 400,1047 400,1047 400,1047 400,1047 400,1047

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TEST RESULTS

GROUP 8

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-E-08-SB PART DESCRIPTION: Connectors

YFS-20-03-E-08-SB------------------------------------------------------------SAMPLE SIZE: 6 Pairs TECHNICIAN: GP------------------------------------------------------------START DATE: 7/16/01 COMPLETE DATE: 8/07/01------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 61%------------------------------------------------------------EQUIPMENT ID#: 1238------------------------------------------------------------THERMAL AGING

PURPOSE:

To evaluate the impact on the stability of the contact systemwhen exposed to a thermal environment. Said environment maygenerate temperature dependent failure mechanisms such as:

a) Reduced normal (contact) force due to stressrelaxation as a result of a thermal environment.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with Nortel Networks,NPS Detail Specification, NPS25298-2 and EIA-364, TestProcedure 17.

2. Test Condition:

a) Temperature : 105°C ± 500°Cb) Duration : 500 hoursc) Mated Condition : Matedd) Mounting Condition: Mounted

3. At each designated measurement period, the test sampleswere removed from the chamber and allowed to cool to roomambient after 100 hours of exposure.

4. Upon completion of the measurements, the test samples wereplaced back into the test chamber.

5. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

1. There shall be no evidence of physical damage ordeterioration of the test samples so exposed.

2. The normal force shall be measured and recorded.

------------------------------------------------------------RESULTS:

1. There was no evidence of visual or physical damage to thetest samples.

2. Figures #20 thru 25 illustrate the normal forcecharacteristics at each 100 hour interval.

3. No significant loss of normal force is evident.

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FIGURE #20

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FIGURE #21

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FIGURE #22

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FIGURE #23

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FIGURE #24

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FIGURE #25

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TEST RESULTS

SEQUENCE 9

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors

YFS-20-03-H-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB------------------------------------------------------------START DATE: 5/22/01 COMPLETE DATE: 8/10/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 40%------------------------------------------------------------EQUIPMENT ID#: 529, 691, 1116, 1278------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

1. To evaluate contact resistance characteristics of thecontact systems under conditions where applied voltages andcurrents do not alter the physical contact interface andwill detect oxides and films which degrade electricalstability.

2. This attribute was monitored after each preconditioningand/or test exposure in order to determine said stabilityof the contact systems as they progress through theapplicable test sequences.

3. The electrical stability of the system is determined bycomparing the initial resistance value to that observedafter a given test exposure. The difference is the changein resistance occurring whose magnitude establishes thestability of the interface being evaluated.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 23.

2. Test Conditions:

a) Test Current : 10 ma maximumb) Open Circuit Voltage : 20 mVc) No. of Pos. Tested : 200 total

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

Low level circuit resistance shall be measured and recorded.

------------------------------------------------------------RESULTS:

1. The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max. Min.

8.3 10.4 4.2

2. See data file 201175A01 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors

YFS-20-03-H-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB------------------------------------------------------------START DATE: 5/25/01 COMPLETE DATE: 6/06/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 44%------------------------------------------------------------EQUIPMENT ID#: 19------------------------------------------------------------THERMAL AGE

PURPOSE:

1. To evaluate the impact on electrical stability of thecontact system when exposed to a thermal environment. Saidenvironment may generate temperature dependent failuremechanisms such as:

a) Dry oxidation of base metals and/or underplates whichhave reached the contacting surfaces by impurity,diffusion or pore corrosion.

------------------------------------------------------------PROCEDURE:

1. The test samples were placed in the test chamber after ithad reached equilibrium at the specified temperature level.The test exposure was performed in accordance with EIA 364,Test Procedure 17.

2. Test Condition:

a) Temperature : 105°C ± 3°Cb) Duration : 300 hoursc) Mated Condition : Matedd) Mounting Condition: Mounted

3. After recovery to room ambient conditions, the applicablevariables were measured and recorded.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

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REQUIREMENTS:

1. There shall be no evidence of physical damage ordeterioration of the test samples so exposed.

2. The change in low level circuit resistance shall notexceed 10 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of visual or physical damage to thetest samples.

2. The following is a summary of the data observed:

LOW LEVEL CIRCUIT/CONTACT RESISTANCE(Milliohms)

Avg. Max. No. ofChange Change Opens

+0.1 +3.6 0

3. See data file 201175A01 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors

YFS-20-03-H-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: AC/AB------------------------------------------------------------START DATE: 6/7/01 COMPLETE DATE: 6/7/01------------------------------------------------------------ROOM AMBIENT: 22°C RELATIVE HUMIDITY: 45%------------------------------------------------------------EQUIPMENT ID#: 52, 113, 691, 1116------------------------------------------------------------DURABILITY

PURPOSE:

This is a preconditioning sequence which is used to induce thetype of wear on the contacting surfaces which may occur undernormal service conditions. The connectors are mated andunmated a predetermined number of cycles. Upon completion, theunits being evaluated are exposed to the environments asspecified to assess any impact on electrical stabilityresulting from wear or other wear dependent phenomenon.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 09 and Paragraph 5.2.5 of GR-1217-CORE.

