Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group
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Transcript of Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group
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Design and fabrication of electrical measurement system for
microchannel plates
(LAPD weekly group meeting) Feb-01-2011
Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group
Energy Systems Division.
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Objective:To build UV-based gain measurement set up for quick ALD functionalized MCP performance test
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Photograph of gain measurement setup:
Ready to test MCP Test 1-2 MCP per day (cause by small capacity turbo pump)
10/28/2010
Dual MCPs testing(Possible to load 3 MCPs)
3 high voltage (0-5kV)DC power supply
pA current meter
A new EMWCD submitted in Oct 10 and approved in first week of Jan 11
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HW design for MCP Gain test
Electrical connections
Shielded UV source for electron generation
Drain resistors box
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Photograph of MCP(s) holder assembly:
MCP 114 is loaded on the holder and will be tested
10/28/2010
Al anode
Anode and MCP bottom contact separated with insulating spacers
MCP top contact
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I-V data with now set-up:
Connections are ok
10/28/2010
R=60M
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System capabilities:
• Current vs. Voltage (I-V)
• Resistance vs. Temperature (R-T) (Thermal coefficient , activation energy)
• Resistance vs. Time (R-t) @ fix HV
• Gain vs. voltage
• Long term stability under scrubbing condition
• Two optical windows (possible to get thermal imaging with CCD)