dave heading and bp1 - Samtec...

144
Contech Research An Independent Test and Research Laboratory Test Laboratory JANUARY 9, 2008 TEST REPORT #207865 MIXED FLOWING GAS TESTING CONNECTOR SERIES QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH RESEARCH, INC.

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Page 1: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

JANUARY 9, 2008

TEST REPORT #207865

MIXED FLOWING GASTESTING

CONNECTOR SERIES

QSE/QTE

SAMTEC, INC.

APPROVED BY: DOMINIC ARPINOPROGRAM MANAGER

CONTECH RESEARCH, INC.

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TR#207865, REV.1.0 2 of 144 Contech ResearchAn Independent Test and Research Laboratory

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REVISION HISTORY

DATE REV. NO. DESCRIPTION ENG.

1/9/2008 1.0 Initial Issue DA

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CERTIFICATION

This is to certify that the evaluation described herein wasdesigned and executed by personnel of Contech Research, Inc.It was performed with the concurrence of Samtec, Inc., of NewAlbany, IN who was the test sponsor.

All equipment and measuring instruments used during testingwere calibrated and traceable to NIST according to ISO 10012-1and ANSI/NCSL Z540-1 and MIL-STD-45662 as applicable.

All data, raw and summarized, analysis and conclusionspresented herein are the property of the test sponsor. No copyof this report, except in full, shall be forwarded to anyagency, customer, etc., without the written approval of thetest sponsor and Contech Research.

Dominic ArpinoProgram Manager

Contech Research, Inc.

DA:cf

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SCOPE

To perform Mixed Flowing Gas testing on various connectorplatings as manufactured and submitted by the test sponsorSamtec, Inc.

APPLICABLE DOCUMENTS

1. Unless otherwise specified, the following documents ofissue in effect at the time of testing performed form apart of this report to the extent as specified herein. Therequirements of sub-tier specifications and/or standardsapply only when specifically referenced in this report.

2. Standards: EIA Publication 364

TEST SAMPLES AND PREPARATION

1. The following test samples were submitted by the testsponsor, Samtec, Inc., for the evaluation to be performedby Contech Research, Inc.

TABLE 1

Plating Thickness(Microinches)

Noble TopConnector Series Nickel Pd. Layer Layer

a) QSE-020-01-X-D-A 150 min Au Flash Au(50)b) QSE-020-01-X-D-A 150 min Au Flash Au(50)c) QSE-020-01-X-D-A 150 min 40 min Au Flash Au(10)d) QSE-020-01-X-D-A 150 min 40 min Au Flash Au(10)e) QSE-020-01-X-D-A 150 min 40 min Au Flash Au(30)f) QSE-020-01-X-D-A 150 min 40 min Au Flash Au(30)

Connector Series

a) QTE-020-01-X-D-A 150 min Au Flash Au(50)b) QTE-020-01-X-D-A 150 min Au Flash Au(50)c) QTE-020-01-X-D-A 150 min 40 min Au Flash Au(10)d) QTE-020-01-X-D-A 150 min 40 min Au Flash Au(10)e) QTE-020-01-X-D-A 150 min 40 min Au Flash Au(30)f) QTE-020-01-X-D-A 150 min 40 min Au Flash Au(30)

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TEST SAMPLES AND PREPARATION continue:

2. Test samples were supplied assembled and terminated to testboards by the test sponsor.

3. Test boards for mounting test samples were supplied by thetest sponsor.

4. The test samples were tested in their ‘as received’condition.

5. Spacers were assembled to each test sample to maintainstability between the mated pair.

6. Unless otherwise specified in the test procedures used, nofurther preparation was used.

TEST SELECTION

1. See Test Plan Flow Diagram, Figure #1, for test sequencesused.

2. Test set ups and/or procedures which are standard or commonare not detailed or documented herein provided they arecertified as being performed in accordance with theapplicable (industry or military) test methods, standardsand/or drawings as specified in the detail specification.

SAMPLE CODING

1. All samples were coded. Mated test samples remained witheach other throughout the test group/sequences for whichthey were designated. Coding was performed in a mannerwhich remained legible for the test duration.

2. The test samples were coded in the following manner:

CRI PLT Socket HeaderGp # Thick Contact mates to Contact ID#’s

111 Au(50) QSE-020-01-X-D-A QTE-020-01-X-D-A 4-25 to 4-32

112 Au(50) QSE-020-01-X-D-A QTE-020-01-X-D-A 5-33 to 5-40

113 Au(10) QSE-020-01-X-D-A QTE-020-01-X-D-A 6-41 to 6-48

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SAMPLE CODING continued:

CRI PLT Socket HeaderGp # Thick Contact mates to Contact ID#’s

114 Au(10) QSE-020-01-X-D-A QTE-020-01-X-D-A 7-49 to 7-56

115 Au(30) QSE-020-01-X-D-A QTE-020-01-X-D-A 8-57 to 8-64

116 Au(30) QSE-020-01-X-D-A QTE-020-01-X-D-A 9-65 to 9-72

3. See page 4, Table 1 for the different plating.

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FIGURE #1

TEST PLAN FLOW DIAGRAM

SAMPLE PREPARATION

LLCR

DURABILITYAS SPECIFIED

LLCR

MFGEXPOSUREDURATION7 DAYSUNMATED

LLCR

1 CYCLEMATE/UNMATE

LLCR

MFGEXPOSUREDURATION7 DAYSMATED

LLCR

1 CYCLEMATE/UNMATE

LLCR

Group A

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DATA SUMMARY

TEST REQUIREMENT RESULT

GROUP A

LLCR

GR 111 –Au (50) RECORD 24.8 mΩ MAX.GR 112 –Au (50) RECORD 24.5 mΩ MAX.GR 113 –Au (10) RECORD 25.0 mΩ MAX.GR 114 –Au (10) RECORD 26.3 mΩ MAX.GR 115 –Au (30) RECORD 24.9 mΩ MAX.GR 116 –Au (30) RECORD 25.2 mΩ MAX.

DURABILITY

GR 111 –Au (50) NO DAMAGE PASSEDGR 112 –Au (50) NO DAMAGE PASSEDGR 113 –Au (10) NO DAMAGE PASSEDGR 114 –Au (10) NO DAMAGE PASSEDGR 115 –Au (30) NO DAMAGE PASSEDGR 116 –Au (30) NO DAMAGE PASSED

LLCR

GR 111 –Au (50) +10.0 mΩ MAX.CHG. +2.5 mΩ MAX.CHG.GR 112 –Au (50) +10.0 mΩ MAX.CHG. +1.9 mΩ MAX.CHG.GR 113 –Au (10) +10.0 mΩ MAX.CHG. +1.3 mΩ MAX.CHG.GR 114 –Au (10) +10.0 mΩ MAX.CHG. +2.2 mΩ MAX.CHG.GR 115 –Au (30) +10.0 mΩ MAX.CHG. +2.8 mΩ MAX.CHG.GR 116 –Au (30) +10.0 mΩ MAX.CHG. +4.3 mΩ MAX.CHG.

MFG –UNMATED

GR 111 –Au (50) @7 DAYS NO DAMAGE CORROSIONGR 112 –Au (50) @7 DAYS NO DAMAGE CORROSIONGR 113 –Au (10) @7 DAYS NO DAMAGE CORROSIONGR 114 –Au (10) @7 DAYS NO DAMAGE CORROSIONGR 115 –Au (30) @7 DAYS NO DAMAGE CORROSIONGR 116 –Au (30) @7 DAYS NO DAMAGE CORROSION

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DATA SUMMARY -continued

TEST REQUIREMENT RESULT

LLCR

GR 111 –Au (50) @7 DAYS +10.0 mΩ MAX.CHG. +5.7 mΩ MAX.CHG.GR 112 –Au (50) @7 DAYS +10.0 mΩ MAX.CHG. +14.6 mΩ MAX.CHG.GR 113 –Au (10) @7 DAYS +10.0 mΩ MAX.CHG. +3.3 mΩ MAX.CHG.GR 114 –Au (10) @7 DAYS +10.0 mΩ MAX.CHG. +4104.3 mΩ MAX.CHG.GR 115 –Au (30) @7 DAYS +10.0 mΩ MAX.CHG. +3.8 mΩ MAX.CHG.GR 116 –Au (30) @7 DAYS +10.0 mΩ MAX.CHG. +184.5 mΩ MAX.CHG.

1 CYCLE

GR 111 –Au (50) NO DAMAGE PASSEDGR 112 –Au (50) NO DAMAGE PASSEDGR 113 –Au (10) NO DAMAGE PASSEDGR 114 –Au (10) NO DAMAGE PASSEDGR 115 –Au (30) NO DAMAGE PASSEDGR 116 –Au (30) NO DAMAGE PASSED

LLCR

GR 111 –Au (50) +10.0 mΩ MAX.CHG. +3.1 mΩ MAX.CHG.GR 112 –Au (50) +10.0 mΩ MAX.CHG. +3.8 mΩ MAX.CHG.GR 113 –Au (10) +10.0 mΩ MAX.CHG. +3.0 mΩ MAX.CHG.GR 114 –Au (10) +10.0 mΩ MAX.CHG. +16.3 mΩ MAX.CHG.GR 115 –Au (30) +10.0 mΩ MAX.CHG. +7.7 mΩ MAX.CHG.GR 116 –Au (30) +10.0 mΩ MAX.CHG. +5.1 mΩ MAX.CHG.

MFG – MATED

GR 111 –Au (50) @14 DAYS NO DAMAGE PASSEDGR 112 –Au (50) @14 DAYS NO DAMAGE PASSEDGR 113 –Au (10) @14 DAYS NO DAMAGE PASSEDGR 114 –Au (10) @14 DAYS NO DAMAGE PASSEDGR 115 –Au (30) @14 DAYS NO DAMAGE PASSEDGR 116 –Au (30) @14 DAYS NO DAMAGE PASSED

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DATA SUMMARY -continued

TEST REQUIREMENT RESULT

LLCR

GR 111 –Au (50) @14 DAYS +10.0 mΩ MAX.CHG. +2.5 mΩ MAX.CHG.GR 112 –Au (50) @14 DAYS +10.0 mΩ MAX.CHG. +3.7 mΩ MAX.CHG.GR 113 –Au (10) @14 DAYS +10.0 mΩ MAX.CHG. +3.0 mΩ MAX.CHG.GR 114 –Au (10) @14 DAYS +10.0 mΩ MAX.CHG. +14.4 mΩ MAX.CHG.GR 115 –Au (30) @14 DAYS +10.0 mΩ MAX.CHG. +1.4 mΩ MAX.CHG.GR 116 –Au (30) @14 DAYS +10.0 mΩ MAX.CHG. (4) mΩ MAX.CHG.

( ) indicates the number of opens

1 CYCLE

GR 111 –Au (50) NO DAMAGE PASSEDGR 112 –Au (50) NO DAMAGE PASSEDGR 113 –Au (10) NO DAMAGE PASSEDGR 114 –Au (10) NO DAMAGE PASSEDGR 115 –Au (30) NO DAMAGE PASSEDGR 116 –Au (30) NO DAMAGE PASSED

LLCR

GR 111 –Au (50) +10.0 mΩ MAX.CHG. +3.1 mΩ MAX.CHG.GR 112 –Au (50) +10.0 mΩ MAX.CHG. +7.6 mΩ MAX.CHG.GR 113 –Au (10) +10.0 mΩ MAX.CHG. +5.4 mΩ MAX.CHG.GR 114 –Au (10) +10.0 mΩ MAX.CHG. +12.7 mΩ MAX.CHG.GR 115 –Au (30) +10.0 mΩ MAX.CHG. +6.2 mΩ MAX.CHG.GR 116 –Au (30) +10.0 mΩ MAX.CHG. +26.0 mΩ MAX.CHG.

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EQUIPMENT LIST

ID# Next Cal Last Cal Equipment Name Manufacturer Model # Serial # Accuracy Freq.Cal

102 1/18/2008 1/4/2007 Data Acquisition Unit Hewlett Packard 3421A 2338A02027 ±. 5 %Of Indicated 12mon207 12/6/2008 12/6/2007 Micro-Ohm Meter Keithley Co. 580 438208 See Cal Cert 12mon208 Analyzer Columbia Scientific SA285E JC006 See Manual N/A280 2/7/2008 2/7/2007 Micro-Ohm Meter Keithley Instr. 580 477845 See Cal Cert 12mon297 11/7/2008 11/7/2007 Micro-Ohm Meter Keithley Instr. 580 485414 See Cal Cert 12mon299 Oxidant Monitor Mast Co. 1724 14281 See Manual N/A323 Computer Legatech 286-12 N/A N/A N/A436 Gas Regulator Liquid Carboinc Co. 702-S-3 392838 N/A N/A510 Regulator Liquid Carbonic SGS 160C M2 42366 N/A N/A525 Gas Regulator Superior Co. 5113A 350218 See Owners Manual N/A543 12/21/2008 12/21/2007 Analytical Balance Ohaus Co. AP250D MO9198 ± .4mg 12mon558 Computer ARC Elect. P111-450 274B031586 N/A N/A563 MFG Control Pan Contech Research N/A N/A N/A Ea Test601 Computer A.M.I. P111-450 082714 N/A N/A673 8/7/2008 8/7/2007 Microohm Meter Keithley Co. 580 0681911 See Cal Cert 12 mon.677 10/5/2008 10/5/2007 Microohm Meter Keithley Co. 580 0685122 See Cal Cert 12 mon681 Computer ARC Co. P166 N/A N/A N/A1015 11/14/2008 11/14/2007 Temp. Humid. Transmitter General Eastern 850-232-5 00278 ± 2%RH 6mon1027 Computer ARC Co. Pent.133 026871 N/A N/A1105 Elect.Liquid Level Control Cole Parmer 7187 15239 N/A N/A1276 Computer ARC.Co. Pent-450 N/A N/A N/A1323 Air Dryer Balston 75-20 7520-1076 N/A N/A1370 Press Stand T.I. DT500 27 N/A N/A1540 MFG Chamber Contech Research 5 CU. FT N/A N/A

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TEST RESULTS

GROUP A

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PROJECT NO.: 207865 SPECIFICATION: EIA-364-23------------------------------------------------------------PART NO.: See page 5 PART DESCRIPTION: Gold Plated Conn.------------------------------------------------------------SAMPLE SIZE: 48 connectors TECHNICIAN: BE, DH, DAM, RLJ------------------------------------------------------------START DATE: 12/13/07 COMPLETE DATE: 1/7/08------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 20%------------------------------------------------------------EQUIPMENT ID#: 207, 280, 297, 323, 558, 601, 673, 677, 681,

1276------------------------------------------------------------LOW LEVEL CIRCUIT RESISTANCE (LLCR)

PURPOSE:

1. To evaluate contact resistance characteristics of thecontact systems under conditions where applied voltages andcurrents do not alter the physical contact interface andwill detect oxides and films which degrade electricalstability. It is also sensitive to and may detect thepresence of fretting corrosion induced by mechanical orthermal environments as well as any significant loss ofcontact pressure.

2. This attribute was monitored after each preconditioningand/or test exposure in order to determine said stabilityof the contact systems as they progress through theapplicable test sequences.

3. The electrical stability of the system is determined bycomparing the initial resistance value to that observedafter a given test exposure. The difference is the changein resistance occurring whose magnitude establishes thestability of the interface being evaluated.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 23 with the following conditions:

2. Test Conditions:

a) Test Current : 100 milliamps maximumb) Open Circuit Voltage : 20 millivoltsc) No. of Positions Tested : 25 per test sample

3. The points of application are shown in Figure #2.

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REQUIREMENTS:

Low level circuit resistance shall be measured and recorded.

------------------------------------------------------------RESULTS:

The following is a summary of the data observed:

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

GP #111 Au(50)

4-25 21.3 23.1 19.94-26 21.7 22.9 20.44-27 21.7 23.8 20.54-28 21.8 24.3 20.54-29 22.1 24.2 20.54-30 21.7 24.8 20.24-31 21.4 23.1 20.14-32 21.7 23.7 19.9

GP #112 Au(50)

5-33 23.0 24.3 21.95-34 22.9 24.0 22.15-35 22.5 23.7 21.85-36 22.6 23.8 21.75-37 22.2 23.2 21.65-38 22.5 23.8 21.35-39 22.4 23.3 21.75-40 22.7 24.5 21.7

GP #113 Au(10)

6-41 23.4 24.1 22.66-42 23.9 25.0 23.36-43 23.5 25.0 22.66-44 22.9 24.4 22.06-45 23.3 24.1 22.46-46 23.5 24.4 22.76-47 23.8 24.6 22.76-48 23.2 24.6 22.0

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RESULTS: -continued

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Sample ID# Avg. Max. Min.

