Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive...

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Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device e Front End Test Stand Collaboration C. Gabor, J. Pozimski, A. Letchford

Transcript of Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive...

Page 1: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28th September 2007

Non—destructive transverseemittance measurement device

The Front End Test Stand Collaboration

C. Gabor, J. Pozimski, A. Letchford

Page 2: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Outline

Introduction FETS, Photo detachment & basic principle of beam diagnostic

Theoretical investigations

Proof of principle experiment Demonstration experiment at a small H- beam line in Frankfurt

Further Hardware

Summary & Outlook

Page 3: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Layout of the Front End Test Stand FETS

(PD) Diagnostic & Support

Beamstop

IonSource

(PD) Emittance Measurement

3 Solenoids90

sect

or

ma

gne

t LEBT RFQ324 MHz3 MeV

MEBTDiagnosticQuads,

Buncher,Chopper

3MeV beam energy, ~ 60mA H-

50Hz, <2ms (10% duty cycle)

at David Lee andJuergen Pozimski,Imperial College

Page 4: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Photo Detachment H— beam diagnostic

• non destructive (i.e. no mechanical parts inside the ion beam) => minimizing the influence on the H- beam (on line) highly suitable for high power applications like FETS

• different applications possible: profile(s), emittance ~ electrons, neutrals, laser power attentuation ~ more information about beam are possible, also with good resolution ~ separating neutrals and H- can cause less flexibility because of dipole ~ higher costs compared with a traditional emittance scanner

T hresho ld :=1644nm (0 ,754eV )

M A X : =840nm (1 ,476eV )

Photon energy /a.u. (atomic unit)

0

0,1

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0 0,1 0,2 0,3 0,4

Cro

ss s

ecti

on

/a

.u.

Ine

last

ic r

eg

ion

:>

0,4

a.u

. (1

0,8

...1

4,4

eV

)

- -

-

-

--

-

LASER

Photodetachm ent

Chargeseparation

Magneticdipole

I(t)1dim profile,

long. emi

I(x,y,t)2dim profile,

trans. em i

Detection ofdistribution

y

z

Page 5: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Non-destructive, transverse H- emittance measurement

H -beam,Neutral atoms produced in the transport section

-

Laser, 1060 nm

H-b

eam

-

Neutra l a tom s produced in the transport section

M agnet poletips

B X

xy

z

Region of interactionand separation of thebeam s

scan

Scintillator

Comparission with a slit—slit emittance instrument:1st slit is replaced by a laser2nd slit is replaced by a scintillator with CCD camera more information (than 2dim) about phase space

Only a small portion of H- will be neutralized,

i.e. max. portion oflaser interaction

Page 6: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Different emittance measurement principles

Envellope ofthe ion beam

Cross section of the ion beam

sligh tly convergent ion beam envelope

A ngle m easurem ent p laneP osition m easurem ent p lane

"slit--s lit"p rincip le

"po in t--point"princip le

F irst step S econd step

R

R

z

x x

y y

drift length L

P (x ,y )0 0

L(y )0

(y ,y ')0

r= ( x, y)

y

( ,x ',y ')0x ,y0

Slit—slit Principle : only 2dim phase space = 2dim (y,y')Point—point Principle : full 4dim information about phase space

Page 7: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Photo detachment simulations aboutits transfer function

100

50

-50

-100-20 10-10 20

<PDsimK.dat>

y/mm

y'/m

rad

=0,138 mmmrad100%,rms,n

255075100

-60-40

-2020

040

60Angl

e [mrad]

y= -10mmy= +10mm

Intensity [a.u.]

-15-10-5051015

-10 0 10

x-axis /mm

y-axis

/mm

x

y-20

Left, beam profile I(y') integrated of the emittance pattern and integration of drifted, (100mm) neutralized particles (dots). Right, the "neutralized particles" at +/-10mm and the drifted particles, enclosed by the neutralized patterns, are shown.

beam profile phase space neutralized particles,drifted particles

Page 8: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Comparision of simulation & measurement

y/m m 10-10

100

50

-50

-100

y'/m

rad

-15 0 15

-20

500m m

20

500m m

50

-50

prf101.spe

prf139.spe

X

Y’

y=-3

,8m

my=

+8,

4mm

2dim yy‘ emittance simulation close to

the experiment

expe

rimen

tal r

esul

ts a

t di

ffer

ent

lase

r po

sitio

ns

simulation of photo neutralized ions of the xy distribution

(drift length 500mm

Page 9: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Further, current development work

Photodetachment Diagnostic Dipole (FETS)

D:\FETS\MAGNET\POISSON-SIMULATIONEN\H-MAGNET\UEBUNG@UNI\VERS-E_YOKE+COIL VARIATION\DIPOLE016.AM 2-12-2007 18:55:56

-10

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good field region20cm

4cm15cm

vacu

umve

sse

l

space for piezo driven stages

arc lenght: 500 mmdeflection angle: 60 degB—field: 0.522 T

I(y)

y

yx

1/e 2H beam-

m in angle

m ax angle

scanningregion

laser beam (reference) path

• homogeneity (waist) along the H- ion beam (collimation/ focusing)• different angles within scanning region

Limiting spatial resolution

Page 10: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Summary

-- Introduction about Photo detachment ion beam diagnostics Motivation; different principles of diagnostic using photo detachment; Comparison with other emittance measurement methods

-- Theoretical aspects investigations about transfer function of "slit—point" emittance

-- Proof of principle experiment in Frankfurt, Germany

Outlook and recent workFurther hardware:

diagnostic dipole & laser equipmenttesting laser beam line/ movable mirrorsparticle detector (beam test of scintillators like P43, 45improving theoretical understanding

Longitudinal emittance measurement

Page 11: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Page 12: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Spare slides

Page 13: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Piezoelectric motors: status

Motion controller

Rotary stage

Amplifiers and

power supplies

Linear stage

Encoders

Page 14: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Motivation for non-destructive diagnostics

665keV H-

1...3% dc30....40mA500 W/cm2

(by Alan Letchford)

Water cooled end plate of a Fast Faraday Cup

(unfocused ion beam)

Measurements at the current ISIS RFQ

Scintillator image of H- ion beamafter the ion source

=> beam not cylindrically symmetric mainly caused the slit extraction of the ion source

xy intensity distribution of H-,35keV 45mA,

(Ion source test stand)

Page 15: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Some data about Front End Test Stand FETS

Page 16: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Integration of a photo neutralized& drifted H- distribution

01

00

20

03

00

400

50

0

Pix

el

<=

> y

' /m

rad

In te nsity I(y ') /a .u . prf129.spe

y=+4,7mm

CCD image (raw data) + P43 with Alu

y

xRelationship between y, y and y'

y

Page 17: Christoph Gabor, ASTeC HIPPI—Meeting (WP 5) 26 th – 28 th September 2007 Non—destructive transverse emittance measurement device The Front End Test Stand.

Christoph Gabor, UKNF—Meeting, 3rd October 2007

Laser characterisation, beam guiding

Laser lab at Imperial college

Power meter

Attenuation

CCD camera

Switching mirror