2. Test Conditions:

a) No. of Cycles : 23b) Rate : 1 inch/min, max.

3. The test samples were axially aligned to accomplish themating and unmating function allowing for self-centeringmovement.

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS: See next page.

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REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples.

2. The change in low level circuit resistance shall not exceed+10 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples.

2. The following is a summary of the data observed:

LOW LEVEL CIRCUIT/CONTACT RESISTANCE(Milliohms)

Avg. Max. No. ofChange Change Opens

+0.7 +9.4 0

3. See data file 201175A01 for individual data points.

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PROJECT NO.: 201175A SPECIFICATION: NPS25298-2------------------------------------------------------------PART NO.: YFT-20-05-H-08-SB PART DESCRIPTION: Connectors

YFS-20-03-H-08-SB------------------------------------------------------------SAMPLE SIZE: 8 Pairs TECHNICIAN: BC/AC/AB------------------------------------------------------------START DATE: 6/16/01 COMPLETE DATE: 8/10/01------------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 40%------------------------------------------------------------EQUIPMENT ID#: 521, 529, 543, 544, 691, 699, 1115, 1116,

1278, 1297, 1298------------------------------------------------------------MIXED FLOWING GAS

PURPOSE:

To determine the impact on electrical stability of contactinterfaces when the test samples are exposed to a mixed flowinggas environment. Said environment is based on field datasimulating typical, severe, non-benign environments. Saidexposure is indicative of expected behavior in the field.

------------------------------------------------------------PROCEDURE:

1. The test environment was performed in accordance withEIA 364, Test Procedure 65.

2. Environmental Conditions:

a) Temperature : 30°C ± 1°Cb) Relative Humidity : 70% ± 2%c) C12 : 10 ± 3 ppbd) NO2 : 200 ± 50 ppbe) H2S : 10 ± 5 ppbf) SO2 : 200 ± 20 ppbg) Exposure Time : 40 daysh) Mounting Conditions : Mountedi) Mating Conditions : Mated

3. The test chamber was allowed to stabilize at the specifiedconditions indicated.

4. After stabilization, the test samples and control couponswere placed in the chamber such that they were no closerthan 2.0" from each other and/or the chamber walls.

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PROCEDURE: Continued

5. The test samples were handled in a manner so as not todisturb the contact interface.

6. After placement of the test samples in the chamber, it wasallowed to re-stabilize and adjusted as required tomaintain the specified concentrations and conditions.

7. The test chamber was monitored periodically during theexposure period to assure the environmental conditions asspecified were maintained.

8. The samples were removed from the chamber periodically toperform low level circuit resistance, durability anddisturbance.

9. Disturbance is defined as a small motion such that thecontact surfaces move 0.004 to 0.015 inch respect to oneanother.

10. Prior to performing variable measurements, the test sampleswere allowed to recover to room ambient conditions.

11. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of damage or corrosion to thetest samples as exposed which will cause mechanical orelectrical malfunction of the said samples.

2. The change in low level circuit resistance shall notexceed +10 milliohms.

------------------------------------------------------------RESULTS: See next page.

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RESULTS:

1. The following is a summary of the data observed:

CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max.

After 5th Day +0.6 +7.7After 10th Day +0.4 +4.2After 15th Day +0.6 +7.5After 1 Mating Cycle +1.4 +13.7After 20th Day +0.5 +7.4After Disturbance +0.4 +5.0After 1 Mating Cycle +0.6 +6.6After Durability +0.4 +6.3After 30th Day +0.4 +6.0After 40th Day +0.4 +7.6

2. See data file 201175A01 for individual data points.

3. Five copper coupons were placed in the chamber. Uponremoval said coupons were evaluated via weight gaintechnique with the following results:

WEIGHT GAIN µgm/cm2/Day)

Coupon No. Day 5 Day 10 Day 15 Day 20 Day 30 Day 40

1 13+ 14+ 14+ 12+ 12+ 142 12+ 15 13 14+ 13+ 14+3 12 13 13+ 13 13 154 14 13+ 15 15 14 13+5 15 14 15+ 14 12 14

Requirement: 12 - 16

4. There was no evidence of damage or corrosion to the testsamples that would cause mechanical or electricalmalfunction of the samples.

5. The test sponsor was notified relative to the observedmeasurements. Upon instructions from the test sponsor, thetest sequence was continued.

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TR#201175A, REV.1.2 114 of 117 Contech Research

Low Level Contact Resistance

Project : 201175A Spec: NPS 25298-2Customer : Samtec Subgroup: Group 9 30 µin AuProduct : YFS/YFT series File #: 201175A01Description: Mated (ID # G1-1 thru G1-8)Open circuit voltage : 20mv Current : 10ma

Delta valuesunits : milliohms

Temp ºC 22 22 22 24 21 22 22 23 23 23 22 22 23R.H. % 40 46 44 57 51 54 54 48 50 50 52 60 68Date : 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 16Jul01 17Jul01 18Jul01 19Jul01 30Jul01 10Aug01Pos. ID Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X MFG20d DISTURB Cyclic1X Dura 2 MFG30d MFG40d