GP #114 Au(10)

7-49 23.3 25.0 22.47-50 23.9 25.5 22.77-51 23.5 24.4 22.57-52 23.3 24.5 22.17-53 23.7 25.8 22.37-54 24.0 26.3 23.27-55 22.7 23.8 21.87-56 23.1 24.1 22.3

GP #115 Au(30)

8-57 22.9 24.3 21.78-58 22.3 23.6 21.08-59 22.5 23.9 21.38-60 22.8 24.9 22.08-61 22.4 23.4 21.28-62 22.2 23.7 21.08-63 23.2 24.5 22.58-64 22.4 23.6 21.5

GP #116 Au(30)

9-65 22.6 25.2 21.49-66 22.3 23.5 21.29-67 22.8 24.3 21.69-68 22.5 23.5 21.49-69 22.0 23.3 21.29-70 23.2 24.0 22.49-71 22.2 23.9 20.99-72 22.2 23.9 21.2

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RESULTS: -continued

2. See the following data files for individual data points.

Connector Variation File Numbers

Group 111 –Au (50) 20786501 through 20786508Group 112 –Au (50) 20786509 through 20786516Group 113 –Au (10) 20786517 through 20786524Group 114 –Au (10) 20786525 through 20786532Group 115 –Au (30) 20786533 through 20786540Group 116 –Au (30) 20786541 through 20786548

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FIGURE #2

TYPICAL LLCR SET UP

+V +I

Connector pair

-V -I

Buss wires are soldered to the 2 PTH’s

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PROJECT NO.: 207865 SPECIFICATION: EIA-364------------------------------------------------------------PART NO.: See page 5 PART DESCRIPTION: Gold Plated Conn.------------------------------------------------------------SAMPLE SIZE: 48 connectors TECHNICIAN: BE, DH, DAM, RLJ------------------------------------------------------------START DATE: 12/13/07 COMPLETE DATE: 12/14/07------------------------------------------------------------ROOM AMBIENT: 23°C RELATIVE HUMIDITY: 20%------------------------------------------------------------EQUIPMENT ID#: 1323, 1370------------------------------------------------------------DURABILITY

PURPOSE:

1. This is a preconditioning sequence which is used to inducethe type of wear on the contacting surfaces which may occurunder normal service conditions. The connectors are matedand unmated a predetermined number of cycles. Uponcompletion, the units being evaluated are exposed to theenvironments as specified to assess any impact onelectrical stability resulting from wear or other weardependent phenomenon.

2. This type or preconditioning sequence is also used tomechanically stress the connector system as would normallyoccur in actual service. This sequence in conjunction withother tests is used to determine if a significant loss ofcontact pressure occurs from said stresses which in turn,may result in an unstable electrical condition to exist.

------------------------------------------------------------PROCEDURE:

1. The test was performed in accordance with EIA 364, TestProcedure 09.

2. Test Conditions:

a) No. of Cycles : GP #111 5X GP #112 25XGP #113 5X GP #114 25XGP #115 5X GP #116 25X

3. The samples were cycled using an X Y Table and a drillpress stand.

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PROCEDURE -continued:

4. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of physical damage to the testsamples so tested.

2. The change in low level circuit resistance shall not exceed+10.0 milliohms.

------------------------------------------------------------RESULTS:

1. There was no evidence of physical damage to the testsamples as tested.

2. The following is a summary of the data observed:

CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max.Sample ID# Change Change

GP #111 Au(10)

4-25 +0.5 +2.54-26 +0.6 +2.64-27 -0.4 +1.34-28 +0.4 +2.24-29 +0.7 +2.34-30 +0.4 +1.24-31 -0.2 +2.84-32 -0.4 +1.4

GP #112 Au(30)

5-9 -0.1 +0.45-10 -1.0 +0.55-11 -1.2 +2.45-12 -0.7 +0.05-13 -0.4 +0.05-14 -0.3 +0.85-15 -0.4 +1.35-16 -1.2 +0.4

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RESULTS: -continued

CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max.Sample ID# Change Change

GP #113 Au(30)

6-41 -0.1 +1.06-42 -0.3 +0.96-43 -0.7 +0.46-44 -0.4 +0.26-45 -0.1 +1.16-46 -0.2 +0.96-47 +0.0 +1.16-48 -0.2 +2.1

GP #111 Au(10)

7-49 +0.7 +2.17-50 +0.6 +2.67-51 -0.4 +1.37-52 +0.4 +2.27-53 +0.7 +2.37-54 +0.4 +1.27-55 -0.2 +2.87-56 -0.4 +1.4

GP #112 Au(30)

8-57 -0.1 +0.48-58 -1.0 +0.58-59 -1.2 +2.48-60 -0.7 +0.08-61 -0.4 +0.08-62 -0.3 +0.88-63 -0.4 +1.38-64 -1.2 +0.4

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Test Laboratory

RESULTS: -continued

CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max.Sample ID# Change Change

GP #111 Au(10)

9-65 +0.7 +2.19-66 +0.6 +2.69-67 -0.4 +1.39-68 +0.4 +2.29-69 +0.7 +2.39-70 +0.4 +1.29-71 -0.2 +2.89-72 -0.4 +1.4

2. See the following data files for individual data points.

Connector Series File Numbers

Group 111 –Au (50) 20786501 through 20786508Group 112 –Au (50) 20786509 through 20786516Group 113 –Au (10) 20786517 through 20786524Group 114 –Au (10) 20786525 through 20786532Group 115 –Au (30) 20786533 through 20786540Group 116 –Au (30) 20786541 through 20786548

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PROJECT NO.: 207865 SPECIFICATION: EIA-364-65------------------------------------------------------------PART NO.: See page 5 PART DESCRIPTION: Gold Plated Conn.------------------------------------------------------------SAMPLE SIZE: 48 connectors TECHNICIAN: WC------------------------------------------------------------START DATE: 12/14/07 COMPLETE DATE: 1/4/08------------------------------------------------------------ROOM AMBIENT: 21°C RELATIVE HUMIDITY: 28%------------------------------------------------------------EQUIPMENT ID#: 102, 208, 299, 436, 510, 525, 543, 563, 1015,

1027, 1105, 1323, 1540------------------------------------------------------------MIXED FLOWING GAS

PURPOSE:

1. To determine the impact on electrical stability of contactinterfaces when the test samples are exposed to a mixedflowing gas environment. Said environment is based onfield data simulating typical, severe, non-benignenvironments. Said exposure is indicative of expectedbehavior in the field.

2. Mixed flowing gas tests (MFG) are environmental testprocedures whose primary purpose is to evaluate productperformance under simulated storage or operating (field)conditions. For parts involving plated contact surfaces,such tests are also used to measure the effect of platingdegradation (due to the environment) on the electrical anddurability properties of a contact or connector system.The specific test conditions are usually chosen so as tosimulate, in the test laboratory, the effects of certainrepresentative field environments or environmental severitylevels on standard metallic surfaces.

------------------------------------------------------------PROCEDURE:

1. The test environment was performed in accordance withEIA 364, Test Procedure 65 with the following conditions.

-continued on next page.

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PROCEDURE: -continued

2. Environmental Conditions:

a) Temperature : 30°C ± 1°Cb) Relative Humidity : 70% ± 2%c) C12 : 10 ± 3 ppbd) NO2 : 200 ± 50 ppbe) H2S : 10 ± 5 ppbf) SO2 : 100 ± 20 ppbg) Exposure Time : 14 daysh) Mating Conditions : First 7 days - unmated

: Second 7 days -mated

3. The test chamber was allowed to stabilize at the specifiedconditions indicated.

4. After stabilization, the test samples and control couponswere placed in the chamber such that they were no closerthan 2.0" from each other and/or the chamber walls.

5. The test samples were handled in a manner so as not todisturb the contact interface.

6. After placement of the test samples in the chamber, it wasallowed to re-stabilize and adjusted as required tomaintain the specified concentrations and conditions.

7. The test chamber was monitored periodically during theexposure period to assure the environmental conditions asspecified were maintained.

8. All subsequent variable testing was performed in accordancewith the procedures previously indicated.

------------------------------------------------------------REQUIREMENTS:

1. There shall be no evidence of damage or corrosion to thetest samples as exposed which will cause mechanical orelectrical malfunction of the said samples.

2. The change in low level circuit resistance shall not exceed+10.0 milliohms.

------------------------------------------------------------RESULTS:

1. Some evidence of corrosion was observed and noted on allgroups, photographs were taken however they were notidentified. See Figure #’s 3 through 12.

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RESULTS: -continued

2. The following is a summary of the data observed followingthe 7 days unmated portion of the exposure:

MAXIMUM CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max. Avg. Max.Sample ID# Chg. Chg. Chg. Chg.GP #111 Au(50)

@ 7 Days 1 Cycle

4-25 +0.5 +2.5 +0.2 +3.14-26 -0.5 +1.4 -0.8 +0.84-27 -0.6 +0.3 -0.3 +1.14-28 -0.2 +5.7 -0.8 +0.54-29 -1.0 +0.8 -1.0 +1.14-30 -0.4 +1.2 -0.4 +1.54-31 +0.0 +1.4 +0.0 +1.04-32 -0.8 +0.9 -0.7 +1.3

GP #112 Au(50)@ 7 Days 1 Cycle

5-33 -0.1 +1.4 -0.1 +1.85-34 +0.0 +1.5 +0.3 +2.25-35 +1.4 +7.5 +0.4 1.15-36 +0.5 +1.9 +0.3 +3.75-37 +1.3 +14.6 +0.4 +1.25-38 -0.1 +1.4 +0.0 +1.45-39 +0.5 +1.7 +1.0 +3.85-40 -0.1 +2.9 +0.1 +1.5

GP #113 Au(10)@ 7 Days 1 Cycle

6-41 +0.3 +2.1 +0.5 +1.36-42 +0.4 +1.9 +0.2 +1.96-43 +0.2 +1.6 +0.7 +2.26-44 +0.4 +1.2 +0.3 +1.16-45 +0.3 +2.8 +0.4 +3.06-46 +0.2 +1.9 +0.2 +1.36-47 +0.2 +3.3 +0.2 +2.36-48 +0.1 +1.2 +0.2 +1.8

-continued on next page.

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RESULTS: -continued

MAXIMUM CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max. Avg. Max.Sample ID# Chg. Chg. Chg. Chg.GP #114 Au(10)

@ 7 Days 1 Cycle

7-49 +0.8 +2.4 +0.5 +2.27-50 +0.3 +2.1 +0.1 +1.37-51 +0.5 +3.0 +0.2 +2.27-52 +0.3 +1.0 +0.4 +1.77-53 +165.1 +4104.3 +1.2 +16.37-54 +0.9 +2.7 +0.6 +1.67-55 +0.8 +3.5 +0.6 +2.37-56 +0.8 +2.5 +0.9 +3.0

GP #115 Au(30)@ 7 Days 1 Cycle

8-57 -0.5 +1.3 -0.3 +0.68-58 +0.2 +3.8 +2.5 +7.78-59 -0.3 +0.8 -0.3 +0.98-60 +0.7 +1.2 +0.6 +1.38-61 -0.3 +1.3 -0.4 +0.88-62 +0.4 +1.6 +0.0 +0.68-63 +0.6 +1.8 +0.7 +1.78-64 +0.1 +0.9 +0.1 +1.3

GP #116 Au(30)@ 7 Days 1 Cycle

9-65 +1.4 +20.3 +0.3 +2.29-66 +0.2 +2.1 +0.2 +1.89-67 +0.2 +1.6 +0.1 +1.59-68 +0.1 +1.6 +0.0 +1.89-69 +0.4 +2.2 +0.2 +1.09-70 +0.9 +12.4 +0.4 +1.79-71 +44.1 +185.5 +0.6 +1.79-72 +1.6 +12.5 +1.0 +5.1

-continued on next page.

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RESULTS: -continued

3. The following is a summary of the data observed followingthe 7 additional days mated portion of the exposure.

MAXIMUM CHANGE INLOW LEVEL CIRCUIT RESISTANCE

(Milliohms)

Avg. Max. Avg. Max.Sample ID# Chg. Chg. Chg. Chg.

GP #111 Au(50)@ 14 Days 1 Cycle

4-25 +0.0 +2.5 +0.8 +3.14-26 -0.8 +0.7 -0.5 +1.44-27 -0.4 +0.8 -0.5 +0.64-28 -1.0 +0.3 -0.2 +2.64-29 -1.2 +0.9 -0.6 +1.34-30 -0.6 +1.1 -0.1 +1.24-31 +0.0 +1.4 +0.3 +2.04-32 -0.8 +1.3 -0.3 +0.9

GP #112 Au(50)@ 14Days 1 Cycle

5-33 -0.2 +1.7 +0.4 +2.15-34 +0.0 +1.5 +0.7 +3.15-35 +0.2 +1.1 +1.0 +5.55-36 +0.0 +1.8 +1.5 +5.35-37 +0.2 +1.0 +1.0 +2.45-38 -0.2 +1.1 +0.7 +2.95-39 +0.9 +3.7 +1.7 +7.65-40 -0.2 +1.4 +0.9 +7.0

GP #113 Au(10)@ 14 Days 1 Cycle

6-41 +0.2 +1.2 +0.8 +2.16-42 +0.0 +0.9 +0.1 +1.16-43 +0.7 +1.9 +0.3 +1.26-44 +0.1 +1.3 +0.7 +2.46-45 +0.3 +3.0 +0.8 +5.46-46 +0.5 +1.1 +1.6 +5.06-47 +0.3 +2.6 +0.1 +4.26-48 +0.4 +2.5 +1.1 +3.3

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RESULTS: -continuedMAXIMUM CHANGE IN

LOW LEVEL CIRCUIT RESISTANCE(Milliohms)

Avg. Max. Avg. Max.Sample ID# Chg. Chg. Chg. Chg.

GP #114 Au(10)@ 14 Days 1 Cycle

7-49 +0.7 +1.8 +1.0 +6.27-50 +0.1 +1.5 +0.9 +6.47-51 +0.2 +2.6 +1.0 +6.57-52 +0.1 +1.4 +0.4 +3.37-53 +0.9 +14.4 +2.0 +12.77-54 +0.4 +1.3 +1.0 +3.67-55 +0.6 +2.5 +1.8 +8.67-56 +0.5 +1.8 +1.0 +5.9

GP #115 Au(30)@ 14Days 1 Cycle

8-57 -0.3 +0.6 +0.3 +2.98-58 +0.0 +1.4 +1.0 +6.28-59 -0.4 +0.6 +0.3 +5.28-60 -0.3 +1.4 +0.4 +3.28-61 -0.5 +0.7 -0.1 +1.18-62 -0.2 +0.7 +0.4 +1.58-63 +0.0 +1.3 +0.7 +3.58-64 -0.1 +0.5 +0.5 +1.9

GP #116 Au(30)@ 14 Days 1 Cycle

9-65 +0.4 +3.0 +1.6 +5.99-66 +0.2 +1.8 +0.8 +4.59-67 -0.1 +1.2 +0.7 +4.29-68 +0.0 +1.8 +0.5 +2.09-69 +0.1 +1.1 +0.7 +2.69-70 +2.8 (4) +3.5 +26.09-71 +0.3 +1.3 +1.1 +3.69-72 +0.7 +3.2 +1.7 +7.0

Note: ( ) indicates the number of opens

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RESULTS: -continued

4. See the following data files for individual data points.

Connector Series File Numbers

Group 108 –Au (50) 20786501 through 20786508Group 109 –Au (50) 20786509 through 20786516Group 110 –Au (10) 20786517 through 20786524Group 111 –Au (10) 20786525 through 20786532Group 112 –Au (30) 20786533 through 20786540Group 113 –Au (30) 20786541 through 20786548

5. Five copper coupons were placed in the chamber. Uponremoval said coupons were evaluated via weight gaintechnique with the following results:

WEIGHT GAIN (µgm/cm2/Day)

Coupon No. Unmated Mated

1 13 14+2 15 143 14+ 144 14 13+5 13+ 13

Requirement: 12 to 16 µgm/cm2/Day

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FIGURE #3

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TR#207865, REV.1.0 30 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #4

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TR#207865, REV.1.0 31 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #5

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TR#207865, REV.1.0 32 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #6

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TR#207865, REV.1.0 33 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #7

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TR#207865, REV.1.0 34 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #8

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TR#207865, REV.1.0 35 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #9

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TR#207865, REV.1.0 36 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #10

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TR#207865, REV.1.0 37 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

FIGURE #11

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TR#207865, REV.1.0 38 of 144 Contech ResearchAn Independent Test and Research Laboratory

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FIGURE #12

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LLCR DATA FILES

FILE NUMBERS

Group 111 Group 112 Group 113

20786501 20786509 2078651720786502 20786510 2078651820786503 20786511 2078651920786504 20786512 2078652020786505 20786513 2078652120786506 20786514 2078652220786507 20786515 2078652320786508 20786516 20786524

