Agilent 5100 ICP-OES · Hole Vertical torch 5100 SVDV Mode Selector 5100 ... ss) As 188.980 Cd 228...

Agilent 5100 ICP-OES

Dual View ICP-OES Minus

the Wait

Steve Wall, Agilent Technologies

July 29, 2014

Agilent Confidential

1

24 Years of Agilent ICP-OES Innovation

1991

1998-2000

2006

1995

High resolution radial

sequential ICP-AES

Liberty

Liberty Series II

710/720/730 Worlds fastest

simultaneous ICP-

OES. Patented CCD

Introducing increased

throughput via SVS2

Axial and Radial models

available. Vacuum and

gas purge optics.

#1 selling ICP-OES. Vista Chip CCD detector

Agilent 5100 SVDV ICP-OES

• Lowest Cost of Ownership • Enhanced Performance • Simple Operation

2014

Vista PRO & MPX

High QE PMT detector. >8000 Agilent ICP-OES

instruments sold

Introducing the Agilent 5100 ICP-OES SVDV

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Dual View Minus the wait Agenda

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Highest throughput with highest performance

• What is the 5100 ICP-OES?

• How does the 5100 work?

• Key benefits

• Analytical performance and applications

Agilent 5100 Synchronous Vertical Dual View ICP-OES


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• Key benefits



Concept

Make ICP-OES easier to use, cheaper to run and maintain,

without compromising analytical speed or performance.

• New software and sample introduction components

• New high specification hardware platform

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What is the 5100 Synchronous Vertical Dual View (SVDV) ICP-OES?

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Vista Chip II CCD

High Speed Pump


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Mode Selector

DSC


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Services

Vertical Torch

SSRF


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• Key benefits



How does the 5100 work?

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Cool Cone Interface

Snout

How does the 5100 SVDV with DSC technology work? Patented DSC technology for ICP-OES provides DV without compromise.

• Single reading of the plasma for both radial and axial.

• Vertical torch gives high matrix capability

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Dichroic

Spectral

Combiner

(DSC)

To detector

Mirror

DSC Hole

Vertical

torch

5100 SVDV Pre-optics 5100 SVDV Mode Selector

Future Proof Your Lab 5100 SVDV ICP-OES is 4 instruments in 1

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2. Radial Mode 3. Axial Mode 1. Synchronous VDV Mode

4. Conventional Simultaneous Dual View Mode

+

RAD AX


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• Key benefits



Benefits of the 5100

• Fastest sample throughput of difficult samples

• Low gas consumption

Lowest cost of ownership

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• Analytical performance

• System robustness and reliability

Enhanced Performance

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• Analytical performance

• System robustness and reliability


• Software

• Hardware

Simple Operation

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1. Lowest cost of ownership • High throughput facilitates low Ar consumption per sample

- (a) DSC. (b) VistaChip II. (c) 80 rpm pump. (d) SVS 2+

• 50% Lower power and 50% lower exhaust requirements.

• 27MHz Solid State RF

• Robust vertical torch

• Increased self maintainability

SVDV Vendor

A Vendor

B

USEPA 200.7 (min) 0.97 2.3 2.3

Ar L/sample 20 38 43

Valve/No Valve Valve Valve Valve 0

5

10

15

20

25

30

35

40

45

50

5100 SVDV Vendor A Vendor B

Ar/sample

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2. Enhanced Performance Long Term Stability

• 4Hr Long Term Stability with complex matrix

• 25% NaCl spiked with 250 ppb multi-element solution

• <2.4% RSD

0%

20%

40%

60%

80%

100%

120%

140%

0:00:00 0:28:48 0:57:36 1:26:24 1:55:12 2:24:00 2:52:48 3:21:36 3:50:24 4:19:12

% R

ead

back

Time (h:mm:ss)

As 188.980 Cd 228.802 Pb 220.353 Se 196.026

250ppb As/Se/Pb/Cd solution in 25% NaCl

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3. Simple Operation

• Plug-and-play torch and SIS

• Enhanced user maintainability

- Pre optic window (axial and radial)

- Optics gas filter

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3. Simple Operation

• ICP Expert software

- Intuitive workflow

- Trend monitoring of argon backpressure to the nebulizer and argon emission per sample

• e-Familiarization DVD videos

- Software

- Hardware

- Routine Maintenance

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• Key benefits



Environmental

Food & Agriculture

Materials Science

Chemical & Energy

Pharmaceuticals

Drinking and natural water Trace toxic metals in food Mining and Metals Petroleum refining Heavy metals

(USP<232>/<233>)

Soil and sediment Nutrient elements Toys and Consumer Products Alternative Energy (Biodiesel) Incoming raw material testing

Waste (solids/liquids/gases) Feed and fertilizer Semicon, Ceramics, Batteries Fine and Bulk Chemicals QA/QC of Final Product

Where can Agilent 5100 ICP-OES be used?

