Comparing Data with a Waterfall Plot

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Comparing Data with a Waterfall Plot

description

More on our XRF and XRD solutions: http://bit.ly/1pZ3zBo A useful way to compare similar samples or to follow a trend through a series of samples is to use the Stack Screen, which allows you to view all of your diffraction patterns together. To better represent a series of data, you can set the patterns in a Waterfall Plot. Sign up for our Newsletter: http://bit.ly/1sQqOyj

Transcript of Comparing Data with a Waterfall Plot

Page 1: Comparing Data with a Waterfall Plot

Comparing Data with a Waterfall Plot

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A Waterfall Plot can be used to: •  View all your diffraction patterns together •  Compare similar samples •  Follow trends through a series of data

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1. Open multiple diffraction patterns •  Left click on the first and last file while holding the shift key and then

press the open button

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2. Stack the plots •  Once all the files have loaded, click the Stack button

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3. Create a Waterfall Plot •  Use the box in the lower center of the screen to adjust the depth and

angle of the waterfall plot by clicking in the blue field •  Clicking to the left or right of center will angle the patterns so you

can inspect each pattern for similar peaks

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4. Additional graphic options •  The box in the lower right hand corner provides additional tools to

rescale or shadow the area under the patterns for a different visual affect

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5. Save the file •  Once you have the desired plot, click File, Save Graphic

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For more information: http://www.olympus-ims.com/en/innovx-xrf-xrd/

Thank you!