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LLCR DATA FILES

FILE NUMBERS

Group 114 Group 115 Group 116

20786501 20786509 2078651720786502 20786510 2078651820786503 20786511 2078651920786504 20786512 2078652020786505 20786513 2078652120786506 20786514 2078652220786507 20786515 2078652320786508 20786516 20786524

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LLCR DATA FILES

GROUP 111

20786501 Through 20786508

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Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-25Product: QSE/QTE Connector File #: 20786501Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 20.5 2.5 0.4 1.9 1.6 1.92 21.9 0.6 -0.3 -0.5 -0.5 0.33 22.0 -0.3 -1.0 -0.4 -0.4 0.04 22.9 -0.9 -1.9 -1.9 -2.0 1.05 23.1 -0.6 -0.4 -1.4 -1.5 -0.66 22.3 1.5 1.8 -0.4 -0.1 2.07 20.6 0.0 1.3 0.3 0.3 0.88 20.0 -0.2 1.1 0.1 -0.1 0.59 19.9 0.2 1.5 0.3 0.3 0.810 21.5 -0.9 2.5 -1.0 -1.2 0.611 20.6 -0.3 -0.2 -0.1 -0.2 0.112 21.0 -0.3 -0.1 -0.2 -0.4 -0.213 20.8 0.5 1.1 0.4 -0.1 0.514 20.9 0.5 2.5 2.8 1.0 -0.415 21.7 -0.5 -0.9 -0.7 -0.9 -0.916 20.2 0.5 0.6 1.3 1.4 0.917 21.6 -0.6 1.2 0.0 -0.5 -0.418 21.3 0.1 0.1 1.8 0.4 1.819 21.3 0.6 0.0 3.1 2.5 0.320 21.7 2.1 0.2 0.0 0.0 3.121 21.3 0.5 0.2 0.3 0.3 2.022 21.2 2.3 1.1 0.3 0.8 1.323 22.0 1.7 1.2 -0.8 -0.7 0.324 20.9 1.8 0.4 -0.2 -0.2 1.325 21.0 0.9 0.8 0.8 0.7 2.0

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File #: 20786501

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.1 2.5 2.5 3.1 2.5 3.1 MIN 19.9 -0.9 -1.9 -1.9 -2.0 -0.9 AVG 21.3 0.5 0.5 0.2 0.0 0.8 STD 0.8 1.0 1.1 1.2 1.0 1.0 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-26Product: QSE/QTE Connector File #: 2086502Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.1 -0.6 -0.8 -0.3 -0.6 -0.32 22.1 -1.2 -0.9 -0.8 -0.9 -1.03 22.1 -0.7 -0.5 -1.3 -1.4 -0.94 22.6 -0.2 -0.5 -1.2 -1.4 -1.25 22.1 -0.6 -0.7 -1.4 -1.4 -0.76 22.1 -0.5 -0.8 -1.5 -1.7 -1.17 20.6 0.5 0.7 0.0 0.2 1.48 20.9 -0.3 0.4 -0.3 -0.2 -0.29 20.6 0.4 0.3 0.0 0.0 1.310 20.9 -0.4 0.8 -0.6 -0.5 -0.111 20.8 -0.2 1.4 0.1 0.2 0.712 21.2 -0.6 -0.4 -0.2 -0.1 0.413 21.9 -1.2 -1.3 -1.1 -1.1 -1.214 22.3 -1.5 -1.1 -1.2 -1.3 -0.915 22.0 -1.3 -1.4 -1.2 -1.2 -1.316 20.9 -0.4 0.5 0.8 0.1 0.017 22.9 -2.1 -1.9 -1.9 -2.1 -2.118 21.2 -0.2 -0.3 0.3 0.7 -0.319 21.4 -0.3 -0.4 -0.2 -0.1 -0.520 20.4 0.8 1.0 0.5 0.6 0.921 22.4 0.3 -0.9 -1.3 -1.4 -0.622 22.7 -1.8 -2.0 -2.4 -2.3 -1.923 21.5 -0.3 -0.7 -0.8 -0.8 -0.724 22.8 -1.1 -1.8 -2.3 -2.3 -1.825 21.6 0.5 -0.3 -0.5 -0.6 -0.5

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File #: 2086502

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 22.9 0.8 1.4 0.8 0.7 1.4 MIN 20.4 -2.1 -2.0 -2.4 -2.3 -2.1 AVG 21.7 -0.5 -0.5 -0.8 -0.8 -0.5 STD 0.8 0.7 0.9 0.8 0.9 0.9 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-27Product: QSE/QTE Connector File #: 20786503Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.6 -1.2 -1.7 -0.4 -0.6 -1.52 21.4 0.1 0.1 0.0 -0.2 0.13 22.5 -1.1 -1.3 -0.9 -1.0 -0.64 23.8 -1.9 -2.2 -2.1 -2.2 -2.15 23.2 -1.4 -2.0 -1.7 -1.7 -1.46 22.9 -1.5 -1.5 -1.3 -1.3 -1.07 21.4 -0.7 -0.8 -0.8 -0.9 -0.88 20.8 -0.2 -0.4 -0.2 -0.2 -0.19 20.5 -0.1 0.3 0.7 0.7 0.210 20.5 -0.3 0.2 0.4 0.3 0.611 20.6 0.0 0.2 0.3 0.3 0.212 21.3 -0.8 -0.7 -1.1 -1.1 -0.313 20.8 0.1 0.2 0.4 0.3 0.514 21.2 -0.2 0.0 -0.3 -0.3 -0.215 21.2 -0.3 -0.4 0.2 0.2 -0.116 21.3 -0.3 -0.4 0.3 0.3 -0.517 21.5 -0.7 -0.3 0.6 0.4 -0.918 20.9 0.0 -0.1 1.1 0.8 0.019 21.0 0.4 0.2 0.4 0.4 0.220 21.7 0.0 -0.7 -0.5 -0.6 -0.321 21.9 0.7 -0.3 -0.2 -0.5 -0.322 23.6 -1.8 -2.1 -2.0 -2.2 -2.123 21.2 0.5 -0.2 -0.1 -0.2 -0.224 21.9 -0.1 -0.9 -1.2 -1.3 -0.625 21.5 0.3 -0.3 0.2 -0.1 -0.5

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TR#207865, REV.1.0 47 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786503

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.8 0.7 0.3 1.1 0.8 0.6 MIN 20.5 -1.9 -2.2 -2.1 -2.2 -2.1 AVG 21.7 -0.4 -0.6 -0.3 -0.4 -0.5 STD 1.0 0.7 0.8 0.9 0.9 0.7 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 48: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 48 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-28Product: QSE/QTE Connector File #: 20786504Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.8 -0.8 0.5 0.3 0.1 0.72 23.2 -2.6 -1.6 -1.4 -1.9 -2.13 23.3 -1.6 -1.3 -1.6 -1.9 -1.84 22.1 -0.9 -1.2 -1.2 -1.3 -1.05 23.0 -1.5 -1.3 -1.6 -2.2 -1.06 24.2 -2.8 -3.0 -2.5 -2.6 -3.17 21.0 -0.3 -0.4 -0.7 -0.5 0.98 20.8 0.1 0.6 -0.1 -0.1 0.99 20.5 0.1 0.7 -0.8 -0.7 1.010 20.7 0.0 0.3 -0.4 -0.3 0.511 20.6 0.3 5.7 0.2 0.2 2.612 21.0 -0.1 0.3 -0.4 -0.3 1.513 21.7 -1.2 -0.3 -0.7 -0.9 -0.114 21.0 -0.1 0.4 0.3 0.1 0.215 20.8 0.1 0.5 0.1 0.0 1.116 22.7 -2.2 -1.4 -1.4 -1.6 -1.117 22.2 -1.5 -1.2 -1.1 -1.3 -0.418 21.0 -0.1 0.6 0.4 0.3 0.019 21.1 -0.1 -0.2 0.5 0.2 -0.220 24.3 -2.8 -3.1 -3.0 -3.1 -3.121 20.8 0.3 0.6 -0.2 -0.2 1.022 20.9 -0.2 0.4 0.0 -0.1 1.023 21.6 -0.2 0.7 -1.1 -1.3 -0.124 22.7 -1.0 -1.4 -2.4 -2.6 -1.625 21.9 -0.4 -1.0 -1.9 -1.8 -0.6

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TR#207865, REV.1.0 49 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786504

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.3 0.3 5.7 0.5 0.3 2.6 MIN 20.5 -2.8 -3.1 -3.0 -3.1 -3.1 AVG 21.8 -0.8 -0.2 -0.8 -1.0 -0.2 STD 1.1 1.0 1.7 1.0 1.0 1.4 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 50: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 50 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-29Product: QSE/QTE Connector File #: 20786505Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 20.9 0.2 0.2 1.1 0.3 1.02 21.4 -0.8 -0.2 -0.1 -0.7 -0.13 23.0 -1.7 -1.8 -1.7 -2.3 -1.44 22.5 -0.9 -1.2 -1.4 -1.5 -1.35 24.2 -1.1 -2.8 -2.7 -3.0 -1.96 24.0 -2.4 -2.5 -2.4 -2.8 -2.27 20.8 -0.4 0.0 -0.5 -0.5 0.08 21.5 -1.1 -0.6 -1.5 -1.5 -0.39 21.0 -0.5 -0.4 -0.8 -1.0 -0.510 20.8 -0.2 0.8 -0.2 -0.3 -0.311 21.5 -1.0 -0.9 -0.8 -0.8 -0.512 21.2 -0.5 0.1 0.0 -0.4 0.013 22.0 -1.5 -1.2 -1.7 -1.9 -0.914 21.5 -0.6 -1.1 -0.5 -0.6 -0.415 23.1 -2.2 -2.7 -1.7 -2.0 -2.116 23.0 -2.2 -2.3 -1.4 -1.7 -2.017 22.2 -1.4 -1.4 -1.3 -1.5 -1.218 21.6 -0.5 -0.2 -0.5 -0.4 -0.319 21.0 0.4 0.2 0.3 0.4 1.320 23.2 -1.3 -2.4 -2.2 -2.3 -1.321 22.8 -1.8 -1.3 -1.3 -1.5 -0.622 22.7 -0.9 -1.4 -1.5 -1.6 -0.223 23.0 -1.5 -2.1 -2.1 -2.0 -0.424 21.7 -0.1 -0.8 -0.7 -0.9 -0.625 20.5 0.7 0.2 1.1 0.9 0.5

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TR#207865, REV.1.0 51 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786505

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.2 0.7 0.8 1.1 0.9 1.3 MIN 20.5 -2.4 -2.8 -2.7 -3.0 -2.2 AVG 22.1 -0.9 -1.0 -1.0 -1.2 -0.6 STD 1.0 0.8 1.0 1.0 1.0 0.9 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 52: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 52 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-30Product: QSE/QTE Connector File #: 20786506Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5x MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.1 0.3 0.2 1.5 0.6 1.02 21.6 0.0 -0.4 0.8 0.3 0.23 21.5 -0.1 -0.1 -0.1 -0.3 1.24 22.1 -0.4 -0.7 -0.5 -0.7 -0.45 22.8 0.3 -1.6 -1.3 -1.5 -0.86 22.1 0.1 -0.9 -0.8 -0.8 -0.77 20.2 0.6 0.6 0.7 0.9 0.88 20.9 -0.7 -0.1 -0.5 -0.6 0.19 20.6 -0.3 0.2 0.2 0.0 0.010 21.2 -0.9 -0.5 -0.5 -0.6 -0.411 20.7 -0.3 0.3 -0.1 -0.3 0.112 20.6 -0.3 0.3 0.4 -0.3 0.513 21.0 -0.3 0.0 0.2 -0.3 0.814 20.9 -0.2 0.1 -0.6 -0.7 -0.215 21.5 -0.8 -0.5 -1.1 -1.4 -0.216 21.1 0.1 0.5 -0.2 -0.6 -0.117 21.8 -0.7 -0.5 -0.5 -0.8 -0.318 21.0 0.0 0.5 0.6 0.4 0.819 20.7 0.2 1.2 1.1 1.1 1.220 24.8 -2.9 -2.9 -3.0 -3.5 -3.021 23.6 -2.0 -1.4 -1.8 -2.0 -2.222 23.3 -1.3 -1.7 -1.5 -1.7 -2.023 23.0 -1.8 -1.8 -1.7 -1.9 0.224 22.5 -0.8 -1.2 -0.9 -1.1 -0.225 20.9 0.6 0.1 0.3 0.2 0.7

Page 53: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 53 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786506

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5x MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.8 0.6 1.2 1.5 1.1 1.2 MIN 20.2 -2.9 -2.9 -3.0 -3.5 -3.0 AVG 21.7 -0.5 -0.4 -0.4 -0.6 -0.1 STD 1.1 0.8 0.9 1.0 1.0 1.0 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 54: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 54 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-31Product: QSE/QTE Connector File #: 20786507Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.0 -1.9 0.0 -0.1 0.0 0.42 23.0 -1.9 -0.7 -0.9 -1.0 -0.93 21.7 -0.9 0.7 0.8 0.5 0.34 21.5 -0.6 1.4 0.5 0.0 0.05 21.5 -0.7 -0.3 0.0 -0.1 -0.36 22.2 -0.8 0.0 -0.1 -0.2 -0.47 20.3 -0.3 0.1 -0.1 -0.2 -0.18 21.1 -0.7 -0.5 -0.9 -0.9 0.29 20.7 -0.6 0.1 0.1 0.3 0.310 21.3 -1.0 -0.7 -0.5 -0.5 -0.211 20.3 -0.2 0.0 0.2 0.4 0.512 20.6 -0.3 -0.1 0.0 0.1 0.713 20.7 -0.3 0.2 0.3 0.2 0.214 20.1 -0.1 0.3 0.2 0.2 1.415 20.4 -0.1 0.8 0.9 0.9 0.416 20.3 0.2 0.6 1.0 0.8 2.017 21.2 -0.3 0.5 0.8 0.7 1.218 21.4 -0.1 -0.3 -0.1 -0.2 0.219 21.3 -0.1 0.3 0.2 0.1 0.620 21.4 0.4 0.5 0.2 0.2 0.221 21.2 -0.2 -0.2 0.4 0.3 0.722 22.3 -1.0 -0.9 -0.9 -0.9 -0.423 22.3 -0.9 -0.7 -0.9 -0.9 0.024 22.0 0.0 1.2 1.0 1.4 1.925 23.1 -1.2 -1.2 -1.6 -1.6 -1.0

Page 55: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 55 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786507

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.1 0.4 1.4 1.0 1.4 2.0 MIN 20.1 -1.9 -1.2 -1.6 -1.6 -1.0 AVG 21.4 -0.5 0.0 0.0 0.0 0.3 STD 0.9 0.6 0.6 0.7 0.7 0.7 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 56: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 56 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 111 4-32Product: QSE/QTE Connector File #: 20786508Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.1 -0.8 -2.1 -2.5 -2.6 0.32 21.4 -0.5 0.5 0.4 0.4 0.13 23.7 -1.5 -3.1 -2.5 -1.9 -1.54 21.3 -0.6 -0.5 -0.5 -0.6 0.05 23.0 -1.7 -2.2 -2.1 -2.0 -1.56 22.5 -1.2 -1.3 -1.3 -1.5 -0.97 20.0 0.0 0.3 0.2 0.2 0.58 19.9 0.4 0.9 0.2 0.3 0.89 20.6 -0.3 -0.1 -0.4 -0.4 0.210 20.9 -0.7 -0.7 -0.8 -0.9 -0.211 21.2 -1.1 -1.2 -1.6 -1.6 -0.812 20.9 -0.6 -0.7 -0.7 -0.9 0.913 20.6 -0.4 -0.1 -0.1 -0.3 0.314 21.0 -0.6 -0.8 -0.2 -0.4 0.615 21.5 -0.8 -0.9 0.3 0.0 -0.716 20.5 -0.2 0.0 0.5 -0.1 0.017 20.9 -0.5 0.2 1.1 0.4 0.318 22.1 -0.6 -0.9 -0.3 -0.8 0.319 21.0 -0.3 0.4 1.3 1.3 0.620 23.5 -2.6 -1.9 -2.5 -2.5 -1.621 21.8 -0.8 -1.0 -1.3 -1.2 -0.422 23.1 -2.1 -1.7 -2.0 -2.1 -1.423 22.4 -1.7 -1.1 -0.8 -1.2 -1.224 22.5 -1.2 -1.7 -1.7 -1.7 -0.825 22.2 -0.3 -1.1 -0.5 -0.8 -0.8

Page 57: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 57 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786508