Performance (technology)

• Speed/low gas costs (SVDV, Vista Chip II)

• EIE interference immunity (SVDV)

• LDR (VistaChip II)

• Resolution/interference minimization

(Echelle optics, FACT/IEC, Fitted

Background Correction)

• Usability (Software, Easy Fit Torch)

Performance (technology)

• Highly stable plasma system (SSRF)

• Matrix tolerance and robust sample intro

(Vertical torch, HF resistant SIS)

• Long term stability (MFC, Thermostatted

optics)

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Agilent 5100 ICP-OES Environmental Application

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Analysis of Environmental Samples using the Agilent 5100 ICP-OES SVDV

• Elemental Analysis on water samples

Measurement challenge:

How to improve sample throughput when measuring water samples, according to the US EPA 200.7 method: “Determination of Metals and Trace Elements in Water, Solids and Biosolids by ICP-AES?

Solution

Using the Agilent 5100 Synchronous Vertical Dual View ICP-OES, fitted with a Switching Valve System and an autosampler allowed the analysis of a sample every 58 seconds, with excellent recoveries and measurement stability and a 50% reduction in argon consumption.

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Experimental Instrumentation


Fitted with:

• Seaspray nebulizer

• Single-pass glass cyclonic spray

chamber

• White-white pump tubing

• Standard 1.8 mm injector torch


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Experimental Instrumentation

Accessories:

• SVS 2+ Switching Valve System -

reduces sample uptake, stabilization

times, and rinse delays.

• SPS 3 autosampler

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Experimental Operating parameters

Table 2. Agilent SVS 2+ Switching Valve System settings

Parameter Setting

Sample loop size (mL)

1.0

Loop uptake delay (s) 7.0

Uptake pump speed (rpm) - refill 355

Uptake pump speed (rpm) – move 355

Uptake pump speed (rpm) – inject 100

Time in sample (s) 6.6

Bubble inject time (s) 6.8

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Experimental Samples and sample preparation

• Standards were prepared from single element standards and diluted

with 1% HNO3.

• 2 x trace metals in drinking water (TMDW) Certified Reference Materials

(CRM)* were analyzed:

• TMDW-A

• TMDW-B

Inter Element Corrections were used for interference correction

* Purchased from High Purity Standards, Charleston, South Carolina, USA.

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Experimental Method

• Sample analysis was performed as per

US EPA method 200.7

• Long term stability was also measured

according to US EPA method 200.7

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Results and discussion

Method Detection Limits

• Excellent detection limits were obtained for the elements selected by the

instrument to be measured in the axial view e.g. As, Pb, and Se.

• In the same measurement, detection limits for K and Na were equivalent

to those from a typical radial measurement.

Table 3. Method detection limits, acquired per EPA Method 200.7. All MDLs were determined in one analytical run.

Note: MDL for other elements listed in full application note.

Element Method Detection Limit (ppb) As 188.980 3.7 K 766.491 21.6 Na 588.995 10.1 Pb 220.353 1.9 Se 196.026 3.2

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Results and discussion

Sample throughput

• The Synchronous Vertical Dual View capability

of the 5100 measures both the axial and the

vertical view of the plasma at the same time

• 1 sample measurement = 58 seconds and

consumed < 21 L argon

• This is 55% faster than conventional dual view ICP-

OES instruments, with approx 50% less argon

consumption per sample

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Conclusion

Water samples were analyzed as per US EPA method 200.7, using the

Agilent 5100 SVDV ICP-OES with sample introduction accessories.

The study found that:

• The 5100 delivered accurate results in 58 seconds per sample.

• The 5100 consumed less than 21 L of argon per sample

• Excellent method detection limits in the μg/L (ppb) range were

obtained for all elements in a single run.

• Good recovery results for 26 elements in two CRMs were achieved

• Stability better than 1.3% for all elements during a 12 hour period

Comparing the results to those published by other ICP-OES

manufacturers allows us to calculate that the 5100:

• is up to 55% faster than dual view instruments

• consumes approx 50% less argon than dual view instruments

To find out more, visit agilent.com/chem

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Agilent 5100 ICP-OES summary



Simple Operation

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Questions

Visit us at www.agilent.com/chem/DualViewMinusTheWait

• Technology Video

• Application Notes

• Technical Overviews

• Agilent’s Atomic Spectroscopy Portfolio of Solutions

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http://www.agilent.com/chem/DualViewMinusTheWait

Agilent 5100 ICP-OES · Hole Vertical torch 5100 SVDV Mode Selector 5100 ... ss) As 188.980 Cd 228...

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Transcript of Agilent 5100 ICP-OES · Hole Vertical torch 5100 SVDV Mode Selector 5100 ... ss) As 188.980 Cd 228...