Béatrice Pradarelli / Laurent Latorre / Pascal Nouet
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Transcript of Béatrice Pradarelli / Laurent Latorre / Pascal Nouet
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Industrial Testing Education at Undergraduate Level: A Datasheet and Diagnosis Labs Approach
EWME2010
Béatrice Pradarelli / Laurent Latorre / Pascal Nouet
TRCC
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Outline
• Introduction to CNFM/CRTC
• Labs oriented approach for industrial testing education of undergraduate students
• Future Developments
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CNFM
National Comity for Education in Nano and
Microelectronics
EWME2010
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Micro/Nano-electronic industry CNFM centers
RENATER Network
CNFM Network
• Created 25 years ago to answer to the need of sharing high cost equipments (tester, cleaning room, …) for education
• Sponsored by French government & micro/nano electronic industry
• 12 CNFM centers strategically located
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CNFM Missions
• To share equipments dedicated to IC manufacturing and characterization, prototyping, test of IC and SIP/SOC products and design automation tools
• To offer dedicated trainings to academic people (students and teachers)
• To develop collaborations with research labs and companies to promote innovation
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CRTC: CNFM Test Resource Center
• Public organization, created in 1998, specialized in the test of microelectronic products. Located in Montpellier, south of FRANCE.
• Owner of an industrial tester, the Verigy V93K PinScale:
• Used for Education at undergraduate and L, M, D levels. • Used for test engineering services (test time, support, consulting) to companies & research labs• Accessible from anywhere
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INDUSTRIAL TESTING EDUCATIONAT UNDERGRADUATE LEVEL
EWME2010
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ICs testing in Mass production
• Millions of parts (ICs) tested automatically daily
• Rooms full of test equipments (tester/handler/prober)
• Skilled technicians in charge of the overall process
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CRTC Environment and Network
RemoteLogin
VNC
VERIGY_OFF2Linux
Tester
SmarTest®“Offline Mode”SSH & VNC servers
VERIGY_ONLinux
SmarTest®Online & Offline ModeSSH & VNC servers
Classroomwith Terminals
AccountServer
DEVICE UNDER TEST
Optical Link
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Lab Oriented Approach
• Pedagogical Objectives
• Initiate undergraduate students to industrial testing• Guide them having a better understanding of the interaction between ICs design, manufacturing & test
Data Sheet
Test Prog.
Test Results
P F
Analysis Diagnosis
Device robustness versus design and
manufacturing
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From Data Sheet to Test Program
Test Program
Data Sheet• Block diagram• Pinning• Operating conditions • Truth table• DC characteristics• AC characteristics
Test Program• Test conditions: T (°C), Vcc • Functional test• Parametric tests: Vil/Vih/Vol/Voh and leakage measurements• Timing tests: propagation delay, set
up and hold times measurements
Continuity Test
Fonctional Test
AC TestSTART DC Test
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Test Results Analysis
Manufacturing, assembly verification• Industrial test concept• Protection diodes on each pad• ESD damages / wrist strap usage
Continuity Test
Functional Test
AC TestSTART DC Test
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Test Results Analysis
Device behavior verification• Go/no Go test
• Test flow execution order, test strategy, cost of test
Continuity Test
Functional Test
AC TestSTART DC Test
Pass (Go)
Fail (No Go)
Fonctional Test @ f1
Fonctional Test @ f2<f1
$
$$$
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Test Results Analysis
Electrical and timing parameters verification• Measured values vs data sheet ones
• Product characterization: shmoo plots
• Product robustness versus process
Continuity Test
Functional Test
AC TestSTART DC Test
ma
rgin
ma
rgin
LL UL
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Failing Device
• FPGA approach to insert stuck at/delay faults
SWITCHES
MODE
DELAY
Good IC
Schematic
+
new lines
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Diagnosis
• Understanding the failures and finding the root cause in the IC using the tester debugger tools
• Interaction between Test, Design, Design for Testability (DFT) and process
Sa1 S1
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Summary
• CRTC test activities and organization offer test services and trainings to academic, research lab and industrial people.
• Lab oriented approach to initiate undergraduate students to industrial testing in 8 hours deployed since 2008: 50 students attended.
• Next: develop a new lab using the FPGA platform and addressing the DFT, fault simulations, SCAN test concepts
EWME2010