Analytical Resolution vs Detection Limit...Dynamic SIMS TOF-SIMS TXRF STEM/ EELS STEM/ EDS Chemical...

2
Dynamic SIMS TOF-SIMS TXRF STEM/ EELS STEM/ EDS Chemical bonding/ molecular information Elemental information Imaging information Thickness and Density information only (no composition information) Physical Properties ©2013 Evans Analytical Group The EAGLABS SM Bubble Chart Auger SEM/ EDS LA-ICPMS Raman LEXES XPS/ ESCA FTIR XRF RBS XRD XRR GC-MS GDMS ICP techniques IGA TGA/DTA/DSC RTX SEM TEM/STEM FIB AFM EBIC OP Imaging Techniques Physical limit for 0.3nm Sampling Depth Physical limit for 3nm Sampling Depth Physical limit for 30nm Sampling Depth Bulk Techniques Analytical Spot Size Detection Range Atoms/cm 3 5E22 1E22 1E21 1E20 1E19 1E18 1E17 1E16 1E15 1E14 1E13 1E12 100 at% 10 at% 1 at% 0.1 at% 100 ppm 10 ppm 1 ppm 100 ppb 10 ppb 1 ppb 100 ppt 10 ppt 0.1 nm 1 nm 10 nm 100 nm 1 μm 10 μm 100 μm 1 mm 1 cm www.eaglabs.com Copyright ©2013 Evans Analytical Group • 02/13 BR004 Analytical Resolution vs Detection Limit

Transcript of Analytical Resolution vs Detection Limit...Dynamic SIMS TOF-SIMS TXRF STEM/ EELS STEM/ EDS Chemical...

Page 1: Analytical Resolution vs Detection Limit...Dynamic SIMS TOF-SIMS TXRF STEM/ EELS STEM/ EDS Chemical bonding/ molecular information Elemental information Imaging information Thickness

Dynamic SIMS

TOF-SIMS

TXRF

STEM/EELS

STEM/EDS

Chemical bonding/molecular informationElemental information

Imaging information

Thickness and Density information only(no composition information)Physical Properties

©2013 Evans Analytical GroupThe EAGLABSSM Bubble Chart

Auger SEM/EDS

LA-ICPMS

Raman

LEXES

XPS/ESCA

FTIRXRF RBS

XRD

XRR

GC

-MS

GD

MS

ICP

te

chn

iqu

es

IGA

TG

A/D

TA/D

SC

RTXSEM

TEM/STEMFIB

AFM

EBIC

OP

Imaging Techniques

Physical limit for 0.3nm

Sampling Depth

Physical limit for 3nm

Sampling Depth

Physical limit for 30nm

Sampling Depth

BulkTechniques

Analytical Spot Size

De

tect

ion

Ran

ge

Ato

ms/

cm3

5E22

1E22

1E21

1E20

1E19

1E18

1E17

1E16

1E15

1E14

1E13

1E12

100 at%

10 at%

1 at%

0.1 at%

100 ppm

10 ppm

1 ppm

100 ppb

10 ppb

1 ppb

100 ppt

10 ppt0.1 nm 1 nm 10 nm 100 nm 1 μm 10 μm 100 μm 1 mm 1 cm

www.eaglabs.comCopyright ©2013 Evans Analytical Group • 02/13 BR004

Analytical Resolution vs Detection Limit

Page 2: Analytical Resolution vs Detection Limit...Dynamic SIMS TOF-SIMS TXRF STEM/ EELS STEM/ EDS Chemical bonding/ molecular information Elemental information Imaging information Thickness

www.eaglabs.comCopyright ©2013 Evans Analytical Group • 02/13 BR004

Typical Analysis Depths for Techniques