Temp ºC 23 23 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 13Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.7 0.4 0.9 1.3 1.3 0.9 MIN 19.9 -2.6 -3.1 -2.5 -2.6 -1.6 AVG 21.7 -0.8 -0.8 -0.7 -0.8 -0.3 STD 1.1 0.7 1.0 1.1 1.0 0.8 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 58: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 58 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

LLCR DATA FILES

GROUP 112

20786509 Through 20786516

Page 59: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 59 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-33Product: QSE/QTE Connector File #: 20786509Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.2 0.1 0.3 1.8 1.2 0.72 22.3 1.9 0.8 1.5 1.7 0.93 22.5 0.2 -0.2 0.3 0.3 0.24 24.2 -1.1 -1.2 -0.7 -0.8 -0.55 23.2 0.4 0.1 0.4 0.4 0.66 23.5 -0.7 -1.3 -0.5 -0.3 0.47 21.9 0.9 0.4 0.4 0.3 1.68 21.9 -0.2 1.2 -0.1 0.0 0.79 22.4 -0.2 -0.4 -0.2 -0.2 2.110 22.1 0.1 1.0 0.4 0.4 1.011 22.3 -0.2 0.2 0.9 0.6 0.012 22.6 0.9 0.5 -0.2 -0.1 -0.413 23.0 0.0 1.0 -0.1 -0.3 0.314 22.6 1.2 1.4 0.8 0.6 0.815 23.2 1.1 0.3 -0.6 -0.8 1.416 23.8 -0.3 -0.1 -1.0 -1.1 -0.217 23.3 0.0 -0.3 -0.5 -0.6 0.018 22.9 -0.4 0.1 -0.1 -0.1 1.819 22.7 1.1 0.4 0.2 0.2 0.320 23.4 -0.8 -0.8 -0.8 -0.7 0.021 23.8 -0.7 -1.5 -1.4 -1.3 -0.422 24.3 -1.5 -1.4 -1.3 -1.2 -1.123 23.5 -0.7 -0.8 -0.7 -0.6 -0.124 23.8 -1.5 -1.8 -0.7 -0.7 -0.425 22.5 -0.4 -0.5 -0.6 -0.8 -0.2

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TR#207865, REV.1.0 60 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786509

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.3 1.9 1.4 1.8 1.7 2.1 MIN 21.9 -1.5 -1.8 -1.4 -1.3 -1.1 AVG 23.0 0.0 -0.1 -0.1 -0.2 0.4 STD 0.7 0.9 0.9 0.8 0.7 0.8 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 61: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 61 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-34Product: QSE/QTE Connector File #: 20786510Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.3 -0.5 0.5 0.6 0.1 0.72 23.5 -0.5 0.5 0.3 0.4 0.93 24.0 -1.3 0.3 0.2 -0.1 0.24 23.3 -0.9 -1.3 0.5 0.0 1.05 22.9 0.1 0.0 0.3 0.2 0.96 23.1 -0.7 -0.2 0.4 0.1 1.47 22.3 -0.2 0.1 0.1 0.0 2.08 22.8 -0.4 -0.3 0.2 0.0 0.49 22.9 -0.9 1.5 0.3 0.3 0.410 22.5 -0.4 0.7 0.7 0.6 0.911 22.6 -0.4 -0.2 -0.5 -0.5 -0.112 22.7 -0.4 -0.1 0.5 0.4 2.313 23.2 -1.1 -0.6 -0.2 -0.5 0.414 22.1 0.2 0.6 0.6 0.3 3.115 22.8 -1.0 0.1 1.2 0.1 0.816 22.9 -0.5 -0.1 0.3 0.0 0.117 22.2 -0.3 0.5 2.2 1.5 1.418 23.5 -0.9 -1.0 -0.6 -0.9 -0.519 23.3 -0.7 -0.7 0.4 -0.1 0.920 22.6 0.0 0.1 0.5 0.4 0.921 22.7 0.0 -0.4 0.1 -0.1 0.322 22.7 -0.2 1.3 0.1 0.2 0.223 23.9 -0.7 -1.0 -0.9 -1.2 -0.524 22.5 0.6 0.6 -0.1 -0.3 0.125 22.7 0.2 -0.9 -0.7 -1.0 -0.2

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TR#207865, REV.1.0 62 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786510

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.0 0.6 1.5 2.2 1.5 3.1 MIN 22.1 -1.3 -1.3 -0.9 -1.2 -0.5 AVG 22.9 -0.4 0.0 0.3 0.0 0.7 STD 0.5 0.5 0.7 0.6 0.5 0.9 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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TR#207865, REV.1.0 63 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-35Product: QSE/QTE Connector File #: 20786511Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 -0.3 -0.8 -0.3 -0.6 -0.52 22.8 0.6 0.9 1.0 0.4 1.03 22.5 0.9 0.7 0.5 -0.1 0.44 23.7 -0.3 0.5 -1.0 -1.1 -0.15 22.3 1.3 1.6 0.7 0.4 1.76 22.0 1.7 7.5 0.8 0.6 2.87 21.8 0.2 2.8 0.8 0.6 0.58 21.9 -0.3 2.1 0.2 0.0 5.59 22.1 -0.1 1.3 0.7 0.7 0.710 22.5 0.1 3.6 0.5 0.2 0.611 22.7 -0.6 4.8 0.2 0.1 0.512 22.5 0.4 1.3 0.3 0.3 1.513 22.6 0.1 0.6 0.5 0.5 0.214 22.3 0.3 0.8 0.9 0.6 1.315 22.1 0.8 1.8 1.1 1.1 1.316 22.1 0.6 1.9 1.1 0.8 0.817 21.9 0.1 0.8 0.5 0.4 1.218 23.1 0.3 0.4 -0.1 -0.3 -0.119 22.0 0.1 0.3 0.2 0.2 0.420 22.4 0.9 1.0 0.5 0.3 1.621 22.8 0.5 0.7 0.2 -0.1 1.522 22.8 0.3 0.7 0.8 0.7 1.923 23.2 -0.1 -0.4 -0.4 -0.6 -0.424 22.6 1.0 0.1 0.1 -0.2 0.425 22.3 0.7 0.8 -0.3 -0.5 1.2

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TR#207865, REV.1.0 64 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786511

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.7 1.7 7.5 1.1 1.1 5.5 MIN 21.8 -0.6 -0.8 -1.0 -1.1 -0.5 AVG 22.5 0.4 1.4 0.4 0.2 1.0 STD 0.5 0.5 1.7 0.5 0.5 1.2 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 65: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 65 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-36Product: QSE/QTE Connector File #: 20786512Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.6 1.7 1.5 3.7 1.8 2.32 23.5 -0.4 0.0 0.2 0.0 2.83 23.8 -0.7 -0.6 -0.3 -0.6 0.54 23.5 -0.6 -0.2 -0.8 -1.3 0.45 22.6 0.4 0.2 0.5 0.0 1.76 23.5 -0.1 0.7 -0.5 -0.6 3.07 22.1 0.4 1.0 0.4 0.3 2.68 22.2 0.5 1.3 0.9 0.7 1.49 22.5 -0.6 0.1 -0.5 -0.5 2.110 21.7 0.2 1.0 1.5 1.3 1.411 22.2 0.0 0.6 0.2 -0.1 4.012 22.3 0.3 0.3 0.7 0.7 0.213 22.0 0.5 1.9 0.4 1.0 0.214 22.5 -0.6 -0.7 -0.2 -0.5 0.415 22.5 -0.3 0.5 0.5 -0.1 1.116 21.9 -0.1 0.2 1.0 0.4 0.917 22.2 -0.4 1.0 0.3 -0.1 0.818 22.3 0.0 0.9 0.2 0.1 0.519 22.3 -0.2 1.4 1.0 0.5 0.320 23.3 -0.6 -0.9 -0.5 -0.8 5.321 23.7 -1.0 -0.5 -1.4 -1.6 -0.422 22.0 0.6 0.8 0.3 0.1 0.823 22.5 0.7 0.6 -0.1 -0.3 2.124 22.3 0.8 0.0 -0.3 -0.4 1.825 22.0 0.5 0.9 -0.2 -0.4 1.2

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TR#207865, REV.1.0 66 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786512units: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.8 1.7 1.9 3.7 1.8 5.3 MIN 21.7 -1.0 -0.9 -1.4 -1.6 -0.4 AVG 22.6 0.0 0.5 0.3 0.0 1.5 STD 0.6 0.6 0.7 1.0 0.8 1.3 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 67: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 67 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-37Product: QSE/QTE Connector File #: 20786513Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.8 1.6 1.0 1.0 0.7 1.12 22.6 0.2 0.5 0.0 -0.2 0.83 21.8 0.6 1.7 0.7 0.6 1.44 23.2 -0.6 -0.2 -0.5 -0.8 0.15 22.3 0.1 0.6 0.0 -0.5 0.16 22.1 0.1 0.9 1.2 0.8 1.57 21.8 0.0 0.1 0.0 0.2 0.78 21.7 0.3 0.8 0.9 0.8 1.29 21.9 0.2 0.9 0.1 0.2 1.210 22.2 -0.4 3.1 0.6 0.0 1.111 21.6 0.3 1.0 1.1 1.0 0.712 22.0 -0.7 14.6 0.4 0.2 2.413 22.5 -0.2 0.7 0.1 -0.1 0.714 21.8 0.3 0.6 1.0 0.6 0.815 22.2 -0.4 0.8 0.7 0.6 0.716 22.7 -0.4 -0.2 -0.4 -0.7 0.117 22.9 -0.2 0.8 0.6 0.5 2.318 23.1 -0.5 0.4 0.5 0.7 1.019 22.3 0.3 0.7 0.0 -0.5 1.720 21.9 1.0 0.9 0.9 0.8 0.621 22.1 0.4 0.3 0.2 0.1 0.422 22.3 -0.1 -0.2 -0.1 -0.3 0.823 21.9 0.6 1.5 0.8 0.7 0.924 21.9 0.3 0.8 0.7 0.5 0.925 21.9 0.2 0.8 0.1 -0.1 0.3

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TR#207865, REV.1.0 68 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786513

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.2 1.6 14.6 1.2 1.0 2.4 MIN 21.6 -0.7 -0.2 -0.5 -0.8 0.1 AVG 22.2 0.1 1.3 0.4 0.2 1.0 STD 0.4 0.5 2.8 0.5 0.5 0.6 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

Page 69: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 69 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-38Product: QSE/QTE Connector File #: 20786514Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.8 -0.4 -0.9 -0.9 -1.0 0.92 23.1 -0.9 -1.3 -1.0 -1.1 -0.53 23.4 -0.8 -1.1 -0.9 -1.2 1.14 22.4 0.8 0.1 0.3 0.3 1.75 23.8 -1.4 -0.7 -1.2 -1.8 -0.96 23.2 0.7 -1.1 0.0 -0.3 0.07 21.6 -0.2 0.8 1.3 1.1 1.68 22.2 -0.5 0.8 0.3 0.1 1.89 21.7 -0.1 0.9 1.4 0.8 2.910 23.1 -0.9 -0.7 -0.7 -0.6 -0.511 22.8 -1.0 -0.5 0.0 -0.4 -0.612 22.2 -0.7 -0.2 0.5 0.3 0.613 22.7 -0.8 -0.5 0.5 -0.1 2.814 22.2 -0.7 -0.1 -0.5 -0.4 0.515 22.3 -0.7 0.0 1.4 1.1 1.216 21.9 -0.5 0.4 0.2 0.1 2.717 22.1 -0.6 -0.1 0.1 -0.1 0.518 23.0 -0.6 1.4 0.8 1.0 1.419 21.5 0.1 0.2 0.8 0.1 0.620 22.2 -0.3 -0.3 -0.4 -0.6 -0.221 22.8 -0.4 -0.9 -0.5 -0.6 -0.122 22.6 -0.2 -0.2 -0.3 -0.3 -0.223 22.7 -0.8 -0.8 -0.8 -0.9 0.724 22.0 0.1 0.4 0.2 0.0 0.125 21.3 -0.1 0.9 0.2 0.0 -0.1

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TR#207865, REV.1.0 70 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786514

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.8 0.8 1.4 1.4 1.1 2.9 MIN 21.3 -1.4 -1.3 -1.2 -1.8 -0.9 AVG 22.5 -0.4 -0.1 0.0 -0.2 0.7 STD 0.6 0.5 0.7 0.8 0.7 1.1 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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TR#207865, REV.1.0 71 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-39Product: QSE/QTE Connector File #: 20786515Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.9 0.4 0.6 0.9 0.8 1.82 23.1 -1.0 -0.6 -0.1 -0.5 0.73 22.4 0.7 -0.3 0.3 0.1 1.14 23.2 0.1 -0.5 0.1 -0.2 0.15 22.4 0.9 0.6 1.2 0.9 1.86 22.6 0.6 -0.3 0.3 0.1 0.77 21.7 0.2 1.4 0.9 0.6 1.58 21.8 0.1 1.5 1.5 1.3 0.69 22.0 -0.1 1.5 1.7 1.4 1.110 22.3 0.2 1.7 0.9 0.8 0.411 21.8 0.6 0.8 2.1 1.9 2.112 22.1 0.7 1.1 1.3 1.2 1.213 22.3 0.2 1.4 2.3 2.2 4.214 22.3 0.9 1.1 2.1 2.3 1.515 22.6 0.1 0.6 3.8 3.7 4.916 22.4 -0.4 0.3 0.5 0.6 4.517 22.8 -0.2 -0.4 1.1 1.6 0.518 22.8 -0.4 0.1 0.8 1.1 2.419 23.3 -0.6 -0.4 0.3 0.2 7.620 22.7 0.7 0.2 0.6 0.3 0.821 22.4 0.8 0.3 0.7 0.5 0.822 22.3 0.5 0.0 0.9 0.5 0.423 23.2 0.1 -0.2 0.4 -0.1 0.024 22.2 1.0 0.6 1.1 1.0 1.325 22.3 1.1 0.7 0.3 0.4 1.1

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TR#207865, REV.1.0 72 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786515

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.3 1.1 1.7 3.8 3.7 7.6 MIN 21.7 -1.0 -0.6 -0.1 -0.5 0.0 AVG 22.4 0.3 0.5 1.0 0.9 1.7 STD 0.4 0.5 0.7 0.9 0.9 1.8 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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TR#207865, REV.1.0 73 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 112 5-40Product: QSE/QTE Connector File #: 20786516Description: Plt Thickness AU (50)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.0 -0.2 -0.4 0.2 -0.1 0.32 22.9 -0.4 -0.8 -0.6 -0.9 -0.63 22.9 0.3 -0.2 0.6 0.3 0.24 23.7 -1.7 -1.7 -1.0 -1.2 -1.15 23.1 -0.4 -0.5 0.0 -0.3 -0.46 22.8 0.2 0.9 0.0 -0.2 0.07 22.1 -0.2 0.8 1.1 0.9 3.78 21.7 0.5 0.2 1.0 0.9 1.69 22.5 -0.3 0.3 0.4 0.4 0.910 22.1 0.7 0.3 1.4 0.4 3.511 22.3 0.3 -0.2 0.1 0.1 -0.112 22.3 0.5 0.6 1.5 1.4 2.713 22.3 -0.4 0.5 0.2 0.3 1.714 22.5 0.2 -0.4 -0.1 -0.2 2.415 22.6 -0.2 0.0 -0.5 -0.6 0.916 22.6 0.1 2.9 1.0 0.3 7.017 23.1 -1.3 -1.0 -1.0 -1.2 -0.818 22.7 -0.3 0.4 0.3 0.1 1.219 23.2 -0.4 -0.1 0.8 0.2 0.820 23.0 0.0 -0.3 0.3 0.1 -0.221 22.8 -0.1 0.1 -0.1 -0.5 0.022 23.0 -0.3 -0.7 -0.9 -1.0 0.423 24.5 -1.7 -2.3 -2.3 -2.4 -1.924 22.0 -0.3 0.5 0.0 -0.1 0.525 23.2 -0.8 -0.9 -0.9 -1.2 -0.4

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TR#207865, REV.1.0 74 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786516

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.5 0.7 2.9 1.5 1.4 7.0 MIN 21.7 -1.7 -2.3 -2.3 -2.4 -1.9 AVG 22.7 -0.3 -0.1 0.1 -0.2 0.9 STD 0.6 0.6 1.0 0.9 0.8 1.9 Open 0 0 0 0 0 0 Tech DAM DAM BE BE BE BE

Equip ID 323 323 601 601 601 601297 297 677 677 677 677

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TR#207865, REV.1.0 75 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

