Atomic Force Microscopy: characterization of surface topography Andrius Martinavičius.
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Transcript of Atomic Force Microscopy: characterization of surface topography Andrius Martinavičius.
AFM schematically
Most AFMs use a laser beam deflection system, introduced by Meyer and Amer.
The atomic force microscope senses force in nano-contacts at the nano-Newton level
Diamond-coated AFM tip FIB Sharp Tip
Gold-coated Si3N4
Tip
Pyramidal, tetrahedral, or
conical tips are the most common tip
shapes
AFM -Tips
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Jump to Contact
Jump off contact
Hysteresis
Jump to Contact
Jump off Contact
Deflection-DisplacementCharacteristics
AFM-Tip Approaching and Retracting
Deflection as a function of the distance
Contact Region Non-Contact Region
Stable Contact Unstable
Very stablevery damagingshear forces
Too unstablebut would be less damaging
force-distance characteristics
Non-Contact and Contact modes
In contact mode, also known as repulsive mode, an AFM tip makes soft “physical contact” with the surface.
The cantilever is oscillated above the surface of the sample at such a distance that we are in the attractive regime.
Tapping Mode
A cantilever with attached tip
is oscillated at its resonant
frequency and scanned
across the sample surface.
Tip touches sample for a very
short time.
The amplitude of the
oscillations changes when
the tip scans over bumps or
depressions on a surface.
Some examples
DNQ151-1VH
A is total roughness
Ra is average roughness
Rq is root-mean-square average roughness
Some roughness parameters
Rp is the height of the highest peak
Rv is the depth of the deepest valley
Rt is the sum of these two - total roughness
Average roughness
The average roughness is the area between the roughness profile and its mean line
Digital expression