Chapter 1-Sensors and Conditioning Circuits

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    Measuring systems

    Lecturer: Andras Kis

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    In class demo: RTD and photodetector

    1.2

    USB connector

    Arduino UNO board Conditioning circuit

    PT 100 Sensor

    Rload

    U0

    0V

    Uout

    Rsensor

    Rload=1k

    U0=5 V

    Uout

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    In class demo: RTD and photodetector

    1.3Arduino UNO board Conditioning circuit

    Sensor

    Rload

    U0

    0V

    Uout

    Rsensor

    U0=5 V

    Uout

    Noise reduction

    Acquisition

    (Analogdigital conversion)

    Data analysis (recording, averaging, etc.)

    Modeling

    Conditioning

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    Measurement chain

    1.4

    Modeling

    Conditioning Acquisition

    Data analysis

    Comparison

    Sensor

    Noise

    reduction

    and signal

    processing

    Action

    Chapter 1

    Chapter 2

    Chapter 3Chapter 4

    Chapter 5

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    Measuring systems

    Sensors and their conditioning

    Modeling sensors

    Noise estimation and reduction

    Data acquisition

    Data analysis and treatment Comparison betweeen different measurement results

    Measuring Systems 1.5

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    References

    Georges Asch, Acquisition de

    donnes, Dunod, 2003

    Ph. Robert, TE vol 17, Systmes de

    mesure

    Transparencies

    Exercises + solutions

    Measuring Systems 1.6

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    Organisation

    Room BC 01

    Exercises

    - 11 problem sets

    - Discussions during the exercises

    - Work at home Written mock exam (end November or early December )

    bonus (max +1 on the final exam)

    Written exam

    Prerequisits: Electrotechnique 1 and 2

    Needed for: TP Measuring systems

    Measuring Systems 1.7

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    Expected work load

    1 credit = 30 work hours (source: EPFL, CRAFT)

    3 credits x 30 = 90 hours total

    - 10 h preparation for the exam

    =80h

    -3x14 lectures + exercises=38 h for individual work at home

    = 2.5-3 h/week

    Measuring Systems 1.8

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    Chapter 1: Sensors and

    conditioning circuits

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    Sensors and conditioning circuits

    Introduction

    - Transducer: sensor, actuator

    Passive sensors and their conditioning

    - TemperatureRTD (resistance temperature detector)

    - Displacementcapacitive sensors

    - Displacementinductive sensors

    - Light intensityphotoconductors

    Active sensors and their conditioning

    - Temperaturethermocouple (thermoelectric effect)

    - Light intensityphotovoltaic cell photovoltaic effect

    - Displacement - piezoelectric gauge

    Measuring Systems 1.10

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    Transducer

    A transduceris an element that converts one physicalquantity into another physical quantity- Mercury thermometer (temperaturedisplacement)

    - Accelerometer (accelerationvoltage)

    - Electrode in a battery (ionelectrical charge)

    - Motor (electrical currentmechanical moment)- LED (electrical currentlight)

    TransducerPhysicalquantity

    Physicalquantity

    Measuring Systems 1.11

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    Sensor - actuator

    A sensor is a transducer that converts a physical quantity intoan electrical quantity:- Resistance thermometer (temperature - resistance)

    - Photodetector (light - current)

    An actuator is a transducer that converts an electrical quantityinto a non-electrical quantity- Piezo actuator (charge - displacement)

    - Resistive heater (current - heat)- LED (current - light)

    SensorMeasured

    quantityElectrical quantity

    (e, I, U, R, )

    ActuatorElectrical quantity Physical quantity

    1.12Measuring Systems

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    Sensors

    Sensitivity S: response in magnitude

    Transfer function: frequency response

    Noise: sensitivity to perturbations (internal and

    external)

    1.13

    Sensor Electrical quantityMeasured

    quantity

    Noise

    x y=f(x)

    dySdx

    Sensitivity

    Measuring Systems

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    Passive and active sensors

    Passive sensors- require an external power source

    Examples:

    - Resistive thermometer

    - Capacitive displacement sensor

    Active sensors- generate the electrical signal from the

    measured quantity

    Examples:

    - Thermocouplesthermoelectric effect- Accelerometerspiezoelectric effect

    1.14

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    Passive sensors

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    Passive sensors

    Measuring Systems 1.16

    Measured quantity Sensitive

    characteristic

    Device

    Temperature Resistance RTD (resistance temperature

    detector)

    Mechanical (Force,

    pression, acceleration,

    vibrations, sound,

    displacement)

    Resistance,

    capacitance,

    inductance

    potentiometer, microphone

    LVDT (linear variable differential

    transformer), accelerometer,

    strain gauge

    Light intensity Resistance photoconductor

    phototransistor

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    Resistive temperature sensors (RTD)

    Resistance of a metal as a function of

    temperature:

    Measuring Systems 1.17

    0 0R R f T T

    R Resistance at temperature T

    R0 Resistance at temperatureT0

    For platinum (PT100):

    20 0 01R T R A T T B T T T temperature in C

    T0 = 0CR0 = 100 W

    A = 3.910-3C-1

    B = -5.775 10-7C-2

    200

    160

    120

    80

    Resistance

    (W)

    3002001000

    Temperature (C)

    Thin film

    Wound wire Linear but low sensitivity

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    Resistive temperature sensors (Thermistors)

    Ceramics or polymers

    Measuring Systems 1.18

    Non-linear but high sensitivity

    Generally described by Steinhart-

    Hart equation:

    31

    ln( ) ln( )A B R C RT

    RT=25C= 10000W

    A = 1.03210-3C-1

    B = 2.20810-4C-1

    C = 1.27610-7C-1

    Example: Omega 44006

    10000

    8000

    6000

    4000

    2000

    Resistance

    (W)

    1601208040

    Temperature (C)

    T Temperature in Kelvin

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    Semiconducting diode thermometers

    Si, Ge, etc.

    - pn junctions

    - Inexpensive and (mostly)

    linear

    - Limited temperature range

    (-50150 C)

    Measuring Systems 1.19

    1.6

    1.2

    0.8

    0.4Voltage

    drop

    (V)

    4003002001000

    Temperature (K)

    I= 10 A

    Lakeshore DT 400

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    Conditioning circuits for resistive sensors

    Measuring Systems 1.20

    V

    Rload

    U0

    UoutRsensor

    Voltage divider

    0sensor

    out

    load sensor

    RU U

    R R

    ForRload=Rsensor=R:

    0

    2

    out

    UU

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    Conditioning circuits for resistive sensors

    Measuring Systems 1.21

    R

    RR

    Rsensor=

    =R+DR

    V

    U0

    Uout

    Wheatstone bridge

    02

    sensorout

    sensor

    R RU U

    R R R

    ForRsensor=R:

    0outU

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    Displacement sensor - resistive

    Potentiometer

    - Resistor with a sliding contact

    - Acts as a voltage divider

    Measuring Systems 1.22

    V

    R

    Rx

    U0

    Uout

    0x

    out

    RU U

    R

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    Displacement sensor - inductive

    LVDT (Linear Variable Differential Transformer)

    Measuring Systems 1.23

    Vo=k.Vin.x sec2 sec1Ferrite core

    Primary Magnetic sheld

    x0

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    Mutual inductancedifferential transformer

    Measuring Systems 1.24

    dt

    diMMdt

    diLiRu 211111 )'''(

    dt

    diMM

    dt

    diLLiRRu 12''2

    '

    22

    ''

    2

    '

    22 )'''()()(

    21111 )'''()( IMMjILjRU

    1222222 )'''()''''''( IMMjILjLjRRU

    For Rc>> i20

    1

    11

    2

    )(')(''U

    LjR

    xMxMjU

    x

    M

    M

    R2

    u2

    L1

    L2

    L2

    R1

    Pri

    sec1

    sec2

    i1

    i2

    Rc

    load''