LLCR DATA FILES

GROUP 113

20786517 Through 20786524

Page 76: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 76 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-41Product: QSE/QTE Connector File #: 20786517Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.2 0.4 0.2 1.2 0.7 0.42 23.6 -0.3 0.4 1.1 0.2 1.13 23.5 -0.2 0.0 -0.3 -0.6 0.14 23.7 0.6 0.5 0.5 0.2 0.45 24.0 -1.1 -0.9 -0.2 -0.1 0.56 23.8 0.1 0.1 0.2 -0.1 0.67 23.2 0.6 0.8 0.7 0.6 1.88 22.6 0.2 0.7 0.2 0.1 0.79 23.2 0.4 0.9 1.1 0.9 1.110 22.9 0.3 0.9 0.9 0.9 1.611 24.1 0.4 0.5 1.3 1.2 1.312 23.7 0.1 0.5 0.4 0.0 0.513 22.8 0.5 1.0 0.8 0.4 0.514 22.8 1.2 2.1 1.2 0.9 1.315 23.6 -0.4 0.4 0.8 0.1 1.116 23.8 -1.0 0.0 0.3 0.0 1.317 23.7 -0.1 -0.2 0.0 0.0 0.518 23.5 -0.3 0.6 1.0 0.4 1.219 23.5 0.1 0.3 0.3 0.2 0.920 22.9 1.2 0.1 1.2 0.7 2.121 22.9 -0.5 -0.6 -0.5 -0.6 -0.322 23.0 0.2 -0.4 1.2 0.3 0.523 22.6 0.6 0.6 0.7 0.7 1.324 23.8 -0.7 -0.5 -0.4 -0.9 -0.125 23.6 -0.9 -0.9 -1.2 -1.3 -0.6

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TR#207865, REV.1.0 77 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786517

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.1 1.2 2.1 1.3 1.2 2.1 MIN 22.6 -1.1 -0.9 -1.2 -1.3 -0.6 AVG 23.4 0.1 0.3 0.5 0.2 0.8 STD 0.4 0.6 0.7 0.7 0.6 0.6 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

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TR#207865, REV.1.0 78 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-42Product: QSE/QTE Connector File #: 20786518Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 24.2 -0.3 0.1 0.7 -0.3 0.02 24.2 0.0 -0.5 -0.5 -0.6 -0.13 23.6 0.0 0.3 0.3 0.2 0.24 24.0 0.0 0.4 0.9 0.6 0.85 23.7 0.5 1.4 0.2 -0.1 0.06 23.6 0.3 1.0 0.0 -0.1 0.47 23.5 0.1 0.5 0.6 0.3 0.48 23.7 -0.3 0.1 0.2 -0.3 -0.19 23.5 0.3 1.9 1.1 0.6 1.110 25.0 -1.1 0.3 -0.6 -0.9 -1.011 23.8 0.0 0.3 0.7 0.3 0.612 24.5 -0.1 0.3 -0.2 -0.5 -0.113 24.7 -0.5 0.2 -0.1 -0.4 -0.214 24.0 0.6 1.1 0.6 0.6 0.415 23.6 0.9 0.6 0.9 0.9 0.516 24.4 0.4 -0.2 0.2 0.1 0.217 24.1 -1.0 -0.7 -0.8 -0.8 -0.818 24.6 -0.9 -0.6 -0.4 -0.5 -0.219 23.7 0.7 1.4 1.9 0.8 0.620 23.8 0.1 0.4 -0.2 -0.3 -0.621 24.0 0.2 0.2 -0.1 -0.3 -0.322 23.3 0.0 0.4 0.0 -0.1 0.223 23.3 0.4 1.4 0.9 0.8 0.724 23.5 -0.6 0.4 0.0 -0.1 0.825 24.4 -0.5 -0.2 -0.2 -0.4 -0.2

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TR#207865, REV.1.0 79 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786518

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.0 0.9 1.9 1.9 0.9 1.1 MIN 23.3 -1.1 -0.7 -0.8 -0.9 -1.0 AVG 23.9 0.0 0.4 0.2 0.0 0.1 STD 0.5 0.5 0.7 0.6 0.5 0.5 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

Page 80: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 80 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-43Product: QSE/QTE Connector File #: 20786519Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 0.1 0.2 0.5 0.2 -0.32 23.2 0.1 0.0 0.7 1.0 0.13 23.0 1.1 0.6 0.7 1.1 0.74 23.2 0.5 0.6 1.7 1.9 0.45 23.9 -0.5 -0.5 -0.7 -0.1 -0.56 22.6 1.1 0.8 0.9 1.0 1.17 23.9 -1.0 -0.4 2.2 0.7 -0.38 23.1 -0.1 0.1 1.0 1.2 0.59 23.5 -0.4 -0.4 0.4 0.4 0.510 23.2 -0.5 0.0 0.6 0.7 0.211 24.0 -0.6 -0.2 1.8 1.6 0.212 23.5 -0.1 0.3 0.7 0.6 0.513 24.6 -0.9 -1.4 -1.3 -0.5 -0.514 22.9 0.7 1.0 0.7 0.9 0.615 23.4 0.5 1.6 0.8 1.0 0.616 25.0 -1.0 -0.3 -0.7 -0.6 -1.017 23.6 0.5 1.4 1.3 0.7 0.318 24.1 -0.1 0.6 0.2 0.5 0.319 24.2 -0.4 -0.3 -0.1 -0.4 -0.520 22.8 0.3 0.8 1.3 0.9 1.021 23.4 0.0 1.3 1.3 1.0 0.922 23.6 0.2 0.0 0.6 0.2 0.123 23.0 0.1 0.2 0.5 1.0 0.324 23.4 0.0 -0.3 0.4 0.1 0.425 23.2 -0.2 0.0 1.8 1.1 1.2

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TR#207865, REV.1.0 81 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786519

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.0 1.1 1.6 2.2 1.9 1.2 MIN 22.6 -1.0 -1.4 -1.3 -0.6 -1.0 AVG 23.5 0.0 0.2 0.7 0.7 0.3 STD 0.6 0.6 0.7 0.8 0.6 0.6 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

Page 82: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 82 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-44Product: QSE/QTE Connector File #: 20786520Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.5 -0.3 0.6 0.8 0.5 0.92 23.5 -0.6 0.1 0.0 -0.3 0.13 22.6 0.6 0.5 0.6 0.4 0.84 22.4 0.3 1.1 0.5 0.5 0.85 22.6 -0.2 0.3 -0.2 -0.1 0.46 23.0 -0.6 -0.3 0.1 -0.1 -0.17 23.8 -1.0 -0.6 -0.3 -0.5 -0.38 22.7 -0.4 0.7 0.8 0.7 1.39 22.6 0.5 1.2 0.8 0.8 1.610 22.0 0.4 1.0 1.1 1.3 1.411 22.9 -0.2 0.4 0.3 0.3 0.712 22.9 1.0 0.7 1.1 1.0 1.513 22.6 1.0 0.9 1.0 1.1 2.014 24.4 -0.7 -0.7 -0.1 -0.3 -0.115 23.1 0.6 0.8 0.4 0.2 2.416 23.4 -0.6 -0.6 -1.1 -1.3 -0.617 23.7 0.1 -0.5 -0.8 -1.2 -0.718 24.3 -1.1 -1.8 -0.5 -0.8 -1.119 22.2 1.0 0.6 0.5 0.1 0.920 23.2 -0.2 1.0 0.1 0.3 1.321 23.0 0.4 0.6 0.4 0.2 1.222 22.0 0.6 1.0 0.8 0.6 1.123 22.1 0.7 0.7 0.5 0.4 0.924 22.3 -0.3 1.1 0.6 0.4 1.225 22.8 -0.4 0.4 -0.3 -0.4 0.2

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TR#207865, REV.1.0 83 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786520

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.4 1.0 1.2 1.1 1.3 2.4 MIN 22.0 -1.1 -1.8 -1.1 -1.3 -1.1 AVG 22.9 0.0 0.4 0.3 0.1 0.7 STD 0.6 0.6 0.7 0.6 0.6 0.9 Open 0 0 0 0 0 0.0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

Page 84: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 84 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-45Product: QSE/QTE Connector File #: 20786521Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.7 0.7 0.6 1.9 3.0 4.12 23.1 0.6 0.2 2.2 1.5 0.53 23.8 -0.2 0.0 0.1 -0.3 0.24 22.7 0.4 0.7 1.3 0.6 1.35 23.2 -0.1 0.1 0.4 0.3 0.16 23.0 0.4 0.2 1.3 0.7 0.77 23.8 -1.1 -0.7 -0.8 -0.7 -0.18 23.3 -0.5 -0.4 0.0 -0.2 0.49 23.2 -0.7 -0.5 -0.7 -1.0 -0.110 23.6 -0.8 0.2 0.4 -0.2 0.111 23.3 -0.4 0.0 0.0 -0.5 0.412 24.1 -0.8 -0.8 -0.7 -1.1 0.213 22.5 -0.5 -0.2 -0.2 0.2 0.314 22.8 -0.2 0.0 3.0 2.3 1.215 23.8 0.6 -0.4 -0.9 -1.1 -0.116 23.7 -0.2 -0.2 -0.4 -0.6 -0.117 23.1 -0.2 2.8 0.2 -0.1 -0.218 22.8 1.2 0.7 1.7 1.6 1.019 24.0 1.2 0.5 0.6 0.9 1.220 22.8 0.0 2.5 1.1 2.3 1.821 23.4 0.1 1.5 0.6 0.5 5.422 23.4 -0.2 0.3 0.4 0.4 0.223 23.2 -0.3 0.0 -0.2 -0.4 0.124 22.4 -0.2 0.6 -0.4 0.2 0.825 22.6 -0.3 -0.2 -0.2 -0.3 0.7

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TR#207865, REV.1.0 85 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786521

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.1 1.2 2.8 3.0 3.0 5.4 MIN 22.4 -1.1 -0.8 -0.9 -1.1 -0.2 AVG 23.3 -0.1 0.3 0.4 0.3 0.8 STD 0.5 0.6 0.9 1.0 1.1 1.3 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

Page 86: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 86 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-46Product: QSE/QTE Connector File #: 20786522Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 24.0 0.3 0.6 1.1 0.5 2.02 23.4 0.3 0.9 0.7 0.8 0.13 23.4 0.3 -0.3 -0.2 -0.3 -0.14 24.3 0.3 -0.3 0.0 -0.3 0.25 24.3 -1.0 -0.7 -0.2 -0.2 4.96 23.5 0.5 0.4 0.6 0.3 0.57 23.2 -0.3 -0.1 0.2 -0.1 0.68 23.5 -0.6 0.5 0.0 -0.2 0.29 23.4 -0.4 1.9 -0.2 0.1 0.010 24.0 -0.7 -0.5 -0.2 -0.6 2.311 23.1 0.1 0.5 0.4 0.4 4.412 23.3 0.0 0.8 0.2 0.0 0.313 23.4 0.1 0.2 0.5 0.4 0.614 22.7 1.3 0.7 1.3 1.1 2.015 23.8 -0.7 0.4 -0.2 -0.2 0.816 23.1 0.0 0.9 1.2 0.5 0.317 24.4 -0.7 -0.4 -0.3 -0.6 0.118 23.8 -0.6 -0.3 0.0 -0.4 0.019 24.2 -0.9 -0.6 -0.6 -0.7 -0.320 24.1 0.2 0.3 -0.1 0.3 5.021 23.4 0.8 0.2 0.1 0.1 0.422 23.1 0.4 0.1 0.4 0.2 0.423 22.8 0.7 0.4 0.7 0.5 0.924 22.9 0.2 0.2 -0.3 -0.3 0.225 22.9 -0.1 -0.1 -0.3 -0.2 0.1

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TR#207865, REV.1.0 87 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786522

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.4 1.3 1.9 1.3 1.1 5.0 MIN 22.7 -1.0 -0.7 -0.6 -0.7 -0.3 AVG 23.5 0.0 0.2 0.2 0.0 1.0 STD 0.5 0.6 0.6 0.5 0.5 1.6 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

Page 88: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 88 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-47Product: QSE/QTE Connector File #: 20786523Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 24.1 -0.1 -0.4 -0.3 -0.2 0.22 23.4 0.0 -0.2 -0.4 -0.2 -0.23 24.0 0.4 0.2 0.1 -0.1 -0.74 23.5 0.0 0.0 -0.1 0.4 -0.25 24.2 0.3 -0.1 0.0 -0.1 -0.26 23.9 -0.6 -0.1 -0.1 0.3 -0.27 23.5 -0.9 -0.8 -0.4 -0.3 -0.58 23.8 -0.5 -0.4 0.5 0.0 -0.89 24.2 -0.8 -0.5 -0.2 -0.3 -0.410 23.4 0.0 0.1 0.3 0.2 0.711 24.1 -0.3 -0.5 -0.4 -0.4 -0.612 23.6 0.1 0.3 0.5 0.4 0.713 23.8 -0.3 -0.2 0.2 0.3 -0.114 23.6 -0.4 0.1 0.1 0.3 0.215 24.0 0.6 0.9 0.2 0.6 0.016 24.1 0.0 1.0 0.4 0.2 -0.717 23.9 0.8 2.4 2.3 2.6 4.218 24.6 -0.8 3.3 -0.2 -0.3 -0.119 24.2 0.5 0.5 0.1 0.1 -0.720 24.2 -0.1 0.2 0.1 0.3 0.421 24.6 -0.2 -0.6 -0.3 -0.3 -1.122 23.7 0.1 -0.3 -0.1 0.7 0.223 22.9 0.2 0.4 0.4 1.3 1.024 22.7 0.9 0.6 0.8 1.1 1.425 23.4 0.8 0.3 0.4 0.2 -1.2

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TR#207865, REV.1.0 89 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786523

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.6 0.9 3.3 2.3 2.6 4.2 MIN 22.7 -0.9 -0.8 -0.4 -0.4 -1.2 AVG 23.8 0.0 0.2 0.2 0.3 0.1 STD 0.5 0.5 0.9 0.5 0.7 1.1 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

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TR#207865, REV.1.0 90 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 113 6-48Product: QSE/QTE Connector File #: 20786524Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 0.1 0.5 0.7 1.3 0.32 23.5 -0.4 -0.5 -0.4 -0.1 0.33 23.0 0.4 0.1 0.4 0.6 1.34 22.0 0.8 0.7 0.8 1.0 2.35 23.8 -1.3 -0.3 -0.3 0.1 0.36 23.3 -0.1 0.3 0.3 0.3 0.57 22.8 -0.1 0.3 -0.1 0.2 0.78 22.8 -0.8 -0.5 -0.2 0.0 1.09 22.4 0.3 0.2 0.5 0.9 1.710 22.9 0.5 0.4 0.6 1.0 1.011 23.0 0.1 0.5 0.8 0.6 1.612 23.8 -0.5 0.3 0.5 0.2 0.413 22.9 -0.2 0.7 1.4 1.2 1.514 24.6 -1.6 -0.9 -1.2 -1.4 -0.515 23.6 -0.2 0.2 0.2 0.0 1.316 23.1 0.6 0.7 0.9 0.5 1.217 24.3 -0.5 -1.4 -1.2 -1.0 0.718 24.2 -1.0 -0.5 1.8 2.5 0.619 24.2 0.0 -0.1 0.2 0.5 0.520 22.2 0.9 1.0 0.7 1.0 3.321 22.8 -0.3 1.2 0.6 0.4 2.222 23.1 0.0 0.2 -0.1 0.0 1.823 23.6 -0.8 -0.7 -0.8 -0.2 0.724 23.3 0.0 0.4 0.0 0.0 0.425 22.6 0.1 -0.3 -0.5 -0.3 1.3

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TR#207865, REV.1.0 91 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786524

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.6 0.9 1.2 1.8 2.5 3.3 MIN 22.0 -1.6 -1.4 -1.2 -1.4 -0.5 AVG 23.2 -0.2 0.1 0.2 0.4 1.1 STD 0.7 0.6 0.6 0.7 0.8 0.8 Open 0 0 0 0 0 0 Tech GL DH BE DAM BE RJC

Equip ID 1276 681 601 323 601 280207 673 677 297 677 558

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TR#207865, REV.1.0 92 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

LLCR DATA FILES

GROUP 114

20786525 Through 20786532

Page 93: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 93 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-49Product: QSE/QTE Connector File #: 20786525Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.0 0.8 0.4 1.1 1.5 0.42 22.9 1.2 1.5 1.6 1.8 2.03 22.9 -0.4 0.6 0.9 1.0 1.64 23.0 -0.2 2.0 1.2 1.0 4.35 22.6 0.7 1.6 2.2 1.3 6.26 22.5 0.2 1.6 1.3 1.1 1.67 23.1 0.3 0.7 0.7 0.5 0.48 22.7 0.8 0.2 0.8 0.8 1.29 23.2 0.2 0.5 0.5 0.4 0.010 23.1 0.7 2.4 1.0 0.7 0.911 23.8 0.4 1.1 0.7 -0.1 0.612 23.4 0.2 0.1 -0.2 0.1 0.513 24.1 0.4 1.4 -0.5 0.4 2.214 24.1 -0.1 1.5 -0.8 0.2 0.015 23.6 0.1 -0.7 -1.0 -0.4 -0.116 25.0 -0.6 -1.0 -0.5 0.8 -1.317 24.7 -0.6 -0.6 -0.5 0.7 -0.918 24.1 0.7 -0.2 0.2 0.4 -0.219 24.0 0.6 0.3 0.6 0.5 0.220 23.1 0.4 0.4 0.4 0.5 0.721 23.5 -0.3 0.4 0.6 0.3 0.522 22.8 0.4 1.7 -0.1 0.7 1.223 23.2 0.0 1.3 0.8 0.7 1.024 22.6 0.4 0.9 0.2 0.9 1.125 22.4 0.9 0.8 1.4 1.6 1.4

