Black Phosphorus and Phosphorene for Device...

28
Black Phosphorus and Phosphorene for Device Applications Peide (Peter) Ye School of Electrical and Computer Engineering and Birck Nanotechnology Center, Purdue University NSF US-EU Workshop on 4/23/2015

Transcript of Black Phosphorus and Phosphorene for Device...

Black Phosphorus and Phosphorene for Device Applications

Peide (Peter) Ye

School of Electrical and Computer Engineering and Birck Nanotechnology Center Purdue University

NSF US-EU Workshop on 4232015

Outline

bull Introduction

bull Single-layer Phosphorene - Optical evolution from bulk to single layer

bull Transport and Device Properties on Few-layer Phosphorene - Anisotropic transport optical and thermal properties

- Effect of dielectric capping

- Temporal and thermal stability

- Metal contacts

- Scaling Properties

bull 2D Integration - CMOS logic and P-N diode with n-type MoS2 and p-type BP

bull Summary

White Phosphorus

Red Phosphorus

Explosion

Safety Matches

Allotropes of Phosphorus

Black Phosphorus Electronics

Phosphorene Renascence of Black P

Research on black phosphorus dates back to PM Bridgman JACS 36 1344-1363 (1914)

Exactly 100 years ago

Experiments Purdue arXiv 14014133 Fudan arXiv 14014117 YaleIBM arXiv 14020270 NUS arXiv 14020718 TU Delft arXiv14030565

Theory BUNUS arXiv 14011801 Remin U arXiv 14015045 WU in St Louis arXiv 14024192

DFT Band Structure

Single layer black phosphorus ndash ldquoPhosphorenerdquo

Band Structure of Phosphorene In collaborations with Prof Tomanek (MSU)

055 nm

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Outline

bull Introduction

bull Single-layer Phosphorene - Optical evolution from bulk to single layer

bull Transport and Device Properties on Few-layer Phosphorene - Anisotropic transport optical and thermal properties

- Effect of dielectric capping

- Temporal and thermal stability

- Metal contacts

- Scaling Properties

bull 2D Integration - CMOS logic and P-N diode with n-type MoS2 and p-type BP

bull Summary

White Phosphorus

Red Phosphorus

Explosion

Safety Matches

Allotropes of Phosphorus

Black Phosphorus Electronics

Phosphorene Renascence of Black P

Research on black phosphorus dates back to PM Bridgman JACS 36 1344-1363 (1914)

Exactly 100 years ago

Experiments Purdue arXiv 14014133 Fudan arXiv 14014117 YaleIBM arXiv 14020270 NUS arXiv 14020718 TU Delft arXiv14030565

Theory BUNUS arXiv 14011801 Remin U arXiv 14015045 WU in St Louis arXiv 14024192

DFT Band Structure

Single layer black phosphorus ndash ldquoPhosphorenerdquo

Band Structure of Phosphorene In collaborations with Prof Tomanek (MSU)

055 nm

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

White Phosphorus

Red Phosphorus

Explosion

Safety Matches

Allotropes of Phosphorus

Black Phosphorus Electronics

Phosphorene Renascence of Black P

Research on black phosphorus dates back to PM Bridgman JACS 36 1344-1363 (1914)

Exactly 100 years ago

Experiments Purdue arXiv 14014133 Fudan arXiv 14014117 YaleIBM arXiv 14020270 NUS arXiv 14020718 TU Delft arXiv14030565

Theory BUNUS arXiv 14011801 Remin U arXiv 14015045 WU in St Louis arXiv 14024192

DFT Band Structure

Single layer black phosphorus ndash ldquoPhosphorenerdquo

Band Structure of Phosphorene In collaborations with Prof Tomanek (MSU)

055 nm

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Phosphorene Renascence of Black P

Research on black phosphorus dates back to PM Bridgman JACS 36 1344-1363 (1914)

Exactly 100 years ago

Experiments Purdue arXiv 14014133 Fudan arXiv 14014117 YaleIBM arXiv 14020270 NUS arXiv 14020718 TU Delft arXiv14030565

Theory BUNUS arXiv 14011801 Remin U arXiv 14015045 WU in St Louis arXiv 14024192

DFT Band Structure

Single layer black phosphorus ndash ldquoPhosphorenerdquo

Band Structure of Phosphorene In collaborations with Prof Tomanek (MSU)