    2R

    u1

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    Mutual inductancedifferential transformer

    Measuring Systems 1.25

    x

    M

    M

    R2

    u2

    L1

    L2

    L2

    R1

    Pri

    sec1

    sec2

    i1

    i2

    Rc

    load''

    2R

    u1

    2 1

    1 1

    2

    2

    ''( ) '( )

    ( ) (0) ... for 0

    ( ) (0) ... for 0

    j M x M xU U

    R j L

    M x M ax bx x

    M x M ax bx x

    ( ) ( ) 2M x M x ax

    2ndorder approximation:

    We get a linear relationship:

    XLjR

    UajU

    11

    12

    2

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    Capacitive displacement sensor

    Capacitance

    Measuring Systems 1.26

    Microphone: sound (external pressure variations) cause the

    membrane to vibrate (displacement dx)

    d

    AC

    dx (sound)

    dqi

    dt

    dqU R

    dt

    C x

    UC U0

    R

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    Conditioning for capacitive sensors

    Measuring Systems 1.27

    Pressure sensor

    UAC

    C2

    C1R

    R

    V

    Uout

    C2

    C11

    2

    flexible metallic

    membrane

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    Strain gauge

    Principle: change in resistance upon mechanical deformation

    Measuring Systems 1.28

    R resistance

    r resistivity

    l length

    S cross-sectional

    area

    Sl l+Dl

    initial

    lR

    Sr strained

    l lR

    S Sr r

    D D

    D

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    Strain gauge

    Measuring Systems 1.29

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    Strain gauge

    Measuring Systems 1.30

    R lK

    R l

    D D

    2 4K

    Uout=f(U0, DR/R)?Source: Wikipedia

    Rload

    U0

    0V

    Uout

    Rsensor

    R

    RR

    V

    U0

    Uout

    Rsensor=

    =R+DR

    S i

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    Strain gauge

    Let strain be the relative change in length and

    stress sthe forceFper cross-sectional area S:

    Measuring Systems 1.31

    Strain and stress are related through the Youngs

    modulus Yand Poisson ratio n

    - In the direction parallel to the stress:

    - Perpendicular to the stress:

    l

    l

    D

    F

    Ss

    Y

    s

    Y

    s n n

    S i

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    Strain gauge

    Surface change:

    Resistance change:

    Measuring Systems 1.32

    2S l

    S ln

    D D

    R l S

    R l S

    r

    r

    D D D D

    1 2R lR l

    rnr

    D D D Dominant termsMetals: first term (geometry)Semiconductors: second term

    F

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    Force sensor

    Based on a strain sensor attached to a test object

    Measuring Systems 1.33

    Force FDeformation of the

    test object

    Resistance change

    of the gauge

    Voltage drop

    in the circuit

    l

    l=

    F

    A Y

    R lK

    R lD D

    U RI

    U RD D

    gauge

    extension

    compression

    / 0l lD

    / 0l lD

    S f f l i

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    Sensors for force, pressure, acceleration

    Measuring Systems 1.34

    J1

    J2

    J4

    J3

    J'1J'4

    J'3

    J'2

    ForceF PressureP= P1- P2 Acceleration a

    F f P f k

    a x fm

    D

    MEMS b d l t

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    MEMS-based accelerometer

    Micro-Electro-Mechanical systems: integration of electronics

    and mechanical elements: sensors and actuators

    www.analog.com

    ADXL202 accelerometer

    Analog Devices website

    1.35

    Mi l t h i l t (MEMS)

    http://www.analog.com/http://www.analog.com/
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    Microelectromechanical systems (MEMS)

    Micro-Electro-Mechanical systems: integration of electronics

    and mechanical elements: sensors and actuators

    www.analog.com

    ADXL202 accelerometer

    Analog Devices website

    Movement of the beam

    controlled by springs with

    spring constant k

    1.36Measuring Systems

    Mi l t h i l t (MEMS)

    http://www.analog.com/http://www.analog.com/
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    Microelectromechanical systems (MEMS)