1-1 8.3 0.3 -0.4 -0.5 -0.3 -0.3 -0.3 -0.2 1.1 -0.2 0.3 1.0 0.11-2 8.9 0.0 0.8 0.3 0.6 1.5 1.2 0.5 0.1 0.5 0.7 0.5 0.61-3 8.3 0.1 0.4 1.1 0.0 1.0 2.6 -0.1 0.6 1.4 0.9 -0.1 0.21-4 8.8 -0.1 0.7 0.8 0.7 0.4 1.5 0.5 0.2 0.7 0.4 0.3 0.21-5 8.7 -0.1 0.6 0.3 0.4 0.0 0.5 0.2 0.4 0.2 0.3 0.3 0.31-6 9.0 -0.1 0.8 0.2 0.2 0.2 0.1 0.1 0.2 0.0 0.3 0.4 0.01-7 9.3 -0.2 0.5 0.3 0.1 0.3 0.0 0.0 0.0 -0.1 0.2 0.4 -0.21-8 9.6 -0.9 -0.6 0.5 -0.9 -0.1 -0.4 -0.6 -0.2 -0.5 -0.8 -0.5 -0.71-9 9.0 -0.2 0.3 1.3 0.2 0.4 1.6 1.2 0.5 0.6 0.2 0.2 -0.11-10 9.1 0.1 1.3 0.4 0.4 0.4 1.2 1.2 0.6 0.2 0.7 0.7 0.81-11 9.3 -0.4 0.8 0.4 0.0 0.0 0.1 -0.5 0.0 0.0 0.2 0.1 -0.11-12 8.4 -0.1 0.8 1.0 0.9 0.8 1.4 1.0 1.5 1.0 0.9 0.8 0.91-13 8.2 1.0 2.3 0.6 1.9 4.6 1.9 2.3 1.2 1.7 3.4 2.5 2.51-14 8.4 -0.1 0.7 1.3 1.0 0.5 2.3 0.6 0.5 0.7 0.8 0.8 1.61-15 8.1 0.1 0.6 2.8 1.6 0.8 2.7 0.7 0.5 1.6 1.0 0.9 2.21-16 8.4 0.0 0.4 1.5 1.2 0.5 0.9 0.4 0.1 0.6 0.5 0.7 0.31-17 8.5 -0.2 -0.1 0.1 -0.2 0.0 -0.3 -0.3 -0.1 -0.3 -0.3 -0.2 -0.11-18 8.7 -0.1 0.1 0.0 -0.3 -0.4 -0.2 -0.1 -0.2 -0.1 0.0 -0.1 -0.21-19 8.6 -0.1 0.3 0.9 0.4 0.4 0.8 0.1 0.0 0.4 0.5 0.5 0.41-20 8.6 -0.1 1.0 4.0 3.5 0.6 4.9 0.6 0.4 2.0 2.5 2.5 2.01-21 8.8 0.0 0.2 0.1 0.0 0.5 0.2 0.0 0.2 0.1 0.4 0.3 0.31-22 8.6 0.0 1.0 1.7 1.4 1.6 4.0 0.7 0.4 1.7 1.0 0.9 2.01-23 8.1 0.4 0.9 1.4 1.6 2.7 4.3 1.1 0.9 2.5 1.7 1.3 2.81-24 7.6 -0.1 0.4 1.8 1.6 1.6 2.0 1.6 1.5 1.7 2.1 1.9 2.11-25 9.8 -0.1 -0.1 0.0 -0.2 -0.5 -0.1 -0.1 0.1 -0.2 -0.2 -0.1 -0.32-1 7.2 1.3 1.4 -0.2 -0.1 1.4 0.0 1.2 1.4 0.8 0.3 1.2 1.32-2 7.4 2.2 5.6 1.7 2.2 4.3 3.0 2.4 2.2 2.1 2.2 1.6 1.82-3 7.8 1.2 2.9 0.5 1.5 1.6 4.1 1.7 1.5 2.9 0.6 1.1 1.02-4 8.3 0.2 1.1 0.2 0.7 0.7 0.8 0.2 0.0 0.3 0.1 0.1 -1.02-5 7.9 0.1 0.2 0.1 0.3 0.3 0.6 0.2 0.3 0.3 0.0 0.0 -0.12-6 8.6 0.1 0.1 0.0 -0.2 -0.1 0.0 -0.2 0.1 0.0 -0.8 -0.1 -0.12-7 8.4 0.2 0.3 0.1 0.1 0.0 0.1 0.2 0.1 0.1 -0.3 0.0 -0.12-8 7.2 1.5 1.2 -0.6 0.9 0.8 1.1 0.5 0.8 0.5 0.5 0.5 0.42-9 8.5 0.2 0.3 0.0 -0.3 -0.2 -0.1 0.0 0.4 0.0 -0.1 0.0 -0.12-10 8.5 0.3 0.3 0.0 0.2 0.2 0.1 0.1 0.0 0.1 0.0 0.1 0.02-11 8.4 0.4 2.5 1.5 2.1 2.0 2.7 1.9 1.9 2.5 1.9 2.1 2.12-12 7.8 0.6 1.8 0.2 0.9 0.6 3.3 0.4 0.2 1.3 0.3 0.3 0.42-13 7.3 0.5 0.6 0.5 -0.1 1.1 0.4 0.2 0.4 0.5 0.1 0.1 0.42-14 8.1 0.8 1.5 0.0 0.5 0.4 2.5 0.0 0.1 2.0 0.1 0.5 0.62-15 7.9 0.5 0.7 0.2 0.7 0.7 2.3 0.4 0.4 1.2 -0.3 0.5 0.42-16 8.0 0.6 1.1 0.3 0.7 1.0 3.5 1.0 0.7 1.2 0.9 1.1 0.92-17 7.6 0.3 0.3 0.1 -0.2 0.2 0.6 0.2 0.8 0.4 0.2 0.3 0.32-18 8.0 0.3 0.4 0.1 0.1 0.0 0.3 0.1 0.2 0.4 0.1 0.2 0.22-19 8.1 0.1 0.2 0.2 0.1 0.2 0.3 0.1 0.2 0.3 0.1 0.0 0.02-20 8.0 0.6 0.8 0.1 0.6 0.4 0.7 0.1 0.3 0.6 0.0 0.3 0.12-21 8.2 0.1 0.3 0.3 0.6 0.5 0.7 0.1 0.3 0.4 0.1 0.1 0.2