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TR#207865, REV.1.0 94 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786525

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.0 1.2 2.4 2.2 1.8 6.2 MIN 22.4 -0.6 -1.0 -1.0 -0.4 -1.3 AVG 23.3 0.3 0.8 0.5 0.7 1.0 STD 0.7 0.5 0.9 0.8 0.5 1.5 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

Page 95: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 95 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-50Product: QSE/QTE Connector File #: 20786526Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.8 -0.5 0.2 -0.4 0.5 0.82 23.4 0.0 0.4 0.1 0.4 0.53 24.8 -1.1 -1.6 -1.3 -1.1 -0.44 24.7 -1.3 -0.1 -0.4 -1.0 -0.55 25.1 -1.5 -0.4 -0.9 -0.8 -0.26 23.6 0.2 2.1 -0.4 1.1 1.57 22.8 1.0 1.0 1.2 1.3 1.48 22.8 0.9 1.2 1.1 1.0 1.29 22.7 1.0 0.8 1.0 0.9 1.010 23.0 0.2 0.4 1.3 0.6 0.511 23.7 0.2 0.0 0.5 0.2 0.512 24.2 0.1 0.3 1.2 0.0 0.413 24.2 0.2 0.1 0.2 -0.2 1.014 24.2 -0.2 -0.2 -0.4 -0.1 0.115 23.7 0.9 1.5 0.3 0.4 1.216 25.5 -1.2 -1.1 -0.9 -1.0 1.817 24.8 0.1 -0.2 -0.9 -0.9 -0.318 24.6 -0.9 0.6 -0.8 -0.4 1.619 24.7 -0.4 -0.4 -0.4 0.0 0.720 23.8 0.1 0.1 0.0 0.5 -0.221 23.4 -0.3 0.8 0.2 0.3 0.422 24.2 -0.5 0.3 -0.6 -0.1 0.323 23.6 0.0 0.8 1.3 0.1 6.424 23.2 0.5 0.2 0.4 0.3 2.125 23.4 0.6 -0.1 0.2 1.5 1.1

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TR#207865, REV.1.0 96 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786526

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.5 1.0 2.1 1.3 1.5 6.4 MIN 22.7 -1.5 -1.6 -1.3 -1.1 -0.5 AVG 23.9 -0.1 0.3 0.1 0.1 0.9 STD 0.8 0.7 0.8 0.8 0.7 1.3 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

Page 97: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 97 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-51Product: QSE/QTE Connector File #: 20786527Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 -0.4 0.9 1.0 0.7 1.72 24.3 -1.5 -1.5 -1.0 -0.4 -0.73 24.4 -1.3 -0.3 -0.9 -0.8 -0.14 24.4 -1.4 -0.9 -0.6 -0.9 -0.95 23.5 -0.4 -0.1 -0.5 -0.6 -0.36 24.1 -1.0 -0.5 -1.1 -0.7 0.47 22.6 0.8 -0.2 0.5 0.7 1.38 23.2 0.0 0.1 0.1 0.3 1.99 22.5 1.5 0.6 1.0 1.1 1.110 23.0 0.4 0.3 1.5 0.2 1.011 23.4 -0.1 -0.4 -0.3 -0.3 1.212 22.8 1.5 0.6 0.9 0.9 1.813 22.9 0.8 1.2 0.5 0.2 1.314 23.7 0.5 1.8 0.7 0.4 0.215 23.5 0.3 1.0 0.2 0.5 1.216 23.6 0.7 3.0 0.1 0.8 6.517 23.5 0.7 2.7 0.5 0.2 0.918 24.0 -0.1 0.6 0.2 0.6 0.319 23.4 0.5 0.5 2.2 2.6 2.120 23.2 0.1 1.5 0.7 0.0 0.821 23.4 -0.3 1.6 0.8 0.5 1.822 23.8 -0.8 0.4 0.0 -0.6 0.023 23.8 -0.7 -0.3 -0.9 -0.7 -0.124 23.1 -0.3 -0.3 -0.6 -0.6 -0.225 23.6 -0.5 -0.7 -0.2 -0.2 2.9

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TR#207865, REV.1.0 98 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786527

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.4 1.5 3.0 2.2 2.6 6.5 MIN 22.5 -1.5 -1.5 -1.1 -0.9 -0.9 AVG 23.5 0.0 0.5 0.2 0.2 1.0 STD 0.5 0.8 1.1 0.8 0.8 1.5 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

Page 99: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 99 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-52Product: QSE/QTE Connector File #: 20786528Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.8 0.0 0.5 0.7 0.4 0.82 23.0 0.7 1.0 1.4 0.9 1.13 24.1 -0.5 -0.8 -0.9 -1.0 -0.94 23.5 0.0 -0.4 -0.4 -0.5 -0.15 23.2 0.2 0.1 -0.1 -0.2 0.66 23.5 0.3 0.5 0.1 0.0 0.37 22.8 1.0 0.5 0.6 0.4 0.98 22.7 0.7 0.5 0.5 0.3 0.99 23.1 0.7 0.2 -0.2 -0.4 1.810 23.0 0.6 0.1 0.7 0.3 0.611 23.5 0.3 0.3 1.1 0.8 0.012 22.8 0.6 0.7 1.2 0.8 0.013 23.0 1.6 1.0 1.7 1.4 0.214 23.7 0.9 0.4 1.3 0.8 -0.315 23.7 0.4 0.9 1.2 0.7 0.516 23.7 0.8 0.5 0.8 0.5 0.917 24.5 0.1 -0.2 0.3 -0.2 -0.718 24.5 0.6 0.2 -0.5 -0.8 3.319 24.1 1.0 0.1 0.9 0.4 0.020 23.2 -0.4 0.1 0.2 -0.3 -0.321 22.9 0.2 0.4 0.8 0.7 0.522 23.0 -0.5 0.0 -0.2 -0.3 0.123 22.9 0.2 -0.1 0.3 0.2 0.824 22.1 0.1 0.6 0.0 0.0 0.825 24.0 -0.8 -0.4 -1.1 -1.3 -0.9

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TR#207865, REV.1.0 100 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786528

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.5 1.6 1.0 1.7 1.4 3.3 MIN 22.1 -0.8 -0.8 -1.1 -1.3 -0.9 AVG 23.3 0.4 0.3 0.4 0.1 0.4 STD 0.6 0.6 0.4 0.7 0.6 0.9 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

Page 101: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 101 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-53Product: QSE/QTE Connector File #: 20786529Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 24.0 -0.2 0.7 0.1 -0.2 0.82 24.9 1.2 -0.1 -0.3 -0.5 0.23 24.9 -0.1 -0.1 -0.7 -0.8 1.44 23.4 0.8 1.2 0.8 0.7 1.35 24.6 1.0 0.0 -0.1 -0.3 0.46 23.1 0.9 1.5 1.2 1.1 2.37 23.2 0.6 0.7 0.8 0.4 0.68 22.8 0.6 1.6 0.9 0.8 1.09 23.2 2.0 1.6 1.7 1.6 1.310 23.4 1.9 2.8 1.6 1.4 1.911 23.4 1.6 4104.3 16.3 14.4 12.712 23.5 1.0 2.2 1.7 1.6 2.513 24.0 0.5 2.9 0.7 0.7 7.514 23.7 0.6 0.6 0.3 0.2 0.615 23.7 0.3 1.1 0.3 0.4 1.616 24.9 -0.5 -0.6 -0.7 -0.9 -0.317 24.1 0.3 2.1 1.5 0.5 2.118 24.0 0.3 0.1 0.4 0.2 1.019 25.8 -0.9 -1.6 -1.6 -1.8 -0.820 23.3 0.7 0.7 0.4 0.4 2.321 23.4 0.5 0.9 0.6 0.6 1.922 23.5 -0.6 0.5 -0.1 -0.1 2.723 22.3 0.7 1.1 0.5 0.5 1.124 22.5 1.5 1.7 1.6 1.7 2.425 22.6 0.6 1.1 0.9 0.9 1.5

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TR#207865, REV.1.0 102 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786529

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.8 2.0 4104.3 16.3 14.4 12.7 MIN 22.3 -0.9 -1.6 -1.6 -1.8 -0.8 AVG 23.7 0.6 165.1 1.2 0.9 2.0 STD 0.8 0.7 820.7 3.3 2.9 2.7 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

Page 103: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 103 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-54Product: QSE/QTE Connector File #: 20786530Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 0.6 1.7 0.7 0.9 0.72 23.2 0.7 2.4 1.1 0.9 1.23 23.4 0.4 1.0 0.7 0.6 1.44 23.5 0.6 2.1 0.7 0.3 1.65 24.5 -0.2 1.4 0.6 0.2 0.86 24.2 -0.2 0.5 1.2 1.3 3.67 23.4 0.7 0.7 1.1 0.9 1.68 23.6 0.3 1.3 1.6 0.8 1.09 23.4 1.2 0.9 0.9 0.7 1.210 23.7 0.0 0.1 0.9 0.6 1.311 23.6 0.6 0.4 0.8 0.6 0.512 23.6 0.8 1.2 0.9 0.8 1.513 23.7 0.7 1.2 0.6 0.6 1.214 24.8 0.5 0.5 1.3 1.0 0.715 24.5 0.1 0.4 1.0 0.7 0.916 26.3 -1.3 0.2 -0.3 0.6 0.117 24.1 0.4 1.2 0.3 0.4 0.818 24.2 0.2 2.7 0.7 0.4 1.319 25.6 -0.4 0.0 -0.1 -0.6 0.120 24.6 -0.6 -0.8 -0.9 -1.0 -0.121 24.0 0.1 0.0 0.1 -0.1 0.522 24.6 -0.6 0.1 -0.6 -1.2 0.023 23.9 -0.4 0.4 0.4 -0.2 1.524 23.7 -0.4 0.0 -0.1 -0.3 0.125 23.6 0.4 2.1 0.6 0.6 1.0

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TR#207865, REV.1.0 104 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786530

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 26.3 1.2 2.7 1.6 1.3 3.6 MIN 23.2 -1.3 -0.8 -0.9 -1.2 -0.1 AVG 24.0 0.2 0.9 0.6 0.4 1.0 STD 0.7 0.6 0.9 0.6 0.6 0.8 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

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TR#207865, REV.1.0 105 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-54Product: QSE/QTE Connector File #: 20786530Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.4 0.6 1.7 0.7 0.9 0.72 23.2 0.7 2.4 1.1 0.9 1.23 23.4 0.4 1.0 0.7 0.6 1.44 23.5 0.6 2.1 0.7 0.3 1.65 24.5 -0.2 1.4 0.6 0.2 0.86 24.2 -0.2 0.5 1.2 1.3 3.67 23.4 0.7 0.7 1.1 0.9 1.68 23.6 0.3 1.3 1.6 0.8 1.09 23.4 1.2 0.9 0.9 0.7 1.210 23.7 0.0 0.1 0.9 0.6 1.311 23.6 0.6 0.4 0.8 0.6 0.512 23.6 0.8 1.2 0.9 0.8 1.513 23.7 0.7 1.2 0.6 0.6 1.214 24.8 0.5 0.5 1.3 1.0 0.715 24.5 0.1 0.4 1.0 0.7 0.916 26.3 -1.3 0.2 -0.3 0.6 0.117 24.1 0.4 1.2 0.3 0.4 0.818 24.2 0.2 2.7 0.7 0.4 1.319 25.6 -0.4 0.0 -0.1 -0.6 0.120 24.6 -0.6 -0.8 -0.9 -1.0 -0.121 24.0 0.1 0.0 0.1 -0.1 0.522 24.6 -0.6 0.1 -0.6 -1.2 0.023 23.9 -0.4 0.4 0.4 -0.2 1.524 23.7 -0.4 0.0 -0.1 -0.3 0.125 23.6 0.4 2.1 0.6 0.6 1.0

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TR#207865, REV.1.0 106 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786530

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 26.3 1.2 2.7 1.6 1.3 3.6 MIN 23.2 -1.3 -0.8 -0.9 -1.2 -0.1 AVG 24.0 0.2 0.9 0.6 0.4 1.0 STD 0.7 0.6 0.9 0.6 0.6 0.8 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

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TR#207865, REV.1.0 107 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-55Product: QSE/QTE Connector File #: 20786531Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.6 -0.5 0.6 -0.2 -0.3 1.32 22.9 0.9 1.1 -0.4 -0.5 0.73 23.2 -0.3 0.4 0.5 0.5 0.94 22.3 0.0 1.4 0.5 1.0 1.15 22.7 0.9 0.6 0.0 -0.1 1.06 22.7 1.4 1.0 1.0 1.0 1.27 22.0 1.4 0.9 1.1 1.1 1.88 21.8 0.3 0.8 0.5 1.4 2.19 22.4 2.2 1.4 1.0 1.4 2.510 22.4 1.1 0.8 1.0 1.1 1.811 22.3 1.6 3.5 2.3 2.5 8.612 22.1 1.9 1.3 1.5 1.4 2.513 23.3 1.9 0.6 1.1 0.8 0.314 23.0 0.3 -0.2 0.0 0.0 0.215 23.4 0.9 0.0 0.6 0.4 0.116 23.8 0.3 0.0 0.2 -0.2 0.317 22.5 0.0 0.6 0.9 0.5 1.318 23.5 0.9 0.2 0.3 0.1 1.819 23.7 -0.7 -0.5 -0.3 -0.4 -0.620 22.6 0.3 0.9 0.6 0.5 1.521 22.0 1.3 2.9 1.2 1.4 4.222 22.7 0.5 0.1 -0.1 -0.2 1.623 22.4 0.8 1.1 1.3 1.0 0.824 22.6 0.7 0.7 0.6 0.4 6.225 22.4 0.7 0.2 0.3 0.4 0.8

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TR#207865, REV.1.0 108 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786531

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.8 2.2 3.5 2.3 2.5 8.6 MIN 21.8 -0.7 -0.5 -0.4 -0.5 -0.6 AVG 22.7 0.8 0.8 0.6 0.6 1.8 STD 0.6 0.7 0.9 0.6 0.7 2.0 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE RJC

Equip ID 681 681 601 323 601 280673 673 677 297 677 558

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TR#207865, REV.1.0 109 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 114 7-56Product: QSE/QTE Connector File #: 20786532Description: Plt Thickness AU (10)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.2 0.4 0.8 0.6 0.2 0.82 23.2 0.0 0.6 2.1 0.5 1.33 23.3 -0.2 -0.2 0.3 0.0 -0.14 23.3 -0.3 0.2 0.0 -0.2 0.35 23.4 -0.3 0.7 -0.4 -0.6 0.26 22.7 0.3 1.3 1.7 1.0 2.17 22.3 0.6 1.3 1.7 1.3 1.48 22.7 0.9 0.4 0.7 0.4 0.79 22.3 1.2 0.4 0.4 0.3 0.910 22.7 1.0 0.9 1.0 0.9 1.911 22.6 1.7 1.7 1.6 0.9 1.512 23.1 0.8 0.1 0.9 0.6 1.213 23.1 0.8 1.0 0.6 0.6 5.914 23.3 1.0 1.7 1.7 1.4 1.415 23.8 0.9 1.0 1.6 1.4 0.616 24.1 1.2 0.1 0.2 0.0 0.817 23.2 1.6 2.5 3.0 1.8 0.518 23.2 0.6 0.6 0.6 0.4 1.119 23.5 1.2 2.3 1.2 1.0 1.620 23.2 -0.2 0.8 0.6 0.2 0.421 23.1 0.5 1.9 1.2 0.8 0.722 23.2 -0.1 0.0 0.0 -0.2 0.023 23.4 -0.6 0.1 0.0 -0.3 0.124 22.6 0.0 -0.1 -0.1 -0.4 0.625 23.3 -0.4 -0.1 0.0 -0.2 0.1

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TR#207865, REV.1.0 110 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786532

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.1 1.7 2.5 3.0 1.8 5.9 MIN 22.3 -0.6 -0.2 -0.4 -0.6 -0.1 AVG 23.1 0.5 0.8 0.9 0.5 1.0 STD 0.4 0.7 0.8 0.8 0.6 1.2 Open 0 0 0 0 0 0 Tech DH DH BE DAM BE BE