055 nm

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

DFT Band Structure

Single layer black phosphorus ndash ldquoPhosphorenerdquo

Band Structure of Phosphorene In collaborations with Prof Tomanek (MSU)

055 nm

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Kito Corp Japan In courtesy of Prof XH Chen in USTC China

Synthesis of Bulk Black Phosphorus (HP 39 GPa and Tgt270oC)

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

S Lange et al Inorg Chem 46 4028 2007 M Kopf et al arXiv 14067275

Synthesis of Black P using SnSnI4

300 350 400 450 500

Inte

nsity

Raman shift

Purdue Yersquos group

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Single-layer Phosphorene

1 μm

T = 085 nm

13 14 15 16 17 18

0

100

200

300

400

500

600

Single-Layer

Phosphorene

Inte

nsity (

au

)

Energy (eV)

Bulk BP

330 360 390 420 450 480

Bulk

2L

B2gA2

g

Ram

an

Inte

nsity

Raman Shift (cm-1)

A1g

1L

Atomic Force Microscopy Photoluminescence

Raman Spectra

In collaborations with Prof Xu (Purdue)

arXiv 1407 0502 Zhang et al

Australian National University

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Phosphorene Transistors

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

103

Dra

in C

urr

en

t (m

Am

m) Vds=001V

Vds=05V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

00

05

10

15

T=300 K

FE=286cm2Vs

-20 -15 -10 -05 00

0

50

100

150

200

30V

0V

Dra

in C

urr

en

t (m

Am

m)

Drain Voltage (V)

-30V Phosphorene p-type FET

Lch=1m

Drain current 194 mAmm Field Effect Mobility 286 cm2Vs

Phosphorene ~5 nm thick

90 nm SiO2

TiAu contact

1 μm gate length

Global gate modulation

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Field-effect Mobility

Side View

Top View

measympmhasymp03m0 mhasymp83 m0 measymp26 m0

Anisotropic Effective Mass

0 5 10 15 20 25 30

0

50

100

150

200

250

300

Mo

bili

ty (

cm

2Vs

)

Thickness (nm)

Anisotropic Field-effect Mobility

bull Devices are randomly distributed of crystal orientations H Liu et al ACS Nano March 2014

Theoretical work K-T Lam et al EDL 35 963 2014 K Gong et al PBB 90 125441 2014

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Vds=-05 V

Vds=-005 V

0 60 120 180 240 300 360

80

100

120

140

160

Dra

in C

urr

ent (m

Am

m)

Angle (degrees)

032

036

040

044

048

Gm

(m

Sm

m)

0

45 o

o

An anisotropic transport of over 50 difference in conductance is observed

Anisotropic Transport

120590=120590119909119909sin2(120579 minus 1205790) + 120590119910119910cos

2(120579 minus 1205790

H Liu et al ACS Nano March 2014 Also Xia et al arXiv 14020270

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Anisotropic Optical Properties

Z Luo et al arXiv 150306167 2015 Also F Xia et al Nature Communication 2014

A Favron et al arXiv 14080345

In collaborations with Prof Xianfan Xu (Purdue)

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Anisotropic Thermal Properties

In collaborations with Xianfan Xursquos group at Purdue

Z Luo et al arXiv 150306167 2015

Theoretical work reported by R Fei et al NL 146393 2014

B Liao et al arXiv 14104242 G Qin et al arXiv 14090279

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Stability of Phosphorene in ambient

After device fabrication After 48 hours in ambient

A Favron et al arXiv 14080345

(1) O2 H2O light accelerate the degrade process (2) Our XPS studies show that H2O is critical phosphorus acid could be formed Y Deng et al APS March Meeting 2015

Solutions (1) Atomic-Layer-Deposited (ALD) capping layer (2) Other organic polymer type capping layer (3) h-BNphosphoreneh-BN heterostructure

JO Island et al 2D Materials 2015

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

ALD Dielectric Capping

φbe

φbh

φbe

φbh

+ +

wo Al2O3 capping w Al2O3 capping

EC

EV EF

-30 -20 -10 0 10 20 30

10-5

10-4

10-3

10-2

10-1

100

101 16 nm Al2O3 on top

Back gate modulation

Vds= -05 V

Vds=-001 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

~x103

-30 -20 -10 0 10 20 30

10-4

10-3

10-2

10-1

100

101

102

Dra

in C

urr

ent (m

Am

m)