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TR#201175A, REV.1.2 115 of 117 Contech Research

Temp ºC 22 22 22 24 21 22 22 23 23 23 22 22 23R.H. % 40 46 44 57 51 54 54 48 50 50 52 60 68Date : 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 16Jul01 17Jul01 18Jul01 19Jul01 30Jul01 10Aug01Pos. ID Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X MFG20d DISTURB Cyclic1X Dura 2 MFG30d MFG40d

2-22 8.1 0.2 0.5 0.5 0.5 0.6 0.9 0.2 0.5 0.4 0.2 0.2 0.22-23 4.6 2.5 3.8 5.9 3.3 3.7 7.6 4.4 5.0 6.6 5.0 4.6 3.92-24 4.9 2.0 2.5 1.0 2.7 3.8 2.9 2.7 3.0 3.0 3.5 3.9 3.82-25 8.6 0.7 0.3 -0.4 0.8 0.8 0.8 0.1 0.8 0.8 0.7 0.4 0.73-1 6.6 2.1 2.6 -0.2 1.8 2.3 2.3 2.1 2.4 2.1 1.7 2.1 2.03-2 8.4 0.2 -0.6 -0.8 -0.2 0.0 1.3 -0.9 -0.9 -0.7 -1.2 -1.1 -0.53-3 8.4 0.0 0.8 0.7 1.4 1.2 2.6 0.4 0.4 1.1 0.2 0.2 0.33-4 8.9 -0.1 0.4 0.6 -0.2 0.4 1.7 -0.1 0.1 0.3 0.2 0.0 0.03-5 8.6 0.2 0.2 0.3 -0.3 0.1 0.3 0.2 0.2 0.1 -0.2 0.2 0.03-6 9.0 0.0 0.1 0.6 -0.2 -0.2 0.2 0.0 0.0 -0.1 -0.1 0.0 -0.13-7 9.1 -0.3 0.1 0.9 -0.2 -0.1 0.1 -0.2 -0.3 -0.2 -0.4 -0.1 -0.33-8 8.3 -0.3 0.0 0.2 -0.4 0.3 -0.3 -0.2 -0.2 -0.4 -0.5 -0.4 0.13-9 8.7 0.1 0.1 0.8 -0.2 -0.3 -0.3 0.0 0.5 -0.1 -0.2 -0.1 -0.13-10 8.7 0.0 1.0 1.4 1.2 1.4 1.3 1.3 1.1 1.2 0.9 1.4 1.33-11 9.2 -0.2 0.5 1.6 0.6 0.6 1.2 0.0 0.5 0.3 -0.2 0.1 -0.13-12 8.6 -0.1 2.5 4.2 2.8 2.5 12.8 3.9 1.2 3.9 0.4 0.5 0.33-13 8.8 0.7 0.4 -1.0 0.0 2.3 0.3 -0.1 0.6 -0.6 -0.9 -0.4 0.63-14 8.6 0.0 1.1 3.9 2.0 1.7 4.9 0.4 1.1 0.9 0.2 0.2 0.13-15 8.8 0.0 0.6 1.9 0.2 1.2 1.9 0.0 0.3 0.6 0.0 0.0 -0.13-16 8.5 0.0 0.3 0.9 -0.2 -0.2 0.3 -0.2 -0.2 -0.2 -0.3 -0.2 -0.33-17 8.7 -0.3 -0.3 -0.5 -0.8 -0.5 -1.2 -0.6 -0.5 -0.8 -1.2 -0.7 -1.33-18 8.6 0.0 0.2 0.1 -0.3 -0.3 0.3 -0.2 -0.3 -0.1 -0.2 -0.1 0.43-19 8.7 -0.1 0.3 0.4 -0.2 0.1 0.1 0.0 -0.2 -0.1 -0.2 -0.1 -0.13-20 8.8 0.0 0.8 2.2 0.1 0.1 1.6 -0.1 0.1 0.2 -0.2 -0.1 -0.23-21 8.9 0.1 0.5 1.1 0.2 0.2 0.7 0.2 0.2 0.5 -0.1 0.1 0.03-22 8.6 0.1 0.5 0.5 0.6 0.4 1.1 0.4 0.7 0.7 0.3 0.3 0.33-23 8.3 -0.2 0.0 0.0 0.2 0.3 0.7 -0.3 -0.6 0.0 -0.8 -0.6 0.43-24 7.9 0.9 1.1 0.0 0.8 0.6 1.1 0.9 0.9 0.8 0.8 0.9 0.93-25 9.0 0.3 0.4 -0.5 0.1 -0.2 0.1 -0.4 