Equip ID 681 681 601 323 601 601673 673 677 297 677 677

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TR#207865, REV.1.0 111 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

LLCR DATA FILES

GROUP 115

20786533 Through 20786540

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TR#207865, REV.1.0 112 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-57Product: QSE/QTE Connector File #: 20786533Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.7 0.1 -0.7 -0.6 -0.8 0.42 21.9 0.9 -0.9 0.0 -0.1 0.13 22.7 0.5 -0.4 -0.7 -0.8 -0.44 22.3 0.4 -0.4 0.6 0.5 1.25 22.5 -0.6 -0.9 -0.7 -0.3 0.56 22.7 0.5 -0.7 0.6 0.3 0.67 23.4 -0.7 -1.0 -0.7 -0.6 -0.78 23.4 -0.7 -1.4 -1.3 -0.8 -0.29 23.9 -0.9 -2.0 -0.9 -0.8 -0.310 23.0 -0.3 -0.9 -0.4 -0.4 -0.311 23.1 -0.5 -0.1 -0.6 -0.4 0.212 23.3 0.7 -0.4 0.6 0.6 0.013 23.2 0.7 0.1 0.2 0.2 0.314 22.4 -0.1 -0.2 -0.4 -0.5 0.215 22.6 0.8 0.0 0.3 0.3 -0.116 23.8 0.6 -0.3 0.0 -0.1 0.217 23.8 0.7 0.0 -0.5 -0.6 0.418 24.3 -0.8 -0.7 -1.1 -1.2 -0.619 23.1 -0.4 -0.8 -0.4 -0.4 0.420 22.3 0.1 -0.3 -0.4 -0.5 -0.221 23.0 -0.6 -1.0 -0.7 -0.7 0.322 22.1 -0.2 -0.4 -0.3 -0.4 0.323 21.7 0.2 1.3 0.0 0.2 2.924 22.2 0.1 -0.1 -0.4 -0.6 -0.225 22.2 0.0 -0.5 -0.3 -0.6 1.8

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TR#207865, REV.1.0 113 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786533

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.3 0.9 1.3 0.6 0.6 2.9 MIN 21.7 -0.9 -2.0 -1.3 -1.2 -0.7 AVG 22.9 0.0 -0.5 -0.3 -0.3 0.3 STD 0.7 0.6 0.6 0.5 0.5 0.8 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 114 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-58Product: QSE/QTE Connector File #: 20786534Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.1 0.2 0.3 0.3 0.0 -0.52 21.8 0.1 1.2 0.7 0.5 0.43 21.6 0.6 0.6 5.0 0.5 0.04 21.3 0.8 0.4 3.0 1.2 1.15 21.9 0.9 0.8 2.2 1.0 2.46 22.1 0.9 -0.3 0.4 -0.1 0.77 23.5 -1.3 -1.4 -1.7 -1.8 -1.18 22.1 0.6 0.4 -0.2 -0.2 0.79 22.2 0.2 -0.2 -0.2 0.0 1.010 22.3 0.8 0.3 0.6 0.5 2.511 23.6 -0.3 -0.9 -0.2 -0.2 -0.312 22.9 -0.4 0.1 0.2 0.1 0.313 22.3 -0.1 -0.1 1.0 0.2 0.114 23.0 -1.0 0.2 -0.3 -0.8 6.215 22.8 0.6 -0.2 3.2 0.0 0.216 23.5 -0.6 -0.6 4.6 -1.5 0.617 22.6 1.6 3.8 7.1 0.6 1.618 21.8 1.7 0.5 6.2 1.4 2.219 22.6 0.3 0.4 3.1 0.2 0.620 22.5 -0.4 -0.3 2.6 -0.2 0.421 22.9 -0.2 -0.2 4.8 -1.1 0.422 21.0 0.3 0.3 7.7 0.0 0.723 21.0 1.0 0.1 4.2 0.5 1.024 21.2 0.7 0.0 4.8 -0.3 2.825 21.0 1.5 0.5 4.5 0.3 1.0

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TR#207865, REV.1.0 115 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786534

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.6 1.7 3.8 7.7 1.4 6.2 MIN 21.0 -1.3 -1.4 -1.7 -1.8 -1.1 AVG 22.3 0.3 0.2 2.5 0.0 1.0 STD 0.8 0.8 0.9 2.6 0.8 1.4 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 116 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-59Product: QSE/QTE Connector File #: 20786535Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.2 0.8 -0.1 0.0 -0.2 0.22 23.2 2.2 -1.0 -0.8 -1.0 -0.53 22.5 0.6 -0.5 -0.3 -0.4 0.04 22.3 0.7 0.1 -0.3 -0.4 -0.15 22.8 1.5 -0.4 -0.3 -0.6 -0.56 21.5 1.6 0.8 0.8 0.6 0.97 22.7 -0.7 -1.3 -1.2 -1.2 -0.58 22.6 0.3 -0.2 -0.8 -1.0 5.29 23.0 -0.4 -0.8 -1.3 -1.4 -0.810 22.9 -0.9 -1.2 -1.5 -1.1 -0.611 23.9 -0.6 -1.3 -1.2 -1.4 -1.112 23.0 0.0 0.3 -0.1 -0.1 0.213 22.4 -0.5 -0.1 -0.2 -0.6 0.514 22.1 0.1 0.1 -0.1 -0.3 1.315 22.7 -0.4 -0.7 -0.4 -0.7 2.516 22.1 -0.1 -0.1 -0.5 -0.7 0.117 22.8 -0.9 -0.9 -0.5 -0.7 -0.518 22.5 -0.4 -0.5 0.0 -0.2 -0.319 23.4 -0.1 -0.5 0.0 -0.1 0.020 21.8 0.9 0.2 0.4 0.3 -0.221 21.9 0.6 -0.3 0.1 -0.1 0.222 21.8 0.2 -0.2 -0.2 -0.2 0.223 21.3 0.5 0.4 0.1 -0.1 0.824 21.7 0.5 0.3 0.1 -0.1 0.925 22.1 0.2 0.5 0.9 0.6 0.4

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TR#207865, REV.1.0 117 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786535

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.9 2.2 0.8 0.9 0.6 5.2 MIN 21.3 -0.9 -1.3 -1.5 -1.4 -1.1 AVG 22.5 0.2 -0.3 -0.3 -0.4 0.3 STD 0.6 0.8 0.6 0.6 0.5 1.3 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 118 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-60Product: QSE/QTE Connector File #: 20786536Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 23.1 -0.6 -0.3 -0.5 -0.7 0.22 22.3 -0.1 -0.2 0.0 -0.2 0.63 22.6 0.4 -0.6 -0.6 -0.8 0.24 22.3 1.1 0.0 -0.1 -0.4 0.45 23.3 -0.3 -0.8 -0.9 -1.0 -0.36 22.6 -0.4 -0.4 0.0 -0.1 0.97 22.7 -0.4 -0.3 -0.1 -0.4 0.68 22.8 -0.5 -0.8 -0.2 -0.5 0.09 22.6 -0.6 -0.3 -0.3 -0.4 -0.310 22.3 0.5 0.4 1.3 0.4 1.011 22.8 -0.4 -0.4 -0.6 -0.8 -0.512 23.0 0.0 -0.2 -0.4 -0.5 -0.113 22.8 0.1 -0.2 0.2 0.0 1.014 23.2 0.9 0.1 0.3 0.1 0.015 22.8 0.6 0.0 0.4 0.0 0.216 23.9 0.3 -1.0 -0.2 -0.7 -0.317 23.4 0.1 -0.5 -0.5 -0.6 -0.318 22.6 1.2 0.8 1.2 1.4 3.219 24.9 -1.0 -1.7 -1.6 -1.6 -1.720 22.4 -0.1 0.3 0.1 -0.1 0.621 22.1 0.5 1.1 0.4 0.2 0.522 22.4 0.3 0.6 0.4 0.1 0.523 22.1 0.4 0.6 0.6 0.5 1.324 22.0 0.2 -0.1 0.0 0.0 1.325 22.9 -0.1 1.2 -0.1 -0.4 -0.2

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TR#207865, REV.1.0 119 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786536

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.9 1.2 1.2 1.3 1.4 3.2 MIN 22.0 -1.0 -1.7 -1.6 -1.6 -1.7 AVG 22.8 0.1 -0.1 0.0 -0.3 0.4 STD 0.6 0.5 0.7 0.6 0.6 0.9 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 120 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-61Product: QSE/QTE Connector File #: 20786537Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.5 1.3 1.3 0.3 0.2 0.52 22.0 0.3 0.3 -0.2 -0.4 0.03 21.8 1.1 0.7 0.4 0.4 0.84 21.8 0.3 -0.5 -0.3 -0.1 0.15 22.1 1.3 0.4 0.0 -0.1 0.36 21.2 -0.1 -0.2 0.0 0.0 0.37 23.4 -1.5 -0.8 -1.1 -1.4 -1.38 22.1 -0.2 -0.9 -0.2 0.0 0.19 22.7 -0.7 -0.3 -0.6 -0.6 -0.210 23.2 -0.9 -0.5 -0.8 -0.8 -0.611 23.1 -1.1 -1.4 -1.2 -1.0 -0.912 22.5 -0.1 -0.4 0.8 0.7 1.113 22.1 -0.5 -0.4 -0.4 -0.2 0.314 23.2 -0.9 -0.5 -0.4 -0.4 0.115 22.2 0.2 -0.3 -0.3 -0.2 0.016 22.9 0.0 0.2 -0.5 -0.5 -0.417 23.0 -0.4 -0.8 -0.9 -1.0 -0.918 22.6 0.1 -0.5 -0.4 -0.6 -0.219 22.1 -0.3 0.0 0.1 -0.2 0.420 22.1 -0.2 0.5 -0.6 -0.7 -0.621 23.0 -0.6 -0.7 -0.9 -1.1 -0.522 21.8 -0.2 -0.3 0.0 -0.1 -0.123 23.0 -1.2 -0.9 -1.5 -1.6 -1.024 21.7 0.6 -0.3 0.1 -0.1 0.525 23.1 -1.3 -1.5 -1.6 -1.8 -1.3

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TR#207865, REV.1.0 121 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786537

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.4 1.3 1.3 0.8 0.7 1.1 MIN 21.2 -1.5 -1.5 -1.6 -1.8 -1.3 AVG 22.4 -0.2 -0.3 -0.4 -0.5 -0.1 STD 0.6 0.8 0.6 0.6 0.6 0.6 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 122 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-62Product: QSE/QTE Connector File #: 20786538Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.0 1.6 0.2 -0.1 -0.2 0.32 21.5 0.8 1.0 0.3 0.0 0.93 21.9 0.2 0.2 -0.4 -0.4 -0.14 21.6 0.9 0.5 0.4 0.2 0.85 21.8 0.4 -0.2 0.3 0.1 0.36 21.7 0.2 1.1 0.0 -0.2 0.57 22.6 -1.3 -1.1 -1.4 -1.4 -1.38 22.1 -0.6 -0.1 -0.7 -0.8 -0.49 21.6 0.0 -0.2 0.2 0.1 0.910 22.2 -0.1 -0.2 -0.6 -0.7 -0.311 22.6 -0.2 0.6 0.4 0.7 1.512 21.7 0.3 0.6 0.3 0.0 0.413 22.2 0.4 1.3 0.0 -0.2 1.014 22.6 2.7 0.6 -0.5 -0.4 0.615 22.4 2.2 0.3 0.2 0.6 1.016 23.4 1.3 -0.7 -0.5 -0.7 -0.317 23.7 2.8 -0.7 -0.5 -0.9 -0.418 23.7 0.7 0.5 0.3 0.0 0.419 23.3 1.5 1.3 0.4 -0.4 -0.520 21.9 0.1 0.9 -0.1 -0.2 0.521 21.5 1.0 1.6 0.6 0.7 1.322 22.0 0.0 0.1 -0.2 -0.2 0.723 21.7 0.5 0.8 0.4 0.3 0.324 21.7 0.1 0.9 0.1 0.3 0.825 22.2 0.6 1.0 0.1 -0.1 0.0

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TR#207865, REV.1.0 123 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786538

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.7 2.8 1.6 0.6 0.7 1.5 MIN 21.0 -1.3 -1.1 -1.4 -1.4 -1.3 AVG 22.2 0.6 0.4 0.0 -0.2 0.4 STD 0.7 1.0 0.7 0.5 0.5 0.7 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 124 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-63Product: QSE/QTE Connector File #: 20786539Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.6 0.5 1.8 1.5 1.1 3.52 23.3 0.4 0.3 -0.1 -0.3 0.33 23.7 0.1 -0.4 -0.5 -0.8 -0.74 22.8 0.6 -0.1 0.5 0.2 0.05 23.1 -0.2 1.1 0.2 0.0 0.46 22.8 0.1 0.5 0.0 0.2 0.87 23.1 -0.3 -0.6 -0.9 -0.9 0.48 22.9 -0.5 -0.1 -0.2 -0.2 0.49 22.9 -0.2 -0.6 -0.7 -0.8 0.510 22.8 -0.1 0.4 0.2 0.2 1.311 22.5 0.8 0.3 0.0 0.2 1.412 22.6 0.1 0.1 0.2 0.3 1.313 22.6 0.7 1.3 1.7 1.3 2.014 23.0 1.8 0.4 1.0 0.4 2.115 23.2 1.7 -0.2 -0.2 -0.4 0.216 23.8 0.3 -0.9 -0.3 -0.6 0.017 23.3 0.3 0.1 0.5 0.3 0.718 23.3 0.6 0.0 1.3 0.9 2.219 24.2 0.2 -0.1 0.4 -0.4 0.420 23.0 -0.1 0.1 0.0 -0.1 0.521 23.8 -0.3 -0.7 0.0 -0.2 0.122 23.1 0.2 0.6 0.3 0.2 0.623 23.0 0.0 0.1 -0.1 -0.2 0.224 24.5 -0.3 0.3 -0.2 -0.4 -0.325 23.8 -0.6 -0.7 -0.9 -1.1 -0.1

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TR#207865, REV.1.0 125 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786539

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.5 1.8 1.8 1.7 1.3 3.5 MIN 22.5 -0.6 -0.9 -0.9 -1.1 -0.7 AVG 23.2 0.2 0.1 0.1 0.0 0.7 STD 0.5 0.6 0.6 0.7 0.6 0.9 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 126 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 115 8-64Product: QSE/QTE Connector File #: 20786540Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.3 1.0 0.4 0.1 -0.1 0.32 21.8 0.8 0.2 0.4 0.1 0.63 21.9 0.9 0.7 0.7 0.5 0.74 22.1 -0.2 0.3 0.1 -0.1 0.75 22.2 0.1 0.3 0.5 0.4 1.96 21.5 0.4 0.3 0.5 0.5 0.77 22.2 -0.1 0.0 -0.3 -0.2 0.88 22.2 0.0 -0.3 -0.3 -0.4 -0.19 22.3 0.1 -0.2 -0.4 -0.4 0.710 22.7 0.5 -0.1 0.0 0.0 0.911 22.6 0.2 0.0 -0.1 0.0 0.412 22.5 0.6 0.1 0.4 0.5 1.213 22.8 -0.1 -0.4 -0.5 -0.6 0.714 22.5 0.6 0.4 0.8 0.5 0.715 22.7 0.7 -0.6 -0.1 -0.4 -0.216 23.6 -0.8 -0.4 1.3 0.2 1.017 22.9 0.5 0.1 0.1 -0.1 0.418 22.4 0.9 0.2 0.5 0.3 0.319 22.5 1.3 0.9 1.1 0.3 1.020 22.0 -0.2 0.6 0.5 0.3 0.221 22.0 -0.2 0.6 0.0 -0.3 -0.222 22.1 0.3 0.0 0.1 -0.1 0.123 22.5 -0.5 0.1 -0.2 -0.4 -0.224 22.4 0.1 -0.5 -0.3 -0.4 -0.125 23.0 -0.8 -0.5 -1.2 -1.4 -0.9

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TR#207865, REV.1.0 127 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786540

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 5X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.6 1.3 0.9 1.3 0.5 1.9 MIN 21.5 -0.8 -0.6 -1.2 -1.4 -0.9 AVG 22.4 0.2 0.1 0.1 -0.1 0.5 STD 0.4 0.5 0.4 0.5 0.4 0.6 Open 0 0 0 0 0 0 Tech GL DH BE BE BE BE

Equip ID 1276 681 601 601 601 601207 673 677 677 677 677

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TR#207865, REV.1.0 128 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