Vds=-001 V

Gate Voltage (V)

p=956 cm2Vs

Vds=-05 V

0

20

40

60

80

100

H Liu et al IEEE EDL July 2014 Low Temperature ALD (150oC or 200oC)

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

ALD Dielectric Capping

JD Wood et al Nano Letters 14 6964 2014

H Wang et al Nano Letters 14 6424 2014

J-S Kim et al arXiv 14120355

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

h-BNphosphoreneh-BN Capping

L Li et al arXiv 14116572 N Gillgren et al 2D Materials 2 1001 2015

Similar work also reported V Tayari et al arXiv14120259 X Chen et al arXiv 14121357 A Avsar et al arXiv 14121191 RA Doganov et al arXiv 14121274 Y Cao et al arXiv 150203755

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Metal Contacts

Ni-Contact Ambipolar Pd-Contact P-type

-40 -20 0 20 4010

-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1705 cm2Vs

Ni

0

5

10

15

20

25

-40 -20 0 20 40

10-2

10-1

100

101

102

Vds= 001 V

Vds= 05 V

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

FE

=1865 cm2Vs

Pd

0

5

10

15

20

25

30

35

Band edge alignment

φbe

φbh

EC

EV EF Rc=15-20 Ωmiddotmm

N-type and P-type Doping Technique on Phosphorene is under development

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

-40 -20 0 20 40

100

101

102

P-type Pd-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

ent (m

Am

m)

Back Gate Voltage (V)-40 -20 0 20 40

100

101

102

Ambipolar Ni-contact

BP Transistors

Vds = 05 V

L = 100 nm

L = 200 nm

L = 500 nm

L = 2 m

Dra

in C

urr

en

t (m

Am

m)

Back Gate Voltage (V)

Scaling Properties

Long-channel Short-channel

Enhanced Ambipolarity

Ni-Contact Pd-Contact

Фse

Vds

Фse

Vds Reduced SB width

Y Du et al ACS Nano 2014 10 nm Back-gated Phosphorene FET is under development

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

2D CMOS Logic

VDD

VOUT

GND

VIN

VDD

GND

VIN VOUT

Phosphorene PMOS

MoS2 NMOS

SiSiO2 substrate

Al2O3 dielectric

TiAu contacts

TiAu metal gates

H Liu et al ACS Nano March 2014

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

2D CMOS Logic - VTC

-10 -8 -6 -4 -2

00

02

04

06

08

10

Vo

ut (V

)

Vin (V)

VDD=1V

00

03

06

09

12

15

Gain

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

2D Hetero-structure

Y Deng et al ACS Nano July 2014

BP Homo-junction Y Deng et al IEDM 2014 Also M Buscema et al Nano Letters 2014

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Photo-response of BPMoS2 pn diode

Maximum photo-detection responsivity of 418 mAW

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

PV energy conversion with an external quantum efficiency of 03

Energy harvesting of BPMoS2 pn diode

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Other phosphorene work on photonic applications

M Buscema et al Nano Letters 2014

M Engel et al Nano Letters 2014

T Low et al PRB 90 081408 2014

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Summary

bull Single-layer phosphorene is demonstrated first time with strong PL peak and Raman shift

bull High performance transistor are achieved on few-layer phosphorene crystals An on-current of 194 mAmm and field-effect hole mobility of 286 cm2Vs are obtained

bull Anisotropic transport is observed at the orthogonal direction and attributed to different effective mass

bull Dielectric capping temporalthermal stability metal contacts and scaling properties are investigated with phosphorene transistors

bull 2D CMOS inverter and 2D p-n diode are demonstrated with n-type MoS2 p-type phosphorene

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Acknowledgement

Prof Jun Lou Prof Pulickel Ajayan Mr Sina Najmaei

Prof David Tomanek Mr Zhen Zhu

Han Liu (Intel) Adam Neal (AFRL) Yuchen Du Yexin Deng Lingming Yang Zhe Luo Prof X Xu

Prof James CM Hwang Mr Xi Luo Yaghoob Rahbarihagh

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases

Acquiring Black P from vendors

$100 in ebay by the end of 2012 $800 similar quantity

a factor of 8 increases