0.3 0.3 0.3 0.1 -0.34-1 7.4 0.2 0.2 0.1 0.3 0.7 0.1 0.4 1.0 0.4 0.6 1.5 0.44-2 7.6 0.7 1.1 -0.3 0.5 0.4 1.9 -0.3 -0.1 1.3 0.5 0.6 0.74-3 8.3 0.0 1.0 0.2 0.0 -0.1 1.5 -0.6 0.2 0.4 -0.4 -0.5 -0.24-4 8.3 -0.1 0.9 0.8 0.9 1.4 2.1 0.7 0.0 1.1 0.9 0.7 0.64-5 8.7 -0.4 -0.5 -0.2 -0.6 -0.4 -0.3 -0.3 -0.9 -0.6 -0.7 -0.5 -0.64-6 8.4 -0.1 0.1 0.2 0.0 0.6 0.3 0.0 0.1 0.1 0.1 0.1 -0.14-7 9.1 -0.3 0.1 -0.3 1.1 -0.4 1.2 0.1 -0.5 -0.2 0.2 0.1 -0.24-8 10.4 -1.8 -2.1 -0.3 -1.9 -2.0 -1.7 -2.5 -2.7 -2.1 -1.6 -2.2 -2.34-9 10.2 -1.1 -1.4 -0.3 -1.3 -1.2 -1.6 -1.4 -1.5 -1.6 -1.5 -1.5 -1.74-10 9.8 -1.0 -0.6 0.1 -0.3 -0.8 -0.6 -0.8 -0.8 -1.1 -1.5 -0.9 -1.14-11 8.8 -0.2 0.9 0.9 1.1 0.7 3.4 1.4 1.3 1.4 0.4 1.3 0.34-12 8.6 -0.3 1.0 1.1 0.9 1.1 3.3 1.0 1.0 2.3 1.9 0.6 0.64-13 7.3 1.2 0.5 -0.4 0.8 1.0 0.8 0.6 0.7 0.8 1.5 1.5 1.54-14 8.2 -0.2 0.6 0.9 0.1 0.8 3.2 0.1 0.1 0.7 1.1 -0.2 0.44-15 8.1 -0.2 0.7 0.9 0.1 0.4 1.9 0.1 -0.2 0.2 0.3 0.0 0.24-16 10.4 -1.5 -2.4 -1.0 -2.4 -2.3 -2.0 -2.5 -2.5 -2.6 -2.5 -2.7 -2.74-17 8.3 -0.4 -0.3 0.0 0.0 -0.4 0.1 -0.5 -0.6 -0.3 0.1 -0.2 -0.34-18 7.8 0.1 1.4 0.3 0.6 0.2 0.9 0.4 0.3 0.8 0.4 0.8 0.24-19 8.3 0.0 0.0 0.0 0.2 -0.1 0.3 -0.4 0.1 -0.1 0.0 0.0 -0.14-20 9.1 -0.5 0.2 0.5 -0.4 0.2 3.0 -0.6 -0.1 0.4 0.6 -0.6 -0.24-21 8.3 0.1 0.3 0.1 0.2 0.5 0.7 -0.1 0.5 0.7 0.4 0.6 0.44-22 8.8 -0.2 8.7 7.6 4.0 7.5 11.9 1.7 4.6 6.6 5.0 2.7 2.64-23 8.5 -0.5 0.8 1.8 1.0 3.8 3.6 -0.3 0.2 3.7 1.1 0.2 -0.14-24 7.1 0.5 -0.1 -0.6 0.1 0.7 0.7 -0.1 0.7 0.5 0.3 0.6 0.44-25 9.1 0.0 0.1 0.0 -0.1 0.1 0.4 -0.1 0.4 0.0 0.0 0.0 0.15-1 7.5 0.3 0.1 0.0 -0.2 0.3 0.2 0.4 2.4 1.6 0.3 1.2 0.55-2 7.7 0.5 3.3 1.8 0.5 0.8 3.2 0.9 1.2 1.5 1.9 1.8 1.65-3 7.9 0.0 1.1 0.3 -0.4 -0.6 1.3 -0.7 -0.5 -0.3 -0.3 -0.7 -0.8

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TR#201175A, REV.1.2 116 of 117 Contech Research

Temp ºC 22 22 22 24 21 22 22 23 23 23 22 22 23R.H. % 40 46 44 57 51 54 54 48 50 50 52 60 68Date : 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 16Jul01 17Jul01 18Jul01 19Jul01 30Jul01 10Aug01Pos. ID Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X MFG20d DISTURB Cyclic1X Dura 2 MFG30d MFG40d