LLCR DATA FILES

GROUP 116

20786541 Through 20786548

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TR#207865, REV.1.0 129 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-65Product: QSE/QTE Connector File #: 20786541Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.8 0.9 0.9 1.0 1.3 1.52 22.2 0.1 2.4 0.6 0.3 1.93 22.2 1.3 3.1 0.9 1.2 2.94 22.2 4.3 1.0 0.7 1.2 3.05 21.8 0.7 1.7 1.6 1.4 5.96 21.9 0.6 -0.3 0.8 0.9 2.67 21.7 0.9 0.0 0.0 0.0 0.28 22.9 1.3 -0.3 -0.6 -0.6 -0.89 22.5 0.7 -0.3 -0.1 0.1 0.310 22.4 2.3 0.4 0.5 0.5 1.311 23.3 2.5 -1.1 -1.1 -0.5 0.312 22.1 1.9 0.3 0.2 0.2 0.713 22.6 -0.2 0.2 0.4 0.4 0.714 23.4 0.4 20.3 2.2 3.0 1.115 22.9 1.3 0.2 0.0 0.2 1.216 24.0 0.2 0.6 0.4 0.0 5.317 25.2 -1.5 -1.1 -2.2 -2.2 2.818 23.6 -0.2 -0.5 -0.4 -0.4 -0.219 23.2 1.2 0.5 0.9 0.5 1.220 22.2 0.4 -0.2 0.6 0.8 1.621 22.1 0.8 0.2 0.1 0.2 2.322 22.2 -0.2 -0.1 0.1 0.0 1.023 21.4 1.3 7.7 1.7 1.7 1.724 22.3 0.9 -0.5 0.3 0.3 2.925 22.9 -0.3 -1.0 -1.3 -1.6 -0.8

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TR#207865, REV.1.0 130 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786541

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 25.2 4.3 20.3 2.2 3.0 5.9 MIN 21.4 -1.5 -1.1 -2.2 -2.2 -0.8 AVG 22.6 0.9 1.4 0.3 0.4 1.6 STD 0.8 1.1 4.3 0.9 1.0 1.6 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

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TR#207865, REV.1.0 131 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-66Product: QSE/QTE Connector File #: 20786542Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.5 1.0 1.2 1.2 1.0 0.52 21.7 0.4 0.7 0.3 0.3 0.43 21.4 0.8 0.6 0.2 0.2 0.54 22.5 -0.5 0.0 -0.1 0.0 -0.25 21.6 0.4 0.4 0.4 0.4 1.16 21.3 0.4 2.1 1.4 1.3 4.57 22.5 1.5 0.1 0.3 0.1 0.78 22.7 2.9 0.0 0.0 -0.3 -0.19 22.2 0.6 0.1 -0.1 0.0 0.910 22.2 1.5 0.3 0.7 0.9 2.911 23.5 -0.7 -0.2 -0.6 -0.3 0.412 22.2 0.4 0.3 0.8 0.8 0.813 23.0 -0.4 0.1 0.2 0.1 0.914 23.0 0.7 1.9 1.8 1.8 2.615 22.8 -0.1 -1.3 -1.0 -1.2 -1.016 23.1 1.0 0.3 -0.1 -0.1 1.217 23.5 0.0 -1.3 -1.3 -1.3 0.118 23.4 2.5 -0.3 -0.3 -0.6 -0.619 23.1 0.7 -0.5 -0.3 -0.4 0.220 22.5 0.0 0.2 -0.1 0.1 0.321 21.5 1.5 0.2 0.4 0.5 1.222 22.2 -0.4 -0.1 0.1 0.1 1.123 21.2 0.4 0.9 0.2 0.1 0.424 21.4 0.8 0.3 0.6 0.6 0.925 21.7 0.0 0.1 -0.2 -0.2 0.4

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TR#207865, REV.1.0 132 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786542

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.5 2.9 2.1 1.8 1.8 4.5 MIN 21.2 -0.7 -1.3 -1.3 -1.3 -1.0 AVG 22.3 0.6 0.2 0.2 0.2 0.8 STD 0.7 0.9 0.8 0.7 0.7 1.1 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

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TR#207865, REV.1.0 133 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-67Product: QSE/QTE Connector File #: 20786543Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.8 -0.9 -0.3 0.0 -0.3 0.02 22.3 0.2 0.7 1.5 1.2 0.03 23.2 -1.1 -0.5 -0.9 -1.2 -0.34 23.3 -0.1 0.7 0.9 0.6 1.05 22.1 0.6 0.5 0.5 0.3 1.46 22.8 0.0 -0.2 0.0 0.0 0.67 21.9 1.3 -0.4 -0.4 -0.5 0.68 22.5 0.0 0.2 0.2 0.0 0.99 22.9 1.5 -0.2 -0.3 -0.3 4.210 21.8 0.9 0.4 0.2 0.2 0.511 23.0 1.3 0.4 0.3 0.1 0.912 23.7 1.1 -0.1 0.1 0.0 0.513 24.3 -0.2 0.3 -0.6 -1.2 -0.914 23.0 0.1 -0.5 -0.7 -0.4 2.715 23.2 0.5 0.1 1.2 0.0 0.116 22.9 1.3 1.6 0.9 0.7 0.517 23.3 0.6 0.9 0.6 0.3 1.118 24.0 0.2 -1.1 0.3 -0.2 -0.319 23.1 0.3 0.9 0.8 0.5 0.520 22.0 0.3 0.5 0.2 0.4 0.621 23.0 -0.7 0.4 -1.0 -1.2 -0.122 21.6 0.0 -0.3 -0.1 -0.2 0.823 21.8 0.3 1.0 0.4 0.3 1.324 22.5 0.4 -0.3 -0.6 -0.7 1.125 22.9 0.7 -0.1 -0.7 -0.5 0.0

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TR#207865, REV.1.0 134 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786543

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.3 1.5 1.6 1.5 1.2 4.2 MIN 21.6 -1.1 -1.1 -1.0 -1.2 -0.9 AVG 22.8 0.3 0.2 0.1 -0.1 0.7 STD 0.7 0.7 0.6 0.7 0.6 1.0 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

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TR#207865, REV.1.0 135 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-68Product: QSE/QTE Connector File #: 20786544Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.9 -0.2 -0.5 0.9 0.6 0.22 22.5 -0.4 -0.6 -0.1 -0.4 -0.13 22.8 -0.5 -0.6 -0.8 -1.0 0.34 22.5 -0.5 -0.6 -0.6 -0.8 1.35 23.3 -0.9 -1.0 -1.2 -1.2 -1.06 23.1 0.0 -0.6 -1.3 -1.1 -1.27 21.4 0.6 1.0 0.2 0.3 1.08 22.1 0.8 1.0 -0.2 -0.1 1.19 21.9 0.1 1.0 0.5 0.4 0.710 21.8 0.5 0.4 0.3 0.2 0.711 21.9 0.8 0.3 0.2 0.2 0.112 21.7 1.5 1.1 1.5 1.4 1.213 22.1 0.5 1.6 0.5 0.5 1.314 22.6 0.6 1.5 0.2 0.1 1.215 22.6 2.3 1.2 1.3 1.0 0.816 22.9 1.0 0.2 0.0 -0.1 0.817 23.3 -0.5 -0.2 -0.4 -0.6 -0.218 22.5 0.6 0.5 1.8 1.8 2.019 23.5 0.2 -0.1 1.3 1.1 0.320 23.0 -0.3 -0.2 -0.2 -0.2 -0.121 23.1 -0.7 -0.8 -1.2 -1.2 -0.122 22.7 -1.1 -0.9 -0.7 -0.7 1.223 22.3 -0.4 0.0 -0.2 -0.2 0.824 22.7 -0.7 -0.7 -0.9 -0.9 0.825 22.6 0.4 0.6 0.3 0.1 0.2

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TR#207865, REV.1.0 136 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786544

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.5 2.3 1.6 1.8 1.8 2.0 MIN 21.4 -1.1 -1.0 -1.3 -1.2 -1.2 AVG 22.5 0.1 0.1 0.0 0.0 0.5 STD 0.6 0.8 0.8 0.9 0.8 0.7 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

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TR#207865, REV.1.0 137 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-69Product: QSE/QTE Connector File #: 20786545Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.2 0.2 1.8 0.9 0.6 1.02 22.2 -0.4 0.0 0.4 0.3 -0.23 22.1 -0.1 0.7 0.6 0.4 0.44 22.4 0.0 0.4 0.5 0.4 0.05 21.6 0.0 0.2 0.0 0.0 0.36 21.7 1.4 2.2 0.7 0.5 1.27 21.6 1.5 0.3 0.0 0.0 1.18 21.6 1.0 0.6 0.2 0.3 1.29 22.8 1.5 0.0 -0.2 0.0 1.210 21.8 0.9 0.3 0.4 0.8 2.611 21.8 0.4 0.0 0.1 0.5 0.912 22.2 -0.6 -0.6 -0.2 -0.1 0.613 22.8 0.4 0.3 -0.1 -0.1 0.514 21.6 1.8 0.7 0.9 1.1 2.015 22.1 0.8 -0.3 0.0 -0.2 0.016 22.5 0.6 0.2 0.4 0.1 0.417 22.5 0.8 0.0 -0.3 -0.4 0.618 23.0 1.0 -0.3 -0.8 -1.0 -0.419 23.3 0.2 -0.2 -0.1 -0.3 -0.120 21.4 0.4 2.0 1.0 0.7 1.021 21.5 0.7 0.6 0.6 0.6 0.822 21.8 0.6 0.8 0.3 0.3 0.623 22.4 -0.5 0.2 -0.5 -0.5 0.224 21.4 0.4 0.2 0.4 0.3 0.625 21.8 -0.3 0.1 -0.3 -0.5 0.8

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TR#207865, REV.1.0 138 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786545

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.3 1.8 2.2 1.0 1.1 2.6 MIN 21.2 -0.6 -0.6 -0.8 -1.0 -0.4 AVG 22.0 0.5 0.4 0.2 0.1 0.7 STD 0.6 0.6 0.7 0.5 0.5 0.7 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

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TR#207865, REV.1.0 139 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-70Product: QSE/QTE Connector File #: 20786546Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.4 1.2 2.1 1.7 1.2 1.92 23.0 -0.3 1.3 0.8 0.6 0.53 23.4 -0.2 0.3 0.7 0.2 -0.24 22.9 0.5 0.0 0.6 2.7 0.85 24.0 -0.5 0.0 -0.2 Open 0.76 23.4 -0.2 0.2 0.2 2.3 0.87 23.0 0.5 -0.4 0.5 0.2 0.98 22.6 1.1 0.3 1.2 1.3 1.79 23.0 0.9 1.4 1.3 2.0 7.510 23.1 1.3 0.8 1.3 1.3 0.811 23.2 1.8 3.3 1.1 1.6 1.312 23.4 2.4 12.4 1.0 3.0 0.713 23.3 1.2 0.8 0.6 2.4 1.914 23.4 0.4 0.3 -0.4 3.3 2.515 23.6 0.2 0.7 0.6 2.9 0.916 23.2 0.6 -0.1 -0.1 18.4 26.017 23.3 0.7 0.7 0.7 4.3 2.318 23.8 -0.2 0.0 0.2 Open 6.219 23.0 1.4 0.6 -0.1 Open 21.120 23.4 0.5 0.0 0.0 Open 2.221 23.4 -0.2 -0.1 -0.1 2.8 0.622 22.8 -0.1 0.0 0.5 1.9 1.223 23.1 -0.3 -0.3 0.2 2.5 3.124 23.2 -0.6 -0.8 -0.5 1.5 1.225 22.7 0.0 0.0 -0.4 2.2 1.5

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TR#207865, REV.1.0 140 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786546

Temp ºC 23 22 22 22 24 24R.H. % 20 20 22 24 18 18Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 04Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 24.0 2.4 12.4 1.7 18.4 26.0 MIN 22.4 -0.6 -0.8 -0.5 0.2 -0.2 AVG 23.2 0.5 0.9 0.4 2.8 3.5 STD 0.4 0.8 2.5 0.6 3.7 6.3 Open 0 0 0 0 4 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

Page 141: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 141 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-71Product: QSE/QTE Connector File #: 20786547Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 22.2 0.1 1.2 0.9 0.6 0.82 21.5 1.5 -0.2 0.4 -0.4 0.13 21.5 0.3 0.3 0.9 0.4 0.64 21.3 0.4 0.8 0.9 0.9 1.55 21.9 -0.2 0.1 0.1 0.0 0.26 22.3 0.7 -0.5 -0.2 -0.3 0.17 21.8 0.5 -0.5 -0.2 -0.4 0.78 21.8 1.6 1.6 0.7 0.9 2.49 21.7 1.0 1.5 1.3 1.1 2.610 22.6 1.0 0.6 0.4 0.6 2.911 21.9 2.5 0.8 0.7 0.8 2.112 22.4 2.1 0.7 -0.1 0.2 1.713 22.4 1.7 -0.4 1.2 1.3 0.514 22.8 -0.1 -0.2 0.9 1.2 0.615 23.3 1.1 0.3 0.3 0.2 1.016 23.9 -0.2 -1.2 -0.9 -1.0 -0.417 23.3 -0.9 184.5 0.7 0.6 3.618 23.8 -0.1 17.0 0.1 -0.4 0.719 22.3 0.7 1.2 1.4 0.6 2.320 21.9 0.5 -0.4 -0.6 -0.8 0.621 21.7 -0.1 129.9 0.1 0.0 0.822 21.7 0.5 0.3 0.3 0.4 -0.123 20.9 1.0 2.1 1.7 1.3 1.724 21.4 0.1 0.8 0.2 0.0 0.825 21.8 -0.3 0.1 -0.1 -0.3 0.1

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TR#207865, REV.1.0 142 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786547

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.9 2.5 184.5 1.7 1.3 3.6 MIN 20.9 -0.9 -1.2 -0.9 -1.0 -0.4 AVG 22.2 0.6 13.6 0.4 0.3 1.1 STD 0.8 0.8 44.1 0.6 0.6 1.0 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677

Page 143: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 143 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

Low Level Contact Resistance

Project: 207865 Spec: EIA 364, TP 23Customer: Samtec Subgroup: 116 9-72Product: QSE/QTE Connector File #: 20786548Description: Plt Thickness AU (30)Open circuit voltage: 20mv Current: 100ma

Delta valuesunits: milliohms

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated1 21.6 0.2 12.5 5.1 3.2 3.42 22.6 -0.4 1.5 0.1 0.3 0.53 22.1 0.0 2.5 1.4 0.4 0.74 22.6 -0.2 1.1 0.5 0.1 1.25 22.8 -0.9 3.9 4.2 -0.3 1.76 21.2 0.3 1.0 1.2 1.3 5.67 21.2 1.2 1.9 1.1 0.7 1.08 22.5 0.2 0.2 -0.9 -0.6 0.79 21.8 0.8 0.1 0.4 0.9 6.210 21.6 1.4 1.1 0.9 1.1 0.611 22.5 0.4 0.0 0.2 0.2 0.912 22.2 1.7 2.7 1.0 1.0 1.013 23.5 0.4 -0.2 1.4 0.7 2.814 21.9 1.5 1.7 1.1 0.4 0.515 22.9 1.7 0.9 0.7 1.0 0.616 22.9 1.0 1.3 0.4 0.4 7.017 23.9 -1.8 0.3 -1.3 -1.5 -0.618 23.3 -1.0 -1.1 -0.7 -0.4 -1.019 22.5 0.7 0.3 0.9 1.0 0.420 21.6 0.0 0.6 1.2 1.1 1.321 22.1 0.0 0.5 1.9 1.1 1.422 22.0 0.0 0.2 1.0 0.3 1.323 21.7 0.5 4.4 1.9 1.8 1.824 21.2 0.5 1.7 1.2 1.0 2.725 21.9 1.5 1.4 0.8 1.1 1.7

Page 144: dave heading and bp1 - Samtec Microelectronicssuddendocs.samtec.com/testreports/207865_test_report_elp.pdf · QSE/QTE SAMTEC, INC. APPROVED BY: DOMINIC ARPINO PROGRAM MANAGER CONTECH

TR#207865, REV.1.0 144 of 144 Contech ResearchAn Independent Test and Research Laboratory

Test Laboratory

File #: 20786548

Temp ºC 23 22 22 22 24 22R.H. % 20 20 22 24 18 23Date: 13Dec07 14Dec07 26Dec07 27Dec07 04Jan08 07Jan08Pos. ID Initial 25X MFG 7d 1X MFG 14d 1X

Unmated Mated

MAX 23.9 1.7 12.5 5.1 3.2 7.0 MIN 21.2 -1.8 -1.1 -1.3 -1.5 -1.0 AVG 22.2 0.4 1.6 1.0 0.7 1.7 STD 0.7 0.9 2.6 1.3 0.9 2.0 Open 0 0 0 0 0 0 Tech DH DH BE BE BE BE

Equip ID 681 681 601 601 601 601673 673 677 677 677 677