    Force on a mass msubject to

    acceleration a:

    Restoring force from the spring:

    So the deflection is:

    It is read out by measuring the electrical

    capacitace between the fingers

    F ma

    F k x Dm

    x ak

    D

    C C x

    1.37

    Li ht i t it t

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    Light intensity measurements

    Photoconductor

    - Highly resistive semiconductor (for

    example CdS)

    - Under illumination, electron-hole

    pairs are excited and the resistance

    decreases

    - Requires a voltage source to operate

    in a similar way to RTDs

    Measuring Systems 1.38

    I

    Vdark

    Increasing

    light

    intensity

    Li ht i t it t

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    Ic

    Vce

    Light intensity measurements

    Phototransistor

    - npn or pnp junction- Light absorbed in the base-collector junction

    generates electrons that are injected into the

    base and amplified by the transistors current

    gain

    - Higher responsivity (A/W) but longerresponse time and higher dark currents than

    photodiodes

    1.39

    dark

    Increasing

    light

    intensity

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    Active sensors

    Measuring Systems 1.40

    Temperat re Thermoelectric effect

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    TemperatureThermoelectric effect

    Seebeck effecttemperature difference results in a potential

    difference

    Measuring Systems 1.41

    Thomson effectheat transport due to electrical current

    TA TB

    conductor

    TA 0

    e-move from B to A energy loss

    temperature increase in the middle ofthe conductor

    e-move from A to B energy is

    absorbed temperature decrease in

    the middle

    TA

    TB

    A B

    TA

    TB

    current: I

    Temperature Thermoelectric effect

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    TemperatureThermoelectric effect

    Peltier effect

    Measuring Systems 1.42

    Thermoelectric effect - common name for these three effects Sensor: thermocouple

    Actuator: Peltier element

    current I

    Conductor 1Conductor 2

    - The energy of an electron depends on the temperature, work function (type of the

    conductor) and local EM field

    - By passing from 1 to 2, the energy of an electron is modified, resulting in heat

    being absorbed (cooling) or generated (heating)

    Thermocouple

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    Thermocouple

    Measuring Systems 1.43

    S - sensitivity

    - characteristic of the AB metal pair- typically 10-100 mV/K

    Most commontype K:

    - chromel (90% Ni, 10% Cr) / alumel

    (95% Ni, 2% Mn, 2% Al, 1% Si)- S = 41mV/K at room temperature

    Hot junction

    Cold junction

    h cV S T T

    Metal A

    Metal B

    Metal C

    Practical devices have built-in cold junction compensation

    Displacement Piezoelectric effect

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    DisplacementPiezoelectric effect

    1.44

    Before polarisation After polarisationq ds

    q induced charge

    d piezoelectric coefficient

    s mechanical stress

    contacts

    Occurs in materials with no inversion symmetry

    Displacement Piezoelectric effect

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    DisplacementPiezoelectric effect

    Sources of mechanical stress

    - Force, deformation, vibration,

    sound

    Materials

    - Quartz, ceramics (PZT), PVDF

    Applications

    - Force and pressure sensors- Accelerometers

    - Microphones

    Measuring Systems Chapter 1- 45

    Displacement Piezoelectric effect

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    DisplacementPiezoelectric effect

    Measuring Systems 1.46

    AccelerometerForce sensor

    Light intensity measurements Photodiode

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    I

    V

    Light intensity measurements - Photodiode

    Light is absorbed in a pn junction

    Photoexcited charge carriers are

    separated in the internal electric field

    Voltage is generated

    Non-linear response

    Measuring Systems 1.47

    dark

    Increasing

    light

    intensity

    Key Points

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    Key Points

    There is a large number of sensors and measurement principles

    Passive sensors - based on measurements ofR,L, C; require apower supply

    Active sensorsdirectly use the measured quantity for generating

    the signal

    The signal is obtained with the use of a conditioning circuit

    When choosing an appropriate sensor, keep in mind the operating

    principle, the measurement range, possible sources of errors