5-4 8.5 0.0 0.5 0.4 0.2 0.7 1.1 0.5 0.3 0.4 0.2 0.2 0.25-5 8.6 0.0 0.2 0.2 0.1 0.1 0.5 0.4 0.2 0.1 -0.3 0.1 0.15-6 8.8 0.0 0.2 0.3 -0.1 0.4 0.6 0.0 0.1 0.0 0.1 0.1 0.15-7 8.4 0.0 1.3 1.5 0.9 0.7 2.5 1.0 0.7 1.4 1.2 1.1 0.65-8 8.4 0.1 0.1 -0.1 -0.2 -0.1 -0.1 -0.2 -0.8 -0.1 -0.1 -0.2 -0.15-9 8.7 -0.2 0.0 0.2 -0.4 -0.2 -0.2 -0.2 -0.3 -0.2 -0.2 -0.1 -0.25-10 8.7 0.0 0.5 0.4 0.1 0.1 0.2 -0.1 -0.1 0.0 0.0 0.0 -0.15-11 8.6 0.0 0.3 0.4 0.1 0.1 0.7 -0.1 0.1 0.1 0.2 0.3 0.25-12 8.3 -0.1 0.6 0.6 0.5 0.6 1.5 0.3 0.4 0.5 0.1 0.2 0.15-13 7.2 0.4 0.4 0.1 0.4 0.3 0.9 0.7 0.8 0.3 0.2 0.4 0.45-14 8.3 0.1 0.5 0.4 0.3 0.4 1.5 0.4 0.7 0.5 0.2 0.3 0.35-15 8.1 0.1 0.8 0.5 0.6 0.5 0.8 0.4 0.5 0.5 -0.3 0.1 0.15-16 8.5 -0.1 0.2 0.1 -0.5 0.0 0.1 -0.2 -0.2 -0.1 -0.2 -0.2 -0.25-17 8.5 -0.1 0.3 0.3 0.1 0.1 0.2 -0.2 -0.1 -0.1 0.0 0.0 -0.15-18 8.8 0.0 0.2 0.1 0.0 -0.1 0.0 0.0 0.1 0.2 0.1 0.0 0.25-19 8.4 0.0 0.3 0.2 0.3 0.0 0.2 0.0 0.3 0.0 -0.1 -0.1 0.15-20 8.6 -0.2 0.6 0.7 0.0 0.0 0.6 0.1 0.1 0.3 0.1 0.0 0.05-21 8.6 0.0 0.4 0.2 0.2 0.2 0.4 0.1 0.3 0.3 0.1 0.0 0.25-22 8.5 -0.1 2.6 2.3 1.7 1.3 3.9 1.6 1.7 5.4 3.3 2.4 2.05-23 7.9 0.2 1.5 1.2 1.2 1.2 3.0 0.7 0.5 2.0 0.8 0.7 0.65-24 8.3 0.0 1.4 1.2 0.5 0.5 5.4 1.5 1.8 3.4 2.1 1.3 1.25-25 8.5 -0.2 0.8 0.4 0.7 -0.2 0.8 -0.1 0.1 0.8 0.7 0.7 0.76-1 8.6 -0.5 -0.6 0.0 -0.5 -0.6 -0.5 -0.5 -0.4 -0.6 -0.6 -0.6 -0.26-2 7.5 0.8 0.5 -0.7 0.1 0.7 2.3 0.3 -0.1 0.9 -0.3 -0.1 -0.46-3 7.2 0.5 0.5 0.2 0.8 0.9 2.4 0.4 1.4 1.1 0.7 0.7 0.36-4 8.6 -0.1 0.4 0.4 -0.3 0.2 1.7 0.4 0.1 1.0 0.1 0.2 0.16-5 8.4 0.0 0.3 0.3 0.3 0.3 0.6 0.5 0.6 0.2 0.1 -0.1 -0.16-6 8.8 0.1 0.5 1.2 0.6 1.0 0.5 0.5 0.8 0.1 0.1 0.0 0.16-7 9.0 -0.2 0.4 0.9 0.2 0.0 0.3 -0.1 0.3 0.3 0.0 0.1 -0.16-8 8.7 0.0 0.2 0.1 0.0 0.0 0.2 -0.2 -0.2 -0.2 -0.2 -0.3 -0.26-9 8.7 0.1 0.4 0.7 0.1 0.1 0.0 -0.1 0.1 0.0 0.0 0.0 0.06-10 8.9 0.4 0.2 -0.2 -0.4 -0.1 -0.1 -0.4 -0.3 -0.2 -0.2 -0.2 0.06-11 8.9 0.0 0.3 1.1 0.1 0.2 1.1 0.1 0.3 0.1 -0.3 -0.1 0.06-12 5.2 1.1 3.2 2.1 3.6 3.2 2.6 2.5 3.4 2.8 2.1 1.4 2.86-13 7.6 0.8 1.2 -0.3 1.1 0.8 1.1 0.0 0.1 0.6 0.1 0.4 0.46-14 8.1 -0.1 0.5 1.0 0.6 0.3 0.9 0.6 0.5 0.7 0.3 0.2 0.46-15 8.2 0.0 0.6 1.0 0.3 0.5 1.3 0.2 0.7 0.3 0.3 0.4 0.56-16 8.4 0.1 0.2 0.8 0.1 0.3 0.4 -0.1 0.7 0.0 -0.1 0.0 0.16-17 4.3 0.1 0.3 0.2 0.0 0.4 0.5 -0.2 0.2 0.2 0.1 0.1 0.36-18 8.9 -0.2 -0.4 0.0 -0.2 0.1 0.0 -0.4 -0.6 -0.5 -0.5 -0.3 -0.66-19 8.3 0.1 0.3 0.4 0.3 0.4 0.4 0.3 0.3 0.2 0.2 0.3 0.36-20 8.6 0.0 0.3 0.9 0.4 0.5 3.1 0.8 0.1 0.9 0.8 0.5 0.46-21 8.7 0.1 0.1 0.1 0.3 0.3 0.5 0.0 0.0 0.1 0.0 0.0 0.16-22 9.4 -0.1 -0.1 0.3 0.1 0.2 5.2 0.5 -0.2 0.8 -0.4 -0.5 -0.56-23 8.0 0.3 0.8 0.5 0.7 1.1 1.8 0.6 0.1 0.4 0.1 0.6 0.66-24 8.3 0.3 -0.5 -0.6 -0.1 -0.1 -0.1 -0.7 -0.6 -0.6 -0.7 -0.7 0.16-25 9.2 0.0 0.1 0.2 0.2 0.2 0.2 0.1 0.2 0.1 0.1 0.2 0.17-1 9.2 -0.8 -0.5 0.5 -0.4 0.5 -0.4 0.4 0.2 0.2 0.3 0.3 0.37-2 8.6 0.0 0.1 -0.2 -0.4 -0.1 0.8 -0.3 -0.6 -0.8 -1.0 -1.0 -0.47-3 8.3 0.1 1.8 2.4 0.1 1.8 7.2 2.8 -0.1 0.5 1.0 0.3 0.87-4 8.6 0.1 0.7 0.5 0.4 0.4 1.2 0.8 -0.1 0.3 0.3 0.3 0.27-5 8.6 0.2 0.5 0.1 0.9 0.5 0.8 0.6 0.2 0.3 0.2 0.4 0.27-6 9.0 0.0 0.4 0.3 0.4 1.0 0.6 0.2 0.7 0.1 0.2 0.3 0.17-7 8.8 0.1 1.3 1.3 1.0 1.5 1.8 0.5 0.3 0.6 0.5 0.5 0.47-8 8.9 0.0 -0.1 -0.2 -0.6 -0.3 -0.1 -0.2 0.1 -0.3 -0.3 -0.3 -0.17-9 8.7 0.0 0.4 0.2 0.2 0.8 0.2 0.2 0.6 0.2 0.1 0.2 0.07-10 8.9 0.1 0.1 0.0 0.1 0.0 0.0 0.1 0.7 0.1 0.0 0.1 0.0

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TR#201175A, REV.1.2 117 of 117 Contech Research

Temp ºC 22 22 22 24 21 22 22 23 23 23 22 22 23R.H. % 40 46 44 57 51 54 54 48 50 50 52 60 68Date : 22May01 06Jun01 08Jun01 20Jun01 27Jun01 05Jul01 05Jul01 16Jul01 17Jul01 18Jul01 19Jul01 30Jul01 10Aug01Pos. ID Initial T-Aging Dura MFG 5d MFG10d MFG15d Dura1X MFG20d DISTURB Cyclic1X Dura 2 MFG30d MFG40d

7-11 8.8 0.3 0.7 0.5 0.1 0.8 1.8 0.4 1.0 0.3 0.3 0.1 0.27-12 8.5 -0.1 3.4 3.3 3.1 1.5 13.7 4.0 1.9 4.2 1.0 1.0 0.77-13 8.0 0.6 0.4 -1.7 0.2 0.7 0.9 0.4 1.0 0.3 0.3 0.2 1.17-14 8.6 0.0 1.7 1.8 1.1 0.3 3.7 1.5 1.2 1.3 0.6 0.8 0.57-15 8.8 0.2 1.0 0.8 0.7 0.8 1.3 0.9 0.8 1.3 0.6 0.6 0.37-16 8.8 0.1 0.3 0.2 0.1 0.4 0.4 0.0 0.2 0.0 0.1 0.2 0.07-17 8.4 0.1 0.8 0.8 0.6 0.8 1.0 0.6 0.5 1.0 0.5 1.0 0.87-18 8.4 0.0 1.1 1.6 1.4 2.0 2.7 1.1 1.5 -0.7 0.8 1.5 1.57-19 8.5 0.0 0.3 0.3 -0.1 0.3 0.5 0.3 0.6 0.2 -0.1 0.1 -0.17-20 8.6 0.0 1.0 0.7 0.8 0.6 2.3 1.4 0.5 0.2 0.6 0.3 0.47-21 8.7 0.0 0.7 0.2 0.5 0.6 0.8 1.1 0.5 0.2 0.3 0.3 0.17-22 8.3 0.1 2.0 1.3 1.4 0.8 3.7 3.2 0.9 0.7 0.8 0.7 0.67-23 8.5 -0.1 1.0 1.1 0.4 0.4 2.1 0.9 0.7 0.8 0.3 -0.2 0.07-24 8.1 0.1 0.9 0.0 0.8 0.7 0.7 0.1 1.0 0.5 0.6 1.0 0.77-25 9.1 0.3 0.6 -0.4 0.6 0.0 0.5 0.6 0.4 0.4 0.3 0.4 0.38-1 7.1 -0.1 0.5 0.1 0.0 0.3 0.5 0.2 0.0 0.2 0.4 0.9 0.98-2 9.1 -0.1 -0.3 -0.8 -1.6 -1.8 -0.6 -0.9 -1.8 -1.5 -1.1 -0.6 -0.18-3 4.9 1.0 3.3 4.4 4.2 3.4 3.9 7.4 3.4 6.0 6.3 6.0 7.68-4 8.3 0.1 1.9 1.7 0.7 1.2 3.2 2.8 0.2 1.5 1.5 1.3 0.78-5 8.3 0.2 1.3 0.6 0.4 0.7 0.3 1.2 0.2 0.4 0.1 0.3 0.28-6 8.4 -0.1 -2.1 -2.0 -2.3 -1.7 -0.4 -1.2 -1.6 -0.6 -1.0 -1.4 -1.68-7 8.7 0.0 0.7 1.2 0.0 0.4 -0.4 0.0 -0.1 -0.1 0.0 0.4 -0.28-8 9.5 -0.6 -0.3 0.0 -1.2 -1.0 -0.8 -1.1 -1.1 -1.1 -1.1 -1.2 -1.28-9 9.9 -0.7 0.4 0.8 -0.6 -0.2 -1.0 -0.5 -1.8 1.7 0.1 0.4 0.18-10 9.1 0.0 0.3 0.5 -0.5 0.3 -0.3 -0.1 -0.3 -0.4 -0.4 -0.4 -0.68-11 8.7 -0.1 1.0 2.0 0.1 0.5 0.6 0.5 0.3 0.2 0.2 0.5 0.78-12 4.2 0.6 1.1 1.8 3.3 2.7 1.1 2.1 4.7 3.8 4.1 3.0 3.28-13 6.8 0.8 0.8 -0.1 0.7 1.1 0.7 0.5 2.6 0.3 0.3 0.5 0.48-14 8.3 0.0 1.0 2.0 0.2 0.5 1.0 0.6 0.3 0.4 0.9 0.6 0.98-15 7.9 0.4 0.6 0.7 0.0 0.5 -0.2 0.1 0.2 0.1 0.2 0.4 0.28-16 5.5 3.6 0.6 -3.2 0.9 2.6 1.9 1.4 2.5 2.0 2.1 2.0 2.08-17 8.1 0.0 0.2 0.4 -0.3 -0.1 -0.3 -0.3 -0.3 -0.3 0.0 0.3 -0.18-18 8.2 0.0 0.2 0.2 -0.2 -0.1 -0.1 -0.1 -0.2 -0.1 0.0 0.1 -0.18-19 8.4 0.0 0.5 0.5 0.0 -0.1 0.1 0.3 0.0 0.1 0.5 0.5 0.28-20 8.5 -0.1 2.2 2.1 0.1 0.5 1.3 1.3 -0.2 0.6 1.7 2.2 0.48-21 8.5 0.1 1.0 0.6 0.4 0.2 1.0 0.8 0.2 0.5 1.0 0.9 0.78-22 9.0 0.0 9.4 7.7 3.3 2.5 5.6 7.3 -0.1 3.6 3.6 4.9 4.08-23 6.1 0.8 3.3 1.4 2.3 2.8 3.5 4.2 1.1 2.0 2.6 3.5 3.68-24 5.0 1.8 2.3 1.2 2.8 2.2 2.7 3.4 2.4 3.3 3.1 2.3 2.88-25 7.8 0.1 0.5 0.0 0.6 0.4 1.0 0.4 0.6 0.4 1.4 1.7 1.8

MAX 10.4 3.6 9.4 7.7 4.2 7.5 13.7 7.4 5.0 6.6 6.3 6.0 7.6 MIN 4.2 -1.8 -2.4 -3.2 -2.4 -2.3 -2.0 -2.5 -2.7 -2.6 -2.5 -2.7 -2.7 AVG 8.3 0.1 0.7 0.6 0.4 0.6 1.4 0.5 0.4 0.6 0.4 0.4 0.4 STD 0.9 0.6 1.3 1.2 1.0 1.1 2.1 1.2 1.0 1.3 1.1 1.0 1.1 Open 0 0 0 0 0 0 0 0 0 0 0 0 0

Tech A.C. A.C. A.C. G.P. AC AC AC AC AB AC AB AC ACEquip ID 691 692 693 400 691 691 691 691 691 691 529 691 691

1116 1117 1118 1047 1116 1116 1116 1116 1116 1116 1278 1116 1116